A leakage current handling system, method, apparatus, equipment and medium

Abstract

This invention discloses a leakage current handling system, method, apparatus, device, and medium, relating to the field of leakage current handling technology. During leakage current detection, the system collects the voltage values ​​of each power source under test via a data acquisition module on the processor, achieving online voltage value acquisition. During leakage current handling, because a pre-stored image file containing various leakage current conditions and corresponding handling methods is stored in the processor, the processor can directly call the handling method from the image file to handle the power source leakage after determining that the voltage value of the power source under test is not zero and identifying the leakage path. This achieves online leakage current handling and improves the efficiency of leakage current handling. Furthermore, by changing the output port status of the leakage path from push-pull mode to open-leakage mode, efficient leakage current location and handling are achieved through program control, ensuring the normal operation of the equipment.

Description

Technical Field

[0001] This invention relates to the field of leakage current treatment technology, and in particular to a leakage current treatment system, method, apparatus, equipment and medium. Background Technology

[0002] In integrated digital products, the power supply is the electrical hub of the entire system. Existing systems typically consist of multiple power supplies. Interconnection signals exist between power supplies and devices, and between devices themselves. Due to the sequential power-up process, power supplies that power on earlier can leak power to those that power on later via these interconnection signals. Devices that power on earlier can transmit their own power voltage to the ports of devices that power on later via these interconnection ports, resulting in a voltage drop at the ports of unpowered devices. This voltage drop at the ports of unpowered devices indicates the presence of electrical charge. Touching an unpowered device can introduce this charge into sensitive components, potentially damaging electronic components and causing system or subsequent malfunctions.

[0003] To detect and address leakage current, current-related technical solutions involve manually checking each potential source of leakage, then physically isolating the device connected to the source (e.g., unplugging the power cord) and waiting several minutes for the device to discharge completely. However, this method is inefficient due to human error and prone to measurement errors. Furthermore, products typically have numerous wires, making it difficult to locate the correct wire and increasing the risk of incorrect connections. Additionally, after addressing the leakage, the disconnected wires must be reconnected, making the process relatively complex and inefficient.

[0004] Therefore, providing a new method for handling leakage current to improve the efficiency of leakage current detection and handling is a technical problem that urgently needs to be solved by those in the field. Summary of the Invention

[0005] The purpose of this invention is to provide a leakage current handling system, method, apparatus, equipment, and medium to solve the technical problems of low leakage current detection efficiency and low handling efficiency.

[0006] To solve the above-mentioned technical problems, the present invention provides a leakage current handling system, which is applied to the leakage current handling of a device under test including a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to the corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor.

[0007] The processor includes a data acquisition module, which is connected to each of the power supplies under test on the device under test.

[0008] The processor pre-stores image files containing various leakage current conditions of the device under test and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes leakage current power supply and leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port status of the leakage current path from push-pull mode to open leakage mode.

[0009] The processor is used to acquire the voltage values ​​of each power supply under test collected by the data acquisition module during the power-on of the controller, and determine whether the voltage value of each power supply under test is equal to 0; if not, acquire the power supply under test with a voltage value not equal to 0, and identify the power supply under test with a voltage value not equal to 0 as the target leakage power supply; acquire the target leakage path of the target leakage power supply; acquire the target leakage power supply and the target leakage processing method corresponding to the target leakage path from the image file; and process the leakage of the target leakage power supply according to the target leakage processing method.

[0010] On one hand, the controller is connected to the main power supply; after the processor processes the leakage current of the target leakage power supply according to the target leakage current processing method, it further includes:

[0011] After the leakage current is detected and the issue is resolved, the main power supply is restarted.

[0012] The voltage value of the target leakage current source is acquired by the data acquisition module during the power-on period of the controller;

[0013] The actual leakage path in the target leakage path is determined based on the voltage value of the target leakage power source.

[0014] On the other hand, the target leakage path is determined by the power-on sequence of each power supply under test and the corresponding interconnection relationship of the devices powered by the power supply under test.

[0015] The target leakage path of the target leakage power source is one, and determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source includes:

[0016] If the voltage value of the target leakage current source is detected to be equal to 0, the target leakage current path is determined to be the actual leakage current path.

[0017] The target leakage current source has multiple target leakage current paths. The step of obtaining the target leakage current source and the corresponding target leakage current processing method under the target leakage current path from the image file, and processing the leakage current of the target leakage current source according to the target leakage current processing method, includes:

[0018] Obtain the current target leakage processing method corresponding to the current target leakage path of the target leakage power source from the image file;

[0019] The leakage of the target leakage power supply is processed according to the current target leakage processing method;

[0020] Returning to the step of controlling the main power supply to restart after the leakage current is detected and handled;

[0021] Correspondingly, determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source includes:

[0022] If the voltage value of the target leakage current source is detected to be equal to 0, then the current target leakage path is determined to be the actual leakage path.

[0023] If the voltage value of the target leakage power source is detected to be non-zero, a new current target leakage path is selected from the target leakage paths as the current target leakage path. The new current target leakage path is the leakage path that has not been processed since the start of leakage to the target leakage power source until the moment when the voltage value of the target leakage power source is detected to be non-zero. The process then returns to the step of obtaining the current target leakage processing method corresponding to the current target leakage path of the target leakage power source from the image file.

[0024] On the other hand, after detecting that the voltage value of the target leakage current source is not equal to 0, and before selecting a new current target leakage current path from the target leakage current paths as the current target leakage current path, the method further includes:

[0025] Determine whether a new current target leakage path exists from the start of leakage processing on the target leakage power source until the moment when the voltage value of the target leakage power source is detected to be non-zero.

[0026] If so, proceed to the step of selecting a new current target leakage path from the target leakage paths as the current target leakage path;

[0027] If not, then the leakage current of the device under test is determined to be the leakage current of the main power supply; and a prompt message is output to characterize the leakage current of the main power supply.

[0028] On the other hand, the leakage current handling system also includes: multiple counters;

[0029] The controller is connected to each of the counters and is used to initialize the value of each of the counters after detecting that the device under test is powered on.

[0030] Each of the timers is connected to the processor and is used to count the number of times the power supply under test leaks when the voltage value of the power supply under test is detected to be non-zero, starting from when the processor begins to process the leakage current of each power supply under test.

[0031] On the other hand, it also includes: a memory connected to the processor; and after acquiring the voltage values ​​of each of the power supplies under test collected by the data acquisition module during the power-on of the controller, it further includes:

[0032] The voltage values ​​of each of the power supplies under test are stored in the memory;

[0033] After determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source, the method further includes:

[0034] Obtain leakage current information for each of the power supplies under test; wherein, the leakage current information includes at least the information of the target leakage power supply, the leakage current processing method corresponding to the target leakage power supply, and the leakage current processing result;

[0035] The leakage current information of each of the power supplies under test is stored in the memory.

[0036] To address the aforementioned technical problems, this invention also provides a leakage current handling method, applied to a leakage current handling system for a device under test (DUT) comprising a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to a corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor; the processor includes a data acquisition module connected to each power supply under test on the DUT; the processor pre-stores image files containing various leakage current conditions of the DUT and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes a leakage current power supply and a leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port state of the leakage current path from push-pull mode to open-leakage mode; the method includes:

[0037] The data acquisition module acquires the voltage values ​​of each power supply under test during the power-on period of the controller;

[0038] Determine whether the voltage value of each power supply under test is equal to 0;

[0039] If not, then obtain the test power supply with a voltage value that is not equal to 0, and identify the test power supply with a voltage value that is not equal to 0 as the target leakage power supply;

[0040] Obtain the target leakage path of the target leakage power source;

[0041] Obtain the target leakage current source and the target leakage current handling method corresponding to the target leakage current path from the image file;

[0042] The leakage of the target leakage power source is processed according to the target leakage processing method.

[0043] To address the aforementioned technical problems, this invention also provides a leakage current handling device, applied to a leakage current handling system for handling leakage current in a device under test (DUT) comprising a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to a corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor; the processor includes a data acquisition module connected to each power supply under test on the DUT; the processor pre-stores image files containing various leakage current conditions of the DUT and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes a leakage current power supply and a leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port state of the leakage current path from push-pull mode to open-leakage mode; the device includes:

[0044] The first acquisition module is used to acquire the voltage values ​​of each power supply under test collected by the data acquisition module during the power-on of the controller;

[0045] The judgment module is used to determine whether the voltage value of each power supply under test is equal to 0; if not, the acquisition and determination module is triggered.

[0046] The acquisition and determination module is used to acquire the test power supply with a voltage value that is not equal to 0, and determine the test power supply with a voltage value that is not equal to 0 as the target leakage power supply.

[0047] The second acquisition module is used to acquire the target leakage path of the target leakage power source.

[0048] The third acquisition module is used to acquire the target leakage current source and the target leakage current processing method corresponding to the target leakage current path from the image file.

[0049] The processing module is used to process the leakage current of the target leakage power supply according to the target leakage current processing method.

[0050] To address the aforementioned technical problems, the present invention also provides a leakage current handling device, comprising:

[0051] Memory, used to store computer programs;

[0052] A processor is used to implement the steps of the above-described leakage current handling method when executing the computer program.

[0053] To address the aforementioned technical problems, the present invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the aforementioned leakage current handling method.

[0054] The leakage current handling system provided by this invention is applied to the leakage current handling of a device under test (DUT) comprising a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to a corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor; the processor includes a data acquisition module connected to each power supply under test on the DUT; the processor pre-stores image files containing various leakage current conditions of the DUT and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes a leakage current source and a leakage current path, and each leakage current condition corresponds to... The leakage current handling method involves changing the output port status of the leakage path from push-pull mode to open-drain mode. The processor acquires the voltage values ​​of each power supply under test collected by the data acquisition module during the controller's power-on period, and determines whether the voltage value of each power supply under test is equal to 0. If not, it acquires the power supply under test with a voltage value not equal to 0 and identifies it as the target leakage current power supply. It then acquires the target leakage current path of the target leakage current power supply, obtains the target leakage current power supply and the corresponding target leakage current handling method from the image file, and processes the leakage current of the target leakage current power supply according to the target leakage current handling method.

[0055] The beneficial effects of this invention are as follows: First, during the leakage current detection process, the leakage current handling system collects the voltage values ​​of each power supply under test through the data acquisition module on the processor, realizing online voltage value acquisition. Furthermore, during leakage current handling, because a mirror file containing various leakage current conditions and corresponding handling methods is pre-stored in the processor, the processor can directly call the handling method from the mirror file to handle the power supply leakage after determining that the voltage value of the power supply under test is not 0 and identifying the leakage path. This achieves online leakage current handling and improves the efficiency of leakage current handling. Second, compared to previous leakage current handling methods that physically isolate the device connected to the leakage power supply, the leakage current handling system provided by this invention uses a leakage current handling method that changes the output port state of the leakage path from push-pull mode to open-leakage mode, and handles the leakage current through program control. This avoids plugging and unplugging of wires, improves leakage current handling efficiency, and enables precise location and handling of leakage current.

[0056] After processing the leakage of the target leakage power source according to the target leakage processing method, the voltage value is collected again by controlling the main power supply to restart. Based on the voltage value, the leakage processing result is detected and the actual leakage path is determined.

[0057] For a power supply under test (DUT) with only one target leakage path, the detected voltage value of the target leakage path is equal to 0, thus verifying the leakage elimination and confirming that the leakage path is the actual leakage path. For DUTs with multiple target leakage paths, the corresponding leakage handling method is found from the image file for each target leakage path and processed. After restarting, the leakage handling results are detected again based on the voltage value, and the actual leakage path is determined, ensuring that the leakage situation of all target leakage paths of the DUT can be analyzed and processed as much as possible. In addition, based on the analysis of the leakage situation of all target leakage paths of the DUT, the leakage of the main power supply is determined, allowing the user to understand the cause of leakage in the DUT.

[0058] By setting a counter to count the number of leakage currents of each power supply under test and storing voltage values ​​and leakage current information in a memory, users can easily understand the leakage current status of each power supply under test.

[0059] In addition, the present invention also provides a leakage current treatment method, a leakage current treatment device, a leakage current treatment equipment, and a computer-readable storage medium, which have the same or corresponding technical features as the leakage current treatment system mentioned above, and have the same effects. Attached Figure Description

[0060] To more clearly illustrate the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0061] Figure 1 This is a schematic diagram illustrating a leakage current handling scenario according to an embodiment of the present invention;

[0062] Figure 2 This is a schematic diagram illustrating a specific leakage current handling scenario provided by an embodiment of the present invention;

[0063] Figure 3 A flowchart illustrating a leakage current detection and processing method provided in an embodiment of the present invention;

[0064] Figure 4 A flowchart of a leakage current handling method provided in an embodiment of the present invention;

[0065] Figure 5 This is a schematic diagram of an online detection and processing system provided in an embodiment of the present invention;

[0066] Figure 6 A structural diagram of a leakage current handling device provided in an embodiment of the present invention;

[0067] Figure 7 This is a structural diagram of a leakage current handling device provided in another embodiment of the present invention. Detailed Implementation

[0068] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present invention.

[0069] The core of this invention is to provide a leakage current handling system, method, apparatus, equipment, and medium to solve the technical problems of low leakage current detection efficiency and low handling efficiency.

[0070] The leakage current handling system provided by this invention solves the problem of system leakage current. It should be noted that the technical solution provided by this invention is not limited to solving system leakage current, but can also be extended to apply to signal leakage current situations caused by system leakage current.

[0071] To enable those skilled in the art to better understand the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Figure 1 This is a schematic diagram of a leakage current handling scenario provided by an embodiment of the present invention. The leakage current handling system is applied to handle leakage current in a device under test, including a controller 1 and multiple devices 2, such as... Figure 1 As shown, the first end of each device 2 is connected to the controller 1, and the second end of each device 2 is connected to the corresponding power supply 3 under test. There is an interconnection relationship between the devices 2. The leakage current handling system includes: processor 4.

[0072] The processor 4 includes a data acquisition module, which is connected to each power supply 3 under test on the device under test.

[0073] The processor 4 pre-stores image files containing various leakage current conditions of the device under test and the corresponding leakage current handling methods for each leakage current condition; among them, the leakage current condition includes leakage current power supply and leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port status of the leakage current path from push-pull mode to open leakage mode.

[0074] The processor 4 is used to acquire the voltage values ​​of each power supply 3 under test collected by the data acquisition module during the power-on of the controller 1, and to determine whether the voltage value of each power supply 3 under test is equal to 0; if not, the power supply 3 under test with a voltage value not equal to 0 is acquired and identified as the target leakage power supply; the target leakage path of the target leakage power supply is acquired; the target leakage power supply and the corresponding target leakage processing method under the target leakage path are acquired from the image file; and the leakage of the target leakage power supply is processed according to the target leakage processing method.

[0075] The device under test (DUT) is the device that requires leakage current detection. There are no restrictions on the type of DUT, its controller, components, number of power supplies under test, number of components, or their interconnections; these are determined based on the actual leakage current detection requirements. For example, the controller can be a Complex Programmable Logic Device (CPLD), and integrated circuits (ICs) can be considered components within the DUT. The processor in the leakage current handling system is also not limited, as long as it is a microcontroller with voltage acquisition capabilities, such as a Field Programmable Gate Array (FPGA), Micro Controller Unit (MCU), Digital Signal Processor (DSP), or Baseboard Management Controller (BMC). To enable online acquisition of voltage values ​​during leakage current detection, a data acquisition module is installed on the processor to collect the voltage values ​​of each power supply under test. There is no limit to the number of data acquisition modules installed on the processor. If the number of data acquisition modules is less than the number of power supplies under test (PSTs), multiple PSTs will inevitably share data acquisition modules. This necessitates further analysis by the data acquisition modules after acquiring voltage values ​​to determine the specific PST being measured. Therefore, to facilitate the acquisition and processing of voltage values ​​from each PST, in implementation, each data acquisition module is paired with a PST, allowing each module to acquire the voltage of one PST. Additionally, for the controller to operate, a mains power supply connected to the controller is required to power it. Furthermore, since the operating voltages of different devices vary, a voltage regulator can be installed in the PST to adjust the voltage.

[0076] During controller power-up, if the CPLD voltage rises from 0V to 3.3V, the data acquisition module on the processor collects the voltage values ​​of each power supply under test. Based on the collected maximum voltage value, leakage current of each power supply under test is detected. If the maximum voltage value of the power supply under test is greater than 0, it indicates that there is no leakage current; otherwise, it indicates that there is leakage current. To avoid the impact of leakage current on the device, this embodiment of the invention pre-stores in the processor an image file containing various leakage current conditions of the device under test and corresponding leakage current handling methods for each condition. The leakage current conditions include the leakage power supply and the leakage current path. The leakage current handling method for each condition is to change the output port state of the leakage current path from push-pull mode to open-drain mode. For example, after detecting a leakage power supply, the leakage current path of the leakage power supply is determined, and then the leakage current handling method for the leakage power supply under the leakage current path is obtained from the image file. Then, the output port state of the leakage current path is changed from push-pull mode to open-drain mode to handle the leakage current of the leakage power supply. Once the primary power supply is powered on, since the open-drain mode has no driving capability for high levels, even if the interconnect port is configured to output a high level, the actual output is a low level, thus eliminating interconnect leakage.

[0077] In the leakage current handling system provided in this embodiment of the invention, firstly, during the leakage current detection process, the system collects the voltage values ​​of each power supply under test through the data acquisition module on the processor, realizing online voltage value acquisition. Furthermore, during the leakage current handling process, since a mirror file containing various leakage current conditions and corresponding handling methods is pre-stored in the processor, the processor can directly call the handling method from the mirror file to handle the power supply leakage after determining that the voltage value of the power supply under test is not 0 and identifying the leakage path. This achieves online leakage current handling and improves the efficiency of leakage current handling. Secondly, compared to previous leakage current handling methods that physically isolate the device connected to the leakage power supply, the leakage current handling system provided in this embodiment of the invention uses a leakage current handling method that changes the output port state of the leakage path from push-pull mode to open-drain mode, and handles the leakage current through program control. This avoids plugging and unplugging the circuit, improves the efficiency of leakage current handling, and enables precise location and handling of the leakage current.

[0078] In the above embodiments, the leakage current of the leakage power supply is processed. To further verify whether the leakage current is completely eliminated, in practice, the controller is connected to the main power supply; after the processor processes the leakage current of the target leakage power supply according to the target leakage current processing method, it also includes:

[0079] After the leakage current is detected and dealt with, the main power supply is restarted.

[0080] The data acquisition module collects the voltage value of the target leakage current source during the controller power-on period;

[0081] The actual leakage path in the target leakage path is determined based on the voltage value of the target leakage power source.

[0082] The target leakage path is determined by the power-on sequence of each power supply under test and the corresponding interconnection relationship of the devices powered by the power supply under test.

[0083] The target leakage path of the target leakage current source is one. The actual leakage paths in the target leakage path are determined based on the voltage value of the target leakage current source, including:

[0084] If the voltage value of the target leakage current source is detected to be 0, the target leakage path is determined to be the actual leakage path.

[0085] There are multiple target leakage paths for the target leakage current source. The target leakage current source and the corresponding target leakage current handling method for each target leakage path are obtained from the image file. The leakage current of the target leakage current source is then processed according to the target leakage current handling method, including:

[0086] Obtain the current target leakage handling method corresponding to the current target leakage path under the target leakage power source from the image file;

[0087] The leakage of the target leakage power source is processed according to the current target leakage processing method;

[0088] Return to the steps of controlling the main power supply to restart after the leakage current is detected and handled;

[0089] Correspondingly, determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source includes:

[0090] If the voltage value of the target leakage current source is detected to be equal to 0, then the current target leakage current path is determined to be the actual leakage current path.

[0091] If the voltage value of the target leakage power source is detected to be non-zero, a new current target leakage path is selected from the target leakage paths as the current target leakage path. The new current target leakage path is the leakage path that has not been processed since the start of leakage to the target leakage power source until the moment when the voltage value of the target leakage power source is detected to be non-zero. The process then returns to the step of obtaining the current target leakage processing method corresponding to the current target leakage path of the target leakage power source from the image file.

[0092] If the target leakage power supply has only one leakage path, after the leakage of the power supply is processed, the main power supply is restarted. During the power-on period of the controller, the voltage value of the power supply is collected. If the maximum voltage value is equal to 0, it indicates that the leakage of the power supply has been eliminated and verifies that leakage did occur on the leakage path. If the maximum voltage value is not equal to 0, it is ruled out that the leakage of the device under test is caused by the leakage of the power supply.

[0093] If the target leakage power source has multiple leakage paths, during the leakage handling process, leakage handling is performed on each leakage path separately. After leakage handling, the processor control system restarts, and the voltage value of the power source is collected during the controller's power-on period. If the maximum voltage value is equal to 0, it indicates that the leakage of the power source has been eliminated, and it also verifies that the leakage of the power source was indeed caused by leakage on that leakage path. If the maximum voltage value is not equal to 0, it indicates that there are other leakage paths of the power source. Therefore, the above leakage handling process is repeated for the other leakage paths. After leakage handling, the processor control system restarts, and the voltage value of the power source is collected during the controller's power-on period until the collected voltage value of the power source is detected to be 0, indicating that the leakage of the power source has been completely eliminated.

[0094] In the leakage current handling system provided in this embodiment of the invention, leakage current handling is performed on each leakage path of the leakage power supply, and the voltage value is judged again after restarting, that is, the leakage current handling result is verified. This ensures that the power supply leakage is completely eliminated as much as possible, thereby ensuring the normal operation of the equipment.

[0095] Based on the above embodiments, if all leakage paths of the power supply have been eliminated, but the collected voltage value is not equal to 0, it indicates that the leakage of the device under test is caused by leakage of each power supply, and there is still leakage of another power supply. Therefore, in some embodiments, after detecting that the voltage value of the target leakage power supply is not equal to 0, before selecting a new current target leakage path from the target leakage paths as the current target leakage path, the following steps are also included:

[0096] Determine whether a new current leakage path exists from the start of leakage processing on the target leakage power source until the moment when the voltage value of the target leakage power source is detected to be non-zero.

[0097] If so, proceed to the step of selecting a new current target leakage path from the target leakage paths as the current target leakage path;

[0098] If not, then the leakage current of the device under test is determined to be the leakage current of the main power supply; output a prompt message to characterize the leakage current of the main power supply.

[0099] The method of outputting warning messages to indicate main power supply leakage is not limited and can be determined based on the actual situation. By outputting warning messages, relevant personnel are notified to quickly locate the leakage and take appropriate measures to ensure the normal operation of the equipment.

[0100] To help users understand the leakage current status of the device, in some embodiments, the leakage current handling system also includes: multiple counters;

[0101] The controller is connected to each counter and is used to initialize the value of each counter after the device under test is powered on.

[0102] Each timer is connected to the processor and is used to count the number of times the power supply under test leaks when the voltage value of the power supply under test is detected to be non-zero, starting from when the processor begins to process the leakage current of each power supply under test.

[0103] It also includes: a memory connected to the processor; after acquiring the voltage values ​​of each power supply under test collected by the data acquisition module during the controller's power-on period, it also includes:

[0104] The voltage values ​​of each power supply under test are stored in the memory;

[0105] After determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source, the process also includes:

[0106] Obtain leakage current information for each power source under test; the leakage current information shall include at least the information of the target leakage power source, the leakage current handling method corresponding to the target leakage power source, and the leakage current handling result.

[0107] The leakage current information of each power supply under test is stored in the memory.

[0108] This section uses an example of a device under test containing three components to illustrate the leakage current handling scenario provided by the embodiments of the present invention. Figure 2 This is a schematic diagram illustrating a specific leakage current handling scenario provided by an embodiment of the present invention, such as... Figure 2As shown, the device under test includes three devices 2, namely device one, device two, and device three; three power supplies (i.e., the power supplies under test 3 mentioned above), namely power supply one, power supply two, and power supply three; three voltage regulators 5, namely voltage regulator one, voltage regulator two, and voltage regulator three; a main power supply 6 is connected to a controller 1, and the controller 1 is connected to each device 2. Device one is interconnected with device two, and device two is interconnected with device three. For ease of description of the leakage path, the leakage path between controller 1 and device one is represented by P1; the leakage path between controller 1 and device two is represented by P2; the leakage path between controller 1 and device three is represented by P3; the leakage path between device one and device two is represented by P4; and the leakage path between device two and device three is represented by P5. After the main power supply 6 is powered on, controller 1 begins normal operation. Controller 1 enables POWER1_EN for power supply 1, POWER2_EN for power supply 2, and POWER3_EN for power supply 3, which in turn power regulator 1 to device 1, regulator 2 to device 2, and regulator 3 to device 3, respectively. Assuming the power supply power-on sequence follows the order of main power supply—power supply 1—power supply 2—power supply 3, due to the interconnection signals on each leakage path, the power supply that powers on earlier will leak to the power supply that powers on later through these interconnection signals. This results in a significant voltage difference in the low-level measurement of the power supply that powers on later. Based on this scenario, leakage detection and handling are implemented. Figure 3 A flowchart of a leakage current detection and processing method provided in an embodiment of the present invention is shown below. Figure 3 As shown, the method includes:

[0109] S10: Initialize the values ​​of each counter, i.e., set M=0, N=0, P=0;

[0110] S11: The processor collects the voltage values ​​of power supply one, power supply two, and power supply three during power-on through the data acquisition module interface;

[0111] S12: Store the data in Database 1, Database 2, and Database 3 respectively;

[0112] S13: Determine whether the maximum value in each database is 0; if not, proceed to step S14; if yes, proceed to step S15.

[0113] S14: Leakage handling;

[0114] S15: Confirm that there is no leakage in the system;

[0115] S16: The processor logs information.

[0116] The leakage current handling in step S14 specifically includes:

[0117] If there is a leakage in power supply 1, let M = M + 1; if M = 1 is determined, the processor upgrades the controller; the processor controls the system to power on;

[0118] If there is leakage in power supply 2, let N = N + 1; when N = 1, the processor upgrades the controller; when N = 2, the processor upgrades the upstream device of power supply 2, i.e. device 1; the processor controls the system to power on.

[0119] If there is leakage in power supply three, let P = P + 1; when P = 1, the processor upgrades the controller; when N = 2, the processor upgrades the upstream device of power supply three, i.e. device two; the processor controls the system to power on.

[0120] Specifically, (1) for different leakage situations, the logic mirror is modified, and the specific mirror is uploaded to the processor via the network for subsequent upgrade calls. The difference between these mirrors and the initial mirror is that the output port modes of P1, P2, P3, P4, and P5 are changed from push-pull mode to open-drain mode. After the current stage power supply is powered on, since open-drain has no driving capability for high level, even if the interconnect port is configured to output high level, the actual output is low level, thus eliminating the interconnect leakage situation. Figure 2 Taking the scenario as an example, the detailed description of the upgrade image is shown in Table 1. Table 1 is a detailed description of different images.

[0121] Table 1. Detailed description of different mirror images

[0122]

[0123]

[0124] (2) After the system is powered on, the controller works normally and begins to initialize the leakage current counters (M=0, N=0, P=0, where M represents the leakage current count of power supply 1, N represents the leakage current count of power supply 2, and P represents the leakage current count of power supply 3) and all interconnection ports for power supply 1, power supply 2, and power supply 3. At the same time, the processor collects data from power supply 1, power supply 2, and power supply 3 during the power-on process in real time through data acquisition module channels 0 / 1 / 2 (data acquisition module 1, data acquisition module 2, and data acquisition module 3), and stores the collected data in data registers DATA1, DATA2, and DATA3.

[0125] (3) The processor's internal program determines whether the minimum value of DATA1, DATA2, and DATA3 is 0. When the minimum and maximum values ​​are close to 0, it indicates that there is no leakage in power supply 1, power supply 2, and power supply 3, and the controller starts to run other normal functions. When the minimum and maximum values ​​are far greater than 0, it indicates that there is leakage in power supply 1, power supply 2, and power supply 3, and the program proceeds to step (4).

[0126] (4) When DATA1≠0 and DATA2=DATA3=0, it indicates that there is leakage in power supply one. According to Figure 2It can be seen that the leakage path of power supply one is P1, that is, the main power supply leaks through the output port P1 of the controller. At this time, set M=1, the processor uses the processor_1 mirror to upgrade the processor online, and configures the initial mode of the output port in P1 from push-pull mode to open-drain mode. After the upgrade is completed, the processor controls the main power supply to restart, and after the system is powered on again, it executes (step (2) and step (4)) again to check whether the leakage of power supply one has been eliminated.

[0127] (5) When DATA2≠0 and DATA1=DATA3=0, it indicates that there is leakage in power supply two. According to Figure 2 It is known that the leakage path of power supply 2 is P2 and P4. At this time, N=1 is set, and the processor uses the processor_2 mirror to upgrade the processor, configuring the initial mode of the output port in P2 from push-pull mode to open-drain mode. After the system restarts and powers on, if DATA2=0 is detected, it means that the leakage of power supply 2 is caused by the P2 path; otherwise, it means that the leakage is caused by P4. N=2 is set, and the processor continues to use the device_1 mirror to upgrade device 1, configuring the initial mode of the output port in P4 from push-pull mode to open-drain mode. After the processor controls the system to power on again, steps (2) and (5) are executed to check whether the leakage of power supply 2 has been eliminated.

[0128] (6) When DATA3≠0 and DATA1=DATA=0, it indicates that there is leakage in power supply three. According to Figure 2 It can be seen that the leakage path of power supply three is P3 and P5, that is, the main power supply leaks through the processor's output port P3 and the interconnection path P5 between device two and device three. At this time, set P=1, the processor uses controller_3 to mirror and upgrade the controller, and configures the initial mode of the output port in P3 from push-pull mode to open-drain mode. After the system restarts and powers on, check DATA3 again. If DATA3=0, it means that the leakage of power supply three is caused by the P3 path; otherwise, it means that the leakage is caused by P5. Set P=2 again, the processor uses device two_1 to mirror and upgrade device two. After the upgrade is completed and the system is powered on again, execute steps (2) and (6) to check whether the leakage of power supply three has been eliminated.

[0129] (7) After the above process is completed, if DATA1 = DATA2 = DATA3 = 0, then the leakage of power supply 1, power supply 2 and power supply 3 has been eliminated. At this time, the program exits the processing and access mechanism, and the controller runs other normal functions. If DATA1 ≠ 0 or DATA2 ≠ 0 or DATA3 ≠ 0, then the system leakage is caused by the main power supply leakage, and relevant personnel need to be notified to locate the problem.

[0130] Once the detection process is complete, the processor outputs DATA1, DATA2, and DATA3 data and logs for each instance and stores them in the relevant system directory. The processor writes the data into a special table and uses this data to create a data graph. The logs record all relevant operations for each leakage current handling, such as which device was upgraded, which image was used, the M / N / P values, and whether leakage current in power supply one, power supply two, and power supply three was eliminated.

[0131] The leakage current handling system provided in this invention automates detection and handling, which helps avoid problems such as mirror upgrade errors and measurement errors caused by repetitive manual mechanical work, and enables the investigation and location of leakage current faults.

[0132] The above describes a leakage current handling system. This embodiment also provides a leakage current handling method. This method is applied to a leakage current handling system that handles leakage current in a device under test (DUT) including a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to the corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor. The processor includes a data acquisition module, which is connected to each power supply under test on the DUT. The processor pre-stores image files containing various leakage current conditions of the DUT and the corresponding leakage current handling methods for each leakage current condition. The leakage current condition includes a leakage current power supply and a leakage current path. The leakage current handling method for each leakage current condition is to change the output port state of the leakage current path from push-pull mode to open-leakage mode.

[0133] Figure 4 A flowchart of a leakage current handling method provided in an embodiment of the present invention is shown below. Figure 4 As shown, the method includes:

[0134] S20: Acquire the voltage values ​​of each power supply under test collected by the data acquisition module during the controller power-on period;

[0135] S21: Determine whether the voltage value of each power supply under test is equal to 0; if not, proceed to step S22.

[0136] S22: Obtain the test power supply with a voltage value that is not equal to 0, and identify the test power supply with a voltage value that is not equal to 0 as the target leakage power supply;

[0137] S23: Obtain the target leakage path of the target leakage power source;

[0138] S24: Obtain the target leakage current source and the corresponding target leakage current handling method under the target leakage current path from the image file;

[0139] S25: Process the leakage current of the target leakage power source according to the target leakage current processing method.

[0140] The leakage current handling method provided in this embodiment has the same or corresponding technical features as the leakage current handling system described above. The embodiments of the leakage current handling system have been described in detail above, and the embodiments of the leakage current handling method will not be described in detail here.

[0141] In the leakage current handling method provided by this embodiment of the invention, the voltage values ​​of each power supply under test are collected by the data acquisition module on the processor, realizing online acquisition of voltage values. Furthermore, during the leakage current handling process, since a mirror file containing various leakage current conditions and corresponding leakage current handling methods is stored in the processor beforehand, the processor can directly call the handling method from the mirror file to handle the power supply leakage after determining that the voltage value of the power supply under test is not 0 and after identifying the leakage path. This achieves online leakage current handling and improves the efficiency of leakage current handling. Secondly, compared to previous leakage current handling methods that physically isolate the device connected to the leakage power supply, the leakage current handling method provided by this embodiment of the invention uses a leakage current handling method that changes the output port state of the leakage path from push-pull mode to open-drain mode, and handles the leakage current through program control. This avoids plugging and unplugging the circuit, improves the efficiency of leakage current handling, and enables precise location and handling of the leakage current.

[0142] To enable those skilled in the art to better understand the present invention, the following description is provided in conjunction with the appendix. Figure 5 The invention will be further described in detail below with reference to specific embodiments. Figure 5 This is a schematic diagram of an online detection and processing system provided in an embodiment of the present invention, such as... Figure 5 As shown, the system includes a main power supply 6, a controller 1, a processing unit 7, and a data storage unit 8.

[0143] The main power supply 6 provides a stable operating voltage for all components in the system, ensuring the operation of the system's basic functions; the controller 1 is responsible for controlling the power-on and power-off sequence of the system power supply and the initial state configuration of the relevant interconnection ports; the processing unit 7 is responsible for real-time detection of whether there is leakage in each power supply of the system, and when leakage is found, it executes the leakage handling mechanism to complete the system leakage handling; it records and stores the relevant detection results; the data storage unit 8 creates documents (such as logs and Excel files) based on the results output by the processing module to record the detection results for subsequent use by relevant personnel.

[0144] In the above embodiments, the leakage current handling system has been described in detail. This invention also provides embodiments of leakage current handling devices and equipment. It should be noted that this invention describes the embodiments of the device portion from two perspectives: one based on functional modules, and the other based on hardware.

[0145] The leakage current handling device provided in this embodiment of the invention is applied to a leakage current handling system for a device under test (DUT) including a controller and multiple devices. The first end of each device is connected to the controller, and the second end of each device is connected to the corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor. The processor includes a data acquisition module, which is connected to each power supply under test on the DUT. The processor pre-stores image files containing various leakage current conditions of the DUT and the corresponding leakage current handling methods for each leakage current condition. The leakage current condition includes a leakage current power supply and a leakage current path. The leakage current handling method corresponding to each leakage current condition is to change the output port state of the leakage current path from push-pull mode to open-leakage mode. Figure 6 This is a structural diagram of a leakage current handling device according to an embodiment of the present invention. Based on the functional modules, the device includes:

[0146] The first acquisition module 10 is used to acquire the voltage values ​​of each power supply under test collected by the data acquisition module during the power-on period of the controller;

[0147] The judgment module 11 is used to determine whether the voltage value of each power supply under test is equal to 0; if not, the acquisition and determination module 12 is triggered.

[0148] The acquisition and determination module 12 is used to acquire the test power supply with a voltage value that is not equal to 0, and determine the test power supply with a voltage value that is not equal to 0 as the target leakage power supply.

[0149] The second acquisition module 13 is used to acquire the target leakage path of the target leakage power source.

[0150] The third acquisition module 14 is used to acquire the target leakage power source and the target leakage processing method corresponding to the target leakage path from the image file.

[0151] The processing module 15 is used to process the leakage current of the target leakage power supply according to the target leakage current processing method.

[0152] Since the embodiments of the apparatus and the embodiments of the method correspond to each other, please refer to the description of the embodiments of the method for the embodiments of the apparatus, which will not be repeated here.

[0153] Figure 7 This is a structural diagram of a leakage current handling device provided in another embodiment of the present invention. This embodiment is based on a hardware perspective, such as... Figure 7 As shown, the leakage current handling device includes:

[0154] Memory 20 is used to store computer programs;

[0155] Processor 4 is used to implement the steps of the leakage current handling method mentioned in the above embodiments when executing a computer program.

[0156] The processor 4 may include one or more processing cores, such as a quad-core processor or an octa-core processor. The processor 4 may be implemented using at least one hardware form selected from DSP, FPGA, and Programmable Logic Array (PLA). The processor 4 may also include a main processor and a coprocessor. The main processor, also known as the Central Processing Unit (CPU), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, the processor 4 may integrate a Graphics Processing Unit (GPU), which is responsible for rendering and drawing the content required to be displayed on the screen. In some embodiments, the processor 4 may also include an Artificial Intelligence (AI) processor, which is used to handle computational operations related to machine learning.

[0157] The memory 20 may include one or more computer-readable storage media, which may be non-transitory. The memory 20 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In this embodiment, the memory 20 is used to store at least the following computer program 201, which, after being loaded and executed by the processor 4, is capable of implementing the relevant steps of the leakage current handling method disclosed in any of the foregoing embodiments. In addition, the resources stored in the memory 20 may also include an operating system 202 and data 203, and the storage method may be temporary storage or permanent storage. The operating system 202 may include Windows, Unix, Linux, etc. The data 203 may include, but is not limited to, the data involved in the leakage current handling method mentioned above.

[0158] In some embodiments, the leakage current handling device may further include a display screen 22, an input / output interface 23, a communication interface 24, a power supply 25, and a communication bus 26.

[0159] Those skilled in the art will understand that Figure 7 The structure shown does not constitute a limitation on leakage current handling equipment and may include more or fewer components than illustrated.

[0160] The leakage current handling device provided in this embodiment of the invention includes a memory and a processor. When the processor executes the program stored in the memory, it can implement the following method: leakage current handling method, with the same effect as above.

[0161] Finally, the present invention also provides an embodiment corresponding to a computer-readable storage medium. The computer-readable storage medium stores a computer program, which, when executed by a processor, performs the steps described in the above method embodiments.

[0162] It is understood that if the methods in the above embodiments are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and executes all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0163] The computer-readable storage medium provided by this invention includes the leakage current handling method mentioned above, and has the same effect.

[0164] The present invention has provided a detailed description of a leakage current handling system, method, apparatus, device, and medium. The various embodiments in the specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatuses disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and relevant parts can be referred to in the method section. It should be noted that those skilled in the art can make various improvements and modifications to the present invention without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of the present invention.

[0165] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

Claims

1. A leakage current handling system, characterized in that, The system is applied to handle leakage current in a device under test (DUT) comprising a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to a corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor. The processor includes a data acquisition module, which is connected to each of the power supplies under test on the device under test. The processor pre-stores image files containing various leakage current conditions of the device under test and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes leakage current power supply and leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port status of the leakage current path from push-pull mode to open leakage mode. The processor is used to acquire the voltage values ​​of each power supply under test collected by the data acquisition module during the power-on of the controller, and determine whether the voltage value of each power supply under test is equal to 0; if not, acquire the power supply under test with a voltage value not equal to 0, and identify the power supply under test with a voltage value not equal to 0 as the target leakage power supply; acquire the target leakage path of the target leakage power supply; acquire the target leakage power supply and the target leakage processing method corresponding to the target leakage path from the image file; and process the leakage of the target leakage power supply according to the target leakage processing method.

2. The leakage current handling system according to claim 1, characterized in that, The controller is connected to the main power supply; after the processor processes the leakage current of the target leakage power supply according to the target leakage current processing method, it further includes: After the leakage current is detected and the issue is resolved, the main power supply is restarted. The voltage value of the target leakage current source is acquired by the data acquisition module during the power-on period of the controller; The actual leakage path in the target leakage path is determined based on the voltage value of the target leakage power source.

3. The leakage current handling system according to claim 2, characterized in that, The target leakage path is determined by the power-on sequence of each power supply under test and the corresponding interconnection relationship of the devices powered by the power supply under test. The target leakage path of the target leakage power source is one, and determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source includes: If the voltage value of the target leakage current source is detected to be equal to 0, the target leakage current path is determined to be the actual leakage current path. The target leakage current source has multiple target leakage current paths. The step of obtaining the target leakage current source and the corresponding target leakage current processing method under the target leakage current path from the image file, and processing the leakage current of the target leakage current source according to the target leakage current processing method, includes: Obtain the current target leakage processing method corresponding to the current target leakage path of the target leakage power source from the image file; The leakage of the target leakage power supply is processed according to the current target leakage processing method; Returning to the step of controlling the main power supply to restart after the leakage current is detected and handled; Correspondingly, determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source includes: If the voltage value of the target leakage current source is detected to be equal to 0, then the current target leakage path is determined to be the actual leakage path. If the voltage value of the target leakage power source is detected to be non-zero, a new current target leakage path is selected from the target leakage paths as the current target leakage path. The new current target leakage path is the leakage path that has not been processed since the start of leakage to the target leakage power source until the moment when the voltage value of the target leakage power source is detected to be non-zero. The process then returns to the step of obtaining the current target leakage processing method corresponding to the current target leakage path of the target leakage power source from the image file.

4. The leakage current handling system according to claim 3, characterized in that, After detecting that the voltage value of the target leakage current source is not equal to 0, and before selecting a new current target leakage current path from the target leakage current paths as the current target leakage current path, the method further includes: Determine whether a new current target leakage path exists from the start of leakage processing on the target leakage power source until the moment when the voltage value of the target leakage power source is detected to be non-zero. If so, proceed to the step of selecting a new current target leakage path from the target leakage paths as the current target leakage path; If not, then the leakage current of the device under test is determined to be the leakage current of the main power supply; and a prompt message is output to characterize the leakage current of the main power supply.

5. The leakage current handling system according to claim 3, characterized in that, The leakage current handling system also includes: multiple counters; The controller is connected to each of the counters and is used to initialize the value of each of the counters after detecting that the device under test is powered on. Each of the counters is connected to the processor and is used to count the number of times the power supply under test leaks when the voltage value of the power supply under test is detected to be non-zero, starting from when the processor begins to process the leakage current of each power supply under test.

6. The leakage current handling system according to any one of claims 2 to 5, characterized in that, Also includes: A memory, which is connected to the processor; After acquiring the voltage values ​​of each power supply under test collected by the data acquisition module during the power-on of the controller, the method further includes: The voltage values ​​of each of the power supplies under test are stored in the memory; After determining the actual leakage path in the target leakage path based on the voltage value of the target leakage power source, the method further includes: Obtain leakage current information for each of the power supplies under test; wherein, the leakage current information includes at least the information of the target leakage power supply, the leakage current processing method corresponding to the target leakage power supply, and the leakage current processing result; The leakage current information of each of the power supplies under test is stored in the memory.

7. A method for handling leakage current, characterized in that, A leakage current handling system is applied to handle leakage current in a device under test (DUT) comprising a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to a corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor; the processor includes a data acquisition module connected to each power supply under test in the DUT; the processor pre-stores image files containing various leakage current conditions of the DUT and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes a leakage power supply and a leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port state of the leakage current path from push-pull mode to open-leakage mode; the method includes: The data acquisition module acquires the voltage values ​​of each power supply under test during the power-on period of the controller; Determine whether the voltage value of each power supply under test is equal to 0; If not, then obtain the test power supply with a voltage value that is not equal to 0, and identify the test power supply with a voltage value that is not equal to 0 as the target leakage power supply; Obtain the target leakage path of the target leakage power source; Obtain the target leakage current source and the target leakage current handling method corresponding to the target leakage current path from the image file; The leakage of the target leakage power source is processed according to the target leakage processing method.

8. A leakage current handling device, characterized in that, A leakage current handling system is applied to handle leakage current in a device under test (DUT) comprising a controller and multiple devices. The first terminal of each device is connected to the controller, and the second terminal of each device is connected to a corresponding power supply under test. The devices are interconnected. The leakage current handling system includes a processor; the processor includes a data acquisition module connected to each power supply under test in the DUT; the processor pre-stores image files containing various leakage current conditions of the DUT and corresponding leakage current handling methods for each leakage current condition; wherein, the leakage current condition includes a leakage power supply and a leakage current path, and the leakage current handling method corresponding to each leakage current condition is to change the output port state of the leakage current path from push-pull mode to open-leakage mode; the device includes: The first acquisition module is used to acquire the voltage values ​​of each power supply under test collected by the data acquisition module during the power-on of the controller; The judgment module is used to determine whether the voltage value of each power supply under test is equal to 0; if not, the acquisition and determination module is triggered. The acquisition and determination module is used to acquire the test power supply with a voltage value that is not equal to 0, and determine the test power supply with a voltage value that is not equal to 0 as the target leakage power supply. The second acquisition module is used to acquire the target leakage path of the target leakage power source. The third acquisition module is used to acquire the target leakage current source and the target leakage current processing method corresponding to the target leakage current path from the image file. The processing module is used to process the leakage current of the target leakage power supply according to the target leakage current processing method.

9. A leakage current handling device, characterized in that, include: Memory, used to store computer programs; A processor, configured to implement the steps of the leakage current handling method as described in claim 7 when executing the computer program.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the leakage current handling method as described in claim 7.

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