A kind of enameled wire particle blocking device and enameled wire quality detection method

CN117760958BActive Publication Date: 2026-10-27GUANGDONG SUNTEK WIRE CO LTD
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Patent Information

Application Number
CN202311776858.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-12-21
Publication Date
2026-10-27
Estimated Expiration
2043-12-21

AI Technical Summary

Technical Problem

[0003]本发明所要解决的技术问题是提供一种漆包线挡粒子装置及漆包线质量检测方法,能够切实地解决现有技术对于无法及时发现粒子并及时清理,容易引起漆包线断线,导致售后成本增加的问题

Benefits of technology

[0022]在检测时,当待测漆包线通过刮刀时,刮刀能够将待测漆包线上的粒子刮除,避免因粒子直径过大而影响待测漆包线的质量;由所述刮刀的内圈的直径比所述待测漆包线的外径大0.1mm~0.2mm;当粒子直径小于刮刀的内圈的直径时,即粒子的直径处于允许范围内时,刮刀不会对粒子进行刮除,由此,能够避免刮刀损坏待测漆包线的表面,保证待测漆包线的质量;

✦ Generated by Eureka AI based on patent content.

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Abstract

The application discloses a kind of enameled wire particle blocking devices, including the scraper assembly of the particle of enameled wire to be measured and the detection component of the particle of enameled wire to be measured after cutting is completed;Detection component includes detection seat, first guide rod, second guide rod, first detection piece, second detection piece, first spring and second spring, first detection piece is arranged on first guide rod, first spring is sleeved on first guide rod, second detection piece is arranged on second guide rod, second spring is sleeved on second guide rod, pressure sensor is arranged between first detection piece and first spring and between second detection piece and second spring, pressure sensor detects the elastic force generated by spring and transmits elastic force signal to processor, and processor obtains elastic force value according to elastic force signal and sends to counter;Using the enameled wire quality detection method of the application, the quality of enameled wire to be measured can be avoided to be influenced by particle diameter being too large or particle quantity being too much, guarantee the qualified rate of enameled wire to be measured, reduce after-sales cost.
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Description

Technical Field

[0001] This invention belongs to the field of testing instrument technology, specifically relating to a particle blocking device for enameled wire and a method for testing the quality of enameled wire. Background Technology

[0002] Currently, the main processes for producing enameled wire consist of unwinding, drawing, annealing, coating, curing, lubrication, and winding. After the bare copper wire is coated, it undergoes evaporation and curing in the oven. During production, impurities, bubbles, and paint buildup may occur on the surface of the coating due to paint contamination or dust in the workshop environment, resulting in an uneven surface known as particles. These particles are a common defect in the current production process of enameled wire. They are generated during high-speed operation of the equipment and cannot be detected. Existing equipment cannot completely remove these particles. If particles are not detected and cleaned in time, they can easily cause the enameled wire to break, leading to increased after-sales costs. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a particle blocking device for enameled wire and a method for detecting the quality of enameled wire, which can effectively solve the problem that the existing technology cannot detect and clean particles in time, which can easily cause the enameled wire to break and increase after-sales costs.

[0004] To address the aforementioned technical problems, one aspect of the present invention employs the following technical solution:

[0005] A particle-blocking device for enameled wire includes a scraper assembly for removing particles from the enameled wire to be tested and a detection assembly for detecting particles in the enameled wire to be tested after cutting.

[0006] The scraper assembly includes a scraper seat and a scraper. The scraper seat has a first through hole through which the enameled wire to be tested can pass. The scraper is disposed on the scraper seat and located at the end where the enameled wire to be tested enters. The scraper is configured as a ring scraper, and the diameter of the inner ring of the scraper is 0.1 mm to 0.2 mm larger than the outer diameter of the enameled wire to be tested.

[0007] The detection assembly includes a detection base, a first guide rod, a second guide rod, a first detection element, a second detection element, a first spring, and a second spring. The detection base has a mounting cavity. The first guide rod and the second guide rod are movably disposed on the left and right sides of the mounting cavity, respectively. The first detection element is disposed on the first guide rod. The first spring is sleeved on the first guide rod, with one end of the first spring abutting against the mounting cavity and the other end abutting against the first detection element. The second detection element is disposed on the second guide rod, with the second spring sleeved on the second guide rod and one end of the second spring abutting against the mounting cavity. Both the first spring and the second spring have... The preload is applied, and the other end of the second spring abuts against the second detection element. The first detection element has a first semi-circular arc groove, and the second detection element has a second semi-circular arc groove. The first semi-circular arc groove and the second semi-circular arc groove together form a second through hole through which the enameled wire to be tested can pass. Pressure sensors are provided between the first detection element and the first spring, and between the second detection element and the second spring. The pressure sensors are used to detect the elastic force generated by the first spring or the second spring and transmit the elastic force signal to the processor. The processor can obtain the elastic force value according to the elastic force signal and send it to the counter. The processor is electrically connected to the pressure sensor and the counter respectively.

[0008] In a preferred embodiment of the present invention, the scraper assembly is disposed on the first adjusting assembly. The first adjusting assembly includes a first transverse guide rail, a first transverse slider, a first transverse locking member, a first vertical guide rail, a first vertical slider, and a first vertical locking member. The scraper seat is slidably disposed on the first transverse guide rail via the first transverse slider. The first transverse locking member is used to lock the first transverse slider onto the first transverse guide rail. The first transverse guide rail is slidably disposed on the first vertical guide rail via the first vertical slider. The first vertical locking member is used to lock the first vertical slider onto the first vertical guide rail.

[0009] In a preferred embodiment of the present invention, the detection component is disposed on the second adjustment component. The second adjustment component includes a second transverse guide rail, a second transverse slider, a second transverse locking member, a second vertical guide rail, a second vertical slider, and a second vertical locking member. The detection seat is slidably disposed on the second transverse guide rail via the second transverse slider. The second transverse locking member is used to lock the second transverse slider onto the second transverse guide rail. The second transverse guide rail is slidably disposed on the second vertical guide rail via the second vertical slider. The second vertical locking member is used to lock the second vertical slider onto the second vertical guide rail.

[0010] As a preferred embodiment of the present invention, a particle blocking device for enameled wire further includes a guide wheel for guiding the transport of the enameled wire to be tested. The guide wheel includes a first guide wheel, a second guide wheel, and a third guide wheel. The first guide wheel is disposed between the second guide wheel and the third guide wheel and is detachably connected to the second guide wheel and the third guide wheel respectively. The inner side of the second guide wheel is provided with an R-angle that transitions from the inner surface of the second guide wheel to the outer circumferential surface of the first guide wheel by an arc. The inner side of the third guide wheel is provided with an R-angle that transitions from the inner surface of the third guide wheel to the outer circumferential surface of the first guide wheel by an arc.

[0011] As a preferred embodiment of the present invention, both the scraper holder and the detection holder are provided with arrows for indicating the transmission direction of the enameled wire to be tested.

[0012] Another aspect of the present invention adopts the following technical solution:

[0013] A method for quality inspection of enameled wire, employing the aforementioned enameled wire particle blocking device, includes the following steps:

[0014] Step S1: The enameled wire to be tested passes through the scraper assembly, and the scraper cuts the particles on the enameled wire to be tested;

[0015] Step S2: After cutting, the enameled wire to be tested enters the detection component for detection; specifically, the pressure sensor detects the elastic force generated by the first spring or the second spring and transmits the elastic force signal to the processor. The processor can obtain the elastic force value based on the elastic force signal and determine whether the elastic force value exceeds the set value; if the elastic force value exceeds the set value, the processor controls the counter to count once.

[0016] Step S3: Repeat steps S1 and S2 until the entire roll of the enameled wire to be tested has undergone particle cutting and quality inspection;

[0017] Step S4: The processor calculates the average number of particles based on the number of times recorded by the counter. The calculation formula is as follows:

[0018] Where N0 is the average number of particles; N is the total number of particles; and L is the total length of the entire roll of enameled wire to be tested.

[0019] If N0 < 0.1, then the enameled wire to be tested is a qualified product;

[0020] If N0 > 0.1, then the enameled wire to be tested is a defective product.

[0021] The method for quality inspection of enameled wire provided by this invention has the following advantages compared with the prior art:

[0022] During testing, when the enameled wire to be tested passes through the scraper, the scraper can remove particles from the wire, preventing the quality of the wire from being affected by particles with excessively large diameters. The inner diameter of the scraper is 0.1mm to 0.2mm larger than the outer diameter of the wire. When the particle diameter is smaller than the inner diameter of the scraper, i.e., when the particle diameter is within the allowable range, the scraper will not remove the particles. This prevents the scraper from damaging the surface of the wire and ensures the quality of the wire.

[0023] When the enameled wire under test passes through the detection component, if there are particles on the wire, the particles push the left or right detection element, thereby compressing the first or second spring. The pressure sensor can detect the elastic force generated by the first or second spring and transmit the elastic force signal to the processor. The processor can obtain the elastic force value based on the elastic force signal and send it to the counter to calculate the average number of particles. If the average number of particles is <0.1, the enameled wire under test is a qualified product; if the processor calculates that the average number of particles is >0.1, the enameled wire under test is a non-qualified product.

[0024] Therefore, it is possible to avoid the quality of the enameled wire being tested being affected by an excessive number of particles, thereby preventing unqualified products from entering the market, ensuring the pass rate of the enameled wire being tested, and reducing after-sales costs. By using this invention, it is possible to avoid the quality of the enameled wire being tested being affected by an excessive number of particles or a large particle diameter, ensuring the pass rate of the enameled wire being tested, and reducing after-sales costs. Attached Figure Description

[0025] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings of the embodiments will be briefly described below.

[0026] Figure 1 This is a schematic diagram of the structure of a particle-blocking device for enameled wire provided in an embodiment of the present invention;

[0027] Figure 2 This is a schematic diagram of the scraper assembly;

[0028] Figure 3 This is a schematic diagram of the detection component;

[0029] Figure 4 This is a schematic diagram of the structure of the first adjustment component;

[0030] Figure 5 This is a schematic diagram of the structure of the second adjustment component;

[0031] Figure 6 This is a schematic diagram of the guide wheel assembly;

[0032] Figure 7 This is a block diagram showing the connection between the pressure sensor, processor, and counter.

[0033] Marked in the image:

[0034] Scraper assembly 1; Scraper seat 101; Scraper 102; First through hole 103; Detection assembly 2; Detection seat 201; First guide rod 202; Second guide rod 203; First detection element 204; Second detection element 205; First spring 206; Second spring 207; Mounting cavity 208; First semi-circular groove 209; Second semi-circular groove 210; Second through hole 211; Pressure sensor 212; Enamelled wire to be tested 3; First adjustment assembly 4; First transverse guide rail 40 1; First horizontal slider 402; First horizontal locking member 403; First vertical guide rail 404; First vertical slider 405; First vertical locking member 406; Second adjusting component 5; Second horizontal guide rail 501; Second horizontal slider 502; Second horizontal locking member 503; Second vertical guide rail 504; Second vertical slider 505; Second vertical locking member 506; Guide wheel 6; First guide wheel 601; Second guide wheel 602; Third guide wheel 603; Bolt 604. Detailed Implementation

[0035] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and are not intended to limit the scope of the invention.

[0036] In the description of this invention, it should be understood that the terms "upper," "lower," "left," "right," "front," "rear," "top," and "bottom," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. It should be understood that the terms "first," "second," etc., are used in this invention to describe various information, but this information should not be limited to these terms. These terms are only used to distinguish information of the same type from each other. For example, without departing from the scope of this invention, "first" information can also be referred to as "second" information, and similarly, "second" information can also be referred to as "first" information.

[0037] like Figures 1 to 3 As shown, one aspect of a preferred embodiment of the present invention provides a particle blocking device for enameled wire, which includes a scraper assembly 1 for cutting off particles from the enameled wire 3 to be tested and a detection assembly 2 for detecting particles from the enameled wire 3 to be tested after cutting.

[0038] The scraper assembly 1 includes a scraper seat 101 and a scraper 102. The scraper seat 101 is provided with a first through hole 103 through which the enameled wire 3 to be tested can pass. The scraper 102 is disposed on the scraper seat 101 and located at the end where the enameled wire 3 to be tested enters. The scraper 102 is configured as an annular scraper, and the diameter of the inner circle of the scraper 102 is 0.1 mm to 0.2 mm larger than the outer diameter of the enameled wire 3 to be tested.

[0039] The detection assembly 2 includes a detection seat 201, a first guide rod 202, a second guide rod 203, a first detection element 204, a second detection element 205, a first spring 206, and a second spring 207. The detection seat 201 has a mounting cavity 208. The first guide rod 202 and the second guide rod 203 are movably disposed on the left and right sides of the mounting cavity 208, respectively. The first detection element 204 is disposed on the first guide rod 202. The first spring 206 is sleeved on the first guide rod 202, with one end of the first spring 206 abutting against the mounting cavity 208 and the other end abutting against the first detection element 204. The second detection element 205 is disposed on the second guide rod 203, with the second spring 207 sleeved on the second guide rod 203 and one end of the second spring 207 abutting against the mounting cavity 208. The first spring 206... Both spring 206 and spring 207 are provided with preload. The other end of spring 207 abuts against the second detection element 205. Spring 204 is provided with a first semi-circular groove 209, and spring 205 is provided with a second semi-circular groove 210. Spring 209 and spring 210 together form a second through hole 211 through which the enameled wire 3 to be tested can pass. Pressure sensors 212 are provided between spring 204 and spring 206 and between spring 205 and spring 207. Pressure sensors 212 are used to detect the elastic force generated by spring 206 or spring 207 and transmit the elastic force signal to the processor. The processor can obtain the elastic force value according to the elastic force signal and send it to the counter. The processor is electrically connected to pressure sensor 212 and counter respectively.

[0040] For example, such as Figures 4 to 5As shown, the scraper assembly 1 is mounted on the first adjusting assembly 4. The first adjusting assembly 4 includes a first horizontal guide rail 401, a first horizontal slider 402, a first horizontal locking member 403, a first vertical guide rail 404, a first vertical slider 405, and a first vertical locking member 406. The scraper holder 101 is slidably mounted laterally on the first horizontal guide rail 401 via the first horizontal slider 402. The first horizontal locking member 403 is used to lock the first horizontal slider 402 onto the first horizontal guide rail 401. The first horizontal guide rail 401 is slidably mounted vertically on the first vertical guide rail 404 via the first vertical slider 405. The first vertical locking member 406 is used to lock the first vertical slider 405 onto the first vertical guide rail 404. The detection component 2 is mounted on the second adjustment component 5. The second adjustment component 5 includes a second horizontal guide rail 501, a second horizontal slider 502, a second horizontal locking member 503, a second vertical guide rail 504, a second vertical slider 505, and a second vertical locking member 506. The detection seat 201 is slidably mounted on the second horizontal guide rail 501 via the second horizontal slider 502. The second horizontal locking member 503 is used to lock the second horizontal slider 502 onto the second horizontal guide rail 501. The second horizontal guide rail 501 is slidably mounted on the second vertical guide rail 504 via the second vertical slider 505. The second vertical locking member 506 is used to lock the second vertical slider 505 onto the second vertical guide rail 504. Therefore, the positions of the scraper component 1 and the detection component 2 can be adjusted according to the actual position of the enameled wire 3 to be tested, ensuring that the enameled wire 3 to be tested, the first through hole 103, and the second through hole 211 are all located on the same straight line, thereby further ensuring the scraping and detection effect of particles.

[0041] For example, such as Figure 6 As shown, a particle-blocking device for enameled wire further includes guide wheels for guiding the enameled wire 3 to be tested. The guide wheels include a first guide wheel 601, a second guide wheel 602, and a third guide wheel 603. The first guide wheel 601 is disposed between the second guide wheel 602 and the third guide wheel 603 and is detachably connected to both. The inner surface of the second guide wheel 602 has an R-angle that transitions from the inner surface of the second guide wheel 602 to the outer circumferential surface of the first guide wheel 601 via an arc. The inner surface of the third guide wheel 603 also has an R-angle that transitions from the inner surface of the third guide wheel 603 to the outer circumferential surface of the first guide wheel 601 via an arc. Therefore, the first guide wheel 601, the second guide wheel 602, and the third guide wheel 603 can be individually disassembled for polishing, preventing wear during the passage of the enameled wire 3. Simultaneously, the R-angle also prevents the enameled wire 3 from being scratched upon entry, ensuring the quality of the enameled wire 3 under test.

[0042] It should also be noted that the first guide wheel 601, the second guide wheel 602 and the third guide wheel 603 are connected by bolts 604, and each of the first guide wheel 601, the second guide wheel 602 and the third guide wheel 603 is provided with mounting holes through which bolts 604 can pass.

[0043] For example, both the scraper holder 101 and the detection holder 201 are provided with arrows for indicating the transmission direction of the enameled wire 3 to be tested.

[0044] like Figure 7 As shown, another aspect of a preferred embodiment of the present invention provides a method for detecting the quality of enameled wire, employing the aforementioned enameled wire particle blocking device, which includes the following steps:

[0045] Step S1: The enameled wire 3 to be tested passes through the scraper assembly 1, and the scraper 102 cuts the particles on the enameled wire 3 to be tested.

[0046] Step S2: After cutting, the enameled wire 3 to be tested enters the detection component 2 for detection; specifically, the pressure sensor 212 detects the elastic force generated by the first spring 206 or the second spring 207 and transmits the elastic force signal to the processor. The processor can obtain the elastic force value based on the elastic force signal and determine whether the elastic force value exceeds the set value; if the elastic force value exceeds the set value, the processor controls the counter to count once.

[0047] Step S3: Repeat steps S1 and S2 until the entire roll of the enameled wire to be tested 3 has completed particle cutting and quality inspection;

[0048] Step S4: The processor calculates the average number of particles based on the number of times recorded by the counter. The calculation formula is as follows:

[0049] Where N0 is the average number of particles; N is the total number of particles; and L is the total length of the entire roll of enameled wire to be tested.

[0050] If N0 < 0.1, then the enameled wire 3 to be tested is a qualified product;

[0051] If N0 > 0.1, then the enameled wire 3 to be tested is a defective product.

[0052] The present invention provides a method for detecting the quality of enameled wire. During testing, when the enameled wire 3 to be tested passes through the scraper 102, the scraper 102 can remove particles from the enameled wire 3, avoiding the impact of excessively large particle diameters on the quality of the enameled wire 3. The inner diameter of the scraper 102 is 0.1 mm to 0.2 mm larger than the outer diameter of the enameled wire 3 to be tested. When the particle diameter is smaller than the diameter of the inner circle 103 of the scraper, that is, when the particle diameter is within the allowable range, the scraper 102 will not remove the particles. Thus, the scraper 102 can be prevented from damaging the surface of the enameled wire 3 to be tested, ensuring the quality of the enameled wire 3 to be tested.

[0053] When the enameled wire 3 to be tested passes through the detection component 2, if there are particles on the enameled wire 3, the particles push the left or right detection component, thereby causing the first spring 206 or the second spring 207 to compress. The pressure sensor 212 can detect the elastic force generated by the first spring 206 or the second spring 207 and transmit the elastic force signal to the processor. The processor can obtain the elastic force value based on the elastic force signal and send it to the counter to calculate the average number of particles. If the average number of particles is <0.1, the enameled wire 3 to be tested is a qualified product; if the processor calculates that the average number of particles is >0.1, the enameled wire 3 to be tested is a non-qualified product.

[0054] Therefore, it is possible to avoid the quality of the enameled wire 3 to be tested being affected by an excessive number of particles, thereby preventing unqualified products from entering the market, ensuring the pass rate of the enameled wire 3 to be tested, and reducing after-sales costs. By using this invention, it is possible to avoid the quality of the enameled wire 3 to be tested being affected by an excessively large particle diameter or an excessive number of particles, ensuring the pass rate of the enameled wire 3 to be tested, and reducing after-sales costs.

[0055] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0056] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and substitutions can be made without departing from the technical principles of the present invention, and these improvements and substitutions should also be considered within the scope of protection of the present invention.

Claims

1. A particle-blocking device for enameled wire, characterized in that, It includes a scraper assembly for removing particles from the enameled wire to be tested and a detection assembly for detecting particles from the enameled wire to be tested after cutting. The scraper assembly includes a scraper seat and a scraper. The scraper seat has a first through hole through which the enameled wire to be tested can pass. The scraper is disposed on the scraper seat and located at the end where the enameled wire to be tested enters. The scraper is configured as a ring scraper, and the diameter of the inner ring of the scraper is 0.1 mm to 0.2 mm larger than the outer diameter of the enameled wire to be tested. The scraper assembly is disposed on the first adjusting assembly. The first adjusting assembly includes a first transverse guide rail, a first transverse slider, a first transverse locking member, a first vertical guide rail, a first vertical slider, and a first vertical locking member. The scraper seat is slidably disposed on the first transverse guide rail via the first transverse slider. The first transverse locking member is used to lock the first transverse slider on the first transverse guide rail. The first transverse guide rail is slidably disposed on the first vertical guide rail via the first vertical slider. The first vertical locking member is used to lock the first vertical slider on the first vertical guide rail. The detection assembly includes a detection base, a first guide rod, a second guide rod, a first detection element, a second detection element, a first spring, and a second spring. The detection base has a mounting cavity. The first guide rod and the second guide rod are movably disposed on the left and right sides of the mounting cavity, respectively. The first detection element is disposed on the first guide rod. The first spring is sleeved on the first guide rod, with one end of the first spring abutting against the mounting cavity and the other end abutting against the first detection element. The second detection element is disposed on the second guide rod, with the second spring sleeved on the second guide rod and one end of the second spring abutting against the mounting cavity. Both the first spring and the second spring have... The preload is applied, and the other end of the second spring abuts against the second detection element. The first detection element has a first semi-circular arc groove, and the second detection element has a second semi-circular arc groove. The first semi-circular arc groove and the second semi-circular arc groove together form a second through hole through which the enameled wire to be tested can pass. Pressure sensors are provided between the first detection element and the first spring, and between the second detection element and the second spring. The pressure sensors are used to detect the elastic force generated by the first spring or the second spring and transmit the elastic force signal to the processor. The processor can obtain the elastic force value according to the elastic force signal and send it to the counter. The processor is electrically connected to the pressure sensor and the counter respectively. The device further includes a first guide wheel, a second guide wheel, and a third guide wheel. The first guide wheel is disposed between the second guide wheel and the third guide wheel and is detachably connected to both the second guide wheel and the third guide wheel. The inner surface of the second guide wheel has an R-angle that transitions from the inner surface of the second guide wheel to the outer circumference of the first guide wheel. The inner surface of the third guide wheel has an R-angle that transitions from the inner surface of the third guide wheel to the outer circumference of the first guide wheel. The first guide wheel, the second guide wheel, and the third guide wheel are connected by bolts, and each of the first guide wheel, the second guide wheel, and the third guide wheel has mounting holes through which bolts can pass.

2. The particle-blocking device for enameled wire according to claim 1, characterized in that, The detection component is mounted on the second adjustment component, which includes a second horizontal guide rail, a second horizontal slider, a second horizontal locking member, a second vertical guide rail, a second vertical slider, and a second vertical locking member. The detection seat is slidably mounted on the second horizontal guide rail via the second horizontal slider. The second horizontal locking member is used to lock the second horizontal slider onto the second horizontal guide rail. The second horizontal guide rail is slidably mounted on the second vertical guide rail via the second vertical slider. The second vertical locking member is used to lock the second vertical slider onto the second vertical guide rail.

3. The particle-blocking device for enameled wire according to claim 1, characterized in that, Both the scraper holder and the detection holder are equipped with arrows to indicate the transmission direction of the enameled wire under test.

4. A method for detecting the quality of enameled wire, employing the enameled wire particle-blocking device as described in any one of claims 1-3, characterized in that, Includes the following steps: Step S1: The enameled wire to be tested passes through the scraper assembly, and the scraper cuts the particles on the enameled wire to be tested; Step S2: After cutting, the enameled wire to be tested enters the detection component for detection; specifically, the pressure sensor detects the elastic force generated by the first spring or the second spring and transmits the elastic force signal to the processor. The processor can obtain the elastic force value based on the elastic force signal and determine whether the elastic force value exceeds the set value; if the elastic force value exceeds the set value, the processor controls the counter to count once. Step S3: Repeat steps S1 and S2 until the entire roll of the enameled wire to be tested has undergone particle cutting and quality inspection; Step S4: The processor calculates the average number of particles based on the number of times recorded by the counter. The calculation formula is: N0 = ; Where N0 is the average number of particles; N is the total number of particles; and L is the total length of the entire roll of enameled wire to be tested. If N0 < 0.1, then the enameled wire to be tested is a qualified product; If N0 > 0.1, then the enameled wire to be tested is a defective product.

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