Crack information determination method, device, equipment and medium

Abstract

The application discloses a crack information determination method, device, equipment and medium, and belongs to the technical field of seismic exploration. The method comprises the following steps: acquiring an OVT gather corresponding to a first target region, wherein the first target region is provided with a detection well; acquiring reference crack information, wherein the reference crack information is crack information detected by the detection well and is used for indicating cracks at the detection well; taking the reference crack information as a constraint condition, performing elliptical fitting processing on the OVT gather to obtain an elliptical fitting result of the first target region; and determining crack information of the first target region based on the elliptical fitting result, wherein the crack information of the first target region is used for indicating cracks in the first target region. Since the crack information of the cracks at the detection well represented by the elliptical fitting result is accurate, the accuracy of the crack information of other cracks outside the detection well represented by the elliptical fitting result is also greatly improved, and therefore, the accuracy of the determined crack information is improved.

Description

Technical Field

[0001] This application relates to the field of seismic exploration technology. In particular, it relates to a method, apparatus, equipment, and medium for determining fracture information. Background Technology

[0002] Sandstone is a type of tight rock formation characterized by low porosity and low permeability, making its exploration and development challenging. However, some sandstone formations are highly brittle, and geological tectonic movements have generated numerous micro-fractures. These micro-fractures provide favorable spaces for oil and gas accumulation, leading to an abnormally high permeability and thus enabling the extraction of high-yield oil and gas flows from these sandstones. To further improve the productivity of sandstone reservoirs, accurately predicting fracture information in target areas has become a pressing issue.

[0003] Currently, most methods involve elliptic fitting of seismic data from the target area to obtain an ellipse fitting result, which is then used to determine crack information in the target area. There are various methods for elliptic fitting, but different methods may produce different ellipse fitting results, leading to different determined crack information. Furthermore, it is currently impossible to know which ellipse fitting result yields accurate crack information. In other words, the above methods have multiple solutions, resulting in inaccurate crack information. Summary of the Invention

[0004] This application provides a method, apparatus, device, and medium for determining crack information, which can improve the accuracy of crack information determination. The specific technical solution is as follows:

[0005] On one hand, embodiments of this application provide a method for determining crack information, the method comprising:

[0006] Obtain the vector offset surface element OVT gather corresponding to the first target region, where a detection well is set;

[0007] Obtain reference fracture information, which is fracture information obtained through the detection well and used to indicate fractures at the detection well;

[0008] Using the reference fracture information as a constraint, the OVT gather is subjected to elliptical fitting to obtain the elliptical fitting result of the first target area, so that the fracture information of the fracture at the probe well represented by the elliptical fitting result is consistent with the reference fracture information.

[0009] Based on the ellipse fitting result, crack information of the first target region is determined, and the crack information of the first target region is used to indicate cracks in the first target region.

[0010] In one possible implementation, the step of using the reference fracture information as a constraint to perform elliptic fitting on the OVT gather to obtain an elliptic fitting result, so that the fracture information at the probe well represented by the elliptic fitting result is consistent with the reference fracture information, includes:

[0011] Based on the reference fracture information and the gather data corresponding to the well in the OVT gather, an ellipse fitting template is determined. The ellipse fitting template is used to fit the gather data into an ellipse fitting result that represents the reference fracture information.

[0012] Based on the ellipse fitting template, the OVT gather is subjected to ellipse fitting processing to obtain multiple ellipse fitting results. The multiple ellipse fitting results are used to indicate multiple cracks in the first target region, and one ellipse fitting result indicates one crack.

[0013] In one possible implementation, determining the ellipse fitting template based on the reference fracture information and the gather data corresponding to the well in the OVT gather includes:

[0014] Based on the reference crack information and the gather data, the ellipse fitting relationship data is subjected to parameter adjustment to obtain the adjusted ellipse fitting relationship data, so that the adjusted ellipse fitting relationship data fits the gather data into an ellipse fitting result representing the reference crack information. The ellipse fitting relationship data is used to perform ellipse fitting on the OVT gather.

[0015] The adjusted ellipse fitting relationship data is used as the ellipse fitting template.

[0016] In one possible implementation, determining the ellipse fitting template based on the reference fracture information and the gather data corresponding to the well in the OVT gather includes:

[0017] Based on the fracture impact information of the first target area, the first target area is divided into multiple first target sub-regions. The fracture impact information of different locations in the first target sub-regions is the same or similar. The fracture impact information is used to represent the factors that cause the fracture information to change. Each of the multiple first target sub-regions is equipped with a detection well.

[0018] For any first target sub-region, based on the reference fracture information obtained by the probe wells in the first target sub-region and the gather data corresponding to the probe wells in the first target sub-region in the OVT gather, the ellipse fitting template corresponding to the first target sub-region is determined.

[0019] The OVT gather is subjected to elliptical fitting processing based on the elliptical fitting template to obtain multiple elliptical fitting results, including:

[0020] For any first target sub-region, based on the ellipse fitting template corresponding to the first target sub-region, the gather data corresponding to the first target sub-region in the OVT gather is subjected to ellipse fitting processing to obtain multiple ellipse fitting results. The multiple ellipse fitting results are used to indicate multiple cracks in the first target sub-region.

[0021] In one possible implementation, the first target area is provided with multiple detection wells, including a first detection well and a second detection well. The ellipse fitting template is determined based on reference fracture information obtained from the first detection well and the gather data corresponding to the first detection well. The method further includes:

[0022] After obtaining the plurality of ellipse fitting results, the target ellipse fitting result corresponding to the second well is determined from the plurality of ellipse fitting results. The target ellipse fitting result is used to indicate the fracture at the second well.

[0023] Based on the reference fracture information obtained from the second detection well, the target ellipse fitting result is verified to obtain the verification result.

[0024] If the verification result indicates that the fracture information represented by the target ellipse fitting result matches the reference fracture information detected by the second detection well, the step of determining the fracture information of the first target area based on the ellipse fitting result is performed.

[0025] In one possible implementation, the OVT gather includes multiple types of data, including at least two of frequency data, amplitude data, or velocity data; the step of using the reference crack information as a constraint to perform elliptic fitting processing on the OVT gather to obtain the elliptic fitting result for the first target region includes:

[0026] Based on each type of data in the OVT data set, ellipse fitting is performed to obtain the ellipse fitting result corresponding to each type of data.

[0027] Based on the reference crack information, each ellipse fitting result is verified to obtain a reference ellipse fitting result, which is the ellipse fitting result that best matches the reference crack information among the multiple ellipse fitting results obtained.

[0028] Determine the target type corresponding to the reference ellipse fitting result, wherein the target type is used to indicate the type of data that generated the reference ellipse fitting result;

[0029] Using the reference crack information as the constraint condition, ellipse fitting is performed on the data belonging to the target type in the OVT gather to obtain the ellipse fitting result.

[0030] In one possible implementation, obtaining the vector offset distance surface element (OVT) gather corresponding to the first target region includes:

[0031] Obtain the candidate OVT gather corresponding to the first target region;

[0032] Based on the reference fracture information, the development characteristics of the fractures at the probe well are determined;

[0033] Based on the candidate OVT gathers, determine the anisotropy characteristics of the candidate OVT gathers at the well.

[0034] If the anisotropic feature matches the developmental feature, the candidate OVT tunnel set is determined as the OVT tunnel set.

[0035] In one possible implementation, obtaining the vector offset distance surface element (OVT) gather corresponding to the first target region includes:

[0036] Based on azimuth and offset information, the seismic data of the first target area are sorted to obtain the first OVT gather;

[0037] Based on the development direction range of the main fracture in the first target region, an azimuth range is determined, wherein the azimuth range is the same as or similar to the development direction range.

[0038] Select a second OVT gather that belongs to the azimuth range from the first OVT gather;

[0039] The second OVT gather is divided into third OVT gathers belonging to different offset ranges;

[0040] Determine the anisotropy characteristics of the third OVT gathers belonging to each offset range;

[0041] The third OVT set with the strongest anisotropy is retained, and the rest of the third OVT sets are discarded to obtain the OVT set.

[0042] On the other hand, embodiments of this application provide a crack information determination device, the device comprising:

[0043] The first acquisition module is used to acquire the vector offset distance surface element OVT gather corresponding to the first target area, where a detection well is set in the first target area;

[0044] The second acquisition module is used to acquire reference fracture information, which is fracture information obtained by the detection well and is used to indicate the fracture at the detection well.

[0045] The fitting module is used to perform ellipse fitting on the OVT gather using the reference fracture information as a constraint condition, so as to obtain the ellipse fitting result of the first target area, so that the fracture information of the fracture at the probe well represented by the ellipse fitting result is consistent with the reference fracture information.

[0046] An information determination module is used to determine crack information in the first target region based on the ellipse fitting result, wherein the crack information in the first target region is used to indicate cracks in the first target region.

[0047] In one possible implementation, the fitting module includes:

[0048] The template determination unit is used to determine an ellipse fitting template based on the reference fracture information and the gather data corresponding to the well in the OVT gather. The ellipse fitting template is used to fit the gather data into an ellipse fitting result representing the reference fracture information.

[0049] The fitting unit is used to perform elliptical fitting processing on the OVT gather based on the elliptical fitting template to obtain multiple elliptical fitting results. The multiple elliptical fitting results are used to indicate multiple cracks in the first target region, and one elliptical fitting result indicates one crack.

[0050] In one possible implementation, the template determining unit is used to perform parameter tuning on the ellipse fitting relationship data based on the reference crack information and the gather data to obtain adjusted ellipse fitting relationship data, so that the adjusted ellipse fitting relationship data fits the gather data into an ellipse fitting result representing the reference crack information, and the ellipse fitting relationship data is used to perform ellipse fitting on the OVT gather; the adjusted ellipse fitting relationship data is determined as the ellipse fitting template.

[0051] In one possible implementation, the template determining unit is configured to divide the first target region into multiple first target sub-regions based on the fracture influence information of the first target region. The fracture influence information at different locations in the first target sub-regions is the same or similar. The fracture influence information is used to represent the factors that cause changes in the fracture information. Each of the multiple first target sub-regions is provided with a detection well. For any first target sub-region, an ellipse fitting template corresponding to the first target sub-region is determined based on the reference fracture information detected by the detection well in the first target sub-region and the gather data corresponding to the detection well in the first target sub-region in the OVT gather.

[0052] The fitting unit is used to perform elliptical fitting processing on the gather data corresponding to the first target sub-region in the OVT gather based on the elliptical fitting template corresponding to the first target sub-region for any first target sub-region, and obtain multiple elliptical fitting results. The multiple elliptical fitting results are used to indicate multiple cracks in the first target sub-region.

[0053] In one possible implementation, the first target area is provided with multiple detection wells, including a first detection well and a second detection well. The ellipse fitting template is determined based on reference fracture information obtained from the first detection well and the gather data corresponding to the first detection well. The device further includes:

[0054] The result determination module is used to determine the target ellipse fitting result corresponding to the second detection well from the multiple ellipse fitting results after obtaining the multiple ellipse fitting results. The target ellipse fitting result is used to indicate the fracture at the second detection well.

[0055] The verification module is used to verify the target ellipse fitting result based on the reference fracture information obtained from the second detection well, and obtain the verification result.

[0056] The information determination module is used to perform the step of determining the fracture information of the first target area based on the ellipse fitting result when the verification result indicates that the fracture information represented by the target ellipse fitting result matches the reference fracture information detected by the second detection well.

[0057] In one possible implementation, the OVT gather includes multiple types of data, including at least two of frequency data, amplitude data, or velocity data; the fitting module includes:

[0058] The fitting unit is used to perform ellipse fitting processing on each type of data in the OVT data set to obtain the ellipse fitting result corresponding to each type of data.

[0059] A verification unit is used to verify each ellipse fitting result obtained based on the reference crack information to obtain a reference ellipse fitting result, wherein the reference fitting result is the ellipse fitting result that best matches the reference crack information among the multiple ellipse fitting results obtained.

[0060] A determining unit is used to determine the target type corresponding to the reference ellipse fitting result, wherein the target type is used to indicate the type of data that generates the reference ellipse fitting result;

[0061] The fitting unit is further configured to use the reference crack information as the constraint condition to perform ellipse fitting processing on the data belonging to the target type in the OVT gather, and obtain the ellipse fitting result.

[0062] In one possible implementation, the first acquisition module is configured to acquire candidate OVT gathers corresponding to the first target area; determine the development characteristics of fractures at the probe well based on the reference fracture information; determine the anisotropy characteristics of the candidate OVT gathers at the probe well based on the candidate OVT gathers; and, if the anisotropy characteristics match the development characteristics, determine the candidate OVT gather as the OVT gather.

[0063] In one possible implementation, the first acquisition module is configured to: sort the seismic data of the first target area based on azimuth information and offset information to obtain a first OVT gather; determine an azimuth range based on the development direction range of the main fault in the first target area, wherein the azimuth range is the same as or similar to the development direction range; select a second OVT gather belonging to the azimuth range from the first OVT gather; divide the second OVT gather into third OVT gathers belonging to different offset ranges; determine the anisotropy characteristics of the third OVT gathers belonging to each offset range; retain the third OVT gather with the strongest anisotropy characteristics and discard the remaining third OVT gathers to obtain the OVT gathers.

[0064] On the other hand, a computer device is provided, the computer device including a processor and a memory, the memory storing at least one piece of program code, the at least one piece of program code being loaded and executed by the processor to implement the crack information determination method described in the above possible implementations.

[0065] On the other hand, a computer-readable storage medium is provided, wherein at least one piece of program code is stored in the computer-readable storage medium, the at least one piece of program code being loaded and executed by a processor to implement the crack information determination method described in the above possible implementations.

[0066] On the other hand, a computer program product is provided, wherein at least one piece of program code is stored in the computer program product, the at least one piece of program code being loaded and executed by a processor to implement the crack information determination method described in the above possible implementations.

[0067] This application provides a method, apparatus, device, and medium for determining fracture information. When performing ellipse fitting on an OVT gather, the actual fracture information at the well is used as a constraint to ensure that the fracture information at the well represented by the ellipse fitting result is accurate. Since the fracture information at the well represented by the ellipse fitting result is accurate, the accuracy of the fracture information of other fractures outside the well represented by the ellipse fitting result is also greatly improved. Therefore, the accuracy of determining fracture information is improved. Attached Figure Description

[0068] Figure 1 This is a schematic diagram of an implementation environment provided in an embodiment of this application;

[0069] Figure 2 This is a flowchart of a crack information determination method provided in an embodiment of this application;

[0070] Figure 3 This is a flowchart of a crack information determination method provided in an embodiment of this application;

[0071] Figure 4 This is a flowchart of a crack information determination method provided in an embodiment of this application;

[0072] Figure 5 This is a flowchart of a crack information determination method provided in an embodiment of this application;

[0073] Figure 6 This is a schematic diagram of the structure of a crack information determination device provided in an embodiment of this application;

[0074] Figure 7 This is a schematic diagram of another crack information determination device provided in an embodiment of this application;

[0075] Figure 8 This is a structural block diagram of a terminal provided in an embodiment of this application;

[0076] Figure 9 This is a structural block diagram of a server provided in an embodiment of this application. Detailed Implementation

[0077] To make the technical solution and advantages of this application clearer, the embodiments of this application will be described in further detail below.

[0078] The terms "first," "second," "third," and "fourth," etc., used in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0079] It should be noted that all information (including but not limited to user device information, user personal information, etc.), data (including but not limited to data used for analysis, stored data, displayed data, etc.), and signals involved in this application have been authorized by the user or fully authorized by all parties, and the collection, use, and processing of related data must comply with the relevant laws, regulations, and standards of the relevant countries and regions. For example, the data and detection methods involved in this application were obtained with full authorization.

[0080] The crack information determination method provided in this application is executed by a computer device. In one possible implementation, the computer device is a terminal, such as a desktop computer, tablet computer, or mobile phone. In another possible implementation, the computer device is a server. For example, the server can be a single server, a server cluster consisting of several servers, or a cloud computing service center. In yet another possible implementation, the computer device includes both a terminal and a server.

[0081] Figure 1 This is a schematic diagram of an implementation environment provided in an embodiment of this application, such as... Figure 1 As shown, the implementation environment includes a terminal 101 and a server 102. The terminal 101 and the server 102 are connected via a wireless or wired network.

[0082] In some embodiments, a target application provided by a server 102 is installed on the terminal 101. Optionally, the target application is an application in the operating system of the terminal 101, or the target application is an application provided by a third party.

[0083] The target application can be any type of application. For example, the target application is a data processing application with image processing capabilities. Of course, the data processing application can also have other functions, such as sharing capabilities.

[0084] In some embodiments, terminal 101 sends seismic data of a target area to server 102, server 102 receives the seismic data of the target area, and determines crack information of the target area based on the seismic data, the crack information being used to indicate cracks in the target area.

[0085] The following provides an exemplary description of the application scenarios of the embodiments of this application.

[0086] The method provided in this application can be applied to the exploration and development of tight and brittle reservoirs. For example, pyrolithified sandstone is a typical tight layer with high brittleness. During geological tectonic movements, this pyrolithified sandstone is prone to developing microfractures, which are favorable spaces for oil and gas accumulation. High-yield oil and gas flows can be obtained from pyrolithified sandstone with numerous microfractures. To improve the productivity of pyrolithified sandstone, it is necessary to accurately predict the fracture information of the pyrolithified sandstone reservoir.

[0087] Currently, there are two methods for predicting fracture information in pyrolithified sandstone reservoirs. The first is post-stack seismic attribute analysis. This method uses post-stack seismic data of the region containing the pyrolithified sandstone reservoir to determine seismic attributes, and then uses these attributes to determine fracture information in that region. However, this method loses a significant amount of information during data processing, thus it can accurately predict large-scale fractures but not small-scale fractures. The second method is pre-stack anisotropic fracture prediction. However, this method relies on multi-attribute, multi-domain, and multi-technical approaches, lacking specificity, and the prediction results are prone to multiple solutions and instability. Therefore, it also cannot accurately predict fracture information in pyrolithified sandstone reservoirs.

[0088] The method provided in this application is an improvement on the second method. It uses the actual exploration data of the well as a constraint to make the fracture information of the well represented by the ellipse fitting result consistent with the actual exploration data. Since the fracture information of the well represented by the ellipse fitting result is accurate, the accuracy of the fracture information of other fractures outside the well identified by the ellipse fitting result is also greatly improved. Therefore, the accuracy of determining fracture information is improved.

[0089] Figure 2 This is a flowchart illustrating a crack information determination method provided in an embodiment of this application. This embodiment uses a computer device as an example for illustrative purposes, and the method includes:

[0090] 201. The computer equipment acquires the vector offset distance surface element OVT gather corresponding to the first target area, which is equipped with a detection well.

[0091] The first target region can be any region. In some embodiments, the first target region is the region containing small-scale fractures. In some embodiments, the first target region is the region containing a dense and brittle reservoir. For example, the first target region is the region containing dolomitic sandstone. This application does not limit the first target region.

[0092] OVT (Offset Vector Tile) gathers are data with the same azimuth and offset information. In some embodiments, obtaining the OVT gather corresponding to the first target area includes: sorting the pre-stack seismic data of the first target area based on azimuth and offset information to obtain multiple OVT gathers, each of which contains gather data with the same azimuth and offset information.

[0093] When exploring and developing the first target area, it is necessary to construct detection wells within the area to assist in predicting fracture information based on seismic data. Therefore, detection wells are installed in the first target area.

[0094] 202. The computer equipment acquires reference fracture information, which is fracture information obtained through the detection well and is used to indicate the fracture at the detection well.

[0095] In this embodiment of the application, the reference fracture information is obtained through the detection well. Therefore, the reference fracture information can be considered to be real and accurate fracture information.

[0096] The reference fracture information may be one or more of the following: imaging data, intensity information, and orientation information of the fracture at the well site. This application does not limit the reference fracture information.

[0097] 203. The computer equipment uses the reference fracture information as a constraint to perform ellipse fitting on the OVT gather, and obtains the ellipse fitting result of the first target area, so that the fracture information of the well represented by the ellipse fitting result is consistent with the reference fracture information.

[0098] When the computer equipment performs ellipse fitting on the OVT gather, it uses the reference fracture information as a constraint condition to make the ellipse fitting result meet the requirements of the reference fracture information. That is, the fracture information of the well at the detection point represented by the ellipse fitting result is consistent with the reference fracture information.

[0099] In some embodiments, the ellipse fitting result for the first target region includes multiple ellipse fitting results, with each ellipse fitting result corresponding to a fracture, used to determine the fracture information of that fracture. Therefore, to achieve the requirement of reference fracture information, the ellipse fitting result is to perform ellipse fitting on the gather data near the well in the OVT gather. The resulting ellipse fitting result can accurately represent the fracture at the well. Since the obtained ellipse fitting result can accurately represent the fracture at the well, it indicates that the ellipse fitting method used is accurate. Because the gather data in the OVT gather are fitted using the same ellipse fitting method, other ellipse fitting results are also accurate.

[0100] 204. The computer device determines the crack information of the first target region based on the ellipse fitting result. The crack information of the first target region is used to indicate the cracks in the first target region.

[0101] In some embodiments, the major axis of the ellipse fitting result indicates the direction information of the crack, and the ratio of the major to minor axis of the ellipse fitting result indicates the intensity information of the crack.

[0102] The fracture information determination method provided in this application uses the actual fracture information at the well site as a constraint condition when performing ellipse fitting on the OVT gather, so that the fracture information at the well site represented by the ellipse fitting result is accurate. Since the fracture information at the well site represented by the ellipse fitting result is accurate, the accuracy of the fracture information of other fractures outside the well represented by the ellipse fitting result is also greatly improved. Therefore, the accuracy of determining fracture information is improved.

[0103] Figure 3 This is a flowchart illustrating a method for determining crack information provided in an embodiment of this application. This embodiment uses a computer device as an example for illustrative purposes. The method includes:

[0104] 301. The computer device determines a first target region and a third target region from the second target region. The first target region is the region to which the crack at the first target scale belongs, and the third target region is the region to which the crack at the second target scale belongs, wherein the second target scale is larger than the first target scale.

[0105] The first and second target scales can be any scale, and this application does not limit this, as long as the second target scale is greater than the first target scale. In some embodiments, the first and second target scales are determined by a technician in practical applications. In some embodiments, the first and second target scales are empirical values. In some embodiments, the first target scale is a small scale, and the second target scale is a medium scale.

[0106] In some embodiments, such as Figure 4 and Figure 5 As shown, the computer device determines the first target region and the third target region from the second target region, including: acquiring historical tectonic movement information and sedimentary history information of the second target region; acquiring post-stack seismic data of the second target region, and determining the seismic attributes of the second target region based on the post-stack seismic data; determining the fracture distribution of the second target region based on the historical tectonic movement information, sedimentary history information and seismic attributes of the second target region; and determining the first target region to which the first target-scale fracture belongs and the second target region to which the second target-scale fracture belongs based on the fracture distribution.

[0107] Among them, historical tectonic movement information is used to represent the compression experienced by the second target area under tectonic movement during historical processes. Sedimentary history information is used to represent the sedimentary history of the rock strata in the second target area, and is used to analyze information such as the composition and thickness of each rock strata in the second target area.

[0108] Seismic attributes are geometric, kinematic, dynamic, and statistical characteristics of seismic waves obtained through mathematical transformations of pre-stack seismic data. The presence of underground fissures causes differences in the lateral rock physical characteristics of strata, resulting in varying degrees of change in information such as the wavelength, frequency, and amplitude of seismic waves—the seismic response of the fissures. These seismic responses can be reflected by seismic attributes. In some embodiments, these seismic attributes include one or more of coherence attributes, curvature attributes, edge detection attributes, and ant-body attributes. This application does not limit the seismic attributes described herein.

[0109] The crack distribution in the second target region is used to represent the macroscopic distribution pattern of cracks in the second target region. Based on this macroscopic distribution pattern, the second target region is divided into the first target region and the third target region, enabling regional prediction for cracks of different scales.

[0110] For example, the reservoirs in the second target area are generally located on the footwall of fault zone A. Along fault zone A, the reservoirs mainly develop Class I faults. With fault B as the boundary, the development of faults differs between the north and south. This is primarily because the northwestern part of the second target area is subjected to compression from fault zone A and multiple reverse faults in the east, resulting in stronger formation stress and a higher degree of reservoir fragmentation, leading to the development of Class II faults. In contrast, the southern part mainly develops several strike-slip faults, with weaker formation strata, resulting in the development of Class III faults. The central reservoirs mainly develop Class II faults, with no significant fault displacement on the seismic phase axis. The eastern part develops Class III faults, with only distortion on the phase axis. Based on the fault classification and seismic attributes of the second target area, the first target area is determined from within the second target area.

[0111] It should be noted that the embodiments in this application are merely examples of "determining the fracture distribution in the second target area based on historical tectonic movement information, sedimentary history information, and seismic attributes of the second target area" to illustrate the process of "determining the fracture distribution in the second target area." In another embodiment, the computer device determines the maximum likelihood fracture prediction result for the second target area, and determines the fracture distribution in the second target area based on the maximum likelihood fracture prediction result. In other embodiments, the computer device determines the fracture distribution in the second target area based on at least one of historical tectonic movement information, sedimentary history information, seismic attributes, and maximum likelihood fracture prediction results for the second target area.

[0112] The seismic data includes offset and azimuth information. For each sampling point containing offset and azimuth information, the similarity is calculated. Then, only the minimum similarity (called the maximum likelihood volume) and the corresponding offset and azimuth information are retained. The similarity is normalized across the entire area to reflect the linear relationship of the fault.

[0113] 302. The computer equipment acquires the vector offset distance surface element OVT gather corresponding to the first target area, which is equipped with a detection well.

[0114] In this embodiment, ellipse fitting is required based on the anisotropic characteristics of the OVT gather; therefore, the OVT gather needs to have good anisotropic characteristics. In one possible implementation, the anisotropic characteristics of the OVT gather are verified based on known fracture information. The computer device acquires the OVT gather corresponding to the first target region, including: acquiring candidate OVT gathers corresponding to the first target region; determining the fracture development characteristics at the probe well based on the reference fracture information; determining the anisotropic characteristics of the candidate OVT gather at the probe well based on the candidate OVT gather; and, if the anisotropic characteristics match the development characteristics, identifying the candidate OVT gather as the OVT gather.

[0115] Specifically, the more developed the fractures at the probe well, the stronger the anisotropy of the OVT gather at that well; conversely, the less developed the fractures at the probe well, the weaker the anisotropy of the OVT gather. If the anisotropy of a candidate OVT gather at the probe well conforms to this rule, then the anisotropy matches the development characteristic, and the candidate OVT gather can be identified as the correct OVT gather. If the anisotropy of a candidate OVT gather at the probe well does not conform to this rule, then the candidate OVT gather corresponding to the first target region is reacquired until a candidate OVT gather that conforms to this rule is obtained.

[0116] In some embodiments, the candidate OVT gathers are optimized before verifying their anisotropic characteristics. Optionally, the candidate OVT gathers are optimized to improve their signal-to-noise ratio. Optionally, the candidate OVT gathers are optimized to improve their resolution. Optionally, the candidate OVT gathers are optimized to preserve fidelity and amplitude, etc.

[0117] For example, candidate OVT gathers are examined, and based on the requirements of the target layer fracture system and pre-stack fracture prediction, interpretive optimization of the gathers is carried out in terms of signal-to-noise ratio, resolution, and amplitude fidelity. Then, anisotropic forward modeling analysis is performed on the optimized candidate OVT gathers to obtain the linear relationship between amplitude at the well fracture and offset. Based on this linear relationship and reference fracture information at the well fracture, the accuracy of the anisotropic characteristics of the candidate OVT gathers is verified. Of course, before verifying the accuracy of the anisotropic characteristics of the candidate OVT gathers, the time delay and reflected wave amplitude of near-vertical incident split P-waves at the well can also be analyzed to verify whether the candidate OVT gathers possess anisotropic characteristics. Through optimization and quality control of the candidate OVT gathers, the subsequent results determined based on the OVT gathers are more accurate.

[0118] Furthermore, the fracture development and principal stress direction exhibit acute-angle shear, with cracks developing along the distribution direction of the main fracture. Based on the crack distribution, we can determine the development direction range of the main fracture, thereby determining the development direction range of the cracks. Optimizing the azimuth angles of the gather data that are sensitive to cracks, eliminating interference from gather data with other azimuth angles, and highlighting the main crack development direction can make the final prediction results more consistent with geological conditions. Moreover, the anisotropy of cracks is more pronounced in the long offset range; therefore, it is also essential to select a reasonable offset range before predicting crack information.

[0119] In another possible implementation, obtaining the vector offset surface element (OVT) gather corresponding to the first target area includes: sorting the seismic data of the first target area based on azimuth and offset information to obtain a first OVT gather; determining an azimuth range based on the development direction range of the main fault in the first target area, wherein the azimuth range is the same as or similar to the development direction range; selecting a second OVT gather belonging to the azimuth range from the first OVT gather; dividing the second OVT gather into third OVT gathers belonging to different offset ranges; determining the anisotropy characteristics of the third OVT gathers belonging to each offset range; retaining the third OVT gather with the strongest anisotropy characteristics and discarding the rest of the third OVT gathers to obtain the OVT gathers.

[0120] In some embodiments, when determining the anisotropy characteristics of the third OVT gather belonging to each offset range, the prediction result can be determined based on the third OVT gather. If the prediction result matches the actual result, then the anisotropy characteristics of the third OVT gather are strong; if the prediction result does not match the actual result, then the anisotropy characteristics of the third OVT gather are weak.

[0121] For example, the OVT gather was divided into three incident angle ranges: 0° to 9°, 7° to 17°, and 15° to 24°. The fracture prediction results for the OVT gather within the 0° to 9° incident angle range were distorted, almost entirely due to background noise interference. The fracture prediction results for the OVT gather within the 7° to 17° incident angle range were relatively stable, but lacked anisotropic characteristics. The fracture prediction results for the OVT gather within the 15° to 24° incident angle range showed good agreement with the data from the exploratory wells, and exhibited significant anisotropy.

[0122] It should be noted that the embodiments in this application are merely examples of optimizing tell data, quality control tell data, and screening tell data to illustrate the preprocessing process of tell data. In some embodiments, such as Figure 5 As shown, the computer equipment first optimizes the gather data, then performs quality control on the gather data. If the gather data meets the requirements, gather data within the sensitive azimuth range and sensitive offset range are selected from the gather data for subsequent processing.

[0123] 303. The computer equipment acquires reference fracture information, which is obtained through the detection of fractures in the well and is used to indicate the fractures at the well.

[0124] Step 303 is the same as step 202 above, and will not be described in detail here.

[0125] 304. The computer equipment uses the reference fracture information as a constraint to perform ellipse fitting on the OVT gather, and obtains the ellipse fitting result of the first target area, so that the fracture information of the probe well represented by the ellipse fitting result is consistent with the reference fracture information.

[0126] Using reference fracture information as a constraint can be seen as using it as a standard for ellipse fitting. The computer equipment fits the gather data at the detection well into an ellipse fitting result that can accurately detect fractures at the well. Then, based on this fitting standard, it fits other gather data to obtain an accurate ellipse fitting result for the first target region.

[0127] In one possible implementation, the computer device uses reference fracture information as a constraint to perform elliptic fitting on the OVT gather, obtaining an elliptic fitting result so that the fracture information at the probe well represented by the elliptic fitting result is consistent with the reference fracture information. This includes: determining an elliptic fitting template based on the reference fracture information and the gather data corresponding to the probe well in the OVT gather; the elliptic fitting template is used to fit the gather data into an elliptic fitting result representing the reference fracture information; and performing elliptic fitting on the OVT gather based on the elliptic fitting template to obtain multiple elliptic fitting results, which are used to indicate multiple fractures in the first target region, with each elliptic fitting result indicating one fracture.

[0128] Optionally, the computer device determines an ellipse fitting template based on the reference fracture information and the gather data corresponding to the exploration well in the OVT gather, including: adjusting the ellipse fitting relationship data based on the reference fracture information and the gather data to obtain adjusted ellipse fitting relationship data, so that the adjusted ellipse fitting relationship data fits the gather data into an ellipse fitting result representing the reference fracture information, and the ellipse fitting relationship data is used to perform ellipse fitting on the OVT gather; and determining the adjusted ellipse fitting relationship data as the ellipse fitting template.

[0129] The ellipse fitting relationship data is used to perform ellipse fitting processing on the gather data to obtain the ellipse fitting result. In some embodiments, the ellipse fitting relationship data is the least squares formula, Ruger formula, etc. This application does not limit the ellipse fitting relationship data.

[0130] The parameter tuning process for the ellipse fitting data can be performed by adjusting the coefficients in the ellipse fitting data or by adding loss parameters to the ellipse fitting data. This application does not limit the parameter tuning method.

[0131] It should be noted that fractures are influenced by factors such as the diagenetic environment and the nature, direction, and magnitude of tectonic stress, which can alter the intensity and direction of fracture development. Considering this, we can divide the first target region into sub-regions. In one possible implementation, the ellipse fitting template is determined based on the reference fracture information and the gather data corresponding to the probe well in the OVT (Output Dynamics Test) data set. This includes: dividing the first target region into multiple first target sub-regions based on fracture influence information; the fracture influence information at different locations within these sub-regions is the same or similar; this fracture influence information represents the factors causing changes in fracture information; and probe wells are set in each of these sub-regions. For any given first target sub-region, the ellipse fitting template corresponding to that sub-region is determined based on the reference fracture information obtained from the probe wells within that sub-region and the gather data corresponding to the probe wells in the OVT data set.

[0132] The computer device performs elliptical fitting processing on the OVT gather based on the elliptical fitting template, and obtains multiple elliptical fitting results, including: for any first target sub-region, based on the elliptical fitting template corresponding to the first target sub-region, performing elliptical fitting processing on the gather data corresponding to the first target sub-region in the OVT gather, and obtaining multiple elliptical fitting results, which are used to indicate multiple cracks in the first target sub-region.

[0133] To obtain more accurate fracture information, multiple probe wells can be set in the first target area. The ellipse fitting standard is determined based on a subset of the probe wells, and the ellipse fitting results are verified based on the remaining probe wells. In one possible implementation, the first target area has multiple probe wells, including a first probe well and a second probe well. The ellipse fitting template is determined based on reference fracture information detected by the first probe well and the corresponding gather data of the first probe well. The method further includes: after obtaining the multiple ellipse fitting results, determining a target ellipse fitting result corresponding to the second probe well from the multiple ellipse fitting results. This target ellipse fitting result is used to indicate the fracture at the second probe well. Based on the reference fracture information detected by the second probe well, the target ellipse fitting result is verified to obtain a verification result. If the verification result indicates that the fracture information represented by the target ellipse fitting result matches the reference fracture information detected by the second probe well, the step of determining the fracture information of the first target area based on the ellipse fitting result is performed.

[0134] The first detection well can be any one or more of the multiple detection wells, and the second detection well can be any one or more of the multiple detection wells. This application embodiment does not limit the first detection well and the second detection well.

[0135] If the target ellipse fitting result matches the reference fracture information detected by the second exploration well, it indicates that the ellipse fitting results of other fractures are accurate, and the fracture situation in the first target area can be accurately determined based on the ellipse fitting result of the first target area.

[0136] It should be noted that the response characteristics of cracks differ in the frequency domain, amplitude domain, and velocity domain. Therefore, in this embodiment, multi-domain ellipse fitting can be performed first to detect the reliability of the ellipse fitting results in each domain, and finally the sensitive domain can be determined. Based on the data of the sensitive domain, the above step 304 can be executed.

[0137] In one possible implementation, the OVT gather includes multiple types of data, including at least two of frequency data, amplitude data, or velocity data. A computer device uses the reference crack information as a constraint to perform ellipse fitting on the OVT gather, obtaining an ellipse fitting result for the first target region. This includes: performing ellipse fitting on each type of data in the OVT gather to obtain ellipse fitting results corresponding to each type of data; verifying each obtained ellipse fitting result based on the reference crack information to obtain a reference ellipse fitting result, which is the ellipse fitting result that best matches the reference crack information among the multiple obtained ellipse fitting results; determining the target type corresponding to the reference ellipse fitting result, which indicates the type of data that generated the reference ellipse fitting result; and using the reference crack information as the constraint to perform ellipse fitting on the data in the OVT gather belonging to the target type to obtain the ellipse fitting result.

[0138] The computer equipment can perform ellipse fitting on each type of data near the OVT concentrator well. The resulting ellipse fitting result is the ellipse fitting result corresponding to the fracture at the well. Based on this ellipse fitting result, the fracture information at the well is determined, and it is confirmed whether the fracture information is consistent with the reference fracture information. If they are consistent, then the ellipse fitting result is the ellipse fitting result that matches the reference fracture information.

[0139] Computer equipment can also perform ellipse fitting on all data of each type in the OVT gather, obtaining multiple ellipse fitting results for each data type, with each ellipse fitting result corresponding to one fracture. From these multiple ellipse fitting results, the ellipse fitting result corresponding to the fracture at the corresponding exploration well is determined, and this ellipse fitting result is verified based on reference fracture information.

[0140] Another point to note is that various ellipse fitting methods can be used, such as least squares, Fourier functions, or spectral gradients. Different methods yield ellipse fitting results with varying reliability. The reliability of each method can be tested to find the most suitable method, and then the ellipse fitting process in step 304 above can be performed based on that method.

[0141] In one possible implementation, the computer device uses the reference crack information as a constraint to perform elliptical fitting on the OVT gather to obtain the elliptical fitting result for the first target region. This includes: using multiple elliptical fitting methods to perform elliptical fitting on the OVT gather to obtain multiple elliptical fitting results for the first target region; verifying the multiple elliptical fitting results based on the reference crack information to obtain a reference elliptical fitting result, which is the elliptical fitting result that best matches the reference crack information among the multiple elliptical fitting results; determining the target elliptical fitting method corresponding to the reference elliptical fitting result; using the reference crack information as the constraint, performing elliptical fitting on the data belonging to the target type in the OVT gather using the target elliptical fitting method to obtain the elliptical fitting result.

[0142] Similarly, when computer equipment performs ellipse fitting on OVT gathers, it can perform ellipse fitting on only the gather data near the well in the OVT gather, or it can perform ellipse fitting on all OVT gathers. These will not be elaborated on here.

[0143] For example, such as Figure 5 As shown, after optimizing the sensitive azimuth and sensitive offset of the OVT gather, multi-domain, multi-method elliptic fitting processing is performed to determine the sensitive domain and sensitive method of fractures in the first target region. Based on factors such as the diagenetic environment, nature, direction, and magnitude of tectonic stress in the first target region, the region is divided into sub-region 1 and sub-region 2. The main lithology of sub-region 1 is dolomitic sandstone, and the main lithology of sub-region 2 is conglomerate-dolomitic sandstone. Sub-region 1 has two exploration wells, and sub-region 2 has one exploration well. The computer equipment can use the reference fracture information obtained from any exploration well in sub-region 1 as a constraint to perform elliptic fitting processing on the OVT gather data of sub-region 1, and then verify the elliptic fitting result based on the reference fracture information obtained from the other exploration well. Similarly, the computer equipment can use the reference fracture information obtained from the exploration well in sub-region 2 as a constraint to perform elliptic fitting processing on the OVT gather data of sub-region 2.

[0144] 305. The computer device determines the crack information of the first target region based on the ellipse fitting result, and the crack information of the first target region is used to indicate the cracks in the first target region.

[0145] Step 305 is similar to step 204 above, and will not be described in detail here.

[0146] It should be noted that the embodiments of this application can determine the crack strength information based on the ellipse fitting results. Alternatively, the crack direction information can be determined using another method. The embodiments of this application do not limit the method for determining the crack direction information; any method from related technologies can be used.

[0147] 306. The computer equipment determines the crack information of the third target area based on the seismic attributes of the third target area.

[0148] The seismic attributes of the third target region can be determined based on post-stack seismic data of the third target region. These seismic attributes may include any one or more seismic attributes such as coherence attributes and curvature attributes, and this embodiment of the application does not limit them.

[0149] 307. The computer equipment determines the crack development area from the second target area based on the crack information of the first target area and the crack information of the third target area.

[0150] The fracture information from the first and third target areas can effectively characterize the planar distribution pattern of fracture development zones in the second target area. Combined with the lithofacies and seismic data of the second target area, favorable fracture seismic facies zones can be selected, providing a basis for well location deployment and the selection of development test areas, and laying the foundation for the establishment and production of oil and gas reservoirs.

[0151] The fracture information determination method provided in this application uses the actual fracture information at the well site as a constraint condition when performing ellipse fitting on the OVT gather, so that the fracture information at the well site represented by the ellipse fitting result is accurate. Since the fracture information at the well site represented by the ellipse fitting result is accurate, the accuracy of the fracture information of other fractures outside the well represented by the ellipse fitting result is also greatly improved. Therefore, the accuracy of determining fracture information is improved.

[0152] Figure 6 This is a schematic diagram of a crack information determination device provided in an embodiment of this application. See also... Figure 6 The device includes:

[0153] The first acquisition module 601 is used to acquire the vector offset distance surface element OVT gather corresponding to the first target area, which is provided with a detection well.

[0154] The second acquisition module 602 is used to acquire reference fracture information, which is fracture information obtained by the probe well and is used to indicate the fracture at the probe well.

[0155] The fitting module 603 is used to perform elliptical fitting on the OVT gather using the reference fracture information as a constraint condition, so as to obtain the elliptical fitting result of the first target area, so that the fracture information of the well represented by the elliptical fitting result is consistent with the reference fracture information.

[0156] The information determination module 604 is used to determine the crack information of the first target area based on the ellipse fitting result. The crack information of the first target area is used to indicate the cracks in the first target area.

[0157] like Figure 7 As shown, in one possible implementation, the fitting module 603 includes:

[0158] The template determination unit 6031 is used to determine an ellipse fitting template based on the reference fracture information and the gather data corresponding to the well in the OVT gather. The ellipse fitting template is used to fit the gather data into an ellipse fitting result that represents the reference fracture information.

[0159] The fitting unit 6032 is used to perform elliptical fitting processing on the OVT gather based on the elliptical fitting template to obtain multiple elliptical fitting results. These multiple elliptical fitting results are used to indicate multiple cracks in the first target region, and one elliptical fitting result indicates one crack.

[0160] In one possible implementation, the template determining unit 6031 is used to perform parameter tuning on the ellipse fitting relationship data based on the reference crack information and the gather data to obtain adjusted ellipse fitting relationship data, so that the adjusted ellipse fitting relationship data fits the gather data into an ellipse fitting result representing the reference crack information. The ellipse fitting relationship data is used to perform ellipse fitting on the OVT gather. The adjusted ellipse fitting relationship data is determined as the ellipse fitting template.

[0161] In one possible implementation, the template determining unit 6031 is used to divide the first target region into multiple first target sub-regions based on the fracture influence information of the first target region. The fracture influence information of different locations in the first target sub-regions is the same or similar. The fracture influence information is used to represent the factors that cause changes in the fracture information. Each of the multiple first target sub-regions is provided with a detection well. For any first target sub-region, based on the reference fracture information detected by the detection well in the first target sub-region and the gather data corresponding to the detection well in the first target sub-region in the OVT gather, the ellipse fitting template corresponding to the first target sub-region is determined.

[0162] The fitting unit 6032 is used to perform elliptical fitting processing on the gather data corresponding to the first target sub-region in the OVT gather based on the elliptical fitting template corresponding to the first target sub-region for any first target sub-region, and obtain multiple elliptical fitting results. The multiple elliptical fitting results are used to indicate multiple cracks in the first target sub-region.

[0163] In one possible implementation, the first target area is provided with multiple detection wells, including a first detection well and a second detection well. The ellipse fitting template is determined based on reference fracture information obtained from the first detection well and the corresponding gather data of the first detection well. The device further includes:

[0164] The result determination module 605 is used to determine the target ellipse fitting result corresponding to the second exploration well from the multiple ellipse fitting results after obtaining the multiple ellipse fitting results. The target ellipse fitting result is used to indicate the fracture at the second exploration well.

[0165] The verification module 606 is used to verify the target ellipse fitting result based on the reference fracture information obtained from the second exploration well, and obtain the verification result.

[0166] The information determination module 604 is used to perform the step of determining the fracture information of the first target area based on the ellipse fitting result when the verification result indicates that the fracture information represented by the target ellipse fitting result matches the reference fracture information detected by the second exploration well.

[0167] In one possible implementation, the OVT gather includes multiple types of data, including at least two of frequency data, amplitude data, or velocity data; the fitting module 603 includes:

[0168] The fitting unit 6032 is used to perform ellipse fitting processing on each type of data in the OVT data set to obtain the ellipse fitting result corresponding to each type of data.

[0169] The verification unit 6033 is used to verify each ellipse fitting result obtained based on the reference crack information to obtain a reference ellipse fitting result, which is the ellipse fitting result that best matches the reference crack information among the multiple ellipse fitting results obtained.

[0170] The type determination unit 6034 is used to determine the target type corresponding to the reference ellipse fitting result, and the target type is used to indicate the type of data that generated the reference ellipse fitting result.

[0171] The fitting unit 6032 is also used to use the reference crack information as the constraint condition to perform ellipse fitting on the data belonging to the target type in the OVT concentrator, and obtain the ellipse fitting result.

[0172] In one possible implementation, the first acquisition module 601 is used to acquire candidate OVT gathers corresponding to the first target area; determine the development characteristics of fractures at the exploration well based on the reference fracture information; determine the anisotropy characteristics of the candidate OVT gathers at the exploration well based on the candidate OVT gathers; and determine the candidate OVT gathers as the OVT gathers if the anisotropy characteristics match the development characteristics.

[0173] In one possible implementation, the first acquisition module 601 is used to sort the seismic data of the first target area based on azimuth information and offset information to obtain a first OVT gather; determine the azimuth range based on the development direction range of the main fault in the first target area, wherein the azimuth range is the same as or similar to the development direction range; select a second OVT gather belonging to the azimuth range from the first OVT gather; divide the second OVT gather into third OVT gathers belonging to different offset ranges; determine the anisotropy characteristics of the third OVT gathers belonging to each offset range; retain the third OVT gather with the strongest anisotropy characteristics and discard the rest of the third OVT gathers to obtain the OVT gather.

[0174] Figure 8 This illustration shows a structural block diagram of a terminal 800 provided in an exemplary embodiment of this application. The terminal 800 can be a portable mobile terminal, such as a smartphone, tablet computer, MP3 player (Moving Picture Experts Group Audio Layer III), MP4 player (Moving Picture Experts Group Audio Layer IV), laptop computer, or desktop computer. The terminal 800 may also be referred to as a user device, portable terminal, laptop terminal, desktop terminal, or other names.

[0175] Typically, terminal 800 includes a processor 801 and a memory 802.

[0176] Processor 801 may include one or more processing cores, such as a quad-core processor or an octa-core processor. Processor 801 may be implemented using at least one hardware form selected from DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), and PLA (Programmable Logic Array). Processor 801 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, processor 801 may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content to be displayed on the screen. In some embodiments, processor 801 may also include an AI (Artificial Intelligence) processor, which is used to handle computational operations related to machine learning.

[0177] The memory 802 may include one or more computer-readable storage media, which may be non-transitory. The memory 802 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments, the non-transitory computer-readable storage media in the memory 802 are used to store at least one piece of program code, which is executed by the processor 801 to implement the operations performed by the terminal in the crack information determination method provided in the method embodiments of this application.

[0178] In some embodiments, the terminal 800 may also optionally include a peripheral device interface 803 and at least one peripheral device. The processor 801, memory 802, and peripheral device interface 803 can be connected via a bus or signal line. Each peripheral device can be connected to the peripheral device interface 803 via a bus, signal line, or circuit board. Specifically, the peripheral device includes at least one of the following: a radio frequency circuit 804, a display screen 805, a camera assembly 806, an audio circuit 807, a positioning assembly 808, and a power supply 809.

[0179] Peripheral device interface 803 can be used to connect at least one I / O (Input / Output) related peripheral device to processor 801 and memory 802. In some embodiments, processor 801, memory 802 and peripheral device interface 803 are integrated on the same chip or circuit board; in some other embodiments, any one or two of processor 801, memory 802 and peripheral device interface 803 can be implemented on separate chips or circuit boards, which is not limited in this embodiment.

[0180] The radio frequency (RF) circuit 804 is used to receive and transmit RF (Radio Frequency) signals, also known as electromagnetic signals. The RF circuit 804 communicates with communication networks and other communication devices via electromagnetic signals. The RF circuit 804 converts electrical signals into electromagnetic signals for transmission, or converts received electromagnetic signals back into electrical signals. Optionally, the RF circuit 804 includes: an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a user identity module card, etc. The RF circuit 804 can communicate with other terminals through at least one wireless communication protocol. This wireless communication protocol includes, but is not limited to: the World Wide Web, metropolitan area networks, intranets, various generations of mobile communication networks (2G, 3G, 4G, and 5G), wireless local area networks, and / or WiFi (Wireless Fidelity) networks. In some embodiments, the RF circuit 804 may also include circuitry related to NFC (Near Field Communication), which is not limited in this application.

[0181] Display screen 805 is used to display a UI (User Interface). This UI may include graphics, text, icons, videos, and any combination thereof. When display screen 805 is a touch display screen, it also has the ability to collect touch signals on or above its surface. These touch signals can be input as control signals to processor 801 for processing. In this case, display screen 805 can also be used to provide virtual buttons and / or a virtual keyboard, also known as soft buttons and / or a soft keyboard. In some embodiments, there may be one display screen 805, disposed on the front panel of terminal 800; in other embodiments, there may be at least two display screens, disposed on different surfaces of terminal 800 or in a folded design; in other embodiments, display screen 805 may be a flexible display screen, disposed on a curved or folded surface of terminal 800. Furthermore, display screen 805 may be configured as a non-rectangular irregular shape, i.e., a non-rectangular screen. Display screen 805 may be made of materials such as LCD (Liquid Crystal Display) or OLED (Organic Light-Emitting Diode).

[0182] The camera assembly 806 is used to acquire images or videos. Optionally, the camera assembly 806 includes a front-facing camera and a rear-facing camera. Typically, the front-facing camera is located on the front panel of the terminal, and the rear-facing camera is located on the back of the terminal. In some embodiments, there are at least two rear-facing cameras, which are any one of a main camera, a depth-sensing camera, a wide-angle camera, and a telephoto camera, to achieve background blurring by fusion of the main camera and the depth-sensing camera, panoramic shooting by fusion of the main camera and the wide-angle camera, VR (Virtual Reality) shooting, or other fusion shooting functions. In some embodiments, the camera assembly 806 may also include a flash. The flash can be a single-color temperature flash or a dual-color temperature flash. A dual-color temperature flash refers to a combination of a warm-light flash and a cool-light flash, which can be used for light compensation at different color temperatures.

[0183] The audio circuit 807 may include a microphone and a speaker. The microphone is used to collect sound waves from the user and the environment, converting the sound waves into electrical signals that are input to the processor 801 for processing, or input to the radio frequency circuit 804 to achieve voice communication. For stereo sound acquisition or noise reduction purposes, multiple microphones may be used, each located at a different part of the terminal 800. The microphone may also be an array microphone or an omnidirectional microphone. The speaker is used to convert the electrical signals from the processor 801 or the radio frequency circuit 804 into sound waves. The speaker may be a conventional diaphragm speaker or a piezoelectric ceramic speaker. When the speaker is a piezoelectric ceramic speaker, it can convert electrical signals not only into audible sound waves but also into inaudible sound waves for purposes such as distance measurement. In some embodiments, the audio circuit 807 may also include a headphone jack.

[0184] The positioning component 808 is used to determine the current geographical location of the terminal 800 in order to enable navigation or LBS (Location Based Service). The positioning component 808 can be a positioning component based on the US GPS (Global Positioning System), China's BeiDou system, or Russia's Galileo system.

[0185] Power supply 809 is used to supply power to the various components in terminal 800. Power supply 809 can be AC ​​power, DC power, a disposable battery, or a rechargeable battery. When power supply 809 includes a rechargeable battery, the rechargeable battery can be a wired rechargeable battery or a wireless rechargeable battery. A wired rechargeable battery is a battery that is charged via a wired line, and a wireless rechargeable battery is a battery that is charged via a wireless coil. The rechargeable battery can also be used to support fast charging technology.

[0186] In some embodiments, the terminal 800 further includes one or more sensors 810. The one or more sensors 810 include, but are not limited to, an accelerometer 811, a gyroscope 812, a pressure sensor 813, an optical sensor 815, and a proximity sensor 816.

[0187] Accelerometer 811 can detect the magnitude of acceleration on the three coordinate axes of a coordinate system established by terminal 800. For example, accelerometer 811 can be used to detect the components of gravitational acceleration on the three coordinate axes. Processor 801 can control display screen 805 to display the user interface in either a landscape or portrait view based on the gravitational acceleration signal acquired by accelerometer 811. Accelerometer 811 can also be used for games or for acquiring user motion data.

[0188] The gyroscope sensor 812 can detect the orientation and rotation angle of the terminal 800. The gyroscope sensor 812, in conjunction with the accelerometer sensor 811, can collect 3D motion data from the user on the terminal 800. Based on the data collected by the gyroscope sensor 812, the processor 801 can perform the following functions: motion sensing (e.g., changing the UI based on the user's tilt), image stabilization during shooting, game control, and inertial navigation.

[0189] The pressure sensor 813 can be disposed on the side bezel of the terminal 800 and / or on the lower layer of the display screen 805. When the pressure sensor 813 is disposed on the side bezel of the terminal 800, it can detect the user's grip signal on the terminal 800, and the processor 801 can perform left / right hand recognition or quick operation based on the grip signal collected by the pressure sensor 813. When the pressure sensor 813 is disposed on the lower layer of the display screen 805, the processor 801 can control the operable controls on the UI interface based on the user's pressure operation on the display screen 805. The operable controls include at least one of button controls, scroll bar controls, icon controls, and menu controls.

[0190] An optical sensor 815 is used to collect ambient light intensity. In one embodiment, the processor 801 can control the display brightness of the display screen 805 based on the ambient light intensity collected by the optical sensor 815. Specifically, when the ambient light intensity is high, the display brightness of the display screen 805 is increased; when the ambient light intensity is low, the display brightness of the display screen 805 is decreased. In another embodiment, the processor 801 can also dynamically adjust the shooting parameters of the camera assembly 806 based on the ambient light intensity collected by the optical sensor 815.

[0191] The proximity sensor 816, also known as a distance sensor, is typically located on the front panel of the terminal 800. The proximity sensor 816 is used to detect the distance between the user and the front of the terminal 800. In one embodiment, when the proximity sensor 816 detects that the distance between the user and the front of the terminal 800 is gradually decreasing, the processor 801 controls the display screen 805 to switch from a screen-on state to a screen-off state; when the proximity sensor 816 detects that the distance between the user and the front of the terminal 800 is gradually increasing, the processor 801 controls the display screen 805 to switch from a screen-off state to a screen-on state.

[0192] Those skilled in the art will understand that Figure 8 The structure shown does not constitute a limitation on terminal 800 and may include more or fewer components than shown, or combine certain components, or use different component arrangements.

[0193] See Figure 9 , Figure 9This is a schematic diagram of a server structure provided in an embodiment of this application. The server 900 can vary considerably due to different configurations or performance. It may include a processor (central processing unit, CPU) 901 and a memory 902. The memory 902 stores at least one line of program code, which is loaded and executed by the processor 901 to implement the operations performed by the server in the aforementioned data quality detection method. Of course, the server 900 may also have wired or wireless network interfaces, a keyboard, and input / output interfaces for input and output. The server 900 may also include other components for implementing device functions, which will not be elaborated here.

[0194] In an exemplary embodiment, a computer-readable storage medium is also provided, which stores at least one piece of program code that is loaded and executed by a processor to implement the crack information determination method in the above embodiments.

[0195] In an exemplary embodiment, a computer program product is also provided, which stores at least one piece of program code that is loaded and executed by a processor to implement the crack information determination method in the above embodiments.

[0196] In some embodiments, the computer program involved in the present application embodiments may be deployed and executed on a computer device, or executed on multiple computer devices located in one location, or executed on multiple computer devices distributed in multiple locations and interconnected through a communication network. Multiple computer devices distributed in multiple locations and interconnected through a communication network may constitute a blockchain system.

[0197] Those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware or by a program instructing related hardware. The program can be stored in a computer-readable storage medium, such as a read-only memory, a disk, or an optical disk.

[0198] The above description is only for the purpose of enabling those skilled in the art to understand the technical solution of this application, and is not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for determining crack information, characterized in that, The method includes: Obtain the vector offset surface element OVT gather corresponding to the first target region, where a detection well is set; Obtain reference fracture information, which is fracture information obtained through the detection well and used to indicate fractures at the detection well; Based on the reference fracture information and the gather data corresponding to the well in the OVT gather, an ellipse fitting template is determined. The ellipse fitting template is used to fit the gather data into an ellipse fitting result that represents the reference fracture information. Based on the ellipse fitting template, the OVT gather is subjected to ellipse fitting processing to obtain multiple ellipse fitting results. The multiple ellipse fitting results are used to indicate multiple cracks in the first target region, and one ellipse fitting result indicates one crack. Based on the ellipse fitting result, crack information of the first target region is determined, and the crack information of the first target region is used to indicate cracks in the first target region. The step of determining the ellipse fitting template based on the reference fracture information and the gather data corresponding to the detection well in the OVT gather includes: Based on the reference crack information and the gather data, the ellipse fitting relationship data is subjected to parameter adjustment to obtain the adjusted ellipse fitting relationship data, so that the adjusted ellipse fitting relationship data fits the gather data into an ellipse fitting result representing the reference crack information. The ellipse fitting relationship data is used to perform ellipse fitting on the OVT gather. The adjusted ellipse fitting relationship data is used as the ellipse fitting template.

2. The method according to claim 1, characterized in that, The step of determining the ellipse fitting template based on the reference fracture information and the gather data corresponding to the well in the OVT gather further includes: Based on the fracture impact information of the first target area, the first target area is divided into multiple first target sub-regions. The fracture impact information of different locations in the first target sub-regions is the same or similar. The fracture impact information is used to represent the factors that cause the fracture information to change. Each of the multiple first target sub-regions is equipped with a detection well. For any first target sub-region, based on the reference fracture information obtained by the probe wells in the first target sub-region and the gather data corresponding to the probe wells in the first target sub-region in the OVT gather, the ellipse fitting template corresponding to the first target sub-region is determined. The OVT gather is subjected to elliptical fitting processing based on the elliptical fitting template to obtain multiple elliptical fitting results, including: For any first target sub-region, based on the ellipse fitting template corresponding to the first target sub-region, the gather data corresponding to the first target sub-region in the OVT gather is subjected to ellipse fitting processing to obtain multiple ellipse fitting results. The multiple ellipse fitting results are used to indicate multiple cracks in the first target sub-region.

3. The method according to claim 1, characterized in that, The first target area is provided with multiple detection wells, including a first detection well and a second detection well. The ellipse fitting template is determined based on reference fracture information obtained from the first detection well and the corresponding gather data of the first detection well. The method further includes: After obtaining the plurality of ellipse fitting results, the target ellipse fitting result corresponding to the second exploration well is determined from the plurality of ellipse fitting results. The target ellipse fitting result is used to indicate the fracture at the second exploration well. Based on the reference fracture information obtained from the second detection well, the target ellipse fitting result is verified to obtain the verification result. If the verification result indicates that the fracture information represented by the target ellipse fitting result matches the reference fracture information detected by the second exploration well, the step of determining the fracture information of the first target area based on the ellipse fitting result is performed.

4. The method according to claim 1, characterized in that, The OVT gather includes multiple types of data, including at least two of frequency data, amplitude data, or velocity data; the step of using the reference crack information as a constraint to perform ellipse fitting processing on the OVT gather to obtain the ellipse fitting result for the first target region includes: Based on each type of data in the OVT data set, ellipse fitting is performed to obtain the ellipse fitting result corresponding to each type of data. Based on the reference crack information, each ellipse fitting result is verified to obtain a reference ellipse fitting result, which is the ellipse fitting result that best matches the reference crack information among the multiple ellipse fitting results obtained. Determine the target type corresponding to the reference ellipse fitting result, wherein the target type is used to indicate the type of data that generated the reference ellipse fitting result; Using the reference crack information as the constraint condition, ellipse fitting is performed on the data belonging to the target type in the OVT gather to obtain the ellipse fitting result.

5. The method according to claim 1, characterized in that, The step of obtaining the vector offset surface element (OVT) gather corresponding to the first target region includes: Obtain the candidate OVT gather corresponding to the first target region; Based on the reference fracture information, the development characteristics of the fractures at the probe well are determined; Based on the candidate OVT gathers, determine the anisotropy characteristics of the candidate OVT gathers at the well. If the anisotropic feature matches the developmental feature, the candidate OVT tunnel set is determined as the OVT tunnel set.

6. The method according to claim 1, characterized in that, The step of obtaining the vector offset surface element (OVT) gather corresponding to the first target region includes: Based on azimuth and offset information, the seismic data of the first target area are sorted to obtain the first OVT gather; Based on the development direction range of the main fracture in the first target region, an azimuth range is determined, wherein the azimuth range is the same as or similar to the development direction range. Select a second OVT gather that belongs to the azimuth range from the first OVT gather; The second OVT gather is divided into third OVT gathers belonging to different offset ranges; Determine the anisotropy characteristics of the third OVT gathers belonging to each offset range; The third OVT set with the strongest anisotropy is retained, and the rest of the third OVT sets are discarded to obtain the OVT set.

7. A crack information determination device, characterized in that, The device includes: The first acquisition module is used to acquire the vector offset distance surface element OVT gather corresponding to the first target area, where a detection well is set in the first target area; The second acquisition module is used to acquire reference fracture information, which is fracture information obtained by the detection well and is used to indicate the fracture at the detection well. The fitting module is used to perform ellipse fitting on the OVT gather using the reference fracture information as a constraint condition, so as to obtain the ellipse fitting result of the first target area, so that the fracture information of the fracture at the probe well represented by the ellipse fitting result is consistent with the reference fracture information. The information determination module is used to determine the crack information of the first target region based on the ellipse fitting result, and the crack information of the first target region is used to indicate the cracks in the first target region; The fitting module includes: The template determination unit is used to perform parameter adjustment processing on the ellipse fitting relationship data based on the reference fracture information and the gather data corresponding to the exploration well in the OVT gather, to obtain adjusted ellipse fitting relationship data, so that the adjusted ellipse fitting relationship data fits the gather data into an ellipse fitting result representing the reference fracture information. The ellipse fitting relationship data is used to perform ellipse fitting on the OVT gather. The unit then determines an ellipse fitting template based on the adjusted ellipse fitting relationship data, and the ellipse fitting template is used to fit the gather data into an ellipse fitting result representing the reference fracture information. The fitting unit is used to perform elliptical fitting processing on the OVT gather based on the elliptical fitting template to obtain multiple elliptical fitting results. The multiple elliptical fitting results are used to indicate multiple cracks in the first target region, and one elliptical fitting result indicates one crack.

8. A computer device, characterized in that, The computer device includes a processor and a memory, the memory storing at least one piece of program code, which is loaded and executed by the processor to implement the crack information determination method as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores at least one piece of program code, which is loaded and executed by a processor to implement the crack information determination method as described in any one of claims 1 to 6.

Images