Display module aging test line

Abstract

This invention discloses an aging test line for display modules, comprising a test carrier, a loading conveyor line, a lighting test line, an aging chamber, an unloading conveyor line, a return conveyor line, a changeover platform, a loading / unloading device, and a transfer device. The test carrier carries the display modules. The loading conveyor line, lighting test line, aging chamber, unloading conveyor line, and return conveyor line are sequentially connected and transport the test carrier, with the output side of the return conveyor line connected to the input side of the loading conveyor line. The changeover platform is located at the rear end of the unloading conveyor line and is used to replace the test carrier. The loading / unloading device is used to place the display modules onto the test carrier at the loading conveyor line and to remove the display modules from the test carrier at the unloading conveyor line. The transfer device is used to transfer the test carrier between the unloading conveyor line and the changeover platform. This invention allows for continuous testing carrier replacement during operation, adapting to display modules of different specifications and models, and facilitating convenient test carrier replacement.

Description

Technical Field

[0001] This invention relates to the field of aging testing technology, and in particular to an aging test line for display modules. Background Technology

[0002] When conducting aging tests on automotive display modules, the display module is typically placed on a carrier and fed into the aging test line along with the carrier. Test signals are then input under high temperature conditions, powering on the display module and allowing for the measurement of its display performance. This enables the timely detection of defects before shipment, improving product quality stability. The carrier used is generally matched to the display module; however, when testing different specifications and models of display modules, the carrier usually needs to be changed accordingly. Existing aging test lines cannot change carriers without shutting down the system, making carrier replacement inconvenient.

[0003] In addition to aging tests, existing production processes typically include lamp-light testing directly on the aging test line to detect defects such as dark spots, bright spots, dark lines, and bright lines in the display module. However, the lamp-light testing process involves a long wait from wiring and power-on to lighting up the display module for testing, affecting the overall testing speed. Summary of the Invention

[0004] The purpose of this invention is to provide a display module aging test line that allows for the replacement of test carriers without line shutdown.

[0005] To achieve the above objectives, the technical solution adopted by the present invention is as follows: A display module aging test line includes a test carrier, a loading conveyor line, a lamp-lighting test line, an aging chamber, a unloading conveyor line, a return conveyor line, a changeover platform, a loading / unloading device, and a transfer device. The test carrier carries the display module. The loading conveyor line, the lamp-lighting test line, the aging chamber, the unloading conveyor line, and the return conveyor line are sequentially connected and transport the test carrier. The output side of the return conveyor line is connected to the input side of the loading conveyor line. The changeover platform is located at the rear end of the unloading conveyor line and is used to replace the test carrier. The loading / unloading device is used to place the display module onto the test carrier at the loading conveyor line and to remove the display module from the test carrier at the unloading conveyor line. The transfer device is used to transfer the test carrier between the unloading conveyor line and the changeover platform.

[0006] Furthermore, the lighting test line is equipped with a pre-lighting platform and a testing platform; the pre-lighting platform is used to support the test carrier and the display module after wiring, and at least two pre-lighting platforms are provided, which are respectively connected to the output side of the feeding conveyor line and the testing platform; the testing platform is used to support the test carrier and the lit display module, and the testing platform is connected to the aging chamber.

[0007] Furthermore, it also includes an NG product conveyor line, the input side of which is connected to the testing platform.

[0008] Furthermore, the aging chamber has a high-temperature zone and a cooling zone, and is equipped with an aging conveyor line, a cooling conveyor line, a placement rack, and a transfer trolley. Both the aging conveyor line and the cooling conveyor line are used to transport the test vehicle. The input side of the aging conveyor line is connected to the lighting test line, and the output side is connected to the unloading conveyor line through the cooling conveyor line. The cooling conveyor line is located within the cooling zone. The placement rack is located within the high-temperature zone, and the transfer trolley is used to transfer the test vehicle between the aging conveyor line and the placement rack.

[0009] Furthermore, the aging conveyor line is provided with a plurality of loading positions and a plurality of unloading positions; the loading positions and the unloading positions are arranged one by one along the conveying direction of the aging conveyor line, and any two adjacent loading positions are separated from each other by the unloading positions, and any two adjacent unloading positions are separated from each other by the loading positions; the transfer trolley is used to transfer the test carrier from the loading position to the placement rack, and to transfer the test carrier from the placement rack to the unloading position.

[0010] Furthermore, the return conveyor line is located in the aging chamber, and the conveying direction is opposite to that of the aging conveyor line.

[0011] Furthermore, the conveying trajectory of the cooling conveyor line is U-shaped, and the aging chamber and the unloading conveyor line are respectively connected by a lifting mechanism.

[0012] Furthermore, the test carrier includes a base plate, a tray, several pins, and several support columns; the base plate is horizontally positioned; the support columns are fixedly positioned on the top of the base plate; the tray is used to support the display module, and the bottom and / or sides of the tray are detachably connected to each of the support columns via the pins, so as to be tilted above the base plate.

[0013] Furthermore, the tray includes several supporting crossbars and an outer frame rod connected end to end to form a rectangle. The outer frame rod is detachably connected to the supporting column by the pin. The supporting crossbar is detachably connected to the outer frame rod by the pin, or it can be slidably connected to the outer frame rod along a direction perpendicular to its own length.

[0014] Furthermore, a plurality of limiting claws for abutting against the side wall of the display module are slidably connected on the support crossbar. The limiting claws are arranged one by one along the length direction of the support crossbar, and the sliding direction is consistent with the length direction of the support crossbar.

[0015] The present invention has the following beneficial effects: 1. During operation, the aging test line can carry display modules on the loading conveyor line using test carriers. The display modules are then sequentially transported through the lighting test line and the aging chamber for lighting and aging tests. After testing, the display modules can be unloaded at the unloading conveyor line. The empty test carriers can then be returned to the loading conveyor line via a return conveyor line to carry the next batch of display modules for testing. If the specifications or model of the display modules to be tested change during operation, the empty test carriers at the rear end of the unloading conveyor line can be transferred to the changeover platform for replacement using a transfer device. The replaced test carriers are then sent back to the rear end of the unloading conveyor line to adapt to the changed display modules. This test carrier changeover process does not require line interruption, is convenient, and has minimal impact on the overall testing speed.

[0016] 2. The lighting test line is equipped with a testing platform for manual inspection of lighting defects of display modules and at least two pre-lighting platforms. The pre-lighting platforms can be used to pre-store the display modules after wiring and wait for the display modules to be powered on and lit. After the display modules are lit, they are sent to the testing platform for inspection, which can effectively shorten the waiting time for the inspection personnel to light up the display modules and improve the inspection efficiency. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the three-dimensional structure of the present invention (I).

[0018] Figure 2 This is a three-dimensional structural schematic diagram (II) of the present invention.

[0019] Figure 3 This is a front view structural diagram of the present invention.

[0020] Figure 4 This is a schematic diagram of the test vehicle transportation process of the present invention.

[0021] Figure 5 This is a schematic diagram (I) of the connection structure of the material feeding conveyor line, the lighting test line and the NG product conveyor line of the present invention.

[0022] Figure 6 This is a schematic diagram (II) of the connection structure of the material feeding conveyor line, the lighting test line and the NG product conveyor line of the present invention.

[0023] Figure 7 This is a schematic diagram (III) of the connection structure of the material feeding conveyor line, the lighting test line and the NG product conveyor line of the present invention.

[0024] Figure 8 This is a schematic diagram of the aging chamber structure of the present invention.

[0025] Figure 9 This is a schematic diagram of the connection structure between the cooling zone, the material feeding conveyor line, and the changing station of the present invention.

[0026] Figure 10 This is a schematic diagram of the test vehicle structure of the present invention (I).

[0027] Figure 11 This is a schematic diagram of the exploded structure of the test vehicle for this invention.

[0028] Figure 12 This is a schematic diagram (II) of the test vehicle structure of the present invention.

[0029] Figure 13 for Figure 12 A magnified schematic diagram of part A of the structure.

[0030] Figure 14 for Figure 12 A magnified schematic diagram of part B of the structure.

[0031] Figure 15 This is a diagram showing the usage status of the test vehicle for this invention.

[0032] Figure 16 This is a schematic diagram (III) of the test vehicle structure of the present invention.

[0033] Explanation of main component symbols: 1. Feeding conveyor line; 2. Illumination test line; 21. Pre-lighting platform; 22. Testing platform; 3. Aging chamber; 31. High temperature zone; 32. Aging conveyor line; 321. Feeding position; 322. Unloading position; 33. Placement rack; 34. Cooling zone; 35. Cooling conveyor line; 36. Lifting mechanism; 4. Return conveyor line; 5. Unloading conveyor line; 6. Changeover platform; 7. NG product conveyor line; 8. Test carrier; 81. Base plate; 82. Pallet; 821. Support crossbar; 822. Outer frame bar; 83. Pin; 831. Pin seat; 832. Pin rod; 84. Support column; 85. Limiting claw; 86. Insertion hole; 9. Display module. Detailed Implementation

[0034] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0035] like Figure 1-4 As shown, this invention discloses an aging test line for display modules, including a test carrier 8, a loading conveyor line 1, a lighting test line 2, an aging chamber 3, a unloading conveyor line 5, a return conveyor line 4, a changeover platform 6, a loading / unloading device (not shown), and a transfer device (not shown). The test carrier 8 carries display modules 9. The loading / unloading device places the display modules 9 onto the test carrier 8 at the loading conveyor line 1 and removes the display modules 9 from the test carrier 8 at the unloading conveyor line 5 for unloading. The loading conveyor line 1, the lighting test line 2, the aging chamber 3, the unloading conveyor line 5, and the return conveyor line 4 are sequentially connected and transport the test carrier 8. The output side of the return conveyor line 4 is connected to the input side of the loading conveyor line 1. That is, after unloading, the empty test carrier 8 can return to the loading conveyor line 1 via the return conveyor line 4 to carry the next batch of display modules 9 for the next round of testing.

[0036] The changeover platform 6 is located at the rear end of the unloading conveyor line 5 and is used to replace the test carrier 8. The transfer device is used to transfer the test carrier 8 between the unloading conveyor line 5 and the changeover platform 6. When the specifications and model of the display module 9 to be tested change, after the previous batch of display modules 9 is unloaded, the empty test carrier 8 at the unloading conveyor line 5 can be transferred to the changeover platform 6 by the transfer device. The testing personnel can then manually replace it with a test carrier 8 that is compatible with the specifications and model of the next batch of display modules 9. After the replacement, the test carrier 8 is sent back to the unloading conveyor line 5 by the transfer device, and then returned to the loading conveyor line 1 via the return conveyor line 4 to carry the next batch of display modules 9 for testing. The entire changeover process does not require line interruption, the test carrier 8 is easy to replace, and the impact on the overall testing speed is minimal.

[0037] like Figure 5-7 As shown, the above-mentioned lighting test line 2 is equipped with a pre-lighting platform 21 and a testing platform 22. The pre-lighting platform 21 is used to support the test carrier 8 and the display module 9 after wiring. At least two pre-lighting platforms 21 are provided, and they are respectively connected to the output side of the feeding conveyor line 1 and the testing platform 22. The testing platform 22 is used to support the test carrier 8 and the lit display module 9, and the testing platform 22 is connected to the aging chamber 3. An NG product conveyor line 7 is also provided on the side of the lighting test line 2, and the input side of the NG product conveyor line 7 is connected to the testing platform 22.

[0038] During testing, the test carrier 8 carrying the display module 9 can be transported by the feeding conveyor line 1 to the empty pre-lighting platform 21 for waiting. During the transport process, the display module 9 is wired. The display module 9 sent to the pre-lighting platform 21 lights up after the power-on time is reached. Then it can be sent to the testing platform 22 for testing by the testing personnel to eliminate display modules 9 with lighting defects such as dark spots, bright spots, dark lines, and bright lines. After that, the good products that meet the requirements enter the aging chamber 3 for aging test, while the defective products with lighting defects are sent out through the NG product conveyor line 7.

[0039] like Figure 8 , 9 As shown, the aging chamber 3 contains a high-temperature zone 31 and a cooling zone 34, and also includes an aging conveyor line 32, a cooling conveyor line 35, a placement rack 33, and a transfer trolley (not shown). Both the aging conveyor line 32 and the cooling conveyor line 35 are used to transport the test carrier 8. The aging conveyor line 32 is located below the high-temperature zone 31, and the cooling conveyor line 35 is located within the cooling zone 34. The input side of the aging conveyor line 32 connects to the lighting test line 2, and the output side connects to the input side of the unloading conveyor line 5, which is connected via the cooling conveyor line 35. The placement rack 33 is located within the high-temperature zone 31, and the transfer trolley is used to transfer the test carrier 8 between the aging conveyor line 32 and the placement rack 33.

[0040] After the lighting test, the test carrier 8 and the display module 9 can be sent into the aging chamber 3 via the aging conveyor line 32, and then transferred by a transfer trolley to the placement rack 33 in the high-temperature zone 31 for aging testing. After the test, the transfer trolley returns them to the aging conveyor line 32. The display module 9 returned to the aging conveyor line 32 can be sent into the cooling zone 34 via the cooling conveyor line 35 for cooling.

[0041] To facilitate the transfer of the test carrier 8 and the display module 9 by the transfer trolley, the aging conveyor line 32 is divided into several loading positions 321 and several unloading positions 322. The loading positions 321 and unloading positions 322 are arranged sequentially along the conveying direction of the aging conveyor line 32. Any two adjacent loading positions 321 are separated by a unloading position 322, and any two adjacent unloading positions 322 are also separated by a loading position 321. In this configuration, the transfer trolley needs to move the test carrier 8 from the loading position 321 to the placement rack 33, and after testing, move the test carrier 8 from the placement rack 33 to the unloading position 322. Because the loading positions 321 and unloading positions 322 are spaced apart, the transfer trolley can easily pick up and place the test carrier 8 and the display module 9.

[0042] The cooling conveyor line 35 is located above the inner side of the cooling zone 34. The input side of the cooling conveyor line 35 is connected to the output side of the aging conveyor line 32 inside the aging chamber 3 via a lifting mechanism 36, and the output side is connected to the unloading conveyor line 5 via the lifting mechanism 36. The lifting mechanism 36 is located below the inner side of the cooling zone 34, and the conveying trajectory of the cooling conveyor line 35 is U-shaped. During conveying, this ensures that the display module 9 remains in the cooling zone 34 for a sufficient time for thorough cooling. After cooling, the display module 9 is unloaded at the unloading conveyor line 5. The empty test carrier 8 after unloading returns to the loading conveyor line 1 via the return conveyor line 4. The return conveyor line 4 is located inside the aging chamber 3 and does not occupy additional space. Both the return conveyor line 4 and the aging conveyor line 32 are located below the placement rack 33, and their conveying directions are opposite.

[0043] like Figure 10-15 As shown, the test carrier 8 includes a base plate 81, a tray 82, several pins 83, and several support columns 84. The base plate 81 is horizontally positioned. The support columns 84 are fixedly mounted on the top of the base plate 81. The tray 82 is used to support the display module 9. The bottom and / or sides of the tray 82 are detachably connected to each support column 84 via pins 83, allowing it to be tilted above the base plate 81. The structure of the tray 82 is compatible with the size and model of the test carrier 8. When changing the test carrier 8, the corresponding tray 82 can be quickly disassembled and replaced via pins 83, completing the changeover of the test carrier 8. The changeover is simple and quick.

[0044] The tray 82 mainly includes several supporting crossbars 821 and an outer frame bar 822 connected end to end to form a rectangle. The outer frame bar 822 is detachably connected to the supporting column 84 via pins 83, and the supporting crossbars 821 are detachably connected to the outer frame bar 822 via pins 83, or as... Figure 16 As shown, the outer frame rod 822 slides along a direction perpendicular to its own length. In some cases, different specifications and models of display modules 9 can be adapted by adjusting the support crossbar 821 without replacing the entire tray 82, making the test carrier 8 quite versatile.

[0045] Similarly, several limiting claws 85 are slidably connected to the support crossbar 821 to abut against the side wall of the display module 9. The limiting claws 85 are arranged one by one along the length of the support crossbar 821, and the sliding direction is consistent with the length direction of the support crossbar 821. The limiting claws 85 can separate the display modules 9 placed on the tray 82 and abut against the display modules 9 to prevent them from shifting. Since the limiting claws 85 are adjustable, they can be adapted to display modules 9 of various specifications, which can improve the versatility of the test carrier 8.

[0046] In summary, this aging test line can be used for aging tests and illumination tests of display modules 9. During testing, the test carrier 8 supporting the display modules 9 can be changed without interrupting the line to adapt to different specifications and models of display modules 9. Changing the test carrier 8 does not affect the overall testing speed. Furthermore, the test carrier 8 uses a quick-release design, making it convenient, flexible, and highly versatile. In addition, the display modules 9 are pre-lit during testing, eliminating the need for personnel at the testing platform 22 to wait for the display modules 9 to light up for extended periods, resulting in high testing efficiency.

[0047] Although the invention has been specifically shown and described in conjunction with preferred embodiments, those skilled in the art should understand that various changes in form and detail to the invention without departing from the spirit and scope of the invention as defined in the appended claims are within the scope of protection of the invention.

Claims

1. An aging test line for a display module, characterized in that: It includes test vehicles, feeding conveyor lines, lighting test lines, aging chambers, unloading conveyor lines, return conveyor lines, changeover platforms, loading and unloading devices, and transfer devices; The test carrier is used to support the display module. The test carrier includes a base plate, a tray, several pins, and several support columns. The base plate is horizontally positioned. The support columns are fixedly mounted on the top of the base plate. The tray supports the display module. The bottom and / or sides of the tray are detachably connected to each support column via the pins, allowing it to be tilted above the base plate. The tray includes several support crossbars and an outer frame rod connected end-to-end to form a rectangle. The outer frame rod is detachably connected to the support columns via the pins. The support crossbars are detachably connected to the outer frame rod via the pins, or slidably connected to the outer frame rod along a direction perpendicular to their own length. The structure of the tray is adapted to the size and model of the display module. When changing the test carrier, the corresponding tray can be quickly disassembled and replaced via the pins, completing the test carrier type change. The feeding conveyor line, the lighting test line, the aging chamber, the unloading conveyor line, and the return conveyor line are sequentially connected to and transport the test carrier. The output side of the return conveyor line is connected to the input side of the feeding conveyor line. The replacement platform is located at the rear end of the unloading conveyor line. It is used by the testing personnel to manually replace the test carrier with one that is compatible with the specifications and model of the next batch of display modules. After the replacement is completed, the test carrier is sent back to the unloading conveyor line by the transfer device. The loading and unloading device is used to place the display module onto the test carrier at the loading conveyor line, and to remove the display module from the test carrier at the unloading conveyor line; the transfer device is used to transfer the test carrier between the unloading conveyor line and the changeover platform.

2. The display module aging test line as described in claim 1, characterized in that: The lighting test line is equipped with a pre-lighting platform and a testing platform; The pre-lighting platform is used to support the test vehicle and the display module after wiring. At least two pre-lighting platforms are provided, and they are respectively connected to the output side of the feeding conveyor line and the detection platform. The testing platform is used to carry the test vehicle and the lit display module, and the testing platform is connected to the aging chamber.

3. The display module aging test line as described in claim 2, characterized in that: It also includes an NG product conveyor line, the input side of which is connected to the testing platform.

4. The display module aging test line as described in claim 1, characterized in that: The aging chamber has a high-temperature zone and a cooling zone, and is equipped with an aging conveyor line, a cooling conveyor line, a placement rack, and a transfer trolley. Both the aging conveyor line and the cooling conveyor line are used to transport the test vehicle. The input side of the aging conveyor line is connected to the lighting test line, and the output side is connected to the unloading conveyor line through the cooling conveyor line. The cooling conveyor line is located in the cooling zone. The placement rack is located within the high-temperature zone, and the transfer trolley is used to transfer the test carrier between the aging conveyor line and the placement rack.

5. The display module aging test line as described in claim 4, characterized in that: The aging conveyor line is equipped with several loading positions and several unloading positions; The loading and unloading points are arranged one by one along the conveying direction of the aging conveyor line. Any two adjacent loading points are separated from each other by the unloading points, and any two adjacent unloading points are separated from each other by the loading points. The transfer trolley is used to transfer the test carrier from the loading position to the placement rack, and to transfer the test carrier from the placement rack to the unloading position.

6. The display module aging test line as described in claim 4, characterized in that: The return conveyor line is located in the aging chamber, and the conveying direction is opposite to that of the aging conveyor line.

7. The display module aging test line as described in claim 4, characterized in that: The cooling conveyor line has a U-shaped conveying trajectory and is connected to the aging conveyor line and the unloading conveyor line by a lifting mechanism.

8. The display module aging test line as described in claim 1, characterized in that: The support crossbar is slidably connected to a plurality of limiting claws for abutting against the side wall of the display module. The limiting claws are arranged one by one along the length direction of the support crossbar, and the sliding direction is consistent with the length direction of the support crossbar.

Images