一种评估热敏电阻在硅压阻传感器硬件补偿中影响的方法

By acquiring the resistance value of the bridge arm in a silicon piezoresistive sensor and using interpolation to expand the data points for circuit simulation calculations, the problem of evaluating the influence of thermistors in the compensation circuit is solved. This achieves accurate evaluation and optimization of compensation parameters, reduces costs, and improves the output accuracy of the sensor.

CN117664431BActive Publication Date: 2026-07-17WUHAN AVIATION INSTR

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
WUHAN AVIATION INSTR
Filing Date
2023-10-20
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In the hardware compensation process of silicon piezoresistive sensors, existing technologies struggle to accurately assess the influence of thermistors, especially the inflection point characteristics of nonlinear NTC thermistors. This results in significant differences in the compensated output characteristics outside the control point, increasing testing costs.

Method used

By collecting the resistance values ​​of the bridge arm resistors, a temperature-resistance coordinate system is established. The data points are expanded using interpolation, and circuit simulation calculations are performed to evaluate the influence of the thermistor in the compensation circuit. The interpolation method is used to expand the correlation data between the bridge arm resistance and temperature and pressure, and to guide the selection of compensation parameters.

Benefits of technology

Without increasing workload, the impact of thermistors on compensation results can be accurately assessed, reducing actual calibration tests, improving compensation accuracy, avoiding out-of-tolerance output characteristics at the inflection point, and reducing costs.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN117664431B_ABST
    Figure CN117664431B_ABST
Patent Text Reader

Abstract

本发明属于硅压阻传感器技术领域,涉及一种评估热敏电阻在硅压阻传感器硬件补偿中影响的方法;包括步骤1:在标定的温度点和压力点下,采集硅压阻敏感元件电桥的四个桥臂电阻Ra、Rb、Rc和Rd阻值;步骤2:在每一个压力点下测得的桥臂电阻Ra、Rb、Rc和Rd阻值与标定温度点组成温度‑阻值坐标系中的坐标点,连接这些坐标点得到桥臂电阻Ra、Rb、Rc和Rd阻值与温度的折线、平滑曲线或直线;步骤3:在标定温度点之间均匀取插值温度点;步骤4:计算各个插值温度点在温度‑阻值坐标系中对应的阻值;步骤5:进行仿真计算;步骤6:将标定温度点和插值温度点仿真计算的输出结果与温度点的关系在温度‑输出坐标系中连成曲线。
Need to check novelty before this filing date? Find Prior Art