Probe for testing printed boards

Abstract

This invention discloses a probe for testing printed circuit boards, comprising: an umbrella-shaped pin; and a telescopic sleeve, wherein the telescopic sleeve is disposed outside the umbrella-shaped pin, and the telescopic sleeve can move along the axial direction of the umbrella-shaped pin to change the state in which the tip of the umbrella-shaped pin is exposed outside the telescopic sleeve; in the testing state, the tip of the umbrella-shaped pin is vertically inserted into the insertion hole of a horizontally arranged printed circuit board, and the end face of the telescopic sleeve abuts against the printed circuit board. The probe of this application can be adapted to test insertion holes of 0.3-0.8mm to achieve insertion hole diameter adaptation and adjustment, and is elastically fixed and easy to insert and remove.

Description

Technical Field

[0001] This invention belongs to the field of printed circuit board probe testing technology, and particularly relates to a probe for testing printed circuit boards. Background Technology

[0002] Currently, with the increasing miniaturization and miniaturization of printed circuit board designs, the design of signal test holes, VCC, GND and other holes is getting smaller and smaller, generally around 1 to 2 mm. However, test holes with a diameter of less than 1 mm or even smaller are often found.

[0003] Currently available test probes do not meet the requirements because the pins must be smaller than the diameter of the hole. However, these pins can loosen and fall out after being inserted into the test hole, leading to open circuits or abnormal signals. Another type of pin, the banana-shaped pin, is easy to insert and remove and can ensure a secure insertion into the test hole. However, due to its complex manufacturing process, it can only be made to a minimum of 2mm and cannot be made smaller. Therefore, it is not suitable for testing the hole positions of printed circuit boards with hole diameters smaller than 1mm. As a result, the current testing process can only be carried out by soldering jumpers, which severely restricts the demand and output of test production. Summary of the Invention

[0004] This application proposes a probe for testing printed circuit boards to address the aforementioned technical problems. The specific technical solution is as follows:

[0005] A probe for testing printed circuit boards includes:

[0006] Umbrella-shaped pin;

[0007] And a telescopic sleeve, the telescopic sleeve being disposed outside the umbrella-shaped insert, the telescopic sleeve being movable along the axial direction of the umbrella-shaped insert to change the state in which the tip of the umbrella-shaped insert is exposed outside the telescopic sleeve;

[0008] In the test state, the tip of the umbrella-shaped pin is vertically inserted into the socket of the horizontally arranged printed circuit board, and the end face of the telescopic sleeve abuts against the printed circuit board.

[0009] Furthermore, the umbrella-shaped insert includes a main rod, a support rod extending axially from the end face of the main rod, and a wing extending from the end of the support rod toward the insertion end. When the wing extends toward the insertion end, the deformation gap between the wing and the support rod increases, and the support rod is distributed in a ring-shaped interval on the end face of the main rod.

[0010] Furthermore, the winglet and the support rod are integrally formed.

[0011] Furthermore, there are four support rods.

[0012] Furthermore, the side wall of the main rod has a scale or pattern indicating the adjustment of the aperture. When the telescopic sleeve is flush with the insertion end of the umbrella-shaped pin, the junction of the other end face of the telescopic sleeve and the main rod is the starting point of the scale or pattern indicating the adjustment of the aperture. The scale or pattern indicating the adjustment of the aperture extends from the starting point toward the insertion end.

[0013] Furthermore, the inner and outer walls of the wing have an included angle α, which is an acute angle not equal to 0°, causing the thickness of the wing to increase when it extends away from the insertion end.

[0014] Furthermore, the telescopic sleeve is made of PPS, and the umbrella-shaped pin is made of brass.

[0015] Furthermore, the outer surface of the wing is frosted.

[0016] The beneficial effects of this invention are as follows: the probe of this application can be adapted to 0.3-0.8mm test holes to achieve insertion hole diameter adaptation and adjustment, and it is elastically fixed and easy to insert and remove. Attached Figure Description

[0017] Figure 1 The diagram shown is a schematic of the probe's structure;

[0018] Figure 2 The diagram shown is a schematic of the umbrella-shaped pin structure;

[0019] Figure 3 This diagram shows the distribution of the support rods on the end face of the main rod.

[0020] Figure 4 This diagram illustrates the probe's state during testing.

[0021] Figure 5 This shows the state where the end of the telescopic sleeve is flush with the end of the umbrella-shaped pin;

[0022] Figure 6 The diagram shows the state of the probe being inserted into the socket to be tested;

[0023] Figure 7 The diagram shows the connector structure of the umbrella-shaped pin.

[0024] Figure 8 The diagram shows the connection between the winglet and the support rod. Detailed Implementation

[0025] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments.

[0026] Figure 1The diagram shows the structure of the probe, which includes an umbrella-shaped needle 100 and a telescopic sleeve 200. The telescopic sleeve 200 is disposed outside the umbrella-shaped needle 100 and can move along the axial direction of the umbrella-shaped needle 100 to change the position of the telescopic sleeve 200 relative to the tip of the umbrella-shaped needle 100.

[0027] Figure 2 The diagram shows a schematic of an umbrella-shaped insert 100. The umbrella-shaped insert 100 has an axially extending insertion end P. The umbrella-shaped insert 100 includes a main rod 110, a support rod 120, and a wing 130. A phase gap exists between the support rod 120 and the wing 130. The support rod 120 is disposed on the end face of the insertion end P of the main rod 110. The support rod 120 extends axially along the umbrella-shaped insert 100. Several support rods 120 are arranged in a ring around the central axis of the main rod 110, spaced apart from each other. The number of winglets 130 corresponds to the number of support rods 120. One end of the wing 130 is connected to the insertion end P of the support rod 120, and the other end extends away from the insertion end P. As the wing 130 extends away from the insertion end P, the distance between the wing 130 and the central axis of the umbrella-shaped pin 100 gradually increases, so that the support rod 120 and the wing 130 form an elastic umbrella-shaped structure with double-layer gaps at the end of the main rod 110. That is, the support rods 120 are spaced apart to form gaps. As the wing 130 extends from the insertion end P to a direction away from the insertion end P, the support rods 120 and the wing 130 are spaced apart to form gaps.

[0028] As the wing 130 extends from the insertion end P in a direction away from the insertion end P, the distance between the outer sides of the wing 130 is a minimum of 0.2 mm and a maximum of 0.8 mm, in order to adapt to test holes of 0.3 to 0.8 mm and meet the insertion conditions of different hole diameters.

[0029] Figure 3 The diagram shows the distribution of the support rods 120 on the end face of the main rod 110. In this embodiment, the number of support rods 120 is set to four, but it is not limited to four support rods 120.

[0030] Figure 4 The diagram shows the state of the probe used for testing. During testing, the printed circuit board 300 is set horizontally, and then the position of the telescopic sleeve 200 on the umbrella-shaped pin 100 is adjusted so that the exposed pin tip matches the diameter of the hole to be tested. Then the probe is inserted vertically into the hole of the printed circuit board 300 until the telescopic sleeve 200 abuts against the printed circuit board 300.

[0031] Here, the telescopic sleeve 200 has four functions:

[0032] Firstly, it serves to fix and support the umbrella-shaped pin 100. Since the insertion of the umbrella-shaped pin 100 into the hole to be tested relies on the contact between the wing 130 and the inner wall of the hole, and the wing 130 is set at an angle, the contact between the wing 130 and the inner wall of the hole is not a complete surface contact, but a partial surface contact or even a point contact. This makes the umbrella-shaped pin 100 prone to tilting and loosening. After the telescopic sleeve 200 is adjusted to the correct position, it is set on the outside of the umbrella-shaped pin 100. After being inserted synchronously with the umbrella-shaped pin 100, it abuts against the printed circuit board 300 through its end face, forming a stable support on the outside, thereby preventing the internal umbrella-shaped pin 100 from tilting and improving the stability of the connection during testing.

[0033] Secondly, it serves as an indicator for aperture adjustment. In this application, the probe is used to adapt to test sockets with diameters of 0.3 to 0.8 mm. Therefore, for sockets with different diameters, it is necessary to adjust the position of the telescopic sleeve 200 to expose a certain distance of the needle tip. The maximum outer diameter of the exposed needle tip is adapted to the diameter of the socket to be tested. However, the applicable size of the probe is between 0.3 and 0.8 mm, and it is difficult to judge by the naked eye whether the exposed needle tip meets the requirements. If the exposed needle tip is too small, it will not be inserted properly, and there may be a problem of poor contact. If the exposed needle tip is too large, the probe will deform inward to adapt to the diameter of the socket when inserted. There may be a deformation limit, which may cause the needle tip to get stuck in the socket and be difficult to pull out.

[0034] Combination Figure 5 The telescopic sleeve 200 is in a state where the end of the telescopic sleeve 200 is flush with the end of the umbrella-shaped pin 100. At this time, the telescopic sleeve 200 completely covers the tip of the umbrella-shaped pin 100. This state is the starting point K of the aperture adjustment indicator. The scale or pattern used to indicate the aperture adjustment is set on the side wall of the main rod 110 and extends away from the insertion end P from K. As the scale or pattern indicating the aperture adjustment extends away from the insertion end P, the indicated fitting aperture increases. In this way, the user can use the scale or pattern on the side wall of the main rod 110 as an indicator to adjust the telescopic sleeve 200 to the specified position.

[0035] Third, reduce the resistance when pulling out the probe and protect the test socket, such as... Figure 6 The diagram shows the state of the probe inserted into the socket under test. When the probe tip is inserted into the socket, its small outer diameter allows it to enter directly. As the probe tip continues to be inserted, the wing 130 will contact the inner wall of the socket. To ensure the connection performance of the insertion, the wing 130 needs to penetrate a further distance. In this state, the wing 130 will undergo the following... Figure 6The dotted line L indicates the state of the probe being concave and bent towards the support rod 120. When pulling out the probe, press the telescopic sleeve 200 and then pull the main rod 110. Since the end of the wing 130 away from the insertion end P is against the inner wall of the telescopic sleeve 200, the telescopic sleeve 200 will generate a certain degree of friction with the wing 130 to resist the tendency of the support rod 120 to be pulled out. In this state, since the wing 130 is already in a concave and bent state, it will bend and bend again towards the support rod 120 during the process of pulling out the main rod 110, thereby reducing the outer diameter of the wing 130 inserted into the test hole, reducing the contact with the inner wall of the test hole, or even detaching from the contact. After releasing the telescopic sleeve 200 in this state, the probe can be pulled out as a whole. Since the pulling process reduces or even eliminates the contact between the wing 130 and the inner wall of the test hole, the frictional loss or even damage of the conductive material of the inner wall of the test hole can be avoided.

[0036] Figure 7 The diagram shows the structure of the insertion end P of the umbrella-shaped pin 100. It can be seen that the width of the wing 130 is greater than the diameter of the support rod 120. This is because the diameter of the test hole is only 0.3 to 0.8 mm. In order to ensure that there is sufficient contact area between the wing 130 and the test hole, the width of the wing 130 needs to be ensured so that the probe can support the inner wall of the test hole to achieve pin fixation and electrical signal transmission.

[0037] Figure 8 The diagram shows the connection state of the winglet 130 and the support rod 120. It can be seen that at least part A at the connection between the winglet 130 and the support rod 120 is in a fixed state and cannot be deformed. In this application, several support rods 120 distributed at intervals are used to form the winglet 130 separately, which has the following advantages:

[0038] 1. The wing 130 can be used for insertion and removal throughout its entire length. Since the support rod 120 and the wing 130 form a double-layered, elastic umbrella-shaped structure, the support rod 120 and the wing 130 can deform between each other. When the aperture is small, the front end can be inserted by the support rod 120 deforming inward to support the inner wall of the insertion hole to be tested.

[0039] If four fins 130 are formed directly on the central main rod 110, the diameter of the support rod 120 must be at least equal to that of the fins 130 in order to meet the test conditions of the 0.3-0.8mm insertion hole (as in this application, the support rod 120 of this diameter cannot have fins 130 machined on all four sides at the same time). This will leave a certain length of non-deformable A part at the front end of the probe. This part will not only make part of the front end of the probe unusable for testing, but also, due to the rearward shift of the deformable part, the range of applicable insertion hole diameters will be reduced, and the insertion and removal requirements of the insertion hole of about 0.3mm cannot be met.

[0040] Second, reducing manufacturing costs. In conjunction with the above description, different support rods 120 are used to form the wing 130 separately. Compared with forming it with a central main rod 110, the support rod 120 has a smaller volume, which can reduce the total material required for manufacturing the probe.

[0041] See Figure 8 The inner and outer walls of the wing 130 form an angle α, which is an acute angle not equal to 0°, so that the thickness of the wing 130 increases while extending away from the insertion end P. When testing small-hole insertions, the support rod 120 deforms inward to support the inner wall of the insertion hole under test. The thinner wing 130 reduces the outer diameter of the needle tip to accommodate smaller insertion holes. When testing large-hole insertions, the wing 130 deforms to support the inner wall of the insertion hole under test, increasing the thickness of the wing 130 to increase its support strength.

[0042] The telescopic sleeve 200 is PPS.

[0043] The umbrella-shaped pin 100 is made of brass, and the outer surface of the wing 130 is machined with a frosted surface to increase friction and improve the insertion strength with the test hole.

[0044] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it.

Claims

1. A probe for testing a printed board, characterized by, include: Umbrella-shaped pin; The umbrella-shaped pin includes a main rod, a support rod extending axially from the end face of the main rod, and a wing extending from the end of the support rod toward the insertion end. When the wing extends toward the insertion end, the deformation gap between the wing and the support rod increases. The support rods are distributed in a ring-shaped interval on the end face of the main rod. The wing and the support rod are integrally formed. There are four support rods. And a telescopic sleeve, the telescopic sleeve being disposed outside the umbrella-shaped insert, the telescopic sleeve being movable along the axial direction of the umbrella-shaped insert to change the state in which the tip of the umbrella-shaped insert is exposed outside the telescopic sleeve; In the test state, the tip of the umbrella-shaped pin is vertically inserted into the socket of the horizontally arranged printed circuit board, and the end face of the telescopic sleeve abuts against the printed circuit board.

2. The probe for testing a printed board according to claim 1, wherein The side wall of the main rod has a scale or pattern indicating the adjustment of the aperture. When the telescopic sleeve is flush with the insertion end of the umbrella-shaped pin, the junction of the other end face of the telescopic sleeve and the main rod is the starting point of the scale or pattern indicating the adjustment of the aperture. The scale or pattern indicating the adjustment of the aperture extends from the starting point toward the insertion end.

3. The probe for testing printed boards as claimed in claim 1, wherein The inner and outer walls of the wing have an included angle α, which is an acute angle not equal to 0°, causing the thickness of the wing to increase when it extends away from the insertion end.

4. The probe for testing printed boards as claimed in claim 1, wherein The outer surface of the wing is frosted.

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