A transient electromagnetic pulse simulation test device and a control method thereof

Abstract

The application relates to a transient electromagnetic pulse simulation test device and a control method thereof, the transient electromagnetic pulse simulation test device comprising a basic assembly, a replacement assembly and an angle adjusting assembly; the basic assembly is used for supporting the replacement assembly and the angle adjusting assembly; the replacement assembly is used for containing a measured device and replacing the measured device; and the angle adjusting assembly is used for containing an electromagnetic pulse generating device and adjusting the distance and the angle between the electromagnetic pulse generating device and the measured device. The transient electromagnetic pulse simulation test device realizes the up-down movement of the measured device through the replacement assembly, facilitates the replacement of the measured device, adjusts the distance and the angle between the electromagnetic pulse generating device and the measured device through the angle adjusting assembly, facilitates the test on the radiation influence of the measured device under the electromagnetic pulse from different distances and angles, improves the test efficiency, and solves the technical problems that the existing transient electromagnetic pulse simulation test device cannot be quickly replaced, is inconvenient to quickly adjust the test position, and has low test efficiency.

Description

Technical Field

[0001] This application relates to the field of electromagnetic pulse field simulation and testing technology, and in particular to a transient electromagnetic pulse simulation and testing device and its control method. Background Technology

[0002] The transient electromagnetic pulse simulation test system is a system used to simulate and test the anti-interference performance of electronic equipment in an electromagnetic pulse environment. Electromagnetic pulse is a high-energy electromagnetic radiation that can damage or interfere with electronic equipment, communication systems and other sensitive equipment.

[0003] Currently, electromagnetic pulse field simulation testing equipment often requires a large number of tests when performing transient electromagnetic pulse simulation tests. Changing the device under test is inconvenient, and the test results vary depending on the distance and angle between the transient electromagnetic pulse field and the device under test. Existing electromagnetic pulse field simulation testing equipment is not convenient for quickly adjusting the test position of the device under test, resulting in low testing efficiency. Summary of the Invention

[0004] This application provides a transient electromagnetic pulse simulation test device and its control method to solve the technical problems of existing transient electromagnetic pulse simulation test equipment, such as the inability to quickly replace it, the inconvenience of quickly adjusting the test position, and the low test efficiency.

[0005] To achieve the above objectives, the embodiments of this application provide the following technical solutions:

[0006] On the one hand, a transient electromagnetic pulse simulation test device is provided, including basic components, replacement components and angle adjustment components;

[0007] The basic component is used to support the replacement component and the angle adjustment component;

[0008] The replacement component is used to hold the device under test and to replace the device under test.

[0009] The angle adjustment component is used to hold the electromagnetic pulse generator and to adjust the distance and angle between the electromagnetic pulse generator and the device under test.

[0010] Preferably, the angle adjustment assembly includes a second driving member, a rotating cylinder pulsatingly connected to the second driving member, and a distance adjustment mechanism fixedly connected to the rotating cylinder. The rotating cylinder has a cavity for accommodating the replacement assembly, and the electromagnetic pulse generator is mounted on the distance adjustment mechanism. The second driving member drives the rotating cylinder to rotate, thereby rotating the distance adjustment mechanism to adjust the angle between the electromagnetic pulse generator and the device under test.

[0011] Preferably, the distance adjustment mechanism includes a third driving component, a slide rail, a transmission component, and a placement box. The third driving component is mounted on a support frame, the support frame is fixed on the slide rail, and the transmission component is mounted on both sides of the slide rail. The placement box is movably sleeved on the transmission component, and the electromagnetic pulse generator is disposed on the placement box. The third driving component drives the transmission component to rotate, thereby moving the placement box on the slide rail to adjust the distance between the electromagnetic pulse generator and the device under test.

[0012] Preferably, the placement box is provided with a slider that matches and engages with the transmission component.

[0013] Preferably, the distance adjustment mechanism includes a gear transmission unit, and the third driving member is connected to the transmission member via the gear transmission unit; the gear transmission unit includes a driving rod, a first bevel gear sleeved and fixed on the driving rod, a second bevel gear meshing with the first bevel gear, a first connecting rod connected to the second bevel gear, a third bevel gear sleeved and fixed on the first connecting rod, and a fourth bevel gear meshing with the third bevel gear; both output ends of the third driving member are connected to one of the driving rods, and the fourth bevel gear is sleeved and fixed on each of the transmission members.

[0014] Preferably, the replacement assembly includes a first driving component, a fourth driving component, a second connecting rod, a baffle, and a placement tray. The first driving component is mounted on the basic assembly via a fixing bracket. The output end of the first driving component is connected to the second connecting rod via the connection tray. The second connecting rod is connected to the baffle. The fourth driving component is fixedly mounted on the connection tray. The output end of the fourth driving component is connected to the placement tray. The placement tray is used to place the device under test (DUT). The baffle is located outside the fourth driving component and the placement tray. The first driving component drives the second connecting rod to rotate, thereby rotating the baffle to protect the DUT. The fourth driving component drives the placement tray to move up and down to facilitate the replacement of the DUT.

[0015] Preferably, the basic components include a support column and an anti-interference test box mounted on the support column, wherein the top of the anti-interference test box has a viewing window.

[0016] Preferably, the outer wall of the anti-interference test box has a window for replacing the electromagnetic pulse generator, and a sliding baffle is provided on the anti-interference test box corresponding to the position of the window.

[0017] Preferably, the transient electromagnetic pulse simulation test device includes a controller, which is installed on the top of the anti-interference test box, and the controller is used to control the operation of the replacement component and the angle adjustment component.

[0018] On another front, a control method for a transient electromagnetic pulse simulation test device is provided, applied to the aforementioned transient electromagnetic pulse simulation test device. This control method includes the following steps:

[0019] The operating parameters of the device under test are obtained, and the operation of the device under test is controlled according to the operating parameters to obtain the operating status of the device under test;

[0020] If the operating status indicates that the device under test is normal, place the device under test on the placement tray of the replacement component and transfer it to the test area inside the anti-interference test box of the basic component.

[0021] An electromagnetic pulse generator is used to emit transient electromagnetic pulses of different intensities onto the device under test, and first test data on the effect of the transient electromagnetic pulse radiation on the device under test is obtained.

[0022] After adjusting the distance and angle between the electromagnetic pulse generator and the device under test using the angle adjustment component, the electromagnetic pulse generator emits a transient electromagnetic pulse of the same intensity onto the device under test, and the second and third test data corresponding to the influence of the transient electromagnetic pulse radiation on the device under test are obtained.

[0023] After the device under test is tested, the placement tray containing the device under test is removed from the test area inside the anti-interference test box by the replacement component.

[0024] This transient electromagnetic pulse (EMIP) simulation test device and its control method include a basic component, a replacement component, and an angle adjustment component. The basic component supports the replacement component and the angle adjustment component. The replacement component holds the device under test (DUT) and facilitates its replacement. The angle adjustment component holds the electromagnetic pulse generator and adjusts the distance and angle between the electromagnetic pulse generator and the DUT. As can be seen from the above technical solution, the embodiments of this application have the following advantages: the EMIP simulation test device allows the DUT to move up and down via the replacement component, facilitating DUT replacement; the angle adjustment component adjusts the distance and angle between the electromagnetic pulse generator and the DUT, making it easier to test the DUT's electromagnetic pulse radiation effect from different distances and angles, thus improving test efficiency; and it solves the technical problems of existing EMIP simulation test devices, such as the inability to quickly replace components, the difficulty in quickly adjusting the test position, and the low test efficiency. Attached Figure Description

[0025] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0026] Figure 1 This is a three-dimensional structural diagram of the transient electromagnetic pulse simulation test device described in the embodiments of this application;

[0027] Figure 2 This is a cross-sectional view of the transient electromagnetic pulse simulation test device described in the embodiments of this application;

[0028] Figure 3 This is a schematic diagram of the distance adjustment mechanism in the transient electromagnetic pulse simulation test device described in the embodiments of this application;

[0029] Figure 4 This is a cross-sectional view of the distance adjustment mechanism in the transient electromagnetic pulse simulation test device described in the embodiments of this application;

[0030] Figure 5 This is a schematic diagram of the structure of the placement box in the transient electromagnetic pulse simulation test device described in the embodiments of this application;

[0031] Figure 6 This is a schematic diagram of the structure of the component replacement device in the transient electromagnetic pulse simulation test apparatus described in the embodiments of this application;

[0032] Figure 7 This is a flowchart illustrating the steps of the control method for the transient electromagnetic pulse simulation test device described in an embodiment of this application. Detailed Implementation

[0033] To make the inventive objectives, features, and advantages of this application more apparent and understandable, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0034] In the description of the embodiments of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0035] In the embodiments of this application, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0036] This application provides a transient electromagnetic pulse simulation test device and its control method, which solves the technical problems of existing transient electromagnetic pulse simulation test equipment that cannot be quickly replaced, is not convenient for quick adjustment of the test position, and has low test efficiency.

[0037] Example 1:

[0038] Figure 1 This is a three-dimensional structural diagram of the transient electromagnetic pulse simulation test device described in the embodiments of this application.

[0039] like Figure 1 As shown in the figure, this application provides a transient electromagnetic pulse simulation test device, including a basic component 1, a replacement component 2, and an angle adjustment component 3.

[0040] In this embodiment, the basic component 1 can be used to support the replacement component 2 and the angle adjustment component 3.

[0041] It should be noted that a replacement component 2 is provided at the top center of the basic component 1, and an angle adjustment component 3 is provided at the bottom center of the basic component 1.

[0042] In this embodiment, the replacement component 2 can be used to hold the device under test (DUT) and to replace the DUT. The angle adjustment component 3 can be used to hold the electromagnetic pulse generator and to adjust the distance and angle between the electromagnetic pulse generator and the DUT.

[0043] It should be noted that this transient electromagnetic pulse simulation test device has two main functions: first, it uses a replaceable component 2 to hold the device under test (DUT); second, it allows the DUT to be moved up and down for easy replacement. The device also uses an angle adjustment component 3 to hold the electromagnetic pulse generator and to adjust the distance and angle between the generator and the DUT. This allows for testing the DUT's electromagnetic pulse radiation effects from different distances and angles, improving testing efficiency and enabling rapid assessment of the impact of transient electromagnetic pulses on the DUT from different angles. The DUT can be equipment susceptible to electromagnetic radiation, such as electrical equipment.

[0044] This application provides a transient electromagnetic pulse (EMIP) simulation testing device, comprising a basic component, a replacement component, and an angle adjustment component. The basic component supports the replacement component and the angle adjustment component. The replacement component holds the device under test (DUT) and facilitates its replacement. The angle adjustment component holds the electromagnetic pulse generator and adjusts the distance and angle between the electromagnetic pulse generator and the DUT. This EMIP simulation testing device allows for the vertical movement of the DUT via the replacement component, facilitating its replacement. The angle adjustment component allows for the adjustment of the distance and angle between the electromagnetic pulse generator and the DUT, enabling testing of the DUT's electromagnetic pulse radiation effects from different distances and angles, thus improving testing efficiency. This solves the technical problems of existing EMIP simulation testing devices, such as the inability to quickly replace components, the difficulty in quickly adjusting the test position, and the low testing efficiency.

[0045] like Figure 1 As shown, in one embodiment of this application, the basic component 1 includes a support column and an anti-interference test box 101 mounted on the support column. A viewing window 104 is provided at the top of the anti-interference test box 101. A window for replacing the electromagnetic pulse generator is provided on the outer wall of the anti-interference test box 101, and a sliding baffle 103 is provided on the anti-interference test box at the position corresponding to the window.

[0046] It should be noted that the viewing window 104 can be made of viewing glass. Basic component 1 includes an anti-interference test chamber 101, with a sliding baffle 103 slidably connected to the front outer wall of the anti-interference test chamber 101. The top of the sliding baffle 103 penetrates through the outer wall of the anti-interference test chamber 101. The viewing window 104 facilitates observation of the testing conditions inside the anti-interference test chamber 101. The anti-interference test chamber 101 creates a good testing environment, ensuring the entire testing process takes place inside, preventing external signals from affecting the test results. The sliding baffle 103 can slide up and down to open, facilitating the replacement and maintenance of the electromagnetic pulse generator.

[0047] like Figure 1As shown, in one embodiment of this application, the transient electromagnetic pulse simulation test device includes a controller 102, which is installed on the top of the anti-interference test box 101. The controller 102 is used to control the operation of the replacement component 2 and the angle adjustment component 3.

[0048] It should be noted that a controller 102 is fixedly connected to the outer diameter of the top of the anti-interference test box 101 near the left side of the sliding baffle 103, and a viewing window 104 is provided on the outer wall of the top of the anti-interference test box 101 near the inner side of the controller 102.

[0049] Figure 2 This is a cross-sectional view of the transient electromagnetic pulse simulation test device described in the embodiments of this application. Figure 3 This is a schematic diagram of the distance adjustment mechanism in the transient electromagnetic pulse simulation test device described in this application embodiment. Figure 4 This is a cross-sectional view of the distance adjustment mechanism in the transient electromagnetic pulse simulation test device described in this application embodiment. Figure 5 This is a schematic diagram of the structure of the placement box in the transient electromagnetic pulse simulation test device described in the embodiment of this application.

[0050] like Figures 1 to 5 As shown, in one embodiment of this application, the angle adjustment component 3 includes a second driving member 302, a rotating cylinder 303 that is pulsatorically connected to the second driving member 302, and a distance adjustment mechanism that is fixedly connected to the rotating cylinder 303. The rotating cylinder 303 has a cavity for accommodating replacement components, and the electromagnetic pulse generator is mounted on the distance adjustment mechanism. The second driving member 302 drives the rotating cylinder 303 to rotate, thereby causing the distance adjustment mechanism to rotate, so as to adjust the angle between the electromagnetic pulse generator and the device under test.

[0051] It should be noted that the second driving component 302 can be selected as a motor. The second driving component 302 is enclosed by a protective housing 301. The second driving component 302 is fixedly connected to the middle of the inner wall of the protective housing 301. The driving end of the second driving component 302 penetrates through the outer wall of the protective housing 301 and is fixedly connected to a rotating cylinder 303. The second driving component 302 can drive the rotating cylinder 303 to rotate, thereby rotating the distance adjustment mechanism to adjust the angle between the device under test and the electromagnetic pulse generator. The distance adjustment mechanism is fixedly engaged with the outer wall surface of the rotating cylinder 303.

[0052] like Figures 1 to 5As shown, in one embodiment of this application, the distance adjustment mechanism includes a third driving member 306, a slide rail 304, a transmission member 305, and a placement box 308. The third driving member 306 is mounted on a support frame 307, which is fixed to the slide rail 304. Transmission members 305 are mounted on both sides of the slide rail 304 and move within the slide rail 304. The placement box 308 is movably sleeved on the transmission member 305, and the electromagnetic pulse generator is mounted on the placement box 308. The third driving member 306 drives the transmission member 305 to rotate, causing the placement box 308 to move on the slide rail 304 to adjust the distance between the electromagnetic pulse generator and the device under test. The placement box 308 is provided with a slider 315 that matches and sleeves with the transmission member 305. The distance adjustment mechanism includes a gear transmission unit. The third drive unit 306 is connected to the transmission unit 305 via the gear transmission unit. The gear transmission unit includes a drive rod 309, a first bevel gear 310 sleeved and fixed on the drive rod 309, a second bevel gear 311 meshing with the first bevel gear 310, a first connecting rod 312 connected to the second bevel gear 311, a third bevel gear 313 sleeved and fixed on the first connecting rod 312, and a fourth bevel gear 314 meshing with the third bevel gear 313. Both output ends of the third drive unit 306 are connected to a drive rod 309, and a fourth bevel gear 314 is sleeved and fixed on each transmission unit 305.

[0053] It should be noted that the third driving component 306 is preferably a dual-head motor. The transmission component 305 can first be a threaded rod. The slider 315 is provided with a thread that matches the transmission component 305. A slide rail 304 is fixedly connected to the top of the outer wall of the rotating cylinder 303. A support frame 307 is fixedly connected to the front side of the top of the slide rail 304. A third driving component 306 is fixedly connected to the middle of the top of the support frame 307. A driving rod 309 is fixedly connected to the driving ends on both sides of the third driving component 306. A first bevel gear 310 is fixedly connected to the opposite end of the driving rod 309. A second bevel gear 311 is meshed with the bottom of the outer diameter of the first bevel gear 310. A first connecting rod 312 is fixedly connected to the middle of the bottom of the second bevel gear 311. A third bevel gear 313 is fixedly connected to the bottom of the first connecting rod 312. A fourth bevel gear 314 is meshed with the bottom of the outer diameter of the third bevel gear 313. 4. A transmission component 305 is fixedly connected to the middle of the inner wall of each component 305. A slider 315 is threadedly connected to the outer wall of each transmission component 305. A sliding placement box 308 is fixedly connected to one end of each slider 315. When the third driving component 306 is activated, it drives the driving rod 309 to rotate, which in turn drives the first bevel gear 310 to rotate, causing the second bevel gear 311 to rotate, which in turn drives the first connecting rod 312 to rotate, causing the third bevel gear 313 to rotate, and then the fourth bevel gear 314 to rotate, which drives the transmission component 305 to rotate. This causes the slider 315 to drive the electromagnetic pulse generator on the sliding placement box 308 to slide inward a specified distance on the slide rail 304, thereby changing the distance between the electromagnetic pulse generator and the device under test. The transmission component 305 is rotatably connected to the inner wall of the slide rail 304 at both ends, and the outer wall of the first connecting rod 312 is rotatably connected to the inner wall of the support frame 307. The transmission component 305 facilitates the sliding of the sliding placement box 308 on the inner wall of the slide rail 304. The outer walls of the drive rods 309 are rotatably connected to the inner walls of the support frame 307, and the sliding placement boxes 308 are slidably connected to the inner walls of the slide rails 304. The opposite ends of the outer walls of the sliders 315 are slidably connected to the left and right sides of the inner walls of the slide rails 304.

[0054] In this embodiment, the transient electromagnetic pulse simulation test device is equipped with a slide rail and a placement box, which allows the test personnel to quickly control the third drive component through the controller to move the placement box a specified distance on the slide rail, thereby changing the distance between the electromagnetic pulse generator and the device under test, determining the impact of the transient electromagnetic pulse radiation distance on the normal operation of the device under test, and quickly testing the impact of transient electromagnetic pulses on the device under test under different distance conditions.

[0055] Figure 6 This is a schematic diagram of the structure of the component replacement device in the transient electromagnetic pulse simulation test device described in the embodiments of this application.

[0056] like Figure 1 , Figure 2 and Figure 6As shown, in one embodiment of this application, the replacement component 2 includes a first driving member 203, a fourth driving member 204, a second connecting rod 206, a baffle 205, and a placement tray 207. The first driving member 203 is mounted on the basic component 1 via a fixing bracket 201. The output end of the first driving member 203 is connected to the second connecting rod 206 via the connecting tray 202. The second connecting rod 206 is connected to the baffle 205. The fourth driving member 204 is fixedly mounted on the connecting tray 202. The output end of the fourth driving member 204 is connected to the placement tray 207, which is used to place the device under test. The baffle 205 is located outside the fourth driving member 204 and the placement tray 207. The first driving member 203 drives the second connecting rod 206 to rotate, thereby rotating the baffle 205 to protect the device under test. The fourth driving member 204 drives the placement tray 207 to move up and down to facilitate the replacement of the device under test.

[0057] It should be noted that the first driving component 203 can be a motor, the fourth driving component 204 can be an electric push rod, the baffle 205 can be a highly transparent plastic baffle, and the fixing frame 201 is installed on the top of the anti-interference test box 101. In this embodiment, the replacement component 2 of the transient electromagnetic pulse simulation test device is provided with at least two fourth driving components 204. In order to facilitate the placement of the device under test, the output end of the fourth driving component 204 is connected to the edge of the placement plate 207. The mounting bracket 201 has a first driving component 203 fixedly connected to its top right side. The driving end of the first driving component 203 passes through the bottom of the mounting bracket 201 and is fixedly connected to a connecting plate 202. The bottom of the connecting plate 202 has second connecting rods 206 fixedly connected to both its front and rear sides. The bottom of the second connecting rods 206 has a baffle 205 made of highly transparent plastic fixedly connected to its bottom. Rotation of the first driving component 203 causes the connecting plate 202 to rotate, which in turn causes the baffle 205 at the bottom of the second connecting rods 206 to rotate. The baffle 205 protects the device under test from damage due to excessive radiation and does not significantly affect the test results. The bottom of the connecting plate 202 has fourth driving components 204 fixedly connected to both its front and rear sides near the inner side of the second connecting rods 206. The bottom of the fourth driving component 204 has a placement plate 207 fixedly connected to its bottom. The fourth driving component 204 facilitates the up-and-down movement of the placement plate 207, making it easy to remove and replace the device under test on the placement plate 207, thus improving testing efficiency. The top of the outer wall of the baffle 205 is rotatably connected to the middle of the inner wall of the top of the anti-interference test box 101. The bottom of the fixing frame 201 is fixedly connected to the left side of the top of the anti-interference test box 101 near the baffle 205. The fixing frame 201 facilitates the support of a series of equipment such as the connecting plate 202.

[0058] In this embodiment, the transient electromagnetic pulse simulation test device is equipped with an anti-interference test box and a fourth driving component, which allows the entire simulation test process to be carried out inside the anti-interference test box, preventing external signals from interfering with the test results and improving test accuracy. The fourth driving component can also pull the device under test on the placement plate to the outside of the anti-interference test box, allowing for rapid replacement of the device under test and facilitating quick testing of different devices under test, thereby improving the efficiency of simulation testing.

[0059] In this embodiment, the third drive component 306 and the second drive component 301 of the transient electromagnetic pulse simulation test device are both electrically connected to the controller 102. The top of the outer wall of the rotating cylinder 303 is rotatably connected to the middle of the bottom of the inner wall of the anti-interference test chamber 101. The controller 102 can easily control the start and stop of the third drive component 306 and the second drive component 301. The rotating cylinder 303 can easily drive the slide rail 304 to rotate on the inner wall of the anti-interference test chamber 101 to change the test angle.

[0060] It should be noted that this transient electromagnetic pulse simulation test device, by setting up a rotating cylinder and a connecting plate, allows the test personnel to control the start of the second driving component through the controller to drive the rotating cylinder to rotate, so that the slide rail rotates on the inner wall of the anti-interference test chamber, thereby quickly determining the degree of influence of transient electromagnetic pulses on the tested equipment at different angles.

[0061] Example 2:

[0062] Figure 7 This is a flowchart illustrating the steps of the control method for the transient electromagnetic pulse simulation test device described in an embodiment of this application.

[0063] like Figure 7 As shown, this application provides a control method for a transient electromagnetic pulse simulation test device, applied to the aforementioned transient electromagnetic pulse simulation test device. The control method includes the following steps:

[0064] S1. Obtain the operating parameters of the device under test, control the operation of the device under test according to the operating parameters, and obtain the operating status of the device under test;

[0065] S2. If the operating status of the device under test is normal, place the device under test on the placement tray of the replacement component and transfer it to the test area inside the anti-interference test box of the basic component;

[0066] S3. Use an electromagnetic pulse generator to emit transient electromagnetic pulses of different intensities to the device under test, and obtain the first test data on the effect of transient electromagnetic pulse radiation on the device under test;

[0067] S4. After adjusting the distance and angle between the electromagnetic pulse generator and the device under test using the angle adjustment component, the electromagnetic pulse generator emits a transient electromagnetic pulse of the same intensity onto the device under test, and obtains the second and third test data corresponding to the influence of the transient electromagnetic pulse radiation on the device under test.

[0068] S5. After the device under test is tested, the tray holding the device under test is removed from the test area inside the anti-interference test box by replacing the component.

[0069] It should be noted that the contents of the transient electromagnetic pulse simulation test device have already been described in Embodiment 1, and the contents of the transient electromagnetic pulse simulation test device will not be described in detail in this embodiment.

[0070] In this embodiment, the control method of the transient electromagnetic pulse simulation test device involves the following steps: First, the tester selects some devices to be tested as devices under test (DUTs). The normal operating parameters of the DUTs, such as voltage fluctuations, frequency offset range, and signal response time, are obtained from the DUTs' instruction manuals. Then, all DUTs are tested to ensure their current data is normal. If abnormal, a new DUT is selected. If the DUTs are normal, the parameters of the electromagnetic pulse generator are set. In step S2, the DUT is placed in the test area inside the anti-interference test box of the basic components. Step S2 involves using a fourth driving component to raise the placement tray to the outside of the anti-interference test box, placing the qualified DUTs on the tray, and then using the fourth driving component to push the DUTs on the tray into the test area inside the anti-interference test box. In step S3, the electromagnetic pulse generator is activated to emit transient electromagnetic pulses of different intensities to the DUTs. The data of the DUTs under the influence of the transient electromagnetic pulse radiation are recorded as the first test data. Based on the deviation between the first test data and the normal data, the degree of influence of transient electromagnetic pulses of different intensities on the normal operation of the DUTs is determined. In step S4, the external controller activates the third drive unit, causing the drive rod to rotate. This, in turn, rotates the first bevel gear, causing the second bevel gear to rotate, which in turn rotates the first connecting rod, causing the third bevel gear to rotate. The fourth bevel gear then rotates, driving the transmission component to rotate. This causes the slider to move the electromagnetic pulse generator on the placement box inward a specified distance along the slide rail, changing the distance between the electromagnetic pulse generator and the device under test (DUT). Electromagnetic pulses of the same intensity are repeatedly emitted to obtain second test data. The deviation between the second test data and normal data is used to determine the impact of the transient electromagnetic pulse radiation distance on the normal operation of the DUT. The second drive unit at the bottom rotates the rotating cylinder, causing the slide rail to rotate a certain angle on the outer wall of the baffle. Electromagnetic pulses of the same intensity are then repeatedly emitted to the DUT to obtain third test data. The deviation between the third test data and normal data is used to determine the degree of influence of electromagnetic pulses at different angles on various data of the DUT. In step S5, when the DUT needs to be replaced, the fourth drive unit can directly pull the DUT from the placement tray to the outside of the anti-interference test box. This allows for quick replacement of the DUT, facilitating rapid testing of different DUTs and improving simulation testing efficiency.

[0071] For example, a computer program can be divided into one or more modules / units, one or more of which are stored in memory and executed by a processor to complete this application. One or more modules / units can be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program in a terminal device.

[0072] Terminal devices can be computing devices such as desktop computers, laptops, handheld computers, and cloud servers. Terminal devices may include, but are not limited to, processors and memory. Those skilled in the art will understand that this does not constitute a limitation on the terminal device, which may include more or fewer components than illustrated, or combinations of certain components, or different components. For example, a terminal device may also include input / output devices, network access devices, buses, etc.

[0073] The processor referred to can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor.

[0074] Memory can be an internal storage unit of a terminal device, such as a hard drive or RAM. Memory can also be an external storage device, such as a plug-in hard drive, Smart Memory Card (SMC), Secure Digital Card (SD), or Flash Memory Card. Furthermore, memory can include both internal and external storage units. Memory is used to store computer programs and other programs and data required by the terminal device. Memory can also be used to temporarily store data that has been output or will be output.

[0075] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0076] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection between apparatuses or units through some interfaces, and may be electrical, mechanical, or other forms.

[0077] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0078] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0079] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RDM), magnetic disks, or optical disks.

[0080] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A transient electromagnetic pulse simulation test device, characterized in that, Includes basic components, replacement components, and angle adjustment components; The basic component is used to support the replacement component and the angle adjustment component; The replacement component is used to hold the device under test and to replace the device under test. The angle adjustment component is used to hold the electromagnetic pulse generator and to adjust the distance and angle between the electromagnetic pulse generator and the device under test. The angle adjustment assembly includes a second driving member, a rotating cylinder that is pulsatorically connected to the second driving member, and a distance adjustment mechanism that is fixedly connected to the rotating cylinder. The rotating cylinder has a cavity for accommodating the replacement assembly, and the electromagnetic pulse generator is mounted on the distance adjustment mechanism. The second driving component drives the rotating cylinder to rotate, which in turn drives the distance adjustment mechanism to rotate, thereby adjusting the angle between the electromagnetic pulse generator and the device under test.

2. The transient electromagnetic pulse simulation test device according to claim 1, characterized in that, The distance adjustment mechanism includes a third driving component, a slide rail, a transmission component, and a placement box. The third driving component is mounted on a support frame, and the support frame is fixed on the slide rail. The transmission component is mounted on both sides of the slide rail. The placement box is movably sleeved on the transmission component, and the electromagnetic pulse generator is mounted on the placement box. The third driving component drives the transmission component to rotate, thereby moving the placement box on the slide rail to adjust the distance between the electromagnetic pulse generator and the device under test.

3. The transient electromagnetic pulse simulation test device according to claim 2, characterized in that, The placement box is equipped with a slider that matches and engages with the transmission component.

4. The transient electromagnetic pulse simulation test device according to claim 2, characterized in that, The distance adjustment mechanism includes a gear transmission unit, and the third driving component is connected to the transmission component via the gear transmission unit. The gear transmission unit includes a driving rod, a first bevel gear sleeved and fixed on the driving rod, a second bevel gear meshing with the first bevel gear, a first connecting rod connected to the second bevel gear, a third bevel gear sleeved and fixed on the first connecting rod, and a fourth bevel gear meshing with the third bevel gear. Both output ends of the third driving component are connected to one of the driving rods, and the fourth bevel gear is sleeved and fixed on each of the transmission components.

5. The transient electromagnetic pulse simulation test device according to claim 1, characterized in that, The replacement assembly includes a first driving component, a fourth driving component, a second connecting rod, a baffle, and a placement tray. The first driving component is mounted on the basic assembly via a mounting bracket. The output end of the first driving component is connected to the second connecting rod via the connection tray. The second connecting rod is connected to the baffle. The fourth driving component is fixedly mounted on the connection tray, and its output end is connected to the placement tray. The placement tray is used to place the device under test (DUT). The baffle is located outside the fourth driving component and the placement tray. The first driving component drives the second connecting rod to rotate, thereby rotating the baffle to protect the DUT. The fourth driving component drives the placement tray to move up and down to facilitate the replacement of the DUT.

6. The transient electromagnetic pulse simulation test device according to claim 1, characterized in that, The basic components include a support column and an anti-interference test box mounted on the support column, with a viewing window at the top of the anti-interference test box.

7. The transient electromagnetic pulse simulation test device according to claim 6, characterized in that, The outer wall of the anti-interference test box has a window for replacing the electromagnetic pulse generator, and a sliding baffle is provided on the anti-interference test box corresponding to the position of the window.

8. The transient electromagnetic pulse simulation test device according to claim 6, characterized in that, The system includes a controller mounted on top of the anti-interference test chamber, which controls the operation of the replacement component and the angle adjustment component.

9. A control method for a transient electromagnetic pulse simulation test device, applied to the transient electromagnetic pulse simulation test device as described in any one of claims 1-8, characterized in that, The control method includes the following steps: The operating parameters of the device under test are obtained, and the operation of the device under test is controlled according to the operating parameters to obtain the operating status of the device under test; If the operating status indicates that the device under test is normal, place the device under test on the placement tray of the replacement component and transfer it to the test area inside the anti-interference test box of the basic component. An electromagnetic pulse generator is used to emit transient electromagnetic pulses of different intensities onto the device under test, and first test data on the effect of the transient electromagnetic pulse radiation on the device under test is obtained. After adjusting the distance and angle between the electromagnetic pulse generator and the device under test using the angle adjustment component, the electromagnetic pulse generator emits a transient electromagnetic pulse of the same intensity onto the device under test, and the second and third test data corresponding to the influence of the transient electromagnetic pulse radiation on the device under test are obtained. After the device under test is tested, the placement tray containing the device under test is removed from the test area inside the anti-interference test box by the replacement component.

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