Large aperture and large field of view telescope splicing target surface flatness detection method

Abstract

The present application relates to the field of semiconductor laser, especially to a large-aperture large-field-of-view telescope spliced target surface flatness detection method, comprising the following steps: S1: placing a microlens array for realizing defocus above the spliced target surface of the large-aperture large-field-of-view telescope; S2: turning on a light source to irradiate the microlens array, and detecting the flatness between the spliced target surfaces by detecting the size of the defocused light spot on the spliced target surface. The present application only needs to place the microlens array above the spliced target surface, without the need for high-precision moving equipment and scanning of the spliced target surface, and the detection method is simpler and more efficient.

Description

Technical Field

[0001] This invention relates to the field of flatness testing technology, and in particular to a method for testing the flatness of a spliced ​​target surface of a large-aperture, large-field-of-view telescope. Background Technology

[0002] The existing method for detecting the flatness of the spliced ​​target surface of a large-aperture, wide-field-of-view telescope is to measure the distance from the aperture to the target surface using a triangular laser rangefinder, measure multiple positions on the target surface, and use data fitting to calculate the average height of the target surface. The flatness between the spliced ​​target surfaces is then detected by judging whether the average heights of the spliced ​​target surfaces are equal.

[0003] This laser ranging detection method requires scanning multiple positions on the target surface. At this time, it is necessary to ensure the horizontal movement accuracy of the triangular laser rangefinder to avoid detection errors that would lead to inaccurate detection results. Summary of the Invention

[0004] In view of the above problems, this invention proposes a simple and quick method for detecting the flatness of the spliced ​​target surface of a large-aperture, large-field-of-view telescope.

[0005] The method for detecting the flatness of the spliced ​​target surface of a large-aperture, large-field-of-view telescope provided by this invention includes the following steps:

[0006] S1: A microlens array for defocusing is placed above the splicing target surface of a large-aperture, large-field-of-view telescope.

[0007] S2: Turn on the light source to illuminate the microlens array, and detect the flatness between the splicing target surfaces by detecting the size of the defocused light spot on the splicing target surface.

[0008] Preferably, the flatness between the splicing target surfaces is detected by measuring the brightness of the defocused spot on the splicing target surface and, in conjunction with the spot size, the flatness between the splicing target surfaces.

[0009] Preferably, the microlens array is made of liquid crystal polymer material.

[0010] Compared with existing technologies, the present invention only requires placing the microlens array above the splicing target surface, without the need for high-precision mobile equipment or scanning of the splicing target surface, making the detection method simpler and more efficient. Attached Figure Description

[0011] Figure 1 This is a flowchart illustrating the method for detecting the flatness of a spliced ​​target surface of a large-aperture, large-field-of-view telescope according to an embodiment of the present invention.

[0012] Figure 2 This is a schematic diagram illustrating a method for detecting the flatness of a spliced ​​target surface in a large-aperture, large-field-of-view telescope, as provided in an embodiment of the present invention.

[0013] Figure labels: Target surface 1, Microlens array 2, Light source 3. Detailed Implementation

[0014] In the following description, embodiments of the invention will be described with reference to the accompanying drawings. In the description below, the same modules are denoted by the same reference numerals. Where the same reference numerals are used, their names and functions are also the same. Therefore, their detailed description will not be repeated.

[0015] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not constitute a limitation thereof.

[0016] The following is combined with Figure 1 and Figure 2 The method for detecting the flatness of the spliced ​​target surface of a large-aperture, large-field-of-view telescope provided in the embodiments of the present invention will be described in detail.

[0017] like Figure 1 and Figure 2 As shown in the figure, the method for detecting the flatness of the spliced ​​target surface of a large-aperture, large-field-of-view telescope provided in this embodiment of the invention includes the following steps:

[0018] S1: A microlens array for defocusing is placed above the splicing target surface of a large-aperture, wide-field telescope.

[0019] Figure 1 Four splicing target surfaces 1 are shown. A microlens array 2 is set between two adjacent splicing target surfaces 1. A total of four microlens arrays 2 are set to detect the flatness between the edges of two adjacent splicing target surfaces 1.

[0020] Of course, the size of the two columns of the microlens array can also be increased to cover the four splicing target surfaces 1. For ordinary microlens arrays 2, the material is glass. In order to increase the size of the microlens array 2, liquid crystal polymer material is selected for the microlens array 2.

[0021] The position of the microlens array 2 is not chosen to coincide with the position of the splicing target surface 1, so that the beam illuminating the microlens array 2 will have a certain amount of defocus.

[0022] S2: Turn on the light source 3 to illuminate the microlens array 2, and detect the flatness between the splicing target surfaces by detecting the size of the defocused light spot on the splicing target surface 1.

[0023] When the splicing target surface 1 is not flat, there is a height difference between the splicing target surfaces 1. The size of the light spot produced by the defocus amount on the splicing target surface 1 is different. By detecting the size of the defocused light spot on the splicing target surface 1, the flatness between the splicing target surfaces 1 can be detected. By adjusting the size of the defocused light spot, the flatness between the splicing target surfaces 1 can be adjusted.

[0024] If two out-of-focus spots are of similar size and cannot be judged by the naked eye, the brightness of the out-of-focus spot can be used for detection.

[0025] The greater the defocus, the lower the brightness of the light spot; conversely, the lower the defocus, the higher the brightness of the light spot. By judging the brightness of the defocused light spot on the stitching target surface 1, the flatness between the stitching target surfaces 1 can also be detected. Detecting the light spot brightness in conjunction with the light spot size can improve the detection accuracy.

[0026] This invention does not use laser ranging to detect the flatness between the spliced ​​target surfaces 1, so there is no need to precisely move the triangular laser rangefinder or scan the spliced ​​target surfaces, making the detection method simpler and more effective.

[0027] It should be understood that the various forms of processes shown above can be used to reorder, add, or delete steps. For example, the steps described in this invention disclosure can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this invention can be achieved, and this is not limited herein.

[0028] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for detecting the flatness of a spliced ​​target surface in a large-aperture, wide-field-of-view telescope, characterized in that, Includes the following steps: S1: A microlens array for defocusing is placed above the splicing target surface of a large-aperture, large-field-of-view telescope. S2: Turn on the light source to illuminate the microlens array, and detect the size and brightness of the defocused spot on the splicing target surface. By combining the spot brightness with the spot size, the flatness between the splicing target surfaces is detected.

2. The method for detecting the flatness of the spliced ​​target surface of a large-aperture, large-field-of-view telescope as described in claim 1, characterized in that, The microlens array is made of liquid crystal polymer material.

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