Test systems and test methods applied to digital output circuits

Abstract

This disclosure provides a testing system and method for digital output circuits, applicable to the field of rail transit technology. The system includes: an excitation voltage source, an analog-to-digital converter (ADC), a microcontroller, and a communication interface. The excitation voltage source provides an excitation voltage to the digital output circuit. The ADC acquires the excitation voltage from the excitation voltage source as voltage input data for the digital output circuit and acquires the output voltage of the digital output circuit as voltage output data. The microcontroller obtains the operating status of the digital output circuit through the communication interface. Based on the voltage input data and voltage output data, the input voltage and output voltage of the digital output circuit are obtained. The system accurately determines whether the digital output circuit is faulty based on its operating status, input voltage, and output voltage, thereby improving the testing results.

Description

Technical Field

[0001] This disclosure relates to the field of rail transit technology, and in particular to a test system and test method for digital output circuits. Background Technology

[0002] Currently, there is a significant demand in the field of rail transit technology for controlling other equipment using digital outputs, typically employing methods such as... Figure 1 The digital output circuit shown typically outputs a rated voltage of DC110V, DC24V, or DC72V.

[0003] It is worth noting that to ensure the safety of rail transit, the digital output circuit needs to be tested. Current testing systems generally employ an optocoupler-based acquisition scheme; that is, if the digital output circuit has voltage output, the optocoupler conducts; if there is no voltage output, the optocoupler does not conduct. However, this scheme can only determine whether the digital output circuit is outputting based on the conduction of the optocoupler, and cannot accurately determine whether the digital output circuit is faulty. Therefore, how to accurately determine whether the digital output circuit is faulty has become a pressing technical problem that needs to be solved. Summary of the Invention

[0004] The embodiments of this disclosure provide a test system and test method for digital output circuits.

[0005] In a first aspect, embodiments of this disclosure provide a test system for digital output circuits, the system comprising: an excitation voltage source, an analog-to-digital converter, a microcontroller, and a communication interface;

[0006] The excitation voltage source is connected to the voltage input terminal of the digital output circuit and the analog-to-digital converter (ADC); the voltage output terminal of the digital output circuit is connected to the ADC; the ADC is connected to the microcontroller; the microcontroller communicates with the digital output circuit through a communication interface.

[0007] The excitation voltage source is used to provide excitation voltage to the digital output circuit;

[0008] The analog-to-digital converter is used to acquire the excitation voltage of the excitation voltage source as the voltage input data of the digital output circuit; and to acquire the output voltage of the digital output circuit as the voltage output data of the digital output circuit.

[0009] The microcontroller is used to obtain the operating status of the digital output circuit through the communication interface; to obtain the input voltage and output voltage of the digital output circuit based on the voltage input data and voltage output data; and to determine whether the digital output circuit is faulty based on the operating status of the digital output circuit, the input voltage, and the output voltage.

[0010] In some possible implementations of the first aspect, the system further includes: a voltage divider circuit, which includes: a first resistor and a second resistor;

[0011] One end of the first resistor is connected to the voltage output terminal of the digital output circuit, and the other end of the first resistor is connected to one end of the second resistor and the analog-to-digital converter; the other end of the second resistor is connected to the ground terminal.

[0012] The analog-to-digital converter is used to acquire the voltage at the connection point of the first resistor and the second resistor, and use it as the voltage output data of the digital output circuit.

[0013] In some possible implementations of the first aspect, the system also includes: an operational amplifier;

[0014] The input terminals of the operational amplifier are connected to the other end of the first resistor and one end of the second resistor, respectively; the output terminal of the operational amplifier is connected to the analog-to-digital converter.

[0015] In some possible implementations of the first aspect, the microcontroller communicates with the host computer via a communication interface;

[0016] The microcontroller is also used to send the fault determination result to the host computer via a communication interface after determining whether the digital output circuit is faulty based on the operating status of the digital output circuit, the input voltage, and the output voltage.

[0017] In some possible implementations of the first aspect, the effective number of bits of the analog-to-digital converter is more than 13 bits.

[0018] Secondly, embodiments of this disclosure provide a testing method based on the testing system described above, the method comprising:

[0019] The excitation voltage source provides excitation voltage to the digital output circuit;

[0020] The analog-to-digital converter acquires the excitation voltage of the excitation voltage source as the voltage input data of the digital output circuit; and acquires the output voltage of the digital output circuit as the voltage output data of the digital output circuit.

[0021] The microcontroller obtains the operating status of the digital output circuit through the communication interface; based on the voltage input data and voltage output data, it obtains the input voltage and output voltage of the digital output circuit; and based on the operating status of the digital output circuit, the input voltage, and the output voltage, it determines whether the digital output circuit is faulty.

[0022] In some possible implementations of the second aspect, determining whether the digital output circuit is faulty based on its operating state, input voltage, and output voltage includes:

[0023] When the digital output circuit is in the off state, the microcontroller calculates the first ratio of the output voltage to the input voltage.

[0024] When the digital output circuit is in the ON state, the microcontroller calculates the second ratio of the output voltage to the input voltage.

[0025] If the first ratio is greater than a first preset threshold and / or the second ratio is less than a second preset threshold, the microcontroller determines that the digital output circuit is faulty; wherein the first preset threshold is less than the second preset threshold.

[0026] When the first ratio is less than or equal to the first preset threshold and the second ratio is greater than or equal to the second preset threshold, the microcontroller calculates the difference between the input voltage and the output voltage when the digital output circuit is in the on state, and searches for the voltage range in which the difference is located from different preset voltage ranges. If the voltage range found is a normal voltage range, the digital output circuit is determined to be fault-free; if the voltage range found is an abnormal voltage range, the digital output circuit is determined to be faulty.

[0027] In some possible implementations of the second aspect, after determining a fault in the digital output circuit if the found voltage range is an abnormal voltage range, the method further includes:

[0028] The microcontroller determines the faulty component in the digital output circuit based on the fault cause corresponding to the found voltage range.

[0029] In some possible implementations of the second aspect, after determining whether the digital output circuit is faulty based on its operating state, input voltage, and output voltage, the method further includes:

[0030] The microcontroller sends the fault determination result to the host computer through the communication interface.

[0031] Thirdly, embodiments of this disclosure provide an electronic device comprising: at least one processor; and a memory communicatively connected to the at least one processor; the memory storing instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the method described above.

[0032] Fourthly, embodiments of this disclosure provide a non-transitory computer-readable storage medium storing computer instructions for causing a computer to perform the methods described above.

[0033] In the embodiments of this disclosure, voltage input data and voltage output data of the digital output circuit can be acquired based on the analog-to-digital converter, and then the microcontroller can calculate the input voltage and output voltage of the digital output circuit. Based on the operating status of the digital output circuit obtained through the communication interface and the previously calculated input voltage and output voltage, it can be accurately determined whether the digital output circuit is faulty, thereby improving the test results.

[0034] It should be understood that the description in the Summary of the Invention is not intended to limit the key or essential features of the embodiments of this disclosure, nor is it intended to restrict the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0035] The above and other features, advantages, and aspects of the embodiments of this disclosure will become more apparent from the accompanying drawings and the following detailed description. The drawings are provided for a better understanding of the invention and are not intended to limit the scope of this disclosure. In the drawings, the same or similar reference numerals denote the same or similar elements, wherein:

[0036] Figure 1 A schematic diagram of a digital output circuit provided by an embodiment of the present disclosure is shown;

[0037] Figure 2 An architecture diagram of a test system for digital output circuits provided by an embodiment of this disclosure is shown;

[0038] Figure 3 An architecture diagram of another test system for digital output circuits provided by an embodiment of this disclosure is shown;

[0039] Figure 4 This illustration shows an architecture diagram of another test system for digital output circuits provided by an embodiment of the present disclosure;

[0040] Figure 5 A flowchart of a testing method provided by an embodiment of this disclosure is shown;

[0041] Figure 6 A structural diagram of an exemplary electronic device capable of implementing embodiments of the present disclosure is shown. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of the embodiments of this disclosure clearer, the technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0043] Furthermore, the term "and / or" in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0044] To address the problems in the background art, embodiments of this disclosure provide a testing system and method for digital output circuits. Specifically, the testing system includes: an excitation voltage source, an analog-to-digital converter (ADC), a microcontroller, and a communication interface; the excitation voltage source provides an excitation voltage to the digital output circuit; the ADC acquires the excitation voltage from the excitation voltage source as voltage input data for the digital output circuit and acquires the output voltage of the digital output circuit as voltage output data; the microcontroller obtains the operating state of the digital output circuit through the communication interface; based on the voltage input data and voltage output data, the input voltage and output voltage of the digital output circuit are obtained; and based on the operating state of the digital output circuit, the input voltage, and the output voltage, it is determined whether the digital output circuit is faulty.

[0045] In this way, the voltage input and voltage output data of the digital output circuit can be collected based on the analog-to-digital converter, and then the microcontroller can calculate the input and output voltages of the digital output circuit. Based on the operating status of the digital output circuit obtained through the communication interface and the previously calculated input and output voltages, it is possible to accurately determine whether the digital output circuit is faulty, thereby improving the test results.

[0046] The following description, in conjunction with the accompanying drawings, details a test system and test method for digital output circuits provided by the present disclosure through specific embodiments.

[0047] Figure 2 An architecture diagram of a test system for digital output circuits provided by an embodiment of this disclosure is shown, such as... Figure 2 As shown, the test system may include: an excitation voltage source, an analog-to-digital converter, a microcontroller, and a communication interface.

[0048] The excitation voltage source is connected to the voltage input terminal of the digital output circuit and the analog-to-digital converter, respectively. The voltage output terminal of the digital output circuit is connected to the analog-to-digital converter, the analog-to-digital converter is connected to the microcontroller, and the microcontroller communicates with the digital output circuit through a communication interface.

[0049] The excitation voltage source is used to provide excitation voltage to the digital output circuit.

[0050] The analog-to-digital converter is used to acquire the excitation voltage of the excitation voltage source (i.e., the input voltage of the digital output circuit) as the voltage input data of the digital output circuit, and to acquire the output voltage of the digital output circuit as the voltage output data of the digital output circuit.

[0051] The microcontroller is used to obtain the operating status of the digital output circuit through the communication interface, and to obtain the input voltage and output voltage of the digital output circuit based on the voltage input data and voltage output data collected by the analog-to-digital converter. In other words, it decodes the voltage input data and voltage output data to obtain the input voltage and output voltage of the digital output circuit, and then determines whether the digital output circuit is faulty based on the operating status of the digital output circuit and the input voltage and output voltage.

[0052] In this embodiment of the disclosure, voltage input data and voltage output data of the digital output circuit can be collected based on the analog-to-digital converter, and then the microcontroller can calculate the input voltage and output voltage of the digital output circuit. Based on the operating status of the digital output circuit obtained through the communication interface and the previously calculated input voltage and output voltage, it can be accurately determined whether the digital output circuit is faulty, thereby improving the test results.

[0053] Figure 3 This illustration shows an architecture diagram of another test system applied to digital output circuits provided in an embodiment of this disclosure, and... Figure 2 In contrast, the test system may also include a voltage divider circuit, which includes a first resistor R1 and a second resistor R2.

[0054] One end of the first resistor R1 is connected to the voltage output terminal of the digital output circuit, the other end of the first resistor R1 is connected to one end of the second resistor R2 and the analog-to-digital converter, and the other end of the second resistor R2 is connected to the ground terminal EP1.

[0055] The analog-to-digital converter is used to acquire the voltage at the connection point of the first resistor R1 and the second resistor R2, and use it as the voltage output data of the digital output circuit.

[0056] Accordingly, the microcontroller decodes the voltage output data to obtain the voltage U1 at the connection point of the first resistor R1 and the second resistor, and then calculates the voltage U1 according to the formula. Calculate the output voltage U0 of the digital output circuit.

[0057] In this way, the output voltage of the digital output circuit can be accurately obtained by using the voltage divider principle.

[0058] Figure 4 This illustration shows an architecture diagram of another test system applied to digital output circuits provided in an embodiment of this disclosure, and... Figure 3 In contrast, the test system may also include: operational amplifier U1.

[0059] The input terminals of operational amplifier U1 are connected to the other end of the first resistor and one end of the second resistor, respectively, and the output terminal of operational amplifier U1 is connected to the analog-to-digital converter.

[0060] In this way, the output voltage of the digital output circuit can be obtained more accurately through an operational amplifier.

[0061] In some embodiments, the microcontroller communicates with the host computer through a communication interface. The microcontroller is also used to send fault determination results to the host computer through the communication interface so that users can promptly identify problems and take appropriate actions.

[0062] The following is combined with Figure 4 The design parameters of the test system are detailed below:

[0063] Considering the specific circumstances of rail transit applications, the highest output voltage of the digital output circuit is DC160V. Therefore, the voltage range for acquisition is designed to be 0 to DC180V, which enables the test system to be capable of testing digital output circuits with various output voltages and improves its test versatility.

[0064] Considering the characteristics of various components in the digital output circuit, the current flowing through the circuit is designed to be 5mA when the input voltage is DC24V, 22mA when the input voltage is DC110V, and 37mA when the input voltage is DC180V. Therefore, the sum of the resistances of the first resistor R1 and the second resistor R2 is determined to be 4.8KΩ. The maximum output voltage across the second resistor R2 is set to 2.5V, and the resistance of the second resistor R2 is 67Ω. The resistance of the first resistor R2 is 4733Ω. Furthermore, since it is necessary to detect small voltage changes caused by diode failure in the digital output circuit, the output voltage acquisition accuracy is set to 0.1V based on the diode's characteristics. Therefore, the accuracy of the first resistor R1 and the second resistor R2 needs to be greater than 0.1V / 180V, or greater than 0.5%.

[0065] To ensure the required accuracy of analog-to-digital conversion, the effective number of bits in the analog-to-digital converter here is more than 13.

[0066] The communication interface is a CAN bus interface, an RS485 bus interface, or an Ethernet bus interface.

[0067] Figure 5 A flowchart of a testing method provided by an embodiment of this disclosure is shown, such as... Figure 5 As shown, test method 500 is applied to Figures 2-4 The test system shown includes the following steps:

[0068] S510 is an excitation voltage source that provides excitation voltage to the digital output circuit.

[0069] The S520 analog-to-digital converter acquires the excitation voltage of the excitation voltage source as the voltage input data of the digital output circuit, and acquires the output voltage of the digital output circuit as the voltage output data of the digital output circuit.

[0070] The S530 microcontroller obtains the operating status of the digital output circuit through the communication interface; based on the voltage input data and voltage output data, it obtains the input voltage and output voltage of the digital output circuit; and based on the operating status of the digital output circuit, the input voltage, and the output voltage, it determines whether the digital output circuit is faulty.

[0071] In some embodiments, when the digital output circuit is in the off state, the microcontroller calculates a first ratio of the output voltage to the input voltage; when the digital output circuit is in the on state, the microcontroller calculates a second ratio of the output voltage to the input voltage.

[0072] The microcontroller determines a digital output circuit fault when the first proportion is greater than a first preset threshold and / or the second proportion is less than a second preset threshold. The first preset threshold is less than the second preset threshold, and both can be flexibly adjusted according to the structure of the digital output circuit. Typically, the first preset threshold can be 2%, and the second preset threshold can be 95%.

[0073] When the first ratio is less than or equal to a first preset threshold and the second ratio is greater than or equal to a second preset threshold, the microcontroller calculates the difference between the input voltage and the output voltage when the digital output circuit is in the "on" state. It then searches for the voltage range containing this difference from preset voltage ranges. If the found voltage range is a normal voltage range, the digital output circuit is determined to be functioning correctly; otherwise, if the found voltage range is an abnormal voltage range, the digital output circuit is determined to be faulty. Each voltage range can be preset according to actual conditions.

[0074] In this way, the voltage ratio in the off and on states and the voltage difference in the on state can be used to accurately determine whether the digital output circuit is faulty from multiple dimensions.

[0075] In this embodiment of the disclosure, voltage input data and voltage output data of the digital output circuit can be collected based on the analog-to-digital converter, and then the microcontroller can calculate the input voltage and output voltage of the digital output circuit. Based on the operating status of the digital output circuit obtained through the communication interface and the previously calculated input voltage and output voltage, it can be accurately determined whether the digital output circuit is faulty, thereby improving the test results.

[0076] It is worth noting that the internal resistance and voltage drop of different components in the digital output circuit are fixed. Therefore, different fault causes, i.e., different component failures, will result in corresponding voltage ranges (the range of variation in the difference between the input and output voltages). Therefore, referring to S530, after determining a fault in the digital output circuit, the microcontroller can accurately identify the faulty component in the digital output circuit based on the fault cause corresponding to the voltage range of the difference.

[0077] For example, the difference between the input voltage and the output voltage is the input voltage minus the output voltage. When the voltage range is 0.3 to 0.7V, the fault is caused by the breakdown of the reverse connection protection diode, thus the reverse connection protection diode is faulty. When the voltage range is greater than 1V, the fault is caused by the breakdown of multiple diodes or insufficient drive voltage of the MOSFET, thus multiple diodes or the MOSFET are faulty.

[0078] Furthermore, to facilitate timely problem detection and response by users, the microcontroller can send fault determination results to the host computer via a communication interface.

[0079] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this disclosure is not limited to the described order of actions, because according to this disclosure, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this disclosure.

[0080] Figure 6 A structural diagram of an exemplary electronic device capable of implementing embodiments of the present disclosure is shown. Electronic device 500 is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic device 500 may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0081] like Figure 6As shown, the electronic device 500 may include a computing unit 501, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 502 or a computer program loaded from a storage unit 508 into a random access memory (RAM) 503. The RAM 503 may also store various programs and data required for the operation of the electronic device 500. The computing unit 501, ROM 502, and RAM 503 are interconnected via a bus 504. An input / output (I / O) interface 505 is also connected to the bus 504.

[0082] Multiple components in electronic device 500 are connected to I / O interface 505, including: input unit 506, such as keyboard, mouse, etc.; output unit 507, such as various types of monitors, speakers, etc.; storage unit 508, such as disk, optical disk, etc.; and communication unit 509, such as network card, modem, wireless transceiver, etc. Communication unit 509 allows electronic device 500 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0083] The computing unit 501 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 501 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 501 performs the various methods and processes described above, such as method 500. For example, in some embodiments, method 500 may be implemented as a computer program product, including a computer program tangibly contained in a computer-readable medium, such as storage unit 508. In some embodiments, part or all of the computer program may be loaded and / or installed on device 500 via ROM 502 and / or communication unit 509. When the computer program is loaded into RAM 503 and executed by the computing unit 501, one or more steps of method 500 described above may be performed. Alternatively, in other embodiments, the computing unit 501 may be configured to perform method 500 by any other suitable means (e.g., by means of firmware).

[0084] The various embodiments described above can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), system-on-a-chip (SoCs), payload programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0085] The program code used to implement the methods of this disclosure may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing apparatus, such that when executed by the processor or controller, the program code causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0086] In the context of this disclosure, a computer-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. A computer-readable medium can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of computer-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0087] It should be noted that this disclosure also provides a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to cause a computer to execute method 500 and achieve the corresponding technical effects achieved by the embodiments of this disclosure in executing the method. For the sake of brevity, these will not be elaborated here.

[0088] In addition, this disclosure also provides a computer program product including a computer program that implements method 500 when executed by a processor.

[0089] To provide interaction with a user, the embodiments described above can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0090] The embodiments described above can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with the implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication (e.g., a communication network) of any form or medium. Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0091] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact via communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other. Servers can be cloud servers, servers in distributed systems, or servers incorporating blockchain technology.

[0092] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this disclosure can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this disclosure can be achieved, and this is not limited herein.

[0093] The specific embodiments described above do not constitute a limitation on the scope of protection of this disclosure. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A test system for digital output circuits, characterized in that, The system includes: an excitation voltage source, an analog-to-digital converter, a microcontroller, and a communication interface; The excitation voltage source is connected to the voltage input terminal of the digital output circuit and the analog-to-digital converter, respectively; the voltage output terminal of the digital output circuit is connected to the analog-to-digital converter; the analog-to-digital converter is connected to the microcontroller; the microcontroller communicates with the digital output circuit through the communication interface. The excitation voltage source is used to provide excitation voltage to the digital output circuit; The analog-to-digital converter is used to acquire the excitation voltage of the excitation voltage source as the voltage input data of the digital output circuit; and to acquire the output voltage of the digital output circuit as the voltage output data of the digital output circuit. The microcontroller is used to acquire the operating status of the digital output circuit through the communication interface; to obtain the input voltage and output voltage of the digital output circuit based on the voltage input data and the voltage output data; and to determine whether the digital output circuit is faulty based on the operating status of the digital output circuit, the input voltage, and the output voltage. Specifically, determining whether the digital output circuit is faulty based on its operating state, the input voltage, and the output voltage includes: when the digital output circuit is in a closed state, the microcontroller calculates a first ratio of the output voltage to the input voltage; when the digital output circuit is in an open state, the microcontroller calculates a second ratio of the output voltage to the input voltage; if the first ratio is greater than a first preset threshold and / or the second ratio is less than a second preset threshold, the microcontroller determines that the digital output circuit is faulty; wherein the first preset threshold is less than the second preset threshold; if the first ratio is less than or equal to the first preset threshold and the second ratio is greater than or equal to the second preset threshold, the microcontroller calculates the difference between the input voltage and the output voltage when the digital output circuit is in an open state, and searches for the voltage range containing the difference from preset different voltage ranges; if the found voltage range is a normal voltage range, the digital output circuit is determined not to be faulty; if the found voltage range is an abnormal voltage range, the digital output circuit is determined to be faulty.

2. The system according to claim 1, characterized in that, The system further includes a voltage divider circuit, which includes a first resistor and a second resistor. One end of the first resistor is connected to the voltage output terminal of the digital output circuit, and the other end of the first resistor is connected to one end of the second resistor and the analog-to-digital converter; the other end of the second resistor is connected to the ground terminal. The analog-to-digital converter is used to collect the voltage at the connection point of the first resistor and the second resistor, and use it as the voltage output data of the digital output circuit.

3. The system according to claim 2, characterized in that, The system also includes: an operational amplifier; The input terminal of the operational amplifier is connected to the other end of the first resistor and one end of the second resistor, respectively; the output terminal of the operational amplifier is connected to the analog-to-digital converter.

4. The system according to claim 1, characterized in that, The microcontroller communicates with the host computer through the communication interface; The microcontroller is also used to send the fault determination result to the host computer through the communication interface after determining whether the digital output circuit is faulty based on the operating state of the digital output circuit, the input voltage and the output voltage.

5. The system according to claim 1, characterized in that, The effective number of bits of the analog-to-digital converter is more than 13 bits.

6. A test method based on the test system as described in any one of claims 1-5, characterized in that, The method includes: The excitation voltage source provides excitation voltage to the digital output circuit; The analog-to-digital converter acquires the excitation voltage of the excitation voltage source as the voltage input data of the digital output circuit; and acquires the output voltage of the digital output circuit as the voltage output data of the digital output circuit. The microcontroller obtains the operating status of the digital output circuit through the communication interface; based on the voltage input data and the voltage output data, it obtains the input voltage and output voltage of the digital output circuit; based on the operating status of the digital output circuit, the input voltage, and the output voltage, it determines whether the digital output circuit is faulty. Specifically, determining whether the digital output circuit is faulty based on its operating state, the input voltage, and the output voltage includes: When the digital output circuit is in the off state, the microcontroller calculates the first ratio of the output voltage to the input voltage; When the digital output circuit is in the ON state, the microcontroller calculates a second ratio of the output voltage to the input voltage; If the first ratio is greater than a first preset threshold and / or the second ratio is less than a second preset threshold, the microcontroller determines that the digital output circuit is faulty; wherein the first preset threshold is less than the second preset threshold. When the first ratio is less than or equal to the first preset threshold and the second ratio is greater than or equal to the second preset threshold, the microcontroller calculates the difference between the input voltage and the output voltage when the digital output circuit is in the on state, and searches for the voltage range in which the difference is located from preset different voltage ranges. If the voltage range found is a normal voltage range, the digital output circuit is determined to be fault-free; if the voltage range found is an abnormal voltage range, the digital output circuit is determined to be faulty.

7. The method according to claim 6, characterized in that, After determining that the digital output circuit is faulty if the found voltage range is an abnormal voltage range, the method further includes: The microcontroller determines the faulty component in the digital output circuit based on the fault cause corresponding to the found voltage range.

8. The method according to claim 6, characterized in that, After determining whether the digital output circuit is faulty based on its operating state, the input voltage, and the output voltage, the method further includes: The microcontroller sends the fault determination result to the host computer through the communication interface.

9. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method of any one of claims 6-8.

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