Contour measuring apparatus and contour measuring method
By introducing a buffer unit into the contour measuring device to maintain a preset distance between the blocking part and the measuring rod, the problem of probe fall damage is solved, thus achieving protection and accuracy during the measurement process.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHOTEST TECH INC
- Filing Date
- 2023-12-14
- Publication Date
- 2026-07-21
AI Technical Summary
When measuring complex-shaped workpieces, traditional contour measuring instruments are prone to damage due to the probe falling under gravity, and the measurement results are inaccurate.
A contour measuring device including a measuring mechanism, a driving mechanism, and a control unit is used. The buffer unit maintains a preset distance from the probe rod to control the probe's falling speed and moves synchronously when the probe leaves the device to reduce impact and ensure measurement accuracy.
It effectively protects the probe, reduces damage, improves the accuracy and stability of measurement results, and avoids measurement interruptions.
Smart Images
Figure CN117629133B_ABST
Abstract
Description
Technical Field
[0001] This disclosure generally relates to the intelligent manufacturing equipment industry, and specifically to a contour measuring device and a contour measuring method. Background Technology
[0002] As industrialization continues to improve, the demand for high-precision measurement of complex shapes and minute dimensions of products is increasing day by day. Traditional manual measurement methods can no longer meet people's pursuit of high-precision measurement.
[0003] A profile measuring instrument (also known as a profilometer) is an industrial measuring instrument used for high-precision measurement of the surface profile (e.g., roughness or shape) of a workpiece. Based on their working principle, profilometers can be divided into contact profilometers and optical 3D surface profilometers. Contact profilometers obtain surface profile data by having a scanning axis contact and move across the workpiece surface. The scanning axis includes a stylus and a probe. The stylus contacts the workpiece surface, and the probe can rotate around a center of rotation, with one end fixedly connected to the stylus. Specifically, the stylus can contact the workpiece surface under gravity or other forces. The probe, driven by a drive mechanism, moves the stylus across the workpiece surface. The stylus can undulate along the Z-axis following the surface profile of the workpiece, and correspondingly, the probe can rotate back and forth around the center of rotation (i.e., reciprocate). Thus, the surface profile data of the workpiece can be obtained based on the positional changes of the probe.
[0004] However, for workpieces with complex shapes (such as workpieces with uneven contour surfaces or large height differences between adjacent surfaces), the probe may suddenly fall from the higher surface of the workpiece to the lower surface under the action of gravity as it moves along the surface contour of the workpiece, which may cause damage to the probe. Summary of the Invention
[0005] This disclosure is made in view of the above-mentioned situation, and its purpose is to provide a contour measuring device and contour measuring method that can protect the probe during the measurement process.
[0006] To this end, the first aspect of this disclosure provides a contour measuring device, including a measuring mechanism, a driving mechanism, and a control unit. The driving mechanism is configured to drive the measuring mechanism to move relative to the object to be measured. The measuring mechanism includes a scanning unit and a buffer unit. The scanning unit includes a probe that can swing around a rotation center and a probe fixedly connected to one end of the probe and configured to contact the object to be measured under the action of a first force. The probe is configured to swing back and forth around the rotation center as the position of the probe changes in a first direction. The buffer unit includes a blocking part and a driving part. The driving part is configured to drive the blocking part to move at a preset speed during the measurement process of the contour measuring device so that the blocking part and the probe maintain a preset distance. The control unit is configured to obtain the target stroke of the blocking part based on a preset value and the swing position of the probe. The driving part drives the blocking part to move the target stroke so that the blocking part and the probe maintain the preset distance. The probe is configured to swing toward the blocking part and abut against the blocking part under the action of the first force when the probe leaves the object to be measured.
[0007] In the first aspect of this disclosure, when the probe detaches from the object to be measured, the probe falls, and the probe rod swings around the center of rotation toward the blocking part under the action of a first force. Since the blocking part needs to maintain a preset distance from the probe rod, the driving part drives the blocking part to move away from the probe rod at a preset speed. However, since the preset speed of the blocking part is a controllable speed, by setting the preset speed, the probe rod can come into contact with the blocking part and move synchronously with the blocking part. In this case, the blocking part can block the swing of the probe rod, thereby slowing down the swing speed of the probe rod, and thus slowing down the falling speed of the probe. This buffers the impact of the probe falling on the object to be measured, reducing damage to the probe. In addition, since the probe rod and the blocking part move synchronously, the probe can re-contact the object to be measured, thereby preventing the measurement from stopping due to probe detachment.
[0008] Furthermore, in the contour measuring device according to the first aspect of this disclosure, optionally, the control unit is configured to control the drive mechanism to stop driving the measuring mechanism to move relative to the object when the probe detaches from the object to be measured, and to control the drive mechanism to continue driving the measuring mechanism to move relative to the object after the probe re-contacts the object and the blocking part and the measuring rod have the preset distance. In this case, during the measurement process, when the probe detaches from the object, the probe is in a suspended state. At this time, the data obtained based on the position of the measuring rod is not the contour data of the object to be measured. By stopping the measuring mechanism from moving, on the one hand, the control unit can stop obtaining the contour data of the object to be measured based on the position change of the measuring rod, and on the other hand, it can prevent the probe from missing the measurement points on the object due to movement. Thus, the accuracy of the measurement results can be improved.
[0009] Additionally, in the contour measuring apparatus according to the first aspect of this disclosure, optionally, the blocking part is configured to abut against the measuring rod under the drive of the driving part to keep the measuring rod in a balanced state. In this case, by the blocking part abutting against the measuring rod, the swing of the measuring rod around the rotation center can be restricted, thereby limiting the measuring rod to keep it stationary, and thus enabling the scanning unit to maintain a balanced state.
[0010] Furthermore, in the contour measuring device according to the first aspect of this disclosure, optionally, the driving unit includes a motor and a rotating wheel. The motor is fixedly connected to the blocking unit via the rotating wheel, and the motor drives the rotating wheel to rotate so that the blocking unit abuts against or moves away from the measuring rod. In this case, the blocking unit can move around the output shaft of the motor, thereby easily adapting the movement path of the blocking unit to the swing path of the measuring rod. When the measuring rod abuts against the blocking unit, the blocking unit can drive the measuring rod to move along the swing path of the measuring rod under the drive of the driving unit, thereby enabling the measuring rod and the blocking unit to move synchronously, and thus suppressing the situation where the blocking unit obstructs the measuring rod and affects the measurement process.
[0011] Additionally, in the contour measuring device according to the first aspect of this disclosure, optionally, the scanning unit includes a first measuring element configured to detect whether the probe is in contact with the object to be measured, and the buffer unit includes a second measuring element configured to detect the swing position of the probe. In this case, the contact status between the probe and the object to be measured can be obtained through the first measuring element. Furthermore, the angle between the probe and the horizontal plane can be obtained through the second measuring element, thereby enabling the acquisition of the swing position of the probe.
[0012] Additionally, in the contour measuring device according to the first aspect of this disclosure, optionally, the buffer unit further includes two sensing elements, and the measuring rod is provided with a blocking portion that cooperates with the sensing elements to generate an alarm signal, with the two sensing elements located at opposite ends of the movement path of the blocking portion. In this case, the sensing elements and the blocking portion can limit the angular range of the measuring rod's swing around the rotation center, thereby preventing damage to the measuring rod that might occur due to excessive swing angle.
[0013] Furthermore, in the contour measuring device according to the first aspect of this disclosure, optionally, the measuring rod includes a first rod and a second rod located on both sides of the rotation center, wherein one end of the first rod is fixedly connected to the probe, and the blocking part is located below the first rod or above the second rod. In this case, while ensuring that the measuring rod swings towards the blocking part when the probe falls, the flexibility of setting the position of the blocking part can be improved.
[0014] A second aspect of this disclosure provides a contour measurement method, which is a method for measuring the contour of an object to be measured using the contour measurement device involved in the first aspect of this disclosure. The method includes: driving a measuring mechanism to move relative to the object to be measured so that a scanning unit of the measuring mechanism approaches the object to be measured, a probe of the scanning unit contacts the object to be measured; driving the measuring mechanism to move relative to the object to be measured so that the probe moves on the object to be measured in a second direction; oscillating the measuring rod around a rotation center in response to a change in the position of the probe in a first direction; obtaining the oscillation position of the measuring rod; obtaining a target stroke of the blocking part based on a preset value and the oscillation position; and driving the blocking part to move the target stroke at a preset speed so that the measuring rod and the blocking part maintain the preset distance. The measuring rod is configured to oscillate towards the blocking part and abut against the blocking part under the action of a first force when the probe leaves the object to be measured.
[0015] In the second aspect of this disclosure, during the process of measuring the contour of an object to be measured by the contour measuring device, the control unit continuously acquires the target stroke of the blocking part based on a preset value and the swing position of the probe, and the drive unit drives the blocking part to move the target stroke so that the blocking part and the probe maintain a preset distance. In this case, when the probe is not detached from the object to be measured, the probe will swing back and forth around the rotation center due to the position change of the probe in the first direction. Since the blocking part and the probe maintain a preset distance, the situation where the blocking part interferes with the reciprocating swing of the probe and affects the measurement result can be suppressed. In addition, when the probe is detached from the object to be measured, the probe swings around the rotation center toward the blocking part under the action of a first force. In order to maintain a preset distance with the probe, the blocking part is driven to move away from the probe at a preset speed. However, since the preset speed of the blocking part is a controllable speed, by setting the preset speed, the probe can come into contact with the blocking part and move synchronously with the blocking part. Thus, the blocking part can block the swing of the probe to slow down the swing speed of the probe, thereby slowing down the falling speed of the probe.
[0016] Furthermore, in the contour measurement method according to the second aspect of this disclosure, optionally, in response to the probe detaching from the object to be measured, the probe rod swings around the rotation center toward the blocking portion until it abuts the blocking portion. Under the action of the first force, the probe rod continues to abut against the blocking portion and moves synchronously with the blocking portion. Once the probe re-contacts the object to be measured and stops moving, the blocking portion and the probe rod separate until the blocking portion and the probe rod have the preset distance. This allows the blocking portion to prepare for a further drop of the probe.
[0017] In addition, in the contour measurement method according to the second aspect of this disclosure, optionally, in response to the probe disengaging from the object to be measured, the movement of the measuring mechanism relative to the object to be measured is stopped, and the movement of the measuring mechanism relative to the object to be measured is continued after the probe re-contacts the object to be measured and the blocking part and the measuring rod have the preset distance.
[0018] According to this disclosure, a contour measuring device and a contour measuring method are provided that can protect the probe during the measurement process. Attached Figure Description
[0019] The present disclosure will now be described in detail with reference to examples in the accompanying drawings, in which:
[0020] Figure 1 This is a schematic diagram illustrating an application scenario of the contour measuring device involved in the example of this disclosure.
[0021] Figure 2 This is a block diagram illustrating the composition of the contour measuring apparatus involved in the example of this disclosure.
[0022] Figure 3 This is a schematic diagram illustrating the contact of the probe with the object to be measured as described in this disclosure.
[0023] Figure 4 This is a schematic diagram illustrating the detachment of the probe from the object to be measured, as described in the examples of this disclosure.
[0024] Figure 5 This is a schematic diagram illustrating the balance of the measuring rod as described in the example of this disclosure.
[0025] Figure 6 This is a schematic diagram showing that the blocking part involved in the example of this disclosure is located above the measuring rod.
[0026] Figure 7 This is a simplified schematic diagram illustrating the calculation of the target route involved in the example of this disclosure.
[0027] Figure 8 This is a flowchart illustrating the contour measurement method involved in the example of this disclosure.
[0028] Figure 9 This is a flowchart illustrating a contour measurement method involving the probe being detached from the object to be measured, as described in this disclosure.
[0029] Figure 10 This is a flowchart illustrating another embodiment of the contour measurement method involving the probe being detached from the object to be measured, as described in this disclosure.
[0030] Explanation of reference numerals in the attached figures:
[0031] 1……Contour measuring device, 3……Object to be measured, 10……Measuring mechanism, 12……Scanning unit, 120……Measuring rod, 120a……First rod, 120b……Second rod, 1202……Blocking part, 122……Stimulus, 123……Rotation center, 14……Buffer unit, 140……Blocking part, 142……Drive part, 142a……Motor, 142b……Rotating wheel, 144……Second measuring element, 146……Sensing element, D……Preset spacing, L……Height difference, 16……Control unit, 20……Drive mechanism. Detailed Implementation
[0032] The technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.
[0033] It should be noted that the terms "first," "second," "third," and "fourth," etc., in this disclosure, claims, and the aforementioned drawings are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices. In the following description, the same reference numerals are used for the same parts, and repeated descriptions are omitted. Additionally, the drawings are merely schematic diagrams, and the scale of the parts or the shape of the parts may differ from the actual figures.
[0034] The first aspect of this disclosure relates to a profile measuring device, which can be configured to measure the profile shape (or roughness) of an object to be measured.
[0035] In some examples, the profile measuring device may be called a roughness measuring device, a profile measuring instrument, or a profiler, etc.
[0036] Figure 1 This is a schematic diagram illustrating an application scenario of the contour measuring device 1 involved in the example of this disclosure. Figure 2 This is a block diagram illustrating the composition of the contour measuring device 1 as described in this disclosure example.
[0037] See in some examples Figure 1 and Figure 2 The contour measuring device 1 may include a measuring mechanism 10 and a driving mechanism 20, wherein the driving mechanism 20 may be configured to drive the measuring mechanism 10 to move relative to the object 3 to be measured. For example, see Figure 1 The driving mechanism 20 can drive the measuring mechanism 10 to move relative to the object to be measured 3 along the X-axis or Z-axis.
[0038] In some examples, the measuring mechanism 10 can be used to acquire contour data of the object to be measured 3. Specifically, the measuring mechanism 10 can move relative to the object to be measured 3 under the drive of the driving mechanism 20 to scan the object to be measured 3, and the contour measuring device 1 can acquire contour data of the object to be measured 3 based on the scanning results of the measuring mechanism 10.
[0039] See in some examples Figure 2 The contour measuring device 1 may include a control unit 16. In some examples, the control unit 16 may be used to control the drive mechanism 20 to drive the measuring mechanism 10 to move.
[0040] See in some examples Figure 1 or Figure 2The measuring mechanism 10 may include a scanning unit 12. The scanning unit 12 may be configured to scan the surface of the object 3 to be measured to obtain scanning results.
[0041] See in some examples Figure 1 and Figure 2 The scanning unit 12 can be used to contact the object 3 to be measured, and the scanning unit 12 can move on the surface of the object 3 under the drive of the driving mechanism 20. The contour measuring device 1 can acquire the contour data of the object 3 to be measured through the scanning unit 12. Specifically, by driving the measuring mechanism 10 to move relative to the object 3 along the X-axis and Z-axis directions respectively by the driving mechanism 20, the scanning unit 12 can contact the object 3 to be measured (see...). Figure 1 Additionally, by driving the measuring mechanism 10 along the X-axis relative to the object 3 via the driving mechanism 20, the scanning unit 12 can be moved on the object 3 (see...). Figure 1 Thus, the contour measuring device 1 can acquire the contour data of the object to be measured 3 through the scanning unit 12.
[0042] In some examples, scanning unit 12 may also be referred to as scanning axis.
[0043] Figure 3 This is a schematic diagram showing the probe 122 contacting the object 3 to be measured, as described in this disclosure example. Figure 4 This is a schematic diagram showing the probe 122 detaching from the object 3 to be measured, as described in this disclosure example. Figure 5 This is a schematic diagram showing the measuring rod 120 maintaining a balanced state as described in the example of this disclosure. Figure 6 This is a schematic diagram showing the blocking portion 140, as described in this disclosure, located above the measuring rod 120.
[0044] See in some examples Figure 3 The scanning unit 12 may include a probe 120 and a stylus 122. The probe 120 may swing around a rotation center 123, and the stylus 122 may be fixedly connected to one end of the probe 120.
[0045] See in some examples Figure 3 The probe 122 can be used to contact the object 3 to be measured. In some examples, the probe 122 can be configured to contact the object under the action of a first force. The first force may include gravity and / or other external forces.
[0046] In some examples, the probe 122 can contact the object 3 under the influence of gravity. For example, the probe 122 can contact the object 3 under its own weight. As another example, the probe 122 can contact the object 3 under the combined influence of its own weight and the weight of the probe 120.
[0047] In addition, in some examples, the probe 122 can come into contact with the object 3 under the action of other external forces.
[0048] In some examples, the probe 122 involved in this disclosure may also be referred to as a probe or stylus.
[0049] See in some examples Figure 3 When the probe 122 contacts the object 3 to be measured, it is driven by the drive mechanism 20 and can move along the surface of the object 3 (e.g., in the positive X-axis direction) under the action of the probe rod 120. Furthermore, the probe 122 can undulate with the surface contour of the object 3 to be measured in the first direction, thereby changing the position of the probe 122 in the first direction.
[0050] In some examples, the first direction can be the vertical direction (i.e., the Z-axis direction), the horizontal direction, or any other arbitrary direction. This disclosure does not limit this.
[0051] In some examples, the probe 120 can be configured to oscillate back and forth as the position of the probe 122 changes. See specifically... Figure 3 During the movement of the probe 122 on the surface of the object 3 to be measured, the probe rod 120 can be configured to oscillate back and forth around the rotation center 123 as the position of the probe 122 changes in the first direction. Thus, contour data of the object 3 to be measured can be obtained based on the oscillation position change of the probe rod 120.
[0052] In some examples, the control unit 16 can acquire contour data of the object under test 3 based on the swing position change of the probe 120.
[0053] In some examples, the scanning unit 12 may include a first measuring element. The first measuring element may be configured to detect whether the probe 122 is in contact with the object 3 to be measured. In other words, the first measuring element may be used to detect whether the probe 122 has detached from the object 3 to be measured. Thus, the contact status between the probe 122 and the object 3 to be measured can be obtained through the first measuring element.
[0054] In some examples, the first measuring element may be, for example, a force sensor. The force sensor can be used to detect the force applied to the probe 120. In some examples, in response to the force sensor's detection result being not less than a preset threshold, it can be confirmed that the probe 122 is in contact with the object 3 to be measured. Conversely, in response to the force sensor's detection result being less than the preset threshold, it can be confirmed that the probe 122 has detached from the object 3 to be measured.
[0055] See in some examples Figure 2 The measuring mechanism 10 may include a buffer unit 14. The buffer unit 14 can be used to buffer and protect the probe 122.
[0056] See in some examples Figure 3 The buffer unit 14 may include a blocking part 140 and a driving part 142. The driving part 142 can be used to drive the blocking part 140 to move.
[0057] In some examples, the blocking portion 140 can be used to abut against the measuring rod 120. Further, see... Figure 4 When the measuring rod 120 comes into contact with the blocking part 140, the speed at which the measuring rod 120 swings around the rotation center 123 can be slowed down by causing the blocking part 140 to move slowly. See also other examples. Figure 5 When the measuring rod 120 comes into contact with the blocking part 140, the measuring rod 120 can be restricted from swinging around the rotation center 123 by stopping the movement of the blocking part 140.
[0058] In some examples, the blocking part 140 may be configured to abut against or move away from the measuring rod 120 under the drive of the driving part 142. Specifically, the driving part 142 may drive the blocking part 140 to move to change the position of the blocking part 140, thereby allowing the blocking part 140 to abut against or move away from the measuring rod 120.
[0059] In some examples, the movement path of the blocking part 140 can be adapted to the swing path of the measuring rod 120. Specifically, when the measuring rod 120 abuts against the blocking part 140 under the action of the first force, the blocking part 140 can drive the measuring rod 120 to move along the swing path of the measuring rod 120 under the drive of the driving part 142. Thus, the measuring rod 120 and the blocking part 140 can move synchronously.
[0060] In some examples, the blocking part 140 may be configured to abut against the measuring rod 120 under the drive of the driving part 142 to keep the measuring rod 120 in a balanced state. Specifically, see [link to relevant documentation]. Figure 5 Before measuring the object 3 (at which point the probe 122 is not in contact with the object 3), the drive unit 142 can drive the blocking part 140 to abut against the probe 120, and after the blocking part 140 abuts against the probe 120, the drive unit 142 can keep the blocking part 140 in a stopped state. In this case, by the blocking part 140 abutting against the probe 120, the swing of the probe 120 around the rotation center 123 can be restricted, thereby limiting the probe 120 to keep it stationary, and thus enabling the scanning unit 12 to maintain a balanced state.
[0061] Furthermore, the blocking part 140 can restrict the swing of the measuring rod 120 at a preset position. That is, the driving part 142 can drive the blocking part 140 to move to the preset position and then keep the blocking part 140 in a stopped state, so that the blocking part 140 can restrict the swing of the measuring rod 120 around the rotation center 123 at the preset position, and the scanning unit 12 can maintain a balanced state at the preset position.
[0062] See in some examples Figure 3 The drive unit 142 can be configured to drive the blocking part 140 to move at a preset speed during the measurement process of the contour measuring device 1 so that the blocking part 140 and the measuring rod 120 maintain a preset distance D.
[0063] In other words, the blocking part 140 can maintain a preset distance D with the measuring rod 120 under the drive of the driving part 142. Specifically, see... Figure 3 When the probe 122 contacts the object 3 to be measured and moves on the surface of the object 3, the blocking part 140 can move away from the probe 120 at a preset speed under the drive of the driving part 142, thereby maintaining a preset distance D between the blocking part 140 and the probe 120. In this case, during the measurement process, when the probe 122 has not detached from the object 3 to be measured, the probe 120 will swing back and forth around the rotation center 123 due to the change in the position of the probe 122 in the Z-axis direction. Since the blocking part 140 and the probe 120 maintain a preset distance D, the situation where the blocking part 140 interferes with the reciprocating swing of the probe 120 and affects the measurement result can be suppressed.
[0064] In some examples, the preset speed of the movement of the blocking part 140 can be set manually. In other words, the preset speed can be a limited speed (i.e., a controllable speed), which the user can set according to the measurement needs. In some examples, the preset speed can be variable within a certain range; alternatively, the preset speed can also be a constant speed.
[0065] See in some examples Figure 3 The preset spacing D can represent the shortest straight-line distance between the measuring rod 120 and the blocking part 140. Additionally, in some examples, see... Figure 3 The preset spacing D can also represent the angle value of the measuring rod 120 swinging around the rotation center 123 to the contact blocking part 140.
[0066] In some examples, the control unit 16 can calculate the target travel distance of the blocking part 140 based on the target position that the blocking part 140 needs to reach.
[0067] In some examples, the target stroke can represent the distance that the blocking part 140 needs to move in order to maintain a preset distance D with the measuring rod 120.
[0068] In some examples, the control unit 16 can be configured to obtain the target stroke of the blocking part 140 based on preset values and the swing position of the probe 120.
[0069] In some examples, the control unit 16 may be configured to continuously acquire the target stroke of the blocking part 140 based on a preset value and the swing position of the measuring rod 120 during the process of the contour measuring device 1 measuring the contour of the object 3 to be measured. Furthermore, the drive unit 142 may drive the blocking part 140 to move the target stroke so that the blocking part 140 and the measuring rod 120 maintain a preset distance D.
[0070] Specifically, see Figure 3 During the process of contour measurement device 1 measuring the contour of object 3, when probe 122 is not disengaged from object 3 and probe 120 swings back and forth around rotation center 123, the position of blocking part 140 needs to be continuously adjusted to maintain a preset distance D between blocking part 140 and probe 120. Based on this, control unit 16 can continuously calculate the target stroke for driving blocking part 140 based on preset value and the current swing position of probe 120, and drive part 142 can drive blocking part 140 to move the target stroke so that blocking part 140 and probe 120 maintain the preset distance D.
[0071] In some examples, the preset value can be a value of the preset spacing D.
[0072] In some examples, a correspondence between the swing position of the measuring rod 120 and the position information of the blocking part 140 can be established based on preset values. Furthermore, the control unit 16 can be configured to determine whether the measuring rod 120 and the blocking part 140 have a preset distance D based on the swing position of the measuring rod 120 and the position information of the blocking part 140. The position information of the blocking part 140 can be obtained by measuring tools such as optical scales, ball scales, or magnetic scales.
[0073] See in some examples Figure 3 or Figure 4 The buffer unit 14 may include a second measuring element 144, which can be configured to detect the swing position of the measuring rod 120. Specifically, when the measuring rod 120 reciprocates around the rotation center 123, the second measuring element 144 can obtain the angle between the measuring rod 120 and the horizontal plane, which can be used as the swing position of the measuring rod 120. That is, the swing position of the measuring rod 120 can also represent the swing angle of the measuring rod 120 around the rotation center 123. In this case, the angle between the measuring rod 120 and the horizontal plane can be obtained by the second measuring element 144, thereby obtaining the swing position of the measuring rod 120.
[0074] In some examples, the second measuring element 144 can be a ruler. For example, the second measuring element 144 can be a grating ruler, a ball grating ruler, or a magnetic grating ruler, etc. In addition, the process of obtaining the swing angle of the measuring rod 120 using the grating ruler can be as follows: first, use the grating ruler to directly obtain the distance moved by any point (e.g., point A) on the measuring rod 120 in the first direction, and then combine the trigonometric function and the length of point A from the rotation center 123 to calculate the swing angle of the measuring rod 120.
[0075] See in some examples Figure 4 The probe 120 can be configured to swing toward the blocking part 140 and abut against the blocking part 40 under the action of a first force when the probe 122 is separated from the object to be measured 3.
[0076] Specifically, the positional relationship between the blocking part 140 and the measuring rod 120 can satisfy the following: when the probe 122 falls, the measuring rod 120 can swing around the rotation center 123 towards the blocking part 140 under the action of the first force, and the measuring rod 120 abuts against the blocking part 40 before the probe 122 re-contacts the object 3 to be measured. In this case, when the probe 122 falls due to detachment from the object 3 to be measured, since the measuring rod 120 swings towards the blocking part 140 and abuts against the blocking part 140, the blocking part 140 can block the swing of the measuring rod 120, thereby slowing down the swing speed of the measuring rod 120.
[0077] In this disclosure, the falling of the probe 122 can mean that the probe 122 falls due to detachment from the object 3 being measured. Alternatively, the falling of the probe 122 can also be referred to as the probe 122 detaching.
[0078] See in some examples Figure 5 The measuring rod 120 may include a first rod 120a and a second rod 120b, which may be located on opposite sides of the rotation center 123. One end of the first rod 120a may be fixedly connected to the measuring stylus 122.
[0079] See in some examples Figure 5 The blocking part 140 may be located below the first rod 120a. See also other examples. Figure 6 Alternatively, the blocking part 140 can be located above the second rod 120b. In this case, the flexibility of setting the position of the blocking part 140 can be improved while ensuring that the probe 120 swings toward the blocking part 140 when the probe 122 falls.
[0080] See also in this disclosure Figure 4When the probe 122 detaches from the object 3 to be measured, it falls. Under the action of the first force, the probe rod 120 swings around the rotation center 123 toward the blocking part 140. Since the blocking part 140 needs to maintain a preset distance D from the probe rod 120, the driving part 142 drives the blocking part 140 to move away from the probe rod 120 at a preset speed. However, since the preset speed of the blocking part 140 is a controllable speed, by setting the preset speed, the probe rod 120 can come into contact with the blocking part 140 and move synchronously with the blocking part 140. In this case, the blocking part 140 can block the swing of the probe rod 120, thereby slowing down the swing speed of the probe rod 120, and thus slowing down the falling speed of the probe 122. This can buffer the impact of the probe 122 on the object 3 to be measured due to the fall, and reduce the damage to the probe 122. In addition, since the probe 120 and the blocking part 140 move synchronously, the probe 122 can re-contact the object to be measured 3, thereby preventing the measurement from stopping due to the probe 122 falling off.
[0081] In some examples, after the probe 122 re-contacts the object 3, the probe rod 120 can stop swinging. Since the control unit 16 can continuously obtain the target stroke of the blocking part 140 based on preset values and the swing position of the probe rod 120 during the contour measurement process of the contour measuring device 1, and the drive unit 142 can drive the blocking part 140 to move the target stroke so that the blocking part 140 maintains a preset distance D with the probe rod 120, the blocking part 140 can continue to move away from the probe rod 120 under the drive of the drive unit 142 until the blocking part 140 and the probe rod 120 have a preset distance D. Thus, the blocking part 140 can prepare for the probe 122 to fall again.
[0082] It should be noted that the preset distance D between the blocking part 140 and the measuring rod 120 involved in this disclosure can be related to the material of the measuring stylus 122 or to the outline shape of the object 3 to be measured. Furthermore, the preset distance D can also be manually set by the user according to the outline characteristics of the object 3 to be measured.
[0083] See in some examples Figure 3 For the object 3 to be measured where there is a height difference L between adjacent surfaces, the preset distance D can be smaller than the height difference L between adjacent surfaces. In this case, when the probe 122 detaches from the higher surface and falls, since the preset distance D is smaller than the height difference L between the higher and lower surfaces, the probe 120 can abut against the blocking part 140 and move synchronously with the blocking part 140 before the probe 122 collides with the lower surface. This allows the blocking part 140 to slow down the falling speed of the probe 122, thereby preventing the probe 122 from being damaged by rapidly hitting the lower surface.
[0084] Furthermore, when adjacent surfaces of the object under test 3 have multiple height differences L, the preset spacing D can be less than the minimum height difference L between adjacent surfaces.
[0085] In some examples, the preset spacing D can be a fixed value and pre-set at the factory. That is, the preset spacing D can be used as a device parameter of the contour measuring device 1. In this case, the preset spacing D can be used as a specific operating parameter of the contour measuring device 1, thereby enabling the contour measuring device 1 to specifically measure the object 3 that matches the preset spacing D.
[0086] In addition, the test object 3 that matches the preset spacing D can represent the test object 3 whose height difference between adjacent surfaces is greater than the preset spacing D.
[0087] See in some examples Figures 3 to 6 The drive unit 142 may include a motor 142a and a rotating wheel 142b. The motor 142a can be fixedly connected to the blocking part 140 through the rotating wheel 142b.
[0088] See in some examples Figures 3 to 6 The motor 142a can drive the blocking part 140 to move by driving the rotating wheel 142b to rotate, so that the blocking part 140 abuts against or moves away from the measuring rod 120. In this case, the blocking part 140 can move around the output shaft of the motor 142a, so that the movement path of the blocking part 140 can be easily matched with the swing path of the measuring rod 120. When the measuring rod 120 abuts against the blocking part 140, the blocking part 140 can drive the measuring rod 120 to move along the swing path of the measuring rod 120 under the drive of the driving part 142, so that the measuring rod 120 and the blocking part 140 can move synchronously, thereby suppressing the situation where the blocking part 140 blocks the measuring rod 120 and affects the measurement process.
[0089] In some examples, the rotary wheel 142b can be connected to an encoder. Alternatively, the encoder can be used to detect the rotation angle of the rotary wheel 142b. In some examples, the position information of the stop 140 can be represented by the rotation angle of the rotary wheel 142b.
[0090] In some examples, the control unit 16 can obtain the distance between the blocking part 140 and the measuring rod 120 based on the position information of the blocking part 140 and the swing angle of the measuring rod 120. This makes it easy to confirm whether the blocking part 140 and the measuring rod 120 have a preset distance D.
[0091] Figure 7 This is a simplified schematic diagram illustrating the calculation of the target route involved in the example of this disclosure.
[0092] The following describes the process of calculating the target stroke, taking the drive unit 142, which includes an electric motor 142a and a rotating wheel 142b, as an example.
[0093] As mentioned above, the preset value can be a preset spacing D, which can be pre-stored in the control unit 16. Additionally, the swing position of the measuring rod 120 can represent the swing angle of the measuring rod 120, which can be obtained by, for example, measurement using a grating ruler. Furthermore, the position information of the blocking part 140 can be represented by, for example, the rotation angle of the rotating wheel 142b obtained by an encoder.
[0094] In some examples, the preset spacing D can represent the angle at which the measuring rod 120 swings around the rotation center 123 to abut against the stop portion 140.
[0095] exist Figure 7 In the example shown, the rotation center 123 of the measuring rod 120 can be made to coincide with the center of the rotating wheel 142b. When the measuring rod 120 is in a horizontal position, the blocking part 140 abuts against the measuring rod 120, and the swing angle of the measuring rod 120 can be considered to be 0. Assuming that the preset distance D is the first angle α, if the measuring rod 120 swings downward around the rotation center 123 by the second angle β, in order to keep the preset distance D at the first angle α, the motor 142a can drive the blocking part 140 to rotate away from the measuring rod 120 to the position of the sum of the first angle α and the second angle β through the rotating wheel 142b.
[0096] In some examples, the encoder can confirm whether the blocking part 140 has rotated to the position of the sum of the first angle α and the second angle β.
[0097] It should be noted that, in Figure 7 In the example shown, setting the rotation center 123 of the measuring rod 120 to coincide with the center of the rotating wheel 142b is merely for simplifying the calculation process and should not be construed as a limitation of this disclosure. Even if the rotation center 123 of the measuring rod 120 does not coincide with the center of the rotating wheel 142b, those skilled in the art can deduce the target stroke based on the diagram.
[0098] See in some examples Figure 4The control unit 16 can be configured to control the drive mechanism 20 to stop driving the measuring mechanism 10 to move relative to the object 3 when the probe 122 detaches from the object 3. When the probe 122 re-contacts the object 3 and the blocking part 140 and the probe 120 have a preset distance D, the control unit 16 can control the drive mechanism 20 to continue driving the measuring mechanism 10 to move relative to the object 3 (e.g., along the positive X-axis). In this case, during the measurement process, when the probe 122 detaches from the object 3, it is in a suspended state. At this time, the data obtained based on the position of the probe 120 is not the contour data of the object 3. By stopping the measuring mechanism 10, the control unit 16 can stop acquiring the contour data of the object 3 based on the position change of the probe 120, and the situation where the probe 122 misses the measurement point on the object 3 due to movement can be prevented. Therefore, the accuracy of the measurement results can be improved.
[0099] In practical applications, if the height of the object to be measured 3 is too high, the probe 122 may be lifted too high during the measurement process, causing the probe 120 to swing too much around the rotation center 123, which may damage the probe 120. In other examples, when the measuring personnel manually lift the probe 120, excessive force may cause the probe 120 to swing too much, which may also damage the probe 120.
[0100] Based on this, see Figure 3 or Figure 5 The buffer unit 14 disclosed herein may also include two sensing elements 146. In some examples, the sensing elements 146 may cooperate with the blocking part 140 to limit the range of swing of the measuring rod 120.
[0101] In some examples, the probe 120 may be provided with a shielding part 1202, which can cooperate with the sensing element 146 to generate an alarm signal. Alternatively, the shielding part 1202 may be fixedly provided to the probe 120.
[0102] See in some examples Figure 5 The two sensing elements 146 can be located at opposite ends of the movement path of the blocking part 1202. In addition, the movement path of the blocking part 1202 can represent the path that the blocking part 1202 travels when it swings back and forth with the measuring rod 120.
[0103] In some examples, the sensing element 146 can cooperate with the blocking portion 1202 to generate an alarm signal. Specifically, see... Figure 5 When the measuring rod 120 swings around the rotation center 123, the blocking part 1202 can enter the sensing area of the sensing element 146, thereby triggering the sensing element 146 and causing the sensing element 146 to issue an alarm signal.
[0104] In some examples, the drive unit 142 can lock the stop part 140 based on an alarm signal. Specifically, the drive unit 142 can stop driving the movement of the stop part 140 in response to the alarm signal to fix the stop part 140. When the probe 120 swings around the rotation center 123 and comes into contact with the stop part 140, the probe 120 is blocked by the stop part 140 and forced to stop swinging. In this case, the angle range of the probe 120 swinging around the rotation center 123 can be limited by the sensing element 146 and the stop part 140, thereby preventing the probe 120 from being damaged due to excessive swing angle.
[0105] Preferably, in some examples, the sensing element 146 may be, for example, a photoelectric sensor (e.g., a photoelectric switch).
[0106] Figure 8 This is a flowchart illustrating the contour measurement method involved in the example of this disclosure. Figure 9 This is a flowchart illustrating a contour measurement method involving the probe being detached from the object to be measured, as described in this disclosure. Figure 10 This is a flowchart illustrating another embodiment of the contour measurement method involving the probe being detached from the object to be measured, as described in this disclosure.
[0107] The second aspect of this disclosure also provides a contour measurement method, which is a method for measuring the contour of an object 3 to be measured using the contour measurement device 1 involved in the first aspect of this disclosure.
[0108] See in some examples Figure 8 The contour measurement method disclosed herein may include: driving the measuring mechanism 10 to move relative to the object to be measured 3 so that the scanning unit 12 approaches the object to be measured 3 (step S110); the probe 122 of the scanning unit 12 contacts the object to be measured 3 (step S120); driving the measuring mechanism 10 to move relative to the object to be measured 3 so that the probe 122 moves in a second direction on the object to be measured 3 (step S130); in response to the reciprocating swing of the probe 120 around the rotation center 123, obtaining the swing position of the probe 120 (step S140); obtaining the target stroke of the blocking part 140 based on a preset value and the swing position (step S150); and driving the blocking part 140 to move the target stroke so that the probe 120 and the blocking part 140 maintain a preset distance (step S160).
[0109] See in some examples Figure 8 In step S110, the driving mechanism 20 can drive the measuring mechanism 10 to move relative to the object to be measured 3, for example, in the X-axis direction and the Z-axis direction, respectively, so that the scanning unit 12 of the measuring mechanism 10 gets closer to the object to be measured 3.
[0110] Further, in step S120, the probe 122 of the scanning unit 12 can contact the object to be measured 3 under the drive of the driving mechanism 20. In some examples, the probe 122 can contact the object to be measured 3 under the action of a first force. In addition, the first measuring element of the scanning unit 12 can confirm whether the probe 122 is in contact with the object to be measured 3 under the action of the first force.
[0111] In some examples, in response to the probe 122 contacting the object 3 to be measured, the blocking part 140 can be driven to move so that the blocking part 140 and the probe 120 have a preset distance D. Specifically, before measuring the object 3 to be measured (at which time the probe 122 has not yet contacted the object 3 to be measured), the blocking part 140 can abut against the probe 120 to keep the probe 120 in a balanced state. When the probe 122 contacts the object 3 to be measured, the blocking part 140 can be driven by the driving part 142 to move away from the probe 120 at a preset speed until the blocking part 140 and the probe 120 have a preset distance D.
[0112] In addition, the preset distance D between the blocking part 140 and the measuring rod 120 can be referred to the above description of the preset distance D.
[0113] See in some examples Figure 8 In step S130, after the probe 122 contacts the object 3 under the action of the first force, the drive mechanism 20 can drive the measuring mechanism 10 to move relative to the object 3 in the second direction, thereby causing the probe 122 to move in the second direction on the object 3. Furthermore, the probe 122 can undulate with the surface contour of the object 3 in the first direction, thereby changing the position of the probe 122 in the first direction. Simultaneously, the measuring rod 120 can oscillate back and forth around the rotation center 123 as the position of the probe 122 in the first direction changes.
[0114] In some examples, the first and second directions can be orthogonal.
[0115] Additionally, in some examples, the second direction can be horizontal (i.e., the X-axis direction), vertical, or any other arbitrary direction. This disclosure does not limit this.
[0116] See in some examples Figure 8 In step S140, in response to the reciprocating swing of the probe 120 around the rotation center 123 as the position of the probe 122 changes in the first direction, the swing position of the probe 122 can be obtained. Furthermore, the process of obtaining the swing position of the probe 120 can be referred to the above description regarding the swing position.
[0117] See in some examples Figure 8In step S150, the control unit 16 can obtain the target stroke of the driving stop 140 based on a preset value and the swing position of the probe 120. The preset value can be the value of a preset distance D. Furthermore, the process of obtaining the target stroke can be referred to the above description regarding the target stroke.
[0118] See in some examples Figure 8 In step S160, the blocking part 140 can be driven by the driving part 142 to move the target stroke at a preset speed so that the measuring rod 120 and the blocking part 140 maintain a preset distance.
[0119] Furthermore, during the process of the contour measuring device 1 measuring the contour of the object 3 to be measured, the control unit 16 can continuously obtain the target stroke of the blocking part 140 based on the preset value and the swing position of the measuring rod 120, and the driving part 142 can drive the blocking part 140 to move the target stroke so that the blocking part 140 and the measuring rod 120 maintain a preset distance D.
[0120] In some examples, the movement path of the blocking part 140 can be adapted to the swing path of the probe 120. In addition, the probe 120 can be configured to swing toward the blocking part 140 and abut against the blocking part 140 under the action of a first force when the probe 122 is separated from the object to be measured 3.
[0121] In this disclosure, it is understood that during the process of measuring the contour of the object 3 to be measured by the contour measuring device 1, the blocking part 140 needs to maintain a preset distance D with the measuring rod 120. Specifically, when the probe 122 is not removed from the object 3 to be measured, the measuring rod 120 will swing back and forth around the rotation center 123 due to the position change of the probe 122 in the first direction (e.g., the Z-axis direction). At this time, it is necessary to continuously adjust the position of the blocking part 140 so that the blocking part 140 and the measuring rod 120 maintain the preset distance D. Furthermore, when the probe 122 detaches from the object 3 to be measured, the probe 120 swings around the rotation center 123 toward the blocking part 140 under the action of the first force. In order to maintain a preset distance D with the probe 120, the blocking part 140 is driven to move away from the probe 120 at a preset speed. However, since the preset speed of the blocking part 140 is a controllable speed, the probe 120 can be made to abut against the blocking part 140 by setting the preset speed. And since the swing path of the probe 120 is adapted to the movement path of the blocking part 140, the probe 120 will continue to abut against the blocking part 140 and move synchronously with the blocking part 140 under the action of the first force.
[0122] Based on this, see Figure 9The contour measurement method disclosed herein may further include: in response to the probe 122 disengaging from the object to be measured 3, the probe rod 120 abuts against the blocking part 140 under the action of a first force and moves synchronously with the blocking part 140 (step S210); the probe 122 re-contacts the object to be measured 3 and stops moving (step S220); and the blocking part 140 and the probe rod 120 separate until the blocking part 140 and the probe rod 120 have a preset distance D (step S230).
[0123] See in some examples Figure 9 In step S210, in response to the probe 122 detaching from the object 3, the probe rod 120 can swing around the rotation center 123 toward the blocking part 140 until it abuts against the blocking part 140. Furthermore, the probe rod 120 can continue to abut against the blocking part 140 and move synchronously with the blocking part 140 under the action of the first force. In this case, by blocking the swing of the probe rod 120 by the blocking part 140, the swing speed of the probe rod 120 can be slowed down, thereby slowing down the falling speed of the probe 122. This buffers the impact of the probe 122 on the object 3 during its fall, thereby reducing damage to the probe 122. In addition, since the probe rod 120 and the blocking part 140 move synchronously, the probe 122 can re-contact the object 3, thus preventing the measurement from stopping due to the probe 122 detaching.
[0124] See in some examples Figure 9 In step S220, after the probe 122 re-contacts the object 3, the probe 122 can stop moving under the support of the object 3. Furthermore, the first measuring element can detect whether the probe 122 is in contact with the object 3. For the process of detecting whether the probe 122 is in contact with the object 3, please refer to the above description of the first measuring element.
[0125] See in some examples Figure 9In step S230, when the probe 122 re-contacts the object 3 to be measured, the probe 120 can stop swinging. Since the control unit 16 can continuously obtain the target stroke of the blocking part 140 based on preset values and the swing position of the probe 120 during the contour measurement process of the contour measuring device 1 measuring the contour of the object 3, and the drive unit 142 can drive the blocking part 140 to move the target stroke so that the blocking part 140 and the probe 120 maintain a preset distance D, the blocking part 140 can continue to move away from the probe 120 under the drive of the drive unit 142 until the blocking part 140 and the probe 120 have a preset distance D. Therefore, the blocking part 140 can continue to move away from the probe 120 at a preset speed under the drive of the drive unit 142 until the blocking part 140 and the probe 120 have a preset distance D. Thus, the blocking part 140 can prepare for the probe 122 to fall again.
[0126] See in some examples Figure 10 The contour measurement method disclosed herein may further include: in response to the probe 122 disengaging from the object to be measured 3, stopping the movement of the measuring mechanism 10 relative to the object to be measured 3 (step S310); and, after the probe 122 re-contacts the object to be measured 3 and the blocking part 140 and the probe 120 have a preset distance D, continuing to drive the measuring mechanism 10 to move relative to the object to be measured 3 (step S320).
[0127] See in some examples Figure 10 In step S310, in response to the probe 122 detaching from the object 3, the control unit 16 can control the drive mechanism 20 to stop driving the measuring mechanism 10 to move relative to the object 3. Specifically, when the probe 122 falls, stopping the driving of the measuring mechanism 10 to move relative to the object 3 in the second direction will stop the probe 122 from moving in the second direction. In this case, during the measurement process, when the probe 122 detaches from the object 3, the probe 122 is in a suspended state. At this time, the data obtained based on the position of the probe 120 is not the contour data of the object 3. By stopping the measuring mechanism 10, on the one hand, the control unit 16 can stop obtaining the contour data of the object 3 based on the position change of the probe 120, and on the other hand, it can prevent the probe 122 from missing the measurement point on the object 3 due to movement. Thus, the accuracy of the measurement results can be improved.
[0128] See in some examples Figure 10In step S320, the probe 122 re-contacts the object 3 and the blocking part 140 and the probe 120 have a preset distance D. The driving mechanism 20 can continue to drive the measuring mechanism 10 to move relative to the object 3 so that the probe 122 continues to move in the second direction on the object 3. In this case, the contour measuring device 1 can continue to measure the contour of the object 3; in addition, the blocking part 140 can prepare for the probe 122 to fall again.
[0129] While the present disclosure has been specifically described above in conjunction with the accompanying drawings and examples, it is to be understood that the foregoing description does not limit the present disclosure in any way. Those skilled in the art can make modifications and variations to the present disclosure as needed without departing from its essential spirit and scope, and all such modifications and variations shall fall within the scope of the present disclosure.
Claims
1. A contour measuring device, characterized in that, It includes a measuring mechanism, a driving mechanism, and a control unit. The driving mechanism is configured to drive the measuring mechanism to move relative to the object to be measured. The measuring mechanism includes a scanning unit and a buffer unit. The scanning unit includes a probe that can swing around a rotation center, and a probe fixedly connected to one end of the probe and configured to contact the object to be measured under the action of a first force. The probe is configured to swing back and forth around the rotation center as the position of the probe changes in a first direction. The buffer unit includes a blocking part and a driving part. The driving part is configured to drive the blocking part to move at a preset speed during the measurement process of the contour measuring device, so that the blocking part and the measuring rod maintain a preset distance. The driving part includes a motor and a rotating wheel. The motor is fixedly connected to the blocking part through the rotating wheel. The motor drives the rotating wheel to rotate so that the blocking part abuts against or moves away from the measuring rod. The control unit is configured to obtain the target stroke of the blocking part based on a preset value and the swing position of the measuring rod, and the driving unit drives the blocking part to move the target stroke so that the blocking part and the measuring rod maintain the preset distance. The probe is configured to swing toward the blocking part and abut against the blocking part under the action of the first force when the probe is removed from the object to be measured.
2. The contour measuring device according to claim 1, characterized in that, The control unit is configured to control the drive mechanism to stop driving the measuring mechanism to move relative to the object when the probe leaves the object to be measured, and to control the drive mechanism to continue driving the measuring mechanism to move relative to the object when the probe re-contacts the object to be measured and the blocking part and the probe rod have the preset distance.
3. The contour measuring device according to claim 1, characterized in that, The blocking part is configured to abut against the measuring rod under the drive of the driving part so that the measuring rod remains in a balanced state.
4. The contour measuring device according to claim 1, characterized in that, The scanning unit includes a first measuring element configured to detect whether the probe is in contact with the object to be measured, and the buffer unit includes a second measuring element configured to detect the swing position of the probe.
5. The contour measuring device according to claim 1, characterized in that, The buffer unit also includes two sensing elements. The measuring rod is provided with a blocking part that cooperates with the sensing elements to generate an alarm signal. The two sensing elements are respectively located at both ends of the moving path of the blocking part.
6. The contour measuring device according to claim 1, characterized in that, The probe includes a first rod and a second rod located on both sides of the rotation center, wherein one end of the first rod is fixedly connected to the probe, and the blocking part is located below the first rod or above the second rod.
7. A contour measurement method, comprising using the contour measurement device as described in any one of claims 1 to 6 to measure the contour of an object to be measured, characterized in that, include: The measuring mechanism is moved relative to the object to be measured so that the scanning unit of the measuring mechanism is close to the object to be measured. The probe of the scanning unit contacts the object to be measured. The measuring mechanism is driven to move relative to the object to be measured so that the probe moves in a second direction on the object to be measured. In response to the position change of the probe in the first direction, the probe oscillates back and forth around the rotation center to obtain the oscillation position of the probe. The target stroke of the blocking part is obtained based on the preset value and the swing position, and The blocking part is driven to move at a preset speed to the target stroke so that the measuring rod and the blocking part maintain the preset distance. The probe is configured to swing toward the blocking part and abut against the blocking part under the action of a first force when the probe leaves the object to be measured.
8. The contour measurement method according to claim 7, characterized in that, In response to the probe detaching from the object being measured, the probe oscillates around the center of rotation toward the blocking part until it abuts against the blocking part. Under the action of the first force, the probe continues to abut against the blocking part and moves synchronously with the blocking part. Once the probe re-contacts the object to be measured and stops moving, the blocking part and the probe rod separate until the blocking part and the probe rod have the preset distance.
9. The contour measurement method according to claim 8, characterized in that, In response to the probe detaching from the object to be measured, the movement of the measuring mechanism relative to the object to be measured is stopped. Once the probe re-contacts the object to be measured and the blocking part and the measuring rod have the preset distance, the movement of the measuring mechanism relative to the object to be measured is resumed.