Dynamic pressure regulation test device

Abstract

This application relates to a dynamic voltage regulation testing device. The device includes: a high-voltage AC / DC generator, a PID controller connected to the high-voltage AC / DC generator, a testing device, and a motor; a distance sensor connected to the PID controller and the motor; the high-voltage AC / DC generator is used to generate a first test voltage based on a power frequency input signal; the testing device is used to perform withstand voltage testing on a dielectric sample based on the first test voltage; the distance sensor is used to detect the thickness of the dielectric sample in real time during the withstand voltage testing; the PID controller is used to output a control voltage based on the first test voltage, the thickness of the dielectric sample, and a set electric field strength; and the motor is used to adjust the voltage generated by the high-voltage AC / DC generator based on the power frequency input signal according to the control voltage to obtain a second test voltage.

Description

Technical Field

[0001] This application relates to the field of electrical technology, and in particular to a dynamic voltage regulation test device. Background Technology

[0002] Breakdown and withstand voltage tests are important tests for studying and evaluating the insulation performance of dielectric materials. During a breakdown test, the breakdown field strength needs to be obtained based on the thickness of the measured sample. In previous tests, the thickness was usually measured before or after the test. For short-duration tests like breakdown tests, the difference in thickness before and after the test is small, and the change in thickness has minimal impact on the test results.

[0003] However, during long-term pressure tests, the electrical and thermal stresses generated during the prolonged pressurization process cause the sample to expand, resulting in thickness changes. As the thickness changes, the breakdown field strength applied to the sample also changes. This phenomenon can significantly interfere with long-term pressure tests, leading to inaccurate test results. Summary of the Invention

[0004] Therefore, it is necessary to provide a dynamic pressure regulating test device that can keep the breakdown field strength applied to the sample stable in order to address the above-mentioned technical problems.

[0005] In a first aspect, this application provides a dynamic pressure regulating test apparatus, comprising:

[0006] A high-voltage AC / DC generator, a PID controller connected to the high-voltage AC / DC generator, a test device and a motor, and a distance sensor connected to the PID controller and the motor;

[0007] The high-voltage AC / DC generator is used to generate a first test voltage based on the power frequency input signal;

[0008] The test apparatus is used to perform withstand voltage testing on the dielectric sample according to the first test voltage.

[0009] The distance sensor is used to detect the thickness of the dielectric sample in real time during the withstand voltage test of the dielectric sample.

[0010] The PID controller is used to output a control voltage based on the first test voltage, the thickness of the dielectric sample, and the set electric field strength.

[0011] The motor is used to adjust the voltage generated by the high-voltage AC / DC generator according to the power frequency input signal, based on the control voltage, to obtain the second test voltage.

[0012] In some embodiments, the high-voltage AC / DC generator includes: a power control console and a test transformer, the test transformer including: a primary winding and a secondary winding;

[0013] The power control console includes:

[0014] An autotransformer is connected to the power frequency power supply and the primary winding of the test transformer, and is used to adjust the voltage of the input signal of the power frequency power supply to a first voltage signal within a preset voltage range.

[0015] A high-voltage voltmeter, connected to the test transformer and the PID controller, is used to obtain the first test voltage through voltage testing and transmit the first test voltage to the PID controller;

[0016] The motor is specifically used to control the movement of the primary winding through the control voltage, so that the autotransformer generates the first voltage signal according to the power frequency input signal;

[0017] The test transformer is used to receive the first voltage signal and, after passing through the primary winding, obtain the second test voltage in the secondary winding.

[0018] In some embodiments, the high-voltage AC / DC generator further includes:

[0019] A high-voltage bushing and a high-voltage silicon stack located inside the high-voltage bushing, wherein the high-voltage bushing and the high-voltage silicon stack are connected in series in the circuit between the secondary winding and the test device.

[0020] In some embodiments, the PID controller is specifically used for:

[0021] The target electric field strength is calculated based on the first test voltage and the thickness of the dielectric sample.

[0022] Calculate the field strength difference based on the target electric field strength and the set electric field strength;

[0023] The control voltage is calculated based on the field strength difference and the PID control parameters.

[0024] In some embodiments, the testing apparatus includes:

[0025] A cylindrical conductor is used to connect the first test voltage;

[0026] A first electrode and a second electrode, wherein the first electrode is connected to the cylindrical conductor, and the dielectric sample is fixed between the first electrode and the second electrode.

[0027] In some embodiments, the apparatus further includes:

[0028] A container for containing transformer oil, and for housing the first electrode, the second electrode, and the dielectric sample in the transformer oil;

[0029] A first insulating partition is disposed between the bottom of the container and the second electrode;

[0030] A second insulating partition is provided with a through hole, through which the cylindrical conductor is fixed.

[0031] A support column is disposed between the first insulating partition and the second insulating partition to support the second insulating partition;

[0032] The size of the through hole matches that of the cylindrical conductor, so as to fix the cylindrical conductor in the through hole of the second insulating partition.

[0033] In some embodiments, the distance sensor is a laser distance sensor, which includes:

[0034] The transmitting end is used to emit laser signals. The transmitting end is set at a first position perpendicular to the direction of the dielectric sample, such that the laser emitted by the transmitting end is perpendicular to the plane of the dielectric sample.

[0035] The receiving end is used to receive the laser signal sent by the transmitting end. The receiving end is set at a second position perpendicular to the direction of the dielectric sample, such that the laser received by the receiving end is perpendicular to the plane where the dielectric sample is located. The first position and the second position are located on different sides of the dielectric sample.

[0036] The calculation unit calculates the initial distance based on the time between the laser signal emitted by the transmitting end and the laser signal received by the receiving end; and calculates the thickness of the dielectric sample based on the initial distance, the first position of the first electrode, and the second position of the second electrode.

[0037] In some embodiments, both the first electrode and the second electrode are spherical electrodes; the line connecting the first position to the center of the first electrode is parallel to the dielectric sample, and the line connecting the second position to the center of the second electrode is parallel to the dielectric sample.

[0038] The calculation unit is specifically used to calculate the thickness of the dielectric sample based on the initial distance, the radius of the first electrode, and the radius of the second electrode.

[0039] In some embodiments, the apparatus further includes:

[0040] A first insulating dielectric layer is disposed between the first electrode and the transmitting end;

[0041] A second insulating dielectric layer is disposed between the second electrode and the receiving end.

[0042] In some embodiments, the apparatus further includes:

[0043] A visualization platform for displaying at least one of the following parameters:

[0044] The thickness of the dielectric sample, the instrument measurement voltage, the first test voltage, the control voltage, and the second test voltage.

[0045] The aforementioned dynamic voltage regulation test device includes: a high-voltage AC / DC generator, a PID controller connected to the high-voltage AC / DC generator, and a test device; a distance sensor and a motor connected to the PID controller; the high-voltage AC / DC generator is used to generate a first test voltage based on a power frequency input signal; the test device is used to perform withstand voltage testing on a dielectric sample based on the first test voltage; the distance sensor is used to detect the thickness of the dielectric sample in real time during the withstand voltage testing; the PID controller is used to output a control voltage based on the first test voltage, the thickness of the dielectric sample, and a set electric field strength; and the motor is used to adjust the voltage generated by the high-voltage AC / DC generator based on the power frequency input signal according to the control voltage to obtain a second test voltage. This device can detect the thickness of a dielectric sample in real time, and output a control voltage based on the detected thickness, a first test voltage, and a set electric field strength. The first test voltage is then adjusted using this control voltage to obtain a second test voltage for testing the dielectric sample. This approach allows for timely adjustment of the applied test voltage based on changes in the thickness of the dielectric sample during the test, thereby maintaining a stable breakdown field strength applied to the sample and improving the accuracy of the test results. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 This is a schematic diagram of the structure of a dynamic pressure regulation test device in one embodiment;

[0048] Figure 2This is a schematic diagram of the structure of a high-voltage AC / DC generator in one embodiment;

[0049] Figure 3 This is a schematic diagram of the PID controller in one embodiment;

[0050] Figure 4 This is a schematic diagram of the electrode setup and distance sensor setup in one embodiment;

[0051] Figure 5 This is a schematic diagram of another dynamic pressure regulating test device in one embodiment. Detailed Implementation

[0052] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0053] In long-term pressure tests, the electrical and thermal stresses generated during prolonged pressurization cause the specimen to expand, resulting in thickness changes. These thickness changes also alter the breakdown field strength applied to the specimen, significantly interfering with the long-term pressure test and leading to inaccurate results. Therefore, a dynamic pressure-adjusting testing device capable of real-time measurement of specimen thickness and dynamic pressure adjustment is urgently needed.

[0054] The dynamic voltage regulation test device provided in this application can adjust the applied test voltage in a timely manner according to the thickness change of the dielectric sample during the test, thereby keeping the breakdown field strength applied to the sample stable and improving the accuracy of the test results.

[0055] In one exemplary embodiment, Figure 1 This is a schematic diagram of the structure of a dynamic pressure regulating test device in one embodiment, as shown below. Figure 1 As shown, a dynamic voltage regulation test device is provided, which may include:

[0056] A high-voltage AC / DC generator 11, a PID controller 12 connected to the high-voltage AC / DC generator 11, a test device 13 and a motor 15, and a distance sensor 14 connected to the PID controller 12 and the motor 15;

[0057] The high-voltage AC / DC generator 11 is used to generate the first test voltage based on the power frequency input signal;

[0058] The test apparatus 13 is used to perform withstand voltage testing on the dielectric sample according to the first test voltage.

[0059] The distance sensor 14 is used to detect the thickness of the dielectric sample in real time during the withstand voltage test of the dielectric sample.

[0060] The PID controller 12 is used to output a control voltage based on the first test voltage, the thickness of the dielectric sample, and the set electric field strength.

[0061] The motor 15 is used to adjust the voltage generated by the high-voltage AC / DC generator according to the power frequency power input signal to obtain the second test voltage.

[0062] The mains frequency power input signal refers to an AC power input signal with a frequency of 50Hz or 60Hz, which is a common power supply frequency. Many electronic devices and systems require mains frequency power input signals for power supply or as a reference signal. Mains frequency power input signals typically have stable voltage and frequency, providing a reliable power supply. It can be obtained from power outlets or power distribution units via power cords or power sockets. In some applications, the mains frequency power input signal may need to be properly conditioned and converted to meet the requirements of specific equipment or systems. For example, components such as transformers, filters, and voltage regulators may be used to adjust parameters such as voltage, current, and frequency. In general, the mains frequency power input signal is a common signal source in power supplies and electronic equipment, providing reliable power support for various devices and systems.

[0063] The aforementioned high-voltage AC / DC generator 11 can convert the input power frequency power input signal into a voltage signal that is boosted to a maximum voltage of 80kV, and used as the main voltage source for high-voltage testing of dielectric samples.

[0064] In a PID controller, PID stands for Proportional, Integral, and Derivative. A PID controller is a feedback controller widely used in industrial control systems. It adjusts the input signal to control the system's output to achieve desired performance indicators. The name PID controller comes from its three control parameters: Proportional, Integral, and Derivative. The basic principle of a PID controller is to compare the system's output with the desired output and calculate the error signal based on the comparison result. The PID controller then uses this error signal to adjust the input signal so that the system's output is as close as possible to the desired output. PID controllers are commonly used to control physical quantities such as temperature, pressure, flow rate, speed, and voltage. They have advantages such as simple structure, ease of implementation, and good stability.

[0065] In this application, the distance sensor can be a laser distance sensor (also known as a laser rangefinder). A laser rangefinder typically includes a transmitter and a receiver. The transmitter usually consists of a laser emitter and an optical system for emitting a laser beam. The laser emitter can be a semiconductor laser, a gas laser, or a solid-state laser, etc., and its emitted laser beam has characteristics such as high directionality, high brightness, and high monochromaticity, which can produce significant reflection on the target object. The receiver usually consists of a receiver and an optical system for receiving the laser beam reflected back from the target object. The receiver can be a photodiode, avalanche diode, or photomultiplier tube, etc., which can convert the received laser beam into an electrical signal and record the time from emission to reception of the laser beam through circuits such as timers or counters, thereby calculating the distance from the sensor to the target object. In a laser rangefinder, the transmitter and receiver are usually separate. The optical system guides the laser beam to the target object and guides the reflected laser beam to the receiver. This avoids reflection and scattering of the laser beam inside the laser rangefinder, improving measurement accuracy and stability.

[0066] The distance sensor in this application has a resolution of less than 1 μm, so the system can distinguish the 1 μm thickness change of the sample during the test. At this resolution, the system can keep the electric field strength at both ends of the sample constant during a long-term pressure test.

[0067] To prevent the voltage of the high-voltage electrode (i.e., the first electrode mentioned above) from interfering with the distance sensor and signal line, the distance sensor is connected to the electrode with insulating material, and the distance sensor is placed in a metal cover to prevent electric field interference.

[0068] The aforementioned dynamic voltage regulation test device includes: a high-voltage AC / DC generator, a PID controller connected to the high-voltage AC / DC generator, and a test device; a distance sensor and a motor connected to the PID controller; the high-voltage AC / DC generator is used to generate a first test voltage based on a power frequency input signal; the test device is used to perform withstand voltage testing on a dielectric sample based on the first test voltage; the distance sensor is used to detect the thickness of the dielectric sample in real time during the withstand voltage testing; the PID controller is used to output a control voltage based on the first test voltage, the thickness of the dielectric sample, and a set electric field strength; and the motor is used to adjust the voltage generated by the high-voltage AC / DC generator based on the power frequency input signal according to the control voltage to obtain a second test voltage. This device can detect the thickness of a dielectric sample in real time, and output a control voltage based on the detected thickness, a first test voltage, and a set electric field strength. The first test voltage is then adjusted using this control voltage to obtain a second test voltage for testing the dielectric sample. This approach allows for timely adjustment of the applied test voltage based on changes in the thickness of the dielectric sample during the test, thereby maintaining a stable breakdown field strength applied to the sample and improving the accuracy of the test results.

[0069] In one example embodiment, Figure 2 This is a schematic diagram of the structure of the high-voltage AC / DC generator 11 in one embodiment. Figure 2 In order to be in Figure 1 Based on the above, a structural schematic diagram of a high-voltage AC / DC generator 11 is provided. The high-voltage AC / DC generator 11 includes: a power control console 111 and a test transformer 112. The test transformer 112 includes: a primary winding 1121 and a secondary winding 1122.

[0070] The power control console 111 includes: an autotransformer 1111, which is connected to the power frequency power supply and the primary winding 1121 of the test transformer 112, and is used to adjust the input signal of the power frequency power supply to a first voltage signal within a preset voltage range; a high-voltage voltmeter 1112, which is connected to the test transformer 112 and the PID controller 12, and is used to obtain the first test voltage through voltage testing and transmit the first test voltage to the PID controller 12; and a motor 15, which is specifically used to control the movement of the primary winding 1121 through the control voltage, so that the autotransformer 1111 generates the first voltage signal according to the input signal of the power frequency power supply.

[0071] The test transformer 112 is used to receive the first voltage signal and, after passing through the primary winding 1121, obtain the second test voltage in the secondary winding 1122.

[0072] The first voltage signal is a voltage signal of 0 to 400V, and the autotransformer 1111 can adjust the power frequency input signal to a voltage signal of 0 to 400V.

[0073] The aforementioned motor adjusts the voltage across the primary winding according to the control voltage to control the high voltage output of the secondary winding, thereby controlling the voltage across the dielectric sample and causing it to change dynamically with the change in sample thickness during the test.

[0074] In some embodiments, such as Figure 2 As shown, the high-voltage AC / DC generator 11 also includes:

[0075] The high-voltage bushing 113 and the high-voltage silicon stack 114 located inside the high-voltage bushing 113 are connected in series in the circuit between the secondary winding 1122 and the test device 13.

[0076] In some embodiments, the above Figure 2 The PID controller 12 shown is specifically used for: calculating the target electric field strength based on the first test voltage and the thickness of the dielectric sample; calculating the field strength difference based on the target electric field strength and the set electric field strength; and calculating the control voltage based on the field strength difference and the PID control parameters.

[0077] The PID control parameters mentioned above may include: proportional parameter (P), used to control the current error of the system, which reduces the error by adjusting the magnitude of the input signal; integral parameter (I), used to control the historical error of the system, which eliminates the static error of the system by adjusting the time integral of the input signal; and derivative parameter (D), used to control the rate of change of the system, which reduces the overshoot and oscillation of the system by adjusting the rate of change of the input signal.

[0078] In one example embodiment, Figure 3 This is a schematic diagram of the structure of the PID controller 12 in one embodiment. Figure 3 In order to be in Figure 1 A schematic diagram of the structure of a PID controller 12 based on the above is shown below. Figure 3As shown, the PID controller 12 may include a divider 121, a first calculation module 122, and a PID control module 123. The divider 121 is used to divide the first test voltage by the thickness of the dielectric sample to obtain the target electric field strength; the first calculation module 122 is used to subtract the set electric field strength from the target electric field strength to obtain a calculated field strength difference; and the PID control module 123 calculates the control voltage based on the field strength difference and PID control parameters.

[0079] When the PID control module 123 calculates the control voltage based on the field strength difference and the PID control parameters, it can do so using the following calculation formula (1):

[0080]

[0081] In the above formula (1), k represents the field strength difference of the kth sampling, n represents the number of summations, e(n) represents the summation marker, e(k) represents the field strength difference of the kth sampling (i.e., the sampling error), e(k-1) represents the field strength difference of the (k-1)th sampling, and K p Represents the PID control parameters P and K I Represents the PID control parameters I, K D D represents the PID control parameter, and U(k) represents the calculated control voltage.

[0082] For example, the above K p =100, K I =25, K D =25. In practical applications, the values ​​of PID control parameters can be set according to actual needs, and this application does not impose any restrictions.

[0083] In one example embodiment, Figure 4 This is a schematic diagram of the electrode setup and distance sensor setup in one embodiment. Figure 4 In order to be in Figure 1 A schematic diagram of an electrode setup and a distance sensor setup based on the above, such as... Figure 4 As shown, the test device 13 in the dynamic voltage regulation test apparatus includes:

[0084] A cylindrical conductor 131 is used to connect the first test voltage; a first electrode 132 and a second electrode 133 are provided, wherein the first electrode 132 is connected to the cylindrical conductor 131, and the dielectric sample is fixed between the first electrode 132 and the second electrode 133.

[0085] Optional, such as Figure 4As shown, a spherical electrode 134 can be disposed at the top end of the cylindrical conductor 131. The spherical electrode 134 is mounted on the top end of the cylindrical conductor 131 for voltage equalization to prevent flashover.

[0086] In some embodiments, such as Figure 4 As shown, the dynamic voltage regulation test device also includes:

[0087] Container 16 is used to contain transformer oil, and the first electrode 132, the second electrode 133, and the dielectric sample disposed in the transformer oil; a first insulating partition 17 is disposed between the bottom of container 16 and the second electrode 133; a second insulating partition 18 is provided with a through hole, through which the cylindrical conductor 131 is fixed; a support 19 is disposed between the first insulating partition 17 and the second insulating partition 18 to support the second insulating partition 18; wherein the size of the through hole matches the cylindrical conductor 131 to fix the cylindrical conductor 131 in the through hole of the second insulating partition 18.

[0088] Optionally, the cylindrical conductor described above can be a round conductor, a square conductor, or the like. This cylindrical conductor can be a metallic conductor.

[0089] For example, the cylindrical conductor can be a round conductor and the through hole can be a round hole; the cylindrical conductor can be a square conductor and the through hole can be a square hole.

[0090] The first and second insulating partitions mentioned above can be plastic partitions.

[0091] The first and second electrodes mentioned above can be spherical electrodes. The first electrode is a high-voltage electrode, and the second electrode is a ground electrode.

[0092] In some embodiments, the distance sensor 14 described above is a laser distance sensor, such as... Figure 4 As shown, the laser distance sensor includes:

[0093] The transmitting end 141 is used to emit a laser signal. The transmitting end 141 is disposed at a first position in a direction perpendicular to the dielectric sample, such that the laser emitted by the transmitting end 141 is perpendicular to the plane where the dielectric sample is located.

[0094] The receiving end 142 is used to receive the laser signal sent by the transmitting end 141. The receiving end 142 is disposed at a second position in the direction perpendicular to the dielectric sample, such that the laser received by the receiving end 142 is perpendicular to the plane where the dielectric sample is located. The first position and the second position are located on different sides of the dielectric sample.

[0095] The calculation unit 143 calculates the initial distance based on the time between the laser signal emitted by the transmitting end 141 and the laser signal received by the receiving end 142; and calculates the thickness of the dielectric sample based on the initial distance, the first position of the first electrode 132 and the second position of the second electrode 133.

[0096] In some embodiments, the first electrode 132 and the second electrode 133 are both spherical electrodes; the line connecting the first position to the center of the first electrode 132 is parallel to the dielectric sample, and the line connecting the second position to the center of the second electrode 133 is parallel to the dielectric sample; the calculation unit 143 is specifically used to calculate the thickness of the dielectric sample based on the initial distance, the radius of the first electrode 132, and the radius of the second electrode 133.

[0097] For example, d = D - R1 - R2. Where d represents the thickness of the dielectric sample, D represents the distance between the transmitter and receiver, R1 represents the radius of the first electrode, and R2 represents the radius of the second electrode.

[0098] Optionally, the computing unit 143 can be integrated with the receiver 142 to realize the various functions of the receiver 42 and the computing unit 143.

[0099] In some embodiments, such as Figure 4 As shown, the dynamic voltage regulation test device further includes: a first insulating dielectric layer 151 disposed between the first electrode 132 and the transmitting end 141; and a second insulating dielectric layer 152 disposed between the second electrode 133 and the receiving end 142.

[0100] In some embodiments, the dynamic pressure regulating test apparatus further includes:

[0101] A visualization platform for displaying at least one of the following parameters:

[0102] The thickness of the dielectric sample, the instrument measurement voltage, the first test voltage, the control voltage, and the second test voltage.

[0103] The Laboratory Virtual Instrument Engineering Workbench (LabVIEW) software can be used to visually display the above parameters and their changing trends.

[0104] LabVIEW is a graphical programming language used to develop applications for data acquisition, instrument control, and automated testing systems. Its visual interface is one of its most prominent features, allowing users to create programs by dragging and dropping icons and connecting lines without writing extensive code. The LabVIEW visual interface consists of two parts: the front panel and the block diagram. The front panel is the interface through which the user interacts with the program, containing input and output controls such as buttons, sliders, and charts. The block diagram is the logical part of the program, containing various functions and algorithms that implement the program's functionality. In LabVIEW, users can use various tools and functions to create visual interfaces, such as basic graphical elements, custom controls, charts, and graphs. Users can also use various templates and examples provided by LabVIEW to quickly create complex interfaces. In short, LabVIEW's visual interface allows users to create and debug programs more intuitively, reducing programming complexity and time costs, and improving development efficiency.

[0105] In combination with the above Figures 1 to 4 You can get something like Figure 5 The diagram shows a structural schematic of another dynamic pressure regulating test device in one embodiment.

[0106] Those skilled in the art will understand that Figures 1 to 5 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the dynamic voltage regulation test device to which the present application is applied. A specific dynamic voltage regulation test device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0107] In summary, traditional testing apparatuses, unable to measure thickness in real time and dynamically adjust voltage, cause deformation within the sample during long-term withstand voltage tests due to prolonged electrical and thermal stress, resulting in thickness variations. Experiments show that the sample thickness variation can reach up to 30 μm, and the electric field strength variation rate can reach 10%. Constant withstand voltage tests require stable electric field strength within the sample, but the instability of the electric field strength introduced by traditional testing apparatuses severely affects the reliability of constant withstand voltage tests. Therefore, a testing apparatus capable of dynamically adjusting voltage during the test is urgently needed. The dynamic voltage adjustment testing apparatus provided in this application measures the sample thickness in real time by adding a distance sensor to the electrodes of a traditional withstand voltage testing apparatus. Combined with the adjustment function of a PID controller, this dynamic voltage adjustment testing apparatus can dynamically adjust the voltage across the sample during long-term withstand voltage tests, maintaining a constant electric field strength. Furthermore, based on a laser distance sensor and LabVIEW software, this invention can dynamically monitor various parameters during long-term withstand voltage tests, possessing significant research value.

[0108] Traditional testing apparatuses cannot dynamically adjust the voltage based on changes in sample thickness during the test. Unlike traditional apparatuses, this application uses a laser distance sensor to measure the sample thickness in real time, inputting the thickness information into a PID controller to achieve real-time control of the applied voltage. Simultaneously, LabVIEW software is used to visualize the real-time trends of parameters such as voltage and thickness during the test, allowing users to control these parameters.

[0109] This application, by setting PID control parameters, can reduce the settling time in the system (dynamic pressure regulation test device) to less than 0.5 seconds and the system overshoot to less than or equal to 5%. The entire system can be quickly and accurately adjusted according to thickness changes. System overshoot refers to the difference between the maximum deviation of the system output signal and the steady-state value when the input signal undergoes a sudden change. Overshoot is one of the important indicators for measuring the dynamic performance of a system, reflecting its stability and response speed. The smaller the overshoot, the better the system's stability and the faster its response speed. In control system design, it is usually necessary to select appropriate controllers and parameters based on actual needs and application scenarios to reduce system overshoot and improve system performance and stability.

[0110] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0111] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A dynamic pressure regulating test device, characterized in that, The device includes: a high-voltage AC / DC generator, a PID controller connected to the high-voltage AC / DC generator, a test device and a motor, and a distance sensor connected to the PID controller and the motor; The high-voltage AC / DC generator is used to generate a first test voltage based on the power frequency input signal; The test apparatus is used to perform withstand voltage testing on the dielectric sample according to the first test voltage. The distance sensor is used to detect the thickness of the dielectric sample in real time during the withstand voltage test of the dielectric sample. The PID controller is used to output a control voltage based on the first test voltage, the thickness of the dielectric sample, and the set electric field strength. The motor is used to adjust the voltage generated by the high-voltage AC / DC generator according to the power frequency input signal, based on the control voltage, to obtain the second test voltage.

2. The apparatus according to claim 1, characterized in that, The high-voltage AC / DC generator includes a power control console and a test transformer, wherein the test transformer includes a primary winding and a secondary winding. The power control console includes: An autotransformer is connected to a power frequency power supply and the primary winding, and is used to adjust the input signal of the power frequency power supply to a first voltage signal within a preset voltage range. A high-voltage voltmeter, connected to the test transformer and the PID controller, is used to obtain the first test voltage through voltage testing and transmit the first test voltage to the PID controller; The motor is specifically used to control the movement of the primary winding through the control voltage, so that the autotransformer generates the first voltage signal according to the power frequency input signal; The test transformer is used to receive the first voltage signal and, after passing through the primary winding, obtain the second test voltage in the secondary winding.

3. The apparatus according to claim 2, characterized in that, The high-voltage AC / DC generator also includes: A high-voltage bushing and a high-voltage silicon stack located inside the high-voltage bushing, wherein the high-voltage bushing and the high-voltage silicon stack are connected in series in the circuit between the secondary winding and the test device.

4. The apparatus according to claim 1, characterized in that, The PID controller is specifically used for: The target electric field strength is calculated based on the first test voltage and the thickness of the dielectric sample. Calculate the field strength difference based on the target electric field strength and the set electric field strength; The control voltage is calculated based on the field strength difference and the PID control parameters.

5. The apparatus according to claim 1, characterized in that, The experimental apparatus includes: A cylindrical conductor is used to connect the first test voltage; A first electrode and a second electrode, wherein the first electrode is connected to the cylindrical conductor, and the dielectric sample is fixed between the first electrode and the second electrode.

6. The apparatus according to claim 5, characterized in that, The device further includes: A container for containing transformer oil, and the first electrode, the second electrode, and the dielectric sample disposed in the transformer oil; A first insulating partition is disposed between the bottom of the container and the second electrode; A second insulating partition is provided with a through hole, through which the cylindrical conductor is fixed. A support column is disposed between the first insulating partition and the second insulating partition to support the second insulating partition; The size of the through hole matches that of the cylindrical conductor, so as to fix the cylindrical conductor in the through hole of the second insulating partition.

7. The apparatus according to claim 5, characterized in that, The distance sensor is a laser distance sensor, and the laser distance sensor includes: The transmitting end is used to emit laser signals. The transmitting end is set at a first position perpendicular to the direction of the dielectric sample, such that the laser emitted by the transmitting end is perpendicular to the plane of the dielectric sample. The receiving end is used to receive the laser signal sent by the transmitting end. The receiving end is set at a second position perpendicular to the direction of the dielectric sample, such that the laser received by the receiving end is perpendicular to the plane where the dielectric sample is located. The first position and the second position are located on different sides of the dielectric sample. The calculation unit calculates an initial distance based on the time between the laser signal emitted by the transmitting end and the laser signal received by the receiving end; and calculates the thickness of the dielectric sample based on the initial distance, the first position of the first electrode, and the second position of the second electrode.

8. The apparatus according to claim 7, characterized in that, Both the first electrode and the second electrode are spherical electrodes; the line connecting the first position to the center of the first electrode is parallel to the dielectric sample, and the line connecting the second position to the center of the second electrode is parallel to the dielectric sample. The calculation unit is specifically used to calculate the thickness of the dielectric sample based on the initial distance, the radius of the first electrode, and the radius of the second electrode.

9. The apparatus according to claim 8, characterized in that, The device further includes: A first insulating dielectric layer is disposed between the first electrode and the transmitting end; A second insulating dielectric layer is disposed between the second electrode and the receiving end.

10. The apparatus according to claim 1, characterized in that, The device further includes: A visualization platform for displaying at least one of the following parameters: The thickness of the dielectric sample, the first test voltage, the control voltage, and the second test voltage.

Images