Imaging apparatus, detection apparatus, and imaging method

Abstract

The application relates to an imaging device, a detection device and an imaging method. The device comprises a visible light conversion assembly, a light splitting assembly and an imaging assembly; the visible light conversion assembly is used for converting a target X-ray beam and a target neutron beam into a visible light beam; the target X-ray beam and the target neutron beam are beams passing through a to-be-detected substance; the light splitting assembly is used for receiving the visible light beam and splitting the visible light beam into a first light beam and a second light beam; the first light beam is a visible light beam corresponding to the target neutron beam, and the second light beam is a visible light beam corresponding to the target X-ray beam; the imaging assembly is used for receiving the first light beam and the second light beam, imaging the first light beam and the second light beam respectively, and generating an imaging result corresponding to the first light beam and an imaging result corresponding to the second light beam. The method can improve the imaging effect of photons and neutrons.

Description

Technical Field

[0001] This application relates to the field of nondestructive testing technology, and in particular to an imaging device, a testing device, and an imaging method. Background Technology

[0002] With the development of radiation imaging technology, dual-mode imaging methods have emerged. Dual-mode imaging utilizes an electron accelerator to generate photons and neutrons, which are then passed through the material to be tested. Imaging equipment can then image these photons and neutrons passing through the material. Furthermore, based on the imaging results of photons and neutrons, non-destructive testing of the material can be achieved.

[0003] Therefore, dual-mode imaging methods can be applied to the field of non-destructive testing technology. For example, dual-mode imaging methods can be widely used in engineering fields such as aero-engine testing, lithium battery testing, and concrete testing, and have broad application prospects.

[0004] However, when using dual-mode imaging for non-destructive testing, traditional imaging equipment is used to image photons and neutrons. Due to the large difference in luminous intensity between the neutron image and the photon image after imaging, poor imaging results may occur. Summary of the Invention

[0005] Therefore, it is necessary to provide an imaging device, detection device, and imaging method that can improve the imaging effect of photons and neutrons, addressing the aforementioned technical problems.

[0006] In a first aspect, this application provides an imaging device. The device includes a visible light conversion component, a beam splitting component, and an imaging component;

[0007] The visible light conversion component is used to convert the target X-ray beam and the target neutron beam into a visible light beam; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected;

[0008] The beam splitter is used to receive the visible light beam and split the visible light beam into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam;

[0009] The imaging component is used to receive the first beam and the second beam, image the first beam and the second beam respectively, and generate an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.

[0010] In one embodiment, the imaging component includes a first imaging component; the first imaging component includes a first lens unit and a first imaging unit;

[0011] The first lens unit is used to receive the first beam and focus the first beam, and to incident the focused first beam onto the first imaging unit.

[0012] The first imaging unit is used to receive the focused first beam and to image the focused first beam.

[0013] In one embodiment, the first imaging unit includes a microchannel plate, a delay line, and digital circuitry;

[0014] The microchannel plate is used to convert the focused first beam into an electrical signal and send the electrical signal corresponding to the first beam to the delay line;

[0015] The delay line is used to receive the electrical signal corresponding to the first beam and transmit the electrical signal corresponding to the first beam to the digital circuit.

[0016] The digital circuit is used to receive the electrical signal corresponding to the first beam and to image the focused first beam based on the electrical signal corresponding to the first beam.

[0017] In one embodiment, the imaging component further includes a second imaging component; the second imaging component includes a second lens unit and a second imaging unit;

[0018] The second lens unit is used to receive the second beam and focus the second beam, and to incident the focused second beam onto the second imaging unit;

[0019] The second imaging unit is used to receive the focused second beam and to image the focused second beam.

[0020] In one embodiment, the second imaging unit includes an image intensifier and an image sensor;

[0021] The image intensifier is used to receive the focused second beam, enhance the luminous intensity of the focused second beam, and incident the enhanced second beam onto the image sensor;

[0022] The image sensor is used to receive the enhanced second beam and to image the enhanced second beam.

[0023] In one embodiment, the image sensor includes a complementary metal-oxide-semiconductor-based image sensor or a charge-coupled device-based image sensor.

[0024] In one embodiment, the second lens unit includes a plane mirror and a lens group;

[0025] The plane mirror is used to receive the second light beam and reflect the second light beam to the lens group;

[0026] The lens group is used to receive the second light beam reflected to the lens group, focus the second light beam, and incident the focused second light beam onto the second imaging unit.

[0027] In one embodiment, the beam splitter includes a semi-transparent, semi-reflective beam splitter.

[0028] Secondly, this application provides a detection device. The device includes the imaging device and detection components described in any of the embodiments of the first aspect above;

[0029] The detection component is used to detect the substance to be detected based on the imaging results corresponding to the first beam and the second beam.

[0030] Thirdly, this application provides an imaging method. Applied to the imaging device in any of the embodiments of the first aspect above, the method includes:

[0031] The target X-ray beam and the target neutron beam are converted into visible light beams by the visible light conversion component; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected;

[0032] The visible light beam is received by the beam splitter and split into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam.

[0033] The imaging component receives the first beam and the second beam, and images the first beam and the second beam respectively, generating an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.

[0034] The aforementioned imaging device, detection device, and imaging method include an imaging device comprising a visible light conversion component, a beam splitting component, and an imaging component. The visible light conversion component converts the target X-ray beam and target neutron beam passing through the substance to be detected into a visible light beam. The beam splitting component receives the visible light beam and splits it into a first beam and a second beam. The imaging component receives the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam, and images the first beam and the second beam respectively, generating imaging results corresponding to the first beam and the second beam. Therefore, using the imaging device in this embodiment, a visible light beam can be split to obtain a first beam corresponding to the target neutron beam and a second beam corresponding to the target X-ray beam. Then, the first beam corresponding to the split target neutron beam can be imaged to generate an imaging result corresponding to the target neutron beam; and the second beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, by using a single imaging device, the target X-ray beam and the target neutron beam can be imaged separately according to the characteristics of the X-ray beam and the neutron beam, thus improving the imaging effect of X-rays and neutrons. Attached Figure Description

[0035] Figure 1 This is a schematic diagram of the imaging device in one embodiment;

[0036] Figure 2 This is a schematic diagram of the structure of an imaging device including a first imaging component and a second imaging component in one embodiment;

[0037] Figure 3 This is a schematic diagram of the most specific structure of the imaging device in one embodiment;

[0038] Figure 4 This is a schematic diagram of the imaging device in one optional embodiment;

[0039] Figure 5 This is a three-dimensional schematic diagram of an imaging device in one embodiment;

[0040] Figure 6 This is a schematic flowchart of an imaging method in one embodiment.

[0041] Explanation of reference numerals in the attached figures:

[0042] 100: Imaging equipment; 120: Visible light conversion component; 140: Beam splitting component; 160: Imaging component;

[0043] 162: First imaging component; 1622: First lens unit; 1624: First imaging unit;

[0044] 1624a: Microchannel board; 1624b: Delay line; 1624c: Digital circuit;

[0045] 164: Second imaging component; 1642: Second lens unit; 1644: Second imaging unit;

[0046] 1642a: Plane mirror; 1642b: Lens group;

[0047] 1644a: Image intensifier; 1644b: Image sensor;

[0048] a1: Microchannel plate in image intensifier 1644a; a2: Fluorescent screen in image intensifier 1644a;

[0049] 520: Substance to be tested;

[0050] 540: Imaging result of the first beam; 560: Imaging result of the second beam. Detailed Implementation

[0051] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0052] With the development of radiation imaging technology, dual-mode imaging methods have emerged. Dual-mode imaging utilizes an electron accelerator to generate photons and neutrons, which are then passed through the material to be tested. Imaging equipment can then image these photons and neutrons passing through the material. Furthermore, based on the imaging results of photons and neutrons, non-destructive testing of the material can be achieved.

[0053] Therefore, dual-mode imaging methods can be applied to the field of non-destructive testing technology. For example, dual-mode imaging methods can be widely used in engineering fields such as aero-engine testing, lithium battery testing, and concrete testing, and have broad application prospects.

[0054] However, when using dual-mode imaging for non-destructive testing, traditional imaging equipment is used to image photons and neutrons. Due to the large difference in luminous intensity between the neutron image and the photon image after imaging, poor imaging results may occur.

[0055] Based on this, in one embodiment, this application provides an imaging device. The imaging device includes a visible light conversion component, a beam splitting component, and an imaging component;

[0056] Visible light conversion component, used to convert target X-ray beam and target neutron beam into visible light beam; target X-ray beam and target neutron beam are beams that pass through the substance to be detected;

[0057] The beam splitter is used to receive a visible light beam and split the visible light beam into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam.

[0058] An imaging component is used to receive a first beam and a second beam, image the first beam and the second beam respectively, and generate an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.

[0059] Imaging equipment refers to devices that image photons and neutrons passing through the substance being detected. For example... Figure 1 As shown, Figure 1 This is a schematic diagram of an imaging device in one embodiment. The imaging device 100 includes a visible light conversion component 120, a beam splitting component 140, and an imaging component 160. X-rays are a stream of particles generated by electrons transitioning between two energy levels with significantly different energies. X-rays are a type of photon. A photon is a wave packet of an electromagnetic wave, that is, the smallest energy unit into which an electromagnetic wave can be decomposed. A neutron is a particle that makes up the atomic nucleus. The substance to be tested refers to the substance that needs to be subjected to non-destructive testing. Visible light refers to electromagnetic waves that can be perceived by the human eye. The imaging result refers to the image generated after imaging the light beam.

[0060] For example, since photons and neutrons generated by an electron accelerator or other dual-ray imaging system have the characteristic of following the same optical path, the X-ray beam and neutron beam generated by the electron accelerator or other dual-ray imaging system can be passed through the material to be detected, generating a target X-ray beam and a target neutron beam that pass through the material to be detected. Then, the target X-ray beam and the target neutron beam can be emitted to the visible light conversion component 120. Since the visible light conversion component 120 is sensitive to both the X-ray beam and the neutron beam, it is used to receive the target X-ray beam and the target neutron beam and convert them into a visible light beam.

[0061] A visible light beam is incident on a beam splitter 140, which receives the visible light beam and splits it into a first beam and a second beam. The first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam. In one embodiment, the beam splitter 140 includes a semi-transparent, semi-reflective beam splitter. The first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam then propagate to an imaging assembly 160, which receives the first beam and the second beam and images them respectively, generating an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.

[0062] The aforementioned imaging device includes a visible light conversion component, a beam splitting component, and an imaging component. The visible light conversion component converts the target X-ray beam and target neutron beam passing through the substance to be detected into a visible light beam. The beam splitting component receives the visible light beam and splits it into a first beam and a second beam. The imaging component receives the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam, and images the first beam and the second beam respectively, generating imaging results corresponding to the first beam and the second beam. Therefore, using the imaging device in this embodiment, a visible light beam can be split to obtain the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam. Then, the first beam corresponding to the split target neutron beam can be imaged to generate an imaging result corresponding to the target neutron beam; and the second beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, by using a single imaging device, the target X-ray beam and the target neutron beam can be imaged separately according to the characteristics of the X-ray beam and the neutron beam, thus improving the imaging effect of X-rays and neutrons.

[0063] In one embodiment, the imaging component includes a first imaging component; the first imaging component includes a first lens unit and a first imaging unit.

[0064] The first lens unit is used to receive the first beam and focus the first beam, and to incident the focused first beam onto the first imaging unit.

[0065] The first imaging unit is used to receive the focused first beam and to image the focused first beam.

[0066] For example, such as Figure 2 As shown, Figure 2This is a schematic diagram of an imaging device including a first imaging component and a second imaging component in one embodiment. Imaging component 160 includes a first imaging component 162. The first imaging component 162 includes a first lens unit 1622 and a first imaging unit 1624. The first lens unit 1622 is used to receive the first beam corresponding to the target neutron beam after beam splitting, and to focus the first beam, directing the focused first beam onto the first imaging unit 1624. The first lens unit 1622 can be a lens group. A lens group is an optical system composed of two or more lenses. The position of the first lens unit 1622 can be set according to information such as the diameter of the lenses in the first lens unit 1622 and the distance between the first lens unit 1622 and the beam splitting component 140; however, this embodiment does not limit this. The first imaging unit 1624 is used to receive the focused first beam and to image the focused first beam, generating an imaging result corresponding to the target neutron beam. The first imaging unit 1624 can include, but is not limited to, delay lines, crossbars, or other counting imaging devices.

[0067] In this embodiment, the imaging component includes a first imaging component; the first imaging component includes a first lens unit and a first imaging unit. The first lens unit is used to receive a first light beam and focus the first light beam, and then incident the focused first light beam onto the first imaging unit, thereby enhancing the brightness of the first light beam through focusing. The first imaging unit is used to receive the focused first light beam and image the focused first light beam, thereby imaged the brightened first light beam, thus improving the imaging effect of the first light beam corresponding to the target neutron beam.

[0068] In one embodiment, the first imaging unit includes a microchannel plate, a delay line, and digital circuitry;

[0069] The microchannel plate is used to convert the focused first beam into an electrical signal and send the electrical signal corresponding to the first beam to the delay line;

[0070] The delay line is used to receive the electrical signal corresponding to the first beam and transmit the electrical signal corresponding to the first beam to the digital circuit.

[0071] The digital circuit is used to receive the electrical signal corresponding to the first beam and to image the focused first beam based on the electrical signal corresponding to the first beam.

[0072] For example, such as Figure 3 As shown, Figure 3This is a schematic diagram of the imaging device in one embodiment. The first imaging unit 1624 includes a microchannel plate 1624a, a delay line 1624b, and a digital circuit 1624c. The microchannel plate 1624a is used to convert the focused first beam into an electrical signal through the photoelectric effect and send the electrical signal corresponding to the first beam to the delay line 1624b. The delay line 1624b is used to receive the electrical signal corresponding to the first beam and transmit the electrical signal corresponding to the first beam to the digital circuit 1624c. The digital circuit 1624c is used to receive the electrical signal corresponding to the first beam, image the focused first beam according to the electrical signal corresponding to the first beam, and generate an imaging result corresponding to the target neutron beam.

[0073] The microchannel plate 1624a (MCP) is a high spatial resolution electron multiplier detector, which can be a photocathode microchannel plate. The delay line 1624b is a position-sensitive detector, including a delay line anode. The delay line anode collects the electrical signal corresponding to the first beam and transmits the signal to both ends of the delay line 1624b. The digital circuit 1624c can be a time-to-digital converter. The digital circuit 1624c is located at both ends of the delay line 1624b and measures the time it takes for the electrical signal to arrive at both ends of the delay line 1624b. Based on the arrival time of the electrical signal at both ends of the delay line 1624b, the position of the electrical signal when it reaches the delay line 1624b is determined. Therefore, neutron events can be recorded based on the position of the electrical signal when it reaches the delay line 1624b, and the first beam corresponding to the target neutron beam can be imaged based on the recorded neutron events to obtain the imaging result of the target neutron beam.

[0074] Because X-ray beams are characterized by high instantaneous flux and short duration, producing X-rays within tens of nanoseconds (ns) after an electron accelerator collides with a tungsten target; while neutron beams are characterized by low instantaneous flux and long duration, continuously producing neutrons for hundreds of nanoseconds (ns) to several microseconds (ms) after an electron accelerator collides with a tungsten target. Therefore, the optimal methods for imaging X-ray beams and neutron beams differ. For neutron beams, a counting mode is suitable for imaging, which records the position and time of each neutron arrival on the delay line and images the neutron beam based on this information. The counting mode can directly record neutron events based on electrical signals, allowing for the differentiation between background noise and the signal based on information such as the amplitude of the electrical signal. This reduces the background noise of interfering signals and improves the imaging effect of the neutron beam.

[0075] For X-ray beams, a large number of X-rays are generated in a short period of time, and the counting mode cannot process such a large number of signals in a short time. Therefore, the integration mode, which uses an image sensor for imaging, is suitable for X-ray beams. Although the integration mode cannot filter out background noise based on information such as the amplitude of the electrical signal, the short duration of the X-ray beam and the large signal amplitude mean that the noise generated by the integration mode has a relatively small impact on the signal. In other words, the integration mode can ensure the imaging effect of the X-ray beam.

[0076] In this embodiment, the first imaging unit includes a microchannel plate, a delay line, and a digital circuit. The microchannel plate converts the focused first beam into an electrical signal and sends the electrical signal corresponding to the enhanced first beam to the delay line. The delay line receives the electrical signal corresponding to the enhanced first beam and transmits it to the digital circuit. The digital circuit receives the electrical signal corresponding to the first beam, records neutron events based on the recorded neutron events, and then images the first beam corresponding to the target neutron beam using a counting mode. Since neutron beams are suitable for imaging using a counting mode, this embodiment can improve the imaging effect of neutron beams.

[0077] In one embodiment, the imaging component further includes a second imaging component; the second imaging component includes a second lens unit and a second imaging unit.

[0078] The second lens unit is used to receive the second beam and focus the second beam, and then project the focused second beam into the second imaging unit.

[0079] The second imaging unit is used to receive the focused second beam and to image the focused second beam.

[0080] For example, in combination Figure 3 As shown, the imaging component 160 further includes a second imaging component 164, which includes a second lens unit 1642 and a second imaging unit 1644. The second lens unit 1642 is used to receive the second beam corresponding to the split target X-ray beam and focus the second beam, then incident the focused second beam onto the second imaging unit 1644. The second lens unit 1642 may consist only of a lens group, or it may include a lens group and a plane mirror. Of course, the structure of the second lens unit 1642 can be specifically configured according to the size, cost, and other requirements of the imaging device; this embodiment does not limit this. The second imaging unit 1644 is used to receive the focused second beam, image the focused second beam, and generate an imaging result corresponding to the target X-ray beam.

[0081] In this embodiment, the imaging assembly further includes a second imaging assembly; the second imaging assembly includes a second lens unit and a second imaging unit. The second lens unit is used to receive and focus the second beam, and by directing the focused second beam onto the second imaging unit, the brightness of the second beam can be enhanced through focusing. The second imaging unit is used to receive and image the focused second beam, thereby improving the imaging effect of the second beam corresponding to the target X-ray beam.

[0082] In one embodiment, the second imaging unit includes an image intensifier and an image sensor;

[0083] An image intensifier is used to receive the focused second beam, enhance the luminous intensity of the focused second beam, and then incident the enhanced second beam onto the image sensor.

[0084] An image sensor is used to receive the enhanced second beam and image the enhanced second beam.

[0085] For example, in combination Figure 3 As shown, the second imaging unit 1644 includes an image intensifier 1644a and an image sensor 1644b. The image intensifier 1644a receives the focused second beam, enhances the luminous intensity of the focused second beam, and directs the enhanced second beam onto the image sensor 1644b. The image sensor 1644b receives the enhanced second beam and images it to generate an imaging result corresponding to the target X-ray beam.

[0086] The image intensifier 1644a is a vacuum phototube capable of converting a low-brightness light signal into a high-brightness light signal. In this embodiment, the image intensifier 1644a may include a microchannel plate and a fluorescent screen; alternatively, it may include a photocathode, an electronic lens, and a fluorescent screen. Of course, this embodiment does not limit the scope of the invention. In one embodiment, the image sensor 1644b includes a CMOS-based image sensor or a charge-coupled device (CCD)-based image sensor.

[0087] In this embodiment, the second imaging unit includes an image intensifier and an image sensor. The image intensifier receives the focused second beam, enhances its luminous intensity, and then directs the enhanced second beam (i.e., brightness) onto the image sensor. The image sensor receives the enhanced second beam and images it. This allows for imaging of the second beam corresponding to the target X-ray beam based on the image intensifier and image sensor, meaning it enables imaging of the target X-ray beam using an integral mode. Since X-ray beams are suitable for imaging using an integral mode, this embodiment improves the imaging effect of the X-ray beam.

[0088] In one embodiment, the second lens unit includes a plane mirror and a lens group;

[0089] A plane mirror is used to receive the second beam of light and reflect it to the lens group.

[0090] The lens group is used to receive the second beam reflected to the lens group, focus the second beam, and then incident the focused second beam onto the second imaging unit.

[0091] For example, in combination Figure 3 As shown, the second lens unit 1642 includes a plane mirror 1642a and a lens group 1642b. The plane mirror 1642a receives the second beam after beam splitting and reflects it to the lens group 1642b. The lens group 1642b receives the second beam reflected to it and focuses it, then directs the focused second beam onto the second imaging unit 1644. The position of the lens group 1642b can be set according to information such as the diameter of the lens in the lens group 1642b and the distance between the lens group 1642b and the plane mirror 1642a. However, this embodiment does not limit the position of the plane mirror 1642a or the position of the lens group 1642b.

[0092] In this embodiment, the second lens unit includes a plane mirror and a lens group. The plane mirror is used to receive the second light beam and reflect it to the lens group. The lens group is used to receive the second light beam reflected to the lens group and focus the second light beam. By focusing the second light beam onto the second imaging unit, the brightness of the second light beam can be enhanced.

[0093] To make the solutions in this application clearer, the imaging device described above is presented below with an optional embodiment. In an optional embodiment, such as Figure 4 As shown, an imaging device is provided, comprising:

[0094] Visible light conversion component 120 is used to convert a target X-ray beam and a target neutron beam into a visible light beam; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected; wherein, the visible light conversion component 120 includes a neutron-sensitive microchannel plate 122 and a fluorescent screen 124; the neutron-sensitive microchannel plate 122 is used to convert the target X-ray beam and the target neutron beam into an electrical signal, the electrical signal including multiple electrons, and the fluorescent screen 124 is used to convert the electrical signal into a visible light beam;

[0095] Beam splitter 140 is used to receive a visible light beam and split it into a first beam and a second beam. The first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam. The beam splitter 140 can be a semi-transparent, semi-reflective beam splitter. For example, the first beam can be a reflected light beam, where reflected light is the light reflected from the object's surface after incident light strikes it; the second beam can be a transmitted light beam, where transmitted light is the light emitted after incident light passes through the object following refraction. It should be noted that both photons and X-rays can be used as transmission imaging results or reflection imaging results. In the embodiments of this application... Figure 4 It only shows a schematic diagram of an optical path;

[0096] Imaging assembly 160 includes a first imaging assembly 162 and a second imaging assembly 164; the first imaging assembly 162 includes a first lens unit 1622 and a first imaging unit 1624;

[0097] The first lens unit 1622 is used to receive the first light beam and focus the first light beam, and then incident the focused first light beam onto the first imaging unit 1624; wherein, the first lens unit 1622 may be a lens group.

[0098] The first imaging unit 1624 includes a microchannel plate 1624a, a delay line 1624b, and a digital circuit 1624c. The microchannel plate 1624a is used to convert the focused first beam into an electrical signal and send the electrical signal corresponding to the first beam to the delay line 1624b. The delay line 1624b is used to receive the electrical signal corresponding to the first beam and transmit the electrical signal corresponding to the first beam to the digital circuit 1624c. The digital circuit 1624c is used to receive the electrical signal corresponding to the first beam, image the focused first beam according to the electrical signal corresponding to the first beam, and generate an imaging result corresponding to the first beam. The microchannel plate 1624a can be a photocathode microchannel plate, the delay line 1624b can be a delay line anode, and the digital circuit 1624c can be a time-to-digital converter.

[0099] The second imaging assembly 164 includes a second lens unit 1642 and a second imaging unit 1644; the second lens unit 1642 is used to receive a second light beam, focus the second light beam, and incident the focused second light beam onto the second imaging unit 1644; the second lens unit 1642 includes a plane mirror 1642a and a lens group 1642b; the plane mirror 1642a is used to receive the second light beam and reflect the second light beam to the lens group 1642b; the lens group 1642b is used to receive the second light beam reflected to the lens group, focus the second light beam, and incident the focused second light beam onto the second imaging unit 1644;

[0100] The second imaging unit 1644 includes an image intensifier 1644a and an image sensor 1644b; the image intensifier 1644a is used to receive the focused second beam, enhance the light intensity of the focused second beam, and incident the enhanced second beam onto the image sensor 1644b; the image sensor 1644b is used to receive the enhanced second beam, image the enhanced second beam, and generate an imaging result corresponding to the second beam.

[0101] The image intensifier 1644a may include a microchannel plate a1 and a fluorescent screen a2 in the image intensifier 1644a; the microchannel plate a1 in the image intensifier 1644a is used to convert the focused second beam into an electrical signal, and the fluorescent screen a2 in the image intensifier 1644a is used to convert the electrical signal into an enhanced second beam; the image sensor 1644b may include an image sensor based on complementary metal-oxide-semiconductor or an image sensor based on charge-coupled device.

[0102] For example, such as Figure 5 As shown, Figure 5This is a three-dimensional schematic diagram of an imaging device in one embodiment. First, an X-ray beam and a neutron beam generated by an electron accelerator or other dual-ray imaging system are passed through the substance to be detected 520 to generate a target X-ray beam and a target neutron beam passing through the substance to be detected 520. Second, a visible light conversion component 120, composed of a neutron-sensitive microchannel plate 122 and a fluorescent screen 124, converts the target X-ray beam and the target neutron beam into a visible light beam. Third, a beam splitter 140 receives the visible light beam and splits it into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam. Fourth, the first beam is incident on a first lens unit 1622, which receives and focuses the first beam, then incident the focused first beam onto a first imaging unit 1624, composed of a microchannel plate 1624a, a delay line 1624b, and a digital circuit 1624c. Fifth, the first imaging unit 1624 receives the focused first beam, images the focused first beam, and generates an imaging result 540 of the first beam corresponding to the target neutron beam.

[0103] Sixth, the second beam is incident on the plane mirror 1642a, which receives the second beam and reflects it to the lens group 1642b. The lens group 1642b receives the reflected second beam, focuses it, and then incident the focused second beam onto the second imaging unit 1644. Seventh, the focused second beam is received and imaged to generate an imaging result 560 of the second beam corresponding to the target X-ray beam.

[0104] The aforementioned imaging device includes a visible light conversion component, a beam splitting component, and an imaging component. The visible light conversion component converts the target X-ray beam and target neutron beam passing through the substance to be detected into a visible light beam. The beam splitting component receives the visible light beam and splits it into a first beam and a second beam. The imaging component receives the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam, and images the first beam and the second beam respectively, generating imaging results corresponding to the first beam and the second beam. Therefore, using the imaging device in this embodiment, a visible light beam can be split to obtain the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam. Then, the first beam corresponding to the split target neutron beam can be imaged to generate an imaging result corresponding to the target neutron beam; and the second beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, by using a single imaging device, the target X-ray beam and the target neutron beam can be imaged separately according to the characteristics of the X-ray beam and the neutron beam, thus improving the imaging effect of X-rays and neutrons.

[0105] In one embodiment, this application also provides a detection device, which includes the imaging device and detection components described in the above embodiments;

[0106] The detection component is used to detect the substance to be detected based on the imaging results corresponding to the first beam and the second beam.

[0107] For example, the detection component can obtain the attenuation coefficients of the target X-ray beam and the target neutron beam based on the imaging results corresponding to the first beam and the second beam. Therefore, the property information of the substance to be detected, such as the elemental type, can be calculated based on these attenuation coefficients. Furthermore, the substance to be detected can be detected based on this property information. A detailed description of the imaging equipment can be found in the above embodiments and will not be repeated here.

[0108] The aforementioned detection equipment includes an imaging device and a detection component. Since the detection equipment includes an imaging device, using the detection equipment in this embodiment of the application allows for the splitting of the visible light beam corresponding to the target X-ray beam and the target neutron beam, resulting in a first beam corresponding to the target neutron beam and a second beam corresponding to the target X-ray beam. Subsequently, the first beam corresponding to the split target neutron beam can be imaged to generate an imaging result corresponding to the target neutron beam; and the second beam corresponding to the split target X-ray beam can be imaged to generate an imaging result corresponding to the target X-ray beam. Therefore, by using a single imaging device, the target X-ray beam and the target neutron beam can be imaged separately according to the characteristics of the X-ray beam and the neutron beam, thus improving the imaging effect of X-rays and neutrons. Furthermore, by using the detection component, and based on the imaging results corresponding to the first beam and the second beam (which have better imaging effects), the substance to be detected can be detected more accurately using non-destructive testing.

[0109] In one embodiment, such as Figure 6 As shown, an imaging method is provided, which can be applied to... Figure 1 Taking the imaging device 100 as an example, the following steps are included:

[0110] S620 converts the target X-ray beam and the target neutron beam into a visible light beam through a visible light conversion component; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected.

[0111] Optionally, since photons and neutrons generated by an electron accelerator or other dual-ray imaging system have the characteristic of following the same optical path, the X-ray beam and neutron beam generated by the electron accelerator or other dual-ray imaging system can be passed through the material to be detected, generating a target X-ray beam and a target neutron beam that pass through the material to be detected. Then, the target X-ray beam and target neutron beam can be emitted to a visible light conversion component. Since the visible light conversion component is sensitive to both X-ray and neutron beams, it can receive the target X-ray beam and target neutron beam and convert them into visible light beams. At this point, the visible light beam corresponding to the target X-ray beam and the visible light beam corresponding to the target neutron beam are on the same optical path.

[0112] S640 receives a visible light beam through a beam splitter and splits the visible light beam into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam.

[0113] Optionally, the visible light beam is incident on a beam splitter, which receives the visible light beam and splits it into a first beam and a second beam. The first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam.

[0114] It should be noted that X-ray beams are characterized by high instantaneous flux and short duration, generating X-rays within tens of nanoseconds (ns) after the electron accelerator collides with the tungsten target; while neutron beams are characterized by low instantaneous flux and long duration, continuously generating neutrons for hundreds of nanoseconds (ns) to several microseconds (ms) after the electron accelerator collides with the tungsten target. Therefore, in this embodiment, different time windows are set for the first beam and the second beam, respectively. By reading the optical signals corresponding to the first beam and the second beam through different time windows, the visible light beam corresponding to the target neutron beam and the visible light beam corresponding to the target X-ray beam can be separated according to the time sequence of the generation of the X-ray beam and the neutron beam.

[0115] S660 receives a first beam and a second beam through an imaging component, images the first beam and the second beam respectively, and generates an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.

[0116] Optionally, the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam propagate to the imaging component. The imaging component can receive the first beam and the second beam, and image them respectively, generating imaging results corresponding to the first beam and the second beam. In other words, the imaging component can image the first beam corresponding to the split target neutron beam to generate an imaging result corresponding to the target neutron beam; and it can also image the second beam corresponding to the split target X-ray beam to generate an imaging result corresponding to the target X-ray beam.

[0117] In the aforementioned imaging method, a visible light conversion component converts the target X-ray beam and target neutron beam passing through the substance to be detected into a visible light beam; a beam splitter receives the visible light beam and splits it into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam; an imaging component receives the first beam and the second beam, respectively, and images the first beam and the second beam to generate imaging results corresponding to the first beam and the second beam. Therefore, the imaging method in this embodiment can split the visible light beam to obtain the first beam corresponding to the target neutron beam and the second beam corresponding to the target X-ray beam. Then, it can image the first beam corresponding to the split target neutron beam to generate an imaging result corresponding to the target neutron beam; and it can image the second beam corresponding to the split target X-ray beam to generate an imaging result corresponding to the target X-ray beam. Therefore, by using a single imaging device, the target X-ray beam and the target neutron beam can be imaged separately according to the characteristics of the X-ray beam and the neutron beam, thus improving the imaging effect of X-rays and neutrons.

[0118] It should be understood that although the steps in the flowcharts of the above embodiments are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0119] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0120] The above embodiments are merely illustrative of several implementation methods of this application, and their descriptions are relatively specific and detailed. However, they should not be construed as limiting the scope of this application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. An imaging device, characterized in that, The device includes a visible light conversion component, a beam splitting component, and an imaging component; The visible light conversion component is used to convert the target X-ray beam and the target neutron beam into a visible light beam; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected; The beam splitter is used to receive the visible light beam and split the visible light beam into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam; The imaging component is used to receive the first beam and the second beam, image the first beam and the second beam respectively, and generate an imaging result corresponding to the first beam and an imaging result corresponding to the second beam. The imaging assembly includes a first imaging assembly; the first imaging assembly includes a first lens unit and a first imaging unit; the first imaging unit includes a microchannel plate, a delay line, and digital circuitry. The microchannel plate is used to convert the focused first beam into an electrical signal and send the electrical signal corresponding to the first beam to the delay line; The delay line is used to receive the electrical signal corresponding to the first beam and transmit the electrical signal corresponding to the first beam to the digital circuit. The digital circuit is used to receive the electrical signal corresponding to the first beam and to image the focused first beam according to the electrical signal corresponding to the first beam. The imaging assembly further includes a second imaging assembly; the second imaging assembly includes a second lens unit and a second imaging unit; the second imaging unit includes an image intensifier and an image sensor; The image intensifier is used to receive the focused second beam, enhance the luminous intensity of the focused second beam, and incident the enhanced second beam onto the image sensor; The image sensor is used to receive the enhanced second beam and to image the enhanced second beam.

2. The imaging device according to claim 1, characterized in that, The first lens unit is used to receive the first beam and focus the first beam, and to incident the focused first beam onto the first imaging unit. The first imaging unit is used to receive the focused first beam and to image the focused first beam.

3. The imaging device according to claim 2, characterized in that, The second lens unit is used to receive the second beam and focus the second beam, and to incident the focused second beam onto the second imaging unit; The second imaging unit is used to receive the focused second beam and to image the focused second beam.

4. The imaging device according to claim 3, characterized in that, The image sensor includes an image sensor based on complementary metal-oxide-semiconductor or an image sensor based on charge-coupled device.

5. The imaging device according to claim 4, characterized in that, The second lens unit includes a plane mirror and a lens group; The plane mirror is used to receive the second light beam and reflect the second light beam to the lens group; The lens group is used to receive the second light beam reflected to the lens group, focus the second light beam, and incident the focused second light beam onto the second imaging unit.

6. The imaging device according to claim 1, characterized in that, The beam splitter includes a semi-transparent, semi-reflective beam splitter.

7. A testing device, characterized in that, Includes the imaging device and detection component as described in any one of claims 1-6; The detection component is used to detect the substance to be detected based on the imaging results corresponding to the first beam and the second beam.

8. An imaging method, characterized in that, The method, applied to the imaging device as described in any one of claims 1-6, comprises: The target X-ray beam and the target neutron beam are converted into visible light beams by the visible light conversion component; the target X-ray beam and the target neutron beam are beams that pass through the substance to be detected; The visible light beam is received by the beam splitter and split into a first beam and a second beam; the first beam is the visible light beam corresponding to the target neutron beam, and the second beam is the visible light beam corresponding to the target X-ray beam. The imaging component receives the first beam and the second beam, and images the first beam and the second beam respectively, generating an imaging result corresponding to the first beam and an imaging result corresponding to the second beam.

Images