Test method, device and equipment of multiplexer and storage medium

Abstract

The application discloses a test method, device and equipment of a multiplexer and a storage medium, and relates to the technical field of integrated circuits. The method comprises the following steps: obtaining a first test configuration file; configuring a logic circuit between an output port and each input port according to a path configuration parameter, and enabling a first input port according to a first port selection parameter; testing the conduction state of a circuit between the first input port and the output port; obtaining a second test configuration file, enabling a second input port; and testing the conduction state of a circuit between the second input port and the output port. When testing any input port other than the first input port in the multiplexer, only the port selection parameter of the corresponding input port needs to be obtained, and the path configuration parameter does not need to be repeatedly obtained, thereby reducing the time consumption and storage space required for obtaining the configuration file when testing the multiplexer due to repeated acquisition of the path configuration parameter, and improving the test efficiency.

Description

Technical Field

[0001] This application relates to the field of integrated circuit technology, and in particular to a test method, apparatus, device, and storage medium for a multiplexer. Background Technology

[0002] With the expansion of the application fields and the increase in application requirements of Field-Programmable Gate Array (FGPA) chips, the scale of programmable circuits is constantly expanding and programmable resources are constantly increasing. As the system integration level continues to improve, the chip size is constantly increasing, and the number of transmission ports connecting the chip to external circuits is increasing. When testing chips using traditional testing methods, the testing efficiency is very low. Therefore, how to test chips efficiently is an urgent problem to be solved. Summary of the Invention

[0003] This application proposes a test method, apparatus, device, and storage medium for a multiplexer.

[0004] In a first aspect, embodiments of this application provide a testing method for a multiplexer, the multiplexer including an output port and a plurality of input ports. The method includes: obtaining a first test configuration file, the first test configuration file including at least path configuration parameters and a first port selection parameter; configuring the logic circuit between the output port and each of the input ports according to the path configuration parameters, and selecting a first input port according to the first port selection parameter, the first input port being any one of the plurality of input ports; testing the continuity state of the circuit between the first input port and the output port; obtaining a second test configuration file, the second test configuration file including a second port selection parameter, and selecting a second input port according to the second port selection parameter, the second input port being any other input port among the plurality of input ports besides the first input port; and testing the continuity state of the circuit between the second input port and the output port.

[0005] Secondly, embodiments of this application provide a testing apparatus for a multiplexer. The multiplexer includes an output port and multiple input ports. The testing apparatus includes: a first test configuration file acquisition module, used to acquire a first test configuration file, the first test configuration file including at least path configuration parameters and a first port selection parameter; a first input port selection module, used to configure the logic circuit between the output port and each of the input ports according to the path configuration parameters, and select a first input port according to the first port selection parameter, the first input port being any one of the multiple input ports; a first testing module, used to test the continuity state of the circuit between the first input port and the output port; a second input port selection module, used to acquire a second test configuration file, the second test configuration file including a second port selection parameter, and select a second input port according to the second port selection parameter, the second input port being any other input port besides the first input port among the multiple input ports; and a second testing module, used to test the continuity state of the circuit between the second input port and the output port.

[0006] Thirdly, embodiments of this application provide a computer device, the computer device comprising: one or more processors; a memory; one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, and the one or more programs are configured to perform the methods described above.

[0007] Fourthly, embodiments of this application provide a computer-readable storage medium storing program code that can be invoked by a processor to execute the methods described above.

[0008] The testing method for a multiplexer provided in this application includes: obtaining a first test configuration file, which includes at least path configuration parameters and a first port selection parameter; configuring the logic circuit between the output port and each input port according to the path configuration parameters, and selecting a first input port according to the first port selection parameter, wherein the first input port is any one of multiple input ports; testing the continuity state of the circuit between the first input port and the output port; obtaining a second test configuration file, which includes a second port selection parameter, and selecting a second input port according to the second port selection parameter, wherein the second input port is any one of multiple input ports other than the first input port; and testing the continuity state of the circuit between the second input port and the output port. Based on this, when performing continuity testing on the circuit between any input port (i.e., the second input port) and the output port of a multiplexer other than the first input port, it is only necessary to obtain the port selection parameters of the second input port. There is no need to repeatedly obtain the path configuration parameters for configuring the output port with each input port. The storage space required for the second test configuration file corresponding to each second input port is small, which reduces the time required to obtain the second test configuration file. This reduces the time required to obtain multiple test configuration files when testing the multiplexer, thereby improving the efficiency of testing the multiplexer.

[0009] These or other aspects of this application will become more apparent in the following description of the embodiments. Attached Figure Description

[0010] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0011] Figure 1 A schematic diagram of a test system for a multiplexer provided in an embodiment of this application is shown.

[0012] Figure 2 A flowchart illustrating a testing method for a multiplexer provided in an embodiment of this application is shown.

[0013] Figure 3 A flowchart illustrating a test method for a multiplexer provided in another embodiment of this application is shown.

[0014] Figure 4 It shows Figure 3 A flowchart illustrating a sub-step of step S340 in one embodiment.

[0015] Figure 5 It shows Figure 3 A flowchart illustrating a sub-step of step S360 in one embodiment.

[0016] Figure 6 It shows Figure 5 A flowchart illustrating a sub-step of step S365 in one embodiment.

[0017] Figure 7 A flowchart illustrating a test method for a multiplexer provided in another embodiment of this application is shown.

[0018] Figure 8 A structural block diagram of a test apparatus for a multiplexer provided in an embodiment of this application is shown.

[0019] Figure 9 A structural block diagram of a computer device provided in an embodiment of this application is shown.

[0020] Figure 10 A structural block diagram of a computer-readable storage medium provided in an embodiment of this application is shown. Detailed Implementation

[0021] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are merely some embodiments of the present application, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present application without creative effort are within the scope of protection of the present application.

[0022] It should be noted that some processes described in the specification, claims, and accompanying drawings of this application include multiple operations that appear in a specific order. These operations may not be performed in the order they appear herein, or they may be performed in parallel. Operation numbers such as S110, S120, etc., are merely used to distinguish different operations and do not represent any execution order. Furthermore, these processes may include more or fewer operations, and these operations may be performed sequentially or in parallel. Also, the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having”, and any variations thereof, are intended to cover non-exclusive inclusion, such that a process, method, system, product, or server that includes a series of steps or sub-modules is not necessarily limited to those steps or sub-modules that are explicitly listed, but may include other steps or sub-modules that are not explicitly listed or that are inherent to such process, method, product, or device.

[0023] Please see Figure 1 , Figure 1 A schematic diagram of a test system 1 for a multiplexer 20 according to an embodiment of this application is shown. The test system 1 for the multiplexer 20 includes at least a main control module 10, which is communicatively connected to the multiplexer 20. The multiplexer 20 includes an output port and multiple input ports, and can be applied in a clock network.

[0024] In this embodiment, when the main control module 10 tests the multiplexer 20 under test, it needs to first download the test configuration file (i.e., bit stream file) pre-generated by the electronic device 30 for the multiplexer 20 under test to the multiplexer 20 for debugging. Therefore, the test system 1 for the multiplexer 20 also includes the electronic device 30, which is communicatively connected to the main control module 10. When the electronic device 30 receives a file request command sent by the main control module 10, it can call the pre-stored configuration information of the multiplexer 20 under test based on the file request command, generate a test configuration file for conducting continuity tests on the multiplexer 20 under test based on the obtained configuration information, and send the generated test configuration file to the main control module 10. The test configuration file (i.e., bit stream file) is a binary data file that needs to be loaded into a field-programmable gate array (FPGA) to execute a specific hardware design. It records the configuration information of programmable logic units and wiring resources. Downloading the bit stream file to the FPGA can realize the specific circuit function involved. The FPGA in this application can be the multiplexer 20 under test.

[0025] In this case, when performing continuity tests on multiple input ports of the multiplexer 20, the test configuration file corresponding to each input port needs to be downloaded to the multiplexer 20 under test before testing each input port. Then, the relevant input ports and logic circuits for each test must be correctly configured. In related technologies, after testing a single input port, when testing the next input port, it is necessary to download the complete test configuration file related to each input port test. This results in the need to repeatedly obtain the configuration information between the output port and each input port when performing continuity tests on multiple input ports of the multiplexer 20. The multiple test configuration files required for continuity tests on multiple input ports of the multiplexer 20 occupy a large amount of storage space. Furthermore, the more input ports the multiplexer 20 has, the longer it takes for the main control module 10 to download multiple test configuration files during testing, resulting in low efficiency in testing the multiplexer 20.

[0026] In this embodiment, when performing continuity tests on multiple input ports of the multiplexer 20, the configuration information of the logic circuit between the output port and each input port is the same during each test, meaning that the path configuration parameters included in the test configuration file corresponding to each input port are consistent. Therefore, when the electronic device 30 pre-generates a test configuration file for the multiplexer 20 under test, it only needs to generate a complete test configuration file for the first input port. The first test configuration file includes at least the path configuration parameters and the first port selection parameters of the multiplexer 20. For any other input port (i.e., the second input port) among the multiple input ports other than the first input port, the second test configuration file generated by the electronic device 30 can include only the second port selection parameters, thereby reducing the size of the multiple test configuration files required to test the multiplexer 20.

[0027] Furthermore, after obtaining the first test configuration file and completing the test of the circuit continuity status between the first input port and the output port, the main control module 10 tests the circuit continuity status between the second input port and the output port. When obtaining the second test configuration file, it only replaces the first port selection parameter with the second port selection parameter included in the second test configuration file, thereby switching the test port from the first input port to the second input port, and correctly configuring the logic circuit based on the path configuration parameters in the obtained first test configuration file.

[0028] In this embodiment, when performing a continuity test on any input port other than the first input port among multiple input ports, it is not necessary to repeatedly obtain the path configuration parameters of the output port and each input port. The storage space occupied by multiple test configuration files required to test the multiplexer 20 is reduced, thereby reducing the time required for the main control module 10 to download multiple test configuration files and improving the efficiency of testing the multiplexer 20.

[0029] Please refer to Figure 2 , Figure 2 A flowchart illustrating a testing method for a multiplexer according to an embodiment of this application is shown. The following will be combined with... Figure 2 The testing method for the multiplexer provided in the embodiments of this application is described in detail. Please refer to [reference needed] for the testing method of this multiplexer. Figure 2 This may include the following steps:

[0030] Step S210: Obtain the first test configuration file, which includes at least the path configuration parameters and the first port selection parameters.

[0031] In this embodiment, when testing multiple input ports of a multiplexer, it is necessary to obtain a complete test configuration file generated by the electronic device for one input port of the multiplexer. Firstly, when testing the first input port of the multiplexer, a first test configuration file for the first input port is obtained. The first input port can be any one of the multiple input ports, and the first test configuration file includes at least path configuration parameters and first port selection parameters.

[0032] Step S220: Configure the logic circuit between the output port and each input port according to the path configuration parameters, and select the first input port according to the first port selection parameters. The first input port is any one of the multiple input ports.

[0033] In this embodiment, based on the obtained first test configuration file, the logic circuit between the output port and each input port can be configured according to the path configuration parameters in the first test configuration file, and the first input port can be selected from multiple input ports according to the first port selection parameters in the first test configuration file. The path configuration parameters are used to configure the operating parameters of the logic circuit between the output port and each input port in the multiplexer under test. For example, the path configuration parameters may include parameters such as bit current, current, voltage, and frequency, to configure the circuit structure, current, voltage, frequency, and other operating parameters of the multiplexer accordingly.

[0034] Optionally, when selecting the first input port from multiple input ports according to the first port selection parameter, since the multiple input ports of the multiplexer are connected to the internal selection circuit of the multiplexer, the first port selection parameter, as a control signal, can determine whether each input port is in the on or off state by the level of the control signal, thereby selecting the first input port from the multiple input ports to be in the on state through the first port selection parameter.

[0035] Step S230: Test the continuity of the circuit between the first input port and the output port.

[0036] In this embodiment, since multiple input ports of the multiplexer are connected to a test signal source to receive test signals from the test signal source, the working parameters of the logic circuit between the output port and each input port of the multiplexer under test are configured based on the path configuration parameters in the first test configuration file. When the first input port is selected according to the first port selection parameters, the multiplexer can receive the test signal through the first input port in the conducting state, thereby realizing the test of the circuit conduction state between the first input port and the output port.

[0037] Optionally, the test signal source can be a test signal source connected to the main control module. After the main control module completes the parameter configuration of the multiplexer, it controls the test signal sources connected to multiple input ports of the multiplexer to output test signals. Alternatively, the test signal source can be a test signal source built into the main control module. After the main control module completes the parameter configuration of the multiplexer, it generates a test signal and outputs it to the first input port of the multiplexer.

[0038] Step S240: Obtain the second test configuration file, which includes a second port selection parameter. Based on the second port selection parameter, select the second input port. The second input port is any input port other than the first input port among multiple input ports.

[0039] In this embodiment, after testing the circuit continuity between the first input port and the output port, since the first test configuration file includes a complete test configuration file for the multiplexer, when testing any input port other than the first input port (the second input port), only the test configuration file used for switching the input port needs to be obtained. That is, by obtaining the second test configuration file including the second port selection parameters, and replacing the first port selection parameters with the second port selection parameters included in the second test configuration file, the test port can be switched from the first input port to the second input port, and the correct configuration of the logic circuit can be achieved based on the path configuration parameters in the stored first test configuration file.

[0040] Step S250: Test the continuity of the circuit between the second input port and the output port.

[0041] In this embodiment, the working parameters of the logic circuit between the output port and each input port in the multiplexer under test are configured based on the stored path configuration parameters. When the conducting input port is switched to the second input port according to the second test configuration file obtained this time, the multiplexer can receive the test signal from the second input port in the conducting state, thereby realizing the test of the circuit conduction state between the second input port and the output port.

[0042] Optionally, after testing the continuity of the circuit between the first input port and the output port, this application sequentially obtains the second test configuration files corresponding to the other input ports (excluding the first input port) from among the multiple input ports. Based on the second port selection parameters in the second test configuration files, the corresponding second input port is selected to test the continuity of the circuit between the second input port and the output port, thereby achieving continuity testing of all input ports of the multiplexer. Furthermore, when performing continuity testing on any input port other than the first input port, this application does not require repeatedly obtaining the path configuration parameters for configuring the output port with each input port. This reduces the storage space occupied by the multiple test configuration files required for testing the multiplexer, thereby reducing the time required for the main control module to download multiple test configuration files and improving the efficiency of testing the multiplexer.

[0043] In the embodiments of this application, a first test configuration file is obtained, which includes at least path configuration parameters and a first port selection parameter; according to the path configuration parameters, the logic circuit between the output port and each input port is configured, and according to the first port selection parameter, a first input port is selected, where the first input port is any one of multiple input ports; the continuity state of the circuit between the first input port and the output port is tested; a second test configuration file is obtained, which includes a second port selection parameter, and according to the second port selection parameter, a second input port is selected, where the second input port is any one of multiple input ports other than the first input port; the continuity state of the circuit between the second input port and the output port is tested. When performing continuity testing on the circuit between any input port (i.e., the second input port) and the output port of a multiplexer other than the first input port, this application only needs to obtain the port selection parameters of the second input port. It does not need to repeatedly obtain the path configuration parameters for configuring the output port with each input port. The storage space required for the second test profile corresponding to each second input port is small, which reduces the time required to obtain the second test profile. This reduces the time required to obtain multiple test profiles when testing the multiplexer. Moreover, the more input ports the multiplexer has, the better the effect of reducing test time, thereby improving the efficiency of testing the multiplexer.

[0044] Please refer to Figure 3 , Figure 3 A flowchart illustrating a test method for a multiplexer according to another embodiment of this application is shown. The following will be combined with... Figure 3 The testing method for the multiplexer provided in the embodiments of this application is described in detail. Please refer to [reference needed] for the testing method of this multiplexer. Figure 3 This may include the following steps:

[0045] Step S310: Send a file request command.

[0046] In this embodiment, when testing the multiplexer begins, a file request command is sent to the electronic device to obtain a first test configuration file from the electronic device.

[0047] Step S320: Receive the first test configuration file fed back by the electronic device based on the file request instruction. The first test configuration file is generated by the electronic device based on the path configuration parameters of the multiplexer and the first port selection parameters.

[0048] In this embodiment, in response to a file request command for the multiplexer under test, the electronic device retrieves the pre-stored path configuration parameters and first port selection parameters of the multiplexer under test from its internal storage data to generate a first test configuration file. The generated first test configuration file is then sent to the main control module connected to the multiplexer under test, thereby enabling the main control module to obtain the first test configuration file fed back by the electronic device based on the file request command.

[0049] Step S330: Configure the logic circuit between the output port and each input port according to the path configuration parameters, and select the first input port according to the first port selection parameters. The first input port is any one of the multiple input ports.

[0050] In this embodiment, the specific implementation of step S330 can be found in the content of the foregoing embodiments, and will not be repeated here.

[0051] Step S340: Test the continuity of the circuit between the first input port and the output port.

[0052] In this embodiment, multiple input ports are connected to a test signal source. Please refer to [link / reference]. Figure 4 , Figure 4 It shows Figure 3 A flowchart illustrating a sub-step of step S340 in one embodiment.

[0053] Step S341: Control the test signal source to output the test signal.

[0054] Optionally, the main control module controls the test signal source connected to multiple input ports of the multiplexer to output test signals. Only the first input port, which is in the conducting state, can transmit the received test signal to the logic circuit between the first input port and the output port, thereby realizing the test of the conduction state of the circuit between the first input port and the output port.

[0055] Step S342: If a first output signal is detected at the output port, it is determined that the circuit between the first input port and the output port is connected.

[0056] In this embodiment, when the circuit between the first input port and the output port is connected, the multiplexer can generate a first output signal based on the input test signal and output it from the output port. This first output signal reflects the actual operating state of the circuit in the multiplexer when the multiplexer is configured using the first test profile. Therefore, based on the first output signal output from the output port, the operating state of the circuit between the first input port and the output port can be specifically determined. For example, the test signal may include current and voltage. According to power consumption = current * voltage, the power consumption of the multiplexer can be calculated and used as the first output signal. Then, it is determined whether the power consumption under the configured voltage is within a preset range. If so, it can be concluded that the multiplexer is in normal operating condition.

[0057] Step S343: If the first output signal matches the preset result signal corresponding to the test signal, then it is determined that the circuit between the first input port and the output port is in normal working condition.

[0058] In this embodiment, the first output signal is compared with a preset result signal corresponding to the test signal. The preset result signal corresponding to the test signal is the result signal generated by the multiplexer and the input test signal when the multiplexer is in normal working condition. Therefore, if a match is detected between the first output signal and the preset result signal corresponding to the test signal, it can be specifically determined that the circuit between the first input port and the output port is in normal working condition.

[0059] Step S344: If the first output signal does not match the preset result signal corresponding to the test signal, it is determined that the circuit between the first input port and the output port is in a first abnormal working state, and the first abnormal prompt information is output. The first abnormal prompt information is used to indicate that there is a hardware fault in the circuit between the first input port and the output port, and / or that the path configuration parameters are incorrect.

[0060] In this embodiment, the first output signal is compared with the preset result signal corresponding to the test signal. If the first output signal does not match the preset result signal corresponding to the test signal, it can be specifically determined that the circuit between the first input port and the output port is in a first abnormal working state.

[0061] When the circuit between the first input port and the output port fails to function properly, it may be due to a hardware fault in the circuit between the first input port and the output port, such as a problem with the circuit structure design of the logic circuit between the first input port and the output port; or, the path configuration parameters obtained by the main control module are incorrect, such as incorrect current or voltage values ​​configured in the logic circuit; or, the circuit between the first port and the output port has a hardware fault, and the obtained path configuration parameters are also incorrect, which is not limited here. Based on the mismatch between the preset result signal corresponding to the first output signal and the test signal, the main control module generates and outputs a first abnormality prompt message to indicate to the designer that there is a hardware fault in the circuit between the first input port and the output port, and / or that the path configuration parameters are incorrect. When the designer detects the first abnormality prompt message issued by the main control module, they can determine the cause of the fault during the testing process of the multiplexer, thereby quickly locating the fault location and handling it in a timely manner.

[0062] Step S350: Obtain the second test configuration file, which includes a second port selection parameter. Based on the second port selection parameter, select the second input port, which is any input port other than the first input port among multiple input ports.

[0063] When testing the multiplexer begins, the main control module sends a file request command to the electronic device to obtain a first test configuration file for the first input port. The main control module also controls the test signal source to input test signals to the multiplexer. When the main control module detects that the continuity test of the first input port is completed, it obtains a second test configuration file for the second input port from the electronic device. This enables automatic detection of each input port of the multiplexer without the need for additional Design for Testability (DFT) circuitry in the chip, thereby reducing chip size and saving chip manufacturing costs.

[0064] In this embodiment, the specific implementation of step S350 can be found in the content of the foregoing embodiments, and will not be repeated here.

[0065] Step S360: Test the continuity of the circuit between the second input port and the output port.

[0066] Optionally, if the circuit between the second input port and the output port is detected to be in normal working condition, the second test configuration file corresponding to the next second input port to be tested is obtained from the electronic device according to the preset input port test order, thereby selecting the next second input port to be tested and completing the test of the circuit continuity status between the second input port and the output port until the continuity test of all input ports of the multiplexer is completed.

[0067] In this embodiment, multiple input ports are connected to a test signal source. Please refer to [link / reference]. Figure 5 , Figure 5 It shows Figure 3 A flowchart illustrating a sub-step of step S360 in one embodiment.

[0068] Please see Figure 5 , Figure 5 It shows Figure 3 A flowchart illustrating a sub-step of step S360 in one embodiment. In this embodiment, multiple input ports are connected to a test signal source.

[0069] Step S361: Control the test signal source to output the test signal.

[0070] Optionally, the main control module controls the test signal source connected to multiple input ports of the multiplexer to output test signals. Only the second input port, which is in the conducting state, can transmit the received test signal to the logic circuit between the second input port and the output port, thereby realizing the test of the conduction state of the circuit between the second input port and the output port.

[0071] Step S362: If the first output signal matches the preset result signal corresponding to the test signal, and a second output signal is detected at the output port, then it is determined that the circuit between the second input port and the output port is connected.

[0072] In this embodiment, if the first output signal matches the preset result signal corresponding to the test signal, it indicates that the hardware design of the circuit between the first input port and the output port is correct, and the path configuration parameters can correctly configure the logic circuit. At this time, when testing the conduction state of the circuit between the second input port and the output port, if a second output signal is detected at the output port, it indicates that the circuit between the second input port and the output port is conductive, enabling the multiplexer to generate a second output signal based on the input test signal.

[0073] Step S363: If the second output signal matches the preset result signal corresponding to the test signal, then it is determined that the circuit between the second input port and the output port is in normal working condition.

[0074] In this embodiment, the second output signal is compared with the preset result signal corresponding to the test signal. If the second output signal matches the preset result signal corresponding to the test signal, it can be specifically determined that the circuit between the second input port and the output port is in normal working condition.

[0075] Step S364: If the second output signal does not match the preset result signal corresponding to the test signal, it is determined that the circuit between the second input port and the output port is in a second abnormal working state, and a second abnormal prompt message is output. The second abnormal prompt message is used to indicate that there is a hardware fault in the second input port.

[0076] In this embodiment, the second output signal is compared with the preset result signal corresponding to the test signal. If the second output signal does not match the preset result signal corresponding to the test signal, it can be specifically determined that the circuit between the second input port and the output port is in a second abnormal working state.

[0077] If the detection shows that the preset result signal corresponding to the first output signal matches the test signal, it means that the hardware design and path configuration parameters of the logic circuit between the second input port and the output port are correct. If the circuit between the second input port and the output port cannot work normally at this time, it may be due to a hardware fault in the selection circuit at the second input port; or, the selection parameters of the second port are incorrect, causing the second input port to fail to conduct normally; or, the selection circuit at the second input port has a hardware fault and the selection parameters of the second port are incorrect, which is not limited here.

[0078] Optionally, based on the mismatch between the second output signal and the preset result signal corresponding to the test signal, the main control module generates and outputs a second abnormality prompt message to indicate to the designer that there is a hardware fault in the selection circuit at the second input port, and / or that the path configuration parameters are incorrect. Furthermore, when the designer detects the second abnormality prompt message issued by the main control module, they can determine the cause of the fault during the multiplexer's testing process, thereby quickly locating the fault and handling it promptly.

[0079] Step S365: If no second output signal is detected at the output port, check whether the second input port is successfully selected.

[0080] In this embodiment, if the output port of the multiplexer detects the first output signal when the first input port is selected, and the first output signal matches the preset result signal corresponding to the test signal, but when the input port is switched from the first input port to the second input port, the output port of the multiplexer does not detect the second output signal, it indicates that the multiplexer cannot receive the test signal input from the test signal source from the second input port even when the logic circuit between the second input port and the output port is working normally. In this case, it may be that the second input port cannot be selected based on the obtained second test configuration file, or it may be due to a hardware fault in the selection circuit at the second input port. Therefore, it is necessary to check whether the second input port is successfully selected. For example, when each input port of the multiplexer is a field-effect transistor (FET), the input port can be controlled to conduct by controlling the driving voltage of the FET corresponding to each input port. If the second input port fails to conduct normally after configuring the FET corresponding to the second input port, the second input port cannot be successfully selected in the event of a component failure of the FET, an incorrect configuration of the FET's driving voltage, or a failure to configure the FET's driving voltage.

[0081] Optionally, the second input port is connected to a self-test signal source; please refer to [link / reference]. Figure 6 , Figure 6 It shows Figure 5 A flowchart illustrating a sub-step of step S365 in one embodiment.

[0082] Step S365-1: If no second output signal is detected at the output port, control the self-detection signal source to output a self-detection signal.

[0083] In this embodiment, if no second output signal is detected at the output port, the main control module controls the self-test signal source to output a self-test signal so that the self-test signal is output to the second input port in the internal selection circuit of the multiplexer to perform a continuity test on the second input port.

[0084] Step S365-2: If a self-test output signal corresponding to the self-test signal is detected at the self-test output port, then the second input port is successfully selected.

[0085] In this embodiment, after configuring the second input port according to the second test configuration file, if the self-test output signal corresponding to the self-test signal is detected at the self-test output port corresponding to the second test input port, it can be determined that the second input port is successfully selected. However, at this time, the second input port cannot transmit the received test signal normally, and the designer needs to test the circuit at the second input port and the second test configuration file corresponding to the second input port.

[0086] In one implementation, the second input port is a field-effect transistor (FET). The main control module is connected to the voltage control pin (gate) of the FET. The source of the FET is connected to the test signal source and the self-test signal source, and the drain of the FET is connected to the self-test output port. When no second output signal is detected at the output port, the main control module controls the self-test signal source to output an electrical signal to the source of the FET. If the main control module detects an electrical signal at the drain of the FET, it can determine that the FET is turned on. However, there may be a FET malfunction or the second test configuration file may not have correctly configured the FET's on-state voltage, causing it to fail to transmit the received test signal normally.

[0087] Step S365-3: If no self-test output signal is detected at the self-test output port, it is determined that the second input port was not successfully selected.

[0088] In this embodiment, if no self-test output signal is detected at the self-test output port, it means that the main control module failed to successfully configure the second input port after obtaining the second test configuration file. This may be because the main control module failed to successfully replace the first port selection parameter with the second port selection parameter in the second test configuration file, or the second port selection parameter in the second test configuration file is incorrect or invalid, thus causing the second input port to fail to be selected successfully.

[0089] Step S366: If the second input port is not successfully selected, the test configuration file for the second input port is re-acquired, and the second input port is selected according to the re-acquired test configuration file.

[0090] In this embodiment, if the second input port is detected as not being successfully selected, the main control module retrieves the test configuration file for the second input port from the electronic device and selects the second input port based on the second port selection parameters in the re-retrieved test configuration file.

[0091] Optionally, after re-acquiring the test configuration file for the second input port and selecting the second input port, the test signal source is controlled to output a test signal to the second input port to test the circuit continuity between the second input port and the output port.

[0092] In some implementations, if the second input port is detected as not being successfully selected, the main control module can output a third error message before retrieving the test configuration file for the second input port. The third error message is used to prompt the designer that there is an error in the test configuration file corresponding to the second input port, so that the designer can correct the test configuration file for the second input port generated by the electronic device in a timely manner, thereby enabling the main control module to obtain the correct test configuration file when retrieving the test configuration file for the second input port from the electronic device.

[0093] In this embodiment, when multiple input ports of the multiplexer are tested, if the output port does not have an output signal and it is determined that the circuit between the input port and the output port is not connected after the multiplexer is configured, and if the output signal output by the output port does not match the preset result signal corresponding to the test signal, different abnormal prompt messages are output to prompt the designer to test the circuit, so that the designer can quickly locate the circuit fault and handle it in a timely manner.

[0094] Please refer to Figure 7 , Figure 7 A flowchart illustrating a test method for a multiplexer according to another embodiment of this application is shown. The following will be combined with... Figure 7 The testing method for the multiplexer provided in the embodiments of this application is described in detail. Please refer to [reference needed] for the testing method of this multiplexer. Figure 7 This may include the following steps:

[0095] Step S410: Generate the first test configuration file.

[0096] Optionally, in response to a file request instruction for the multiplexer under test, the electronic device retrieves pre-stored path configuration parameters and first port selection parameters of the multiplexer under test from internal storage data to generate a first test configuration file, wherein the first input port is any one of a plurality of input ports.

[0097] Step S420: Obtain the second port selection parameters corresponding to each second input port, and generate the second test configuration file corresponding to each second input port.

[0098] In this embodiment, when performing continuity tests on multiple input ports of a multiplexer, the configuration information of the logic circuit between the output port and each input port is the same during each test; that is, the path configuration parameters included in the test configuration file corresponding to each input port are consistent. Therefore, for the input ports other than the first input port (i.e., the second input ports), the electronic device retrieves the pre-stored second port selection parameters corresponding to each second input port of the multiplexer under test from its internal storage data to generate a second test configuration file corresponding to each second input port. The second test configuration file may only include the second port selection parameters, thereby reducing the size of the multiple test configuration files required to test the multiplexer.

[0099] Step S430: Download the first test configuration file and test the first input port.

[0100] In this embodiment, the main control module downloads a first test configuration file for the first input port from the electronic device, configures the logic circuit between the output port of the multiplexer and each input port according to the path configuration parameters in the first test configuration file, and selects the first input port from multiple input ports according to the first port selection parameters in the first test configuration file, thereby realizing the continuity test of the first input port based on the input test signal.

[0101] Step S440: Shut down and reconfigure the download of the second test configuration file, and test the second input port.

[0102] In this embodiment, after completing the test on the first input port, the main control module shuts down the multiplexer by controlling its power supply, and then downloads a second test configuration file for the second input port from the electronic device. The configuration data of the logic circuit between the output port and each input port remains the path configuration parameters in the first test configuration file, while the first port selection parameters are replaced by the second port selection parameters in the second test configuration file. This reconfigures the configuration data corresponding to the multiple input ports of the multiplexer, allowing the main control module to switch the test port from the first input port to the second input port, thus achieving a continuity test on the second input port.

[0103] Step S450: If the test is successful, check whether all input ports have been tested.

[0104] In this embodiment, if the main control module detects that the second input port currently being tested is in a normal conducting state, the main control module checks whether the testing of all input ports of the multiplexer has been completed. If it is detected that not all input ports have been tested, the process proceeds to step S440 again. The main control module then sequentially obtains the second test configuration files corresponding to the other input ports (excluding the first input port) among the multiple input ports, and selects the corresponding second input port based on the second port selection parameters in the second test configuration file, thereby achieving the conduction test of all input ports of the multiplexer. When it is detected that all input ports have been tested, the test of the multiplexer is completed.

[0105] Optionally, if the main control module detects that the second input port under test is not in a normal conducting state, it needs to output an abnormal prompt message to prompt the designer to check the circuit and the configuration parameters of the multiplexer, determine the cause of the fault during the test of the multiplexer, and deal with it in a timely manner.

[0106] In this embodiment, when the main control module performs continuity testing on the circuit between any input port (i.e., the second input port) and the output port of the multiplexer other than the first input port, it only needs to obtain the port selection parameters of the second input port. It does not need to repeatedly obtain the path configuration parameters for configuring the output port with each input port. The storage space required for the second test configuration file corresponding to each second input port is small, which reduces the time required to obtain the second test configuration file. This reduces the time required to obtain multiple test configuration files when testing the multiplexer, thereby improving the efficiency of testing the multiplexer.

[0107] Please refer to Figure 8 , Figure 8 This illustration shows a schematic diagram of a test apparatus 500 for a multiplexer according to an embodiment of this application. The test apparatus 500 for the multiplexer may include: a first test configuration file acquisition module 510, a first input port gating module 520, a first test module 530, a second input port gating module 540, and a second test module 550.

[0108] The first test configuration file acquisition module 510 is used to acquire the first test configuration file, which includes at least the path configuration parameters and the first port selection parameters.

[0109] The first input port selection module 520 is used to configure the logic circuit between the output port and each input port according to the path configuration parameters, and to select the first input port according to the first port selection parameters. The first input port is any one of the multiple input ports.

[0110] The first test module 530 is used to test the continuity of the circuit between the first input port and the output port.

[0111] The second input port selection module 540 is used to obtain the second test configuration file, which includes the second port selection parameters, and selects the second input port according to the second port selection parameters. The second input port is any input port other than the first input port among multiple input ports.

[0112] The second test module 550 is used to test the circuit continuity between the second input port and the output port.

[0113] In this embodiment, the first test module 530 can be specifically used to: control the test signal source to output a test signal; if a first output signal is detected at the output port, determine that the circuit between the first input port and the output port is connected; and determine the working state of the circuit between the first input port and the output port based on the first output signal.

[0114] In some implementations, the first test module 530 may also be specifically used to: if the first output signal matches the preset result signal corresponding to the test signal, determine that the circuit between the first input port and the output port is in normal working condition; if the first output signal does not match the preset result signal corresponding to the test signal, determine that the circuit between the first input port and the output port is in a first abnormal working condition, and output a first abnormal prompt message, the first abnormal prompt message being used to indicate that there is a hardware fault in the circuit between the first input port and the output port, and / or that the path configuration parameters are incorrect.

[0115] In this embodiment, the second test module 550 can be specifically used to: if the first output signal matches the preset result signal corresponding to the test signal, and a second output signal is detected at the output port, then determine that the circuit between the second input port and the output port is conducting; if the second output signal matches the preset result signal corresponding to the test signal, then determine that the circuit between the second input port and the output port is in normal working condition; if the second output signal does not match the preset result signal corresponding to the test signal, then determine that the circuit between the first input port and the output port is in a second abnormal working state, and output a second abnormal prompt message, which is used to indicate that there is a hardware fault in the second input port.

[0116] In some implementations, the second test module 550 may also be specifically used to: if no second output signal is detected at the output port, detect whether the second input port is successfully selected; if the second input port is not successfully selected, re-acquire the test configuration file for the second input port, and select the second input port according to the re-acquired test configuration file.

[0117] Optionally, the second input port is connected to a self-detection signal source, and the second test module 550 can also be specifically used to: if no second output signal is detected at the output port, control the self-detection signal source to output a self-detection signal; if a self-detection output signal corresponding to the self-detection signal is detected at the self-detection output port, determine that the second input port is successfully selected; if no self-detection output signal is detected at the self-detection output port, determine that the second input port is not successfully selected.

[0118] Optionally, the first test configuration file acquisition module 510 can be specifically used to: send a file request instruction; receive the first test configuration file fed back by the electronic device based on the file request instruction, wherein the first test configuration file is generated by the electronic device based on the path configuration parameters and the first port selection parameters of the multiplexer.

[0119] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the above-described device and module can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0120] In the several embodiments provided in this application, the coupling between modules can be electrical, mechanical, or other forms of coupling.

[0121] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0122] In summary, the solution provided in this application involves: obtaining a first test configuration file, which includes at least path configuration parameters and a first port selection parameter; configuring the logic circuit between the output port and each input port according to the path configuration parameters; selecting a first input port, which is any one of multiple input ports, according to the first port selection parameter; testing the continuity of the circuit between the first input port and the output port; obtaining a second test configuration file, which includes a second port selection parameter; selecting a second input port, which is any one of multiple input ports other than the first input port; and testing the continuity of the circuit between the second input port and the output port. Based on this, when performing continuity testing on the circuit between any input port (i.e., the second input port) and the output port of a multiplexer other than the first input port, it is only necessary to obtain the port selection parameters of the second input port. There is no need to repeatedly obtain the path configuration parameters for configuring the output port with each input port. The storage space required for the second test configuration file corresponding to each second input port is small, which reduces the time required to obtain the second test configuration file. This reduces the time required to obtain multiple test configuration files when testing the multiplexer, thereby improving the efficiency of testing the multiplexer.

[0123] The following will combine Figure 9 This application provides a description of a computer device 600.

[0124] Please refer to Figure 9 , Figure 9 The diagram shows a structural schematic of a computer device 600 provided in an embodiment of this application. The above-described method provided in this embodiment of the application can be executed by the computer device 600.

[0125] The computer device 600 in this application embodiment may include the following components: one or more processors 601, memory 602, and one or more application programs, wherein the one or more application programs may be stored in memory 602 and configured to be executed by one or more processors 601, and the one or more programs are configured to perform the methods as described in the foregoing method embodiments.

[0126] Processor 601 may include one or more processing cores. Processor 601 connects to various parts within the computer device 600 using various interfaces and lines, and performs various functions and processes data of the computer device 600 by running or executing instructions, programs, code sets, or instruction sets stored in memory 602, and by calling data stored in memory 602. Optionally, processor 601 may be implemented using at least one hardware form of Digital Signal Processing (DSP), Field-Programmable Gate Array (FPGA), or Programmable Logic Array (PLA). Processor 601 may integrate one or a combination of several of the following: Central Processing Unit (CPU), Graphics Processing Unit (GPU), and modem. The CPU primarily handles the operating system, user interface, and applications; the GPU is responsible for rendering and drawing the displayed content; and the modem handles wireless communication. It is understood that the aforementioned modem can also be integrated into processor 601 and implemented using a separate communication chip.

[0127] The memory 602 may include random access memory (RAM) or read-only memory (ROM). The memory 602 can be used to store instructions, programs, code, code sets, or instruction sets. The memory 602 may include a program storage area and a data storage area. The program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as touch functionality, sound playback functionality, image playback functionality, etc.), and instructions for implementing the various method embodiments described below. The data storage area may also store data created by the computer device 600 during use (such as the various correspondences described above).

[0128] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the above-described device and module can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0129] In the several embodiments provided in this application, the coupling or direct coupling or communication connection between the modules shown or discussed may be an indirect coupling or communication connection through some interface, device or module, and may be electrical, mechanical or other forms.

[0130] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0131] Please refer to Figure 10 , Figure 10 A schematic diagram of a computer-readable storage medium 700 provided in an embodiment of this application is shown. The computer-readable storage medium 700 stores program code 710, which can be called by a processor to execute the methods described in the above method embodiments.

[0132] The computer-readable storage medium 700 may be an electronic memory such as flash memory, EEPROM (Electrically Erasable Programmable Read-Only Memory), EPROM, hard disk, or ROM. Optionally, the computer-readable storage medium 700 includes a non-transitory computer-readable storage medium. The computer-readable storage medium 700 has storage space for program code 710 that performs any of the method steps described above. This program code can be read from or written to one or more computer program products. The program code 710 may be compressed, for example, in a suitable form.

[0133] In some embodiments, a computer program product or computer program is provided, the computer program product or computer program including computer instructions stored in a computer-readable storage medium. A processor of a computer device reads the computer instructions from the computer-readable storage medium, and executes the computer instructions, causing the computer device to perform the steps in the above-described method embodiments.

[0134] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A test method for a multiplexer, characterized in that, The multiplexer includes an output port and multiple input ports, and the method includes: Obtain the first test configuration file, which includes at least the path configuration parameters and the first port selection parameters; According to the path configuration parameters, the logic circuit between the output port and each of the input ports is configured, and according to the first port selection parameters, the first input port is selected, where the first input port is any one of the plurality of input ports; Test the continuity of the circuit between the first input port and the output port; Obtain a second test configuration file, which includes a second port selection parameter, and select a second input port according to the second port selection parameter. The second input port is any input port other than the first input port among the plurality of input ports. The continuity of the circuit between the second input port and the output port is tested.

2. The method according to claim 1, characterized in that, The multiple input ports are connected to the test signal source; The test of the circuit continuity between the first input port and the output port includes: Control the test signal source to output a test signal; If a first output signal is detected at the output port, it is determined that the circuit between the first input port and the output port is connected. Based on the first output signal, determine the operating state of the circuit between the first input port and the output port.

3. The method according to claim 2, characterized in that, Determining the operating state of the circuit between the first input port and the output port based on the first output signal includes: If the first output signal matches the preset result signal corresponding to the test signal, then it is determined that the circuit between the first input port and the output port is in normal working condition. If the first output signal does not match the preset result signal corresponding to the test signal, it is determined that the circuit between the first input port and the output port is in a first abnormal working state, and a first abnormal prompt message is output. The first abnormal prompt message is used to indicate that there is a hardware fault in the circuit between the first input port and the output port, and / or that the path configuration parameters are incorrect.

4. The method according to claim 3, characterized in that, The test of the circuit continuity between the second input port and the output port includes: If the first output signal matches the preset result signal corresponding to the test signal, and a second output signal is detected at the output port, then it is determined that the circuit between the second input port and the output port is connected. If the second output signal matches the preset result signal corresponding to the test signal, then it is determined that the circuit between the second input port and the output port is in normal working condition. If the second output signal does not match the preset result signal corresponding to the test signal, it is determined that the circuit between the second input port and the output port is in a second abnormal working state, and a second abnormal prompt message is output. The second abnormal prompt message is used to indicate that there is a hardware fault in the second input port.

5. The method according to claim 4, characterized in that, The test of the circuit continuity between the second input port and the output port further includes: If the second output signal is not detected at the output port, then check whether the second input port is successfully selected; If the second input port is not successfully selected, a new test configuration file for the second input port is obtained, and the second input port is selected according to the newly obtained test configuration file.

6. The method according to claim 5, characterized in that, The second input port is connected to the self-detection signal source; If the second output signal is not detected at the output port, the step of detecting whether the second input port is successfully selected includes: If the second output signal is not detected at the output port, the self-detection signal source is controlled to output a self-detection signal. If a self-detection output signal corresponding to the self-detection signal is detected at the self-detection output port, then the second input port is determined to be successfully selected. If no self-test output signal is detected at the self-test output port, it is determined that the second input port was not successfully selected.

7. The method according to any one of claims 1 to 6, characterized in that, The process of obtaining the first test configuration file includes: Send file request command; The electronic device receives the first test configuration file based on the file request instruction. The first test configuration file is generated by the electronic device based on the path configuration parameters of the multiplexer and the first port selection parameters.

8. A testing apparatus for a multiplexer, characterized in that, The multiplexer includes an output port and multiple input ports, and the testing device for the multiplexer includes: The first test configuration file acquisition module is used to acquire the first test configuration file, which includes at least the path configuration parameters and the first port selection parameters. The first input port selection module is used to configure the logic circuit between the output port and each input port according to the path configuration parameters, and to select the first input port according to the first port selection parameters, wherein the first input port is any one of the plurality of input ports; The first test module is used to test the circuit continuity between the first input port and the output port; The second input port selection module is used to obtain a second test configuration file, the second test configuration file including a second port selection parameter, and select a second input port according to the second port selection parameter, wherein the second input port is any input port other than the first input port among the plurality of input ports; The second test module is used to test the continuity of the circuit between the second input port and the output port.

9. A computer device, characterized in that, The computer device includes: One or more processors; Memory; One or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, the one or more programs being configured to perform the method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores program code that can be invoked by a processor to perform the method as described in any one of claims 1 to 7.

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