Adjustable update rate for measurement probe

Abstract

A measurement system includes a measuring probe having a contact portion that contacts a workpiece to be measured. The measuring probe operates at a first update rate during at least a portion of a movement mode, wherein the movement mode includes movement of the measuring probe causing the contact portion to move away from the workpiece and / or to move at a distance from the workpiece equal to or greater than a threshold distance. The measuring probe operates at a second update rate (i.e., faster than the first update rate) during at least a portion of a measurement mode, wherein the measurement mode includes movement of the measuring probe causing the contact portion to move towards the workpiece to obtain a measurement result. In various embodiments, the combined use of the first and second update rates effectively reduces the energized drift of the measuring probe.

Description

Background Technology Technical Field

[0002] This disclosure relates to a measuring probe for a coordinate measuring machine, and more specifically to the update rate for the measuring probe.

[0003] Related technical descriptions

[0004] A measuring probe for a coordinate measuring machine (CMM) is described in U.S. Patent No. 10,415,949, which is incorporated herein by reference in its entirety. Such a measuring probe includes: a stylus having a contact portion to contact a workpiece to be measured; a probe housing capable of supporting the stylus at an axial center; a detection element capable of detecting movement of the contact portion corresponding to contact with the workpiece; and signal processing circuitry for processing the output of the detection element. The signal processing circuitry processes the sensor signal from the detection element to output a measurement signal (e.g., a touch signal). Another CMM measuring probe having similar components (e.g., and capable of outputting a digital measurement signal) is described in U.S. Patent No. 10,852,119, which is incorporated herein by reference in its entirety.

[0005] During operation, such CMM measurement probes may experience "power-on" drift (also known as turn-on drift or warm-up drift), during which the probe's measurement output will monotonically change over time due to power dissipation (heat) until the probe temperature stabilizes and the probe reaches thermal equilibrium with the surrounding environment. Power-on drift can cause position measurement errors during the warm-up period due to probe material expansion; therefore, it may be necessary to wait for the measurement probe to thermally stabilize in order to achieve highly accurate measurements.

[0006] To address this issue, it is known to allow the CMM to supply power to the measurement probe attached to the CMM during the preheating cycle, enabling the measurement probe to reach a stable temperature before starting workpiece surface measurement. This can be time-consuming and undesirable for various types of measurement operations (e.g., when attempting to perform a measurement operation within a specific time period, when performing a measurement operation requiring the use of multiple CMM measurement probes, etc.). Therefore, there are several means to accelerate or avoid the preheating cycle. For example, the CMM probe or the CMM probe head supporting the CMM probe may include a thermal regulator configured to rapidly raise the temperature of the CMM probe to the desired stable state. U.S. Patent No. 8,474,148 discloses a heater configured to provide heat within the CMM probe head.

[0007] Systems and configurations that can improve or otherwise enhance such CMM measurement probes (e.g., regarding improved operating characteristics, etc.) would be desirable. Summary of the Invention

[0008] The summary is provided to introduce, in a simplified form, the selection of concepts further described in the detailed embodiments below. This summary is not intended to identify key features of the claimed subject matter, nor is it intended to help determine the scope of the claimed subject matter.

[0009] A measurement system is provided, comprising at least a measuring probe with a stylus, at least one detection element, and a signal processing unit. The stylus has a contact portion to contact a workpiece to be measured. The at least one detection element is capable of detecting movement of the contact portion corresponding to contact with the workpiece. The signal processing unit is configured to process a generated signal obtained from the output of the at least one detection element to output a measurement signal.

[0010] The measuring probe is configured to operate at a first update rate during at least a portion of a movement mode, wherein the movement mode includes at least one of the following: movement of the measuring probe causing a contact portion to move away from the workpiece, or movement of the measuring probe causing the contact portion to move at a distance from the workpiece equal to or greater than a threshold distance. The measuring probe is further configured to operate at a second update rate during at least a portion of a measurement mode, wherein the measurement mode includes movement of the measuring probe causing the contact portion to move towards the workpiece to obtain a measurement result, and the second update rate is faster than the first update rate.

[0011] In various embodiments, the first update rate and the second update rate correspond to the rate at which the signal processing section processes / outputs the measurement signal. In various embodiments, the movement mode and the measurement mode correspond to the modes of a coordinate measuring machine (e.g., the coordinate measuring machine operates to move a measuring probe, including a contact portion, relative to a workpiece). In various embodiments, the measurement system also includes a controller section that provides (e.g., sends) signals (commands) instructing the measuring probe to switch between update rates.

[0012] Based on the principles disclosed herein, in various embodiments, the magnitude of the power-on drift of the measurement probe can be reduced (e.g., compared to previously known configurations) by actively switching the update rate of the measurement probe between a relatively slow first update rate and a relatively fast second update rate. Utilizing a slower update rate over a specific time period can effectively reduce the total electrical power consumed in the measurement probe (e.g., while still enabling collision detection during moving modes), thereby effectively reducing the duty cycle of the electronics and correspondingly reducing the magnitude of the power-on drift of the measurement probe. Attached Figure Description

[0013] Figure 1This is a schematic diagram illustrating an example of a measurement system using a measurement probe according to a first embodiment of the present invention;

[0014] Figure 2 It is shown Figure 1 A schematic diagram of the cross-section of the measuring probe;

[0015] Figure 3 It is shown Figure 1 A block diagram of certain parts of the measurement system;

[0016] Figure 4A and Figure 4B This is a graph showing the movement of the measuring probe relative to a threshold distance from the workpiece;

[0017] Figure 5 This is a diagram showing the movement of a measuring probe used to measure surface points on a workpiece;

[0018] Figure 6 This is a timing diagram showing the movement cycle of a measuring probe used to measure surface points on a workpiece;

[0019] Figure 7 It is a timing diagram illustrating certain operations of the measurement system relative to the movement mode and the measurement mode; and

[0020] Figure 8 This is a flowchart illustrating an exemplary embodiment of a method for operating a measurement system including a measurement probe. Detailed Implementation

[0021] Figure 1 This is a schematic diagram illustrating an example of a measurement system 100 using a measurement probe 300. (See attached diagram.) Figure 1 As shown, the measurement system 100 includes: a measuring probe 300; a coordinate measuring machine 200 configured to move the measuring probe 300; an operation unit 110 having a manually operated joystick 111; and a system controller unit 140 configured to control certain operations of the coordinate measuring machine 200 and the measuring probe 300. The measurement system 100 also includes: a host computer 150 configured to operate the coordinate measuring machine 200 via the system controller unit 140 and process measurement data acquired by the coordinate measuring machine 200 to obtain, for example, the size or shape of the workpiece W to be measured; one or more input units 120 (e.g., keyboard, mouse, etc.) configured to input, for example, measurement conditions; and one or more output units 130 (e.g., display, printer, etc.) configured to output, for example, measurement results. As will be explained below relative to... Figure 2In more detail, the measuring probe 300 includes a stylus 336 having a contact portion 362 to contact the workpiece W to be measured.

[0022] like Figure 1 As shown, the coordinate measuring machine 200 includes: a surface plate 210; a drive mechanism 220 disposed on the surface plate 210 and configured to move the measuring probe 300 in three dimensions; and a drive sensor (not shown) configured to detect the drive amount of the drive mechanism 220. The drive mechanism 220 includes an X-axis movement mechanism 222, a Y-axis movement mechanism 221, and a Z-axis movement mechanism 223 (e.g., a sliding mechanism) for moving the measuring probe 300 in three dimensions.

[0023] Figure 2 It is shown Figure 1 A schematic diagram of the cross-section of the measuring probe 300. (See diagram below.) Figure 2 As shown, the measuring probe 300 includes: a stylus 336 having a contact portion 362 to contact the workpiece W to be measured; a probe housing 306 configured to support the stylus 336 at an axial center O; one or more (four in this embodiment) detection elements 325 configured to detect movement of the contact portion 362 away from and along the axial center O; and a signal processing circuit 320 configured to process the outputs of the four detection elements 325 to output a measurement signal Str (e.g., a touch signal), which may be a digital signal. Specifically, the measuring probe 300 is also referred to as a touch signal probe. Note that the stylus 336 is included in a stylus module 304, and the probe housing 306 and the detection elements 325 are included in a probe body 302. The probe body 302 is supported by a spindle 224 of a drive mechanism 220. The stylus module 304 is detachably coupled to the probe body 302 via a motion joint with high position reproducibility.

[0024] For the purposes described below, Figure 2 The longitudinal direction on the paper plane is defined as the Z direction, the horizontal direction on the paper plane is defined as the X direction, and the vertical direction on the paper plane is defined as the Y direction. Therefore, the direction of the axial center O of the measuring probe 300 (axial direction O) coincides with the Z direction.

[0025] like Figure 2As shown, the probe body 302 includes a probe housing 306, a signal processing circuit 320, support members (supports) 322 and 324, a detection element 325, a connecting shaft 326, a flange member 328, a permanent magnet 330, and a ball 332. The probe housing 306 includes an attachment portion 308, a circuit placement portion 310, a fixing member 314, a bottom member 316, and a main cover 318.

[0026] like Figure 2 As shown, the attachment portion 308 is the part attached to the mandrel 224 at the upper end of the measuring probe 300. The circuit placement portion 310 is located at the lower end of the attachment portion 308. Except for the disc-shaped upper end portion 310A and the disc-shaped lower flange 312 located at the lower end of the circuit placement portion 310, the cross-section of the circuit placement portion 310 perpendicular to the axial center O has a generally triangular shape. The signal processing circuit 320 is located on the outer periphery of the generally triangular shape. The circuit placement portion 310 is located above the support members 322 and 324.

[0027] like Figure 2 As shown, the fixing member 314 is fixed to the lower peripheral portion 312B of the lower flange 312, and the support member 322 is inserted therebetween. The fixing member 314 has a cylindrical shape with an opening 314A at the axial center O. The lower inner surface of the fixing member 314 has four recesses 314C at four symmetrical positions. The bottom member 316 is fixed to the lower peripheral portion of the fixing member 314, and the support member 324 is inserted therebetween. The bottom member 316 has an annular shape. The main cover 318 has a cylindrical shape and is arranged around the circuit placement portion 310, the lower flange 312, the fixing member 314, and the bottom member 316 in a manner that covers all signal processing circuits 320. The main cover 318 is fixed to the fixing member 314 with bolts.

[0028] Figure 3 It is shown Figure 1 A block diagram of certain parts of the measurement system 100. (See diagram below.) Figure 3 As shown, the signal processing circuit 320 is a circuit configured to process the output of the detection element 325 to output a measurement signal Str (e.g., a touch signal / contact sensing signal for notifying when the contact portion 362 contacts the workpiece W to be measured). The signal processing circuit 320 includes a signal amplification section (signal amplifier circuit) 364 and a signal processing section 366 (e.g., including a signal processing device).

[0029] The signal amplification section 364 includes amplifiers 364A to 364D, which are configured to amplify the corresponding sensor signals Ss (Ss1 to Ss4) output as the detection element 325 to output amplified signals Sa (Sa1 to Sa4). Note that reference numerals Ch1 to Ch4 denote channels 1 to 4, respectively. The signal processing section 366 processes the amplified signals Sa to output a measurement signal Str. That is, in this embodiment of the invention, the signal amplification section 364, configured to amplify the corresponding outputs of the detection element 325, is positioned before the signal processing section 366, and the generated signals Sg (Sg1 to Sg4) are the amplified signals Sa from the signal amplification section 364.

[0030] The signal processing section 366 is configured to process the generated signals Sg obtained from the outputs of the four sensing elements 325 to output a measurement signal Str. The signal processing section 366 is configured to obtain / determine the amount of movement / deflection in the three X, Y, and Z directions based on the generated signals Sg (Sg1 to Sg4), synthesize the amount of movement / deflection in the three directions, and output the measurement signal Str, which can indicate when the contact portion 362 moves a given displacement or more (e.g., corresponding to contact with the workpiece). Note that a bridging circuit can be formed in the signal amplification section, or the bridging circuit can be formed in the signal processing section. Additional operations of the signal processing section 366, the system controller section 140, and the host computer 150 will be described in more detail below.

[0031] like Figure 2 As shown, support members 322 and 324 are elastically deformable members disposed in the axial direction O of the probe housing 306, allowing for a change in the orientation of the stylus 336. Specifically, as... Figure 3 As shown, the support member 324 has a rotationally symmetric shape comprising a total of four deformable arm members 324B (e.g., four deformable arms) located at positions offset from each other by 90 degrees in the circumferential direction (around the axial center O). These four arm members 324B are formed in the same plane. Except for the width of the respective arm members, the support members 322 and 324 have the same thickness and the same structure. However, this is not a limitation; the thickness, length, and shape of the arm members may differ from each other, or the entire support members 322 and 324 may have different shapes from each other. Therefore, the support member 324 in which the detection element 325 is disposed will be described below, and any repeated description of the support member 322 will be omitted. It should be noted that the shape of the support member is not limited to the shape shown in the embodiments of the invention, and only at least one support member needs to be provided.

[0032] like Figure 3As shown, the support member 324 has a generally circular plate shape and, in addition to the rectangular arm member 324B, includes a central portion 324A to be connected to the connecting shaft 326, and a peripheral portion 324C connected to the central portion 324A via the arm member 324B and connected to the probe housing 306. The peripheral portion 324C is located at the outermost position of the support member 324. The arm member 324B is disposed on the inner side of the peripheral portion 324C in a linearly extending radial direction. The central portion 324A is disposed on the inner side of the arm member 324B. The support member 324 is configured such that displacement of the connecting shaft 326 relative to the probe housing 306 causes the central portion 324A to move upward, downward, leftward, or rightward, thereby causing the arm member 324B to elastically deform accordingly (e.g., corresponding to contact between the contact portion 362 and the workpiece, etc.).

[0033] The sensing element 325 is, for example, a strain gauge that is to be fixed and to detect the strain of the support member 324. Figure 3 The support member is shown to be configured with four sensing elements 325 positioned symmetrically on the corresponding deformable arm parts 324B of the support member 324. The sensing elements 325 are fixed to the arm parts 324B, for example, with adhesive. While a general-purpose strain gauge can be used, a temperature-compensated strain gauge can also be used. Furthermore, from a temperature compensation point of view, temperature correction can be performed, for example, by integrating a virtual strain gauge for temperature compensation into a bridging circuit (not shown).

[0034] like Figure 2 and Figure 3 As shown, the connecting shaft 326 has a generally cylindrical shape and connects two support members 322 and 324 together. The connecting shaft 326 is held at the axial center O by the two support members 322 and 324 without contacting the lower flange 312, the fixing member 314, and the bottom member 316. The connecting shaft 326 integrally supports the flange member 328.

[0035] like Figure 2 As shown, the flange member 328 has a generally disk-shaped form. The flange member 328 faces the bottom member 316 in a non-contact manner in the axial direction O and faces the body cover 318 in a non-contact manner in the radial direction. The flange member 328 supports the stylus module 304. At least a portion of the gap between the bottom member 316 and the flange member 328 is filled with an adhesive material such as lubricating oil. A permanent magnet 330 is fixed to the lower surface of the flange member 328 at its axial center O. In the lower outer region of the flange member 328, three spheres 332 are arranged at 120-degree intervals in the circumferential direction in a rotationally symmetrical manner to surround the permanent magnet 330.

[0036] like Figure 2As shown, the stylus module 304 includes an overtravel mechanism 334, and the stylus 336 is supported by the overtravel mechanism 334. The overtravel mechanism 334 is configured to change the position of the stylus 336 when a force greater than the measuring force at the output measurement signal Str is applied to the stylus 336, and to automatically restore the position of the stylus 336 when such a large force disappears. Specifically, the overtravel mechanism 334 includes a flange portion 338, an extension portion 344, a stylus holder 346, and a coil spring 350.

[0037] like Figure 2 As shown, the flange portion 338 is a component corresponding to the flange member 328. That is, three V-shaped grooves 340 are arranged at 120-degree intervals along the circumferential direction of the flange portion 338 to contact the ball 332. A magnetic member 342, which will be attracted to the permanent magnet 330, is disposed in the flange portion 338 to face the permanent magnet 330; this magnetic member can be a permanent magnet. Specifically, the flange portion 338 and the flange member 328 constitute a motion joint, which is a detachable connection mechanism.

[0038] like Figure 2 As shown, the extension 344 is integrally formed with the periphery of the flange portion 338, and a helical spring 350 that can extend in the axial direction O is housed in the extension. A stylus holder 346 is disposed at the end of the extension 344 in the axial direction O and connected to the extension 344 (e.g., by bolt). The stylus holder 346 movably supports the flange portion 356 of the stylus 336 pressed by the helical spring 350 on its upper surface closer to the upper surface of the helical spring 350. Three balls 348 are disposed at 120-degree intervals in the circumferential direction on the upper surface of the stylus holder 346 closer to the helical spring 350. Three V-shaped grooves 358 are disposed at 120-degree intervals in the circumferential direction on the lower surface of the flange portion 356 to correspond to the balls 348. Specifically, the stylus holder 346 and the flange portion 356 can be said to constitute the aforementioned motion joint. Therefore, the overtravel mechanism 334 can achieve high positioning reproducibility of the stylus 336 relative to the flange portion 338 within the measuring force that does not exceed the compressive force of the helical spring 350.

[0039] like Figure 2 As shown, the stylus 336 includes: a flange portion 356 supported by the stylus holder 346 as described above; a rod portion 360 configured to extend from the flange portion 356 in the axial direction O; and a contact portion 362 disposed at the end of the rod portion 360. The base end of the rod portion 360 is attached to the flange portion 356. A spherical contact portion 362 to contact the workpiece W to be measured is disposed at the end of the rod portion 360 (i.e., the stylus 336 has a contact portion 362 to contact the workpiece W to be measured).

[0040] like Figure 3 As shown, the signal processing section 366 includes a clock timer section 367A, a comparison value section 367B, a switch setting section 367C, and an analog-to-digital (AD) converter section 367D, each of which will be described in more detail below. In short, in some embodiments, the clock timer section 367A, the comparison value section 367B, and the switch setting section 367C may be used as part of a process for setting and / or implementing the update rate of the measurement probe 300 (e.g., as a first update rate or a second update rate). The AD converter section 367D (e.g., including an AD converter) may be used to perform AD conversion as part of a process for providing a digital measurement signal Str (e.g., whereby the process may include converting the output amplified signals Sa1 to Sa4 into digital signals).

[0041] In various embodiments, certain portions of the signal processing section 366 may be combined and / or indistinguishable. For example, the clock timer 367A (e.g., including a clock) may include a comparison value section 367B and / or a switch setting section 367C in various embodiments. In various embodiments, the signal processing section 366 may also include certain additional portions. For example, as described in U.S. Patent No. 10,852,119 (as previously incorporated herein), in various embodiments, the signal processing section 366 may also include a signal combination processing section, a trigger threshold processing section, an offset compensation section, etc.

[0042] In various embodiments, the signal processing section 366 may be implemented based on principles known to those skilled in the art of touch probe design. Therefore, it will only be briefly described herein in one exemplary embodiment. According to certain design principles, it may be desirable for the signal processing section 366 to combine multiple displacement sensor signals (e.g., corresponding to Sa1 to Sa4) to provide a combined signal (e.g., comparable to a touch trigger signal switching threshold). Therefore, the signal processing section 366 inputs four amplified signals Sa1 to Sa4 (e.g., in some embodiments, these may be offset-compensated signals), which may be converted into digital signals by the AD converter section 367D. The signal processing section 366 may determine a combined displacement signal, which may be compared to a switching threshold. When the combined displacement signal exceeds the switching threshold, the signal processing section 366 may output a measurement signal Str (e.g., a touch signal) indicating that the contact portion 362 of the stylus 360 has contacted the workpiece.

[0043] The output of the measuring probe 300 (e.g., including the measuring signal Str) is provided to the system controller section 140 (e.g., so that when a touch signal occurs, the current measurement value can be recorded to indicate, for example, the current coordinates of the stylus and the measurement coordinates of the workpiece surface it is contacting, relative to the CMM 200 or other XYZ coordinate system). The system controller section 140 includes a probe interface controller section 145 and a CMM controller section 140'.

[0044] In one embodiment, the probe interface controller section 145 can receive signals from and transmit signals (e.g., including the measurement signal Str) to the signal processing section 366 of the measurement probe 300. In various embodiments, the probe interface controller section 145 may be provided in different configurations (e.g., included within the system controller section 140, or as a separate element external to the system controller section 140, or integrated with the CMM controller section 140', etc.). The CMM controller section 140' can receive signals from and transmit signals to the probe interface controller section 145.

[0045] In various embodiments, the CMM controller section 140' can provide or otherwise indicate the coordinates of the measuring probe 300, corresponding to when a touch signal is generated. For example, such coordinates may correspond to XYZ coordinates (e.g., in the CMM coordinate system) that correspond to the positioning of the measuring probe 300 by the X-axis movement mechanism 222, Y-axis movement mechanism 221, and Z-axis movement mechanism 223 of the CMM 200. Such coordinates corresponding to the position of the measuring probe 300 can be used to determine the measurement coordinates of surface points on the workpiece that have been contacted by the contact portion 362 (i.e., whereby contact generates a touch signal, and where such measurement coordinate determination may include factors such as stylus length). The host computer 150 can receive signals from and send signals to the CMM controller section 140' of the system controller section 140. In various embodiments, the host computer 150 may be configured to operate and / or communicate with the coordinate measuring machine 200 via the system controller section 140, and process measurement data (e.g., including coordinates) acquired by the coordinate measuring machine 200 to determine, for example, the size or shape of the surface of a workpiece W being measured.

[0046] In various embodiments, signal processing section 366 may include one or more processors 367P and memory 367M, probe interface controller section 145 may include one or more processors 146P and memory 146M, CMM controller section 140 may include one or more processors 141P' and memory 141M', and host computer 150 may include one or more processors 151P and memory 151M. In various embodiments, for each corresponding section, a corresponding memory may be coupled to the corresponding one or more processors and may store program instructions that, when executed by the one or more processors, cause the one or more processors to perform certain functions and / or operations (e.g., those functions and / or operations as described herein).

[0047] Those skilled in the art will understand that certain portions or components thereof described or usable with the elements and methods described herein can typically be implemented using any suitable computing system or device (including distributed or networked computing environments, etc.). Such computing systems or devices may include one or more general-purpose or special-purpose processors (e.g., non-custom or custom devices) that execute software to perform the functions described herein. The software may be stored in memory, such as random access memory (RAM), read-only memory (ROM), flash memory, etc., or combinations of these components. The software may also be stored in one or more storage devices, such as optical-based disks, flash memory devices, or any other type of non-volatile storage medium for storing data. The software may include one or more program modules that include procedures, routines, programs, objects, components, data structures, etc., that perform specific tasks or implement specific abstract data types. In a distributed computing environment, the functionality of program modules can be combined or distributed across multiple computing systems or devices, and the functionality of program modules can be accessed via service calls in wired or wireless configurations.

[0048] In various embodiments, the update rate of the measurement probe 300 may correspond to the rate at which the measurement probe 300 outputs the measurement signal Str. As described above, in some embodiments, the clock timer section 367A, the comparison value section 367B, and the switch setting section 367C may be used as part of a process for setting and / or implementing the update rate of the measurement probe 300 (e.g., as a first update rate or a second update rate). The AD converter 367D may be used to provide the digital measurement signal Str (e.g., it may convert the output amplified signals Sa1 to Sa4 into digital signals for further processing, such as determining a combined signal). Generally, a lower update rate may correspond to less frequent use of the AD converter 367D and / or other components (e.g., it may correspond to lower power consumption / heat generation within the measurement probe 300).

[0049] In one implementation, the clock timer section 367A implements a clock timer that schedules the analog-to-digital converter reads of the AD converter 367D, and therefore also sends trigger packets (e.g., associated with the measurement signal Str) at fixed intervals (e.g., for a relatively fast / second update rate of nominal 100 kHz in a particular example implementation). In various implementations, this relatively fast update rate of the measurement probe 300 can be utilized during at least a portion of the measurement mode.

[0050] To achieve a relatively slow update rate, the comparison value section 367B (e.g., which may be a portion of the clock timer section 367A) is configured to store comparison values ​​(e.g., which may also be referred to as update rate values) for the clock timer section 367A, whereby the stored comparison values ​​determine a relatively slow update rate. As some specific numerical examples, the stored comparison values ​​for a relatively slow update rate may, in some embodiments, be larger (e.g., nominally 10 to 50 times larger) than comparison values ​​that would correspond to a relatively fast update rate (e.g., 100 kHz) as described above, thus resulting in a relatively slow update rate nominally between 10 kHz and 2 kHz. In one example embodiment, the programmable comparison value in the comparison value section 367B may be set to produce a relatively slow update rate within a certain range (e.g., such as less than 100 kHz but greater than 2 kHz). It should be understood that when the clock timer of the clock timer section 367A is running, when the amount of time corresponding to the comparison value has elapsed, an analog-to-digital converter read is performed accordingly (e.g., using an AD converter 367D), whereby such operation corresponds to the update rate. Therefore, a higher comparison value will correspond to a relatively slower update rate (e.g., and less frequent use of components such as the AD converter 367D), while a lower comparison value will correspond to a relatively higher update rate (e.g., and more frequent use of components such as the AD converter 367D).

[0051] Further regarding this correspondence, it should be understood that where existing systems can be modified based on the principles disclosed herein, this may require, for example, increasing the capacity of the clock timer (e.g., expanding the number of bits). More specifically, in existing systems that utilize only a relatively fast update rate, the corresponding clock timer may only need to count to the time corresponding to a relatively low (e.g., smaller) value. In contrast, according to the principles disclosed herein, if a relatively high (e.g., larger) comparison value will be used in implementations that utilize a relatively slow update rate in addition to the faster update rate, the clock timer of such existing systems may not have sufficient capacity (e.g., bits) to count to higher time values. Therefore, according to the principles disclosed herein, it may be necessary to modify the clock timer of such existing systems (e.g., such as expanding the number of bits of the clock timer so that it can count to new, higher comparison values ​​to achieve a slower update rate in addition to the faster update rate).

[0052] In various implementations, the comparison value stored in the comparison value section 367B is programmable (e.g., programmable by the system controller section 140). For example, the CMM controller section 140' of the system controller section 140 can implement control (e.g., sending signals such as commands to the probe interface controller section 145, which can send signals such as commands to the measurement probe 300) to program (e.g., modify) the comparison value (e.g., for sampling at a corresponding programmed rate).

[0053] In various embodiments, the programmed comparison values ​​described above can be used to achieve relatively slow update rates (e.g., corresponding to values ​​such as 10 kHz, or other values ​​in the range such as above 2 kHz but less than 100 kHz), while the fixed intervals described above (e.g., corresponding to values ​​such as 100 kHz) can be used to achieve relatively fast update rates. In various embodiments, individual settings (e.g., values) can be used to switch between relatively fast and slow update rates (e.g., such as those stored in or otherwise implemented in the switch setting section 367B). For example, the probe interface controller 145 (e.g., controlled by other parts or otherwise) can provide signals (e.g., send commands, such as write commands) to the measurement probe 300 to cause the settings (e.g., values) in the switch setting section 367B to correspond to settings for either a relatively fast or relatively slow update rate.

[0054] In one particular example implementation, the setting for a faster or slower update rate may correspond to a single bit (e.g., a value of 0 for the faster update rate and a value of 1 for the slower update rate, or vice versa). In such implementations, the switch setting section 367B may also store values ​​for other settings in some cases, thereby allowing the process to change only the bit corresponding to the update rate (e.g., where the update rate will only change at a given time). In various implementations, the switch setting section 367B may be implemented as a virtual switch. Further details will follow regarding... Figure 7 The timing diagrams describe in more detail certain operations related to the switch setup section 367B.

[0055] Based on the principles disclosed herein, in various embodiments, the magnitude of the power-on drift of the measurement probe 300 can be reduced by actively switching the update rate of the measurement probe between a relatively fast / high update rate and a relatively slow / low update rate, compared to a previous configuration. As described above, such an update rate of the measurement probe 300 can correspond to the update rate of the AD converter 367D and other processing electronics, such as according to a clock timer portion 367A, which schedules the analog-to-digital converter readouts of the AD converter 367D according to the update rate, etc. (e.g., which may be a specific source of power consumption / heat generation). Utilizing a slower / lower update rate for a specific time period (e.g., in some embodiments, it can be equal to more than 50% of the total operating time of the measurement probe) can effectively reduce the electrical power dissipated in the measurement probe, thereby effectively reducing the duty cycle of the electronics and correspondingly reducing the magnitude of the power-on drift of the measurement probe 300.

[0056] As will be described in more detail below, in various embodiments, a slower update rate can be utilized when precise measurement is not required (e.g., when the system is in mobile mode, during which it is still desirable to operate at a slower update rate, such as for detecting accidental collisions between the measuring probe and a workpiece or other object). A faster update rate can be utilized when high-precision measurement is required, such as during the system's measurement mode (e.g., for more accurately determining the measurement coordinates corresponding to when a touch signal occurs). In various embodiments, the CMM controller portion 140' of the system controller portion 140 can communicate with the probe interface controller portion 145 to indicate (e.g., provide a signal indicating) what the update rate should currently be, and the probe interface controller portion 145 can then communicate with the measuring probe 300 (e.g., provide a signal such as a command) to implement (e.g., change to) the indicated update rate.

[0057] Figure 4A and Figure 4B This is a graph showing the movement of the measuring probe 300 relative to a threshold distance TD from the workpiece. Figure 4A In the example, the measuring probe 300 is moved such that the contact portion 362 moves toward the workpiece W' (e.g., closer to the measuring position used to acquire measurement data for measuring workpiece W'). Figure 4A In this case, the contact portion 362 remains at a relatively long distance from the workpiece W', as indicated by the first probe-to-workpiece distance PWD1 (i.e., the distance between the contact portion 362 and the nearest surface point of the workpiece W'), which is shown as greater than a threshold distance TD. In various embodiments, the threshold distance TD may alternatively be referred to as a safety distance. With respect to the first probe-to-workpiece distance PWD1 being greater than the threshold distance TD, the measuring probe (i.e., and correspondingly the contact portion 362) is shown moving at a first moving speed MVS1 (e.g., which may be a relatively high moving speed).

[0058] like Figure 4B As shown, when the contact portion 362 approaches the workpiece W', such as by a second probe-to-workpiece distance PWD2 less than a threshold distance TD, the movement of the measuring probe 300 can be slowed to a second moving speed MVS2 (i.e., slower than the first moving speed MVS1). Generally, the transition from the first moving speed MVS1 to the second moving speed MVS2 can be in response to an indication that the contact portion 362 has passed (i.e., the probe-to-workpiece distance has become less than) the threshold distance TD. In a particular example embodiment, the threshold distance TD may be approximately 5 mm. In various embodiments, the threshold distance TD may be user-selectable (e.g., where the user can set the threshold distance TD to a desired value).

[0059] Regarding the further use of the first moving speed MVS1 and the second moving speed MVS2, it should be understood that in some embodiments, moving the measuring probe 300 at a relatively fast moving speed MVS1 can be considered relatively safe / acceptable, while the contact end 362 of the measuring probe is at a sufficient distance (e.g., greater than a threshold distance) from the workpiece W', and is therefore unlikely to be in danger of colliding with the workpiece W' (e.g., potentially damaging the measuring probe, CMM, and / or the workpiece W', etc.). Furthermore, acquiring highly accurate measurement data is generally not required during such movements (e.g., thus, according to the principles disclosed herein, a relatively slow update rate can be utilized for at least a portion of such movements). In contrast, when the contact portion 362 of the measuring probe 300 moves toward the workpiece W' (e.g., for measuring the workpiece) and is less than a threshold distance TD from the workpiece W', it may be desirable to reduce the movement of the measuring probe 300 to the second moving speed MVS2 as part of a more precise control process and to reduce the risk of potential collisions. The slower movement speed also makes it possible to obtain more accurate measurement data over shorter distances during such movement (e.g., thus, according to the principles disclosed herein, a relatively fast update rate can be utilized for at least a portion of such movement).

[0060] Figure 5 This is a diagram showing the movement of the measuring probe 300 used to measure surface point SP on workpiece W”. (See diagram for reference.) Figure 5 As shown, referring to the left side of the page, the measuring probe 300 moves to the first measuring position PS1 at a first moving speed MVS1 as part of the movement MNMP to move to the next measuring position. After reaching the first measuring position PS1, the measuring probe 300 moves such that the contact portion 362 moves toward the first surface point SP1 of the workpiece W” at a second moving speed MVS2 as part of the approaching and measuring movement AWM. The approaching and measuring movement AWM may move the contact portion 362 beyond the approach distance APD (e.g., which may correspond to or otherwise relate to a threshold distance TD, such as...). Figure 4A and Figure 4B The AWM (Action Machine) is executed when the workpiece is approached and the motion is measured. The AWM may include a contact portion 362 that contacts the surface point SP1 of the workpiece W (e.g., which may correspond to a touch signal). The AWM may therefore be part of a process for acquiring measurement data corresponding to the first surface point SP1 (e.g., for measuring the first surface point SP1, and the measurement coordinates of the first surface point SP1 may be indicated, such as based on or referenced to a CMM or other XYZ coordinate system).

[0061] After approaching the workpiece and measuring the motion AWM, a touch return motion can be performed (i.e., as shown in the image). Figure 5Not shown in the image, but will be shown below relative to... Figure 6 (described in more detail), wherein the measuring probe 300 is moved such that the contact portion 362 is retracted away from the workpiece W” (e.g., when the movement returns to the approach distance APD, such as after the process for measuring surface point SP1 is completed). In one example, except that in some embodiments it can be performed at a first moving speed MVS1 (i.e., opposite to the approach and measuring motion AWM which can be performed at a second moving speed MVS2), the touch return motion can be substantially opposite to the nearest approach and measuring motion AWM (e.g., in the opposite direction).

[0062] In this example of the invention, after the measuring probe 300 with contact portion 362 has returned to the first measuring position PS1 (or the contact portion 362 has otherwise returned to the proximity distance APD), the measuring probe 300 may begin to move toward the second measuring position PS2. The movement of the measuring probe 300 to the second measuring position PS2 may be part of a movement MNMP to the next measuring position, based on a first moving speed MVS1. Generally, the distance between measuring positions (e.g., the distance between the first measuring position PS1 and the second measuring position PS2) may be referred to as the measuring position spacing MPS. As indicated, the measuring position spacing MPS corresponds to the distance between consecutive measuring positions.

[0063] After reaching the second measurement position PS2, the measuring probe 300 with the contact portion 362 can move again according to the approaching and measuring motion AWM performed at the second moving speed MVS2. As part of the approaching and measuring motion AWM, the measuring probe can be moved such that the contact portion 362 can approach and contact the surface point SP2 of the workpiece W” (e.g., as part of a process for acquiring measurement data corresponding to the second surface point SP2, such as measuring the second surface point SP2 and indicating the coordinates of the second surface point SP2). After the measurement of the second surface point SP2 is completed, a touch return motion can be performed (e.g., as...). Figure 6 As shown in the diagram, the touch return motion can be in the opposite direction to the approaching workpiece and measuring motion AWM (e.g., for moving the measuring probe 300 so that the contact portion 362 moves away from the workpiece W” and back to the approach distance APD), such as for returning the measuring probe 300 to the second measuring position PS2.

[0064] This process can then be repeated, wherein the measuring probe 300 moves at a first moving speed MVS1 according to the movement MNMP to move to the next measuring position, so as to move from the second measuring position PS2 to the third measuring position PS3. Then, the measuring probe 300 with the contact portion 362 can move again at a second moving speed MVS2 as it approaches the workpiece and measures the movement AWM, such that the contact portion 362 moves toward the surface point SP3 of the workpiece W”, for approaching and contacting the surface point SP3 (e.g., as part of a process for acquiring measurement data corresponding to the third surface point SP3, such as for measuring the third surface point SP3, and the coordinates of the third surface point SP3 can be indicated). In this example, the measuring probe 300 can then return to its original movement based on the contact (e.g., as...). Figure 6 The touch return motion can be in the opposite direction to the nearest approaching workpiece and measuring motion AWM, and can be performed at a first moving speed MVS1 (e.g., to move the measuring probe 300 so that the contact portion 362 moves away from the workpiece W' so that the measuring probe 300 returns to the third measuring position PS3).

[0065] It should be understood that for each of the motions MNMPs shown in the diagram to move to the next measurement position, in various implementations where the proximity distance APD is equal to or greater than the threshold distance TD (e.g., as...), Figure 4A and Figure 4B As shown), in such embodiments, each of the motions MNMP can be characterized as a movement of the measuring probe 300 that causes the contact portion 362 to move at a distance from the workpiece W” equal to or greater than a threshold distance TD. Additionally, in various embodiments, each of the illustrated approach-to-workpiece and measurement motions AWM can be characterized as a movement of the measuring probe 300 that causes the contact portion 362 to move toward the workpiece W” (e.g., for obtaining a measurement result). Furthermore, in various embodiments, each of the described touch-back motions TBM (e.g., indicated in the opposite direction to the corresponding approach-to-workpiece and measurement motion AWM) can be characterized as a movement of the measuring probe 300 that causes the contact portion 362 to move away from the workpiece W”. As will be described in more detail below, based on the principles disclosed herein, the measuring probe 300 can operate at a relatively slow update rate during at least a portion of the move to the next measurement position motion MNMP and the touch-back motion TBM, and can operate at a relatively fast update rate during at least a portion of the approach-to-workpiece and measurement motion AWM.

[0066] Figure 6 This is a timing diagram showing the cycle CYC of the movement of the measuring probe 300 (e.g., it can correspond to...). Figure 5(Some examples). In various implementations, the cycle CYC can be a measurement cycle (e.g., where each measurement cycle CYC represents part of a process for acquiring measurement data corresponding to a respective surface point, such as for measuring the respective surface point, and may indicate the measurement coordinates of the respective surface point). Figure 6 As shown, as part of the first measurement cycle CYC1, between times t1' and t2', the measuring probe 300 with contact portion 362 moves at a first moving speed MVS1 according to the movement MNMP to move to the next measurement position. Between times t2' and t3', the measuring probe with contact portion 362 moves at a second moving speed MVS2 according to the movement AWM to approach the workpiece and measure. Figure 5 As shown, such a movement can be made to bring the contact portion 362 close to and contact the surface point SP on the workpiece. Between times t3' and t4', the measuring probe can move according to the touch return motion TBM performed at the first moving speed MVS1. As relative to... Figure 5 As described, in some embodiments, such a touch-back motion can be in the opposite direction to the approaching and measuring motion AWM (e.g., to retract the contact portion 362 of the measuring probe 300 away from the workpiece). In various embodiments, a series of motions MNMP, AWM, and TBM can correspond to a first measuring cycle CYC1.

[0067] like Figure 6 As further shown, the second measurement cycle CYC2 includes a similar series of movements. More specifically, between times t4' and t5', the measuring probe 300 with contact portion 362 moves at a first moving speed MVS1 according to the movement MNMP to move to the next measurement position. Between times t5' and t6', the measuring probe 300 with contact portion 362 moves at a second moving speed MVS2 according to the approaching and measuring movement AWM. Between times t6' and t7', the measuring probe 300 with contact portion 362 moves at a first moving speed MVS1 according to the touch return movement TBM. (As relative to...) Figure 5 As described, in various embodiments, the first measurement cycle CYC1 and the second measurement cycle CYC2 can be used to measure different (e.g., consecutive) surface points on the workpiece (e.g., for measuring surface points SP1 and SP2, or surface points SP2 and SP3, or any other two consecutive surface points that will be measured along the movement path of the measuring probe 300).

[0068] In various implementations, each motion in the movement may be performed as part of certain modes (e.g., modes that may correspond to CMM, system, and / or other system parts, etc.). For example, as will be described below relative to... Figure 7In a more detailed description, a first instance of the moving mode MVM may include, in part, a moving motion MNMP to the next measurement position between times t1' and t2'. A first instance of the measuring mode MSM may include, in part, a workpiece approach and measuring motion AWM between times t2' and t3'. A second instance of the moving mode MVM may include, in part, a touch-back motion TBM between times t3' and t4' and / or a moving motion MNMP to the next measurement position between times t4' and t5'. A second instance of the measuring mode MSM may include, in part, a workpiece approach and measuring motion AWM between times t5' and t6'. A third instance of the moving mode MVM may include, in part, a touch-back motion TBM between times t6' and t7'.

[0069] Figure 7 This is a timing diagram illustrating certain operations of the measurement system relative to instances of the Mobility Mode (MVM) and Measurement Mode (MSM). It should be understood that, as... Figure 7 Some timeline sections shown in the figures (e.g., and in other figures herein) may not be drawn to scale in some cases and may have been enlarged or minimized to simplify and / or better illustrate certain concepts and principles as disclosed herein.

[0070] exist Figure 7 In the example, the first signal portion S1 represents (e.g., provided / sent from CMM controller portion 140' to probe interface controller portion 145) a mode signal. In various embodiments, the mode signal may be a signal that can be provided by the CMM controller portion relative to certain functions, or may be associated with such a signal. For example, during a movement such as moving at a first moving speed MVS1 to the next measurement position MNMP, in some systems it may be desirable to reduce the sensitivity of the measurement probe to prevent vibrations caused by the movement (e.g., which may cause movement / deflection of the contact portion) from exceeding a touch trigger signal switching threshold (e.g., which may otherwise be indicated as a touch signal). In some embodiments, the mode signal (or associated signal) may be provided by the CMM controller portion (e.g., where the mode signal is switched to a low state or otherwise provided in a low state) to switch the measurement probe to a low-sensitivity mode. In such a low-sensitivity mode, the touch trigger signal switching threshold can be changed or other conditions may exist. Therefore, the contact portion 362 needs to maintain movement / deflection for a specified amount of time to correspond to the touch trigger signal, and movement / deflection caused by rapid oscillations rather than vibrations with stable deflection over a period of time will not meet such a criterion.

[0071] exist Figure 7In this context, the second signal portion S2 represents (e.g., signals sent from the probe interface controller portion 145 to the signal processing portion 366 in the measuring probe 300). The third signal portion S3 represents (e.g., signals sent from the signal processing portion 366 of the measuring probe 300 to the probe interface controller portion 145 of the system controller portion 140). Figure 7 As shown, the first instance of the mobile mode MVM occurs between time t0 and t2, while the first instance of the measurement mode MSM occurs between time t2 and t14, and the second instance of the mobile mode MVM occurs between time t14 and t20.

[0072] At time t0, as indicated by signal section S1, the mode signal is in a low state. At time t1, as indicated by signal section S3, measurement signal section M1 is sent from measurement probe 300 (e.g., from signal processing section 366) to probe interface controller section 145. At time t2, as indicated by signal section S1, the mode signal transitions from a low state to a high state, as provided / sent from CMM controller section 140' to probe interface controller section 145. In various embodiments, for the mode signal, the low state may be referred to as the first state and the high state may be referred to as the second state, or vice versa. In response to the transition of the mode signal, probe interface controller section 145 is set / prepared to change the update rate of the measurement probe, but waits to initiate the transition until the measurement probe 300 completes the current measurement signal interval to provide the next measurement signal section. At time t3, as indicated by signal section S3, the measurement probe sends the next / last measurement signal section M2 of the first measurement cycle MP1 (e.g., after which the probe interface controller section 145 initiates a process for changing the update rate of the measurement probe 300, as will be described in more detail below).

[0073] Measurement signal portions M1 and M2 include measurement signals during the first measurement cycle MP1 (e.g., typically indicating that, for at least a portion of the movement mode, the contact portion 362 of the measurement probe 300 is not currently in contact with the workpiece W, but will indicate whether any accidental collision with the workpiece or other obstacles has occurred, in which case an immediate stop or other appropriate action can be taken). The time interval between measurement signal portions M1 and M2 that appear at times t1 and t3 (e.g., indicated as the time interval TS1 between the centers of measurement signal portions M1 and M2 and indicating the frequency of the measurement signal portions) is based on a first update rate UR1 as utilized during the first measurement cycle MP1.

[0074] exist Figure 7In the example, after the measurement probe 300 sends the last / next measurement signal portion M2 at time t3 corresponding to the end of the first measurement cycle MP1, at time t4, as indicated by signal portion S2, the probe interface controller portion 145 provides a signal to the measurement probe 300 (e.g., sends a read command RC) (e.g., as a first step in the process of changing the update rate of the measurement probe 300). At time t5, as indicated by signal portion S3, in response to the signal sent at time t4 (e.g., the read command RC), the measurement probe 300 provides (sends) a signal (e.g., a value response VL) back to the probe interface controller portion 145 (e.g., whereby the value response VL indicates a value such as that set in a virtual switch, indicating that the measurement probe 300 is currently operating at the first update rate, and any additional values ​​of the virtual switch). At time t6, as indicated by signal section S2, in response to the signal sent at time t5 (e.g., value response VL), probe interface controller section 145 provides a signal to measurement probe 300 (e.g., sends write command WC), which indicates (e.g., commands) that the update rate of measurement probe 300 will be changed / transformed to a second update rate UR2 (e.g., may include changing the corresponding value stored in a virtual switch while keeping other values ​​of the virtual switch unchanged).

[0075] At time t7, as indicated by signal section S3, after the measuring probe 300 has received the signal sent at time t6 (e.g., write command WC), the second measurement cycle MP2 begins, during which the measuring probe operates at the second update rate UR2. As indicated by signal section S3, the measuring probe 300 sends (e.g., outputs) (e.g., sends to the probe interface controller section 145) measurement signals M3, M4, M5, M6, M7, M8, M9, and M10 at corresponding times t7, t8, t9, t10, t11, t12, t13, and t15. Since the second update rate UR2 of the second measurement cycle MP2 is faster than the first update rate UR1 of the first measurement cycle MP1, it is noted that the time interval between the timing of the measurement signal portions M3 to M10 (e.g., a representative time interval TS2 indicating the frequency of the measurement signal portions, which is indicated between the centers of the measurement signal portions M3 and M4 at times t7 and t8) is shorter than the time interval between the timing of the measurement signal portions M1 and M2 (e.g., indicated as time interval TS1).

[0076] At time t14, as indicated by signal section S1, the mode signal transitions from a high state to a low state, as provided / sent from CMM controller section 140' to probe interface controller section 145. In response to the mode signal transition, probe interface controller section 145 is set / prepared to change the update rate of the measurement probe, but waits to initiate the transition until the measurement probe 300 completes the current measurement signal interval to provide the next measurement signal section. At time t15, as indicated by signal section S3, as part of the end of measurement cycle MP2, the measurement probe 300 sends the next / last measurement signal section M10 to probe interface controller section 145.

[0077] At time t16, as indicated by signal section S2, in response to receiving measurement signal section M10 at time t15, probe interface controller section 145 initiates a process for changing the update rate of the measurement probe by providing a signal to the measurement probe 300 (e.g., sending a read command RC). At time t17, as indicated by signal section S3, in response to the signal (e.g., read command RC) at time t16, the measurement probe 300 provides (sends) a signal (e.g., value response VL) back to probe interface controller section 145 (e.g., thus, the value response VL indicates a value such as that set in the virtual switch, indicating that the measurement probe 300 is currently operating at a second update rate, and any additional values ​​of the virtual switch). At time t18, as indicated by signal section S2, in response to the signal at time t17 (e.g., value response VL), probe interface controller section 145 provides a signal to measurement probe 300 (e.g., sends write command WC), which indicates (e.g., commands) that the update rate of measurement probe 300 will be changed / transformed to a first update rate UR1 (e.g., may include changing the corresponding value stored in a virtual switch while keeping other values ​​of the virtual switch unchanged).

[0078] At time t19, as indicated by signal section S3, the measurement probe 300 begins the third measurement cycle MP3 by outputting measurement signal section M11. The measurement probe 300 continues the third measurement cycle M3 by outputting measurement signal section M12 at time t20. The time interval between measurement signal sections M11 and M12 at times t19 and t20 (e.g., indicated as time interval TS1) is based on the first update rate UR1 utilized during the third measurement cycle MP3.

[0079] In various embodiments, certain additional techniques can be utilized regarding the time interval TS1 between measurement signal portions M11 and M12 at corresponding timings t19 and t20 (e.g., and regarding the earlier reference time interval TS1 between measurement signal portions M1 and M2 at corresponding timings t1 and t3). More specifically, during the time interval TS1 between measurement signal portions (e.g., between times t1 and t3, or between times t19 and t20), when operating at a first update rate UR1 (e.g., as shown for the first measurement cycle MP1 and the third measurement cycle MP3), certain portions (e.g., the clock timer portion 367A and / or other portions of the system) may have reduced operation (e.g., such as being at least partially disabled or less frequently operated compared to operating at a second update rate UR2) in order to further save energy / reduce power dissipation in the measurement probe 300. It should be understood that such techniques are achieved by utilizing a first update rate UR1 with a relatively large time interval TS1 (e.g., compared to a previous system that only utilized a relatively fast update rate, such as corresponding to a time interval TS2, during which the opportunity to reduce the operation of certain components during such a short time interval is relatively less or non-existent).

[0080] In various embodiments, the measurement period MP2 with a second update rate UR2 and the corresponding measurement signal portions M3 to M10 can correspond to the measurement of surface points (e.g., such as...). Figure 5 The process of approaching the workpiece W” and measuring at least a portion of the surface points SP1, SP2, or SP3 on the workpiece (as shown) can be utilized, and can be combined with at least a portion of the approaching and measuring motion AWM (e.g., which may correspond to at least a portion of an instance of measurement mode MSM). In contrast, the measurement cycles MP1 and MP3 with a first update rate UR1 and the corresponding measurement signal portions M1 to M2 and M11 to M12 can correspond to the process of moving the measuring probe when no measurement results are intended to be obtained from the workpiece surface (e.g., which may correspond to less frequent measurement data), and can be utilized, in combination with at least a portion of the movement to the next measurement position motion MNMP and / or the touch return motion TBM (e.g., which may correspond to at least a portion of the movement mode MVM). It should be understood that the first update rate UR1 (i.e., which is slower than the second update rate UR2) is still sufficient to detect accidental collisions between the contact portion 362 or other portions of the measuring probe and the workpiece W” or other objects in the environment. In various embodiments, if such a collision is detected, appropriate actions can be taken (e.g., signals such as commands can be sent to immediately stop the movement of the CMM and / or otherwise limit any damage associated with such a collision, etc.).

[0081] Figure 8This is a flowchart illustrating an exemplary embodiment of a method 800 for operating a measurement system including a measurement probe. At block 810, the measurement probe is operated at a first update rate (e.g., update rate UR1) during at least a portion of a movement mode (e.g., movement mode MVM). The movement mode includes at least one of the following: movement of the measurement probe that causes the contact portion of the measurement probe to move away from the workpiece (e.g., such as that which may occur as part of a touch-back movement TBM at a first movement speed MVS1), or movement of the measurement probe that causes the contact portion to move at a distance equal to or greater than a threshold distance from the workpiece (e.g., such as that which may occur as part of a movement MNMP to the next measurement position at a first movement speed MVS1).

[0082] At block 820, it is determined that a transition from a first update rate to a second update rate will occur (e.g., based on a change in the mode signal, whereby the controller portion can provide a signal, such as sending a command, instructing the measuring probe to switch from operating at the first update rate to operating at the second update rate). At block 830, the measuring probe operates at the second update rate (e.g., update rate UR2) for at least a portion of a measurement mode (e.g., measurement mode MSM). The measurement mode includes movement of the measuring probe that causes the contact portion of the measuring probe to move toward the workpiece to obtain a measurement result (e.g., such as as part of an approaching and measuring motion AWM at a second movement speed MVS2). As part of such operation, the second update rate (e.g., update rate UR2) is faster than the first update rate (e.g., update rate UR1).

[0083] Various exemplary embodiments of this disclosure are described below, wherein various features and elements are used... Figures 1 to 8 Reference numerals are used to indicate exemplary embodiments, and the features and elements are not limited to those specified herein. Figures 1 to 8 The specific implementation scheme shown.

[0084] As described herein, a measurement system 100 is provided including a measurement probe 300, which includes a stylus 336, at least one detection element 325, and a signal processing unit 366. The stylus 336 has a contact portion 362 to contact a workpiece W to be measured. The at least one detection element 325 is capable of detecting movement of the contact portion 362 corresponding to contact with the workpiece W. The signal processing unit 366 is configured to process a generated signal Sg obtained from the output Ss of the at least one detection element 325 to output a measurement signal Str.

[0085] The measuring probe 300 is configured to operate at a first update rate UR1 during at least a portion of a movement mode MVM (e.g., a movement mode corresponding to the CMM 200 of the moving measuring probe 300). The movement mode MVM includes at least one of the following: a movement of the measuring probe 300 that moves the contact portion 362 away from the workpiece W, or a movement of the measuring probe 300 that moves the contact portion 362 at a distance from the workpiece W equal to or greater than a threshold distance TD.

[0086] The measuring probe 300 is further configured to operate at a second update rate UR2 (i.e., faster than the first update rate) during at least a portion of a measurement mode MSM (e.g., a movement mode corresponding to the CMM 200 of the moving measuring probe 300). The measurement mode MSM includes movement of the measuring probe 300 such that the contact portion 362 moves toward the workpiece W (e.g., when at a distance from the workpiece within a threshold distance TD) to obtain a measurement result. In various embodiments, the second update rate UR2 is at least twice the first update rate UR1, and in some cases can be at least ten times or fifty times. As some specific numerical examples, in embodiments where the second update rate corresponds to about 100 kHz, the first update rate may correspond to about 50 kHz, or 10 kHz, or 2 kHz (e.g., such as in the range of 2 kHz to 50 kHz).

[0087] In various embodiments, the first update rate UR1 and the second update rate UR2 correspond to the rate at which the signal processing section 366 outputs the measurement signal Str. The signal processing section 366 may include (e.g., an analog-to-digital converter section 367D) an analog-to-digital converter. Processing of the generated signal Sg obtained from the output Ss of at least one detection element 325 may include analog-to-digital conversion, and the analog-to-digital converter may operate less frequently when operating at the first update rate UR1 than when operating at the second update rate UR2.

[0088] In various embodiments, the measurement probe 300 receives and stores a first update rate value (e.g., a first update rate comparison value) that determines a first update rate UR1 (e.g., sent from the system controller section 140 and stored in the comparison value section 367B). In various embodiments, the controller section (e.g., the probe interface controller section 145 of the system controller section 140) is configured to provide a signal (e.g., sending a command such as a write command WC to switch a single bit in the switch setting section 367C) indicating that the measurement probe 300 will switch from operating at the first update rate UR1 to operating at the second update rate UR2. In various embodiments, the determination of the transition from the first update rate UR1 to the second update rate UR2 may be based at least in part on a transition of a mode signal (e.g., as indicated by the signal section S1) from a first signal level to a second signal level, whereby the transition of the mode signal may be associated with the transition between the mobile mode MVM and the measurement mode MSM. In some implementations, there may be a delay between the mode signal transition and the corresponding transition between the mobile mode MVM and the measurement mode MSM and / or between the measurement mode MSM and the mobile mode MVM.

[0089] In various embodiments, the Movement Mode (MVM) and Measurement Mode (MSM) correspond to the modes of a Coordinate Measuring Machine (CMM) that operates to move a measuring probe 300, including a contact portion 362, relative to the workpiece W. In various embodiments, the movement of the measuring probe 300 during at least a portion of the Movement Mode (MVM) is at a first movement speed (MVS1), and the movement of the measuring probe 300 during at least a portion of the Measurement Mode (MSM) is at a second movement speed (MVS2), whereby the first movement speed (MVS1) is faster than the second movement speed (MVS2).

[0090] In various embodiments, the measuring probe 300 is configured to operate at a first update rate UR1 during at least a portion of a first instance of the moving mode MVM. The first instance of the moving mode MVM may include movement of the measuring probe 300 such that the contact portion 362 moves relative to a first surface point SP1 on the workpiece W” toward a first measurement position PS1. The measuring probe 300 may be further configured to operate at a second update rate UR2 during at least a portion of the first instance of the measurement mode MSM. The first instance of the measurement mode MSM may include movement of the measuring probe 300 such that the contact portion 362 moves toward the first surface point SP1 on the workpiece W” to obtain a measurement result for the first surface point.

[0091] In various embodiments, the measuring probe 300 may be further configured to operate at a first update rate UR1 during at least a portion of a second instance of the moving mode MVM. The second instance of the moving mode may include movement of the measuring probe 300 such that the contact portion 362 moves away from the first surface point SP1 after measurement has been completed, and movement of the measuring probe 300 relative to the second surface point SP2 on the workpiece W” toward a second measurement position PS2. The measuring probe 300 may be further configured to operate at a second update rate UR2 during at least a portion of a second instance of the measuring mode MSM. The second instance of the measuring mode MSM may include movement of the measuring probe 300 such that the contact portion 362 moves toward the second surface point SP2 on the workpiece W” to obtain a measurement result for the second surface point.

[0092] In various embodiments, the controller section may be configured to provide a signal (e.g., the CMM controller section 140' may provide a low-state mode signal on signal section S1, and / or, in response to such a signal, the probe interface controller section 145 may provide a signal such as a write command WC on signal section S2) indicating that the measurement probe 300 will operate at a first update rate UR1 during at least a portion of the moving mode MVM. The controller section may be further configured to provide a signal (e.g., the CMM controller section 140' may provide a high-state mode signal on signal section S1, and / or, in response to such a signal, the probe interface controller section 145 may provide a signal such as a write command WC on signal section S2) indicating that the measurement probe 300 will operate at a second update rate UR2 during at least a portion of the measurement mode MSM.

[0093] In various embodiments, a method is provided for operating a measurement system 100 (i.e., including a measurement probe 300 having a contact portion 362 to contact a workpiece W to be measured). The method includes operating the measurement probe 300 at a first update rate UR1 during at least a portion of a moving mode MVM. As part of the operation of the measurement system, it can be determined (e.g., at least in part based on a mode signal transition) that a transition from the first update rate UR1 to a second update rate UR2 will occur. The method also includes operating the measurement probe 300 at a second update rate UR2 (i.e., faster than the first update rate UR1) during at least a portion of a measurement mode MSM.

[0094] In various embodiments, one or more components of the measurement system 100 may be designated to operate the measurement probe 300 at a first update rate UR1 and a second update rate UR2. For example, the signal processing section 366 may be designated to operate the measurement probe 300 at the first update rate and the second update rate. Alternatively or additionally, at least a portion of the system controller section 140 (e.g., including the CMM controller section 140' and / or the probe interface controller section 145) may be designated to operate the measurement probe 300 at the first update rate and the second update rate.

[0095] In various embodiments, the determination of a transition from a first update rate UR1 to a second update rate UR2 can be designated to be performed by one or more components of the measurement system. In some embodiments, this determination can be designated to be performed by at least a portion of the system controller section 140. For example, the CMM controller section 140' can be designated to perform the determination as part of a process for providing a transition from a low state to a high state to a mode signal. Alternatively or additionally, the probe interface controller section 145 can be designated to perform the determination in response to receiving a mode signal with a transition from the CMM controller section 140', whereby the probe interface controller section 145 accordingly initiates a process for changing the update rate. Alternatively or additionally, the signal processing section 366 of the measurement probe 300 can be designated to perform the determination in response to receiving a signal (e.g., a write command WC) from the probe interface controller section 145, whereby the signal processing section 366 correspondingly changes to the second update rate UR2 (e.g., such as by changing a corresponding value stored in a virtual switch such as the switch setting section 367C).

[0096] Although preferred embodiments of the present disclosure have been illustrated and described, many variations of the feature arrangements and sequences of operation shown and described based on this disclosure will be apparent to those skilled in the art. Various alternative forms can be used to implement the principles disclosed herein. Furthermore, the various embodiments described above can be combined to provide other embodiments. All U.S. patents and U.S. patent applications mentioned in this specification are incorporated herein by reference in their entirety. If it is necessary to employ the concepts of various patents and applications to provide other embodiments, aspects of the embodiments can be modified.

[0097] These and other changes can be made to the embodiments based on the detailed description above. Generally, the terminology used in the following claims should not be construed as limiting the claims to the specific embodiments disclosed in this specification and claims, but should be interpreted to include all possible embodiments and the full scope of the equivalents conferred by these claims.

Claims

1. A measurement system, comprising: The measuring probe includes: A stylus having a contact portion to contact the workpiece to be measured; At least one detection element, said at least one detection element being capable of detecting movement of the contact portion, said movement corresponding to contact with the workpiece; and The signal processing section is configured to process the generated signal obtained from the output of the at least one detection element to output a measurement signal; The measurement probe is configured as follows: The device operates at a first update rate during at least a portion of a movement mode, wherein the movement mode includes at least one of the following: a movement of the measuring probe that moves the contact portion away from the workpiece, or a movement of the measuring probe that moves the contact portion at a distance from the workpiece equal to or greater than a threshold distance; and The measurement mode operates at a second update rate during at least a portion of the measurement mode, wherein the measurement mode includes movement of the measurement probe such that the contact portion moves toward the workpiece to obtain a measurement result, and the second update rate is faster than the first update rate.

2. The measurement system according to claim 1, wherein the first update rate and the second update rate correspond to the rate at which the signal processing section outputs the measurement signal.

3. The measurement system of claim 1, wherein the signal processing section includes an analog-to-digital converter, and the processing of the generated signal obtained from the output of the at least one detection element includes analog-to-digital conversion, and the analog-to-digital converter operates less frequently when operating at the first update rate than when operating at the second update rate.

4. The measurement system of claim 1 further includes a controller portion configured to provide a signal indicating that the measurement probe will switch from operating at the first update rate to operating at the second update rate.

5. The measurement system of claim 1, wherein the determination of the transition from the first update rate to the second update rate is based at least in part on the transition of the mode signal from a first signal level to a second signal level, whereby the transition of the mode signal is related to the transition between the movement mode and the measurement mode.

6. The measurement system of claim 1, wherein the movement mode and the measurement mode correspond to the mode of a coordinate measuring machine, the coordinate measuring machine being operated to move the measuring probe, including the contact portion, relative to the workpiece.

7. The measurement system according to claim 1, wherein: The measurement probe moves at a first speed during at least a portion of the movement mode; The movement of the measuring probe is at a second moving speed during at least a portion of the measuring mode; and The first moving speed is faster than the second moving speed.

8. The measurement system according to claim 1, wherein: The movement pattern is a first instance of the movement pattern, and the movement of the measuring probe that causes the contact portion to move at a distance equal to or greater than a threshold distance from the workpiece includes movement of the measuring probe relative to a first surface point on the workpiece toward a first measuring position; and The measurement mode is a first instance of the measurement mode, and the movement of the measurement probe that causes the contact portion to move toward the workpiece to obtain the measurement result includes the movement of the measurement probe that causes the contact portion to move toward the first surface point on the workpiece to obtain the measurement result of the first surface point.

9. The measurement system according to claim 8, wherein the measurement probe is further configured as follows: During at least a portion of the second instance of the movement mode, the operation is performed at the first update rate, wherein the second instance of the movement mode includes movement of the measuring probe that causes the contact portion to move away from the first surface point after the measurement has been completed, and the movement of the measuring probe that causes the contact portion to move at a distance equal to or greater than a threshold distance from the workpiece includes movement of the measuring probe relative to a second surface point on the workpiece toward a second measurement position; and During at least a portion of the second instance of the measurement mode, the measurement mode operates at the second update rate, wherein the second instance of the measurement mode includes a movement of the measurement probe such that the contact portion moves toward the second surface point on the workpiece to obtain a measurement result of the second surface point.

10. The measurement system of claim 1, wherein the measurement probe receives and stores a first update rate value that determines the first update rate.

11. The measurement system of claim 1, wherein the second update rate is at least twice the first update rate.

12. A method for operating a measuring system, the measuring system including a measuring probe having a contact portion to contact a workpiece to be measured, the method comprising: The measuring probe is operated at a first update rate during at least a portion of the movement mode, wherein the movement mode includes at least one of the following: a movement of the measuring probe that moves the contact portion away from the workpiece, or a movement of the measuring probe that moves the contact portion at a distance from the workpiece equal to or greater than a threshold distance. It is determined that a transition from the first update rate to the second update rate will occur; as well as The measuring probe is operated at a second update rate during at least a portion of the measurement mode, wherein the measurement mode includes movement of the measuring probe such that the contact portion moves toward the workpiece to obtain a measurement result, and the second update rate is faster than the first update rate.

13. The method of claim 12, wherein the determination of the transition from the first update rate to the second update rate is based at least in part on the transition of the mode signal from the first signal level to the second signal level.

14. The method of claim 12, wherein the first update rate and the second update rate correspond to the rate at which the measurement probe outputs the measurement signal.

15. The method of claim 14, wherein the measurement signal is processed within the measurement probe using an analog-to-digital converter, and the analog-to-digital converter operates less frequently when operating at the first update rate than when operating at the second update rate.

16. The method of claim 12, wherein: The measurement probe moves at a first speed during at least a portion of the movement mode; The movement of the measuring probe is at a second moving speed during at least a portion of the measuring mode; and The first moving speed is faster than the second moving speed.

17. The method of claim 12, further comprising receiving and storing a first update rate value for determining the first update rate.

18. A measurement system, comprising: The measuring probe includes: A stylus having a contact portion to contact the workpiece to be measured; At least one detection element, said at least one detection element being capable of detecting movement of the contact portion, said movement corresponding to contact with the workpiece; and A signal processing section, configured to process a generated signal obtained from the output of the at least one detection element, to output a measurement signal; and The controller is configured to: A signal is provided instructing the measuring probe to operate at a first update rate during at least a portion of a movement mode, wherein the movement mode includes at least one of: a movement of the measuring probe that moves the contact portion away from the workpiece, or a movement of the measuring probe that moves the contact portion at a distance from the workpiece equal to or greater than a threshold distance; and A signal is provided instructing the measuring probe to operate at a second update rate during at least a portion of a measuring mode, wherein the measuring mode includes movement of the measuring probe such that the contact portion moves toward the workpiece to obtain a measurement result, and the second update rate is faster than the first update rate.

19. The measurement system of claim 18, wherein the determination of a transition from the first update rate to the second update rate is based at least in part on a transition of the mode signal.

20. The measurement system of claim 19, wherein the movement mode and the measurement mode correspond to a mode of a coordinate measuring machine that operates to move the measuring probe, including the contact portion, relative to the workpiece, and the transition of the mode signal relates to the transition between the movement mode and the measurement mode.

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