Test structure and test apparatus for a cleaning robot

Abstract

The application discloses a test structure and test equipment of a cleaning robot, the test structure of the cleaning robot comprises a mounting seat, a first driving structure, a circuit board, a guide structure and a test needle structure, the mounting seat is provided with a test station for placing the cleaning robot, the first driving structure is arranged on the mounting seat, one end of the circuit board is used for electrically connecting with the cleaning robot, the guide structure is drivingly connected with the first driving structure and has a guide surface which is arranged in a vertical direction, the test needle structure is movably arranged on the mounting seat in the vertical direction and is carried on the guide surface, when the first driving structure drives the guide structure to move, the guide surface guides the test needle structure to move in the vertical direction, the test needle structure has a movement stroke from an initial position to an abutting position which abuts against and is electrically connected with the other end of the circuit board, and the height of the test needle structure does not exceed that of the circuit board.

Description

Technical Field

[0001] This invention belongs to the field of testing technology for cleaning robots, and specifically relates to a testing structure and testing equipment for a cleaning robot. Background Technology

[0002] During operation, cleaning robots first need to create an environmental image of their surroundings, for example, using LDS (Light Detection and Ranging) laser radar technology to generate such an image. Based on this image, they then set a route for cleaning. Taking a robotic vacuum cleaner as an example, the LDS laser radar needs to be tested before leaving the factory. However, existing LDS testing structures suffer from poor testing results and low automation. Summary of the Invention

[0003] Therefore, the present invention aims to solve the technical problems of poor testing results and low automation in the testing structure of cleaning robots in the prior art.

[0004] To address the aforementioned technical problems, this invention provides a test structure for a cleaning robot, the test structure comprising:

[0005] The mounting base is equipped with a test station for placing the cleaning robot;

[0006] A first driving structure is disposed on the mounting base;

[0007] A circuit board, one end of which is used for electrical connection with the cleaning robot;

[0008] A guide structure, which is drivenly connected to the first drive structure and has a guide surface that is vertically inclined; and,

[0009] The test probe structure is vertically movably disposed on the mounting base and supported on the guide surface, so that when the first driving structure drives the guide structure to move, the guide surface guides the test probe structure to move vertically, and the test probe structure has a travel distance from an initial position to an abutment position that abuts and is electrically connected to the other end of the circuit board, and the height of the test probe structure does not exceed the circuit board.

[0010] Preferably, in the test structure of the cleaning robot, the first drive structure is a linear drive structure, and the test needle structure, the guide structure, and the first drive structure are arranged sequentially along the linear drive direction of the first drive structure.

[0011] The guide surface is inclined along the linear driving direction of the first driving structure and toward the other end of the circuit board.

[0012] Preferably, the test structure of the cleaning robot further includes:

[0013] The abutment structure can be selectively abutted against the other end of the circuit board on the side opposite to the test needle structure in the vertical direction, and the height of the abutment structure is lower than the height of the top of the cleaning robot; wherein, when the test needle structure is in the abutment position, the abutment structure and the test needle structure abut against the two sides of the circuit board respectively.

[0014] Preferably, in the test structure of the cleaning robot, the contact structure includes:

[0015] A mounting bracket is provided on the mounting base;

[0016] A rotating column, one end of which is rotatably mounted on the mounting bracket and extends in the vertical direction;

[0017] An abutment plate, mounted at the other end of the rotating column, has a first position abutting against the other end of the circuit board and a second position releasing from contact with the circuit board; and...

[0018] The second driving structure is connected to the rotating column drive and is used to drive the rotating column to rotate and drive the abutment plate to move between the first position and the second position.

[0019] Preferably, in the test structure of the cleaning robot, the first drive structure and the second drive structure are the same drive structure;

[0020] The rotating column is driven and connected to the first driving structure through a cam linkage structure; the first driving structure drives the guide structure to move and makes the test probe structure bear the highest height of the guide surface, while the guide structure is linked to the rotating column to rotate, so that the test probe structure and the abutment plate abut against the two sides of the other end of the circuit board respectively.

[0021] To achieve the above objectives, the present invention also provides a testing device for a cleaning robot, the testing device comprising:

[0022] A conveyor structure for transporting cleaning robots;

[0023] The test structure for the aforementioned cleaning robot; and,

[0024] The material transfer structure is used to move the cleaning robot on the conveying structure to the test station of the test structure.

[0025] Preferably, in the testing equipment for the cleaning robot, the conveying structure includes:

[0026] A conveying structure includes a conveyor plate and a carrier plate disposed on the conveyor plate, the carrier plate being used to carry a cleaning robot, and the conveyor plate being movably disposed along a first direction;

[0027] The adjustment structure includes a side plate structure, a partition structure, an elastic reset member, and multiple roller structures. The partition structure includes a partition seat structure that can slide vertically with the side plate structure, and a partition. The partition is located on the side opposite to the side plate structure and extends laterally. The two ends of the elastic reset member are respectively disposed on the side plate structure and the partition seat structure and are spaced apart vertically. The multiple roller structures are disposed at the bottom of the partition seat structure along a first direction.

[0028] When the conveyor plate moves to the position corresponding to the partition, the multiple roller structures roll on the conveyor plate, and the partition is used to be disposed between the carrier plate and the bottom of the cleaning robot.

[0029] Preferably, in the testing equipment for the cleaning robot, the partition has a support portion near the carrier plate and for bearing between the carrier plate and the bottom of the cleaning robot, the support portion having a support surface facing the cleaning robot, the support surface being inclined downwards.

[0030] Preferably, in the testing equipment for the cleaning robot, the side plate structure includes a side plate seat and a side plate mounted on the side plate seat;

[0031] The partition seat structure includes a first connecting plate and a second connecting plate mounted on the first connecting plate. The first connecting plate is arranged facing the side plate and can slide in the up and down direction. The two ends of the elastic reset member are respectively connected to the ends of the first connecting plate and the side plate. The partition is mounted on the second connecting plate.

[0032] Preferably, in the testing equipment for the cleaning robot, the elastic reset member includes at least two tension springs, which are respectively disposed at both ends of the first connecting plate and the side plate.

[0033] The technical solution provided by this invention has the following advantages:

[0034] This invention drives a guide structure to move via a first driving structure. The guide structure moves and causes the test probe structure to move on a guide surface. The guide surface is vertically inclined so that the test probe structure moves vertically from its initial position to its contact position. At the contact position, the test probe structure contacts and is electrically connected to the circuit board. This allows for the testing of cleaning robots. The height of the test probe structure does not exceed that of the circuit board, thus providing a completely unobstructed testing environment to improve testing efficiency and automation. Attached Figure Description

[0035] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0036] Figure 1 A perspective view of the structure of a testing device for the cleaning robot provided by the present invention;

[0037] Figure 2 for Figure 1 A three-dimensional view of the middle section structure;

[0038] Figure 3 for Figure 2 A three-dimensional view of the middle section structure;

[0039] Figure 4 for Figure 3 A partial schematic diagram of an embodiment of the center guide structure;

[0040] Figure 5 A schematic diagram of an embodiment of the conveying structure provided by the present invention;

[0041] Figure 6 for Figure 5 A schematic diagram of the conveyor structure without a cleaning robot.

[0042] Explanation of reference numerals in the accompanying drawings of this invention:

[0043] 100 Test structure for cleaning robots 72 crimping seat structure 1 Mounting base 721 Connecting arm 2 First drive structure 722 pressure plate 3 circuit board 200 Conveying structure 4 Guide structure 210 Transmission Structure 41 Guide surface 211 conveyor plate 411 Inclined section 212 carrier board 412 Straight section 220 Adjusting the structure 5 Test probe structure 221 Side panel structure 51 test needle 2211 Side plate seat 52 Fixed base structure 2212 Side panel 521 First fixed seat 22121 First connecting post 522 Second fixing seat 222 partition structure 523 protruding ears 2221 partition seat structure 53 First spring 2221a First connecting plate 6 abutment structure 2221a1 Second connecting post 61 Mounting rack 2221b Second connecting plate 62 Rotating column 2222 partition 63 abutment plate 2222a bearing surface 7 crimping structure 223 Roller structure 71 Third drive structure 300 Cleaning robots

[0044] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0045] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. The present invention will be described in detail below with reference to the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of the present invention can be combined with each other.

[0046] It should be noted that the terms "first," "second," etc., in the specification, claims, and drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0047] In this invention, unless otherwise stated, directional terms such as "upper," "lower," "top," and "bottom" are generally used in relation to the direction shown in the accompanying drawings, or in relation to the vertical, perpendicular, or gravitational direction of the component itself; similarly, for ease of understanding and description, "inner" and "outer" refer to the inner and outer contours of each component itself, but the above directional terms are not intended to limit this invention.

[0048] Example 1

[0049] Figure 1 An embodiment of a testing device for a cleaning robot is illustrated. Figures 2 to 3 The schematic diagram illustrates one embodiment of the test structure for the cleaning robot. Please refer to [link / reference]. Figures 1 to 3 The testing structure 100 of the cleaning robot includes a mounting base 1, a first drive structure 2, a circuit board 3, a guide structure 4, and a test needle structure 5. The mounting base 1 has a testing station for placing the cleaning robot 300. The first drive structure 2 is located on the mounting base 1. One end of the circuit board 3 is electrically connected to the cleaning robot 300. The guide structure 4 is drivenly connected to the first drive structure 2 and has a guide surface 41 that is vertically inclined. The test needle structure 5 is vertically movably located on the mounting base 1 and supported on the guide surface 41, so that when the first drive structure 2 drives the guide structure 4 to move, the guide surface 41 guides the test needle structure 5 to move vertically. The test needle structure 5 has a travel distance from its initial position to an abutment position that abuts against and is electrically connected to the other end of the circuit board 3. The height of the test needle structure 5 does not exceed that of the circuit board 3. In this embodiment, the guide structure 4 is a cam structure.

[0050] The first driving structure 2 drives the guide structure 4 to move. The guide structure 4 moves and drives the test needle structure 5 to move on the guide surface 41. The guide surface 41 is set vertically inclined so that the test needle structure 5 moves vertically and moves from the initial position to the contact position. At the contact position, the test needle structure 5 contacts and is electrically connected to the circuit board 3. In this way, the cleaning robot 300 can be tested. The height of the test needle structure 5 does not exceed the circuit board 3, so a completely unobstructed testing environment can be provided.

[0051] Figure 4 An embodiment of the guide structure 4 is illustrated; please refer to [link / reference]. Figure 4The guide surface 41 includes an inclined section 411 and a straight section 412. The straight section 412 is connected to the inclined section 411 and is connected to the highest point of the inclined section 411. The straight section 412 extends laterally. Thus, the first drive structure 2 drives the guide structure 4. When the test needle structure 5 is located in the straight section 412, the test needle structure 5 remains in the contact position. This ensures that the test needle structure 5 cannot continue to move upward from the contact position or even exceed the circuit board 3, further ensuring that the test needle structure 5 cannot block the cleaning robot 300.

[0052] Specifically, the first driving structure 2 is a linear driving structure. The test probe structure 5, the guide structure 4, and the first driving structure 2 are arranged sequentially along the linear driving direction of the first driving structure 2. The guide surface 41 is inclined along the linear driving direction of the first driving structure 2 and toward the other end of the circuit board 3. Thus, when the first driving structure 2 drives the guide structure 4, the guide structure 4 moves along the linear driving direction of the first driving direction. The test probe structure 5 is subjected to the force of the guide surface 41 and moves vertically and is supported on the guide surface 41. When the test probe structure 5 moves to the contact position, it contacts the circuit board 3.

[0053] The test probe structure 5 includes a test probe 51, a fixing base structure 52, and a first spring 53. The fixing base structure 52 includes a first fixing base 521 and a second fixing base 522. The test probe 51 is mounted on the first fixing base 521, and the first spring 53 is disposed between the first fixing base 521 and the second fixing base 522. The first fixing base 521 and the second fixing base 522 are arranged vertically on both sides of the mounting base 1. The mounting base 1 has mounting holes, through which the first spring 53 passes. In addition, the first fixing base 521 has lugs 523 on both sides. The lugs 523 are supported on the guide surface 41. When the lugs 523 move along the guide surface 41 toward the abutment position, the first spring 53 is in a stretched state. When the first driving structure 2 stops driving the guide structure 4 to move, the first fixing base 521 returns to its initial position under the elastic restoring force of the first spring 53. Preferably, the lug 523 is rotatably disposed on the first fixed base 521, which reduces the frictional force on the guide surface 41 and ensures smooth movement. In this embodiment, the first drive structure 2 is a first cylinder.

[0054] In this embodiment, the circuit board 3 is a PCB board. The test structure 100 of the cleaning robot also includes an abutment structure 6, which can selectively abut against the other end of the circuit board 3 on the side opposite to the vertical direction of the test needle structure 5. The height of the abutment structure 6 is lower than the height of the top of the cleaning robot 300. When the test needle structure 5 needs to abut against the circuit board 3, the abutment structure 6 abuts against the other end of the circuit board 3 on the side opposite to the vertical direction of the test needle structure 5. In this way, the circuit board 3 is clamped between the abutment structure 6 and the test needle structure 5, ensuring the stability of the electrical connection and the reliability of the abutment. When the test needle structure 5 does not need to abut against the circuit board 3, the abutment structure 6 can be removed, thus providing operating space for the testing equipment of the cleaning robot to feed or discharge (i.e., move away from or into the cleaning robot 300).

[0055] Specifically, please refer to Figure 3 The abutment structure 6 includes a mounting frame 61, a rotating column 62, an abutment plate 63, and a second driving structure. The mounting frame 61 is disposed on the mounting base 1. One end of the rotating column 62 is rotatably mounted on the mounting frame 61 and extends vertically. The abutment plate 63 is mounted on the other end of the rotating column 62, having a first position abutting against the other end of the circuit board 3 and a second position where it is released from contact with the circuit board 3. The second driving structure is drivenly connected to the rotating column 62 and is used to drive the rotating column 62 to rotate and move the abutment plate 63 between the first position and the second position. The second driving structure is disposed on the mounting base 1 or the mounting frame 61. In this embodiment, the second driving structure can be a rotary cylinder. When testing is required, the test probe structure 5 abuts against the circuit board 3. At this time, the second driving structure drives the rotating column 62 to rotate and moves the abutment plate 63 to the first position, where the test probe structure 5 and the abutment plate 63 abut against both sides of the circuit board 3.

[0056] In other embodiments, the first driving structure 2 and the second driving structure may be the same driving structure; the rotating column 62 is driven and connected to the first driving structure 2 through a cam linkage structure; the first driving structure 2 drives the guide structure 4 to move, and the test needle structure 5 is supported at the highest height of the guide surface 41. At the same time, the guide structure 4 is linked to the rotating column 62 to rotate, so that the test needle structure 5 and the abutment plate 63 abut against the two sides of the other end of the circuit board 3 respectively. In this way, when the first driving structure 2 drives the guide structure 4, the guide mechanism is linked to the rotating column 62 to rotate, which can achieve synchronous abutment, facilitate control, and reduce the number of parts to save space.

[0057] Example 2

[0058] This invention provides a testing device for a cleaning robot, which includes a conveying structure, the aforementioned testing structure 100 for the cleaning robot, and a material transfer structure. Figure 5 and Figure 6 An embodiment of the conveying structure is illustrated; please refer to [link / reference]. Figure 5 and Figure 6 The conveying structure 200 is used to convey the cleaning robot 300, and the transfer structure is used to move the cleaning robot 300 on the conveying structure 200 to the test station of the test structure. Embodiments of the testing equipment for the cleaning robot 300 include the embodiments of the test structure 100 for the cleaning robot described above, and will not be detailed here.

[0059] The transfer structure is used to move the cleaning robot 300 on the conveying structure 200 to the test structure 100 of the cleaning robot. Typically, the transfer structure uses a vacuum gripping method to move the cleaning robot 300.

[0060] The conveying structure 200 includes a conveying structure and an adjusting structure 220. The conveying structure includes a conveying plate 211 and a carrier plate 212 disposed on the conveying plate 211. The carrier plate 212 is used to support the cleaning robot 300. The conveying plate 211 is movably disposed along a first direction. The adjusting structure 220 includes a side plate structure 221, a partition structure 222, an elastic reset member, and a plurality of roller structures 223. The partition structure 222 includes a partition seat structure 2221 that can slide vertically with the side plate structure 221, and a partition 2222. 22 is located on the side opposite to the side plate structure 2221 and extends laterally. The two ends of the elastic reset member are respectively provided on the side plate structure 221 and the partition plate structure 2221 and are spaced apart in the vertical direction. The plurality of roller structures 223 are provided at the bottom of the partition plate structure 2221 in the first direction. When the conveyor plate 211 moves to the position corresponding to the partition 2222, the plurality of roller structures 223 roll on the conveyor plate 211. The partition 2222 is used to be provided between the carrier plate 212 and the bottom of the cleaning robot 300.

[0061] The conveyor plate 211 moves along the first direction to the roller structure 223, and the roller moves to the conveyor plate 211. The side plate structure 221 extends between the carrier plate 212 and the bottom of the cleaning robot 300 to support one end of the cleaning robot 300 on the side plate structure 221. The cleaning robot 300 exerts downward pressure on the partition 2222. At this time, the elastic reset member is in a stretched state, and the partition 2222 elastically lifts the cleaning robot 300. At this time, the cleaning robot 300 is in a flat state relative to the conveyor plate 211, and the material transfer structure grabs the cleaning robot 300. After the cleaning robot 300 is moved away, the conveying structure moves away, and the partition structure 222 is reset under the action of the elastic reset member.

[0062] When the cleaning robots 300 are placed on the carrier plate, not every cleaning robot 300 is placed perfectly flat. The angle and slope of the cleaning robots may be different, and there may be a very small gap between the cleaning robot and the carrier plate, which means that the cleaning robot is not placed flat. In this case, the moving structure cannot grasp the cleaning robot. In addition, there may be certain processing errors in the carrier plate.

[0063] The present invention uses rollers mounted on the conveyor plate 211, and a side plate structure 221 extending between the carrier plate 212 and the bottom of the cleaning robot 300 to elastically lift one side of the cleaning robot 300. In this way, the cleaning robot 300 is flat relative to the conveyor plate 211, and the problem of the cleaning robot 300 not being able to be placed flat due to the processing error of the carrier plate 212 can also be eliminated.

[0064] Specifically, the partition 2222 has a support portion near the carrier plate 212 and for being supported between the carrier plate 212 and the bottom of the cleaning robot 300. The support portion has a support surface 222a facing the cleaning robot 300, and the support surface 222a is inclined downward.

[0065] The side plate structure 221 includes a side plate seat 2211 and a side plate 2212 mounted on the side plate seat 2211; the partition seat structure 2221 includes a first connecting plate 2221a and a second connecting plate 2221b mounted on the first connecting plate 2221a. The first connecting plate 2221a and the side plate 2212 are arranged facing each other and can slide in the up and down direction. The two ends of the elastic reset member are respectively connected to the ends of the first connecting plate 2221a and the side plate 2212. The partition 2222 is mounted on the second connecting plate 2221b.

[0066] In this embodiment, the elastic reset member includes at least two tension springs, which are respectively disposed at both ends of the first connecting plate 2221a and the side plate 2212. The side plate 2212 has a first connecting post 22121 for connecting one end of the tension spring; the first connecting plate 2221a has a second connecting post 2221a1 for connecting the other end of the tension spring. Preferably, the number of tension springs is two.

[0067] In addition, the conveying structure 200 includes a pressing structure 7, which includes a third driving structure 71 and a pressing seat structure 72. The pressing seat structure 72 is rotatably mounted on the mounting base 1. The pressing seat structure 72 includes a connecting arm 721 and a pressure plate 722. The pressure plate 722 is fixedly connected to the connecting arm 721 and is fixed to the mounting base 1 at the connection point by a hinge. The third driving structure 71 is drivenly connected to the connecting arm 721.

[0068] Specifically, the pressure plate 722 has a pressing end, which has a pressing position for pressing with the cleaning robot 300 and a separating position for releasing from the cleaning robot 300 during its rotational stroke. The third drive structure 71 drives the connecting arm 721 to rotate, thereby causing the pressing end to rotate from the separating position to the pressing position, so as to press the cleaning robot 300. In this embodiment, the third drive structure 71 is a cylinder.

[0069] Obviously, the embodiments described above are merely some, not all, embodiments of the present invention. Based on the embodiments of the present invention, those skilled in the art can make other variations or modifications without creative effort, and all such variations or modifications should fall within the scope of protection of the present invention.

Claims

1. A testing device for a cleaning robot, characterized in that, include: A conveyor structure for transporting cleaning robots; A testing structure for a cleaning robot includes a mounting base, a first drive structure, a circuit board, a guide structure, and a test probe structure. The mounting base has a testing station for placing the cleaning robot. The first drive structure is located on the mounting base. One end of the circuit board is electrically connected to the cleaning robot. The guide structure is driven to the first drive structure and has a guide surface that is vertically inclined. The test probe structure is vertically movably located on the mounting base and supported on the guide surface. When the first drive structure drives the guide structure to move, the guide surface guides the test probe structure to move vertically. The test probe structure has a travel distance from its initial position to an abutment position that abuts against and is electrically connected to the other end of the circuit board. The height of the test probe structure does not exceed that of the circuit board. A material transfer structure is used to move a cleaning robot from the conveying structure to the test station of the test structure. A conveying structure, comprising a conveyor plate and a carrier plate disposed on the conveyor plate, the carrier plate being used to carry a cleaning robot, the conveyor plate being movably disposed along a first direction; and... The adjustment structure includes a side plate structure, a partition structure, an elastic reset member, and multiple roller structures. The partition structure includes a partition seat structure that can slide vertically with the side plate structure, and a partition. The partition is located on the side opposite to the side plate structure and extends laterally. The two ends of the elastic reset member are respectively disposed on the side plate structure and the partition seat structure and are spaced apart vertically. The multiple roller structures are disposed at the bottom of the partition seat structure along a first direction. When the conveyor plate moves to the position corresponding to the partition, the multiple roller structures roll on the conveyor plate, and the partition is used to be disposed between the carrier plate and the bottom of the cleaning robot.

2. The testing equipment for the cleaning robot as described in claim 1, characterized in that, The first driving structure is a linear driving structure, and the test pin structure, the guide structure, and the first driving structure are arranged sequentially along the linear driving direction of the first driving structure; The guide surface is inclined along the linear driving direction of the first driving structure and toward the other end of the circuit board.

3. The testing equipment for the cleaning robot as described in claim 2, characterized in that, Also includes: The abutment structure can be selectively abutted against the other end of the circuit board on the side opposite to the test probe structure in the vertical direction, and the height of the abutment structure is designed to be lower than the height of the top of the cleaning robot; When the test probe structure is in the contact position, the contact structure and the test probe structure respectively contact the two sides of the circuit board.

4. The testing equipment for the cleaning robot as described in claim 3, characterized in that, The abutment structure includes: a mounting bracket disposed on the mounting base; A rotating column, one end of which is rotatably mounted on the mounting bracket and extends in the vertical direction; An abutment plate, mounted at the other end of the rotating column, has a first position abutting against the other end of the circuit board and a second position releasing from contact with the circuit board; and... The second driving structure is connected to the rotating column drive and is used to drive the rotating column to rotate and drive the abutment plate to move between the first position and the second position.

5. The testing equipment for the cleaning robot as described in claim 4, characterized in that, The first driving structure and the second driving structure are the same driving structure; The rotating column is driven and connected to the first driving structure through a cam linkage structure; the first driving structure drives the guide structure to move and makes the test probe structure bear the highest height of the guide surface, while the guide structure is linked to the rotating column to rotate, so that the test probe structure and the abutment plate abut against the two sides of the other end of the circuit board respectively.

6. The testing equipment for the cleaning robot as described in claim 1, characterized in that, The partition has a support portion near the carrier plate and for bearing between the carrier plate and the bottom of the cleaning robot. The support portion has a support surface facing the cleaning robot and the support surface is inclined downwards.

7. The testing equipment for the cleaning robot as described in claim 1, characterized in that, The side plate structure includes a side plate seat and a side plate mounted on the side plate seat; The partition seat structure includes a first connecting plate and a second connecting plate mounted on the first connecting plate. The first connecting plate is arranged facing the side plate and can slide in the up and down direction. The two ends of the elastic reset member are respectively connected to the ends of the first connecting plate and the side plate. The partition is mounted on the second connecting plate.

8. The testing equipment for the cleaning robot as described in claim 7, characterized in that, The elastic reset member includes at least two tension springs, which are respectively disposed at both ends of the first connecting plate and the side plate.

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