A method for testing electric propulsion under orbit in synchronous orbit

Abstract

The present application relates to the technical field of space electric propulsion, and particularly relates to a synchronous orbit lower electric propulsion on-orbit test method.The method comprises the following steps: before satellite positioning, a no-thrust preprocessing project test is carried out; when a target starting work cycle reaches an ascending node firing area and a descending node firing area, first grid preprocessing and second grid preprocessing are respectively carried out; after the grid preprocessing is completed, based on actual average thrust of the first grid preprocessing and the second grid preprocessing, a first test duration of a first thrust vector pointing mass center test carried out by the satellite in the ascending node firing area and a second test duration of a second thrust vector pointing mass center test carried out by the satellite in the descending node firing area are respectively determined; until a first firing test / second firing test is carried out in the ascending node firing area / descending node firing area of a next work cycle after the first thrust vector pointing mass center test / second thrust vector pointing mass center test is completed.The present application can eliminate the influence of test thrust on an orbit, and can improve test efficiency.

Description

Technical Field

[0001] This invention relates to the field of space electric propulsion technology, and in particular to an on-orbit testing method for electric propulsion in a synchronous orbit. Background Technology

[0002] Geostationary orbit satellites use electric propulsion systems for north-south position-keeping missions, requiring long lifespan and high reliability. Electric propulsion systems are complex, and after insertion into orbit, preprocessing, thrust vector pointing towards the center of mass testing, and ignition testing are necessary to verify their functionality and performance. During the satellite's on-orbit testing of electric propulsion, it is necessary to perform center-of-mass pointing and ignition tests separately for the thrust vector generated by the north thruster igniting southward after the satellite enters the ascending node ignition zone; and for the thrust vector generated by the south thruster igniting northward after the satellite enters the descending node ignition zone.

[0003] However, preprocessing is divided into thrust-free and thrust-based preprocessing projects. During thrust vector pointing towards the center of mass tests, ignition tests, and gate preprocessing, using different side thrusters generates thrust in different directions. Existing on-orbit testing methods do not consider the impact of the thrust generated during testing on the orbit. Furthermore, due to the large number of test items, the existing on-orbit testing methods have unreasonable testing procedures and timing, resulting in long testing times and poor testing efficiency.

[0004] Therefore, there is an urgent need for an on-orbit testing method for electric propulsion in a synchronous orbit. Summary of the Invention

[0005] To address the problems of existing on-orbit testing methods that not only fail to consider the impact of the thrust generated during testing on the track, but also have poor testing efficiency, this invention provides an on-orbit testing method for electric propulsion in a synchronous orbit.

[0006] In a first aspect, embodiments of the present invention provide an on-orbit testing method for electric propulsion in a synchronous orbit, comprising:

[0007] Before the satellite is positioned, a thrustless pretreatment test is conducted; wherein the thrustless pretreatment includes at least exhaust pretreatment, cathode pretreatment and discharge chamber pretreatment.

[0008] When the satellite reaches the ascending node ignition zone and the descending node ignition zone during the initial target working cycle, it performs the first gate preprocessing and the second gate preprocessing, respectively. The first gate preprocessing uses the north thruster to generate thrust, and the second gate preprocessing uses the south thruster to generate thrust.

[0009] After the first gate preprocessing and the second gate preprocessing are completed, the actual average thrust of the first gate preprocessing and the second gate preprocessing are calculated respectively.

[0010] Based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the first test duration of the first thrust vector pointing to the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the center of mass test conducted in the descending node ignition zone are determined respectively, so that the first thrust vector pointing to the center of mass test and the second thrust vector pointing to the center of mass test are conducted based on the first test duration and the second test duration respectively.

[0011] The first ignition test is performed in the rising intersection ignition zone of the next working cycle after the first thrust vector pointing to the center of mass test is completed; and the second ignition test is performed in the falling intersection ignition zone of the next working cycle after the second thrust vector pointing to the center of mass test is completed.

[0012] Secondly, embodiments of the present invention also provide an on-orbit testing device for electric propulsion in a synchronous orbit, comprising:

[0013] The first test unit is used to conduct thrustless pretreatment tests before the satellite is positioned; wherein the thrustless pretreatment projects include at least exhaust pretreatment, cathode pretreatment and discharge chamber pretreatment.

[0014] The gate preprocessing unit is used to perform first gate preprocessing and second gate preprocessing respectively when the satellite reaches the ascending node ignition zone and the descending node ignition zone during the initial working cycle of the target; wherein, the first gate preprocessing uses the north thruster to generate thrust, and the second gate preprocessing uses the south thruster to generate thrust.

[0015] The calculation unit is used to calculate the actual average thrust of the first gate preprocessing and the second gate preprocessing respectively after the first gate preprocessing and the second gate preprocessing are completed.

[0016] The second test unit is used to determine, based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the first test duration of the first thrust vector pointing to the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the center of mass test conducted in the descending node ignition zone, so as to perform the first thrust vector pointing to the center of mass test and the second thrust vector pointing to the center of mass test based on the first test duration and the second test duration, respectively.

[0017] The third test unit is used to perform a first ignition test in the rising intersection ignition zone of the next working cycle after the first thrust vector pointing to the center of mass test is completed; and to perform a second ignition test in the falling intersection ignition zone of the next working cycle after the second thrust vector pointing to the center of mass test is completed.

[0018] This invention provides an on-orbit testing method for electric propulsion in a synchronous orbit. Firstly, the on-orbit testing is divided into a thrustless testing phase and a thrust-equipped testing phase. This allows for the timely conduct of thrustless preprocessing tests before the satellite reaches its designated orbit, saving on-orbit testing time and improving testing efficiency. Secondly, the actual average thrust from the first and second gate preprocessing is used to evaluate the first test duration of the first thrust vector pointing towards the center of mass test conducted in the ascending node ignition zone and the second test duration of the second thrust vector pointing towards the center of mass test conducted in the descending node ignition zone. This ensures that the equivalent thrust of the satellite before and after the ascending node / descending node is equal, eliminating the impact of thrust generated during gate preprocessing and thrust vector pointing towards the center of mass tests on the orbit. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a flowchart of an on-orbit testing method for electric propulsion in a synchronous orbit, provided by an embodiment of the present invention;

[0021] Figure 2 This is a hardware architecture diagram of a computing device provided in an embodiment of the present invention;

[0022] Figure 3 This is a structural diagram of an on-orbit test device for electric propulsion in a synchronous orbit, provided by an embodiment of the present invention. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0024] The following describes the specific implementation of the above concept.

[0025] Please refer to Figure 1 This invention provides an on-orbit testing method for electric propulsion in a synchronous orbit, the method comprising:

[0026] Step 100: Conduct thrustless pretreatment tests before satellite positioning; the thrustless pretreatment tests include at least exhaust pretreatment, cathode pretreatment, and discharge chamber pretreatment.

[0027] Step 102: When the satellite reaches the ascending node ignition zone and the descending node ignition zone during the initial working cycle of the target, it performs the first gate preprocessing and the second gate preprocessing respectively; wherein, the first gate preprocessing uses the north thruster to generate thrust, and the second gate preprocessing uses the south thruster to generate thrust.

[0028] Step 104: After the first gate preprocessing and the second gate preprocessing are completed, calculate the actual average thrust of the first gate preprocessing and the second gate preprocessing respectively.

[0029] Step 106: Based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, determine the first test duration of the first thrust vector pointing to the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the center of mass test conducted in the descending node ignition zone, so as to conduct the first thrust vector pointing to the center of mass test and the second thrust vector pointing to the center of mass test based on the first test duration and the second test duration, respectively.

[0030] Step 108: Perform the first ignition test in the rising intersection ignition zone of the next working cycle after the first thrust vector pointing to the center of mass test is completed; and perform the second ignition test in the falling intersection ignition zone of the next working cycle after the second thrust vector pointing to the center of mass test is completed.

[0031] In this embodiment of the invention, firstly, the on-orbit testing of electric propulsion is divided into a thrustless testing phase and a thrust-equipped testing phase. This allows for the timely conduct of thrustless preprocessing tests before the satellite reaches its designated orbit, saving on-orbit testing time and improving testing efficiency. Secondly, the actual average thrust of the first and second gate preprocessing is used to evaluate the first test duration of the first thrust vector pointing towards the center of mass test conducted in the ascending node ignition zone and the second test duration of the second thrust vector pointing towards the center of mass test conducted in the descending node ignition zone. This ensures that the equivalent thrust of the satellite before and after the ascending node / descending node is equal, eliminating the impact of thrust generated during gate preprocessing and thrust vector pointing towards the center of mass test on the orbit.

[0032] For step 100:

[0033] Electric propulsion pretreatment includes exhaust pretreatment, cathode pretreatment, discharge chamber pretreatment, and grid pretreatment. Among these, exhaust pretreatment, cathode pretreatment, and discharge chamber pretreatment do not generate thrust, so they can be carried out concurrently with related work before satellite positioning to save on-orbit testing time.

[0034] Regarding step 102:

[0035] In some implementations, step 102 may include:

[0036] Obtain a preset first idle time T1 and a gate preprocessing time T2; wherein, the first idle time is the interval between the end of the first gate preprocessing and the rising crossover point, and the interval between the end of the second gate preprocessing and the falling crossover point;

[0037] When the satellite reaches the ascending node at time T1+T2 before the target's initial working cycle, the first gate preprocessing begins.

[0038] When the satellite reaches the descending node at time T1+T2 before the target's initial working cycle, the second gate preprocessing begins.

[0039] In this embodiment, after entering orbit, the satellite will orbit once in each working cycle, passing through the ascending node ignition zone and the descending node ignition zone once in each working cycle. To ensure that the equivalent thrust of the satellite before and after the ascending node / descending node is equal, it is necessary to divide the area before and after the ascending node / descending node into two detection regions, centered on the passing of the ascending / descending node. First, the first gate preprocessing needs to be designed before the ascending node, and the second gate preprocessing needs to be designed before the descending node.

[0040] Therefore, in order to ensure that the first gate preprocessing / second gate preprocessing is performed before the rising crossover point / falling crossover point, a first idle time T1 needs to be set between the end of the first gate preprocessing and the rising crossover point. Similarly, a first idle time T1 needs to be set between the end of the second gate preprocessing and the falling crossover point. The pre-set gate preprocessing time T2 is also obtained, that is, the time for both the first gate preprocessing and the second gate preprocessing is T2.

[0041] Therefore, the target initial working cycle for starting thrust-assisted on-orbit testing is determined. When the satellite reaches the ascending node at time T1+T2 before the target initial working cycle, the first gate preprocessing begins; when the satellite reaches the descending node at time T1+T2 before the target initial working cycle, the second gate preprocessing begins.

[0042] Regarding step 104:

[0043] In one embodiment, the actual average thrust of the first gate preprocessing and the second gate preprocessing is calculated using the following formula:

[0044]

[0045] In the formula, F1 is the actual average thrust of the first gate preprocessing or the second gate preprocessing, a is the thrust correction coefficient, i is the gate preprocessing level of the first gate preprocessing or the second gate preprocessing, n is the number of gate preprocessing levels, and I bi V represents the actual gate current value for the i-th gate preprocessing level in either the first gate preprocessing or the second gate preprocessing. bi This refers to the actual voltage value of the screen gate at the i-th screen gate preprocessing level of the first or second gate preprocessing.

[0046] In this embodiment, the gate preprocessing is generally divided into several levels for sequential testing, and a thrust is generated. In order to eliminate the thrust generated during the test, it is necessary to calculate the actual average thrust of the first gate preprocessing and the second gate preprocessing.

[0047] Regarding step 106:

[0048] In some implementations, step 106, "determining the first test duration of the first thrust vector pointing towards the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing towards the center of mass test conducted in the descending node ignition zone based on the actual average thrust of the first gate preprocessing and the second gate preprocessing," may include:

[0049] Based on the gate preprocessing positions of the first gate preprocessing and the second gate preprocessing, and the rated current and rated voltage values ​​of the gate preprocessing positions of the first gate preprocessing and the second gate preprocessing, the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing is determined.

[0050] Based on the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing, the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test are determined respectively.

[0051] Based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the gate preprocessing time T2, and the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test, the first test duration of the first thrust vector pointing to the centroid test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the centroid test conducted in the descending node ignition zone are determined respectively.

[0052] Since the first test of the first thrust vector pointing to the center of mass test and the first test of the second thrust vector pointing to the center of mass test need to be designed after the ascending node and descending node of the target's initial working cycle, the impulse generated by the actual thrust of the first gate preprocessing needs to be equal to the impulse generated by the actual thrust of the first thrust vector pointing to the center of mass test. This is to ensure that the equivalent thrust of the satellite before and after the ascending node is equal and to eliminate the influence of thrust on the orbit (the same applies to the descending node). Therefore, it is necessary to calculate the first test duration of the first thrust vector pointing to the center of mass test and the second test duration of the second thrust vector pointing to the center of mass test based on the actual average thrust of the first gate preprocessing and the second gate preprocessing.

[0053] However, in the calculation process, in order to calculate the impulse, the actual average thrust of the first gate preprocessing and the second gate preprocessing, and the gate preprocessing time T2 are known, while the first test duration of the first thrust vector pointing to the centroid test and the second test duration of the second thrust vector pointing to the centroid test are unknown. Therefore, the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test must first be determined.

[0054] The following explains the calculation process of the equivalent thrust for the first thrust vector pointing towards the center of mass test and the second thrust vector pointing towards the center of mass test.

[0055] In this embodiment, it is necessary to predict the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing in advance, and then multiply them by the gate preprocessing time T2 respectively to estimate the impulse generated by the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing. Then, the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test are multiplied by the initial test duration of the thrust vector pointing to the centroid test to obtain the impulse generated by the thrust of the first / second thrust vector pointing to the centroid test. In order to make the impulse before and after the rising node / before and after the falling node equal, the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test can be designed.

[0056] After obtaining the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test, the first test duration and the second test duration can be determined by combining the actual average thrust of the first gate preprocessing and the second gate preprocessing and the gate preprocessing time T2.

[0057] In some implementations, the first test duration and the second test duration are calculated using the following formula:

[0058]

[0059] In the formula, T FFor the first test duration or the second test duration, F1 is the actual average thrust of the first gate preprocessing or the second gate preprocessing, T2 is the gate preprocessing time, and F2 is the equivalent thrust of the first thrust vector pointing to the centroid test or the second thrust vector pointing to the centroid test.

[0060] In some implementations, the step "performing a first thrust vector pointing towards the center of mass test based on a first test duration" includes:

[0061] The first test of the first thrust vector pointing towards the center of mass begins at a set time after the ascending node in the target's initial working cycle; the test duration of this first test is the first test duration.

[0062] The electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0063] If so, the test of the first thrust vector pointing towards the center of mass is complete;

[0064] If not, then for each subsequent test, execute:

[0065] Determine whether the current test is an even or odd number of times;

[0066] If the current test is an even number of times, the current test will begin when the sum of the time set before the rising node of the next work cycle and the first test duration is reached. The electric propulsion interference torque during the current test will be evaluated, and then the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0067] If the current test is an odd number of times, the current test will begin after a set time after the rising node of the work cycle in which the previous test was located, and the electric propulsion interference torque at the current test will be evaluated. Then, the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold. The test duration of each test in which the first thrust vector points to the center of mass is the first test duration.

[0068] The step "conducting a second thrust vector pointing towards the center of mass test based on the second test duration" may include:

[0069] After a set time following the descent point in the target's initial working cycle, the first test of the second thrust vector pointing towards the center of mass begins; the duration of this first test is the duration of the second test.

[0070] The electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0071] If so, the second thrust vector pointing towards the center of mass test is complete;

[0072] If not, then for each subsequent test, execute:

[0073] Determine whether the current test is an even or odd number of times;

[0074] If the current test is an even number of times, the current test will begin when the time before the descending intersection of the next working cycle is set to the sum of the time of the second test and the time of the current test. The electric propulsion interference torque during the current test will be evaluated, and then the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0075] If the current test is an odd number of times, the current test will begin after a set time after the descending intersection of the working cycle in which the previous test is located, and the electric propulsion interference torque during the current test will be evaluated. Then, the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold. The test duration for each test in which the second thrust vector points to the center of mass is the second test duration.

[0076] In this embodiment, the test of the first thrust vector pointing to the centroid is used as an example. The first gate preprocessing has been completed before the rising node of the target start working cycle. Therefore, the first test of the test of the first thrust vector pointing to the centroid needs to be designed after the rising node of the target start working cycle, and the first test should start after a set time after the rising node. The setting of the set time is to ensure that it is after the rising node. In this embodiment, the set time can be equal to the first idle time T1 in step 102.

[0077] Then, the electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold; if so, it means that the first test is successful and the test of the first thrust vector pointing to the center of mass is completed.

[0078] If not, then it is necessary to wait until T1+T before the rising node of the next working cycle following the target's initial working cycle. F A second test is conducted, and it is then determined whether the electric propulsion interference torque during the second test is less than or equal to the judgment threshold. If it is less than the threshold, the test of the first thrust vector pointing towards the center of mass is completed. If it is not less than the threshold, a third test is conducted at time T1 after the rising node of the next working cycle of the target's initial working cycle. The electric propulsion interference torque during the third test is then determined to be less than or equal to the judgment threshold. This process is repeated, with the fourth test conducted before the rising node of the next two working cycles of the target's initial working cycle, and the fifth test conducted after the rising node of the next two working cycles of the target's initial working cycle, until the electric propulsion interference torque is less than or equal to the judgment threshold, at which point the test of the first thrust vector pointing towards the center of mass is completed.

[0079] It is understandable that the thrust impulse generated in the second and third tests is equal, which also ensures that the equivalent thrust before and after the rising node is equal.

[0080] The test of the second thrust vector pointing to the center of mass is the same as the test of the first thrust vector pointing to the center of mass, and will not be repeated here.

[0081] Regarding step 108:

[0082] In some implementations, the first ignition test is performed in the following manner:

[0083] Obtain the pre-set test duration for the first ignition test;

[0084] The first ignition test begins when the first thrust vector points to the ascending node of the next working cycle after the completion of the first centroid test, at the first target time interval; wherein, the first target time interval is half the test duration of the first ignition test;

[0085] The second ignition test was conducted in the following manner:

[0086] Obtain the pre-set test duration for the second ignition test;

[0087] The second ignition test begins at the second target time interval before the descending intersection of the next working cycle after the second thrust vector points to the center of mass test is completed; wherein the second target time interval is half the test duration of the second ignition test.

[0088] In this embodiment, the first ignition test is used as an example. The test duration of the first ignition test is evenly divided before and after the ascending node to ensure that the impulse generated by the satellite's first ignition test before and after the ascending node is equal, so as to eliminate the impact of the thrust generated by the first ignition test on the orbit.

[0089] The second ignition test is conducted in the same manner as the first ignition test, and will not be repeated here.

[0090] like Figure 2 , Figure 3 As shown, this embodiment of the invention provides an on-orbit testing device for electric propulsion in a synchronous orbit. The device embodiment can be implemented through software, hardware, or a combination of both. From a hardware perspective, as... Figure 2 The diagram shown is a hardware architecture diagram of a computing device for an on-orbit test device for electric propulsion in a synchronous orbit, provided by an embodiment of the present invention. Except for... Figure 2 In addition to the processor, memory, network interface, and non-volatile memory shown, the computing device in the embodiment may also include other hardware, such as a forwarding chip responsible for processing packets. Taking software implementation as an example, such as... Figure 3As shown, a device in a logical sense is formed by the CPU of its computing device reading the corresponding computer program from the non-volatile memory into memory for execution. This embodiment provides an on-orbit testing device for electric propulsion in a synchronous orbit, comprising:

[0091] The first test unit 301 is used to conduct thrustless pretreatment tests before the satellite is positioned; the thrustless pretreatment tests include at least exhaust pretreatment, cathode pretreatment and discharge chamber pretreatment.

[0092] The gate preprocessing unit 302 is used to perform first gate preprocessing and second gate preprocessing respectively when the satellite reaches the ascending node ignition zone and the descending node ignition zone during the initial working cycle of the target; wherein, the first gate preprocessing uses the north thruster to generate thrust, and the second gate preprocessing uses the south thruster to generate thrust.

[0093] The calculation unit 303 is used to calculate the actual average thrust of the first gate preprocessing and the second gate preprocessing respectively after the first gate preprocessing and the second gate preprocessing are completed.

[0094] The second test unit 304 is used to determine, based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the first test duration of the first thrust vector pointing to the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the center of mass test conducted in the descending node ignition zone, so as to conduct the first thrust vector pointing to the center of mass test and the second thrust vector pointing to the center of mass test based on the first test duration and the second test duration, respectively.

[0095] The third test unit 305 is used to perform a first ignition test in the rising intersection ignition zone of the next working cycle after the first thrust vector pointing to the center of mass test is completed; and to perform a second ignition test in the falling intersection ignition zone of the next working cycle after the second thrust vector pointing to the center of mass test is completed.

[0096] In one embodiment of the present invention, the gate preprocessing unit 302 is configured to perform:

[0097] Obtain a preset first idle time T1 and a gate preprocessing time T2; wherein, the first idle time is the interval between the end of the first gate preprocessing and the rising crossover point, and the interval between the end of the second gate preprocessing and the falling crossover point;

[0098] When the satellite reaches the ascending node at time T1+T2 before the target's initial working cycle, the first gate preprocessing begins.

[0099] When the satellite reaches the descending node at time T1+T2 before the target's initial working cycle, the second gate preprocessing begins.

[0100] In one embodiment of the present invention, the actual average thrust of the first gate preprocessing and the second gate preprocessing in the calculation unit 303 is calculated by the following formula:

[0101]

[0102] In the formula, F1 is the actual average thrust of the first gate preprocessing or the second gate preprocessing, a is the thrust correction coefficient, i is the gate preprocessing level of the first gate preprocessing or the second gate preprocessing, n is the number of gate preprocessing levels, and I bi V represents the actual gate current value for the gate preprocessing stage of the first or second gate preprocessing. bi The actual grid voltage value for the grid preprocessing level of the first or second gate preprocessing.

[0103] In one embodiment of the present invention, when the second test unit 304 performs the actual average thrust based on the first gate preprocessing and the second gate preprocessing to determine the first test duration of the first thrust vector pointing towards the center of mass test in the ascending node ignition zone and the second test duration of the second thrust vector pointing towards the center of mass test in the descending node ignition zone, it is used to:

[0104] Based on the gate preprocessing positions of the first gate preprocessing and the second gate preprocessing, and the rated current and rated voltage values ​​of the gate preprocessing positions of the first gate preprocessing and the second gate preprocessing, the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing is determined.

[0105] Based on the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing, the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test are determined respectively.

[0106] Based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the gate preprocessing time T2, and the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test, the first test duration of the first thrust vector pointing to the centroid test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the centroid test conducted in the descending node ignition zone are determined respectively.

[0107] In one embodiment of the present invention, the first test duration and the second test duration in the second test unit 304 are calculated using the following formula:

[0108]

[0109] In the formula, T FFor the first test duration or the second test duration, F1 is the actual average thrust of the first gate preprocessing or the second gate preprocessing, T2 is the gate preprocessing time, and F2 is the equivalent thrust of the first thrust vector pointing to the centroid test or the second thrust vector pointing to the centroid test.

[0110] In one embodiment of the present invention, when the second test unit 304 performs a test on the first thrust vector pointing towards the center of mass based on a first test duration, it is used to:

[0111] The first test of the first thrust vector pointing towards the center of mass begins at a set time after the ascending node in the target's initial working cycle; the test duration of this first test is the first test duration.

[0112] The electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0113] If so, the test of the first thrust vector pointing towards the center of mass is complete;

[0114] If not, then for each subsequent test, execute:

[0115] Determine whether the current test is an even or odd number of times;

[0116] If the current test is an even number of times, the current test will begin when the sum of the time set before the rising node of the next work cycle and the first test duration is reached. The electric propulsion interference torque during the current test will be evaluated, and then the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0117] If the current test is an odd number of times, the current test will begin after a set time after the rising node of the work cycle in which the previous test was located, and the electric propulsion interference torque at the current test will be evaluated. Then, the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold. The test duration of each test in which the first thrust vector points to the center of mass is the first test duration.

[0118] The second thrust vector is directed towards the center of mass based on the second test duration, including:

[0119] After a set time following the descent point in the target's initial working cycle, the first test of the second thrust vector pointing towards the center of mass begins; the duration of this first test is the duration of the second test.

[0120] The electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0121] If so, the second thrust vector pointing towards the center of mass test is complete;

[0122] If not, then for each subsequent test, execute:

[0123] Determine whether the current test is an even or odd number of times;

[0124] If the current test is an even number of times, the current test will begin when the time before the descending intersection of the next working cycle is set to the sum of the time of the second test and the time of the current test. The electric propulsion interference torque during the current test will be evaluated, and then the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold.

[0125] If the current test is an odd number of times, the current test will begin after a set time after the descending intersection of the working cycle in which the previous test is located, and the electric propulsion interference torque during the current test will be evaluated. Then, the process will jump to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold. The test duration for each test in which the second thrust vector points to the center of mass is the second test duration.

[0126] In one embodiment of the present invention, the first ignition test in the third test unit 305 is performed in the following manner:

[0127] Obtain the pre-set test duration for the first ignition test;

[0128] The first ignition test begins when the first thrust vector points to the ascending node of the next working cycle after the completion of the first centroid test, at the first target time interval; wherein, the first target time interval is half the test duration of the first ignition test;

[0129] The second ignition test was conducted in the following manner:

[0130] Obtain the pre-set test duration for the second ignition test;

[0131] The second ignition test begins at the second target time interval before the descending intersection of the next working cycle after the second thrust vector points to the center of mass test is completed; wherein the second target time interval is half the test duration of the second ignition test.

[0132] It is understood that the structures illustrated in the embodiments of the present invention do not constitute a specific limitation on an on-orbit testing device for electric propulsion in a synchronous orbit. In other embodiments of the present invention, an on-orbit testing device for electric propulsion in a synchronous orbit may include more or fewer component units than illustrated, or combine certain component units, or split certain component units, or arrange different component units. The illustrated components may be implemented in hardware, software, or a combination of software and hardware.

[0133] The information interaction and execution process between the modules in the above-mentioned device are based on the same concept as the method embodiment of the present invention, and the specific details can be found in the description of the method embodiment of the present invention, and will not be repeated here.

[0134] This invention also provides a computing device, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements an on-orbit testing method for electric propulsion in a synchronous orbit according to any embodiment of this invention.

[0135] This invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform an on-orbit test method for electric propulsion in a synchronous orbit according to any embodiment of this invention.

[0136] Specifically, a system or apparatus equipped with a storage medium may be provided, on which software program code implementing the functions of any of the embodiments described above is stored, and the computer (or CPU or MPU) of the system or apparatus may read and execute the program code stored in the storage medium.

[0137] In this case, the program code read from the storage medium can itself implement the function of any of the above embodiments, and therefore the program code and the storage medium storing the program code constitute part of the present invention.

[0138] Storage media embodiments for providing program code include floppy disks, hard disks, magneto-optical disks, optical disks (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), magnetic tapes, non-volatile memory cards, and ROMs.

[0139] Furthermore, it should be clear that not only can the program code read by the computer be executed, but also the operating system or other components operating on the computer can be instructed based on the program code to perform some or all of the actual operations, thereby realizing the function of any of the embodiments described above.

[0140] Furthermore, it is understood that the program code read from the storage medium is written to the memory set in the expansion board inserted into the computer or to the memory set in the expansion module connected to the computer. Then, based on the instructions of the program code, the CPU or other components installed on the expansion board or expansion module execute some and all of the actual operations, thereby realizing the function of any of the embodiments described above.

[0141] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus.

[0142] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as ROM, RAM, magnetic disk, or optical disk.

[0143] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for on-orbit testing of electric propulsion in a synchronous orbit, characterized in that, include: Before the satellite is positioned, a thrustless pretreatment test is conducted; wherein the thrustless pretreatment includes at least exhaust pretreatment, cathode pretreatment and discharge chamber pretreatment. When the satellite reaches the ascending node ignition zone and the descending node ignition zone during the initial target working cycle, it performs the first gate preprocessing and the second gate preprocessing, respectively. The first gate preprocessing uses the north thruster to generate thrust, and the second gate preprocessing uses the south thruster to generate thrust. After the first gate preprocessing and the second gate preprocessing are completed, the actual average thrust of the first gate preprocessing and the second gate preprocessing are calculated respectively. Based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the first test duration of the first thrust vector pointing to the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the center of mass test conducted in the descending node ignition zone are determined respectively, so that the first thrust vector pointing to the center of mass test and the second thrust vector pointing to the center of mass test are conducted based on the first test duration and the second test duration respectively. The first ignition test is performed in the rising intersection ignition zone of the next working cycle after the first thrust vector pointing to the center of mass test is completed; and the second ignition test is performed in the falling intersection ignition zone of the next working cycle after the second thrust vector pointing to the center of mass test is completed.

2. The method according to claim 1, characterized in that, When the satellite reaches the ascending node ignition zone and the descending node ignition zone during the target's initial operational cycle, it performs first gate preprocessing and second gate preprocessing, respectively, including: Obtain a preset first idle time T1 and a gate preprocessing time T2; wherein, the first idle time is the interval between the end of the first gate preprocessing and the rising crossover point, and the interval between the end of the second gate preprocessing and the falling crossover point; When the satellite reaches the ascending node at time T1+T2 before the target's initial working cycle, the first gate preprocessing begins. When the satellite reaches the descending node at time T1+T2 before the target's initial working cycle, the second gate preprocessing begins.

3. The method according to claim 1, characterized in that, The actual average thrust of the first gate preprocessing and the second gate preprocessing is calculated using the following formula: In the formula, F1 is the actual average thrust of the first gate preprocessing or the second gate preprocessing, a is the thrust correction coefficient, i is the gate preprocessing level of the first gate preprocessing or the second gate preprocessing, n is the number of gate preprocessing levels, and I bi V represents the actual gate current value of the gate preprocessing stage for the first gate preprocessing or the second gate preprocessing stage. bi The actual grid voltage value is the grid preprocessing level of the first or second gate preprocessing.

4. The method according to claim 2, characterized in that, The determination of the first test duration for the first thrust vector pointing towards the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration for the second thrust vector pointing towards the center of mass test conducted in the descending node ignition zone, based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, includes: Based on the gate preprocessing settings of the first gate preprocessing and the second gate preprocessing, and the rated current and rated voltage values ​​of the gate preprocessing settings of the first gate preprocessing and the second gate preprocessing, the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing is determined. Based on the estimated equivalent thrust of the first gate preprocessing and the second gate preprocessing, the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test are determined respectively. Based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the gate preprocessing time T2, and the equivalent thrust of the first thrust vector pointing to the centroid test and the second thrust vector pointing to the centroid test, the first test duration of the first thrust vector pointing to the centroid test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the centroid test conducted in the descending node ignition zone are determined respectively.

5. The method according to claim 4, characterized in that, The first test duration and the second test duration are calculated using the following formula: In the formula, T F The first test duration or the second test duration is denoted as F1, the actual average thrust of the first gate preprocessing or the second gate preprocessing is denoted as T2, the gate preprocessing time is denoted as F2, and the equivalent thrust of the first thrust vector pointing to the centroid test or the second thrust vector pointing to the centroid test is denoted as F2.

6. The method according to claim 1, characterized in that, Based on the first test duration, the test of the first thrust vector pointing towards the center of mass includes: When the time is set after the ascending node in the target's initial working cycle, the first test of the first thrust vector pointing to the center of mass is started; wherein, the test duration of the first test is the first test duration; The electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold. If so, the test of the first thrust vector pointing towards the center of mass is complete; If not, then for each subsequent test, execute: Determine whether the current test is an even or odd number of times; If the current test is an even number of times, the current test will begin when the sum of the time set before the rising node of the next working cycle and the first test duration is reached. The electric propulsion interference torque during the current test will be evaluated, and then the process will jump to execute the judgment on whether the electric propulsion interference torque is less than or equal to the judgment threshold. If the current test is an odd number of times, the current test will begin after a set time after the rising node of the work cycle in which the previous test was conducted, and the electric propulsion interference torque during the current test will be evaluated. Then, the process will jump to execute the judgment on whether the electric propulsion interference torque is less than or equal to the judgment threshold. The test duration of each test in which the first thrust vector points to the center of mass is the first test duration. The second thrust vector is tested for pointing towards the center of mass based on the second test duration, including: After a set time following the descent point in the target's initial working cycle, the first test of the second thrust vector pointing towards the center of mass begins; wherein the duration of the first test is the second test duration. The electric propulsion interference torque during the first test is evaluated to determine whether the electric propulsion interference torque is less than or equal to the judgment threshold. If so, the second thrust vector pointing towards the center of mass test is complete; If not, then for each subsequent test, execute: Determine whether the current test is an even or odd number of times; If the current test is an even number of times, the current test will begin when the time before the descending intersection of the next working cycle is set to the sum of the second test duration and the time before the current test. The electric propulsion interference torque during the current test will be evaluated, and then the process will jump to execute the judgment on whether the electric propulsion interference torque is less than or equal to the judgment threshold. If the current test is an odd number of times, the current test will begin after a set time after the descending intersection of the working cycle in which the previous test was conducted, and the electric propulsion interference torque during the current test will be evaluated. Then, the process will jump to execute the judgment on whether the electric propulsion interference torque is less than or equal to the judgment threshold. The test duration of each test in which the second thrust vector points to the center of mass is the second test duration.

7. The method according to any one of claims 1-6, characterized in that, The first ignition test was conducted in the following manner: Obtain the pre-set test duration for the first ignition test; The first ignition test begins when the first thrust vector is at the ascending node of the next working cycle after the completion of the centroid test, at the first target time interval; wherein, the first target time interval is half the test duration of the first ignition test; The second ignition test was conducted in the following manner: Obtain the pre-set test duration for the second ignition test; The second ignition test begins at the second target time interval before the descending intersection of the next working cycle after the second thrust vector points to the center of mass test; wherein the second target time interval is half the test duration of the second ignition test.

8. An on-orbit testing device for electric propulsion in a synchronous orbit, characterized in that, include: The first test unit is used to conduct thrustless pretreatment tests before the satellite is positioned; wherein the thrustless pretreatment projects include at least exhaust pretreatment, cathode pretreatment and discharge chamber pretreatment. The gate preprocessing unit is used to perform first gate preprocessing and second gate preprocessing respectively when the satellite reaches the ascending node ignition zone and the descending node ignition zone during the initial working cycle of the target; wherein, the first gate preprocessing uses the north thruster to generate thrust, and the second gate preprocessing uses the south thruster to generate thrust. The calculation unit is used to calculate the actual average thrust of the first gate preprocessing and the second gate preprocessing respectively after the first gate preprocessing and the second gate preprocessing are completed. The second test unit is used to determine, based on the actual average thrust of the first gate preprocessing and the second gate preprocessing, the first test duration of the first thrust vector pointing to the center of mass test conducted by the satellite in the ascending node ignition zone and the second test duration of the second thrust vector pointing to the center of mass test conducted in the descending node ignition zone, so as to perform the first thrust vector pointing to the center of mass test and the second thrust vector pointing to the center of mass test based on the first test duration and the second test duration, respectively. The third test unit is used to perform a first ignition test in the rising intersection ignition zone of the next working cycle after the first thrust vector pointing to the center of mass test is completed; and to perform a second ignition test in the falling intersection ignition zone of the next working cycle after the second thrust vector pointing to the center of mass test is completed.

9. A computing device comprising a memory and a processor, wherein the memory stores a computer program, and the processor, when executing the computer program, implements the method as described in any one of claims 1-7.

10. A computer-readable storage medium having a computer program stored thereon, which, when executed in a computer, causes the computer to perform the method of any one of claims 1-7.

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