不规则样品的对准方法、对准系统及存储介质
By acquiring and analyzing images of irregular samples and calculating rotation and translation, the problem of aligning irregular samples was solved, thus improving processing quality and accuracy.
CN117557543BActive Publication Date: 2026-07-17RAINTREE SCI INSTR SHANGHAI
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- RAINTREE SCI INSTR SHANGHAI
- Filing Date
- 2023-11-30
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing technologies struggle to accurately align irregular samples, making it difficult to guarantee processing precision and quality.
Method used
By acquiring images of irregular samples, the measured straight line equations of multiple characteristic edges and the coordinates of the edge centers are determined. Combining the theoretical straight line equations and the coordinates of the edge centers, the rotation and translation amounts are calculated to achieve alignment.
Benefits of technology
It improves the processing quality and precision of irregular samples, and enables effective alignment of irregular samples.
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Smart Images
Figure CN117557543B_ABST
Abstract
本发明提供了一种不规则样品的对准方法、一种不规则样品的对准系统及一种计算机可读存储介质。所述不规则样品的对准方法包括以下步骤：获取待对准的不规则样品的形状类型，以确定不规则样品的多条特征边缘；获取并解析不规则样品的实测图像，以确定多条特征边缘的实测直线方程，以及多条特征边缘的边缘中心的第一实测坐标；获取不规则样品的所述多条特征边缘的理论直线方程，以及多条特征边缘的边缘中心的第一理论坐标；根据多条特征边缘的实测直线方程及所述理论直线方程，确定对准不规则样品所需的旋转量；以及根据多条特征边缘的所述边缘中心的第一实测坐标及第一理论坐标，确定对准不规则样品所需的平移量。
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