A photovoltaic fault diagnosis method and system based on iv curve data

Abstract

The application relates to the technical field of photovoltaic power generation, in particular to a photovoltaic fault diagnosis method and system based on IV curve data, which comprises the following steps: S1. collecting open circuit voltage DY data, short circuit current DL data and fill factor TY data in a cell panel; S2. processing the open circuit voltage DY, the short circuit current DL and the fill factor TY to respectively generate an average value PDY of the open circuit voltage, an average value PDL of the short circuit current and an average value PTY of the fill factor in the cell panel, and calculating a change rate B of the open circuit voltage, a change rate B of the short circuit current and a change rate B of the fill factor in the cell panel. DY DL TY The application improves the accuracy of photovoltaic panel fault diagnosis by collecting the short circuit current DL and referring to the two key influencing factors of the open circuit voltage DY and the fill factor TY, realizes the effect of multi-dimensional diagnosis of cell panel faults, and avoids the problem of increasing potential risks due to the failure to discover cell panel faults in time.​​

Description

Technical Field

[0001] This invention relates to the field of photovoltaic power generation technology, specifically to a photovoltaic fault diagnosis method and system based on IV curve data. Background Technology

[0002] A photovoltaic (PV) system is a system that uses solar photovoltaic cells to convert solar radiation into electrical energy. These systems are also known as solar cell systems or photovoltaic cell systems. PV systems are an environmentally friendly and sustainable way of generating electricity and are being widely adopted to meet energy demands and reduce dependence on fossil fuels. PV fault diagnosis is a process used to detect and identify problems and faults in solar photovoltaic systems.

[0003] An existing technology discloses an automatic fault detection method for solar panels (application publication number CN113283580A). This method uses the changing trend of current data collected during the operation of photovoltaic modules as the basis for fault classification. It trains a pre-built ST-TCN deep learning fault diagnosis model, repeatedly trains the model until it reaches its optimal state, and saves the trained model. This invention uses current data collected by the power plant to monitor the physical location and fault level of solar photovoltaic modules. It can be directly put into use in actual power plants without adding extra equipment, reducing the operation and maintenance costs of power plants. This invention uses a pre-trained deep learning fault diagnosis model, which has high diagnostic and detection efficiency and is superior to existing deep learning fault diagnosis models.

[0004] However, the following shortcomings still exist: As stated above, photovoltaic panel failures are not only related to the current data during operation, but also to the open-circuit voltage and fill factor. If only the current during photovoltaic panel operation is detected, it is difficult to detect the problem of reduced open-circuit voltage and fill factor in a timely manner. However, the decrease in open-circuit voltage and fill factor can also prove that the photovoltaic panel is faulty. Therefore, it is necessary to comprehensively consider the changes in key influencing parameters such as open-circuit voltage, short-circuit current, and fill factor for photovoltaic panel fault diagnosis. However, the existing technology does not use the two key influencing factors of open-circuit voltage and fill factor, which makes the fault diagnosis of photovoltaic panels somewhat inaccurate. Summary of the Invention

[0005] In view of this, the purpose of this invention is to propose a photovoltaic fault diagnosis method and system based on IV curve data to solve the problems existing in the prior art.

[0006] To achieve the above objectives, the present invention provides a photovoltaic fault diagnosis method based on IV curve data, comprising:

[0007] S1. Collect open-circuit voltage DY data, short-circuit current DL data, and fill factor TY data from the solar panel N times;

[0008] S2. Process the N collected open-circuit voltage DY, short-circuit current DL, and fill factor TY to generate the average open-circuit voltage PDY, the average short-circuit current PDL, and the average fill factor PTY in the solar panel, and calculate the rate of change B of the open-circuit voltage in the solar panel. DY and the rate of change of short-circuit current B DL and the rate of change of the fill factor B TY ;

[0009] S3. Calculate the average value PDY of the open-circuit voltage in the solar panel and the rate of change B of the open-circuit voltage in the solar panel. DY Perform dimensionless processing, and convert PDY and B... DY Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY This is used to compare the average short-circuit current PDL in the solar panel with the rate of change B of the short-circuit current in the solar panel. DL Perform dimensionless processing to convert PDL and B DL Correlated, the predicted value YC of the solar panel short-circuit current is generated. DL This is used to compare the average fill factor PTY and the rate of change B of the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY ;

[0010] S4. The predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison, this helps determine whether the solar panel has malfunctioned.

[0011] Furthermore, the open-circuit voltage DY, short-circuit current DL, and fill factor TY from the N data collections of the solar panel are processed, where N is an integer greater than 1, and the resulting sets are as follows:

[0012] DY = [DY1, DY2...DY] i ...DY N ]

[0013] DL = [DL1, DL2...DL] i ...DL N ]

[0014] TY = [TY1, TY2...TY] i ...TY N ]

[0015] Among them, DY i Let DL be the amplitude of the open-circuit voltage in the i-th solar panel. i TY represents the short-circuit current in the i-th solar panel. i is the fill factor in the i-th solar panel.

[0016] The average open-circuit voltage in the Nth solar panel is denoted as PDY, the average short-circuit current in the Nth solar panel is denoted as PDL, and the average fill factor in the Nth solar panel is denoted as PTY. These values ​​are derived using the following formula:

[0017]

[0018]

[0019]

[0020] Furthermore, the open-circuit voltage in the solar panel is analyzed further, and the rate of change B of the open-circuit voltage in the solar panel over N consecutive cycles is calculated. DY Further analysis of the short-circuit current in the solar panel was conducted, and the rate of change B of the short-circuit current in the solar panel for N consecutive cycles was calculated. DL Further analysis of the fill factor in the solar panel was conducted, and the rate of change B of the fill factor in the solar panel over N consecutive cycles was calculated. TY The calculation formula is as follows:

[0021]

[0022]

[0023]

[0024] Where N is a positive integer greater than 1, DY N DY1 represents the Nth open-circuit voltage value of the solar panel, and DY2 represents the first open-circuit voltage value of the solar panel. N DL1 represents the Nth short-circuit current value of the solar panel, DL2 represents the 1st short-circuit current value of the solar panel, and TY represents the 1st short-circuit current value. N TY1 is the Nth fill factor value of the solar panel, and TY2 is the first fill factor value of the solar panel.

[0025] Furthermore, the average value of the open-circuit voltage in the solar panel... and the rate of change of open-circuit voltage in the solar panel B DY Perform dimensionless processing, and convert PDY and B... DYCorrelatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY The average short-circuit current PDL in the solar panel and the rate of change B of the short-circuit current in the solar panel are calculated. DL Perform dimensionless processing to convert PDL and B DL Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DL The average fill factor PTY and the rate of change B of the fill factor in the solar panel are used to calculate the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY The formula used is as follows:

[0026]

[0027]

[0028]

[0029] Furthermore, the predicted value YC of the open-circuit voltage of the solar panel... DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison.

[0030] Furthermore, when YC DY ≤YZ DY YC DL ≤YZ DL YC TY ≤YZ TY If any of the conditions are met, an alarm will be triggered indicating that the solar panel has malfunctioned.

[0031] A photovoltaic fault diagnosis system based on IV curve data, used to execute the photovoltaic fault diagnosis method according to any one of claims 1-6, comprising:

[0032] The IV curve data acquisition module is used to acquire open-circuit voltage DY data, short-circuit current DL data, and fill factor TY data in the Nth solar panel.

[0033] The data processing module is used to process the open-circuit voltage DY, short-circuit current DL, and fill factor TY collected N times to generate the average value of the open-circuit voltage PDY, the average value of the short-circuit current PDL, and the average value of the fill factor PTY in the solar panel, and to calculate the rate of change B of the open-circuit voltage in the solar panel. DY and the rate of change of short-circuit current B DL and the rate of change of the fill factor B TY ;

[0034] The data analysis module is used to analyze the average value PDY of the open-circuit voltage in the solar panel and the rate of change B of the open-circuit voltage in the solar panel. DY Perform dimensionless processing, and convert PDY and B... DY Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY This is used to compare the average short-circuit current PDL in the solar panel with the rate of change B of the short-circuit current in the solar panel. DL Perform dimensionless processing to convert PDL and B DL Correlated, the predicted value YC of the solar panel short-circuit current is generated. DL This is used to compare the average fill factor PTY and the rate of change B of the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY ;

[0035] The early warning module is used to generate the predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison, this helps determine whether the solar panel has malfunctioned.

[0036] Furthermore, the IV curve data acquisition module consists of an integrated sensor installed on the back of the solar panel. The integrated sensor includes an oscilloscope for acquiring the open-circuit voltage DY in the solar panel, a multimeter for acquiring the short-circuit current DL in the solar panel, and a sunlight simulator for acquiring the fill factor TY in the solar panel.

[0037] The beneficial effects of this invention are:

[0038] Using the open-circuit voltage (DY) data, short-circuit current (DL) data, and fill factor (TY) data from the solar panel, the predicted value of the open-circuit voltage (YC) of the solar panel is generated. DYGenerate the predicted value YC of the short-circuit current of the solar panel. DL Generate the predicted value YC of the solar panel fill factor. TY And the predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY The predicted short-circuit current YC of the solar panel DL and the preset short-circuit current threshold YZ DL The predicted value of the fill factor YC of the solar panel. TY And the preset fill factor threshold YZ TY By comparing the data one by one, in addition to collecting the short-circuit current DL, the accuracy of photovoltaic panel fault diagnosis was improved by incorporating two key influencing factors: open-circuit voltage DY and fill factor TY. This achieved the effect of multi-dimensional diagnosis of panel faults and avoided the problem of increasing potential risks due to the failure to detect panel faults in a timely manner. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only for this invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0040] Figure 1 This is a flowchart illustrating the process of the method of the present invention;

[0041] Figure 2 This is a schematic diagram of the operation of the module unit of the present invention. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to specific embodiments.

[0043] It should be noted that, unless otherwise defined, the technical or scientific terms used in this invention should have the ordinary meaning understood by one of ordinary skill in the art to which this invention pertains. The terms "first," "second," and similar terms used in this invention do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are used only to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0044] Example 1

[0045] like Figure 1 As shown, the present invention provides a photovoltaic fault diagnosis method based on IV curve data, comprising:

[0046] S1. Collect the open-circuit voltage DY, short-circuit current DL, and fill factor TY of the solar panel N times.

[0047] When a solar panel malfunctions, the open-circuit voltage DY in the solar panel will drop. The specific reasons are as follows:

[0048] Localized hotspots: Localized hotspots refer to areas on the solar panel that overheat due to shading, dust, damage, or other reasons. Overheating can damage the solar cells, and the open-circuit voltage (DY) of the battery may decrease.

[0049] Cell damage: If the cells of the solar panel are physically damaged, such as by impact, cracks or scratches, the efficiency of the cells may decrease, thereby reducing the overall open circuit voltage DY.

[0050] Broken connection wires: If the connection wires on the solar panel are broken or loose, the current may not be transmitted effectively, thereby reducing the open circuit voltage DY.

[0051] Dust and dirt: Dust, dirt, or deposits on the surface of the solar panel can affect light absorption and conduction, thereby reducing the efficiency of the battery and the open-circuit voltage DY.

[0052] Therefore, it is particularly important to set the oscilloscope to detect the open-circuit voltage DY in the solar panel. If this can be done, the following effects will be achieved:

[0053] Localized Hot Spot Detection: An oscilloscope can be used to detect localized hot spots on a solar panel. When an area on a solar panel overheats due to shadows, dirt, or other reasons, the voltage in that area typically drops. With an oscilloscope, you can monitor the voltage at different locations in real time to quickly detect and pinpoint potential problems.

[0054] Troubleshooting: If a fault occurs in a specific area of ​​the solar panel, such as a broken cell or a broken wire, an oscilloscope can help pinpoint the exact location of the fault. By comparing the voltage at different locations, you can determine if the fault is localized to a specific area, which helps in more precise problem repair.

[0055] Performance Monitoring: By periodically monitoring the open-circuit voltage at different locations, you can assess the performance of the solar panels. Any performance degradation will be reflected on an oscilloscope, helping you determine when maintenance or replacement of the panels is needed.

[0056] Efficiency Optimization: Understanding voltage variations at different locations can help you optimize the layout and positioning of your solar panels to maximize energy harvesting efficiency. By monitoring voltage, you can determine which locations receive more sunlight and which may require adjustments or improvements.

[0057] Preventive maintenance: By monitoring the voltage at various locations on the solar panel in real time, you can perform preventive maintenance, detect problems early, and take measures to reduce maintenance costs and system downtime.

[0058] Similarly, when a solar panel malfunctions, the short-circuit current DL in the solar panel will decrease. The specific reasons are as follows:

[0059] Damaged solar cells: If the solar cells of the solar panel are physically damaged, such as by cracks, scratches or impacts, the current output of the solar cells may decrease, resulting in a drop in short-circuit current.

[0060] Connection issues: Loose, broken, or oxidized wires or connection points on the solar panel may obstruct the flow of current, thus affecting the short-circuit current.

[0061] Battery aging: Over time, the cells in a solar panel may age, potentially reducing their current output capability. This is often a result of battery aging.

[0062] Local shading: When a certain area of ​​a solar panel is partially shaded, the current output in that area may decrease, thus affecting the overall short-circuit current.

[0063] Pollution: The surface of the solar panel may be affected by pollution, dust, asphalt or other contaminants, which may reduce sunlight absorption and lead to a decrease in current.

[0064] Climate and environmental factors: Extreme climate conditions or environmental factors, such as high temperature, low temperature or humidity, may also cause the performance of solar panels to degrade, thereby reducing short-circuit current.

[0065] Therefore, it is particularly important to set the multimeter to detect the short-circuit current DL in the solar panel. If this can be done, the following effects will be achieved:

[0066] Fault detection: A multimeter can be used to detect partial or global short circuits on the solar panel. If the short-circuit current is much lower than expected, this may indicate a fault in the solar panel, such as a damaged cell, a wiring problem, or other circuit failure.

[0067] Performance Monitoring: By periodically measuring the short-circuit current at various points on the solar panel, you can monitor its performance. Any performance degradation will be reflected in the measurements, helping to determine when maintenance or replacement of the panels is needed.

[0068] Efficiency Assessment: Understanding the short-circuit current at different locations can help you assess the efficiency of various parts of the solar panel. This helps identify areas affected by contamination, damage, or shading, allowing you to take appropriate steps to improve efficiency.

[0069] Locating the problem: Using a multimeter to measure the short-circuit current at different locations can help you pinpoint the problem within the solar panel. If the current at one location is significantly lower than at other locations, the problem may be localized to that area, which helps in more precise location and resolution of the issue.

[0070] Preventive maintenance: By monitoring the current at various locations on the solar panel in real time, you can perform preventive maintenance, detect problems early, and take measures to reduce maintenance costs and system downtime.

[0071] Data logging and analysis: Multimeters typically have data logging and analysis functions, allowing you to save measurement data for later analysis. This helps establish historical performance data to track long-term changes and trends in the solar panels.

[0072] Improved reliability: By monitoring the short-circuit current at various locations on the solar panels, you can improve the reliability of your solar system, reduce the risk of failure, and ensure long-term stable operation of the system.

[0073] Similarly, when a solar panel malfunctions, it will cause a decrease in the fill factor TY within the solar panel. The specific reasons are as follows:

[0074] Cell damage: Physical damage to the cells of the solar panel, such as cracks, scratches or impacts, may lead to a decrease in the efficiency of the cells, thereby reducing the fill factor.

[0075] Connection issues: Loose, broken, or oxidized connection wires or connection points on the solar panel may obstruct current flow, thus affecting the fill factor.

[0076] Local shading: When a certain area of ​​a solar panel is partially shaded, it may cause a decrease in the current output of that area, thereby reducing the fill factor.

[0077] Battery aging: The cells in a solar panel may age over time, causing a decrease in battery efficiency, which leads to a reduction in fill factor.

[0078] Pollution: If the surface of the solar panel is affected by pollution, dust, asphalt or other contaminants, it may reduce sunlight absorption, leading to a decrease in cell efficiency and thus a reduction in fill factor.

[0079] Solar panel component failure: Failure of other components on the solar panel, such as diodes, relays, or circuit elements, can also lead to a decrease in the efficiency of the solar panel, thereby reducing the fill factor.

[0080] Therefore, setting the fill factor TY in the solar panel detection using the sunlight simulator is particularly important. If this can be achieved, the following effects will be observed:

[0081] Performance Evaluation: A sunlight simulator can simulate different sunlight conditions in a controlled environment, allowing you to evaluate the performance of solar panels in a laboratory setting. By measuring the fill factor, you can understand how efficient the panels are under different lighting conditions, helping you select the most suitable panel type and design.

[0082] Quality Control: During the production of solar panels, a solar simulator can be used for quality control. By detecting the fill factor, you can ensure that all components of the solar panel are functioning properly, thereby improving product quality.

[0083] Anomaly Detection: If there are problems with the solar panels, such as damaged cells, shading, wiring issues, or other faults, the fill factor may be affected. A solar simulator can help detect these problems early, thus preventing performance degradation in real-world use.

[0084] In summary, collecting open-circuit voltage (DY), short-circuit current (DL), and fill factor (TY) data from the solar panel is extremely important for monitoring whether the solar panel has malfunctioned. The following is a specific implementation method for the data acquisition module in this embodiment to collect open-circuit voltage (DY), short-circuit current (DL), and fill factor (TY) data from the solar panel:

[0085] The open-circuit voltage DY, short-circuit current DL, and fill factor TY from N data collections of the solar panel are processed, where N is an integer greater than 1, to obtain the following set:

[0086] DY = [DY1, DY2...DY] i ...DY N ]

[0087] DL = [DL1, DL2...DL] i ...DL N ]

[0088] TY = [TY1, TY2...TY] i ...TY N ]

[0089] Among them, DY i Let DL be the amplitude of the open-circuit voltage in the i-th solar panel. i TY represents the short-circuit current in the i-th solar panel. i Let be the fill factor in the i-th solar panel;

[0090] S2. The average open-circuit voltage in the Nth solar panel is denoted as PDY, the average short-circuit current in the Nth solar panel is denoted as PDL, and the average fill factor in the Nth solar panel is denoted as PTY. These values ​​are then derived using the following formula:

[0091]

[0092]

[0093]

[0094] Further analysis of the open-circuit voltage in the solar panel is conducted, and the rate of change B of the open-circuit voltage in the solar panel over N consecutive cycles is calculated. DY Further analysis of the short-circuit current in the solar panel was conducted, and the rate of change B of the short-circuit current in the solar panel for N consecutive cycles was calculated. DL Further analysis of the fill factor in the solar panel was conducted, and the rate of change B of the fill factor in the solar panel over N consecutive cycles was calculated. TY The calculation formula is as follows:

[0095]

[0096]

[0097]

[0098] Where N is a positive integer greater than 1, DY N DY1 represents the Nth open-circuit voltage value of the solar panel, and DY2 represents the first open-circuit voltage value of the solar panel. N DL1 represents the Nth short-circuit current value of the solar panel, DL2 represents the 1st short-circuit current value of the solar panel, and TY represents the 1st short-circuit current value. NTY1 is the Nth fill factor value of the solar panel, and TY2 is the first fill factor value of the solar panel.

[0099] S3. Calculate the average value PDY of the open-circuit voltage in the solar panel and the rate of change B of the open-circuit voltage in the solar panel. DY Perform dimensionless processing, and convert PDY and B... DY Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY The average short-circuit current PDL in the solar panel and the rate of change B of the short-circuit current in the solar panel are calculated. DL Perform dimensionless processing to convert PDL and B DL Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DL The average fill factor PTY and the rate of change B of the fill factor in the solar panel are used to calculate the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY The formula used is as follows:

[0100]

[0101]

[0102]

[0103] S4. The predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison.

[0104] When YC DY ≤YZ DY YC DL ≤YZ DL YC TY ≤YZ TY When any condition is met, an alarm will be triggered to indicate that the solar panel has malfunctioned, thus achieving the effect of alerting at the initial stage of solar panel failure and avoiding potential risks due to failure to detect solar panel failure in a timely manner.

[0105] like Figure 2 As shown, a photovoltaic fault diagnosis system based on IV curve data is used to execute the photovoltaic fault diagnosis method according to any one of claims 1-6, comprising:

[0106] The IV curve data acquisition module is used to acquire open-circuit voltage DY data, short-circuit current DL data, and fill factor TY data in the Nth solar panel.

[0107] The data processing module is used to process the open-circuit voltage DY, short-circuit current DL, and fill factor TY collected N times to generate the average value of the open-circuit voltage PDY, the average value of the short-circuit current PDL, and the average value of the fill factor PTY in the solar panel, and to calculate the rate of change B of the open-circuit voltage in the solar panel. DY and the rate of change of short-circuit current B DL and the rate of change of the fill factor B TY ;

[0108] The data analysis module is used to analyze the average value PDY of the open-circuit voltage in the solar panel and the rate of change B of the open-circuit voltage in the solar panel. DY Perform dimensionless processing, and convert PDY and B... DY Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY This is used to compare the average short-circuit current PDL in the solar panel with the rate of change B of the short-circuit current in the solar panel. DL Perform dimensionless processing to convert PDL and B DL Correlated, the predicted value YC of the solar panel short-circuit current is generated. DL This is used to compare the average fill factor PTY and the rate of change B of the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY ;

[0109] The early warning module is used to generate the predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison, this helps determine whether the solar panel has malfunctioned.

[0110] The IV curve data acquisition module consists of an integrated sensor installed on the back of the solar panel. The integrated sensor includes an oscilloscope for acquiring the open-circuit voltage DY in the solar panel, a multimeter for acquiring the short-circuit current DL in the solar panel, and a sunlight simulator for acquiring the fill factor TY in the solar panel.

[0111] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents. The above embodiments can be implemented, in whole or in part, by software, hardware, firmware, or any other combination. When implemented in software, the above embodiments can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer program are loaded or executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center containing one or more sets of available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium. A semiconductor medium can be a solid-state drive (SSD).

[0112] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0113] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0114] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division of a waterway underwater topography change analysis system and method. In actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces, indirect coupling or communication connection between devices or units, and may be electrical, mechanical, or other forms.

[0115] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0116] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0117] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0118] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0119] In conclusion, the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A photovoltaic fault diagnosis method based on IV curve data, characterized in that, include: S1. Collect open-circuit voltage DY data, short-circuit current DL data, and fill factor TY data from the solar panel N times; S2. Process the N collected open-circuit voltage DY, short-circuit current DL, and fill factor TY to generate the average open-circuit voltage PDY, the average short-circuit current PDL, and the average fill factor PTY in the solar panel, and calculate the rate of change B of the open-circuit voltage in the solar panel. DY and the rate of change of short-circuit current B DL and the rate of change of the fill factor B TY ; The open-circuit voltage DY, short-circuit current DL, and fill factor TY from N data collections of the solar panel are processed, where N is an integer greater than 1, to obtain the following set: in, Let be the amplitude of the open-circuit voltage in the i-th solar panel. Let be the short-circuit current in the i-th solar panel; Let be the fill factor in the i-th solar panel; The average value of the open-circuit voltage in the solar panel N times is denoted as The average value of the short-circuit current in the solar panel N times is denoted as The average fill factor in the solar panel N times is denoted as And it can be obtained through the following formula: ； Further analysis of the open-circuit voltage in the solar panel was conducted, and the rate of change of the open-circuit voltage in the solar panel was calculated for N consecutive cycles. Further analysis of the short-circuit current in the solar panel was conducted, and the rate of change of the short-circuit current in the solar panel for N consecutive cycles was calculated. Further analysis of the fill factor in the solar panel was conducted, and the rate of change of the fill factor in the solar panel over N consecutive cycles was calculated. The calculation formula is as follows: *100% *100% *100% Where N is a positive integer greater than 1, This represents the Nth open-circuit voltage value of the solar panel. This is the first open-circuit voltage value of the solar panel. This represents the Nth short-circuit current value of the solar panel. This is the value of the solar panel's first short-circuit current. Let N be the fill factor value of the solar panel. This is the first fill factor value for the solar panel; S3. Calculate the average value PDY of the open-circuit voltage in the solar panel and the rate of change B of the open-circuit voltage in the solar panel. DY Perform dimensionless processing, and convert PDY and B... DY Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY This is used to compare the average short-circuit current PDL in the solar panel with the rate of change B of the short-circuit current in the solar panel. DL Perform dimensionless processing to convert PDL and B DL Correlated, the predicted value YC of the solar panel short-circuit current is generated. DL This is used to compare the average fill factor PTY and the rate of change B of the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY ; S4. The predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison, this helps determine whether the solar panel has malfunctioned.

2. The photovoltaic fault diagnosis method based on IV curve data according to claim 1, characterized in that, The average value of the open-circuit voltage in the solar panel and the rate of change of open-circuit voltage in the solar panel Perform dimensionless processing, and and Correlate this to generate a predicted value for the open-circuit voltage of the solar panel. The average value of the short-circuit current in the solar panel and the rate of change of short-circuit current in the solar panel Perform dimensionless processing, and and Correlate this to generate a predicted value for the open-circuit voltage of the solar panel. The average fill factor in the solar panel and the rate of change of fill factor in solar panels Perform dimensionless processing, and and Correlate and generate predicted values ​​for the solar panel fill factor. The formula used is as follows: * * * 。 3. The photovoltaic fault diagnosis method based on IV curve data according to claim 2, characterized in that, Predicted value of open-circuit voltage of solar panel and the preset open-circuit voltage threshold In comparison, the predicted value of the solar panel short-circuit current... and the preset short-circuit current threshold In comparison, the predicted value of the solar panel fill factor and the preset fill factor threshold In comparison.

4. The photovoltaic fault diagnosis method based on IV curve data according to claim 3, characterized in that, when , , If any of the conditions are met, an alarm will be triggered indicating that the solar panel has malfunctioned.

5. A photovoltaic fault diagnosis system based on IV curve data, characterized in that, The method for performing the photovoltaic fault diagnosis method according to any one of claims 1-4 includes: The IV curve data acquisition module is used to acquire open-circuit voltage DY data, short-circuit current DL data, and fill factor TY data in the Nth solar panel. The data processing module is used to process the open-circuit voltage DY, short-circuit current DL, and fill factor TY collected N times to generate the average value of the open-circuit voltage PDY, the average value of the short-circuit current PDL, and the average value of the fill factor PTY in the solar panel, and to calculate the rate of change B of the open-circuit voltage in the solar panel. DY and the rate of change of short-circuit current B DL and the rate of change of the fill factor B TY ; The data analysis module is used to analyze the average value PDY of the open-circuit voltage in the solar panel and the rate of change B of the open-circuit voltage in the solar panel. DY Perform dimensionless processing, and convert PDY and B... DY Correlatedly, the predicted value YC of the open-circuit voltage of the solar panel is generated. DY This is used to compare the average short-circuit current PDL in the solar panel with the rate of change B of the short-circuit current in the solar panel. DL Perform dimensionless processing to convert PDL and B DL Correlated, the predicted value YC of the solar panel short-circuit current is generated. DL This is used to compare the average fill factor PTY and the rate of change B of the fill factor in the solar panel. TY Perform dimensionless processing, and convert PTY and B... TY Correlate this to generate the predicted value YC of the solar panel fill factor. TY ; The early warning module is used to generate the predicted value YC of the open-circuit voltage of the solar panel. DY and the preset open-circuit voltage threshold YZ DY In comparison, the predicted value YC of the solar panel short-circuit current... DL and the preset short-circuit current threshold YZ DL In comparison, the predicted value of the solar panel fill factor YC TY And the preset fill factor threshold YZ TY In comparison, this helps determine whether the solar panel has malfunctioned.

6. A photovoltaic fault diagnosis system based on IV curve data according to claim 5, characterized in that, The IV curve data acquisition module consists of an integrated sensor installed on the back of the solar panel. The integrated sensor includes an oscilloscope for acquiring the open-circuit voltage DY in the solar panel, a multimeter for acquiring the short-circuit current DL in the solar panel, and a sunlight simulator for acquiring the fill factor TY in the solar panel.

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