Test station working state detection system, method and device in string test mode

Abstract

The application provides a test station working state detection system, method and device in a serial test mode, and relates to the technical field of integrated circuit testing. The system comprises a manipulator, at least two test boards and at least two test machines, and further comprises a processing module. In a test process, the manipulator transfers a product to be tested to a target position, and then presses the product to a position to be tested in the test board, and sends a test signal to the test machine connected with the test board; the test machine provides power to the product to be tested on the test board connected with the test machine according to the test signal, and turns off the power after the test is completed; the processing module is used for detecting voltage signals in each test board, and judging whether voltage changes of all the voltage signals are consistent according to all the voltage signals obtained; if not, it is determined that there is a test board in a closed state. The application can automatically detect whether a test station has been closed in a serial test mode.

Description

Technical Field

[0001] This invention relates to the field of integrated circuit testing technology, and in particular to a test station working status detection system, method and apparatus in serial testing mode. Background Technology

[0002] Turret Handlers are widely used in the field of integrated circuit testing due to their versatility (simultaneous testing, printing, appearance measurement, and tape taping) and high efficiency, making them the preferred solution for small devices (0603-8*8mm).

[0003] To improve testing efficiency, turret-type robotic arms are equipped with 4 sites (test stations), enabling either parallel or serial testing modes. Parallel testing means each site tests a single product, aiming to maximize testing efficiency. Serial testing means each product must be tested once at each site to complete all parameter testing; this is used when only some functional parameters of a product can be tested at a single site, and is commonly seen in MOSFET / power product testing.

[0004] As shown in Table 1 below, taking two test stations (site 1 and site 2) and a product with 10 test parameters as an example, in parallel testing mode, either site 1 or site 2 can complete the testing of all product parameters in one test. In serial testing mode, site 1 first tests parameters 1-4 of the product. After site 1 completes the testing of parameters 1-4, site 2 continues to test parameters 5-10 of the product. When both site 1 and site 2 have completed the parameter testing, the testing of all parameters of the product is complete.

[0005] Table 1

[0006]

[0007]

[0008] However, in actual factory testing and production, if a site fails to perform well due to equipment issues and cannot be repaired in time, the only option is to shut down that site and continue mass production using the remaining sites. But this only applies to concurrent testing mode, because in concurrent testing mode each site undergoes full parameter testing. If a site is shut down in serial testing mode, the parameters for that site will not be actually tested, resulting in incomplete product functionality testing and the release of defective products. Summary of the Invention

[0009] This invention provides a test station operating status detection system, method, and apparatus in serial testing mode, used to automatically detect whether any test stations are shut down in serial testing mode. The technical solution is as follows:

[0010] In a first aspect, embodiments of the present invention provide a test station working status detection system in serial testing mode, including a robotic arm, at least two test boards and at least two test machines, wherein one test board is connected to one test machine, and a processing module is also included.

[0011] During the test, the robotic arm transfers the product to be tested to the target position, then presses it onto the test position in the test plate, and sends a test signal to the test machine connected to the test plate.

[0012] The testing machine provides power to the product under test on the test board connected to it according to the test signal, and disconnects the power supply after the test is completed;

[0013] The processing module is used to detect the voltage signals in each of the test boards and determine whether the voltage changes of all the obtained voltage signals are consistent; if they are inconsistent, it is determined that there is a test board that is currently in a closed state.

[0014] Optionally, the processing module is further configured to output an alarm signal when it is determined that there is a test board in a closed state.

[0015] Optionally, the processing module includes an XOR gate circuit.

[0016] Optionally, the processing module further includes a delay circuit;

[0017] All voltage signals detected by the processing module are first delayed for a set time by the delay circuit before being transmitted to the XOR gate circuit. The XOR gate circuit is then used to determine whether the voltage changes of all voltage signals after the delay meet the preset conditions.

[0018] Secondly, embodiments of the present invention provide a method for detecting the working status of a test station in a serial testing mode, applied to a processing module in a test station working status detection system. The test station working status detection system further includes a robotic arm, at least two test boards, and at least two testing machines, with one test board corresponding to one testing machine. During testing, the robotic arm transfers the product to be tested to a target position, then presses it onto the test position on the test board, and sends a test signal to the testing machine corresponding to the test board. The testing machine provides power to the product to be tested on the test board connected to it according to the test signal, and disconnects the power supply after the test. The method for detecting the working status of a test station in a serial testing mode includes:

[0019] Detect the voltage signals in each of the test boards;

[0020] Determine whether the voltage changes of all the obtained voltage signals are consistent;

[0021] If there is a discrepancy, determine if there is a test board that is currently in a closed state.

[0022] Optionally, the test station operating status detection method in the serial testing mode further includes:

[0023] An alarm signal is output when it is determined that a test board is currently in a closed state.

[0024] Optionally, the test station operating status detection method in the serial testing mode further includes:

[0025] After detecting a voltage signal, delay it for a set time;

[0026] The step of determining whether the voltage changes of all the obtained voltage signals are consistent includes: determining whether the voltage changes of all the delayed voltage signals meet preset conditions.

[0027] Thirdly, embodiments of the present invention provide a test station working status detection device in serial testing mode, applied to a processing module in a test station working status detection system. The test station working status detection system further includes a robotic arm, at least two test boards, and at least two testing machines, with one test board correspondingly connected to one testing machine. During testing, the robotic arm transfers the product to be tested to a target position, then presses it onto the test position on the test board, and sends a test signal to the testing machine corresponding to the test board. The testing machine provides power to the product to be tested on the test board connected to it according to the test signal, and disconnects the power supply after the test. The processing module includes:

[0028] The detection unit is used to detect the voltage signal in each of the test boards;

[0029] The judgment unit is used to determine whether the voltage changes of all the obtained voltage signals are consistent.

[0030] The determining unit is used to determine that there is a test board that is currently in a closed state when the judging unit determines that the voltage changes of all voltage signals are inconsistent.

[0031] Fourthly, embodiments of the present invention provide an electronic device, including: a transceiver, a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the test station working status detection method in the serial test mode as described in the second aspect.

[0032] Fifthly, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the test station operating status detection method in serial testing mode as described in the second aspect.

[0033] The beneficial effects of the above-mentioned technical solution of the present invention are:

[0034] The test station working status detection system in serial testing mode provided by this invention includes a robotic arm, at least two test boards, and at least two testing machines, with one test board corresponding to one testing machine. Specifically, it also includes a processing module. During testing, the robotic arm transfers the product to be tested to the target position, then presses it onto the test position on the test board, and sends a test signal to the testing machine connected to the test board. The testing machine provides power to the product to be tested on the test board connected to it according to the test signal, and disconnects the power after the test. The processing module detects the voltage signals in each test board and determines whether the voltage changes of all the obtained voltage signals are consistent. If they are inconsistent, it determines that there is a test board currently in a closed state. In this invention, when one or more sites are in a closed state, it can promptly determine that there is a test station in a closed state. Furthermore, in serial testing mode, this invention automatically detects that a test station has been closed, supports automatic alarm triggering and equipment shutdown, and can effectively avoid incomplete test parameter testing due to site closure in serial testing mode. Attached Figure Description

[0035] Figure 1 This is a schematic diagram of the structure of a test station working status detection system in serial testing mode disclosed in an embodiment of the present invention;

[0036] Figure 2 This is a schematic diagram of the structure of a test station working status detection system under another serial testing mode disclosed in an embodiment of the present invention;

[0037] Figure 3 This is a schematic diagram of the structure of a test station working status detection system under another serial testing mode disclosed in an embodiment of the present invention;

[0038] Figure 4 This is a schematic diagram of voltage changes at different test stations under different operating states in an embodiment of the present invention;

[0039] Figure 5 This is a flowchart of a test station working status detection method in serial testing mode disclosed in an embodiment of the present invention;

[0040] Figure 6This is a schematic diagram of the structure of a test station working status detection device in serial testing mode disclosed in an embodiment of the present invention;

[0041] Figure 7 This is a schematic diagram of the structure of an electronic device disclosed in an embodiment of the present invention.

[0042] B1 Feeding

[0043] B2 Vision 1(0rientation lnspection+Checker)

[0044] B3 Polarity Test

[0045] B4 Rotary 1

[0046] B5 Test 1

[0047] B6 Test 2

[0048] B7 Test 3

[0049] B8 Test 4

[0050] B9 Tribin 1 (Bin 12 3)

[0051] B10 Bin 4

[0052] B11 Minitable (4Pos)

[0053] B12 Bin 5

[0054] B13 Rotary 2

[0055] B14 Vision 3 (5S Inspection)

[0056] B15 Bin 6

[0057] B16---

[0058] B17 Checker 2

[0059] B18 Taping

[0060] B19 Purge Bin

[0061] B20---

[0062] T1 Transfer to / from transfer

[0063] T2---

[0064] T3 Laser Mark (Optional)

[0065] T4 Vision 2 (Mark Inspection) Detailed Implementation

[0066] To make the technical problems, technical solutions, and advantages of this invention clearer, a detailed description will be provided below in conjunction with the accompanying drawings and specific embodiments. In the following description, specific details such as particular configurations and components are provided merely to aid in a comprehensive understanding of the embodiments of this invention. Therefore, those skilled in the art should understand that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of this invention. Furthermore, for clarity and brevity, descriptions of known functions and structures have been omitted.

[0067] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the invention. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments.

[0068] In various embodiments of the present invention, it should be understood that the sequence number of each process described below does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0069] To address the problem in existing serial testing modes where a site (test station) is shut down, resulting in incomplete product functionality testing and the release of defective products due to the lack of actual testing of parameters at that site, this invention proposes a test station operational status detection system in serial testing mode. This system can quickly detect when a site is shut down in serial testing mode, allowing for timely intervention, such as automatically triggering an alarm and proactively stopping equipment operation. This effectively prevents defective products from being released due to incomplete functional testing.

[0070] like Figure 1 As shown, the test station working status detection system in serial testing mode provided by the embodiment of the present invention includes a robotic arm 10, at least two test boards 20 and at least two test machines 30, wherein one test board 20 is connected to one test machine 30, and the embodiment of the present invention also includes a processing module 40;

[0071] During the test, the robotic arm 10 transfers the product to be tested to the target position, then presses it onto the test position in the test plate 20, and sends a test signal to the test machine 30 connected to the test plate 20.

[0072] The test machine 30 provides power to the product under test on the test board 20 connected to it according to the test signal, and disconnects the power supply after the test is completed;

[0073] The processing module 40 is used to detect the voltage signals in each of the test boards 20, and determine whether the voltage changes of all the obtained voltage signals are consistent; if they are inconsistent, it is determined that there is a test board that is currently in a closed state.

[0074] In a preferred embodiment of the present invention, when the processing module 40 determines that there is a test board in a closed state, it can output an alarm signal to trigger the alarm device to remind the staff that a test station is currently closed. It can also set the device stop function, and when the processing module 40 determines that there is a test board in a closed state, it triggers the device stop function to control the device to stop running.

[0075] Further with Figure 2 For example, robot 10 is specifically a turret robot. Assume there are two test stations, corresponding to test board 21 and test board 22. Further assume that test board 21 is used to test parameters 1-4 of the product, and test board 22 is used to test parameters 5-10 of the product.

[0076] After the equipment starts operating, the turret robot will pick up the first product to be tested (let's call it 'a') and rotate it from position B1 to position B5 (the target position). It will then press product a into the socket (the position to be tested) on test board 21. Simultaneously, the turret robot will send a test signal to the testing machine 31 connected to test board 21. Upon receiving the test signal, testing machine 31 will supply power (such as VCC / VDD, typically 5V / 12V) to product a on test board 21 and begin testing parameters 1-4 of product a. After the test, it will disconnect the power supply.

[0077] When the power is turned off by the testing machine 31, it sends a notification message to the turret robot. Upon receiving the notification message, the turret robot picks up the product under test (a) again, rotates it from position B5 to position B6, and presses it into the socket on the test board 22. Simultaneously, the turret robot sends a test signal to the testing machine 32 connected to the test board 22. Upon receiving the test signal, the testing machine 32 supplies power (such as VCC / VDD, typically 5V / 12V) to the product under test (a) on the test board 22 and begins testing parameters 5-10 of the product under test (a). After the test is completed, it disconnects the power supply.

[0078] Thus, after the product to be tested, a, has been tested through test board 21 and test board 22 in sequence, all parameters of the product to be tested have been tested.

[0079] While the turret robot picks up product 'a' and moves it from position B5 to position B6, it also picks up a second product 'b' (let's call it 'b') and moves it from position B1 to position B5, pressing product 'b' into the socket of test board 21. Simultaneously, the turret robot sends a test signal to the test machine 31 connected to test board 21. Upon receiving the test signal, test machine 31 supplies power (e.g., VCC / VDD, typically 5V / 12V) to product 'b' on test board 21 and begins testing parameters 1-4 of product 'b'. After the test, it disconnects the power supply. Furthermore, driven by the turret robot, product 'b' is moved to the socket of test board 22, where test machine 32 tests parameters 5-10 of product 'b'.

[0080] This process is repeated, and the turret robot will sequentially send all the products to be tested to positions B5 and B6, and use test plates 21 and 22 to complete the testing of all parameters of the products to be tested.

[0081] During this test, the processing module 40 acquires and monitors the voltage signals in each test board 20 in real time. Figure 2 Taking the two test sites shown below as an example, and referring to Table 2, if the VCC / VDD voltage signal of one site does not change while the VCC / VDD voltage signal of the other site changes, it is determined that an anomaly has occurred, and it is confirmed that there is a test board in the off state. This allows for further options such as triggering an alarm or actively stopping the equipment.

[0082] Table 2

[0083]

[0084] The test station working status detection system in serial testing mode provided in this embodiment of the invention includes a robotic arm 10, at least two test boards 20, and at least two testing machines 30, with one test board 20 corresponding to one testing machine 30. Specifically, it also includes a processing module 40. During testing, the robotic arm 10 transfers the product to be tested to the target position, then presses it onto the test position in the test board 20, and sends a test signal to the testing machine 30 connected to the test board 20. The testing machine 30 provides power to the product to be tested on the test board 20 connected to it according to the test signal, and disconnects the power after the test. The processing module 40 is used to detect the voltage signals in each of the test boards 20, and determines whether the voltage changes of all the obtained voltage signals are consistent. If they are inconsistent, it is determined that there is a test board currently in a closed state. In this embodiment of the invention, when one or more sites are in a closed state, it can promptly determine that there is a test station currently in a closed state. Furthermore, in the serial testing mode, this embodiment of the invention automatically detects that a test station has been shut down, supports automatically triggering an alarm and stopping the equipment, which can effectively avoid the situation where test parameters are incomplete due to the shutdown of a site in the serial testing mode.

[0085] The processing module 40 in this embodiment of the invention can be specifically an XOR gate circuit.

[0086] In practical applications, if the current test station fails, subsequent test stations will not test the product. In this case, other test stations will not load VCC / VDD signals and will not synchronize with other sites. (Continuing with...) Figure 2 For example, if the test board 21 detects abnormal product parameters during product testing, the test machine 31 will notify the turret robot of this abnormality. In some configurations, after the turret robot detects the abnormal product parameters and transfers the product to the test board 22, it will not notify the test machine 32 to test its parameters. That is, the test board 22 will not be energized. In this case, the voltage signal detected by the processing module 40 of the test board 22 is inconsistent with the voltage signal of the test board 22 when it is in the testing state. Although the test board 22 is in the testing state, it will still be mistakenly regarded as being in the off state, thus causing a false alarm.

[0087] To improve the accuracy of detection and judgment and reduce the probability of false alarms, such as Figure 3 As shown in the embodiment of the present invention, the processing module 40 further includes a delay circuit 41;

[0088] All voltage signals detected by the processing module 40 are first delayed for a set time by the delay circuit 41 before being transmitted to the XOR gate circuit 42. The XOR gate circuit 42 is then used to determine whether the voltage changes of all voltage signals after the delay meet the preset conditions.

[0089] The delay time of the delay circuit 41 can be set to n times the working cycle of the test parameters of the testing machine, or n times the working cycle of the turret manipulator. n is a positive integer greater than 1. The delay circuit 41 can specifically be a 555RC delay circuit.

[0090] The preset condition can be: within a set time period, the voltage changes of all voltage signals are consistent within at least one working cycle. If the XOR gate circuit 42 determines that the voltage changes of all voltage signals are consistent within at least one working cycle within the set time period, it indicates that all test stations are currently in the testing state. However, if the voltage changes of all voltage signals are not consistent within any working cycle within the set time period, it indicates that some test stations are currently in the off state. (Specific details can be combined with...) Figure 4 As shown.

[0091] The present invention can effectively improve the accuracy of detection and judgment and reduce the probability of false alarms by adding a delay circuit 41. In actual use, the delay parameters of the device can also be adjusted appropriately according to the test time of the product.

[0092] Furthermore, this embodiment of the invention also provides a method for detecting the working status of a test station in a serial testing mode, applied to the processing module of a test station working status detection system. The test station working status detection system further includes a robotic arm, at least two test boards, and at least two testing machines, with one test board corresponding to one testing machine. During testing, the robotic arm transfers the product to be tested to a target position, then presses it onto the test position on the test board, and sends a test signal to the testing machine corresponding to the test board. The testing machine, based on the test signal, provides power to the product to be tested on the test board connected to it, and disconnects the power supply after the test is completed. Figure 5 As shown, the test station working status detection method in the serial testing mode includes:

[0093] Step 101: Detect the voltage signal in each of the test boards;

[0094] Step 102: Determine whether the voltage changes of all the obtained voltage signals are consistent. If they are consistent, return to step 101. If they are inconsistent, proceed to step 103.

[0095] Step 103: Determine if there are test boards that are currently in a closed state.

[0096] In a preferred embodiment of the present invention, when it is determined in step 103 that there is a test board in a closed state, the method may further include: outputting an alarm signal.

[0097] In this embodiment of the invention, the processing module monitors the voltage signals in each test board in real time. When it is determined that the voltage changes of one or more voltage signals are inconsistent, it identifies that there is a test board that is currently in a closed state. This allows for the option to trigger an alarm and stop the device, effectively avoiding incomplete test parameter testing due to site shutdown in serial testing mode.

[0098] More preferably, in Figure 5 The method shown in the embodiment of the present invention for detecting the working status of a test station in series test mode may further include: delaying the voltage signal for a set time after it is detected.

[0099] The set time can be n times the working cycle of the testing machine's test parameters, or n times the working cycle of the turret manipulator. n is a positive integer greater than 1.

[0100] At this point, step 102 specifically involves: determining whether the voltage changes of all voltage signals after the delay meet the preset conditions based on all the delayed voltage signals.

[0101] The preset conditions could be, for example, that all voltage signals exhibit consistent voltage changes within at least one working cycle over a set time period. If it is determined that all voltage signals exhibit consistent voltage changes within at least one working cycle over the set time period, it indicates that all test stations are currently in testing mode. However, if no voltage signals exhibit consistent voltage changes within any working cycle over the set time period, it indicates that some test stations are currently in a closed state. Specific details can be combined with... Figure 4 As shown.

[0102] It should be noted that the test station working status detection method in this serial testing mode corresponds to the test station working status detection system in the serial testing mode in the aforementioned embodiments. All implementation means in the aforementioned system embodiments are applicable to the embodiments of this method and can achieve the same technical effect.

[0103] Based on the test station working status detection method in serial testing mode provided in the foregoing embodiments of the present invention, the present invention also provides a test station working status detection device in serial testing mode, applied to the processing module of a test station working status detection system. The test station working status detection system further includes a robotic arm, at least two test boards, and at least two testing machines, with one test board corresponding to one testing machine. During testing, the robotic arm transfers the product to be tested to a target position, then presses it onto the test position on the test board, and sends a test signal to the testing machine corresponding to the test board. The testing machine provides power to the product to be tested on the test board connected to it according to the test signal, and disconnects the power supply after the test is completed. Figure 6As shown, the processing module includes:

[0104] Detection unit 01 is used to detect the voltage signal in each of the test boards;

[0105] Judgment unit 02 is used to determine whether the voltage changes of all the obtained voltage signals are consistent;

[0106] The determination unit 03 is used to determine that there is a test board that is currently in a closed state when the judgment unit 02 determines that the voltage changes of all voltage signals are inconsistent.

[0107] More preferably, the processing module may further include:

[0108] The output unit is used to output an alarm signal when the determination unit 03 determines that there is a test board in the current off state.

[0109] The alarm signal can be output to an external alarm device so that the external alarm device can execute an alarm warning based on the alarm signal.

[0110] The processing module may also include:

[0111] An alarm unit is used to issue an alarm reminder when the determining unit 03 determines that there is a test board in a closed state.

[0112] In this embodiment of the invention, an alarm unit can also be designed inside the processing module to automatically trigger an alarm when it is determined that a closed test board exists.

[0113] More preferably, the processing module may further include:

[0114] The delay unit is used to delay the voltage signals in each of the test boards detected by the detection unit 01 for a set time. The set time can be n times the working cycle of the test machine's test parameters, or n times the working cycle of the turret manipulator. n is a positive integer greater than 1.

[0115] At this time, the judgment unit 02 is specifically used to judge whether the voltage changes of all voltage signals after the delay meet the preset conditions.

[0116] Preset conditions could be, for example, that all voltage signals exhibit consistent voltage changes within at least one working cycle over a set time period. If it is determined that all voltage signals exhibit consistent voltage changes within at least one working cycle over the set time period, it indicates that all test stations are currently in testing mode. However, if no voltage signals exhibit consistent voltage changes within any working cycle over the set time period, it indicates that some test stations are currently in a closed state. Specific details can be combined with... Figure 4 As shown.

[0117] The processing module provided in this embodiment of the invention can monitor abnormal situations such as site closure in real time. It has simple logic, is easy to implement, and is convenient to use.

[0118] like Figure 7 As shown, embodiments of the present invention also provide an electronic device, including:

[0119] The processor 1000; and the memory 1020 connected to the processor 1000 via a bus interface, the memory 1020 being used to store programs and data used by the processor 1000 during operation, and the processor 1000 calling and executing the programs and data stored in the memory 1020.

[0120] The transceiver 1010 is connected to a bus interface and is used to receive and send data under the control of the processor 1000; the processor 1000 reads the program in the memory 1020 to implement the following steps:

[0121] Detect the voltage signals in each of the test boards;

[0122] Determine whether the voltage changes of all the obtained voltage signals are consistent;

[0123] If there is a discrepancy, determine if there is a test board that is currently in a closed state.

[0124] Optionally, an alarm signal is output when it is determined that a test board is currently in a closed state.

[0125] Optionally, after detecting a voltage signal, it is delayed for a set time;

[0126] The step of determining whether the voltage changes of all the obtained voltage signals are consistent includes: determining whether the voltage changes of all the delayed voltage signals meet preset conditions.

[0127] Among them, Figure 7In this context, the bus architecture can include any number of interconnected buses and bridges, specifically linking various circuits together, represented by one or more processors (processor 1000) and memory (memory 1020). The bus architecture can also link various other circuits, such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein. The bus interface provides an interface. The transceiver 1010 can be multiple components, including transmitters and transceivers, providing a unit for communicating with various other devices over a transmission medium. For different terminals, the user interface 1030 can also be an interface capable of connecting external or internal devices, including but not limited to keypads, displays, speakers, microphones, joysticks, etc. The processor 1000 is responsible for managing the bus architecture and general processing, and the memory 1020 can store data used by the processor 1000 during operation.

[0128] Those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware or by a computer program instructing the relevant hardware to implement them. The computer program includes instructions to perform some or all of the steps of the above methods; and the computer program can be stored in a readable storage medium, which can be any form of storage medium.

[0129] In addition, embodiments of the present invention also provide a computer-readable storage medium storing a computer program thereon. When the program is executed by a processor, it implements the steps of the method in the above embodiments and achieves the same technical effect. To avoid repetition, it will not be described again here.

[0130] The above description represents the preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A test station working status detection system in serial testing mode, comprising a robotic arm, at least two test boards, and at least two test machines, wherein one test board is connected to one test machine, characterized in that, It also includes a processing module; During the test, the robotic arm transfers the product to be tested to the target position, then presses it onto the test position in the test plate, and sends a test signal to the test machine connected to the test plate. The testing machine provides power to the product under test on the test board connected to it according to the test signal, and disconnects the power supply after the test is completed; The processing module is used to detect the voltage signals in each of the test boards, and determine whether the voltage changes of all the obtained voltage signals are consistent; if they are inconsistent, it is determined that there is a test board that is currently in a closed state. The processing module includes an XOR gate circuit and a delay circuit; All voltage signals detected by the processing module are first delayed for a set time by the delay circuit before being transmitted to the XOR gate circuit. The XOR gate circuit is then used to determine whether the voltage changes of all voltage signals after the delay meet the preset conditions.

2. The test station working status detection system in serial testing mode according to claim 1, characterized in that, The processing module is also used to output an alarm signal when it is determined that there is a test board in a closed state.

3. A method for detecting the working status of a test station in a serial testing mode, characterized in that, The processing module is applied to a testing station working status detection system. The testing station working status detection system also includes a robotic arm, at least two test boards, and at least two testing machines. Each test board is connected to a corresponding testing machine. During the testing process, the robotic arm transfers the product to be tested to the target position, then presses it onto the test position on the test board, and sends a test signal to the testing machine connected to the test board. The testing machine provides power to the product to be tested on the test board connected to it according to the test signal, and disconnects the power after the test is completed. The method for detecting the working status of the test station under the serial testing mode includes: Detect the voltage signals in each of the test boards; Determine whether the voltage changes of all the obtained voltage signals are consistent; If there is a discrepancy, confirm that there is a test board that is currently in a closed state; The test station working status detection method under the serial testing mode also includes: After detecting a voltage signal, delay it for a set time; The step of determining whether the voltage changes of all the obtained voltage signals are consistent includes: determining whether the voltage changes of all the delayed voltage signals meet preset conditions.

4. The method for detecting the working status of a test station in serial testing mode according to claim 3, characterized in that, The test station working status detection method under the serial testing mode also includes: An alarm signal is output when it is determined that a test board is currently in a closed state.

5. A device for detecting the working status of a test station in a series test mode, characterized in that, A processing module is applied to a test station working status detection system. The test station working status detection system employs the serial testing mode described in claim 1 or 2. The system further includes a robotic arm, at least two test boards, and at least two testing machines, with one test board corresponding to one testing machine. During testing, the robotic arm transfers the product to be tested to a target position, presses it onto the test position on the test board, and sends a test signal to the testing machine corresponding to the test board. The testing machine provides power to the product to be tested on the test board connected to it based on the test signal and disconnects the power supply after testing. The processing module includes: The detection unit is used to detect the voltage signal in each of the test boards; The judgment unit is used to determine whether the voltage changes of all the obtained voltage signals are consistent. The determining unit is used to determine that there is a test board that is currently in a closed state when the judging unit determines that the voltage changes of all voltage signals are inconsistent.

6. An electronic device, comprising: A transceiver, a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, when the processor executes the computer program, it implements the steps of the test station working status detection method in the serial test mode as described in any one of claims 3 or 4.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by a processor, the computer program implements the steps of the test station working status detection method in the serial testing mode as described in any one of claims 3 or 4.

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