Apparatus and method for eye diagram testing of a transimpedance amplifier module

Abstract

The application discloses an eye diagram testing device and method for a gigabit-to-hundred-megabit optical module, which comprises a bit error rate meter, a splitter, an optical oscilloscope and an optical-to-electricity module, the bit error rate meter is connected with the gigabit-to-hundred-megabit optical module for outputting a gigabit signal to the gigabit-to-hundred-megabit optical module, the gigabit-to-hundred-megabit optical module is connected with the splitter through optical fibers for outputting a hundred-megabit optical signal to the splitter, the splitter is connected with the optical oscilloscope and the optical-to-electricity module through optical fibers for transmitting the hundred-megabit optical signal to the optical oscilloscope and the optical-to-electricity module, the optical-to-electricity module is connected with the optical oscilloscope for outputting an electric signal as a clock to the optical oscilloscope, and the optical oscilloscope receiving the clock signal can display an optical eye diagram. The application can realize the testing of the eye diagram of the gigabit-to-hundred-megabit optical module.

Description

Technical Field

[0001] This invention belongs to the field of testing technology, specifically relating to an eye diagram testing device and method for a 1000-second-1000-second optical module. Background Technology

[0002] The 1000 RPM optical module is an optical module used in special environments. Traditional optical modules use a bit error rate tester to send an electrical signal to the optical module, and the bit error rate tester sends a clock to an optical oscilloscope to test the eye diagram. However, after a gigabit signal passes through a 1000 RPM optical module, it becomes a 100 Mbps signal. At this time, the clock sent by the bit error rate tester is not compatible. Therefore, this conventional method of testing the eye diagram cannot meet the requirements of the 1000 RPM optical module. Summary of the Invention

[0003] To address the aforementioned problems, this invention provides an eye diagram testing device and method for 1000 RPM optical modules, aiming to test the eye diagram of 1000 RPM optical modules.

[0004] According to a first aspect of the present disclosure, an eye diagram testing device for a 1000 Mbps optical module is provided, including a bit error rate tester, a beam splitter, an optical oscilloscope, and an optical-to-electrical converter. The bit error rate tester is connected to the 1000 Mbps optical module to output gigabit signals to the 1000 Mbps optical module. The 1000 Mbps optical module is optically connected to the beam splitter to output 100 Mbps optical signals to the beam splitter. The beam splitter is optically connected to both the optical oscilloscope and the optical-to-electrical converter to split and transmit the 100 Mbps optical signals to both the optical oscilloscope and the optical-to-electrical converter. The optical-to-electrical converter is connected to the optical oscilloscope to output an electrical signal as a clock signal to the optical oscilloscope. The optical oscilloscope, receiving the clock signal, can then display the optical eye diagram.

[0005] In some implementations, the splitter outputs the 100 Mbps optical signal to the optical oscilloscope and the optical-to-electrical converter in a 2:1 ratio.

[0006] According to a second aspect of the present disclosure, an eye diagram testing method for a 1000 RPM optical module is provided, the method comprising:

[0007] The bit error rate tester outputs gigabit signals to the 1000-bit optical module, and the 1000-bit optical module outputs 100-bit optical signals to the splitter.

[0008] A splitter is used to split the 100 Mbps optical signal and transmit it to an optical oscilloscope and an optical-to-electrical converter. The optical-to-electrical converter outputs an electrical signal as a clock to the optical oscilloscope, which then displays the optical eye diagram upon receiving the clock signal.

[0009] In some implementations, the splitter outputs the 100 Mbps optical signal to the optical oscilloscope and the optical-to-electrical converter in a 2:1 ratio.

[0010] This invention relates to an eye diagram testing device and method for 1000 RPM optical modules, which can test the eye diagram of 1000 RPM optical modules.

[0011] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0012] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0013] Figure 1 This is a schematic diagram of the eye diagram testing device for a 1000-revolution optical module in an embodiment of the present invention;

[0014] Figure 2 This is a schematic diagram of an eye diagram testing method for a 1000-second optical module in an embodiment of the present invention. Detailed Implementation

[0015] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention. Furthermore, it should be noted that, for ease of description, only the parts relevant to the present invention are shown in the drawings, not the entire structure.

[0016] Before discussing the exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although the flowcharts describe the steps as sequential processes, many of these steps can be performed in parallel, concurrently, or simultaneously. Furthermore, the order of the steps can be rearranged. The process can be terminated when its operation is complete, but may also have additional steps not included in the figures. The process can correspond to a method, function, procedure, subroutine, subroutine, etc.

[0017] This invention provides an eye diagram testing device and method for a 1000 RPM optical module, and offers the following embodiments:

[0018] One embodiment illustrates an eye diagram testing apparatus for a 1000 RPM optical module; see [link to documentation]. Figure 1 The system includes a bit error rate tester, a beam splitter, an optical oscilloscope, and an optical-to-electrical converter. The bit error rate tester is connected to a 1000-bit / 1000-bit optical module to output gigabit signals to the 1000-bit / 1000-bit optical module. The 1000-bit / 1000-bit optical module is connected to the beam splitter via optical fiber to output 100-bit / ...

[0019] like Figure 1The splitter outputs the 100 Mbps optical signal to the optical oscilloscope and the optical-to-electrical converter at a 2:1 ratio.

[0020] In the specific implementation process, the bit error rate tester outputs a gigabit signal to the gigabit-to-hundred-megabit (QT) module. The QT module converts the gigabit signal into a hundred-megabit optical signal for output. After the optical signal passes through a beam splitter, one path is sent to an oscilloscope, and the other path is sent to a regular optical module. The regular optical module does not process the rate; it directly converts the optical signal into an electrical signal. This electrical signal is the hundred-megabit rate. Using the electrical signal as a clock on the oscilloscope, an optical eye diagram can be generated. At this point, the eye diagram of the QT module can be tested.

[0021] Another embodiment illustrates an eye diagram testing method for a 1000 RPM optical module, such as... Figure 2 The methods include:

[0022] The bit error rate tester outputs gigabit signals to the 1000-bit optical module, and the 1000-bit optical module outputs 100-bit optical signals to the splitter.

[0023] A splitter is used to split the 100 Mbps optical signal and transmit it to an optical oscilloscope and an optical-to-electrical converter. The optical-to-electrical converter outputs an electrical signal as a clock to the optical oscilloscope, which then displays the optical eye diagram upon receiving the clock signal.

[0024] In some implementations, the splitter outputs the 100 Mbps optical signal to the optical oscilloscope and the optical-to-electrical converter in a 2:1 ratio.

[0025] Other specific working processes of the eye diagram testing method for the 1000 RPM optical module are described in the above embodiment of the eye diagram testing device for the 1000 RPM optical module, and will not be repeated here.

[0026] Based on the technical solutions provided in the above embodiments, an eye diagram testing device and method for a 1000 RPM optical module can be used to test the eye diagram of the 1000 RPM optical module.

[0027] In this document, the terms “comprising,” “including,” or any other variations thereof are intended to cover non-exclusive inclusion, such that a step or method that comprises a list of elements includes not only those elements but also other elements not expressly listed or inherent to such a step or method.

[0028] The above description, in conjunction with specific preferred embodiments, provides a further detailed explanation of the present invention. It should not be construed that the specific implementation of the present invention is limited to these descriptions. For those skilled in the art, various simple deductions or substitutions can be made without departing from the concept of the present invention, and all such modifications and substitutions should be considered within the scope of protection of the present invention.

Claims

1. An eye diagram testing device for a 1000 RPM optical module, characterized in that, The eye diagram testing device includes a bit error rate analyzer, a beam splitter, an optical oscilloscope, and an optical-to-electrical converter. The bit error rate analyzer is connected to a gigabit-to-hundred-bit optical module to output gigabit signals to the gigabit-to-hundred-bit optical module. The gigabit-to-hundred-bit optical module is optically connected to the beam splitter to output hundred-megabit optical signals to the beam splitter. The beam splitter is optically connected to both the optical oscilloscope and the optical-to-electrical converter to split and transmit the hundred-megabit optical signals to the optical oscilloscope and the optical-to-electrical converter. The optical-to-electrical converter does not process the rate; it directly converts the optical signal into a hundred-megabit electrical signal. It is connected to the optical oscilloscope to output the electrical signal as a clock signal to the optical oscilloscope. The optical oscilloscope, receiving the clock signal, can then display the optical eye diagram. The beam splitter outputs the 100 Mbps optical signal to the optical oscilloscope and the optical-to-electrical converter at a 2:1 ratio.

2. An eye diagram testing method for a 1000 RPM optical module, characterized in that, The method includes: The bit error rate tester outputs gigabit signals to the 1000 RPM optical module, and the 1000 RPM optical module outputs 1000 Mbps optical signals to the splitter. A splitter is used to split the 100 Mbps optical signal and transmit it to an optical oscilloscope and an optical-to-electrical converter. The optical-to-electrical converter does not process the rate; it directly converts the optical signal into a 100 Mbps electrical signal. The optical-to-electrical converter outputs the electrical signal as a clock to the optical oscilloscope, which then displays the optical eye diagram upon receiving the clock signal. The beam splitter outputs the 100 Mbps optical signal to the optical oscilloscope and the optical-to-electrical converter at a 2:1 ratio.

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