XRD中利用噪声波动鉴定微量物相的方法
By comparing the diffraction peaks of the PDF card with noise fluctuations in the XRD pattern, the problem of identifying trace phases was solved, and accurate identification of trace phases was achieved.
CN117761091BActive Publication Date: 2026-07-17KUNMING UNIV OF SCI & TECH
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- KUNMING UNIV OF SCI & TECH
- Filing Date
- 2023-12-25
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
In X-ray diffraction analysis, the identification of trace phases is difficult to perform accurately because the strongest diffraction peak signal is weak, making it difficult to confirm the phase using conventional methods.
Method used
By analyzing the 2θ position of weak diffraction peaks in the XRD pattern, comparing the noise fluctuation type with the diffraction peaks on the PDF card, and statistically analyzing the noise fluctuation types of the 3-strong, 5-strong, and 8-strong lines, trace phases were determined.
Benefits of technology
It accurately identified trace phases, solved the problem of difficulty in identifying trace phases when weak diffraction peak signals are present in XRD patterns, and improved the accuracy of phase identification.
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Figure CN117761091B_ABST
Abstract
本发明公开XRD中利用噪声波动鉴定微量物相的方法，属于X射线物相分析领域。本发明通过分析XRD图谱检索物相，观察是否存在微弱衍射峰信号未被检索出或无法确认物相，若存在则记录XRD衍射图中微弱的衍射峰信号所对应的2θ位置，检索出该2θ位置作为微量物相最强衍射峰时相应的PDF卡片信息，获得可能存在的物相，依次比对可能存在物相的PDF卡片3强线、5强线、8强线与XRD图谱背景线的噪声波动情况来鉴定微量物相。本发明所述XRD中利用噪声波动鉴定微量物相的方法准确鉴别了微量物相是否存在，解决了XRD图谱中存在微弱衍射峰信号时难以鉴定微量物相的问题。
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