A multi-band compatible stealth film system structure suitable for green background

CN117826288BActive Publication Date: 2026-10-13NAT UNIV OF DEFENSE TECH
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Patent Information

Application Number
CN202310216998.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-03-08
Publication Date
2026-10-13
Estimated Expiration
2043-03-08

AI Technical Summary

Technical Problem

当前,多数薄膜型隐身材料覆盖的波段较少,膜层总数较多,在可见光波段的隐身存在色度不准确、大面积样品的颜色受观察角度影响大等问题,且较少有适用于绿色植物背景隐身的薄膜材料

Benefits of technology

[0012]本发明有益效果为:本发明创新性地将D/M/D结构引入多层薄膜,与多层显色结构复合形成全新的多波段兼容隐身膜系结构。其适用于典型的绿色植物背景,通过较少的材料种类与膜层总数实现了可见光-近红外、1.06μm激光及中远红外波段的兼容隐身。优点在于(1)膜层总数少,膜厚合理,制备效率高,成膜质量好;(2)组成材料种类简单,经济高效。(3)隐身效果好,隐身波段覆盖全面。

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Abstract

The present application belongs to the field of composite materials, and relates to a multi-band film type stealth material suitable for a green plant background. The present application provides a multi-band compatible stealth film system structure suitable for a green background. The film system is a D / M / D multi-layer color development structure composite film, and the total number of film layers is extremely small, so that the compatible stealth of the visible light-near infrared band, 1.06 mu m laser and mid-infrared band under the green plant background is realized, cost is saved, efficiency is improved, and the shortage of the visible light band stealth existence is improved.
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Description

Technical Field

[0001] This invention belongs to the field of stealth material preparation, specifically relating to a multi-band thin-film stealth material suitable for green plant backgrounds. Background Technology

[0002] To counter the threats posed by reconnaissance and detection and achieve multi-band compatible stealth, stealth materials are increasingly being used. Thin-film stealth materials are convenient to apply and suitable for varied real-world environments. Currently, most thin-film stealth materials cover fewer bands and have a large number of layers. In the visible light band, stealth suffers from inaccurate colorimetry, and the color of large-area samples is greatly affected by the observation angle. Furthermore, there are few thin-film materials suitable for stealth against green plant backgrounds.

[0003] Taking the above considerations into account, this invention proposes a multi-band compatible stealth film structure suitable for green backgrounds. This film system is composed of a D / M / D (Dielectric / Metal / Dielectric) structure combined with a multilayer color-developing structure. While ensuring stealth performance, it significantly reduces the total number of film layers, saving costs and improving fabrication efficiency.

[0004] Furthermore, the structural design of this membrane system greatly improves the aforementioned problems of visible light cloaking. Summary of the Invention

[0005] The purpose of this invention is to provide a multi-band compatible stealth film structure suitable for green backgrounds. This film system is a D / M / D multilayer color-developing composite film, which achieves compatible stealth in the visible-near infrared band, 1.06μm laser, and mid-far infrared bands against a green plant background with a very small total number of film layers, saving costs, improving efficiency, and overcoming the shortcomings of stealth in the visible light band.

[0006] This invention provides a multi-band compatible stealth film structure suitable for green backgrounds, characterized in that it is composed of a DMD structure and a multi-layer color-developing structure.

[0007] Furthermore, the DMD structure is composed of ZnS, Ag, and MgF2, presenting as a three-layer film.

[0008] Furthermore, the DMD structure from top to bottom is as follows: ZnS 103.12nm, Ag 12nm, MgF2 85.71nm.

[0009] Furthermore, the multilayer color-developing structure is composed of alternating ZnS and MgF2, presenting as a four-layer thin film.

[0010] Furthermore, the multilayer color-developing structure is specifically distributed from top to bottom as follows: ZnS

[0011] 75.61nm, MgF2 243.74nm, ZnS 75.61nm, MgF2 243.74nm.

[0012] The beneficial effects of this invention are as follows: This invention innovatively introduces the D / M / D structure into multilayer thin films, and combines it with multilayer color-developing structures to form a novel multi-band compatible stealth film system. It is suitable for typical green plant backgrounds, and achieves compatible stealth in the visible-near infrared, 1.06μm laser and mid-far infrared bands by using fewer types of materials and a smaller total number of film layers. The advantages are: (1) fewer film layers, reasonable film thickness, high preparation efficiency, and good film quality; (2) simple types of constituent materials, economical and efficient; (3) good stealth effect and comprehensive stealth band coverage. Attached Figure Description

[0013] Figure 1 Visible light images of composite thin films

[0014] Figure 2 Three types of leaves used for comparison

[0015] Figure 3 Green composite film chromaticity coordinates

[0016] Figure 4 Measured spectra of composite thin films in the 380 nm-1100 nm range

[0017] Figure 5 Measured spectra of composite films in the 3μm-14μm range

[0018] Figure 6 Mid-infrared image of composite film

[0019] Figure 7 Far-infrared images of composite films Specific Implementation

[0020] Performance testing of composite multilayer thin films

[0021] Example 1: Visible Light and 1.06μm Laser Stealth Performance Test

[0022] For composite films, the prepared samples are as follows: Figure 1 As shown.

[0023] The composite film exhibits a green hue in the visible light band, largely meeting the expectation of a corresponding green background, and the color development is uniform and stable. During the colorimetric testing, leaves from three different green plants were selected and tested alongside the sample for comparison. Visible light images of the three types of leaves are shown below. Figure 2 The colorimeter model is ZB-A, and the test conditions include a D65 light source and a 2° standard observer. Figure 4 The results are for the chromaticity coordinates.

[0024] exist Figure 4 In the diagram, the X-axis represents the red component, and the Y-axis represents the green component. The coordinates of the three green leaves are A(0.332, 0.448), B(0.283, 0.446), and C(0.338, 0.457). The specific coordinates of the thin film are (0.258, 0.393). Colorimetric results show that the color of the thin film is similar to that of the three green leaves, all falling within the green region of the colorimetric diagram. In the visible light band, the thin film exhibits the expected performance. Further spectroscopic testing of the thin film's reflectance spectrum is shown in the figure. Figure 4 .

[0025] The measured reflectance curve exhibits characteristics such as a green reflection peak, a red edge, and a near-infrared plateau, possessing spectral features similar to those of green plants. Calculations show a reflectance of 0.172 at a 1.06 μm laser wavelength, which reduces laser echo. Although slightly higher than the theoretical value of 0.107, the thin film still demonstrates laser stealth capabilities.

[0026] In summary, composite multilayer thin film materials exhibit good stealth performance in the corresponding wavelength bands.

[0027] Mid- and far-infrared stealth performance test

[0028] The spectrum of the thin film in the mid- and far-infrared band was measured using a Nicol et 8700 Fourier transform infrared spectrometer, and the spectral curve is shown below. Figure 5 As shown.

[0029] Figure 5 The measured reflectance curves of the composite film against a green background are shown. The calculated average reflectance values ​​for the mid- and far-infrared bands are 0.822 and 0.910, respectively. These values ​​show a small difference from the expected performance, indicating that the infrared stealth effect can be achieved normally.

[0030] To further verify the actual stealth effect, an experimental platform was built, and mid-infrared and far-infrared thermal imagers were used to photograph the thin film samples. The samples were attached to a heating plate, and the heating temperature was set to 90℃. The ambient temperature was 24℃. Thermal radiation images of the samples in the mid- and far-infrared bands were captured, and the results are shown below. Figure 6 , 7 .

[0031] Figure 6 , 7 The images show the thermal radiation of the D / M / D multilayer colorimetric composite film in the mid- and far-infrared bands. R1 represents the area covered by the film, and R2 represents the background area of ​​the heating plate. During the experiment, the heating plate temperature was set to 100℃, and the indoor wall temperature was 28℃. A significant difference in radiation temperature was observed between R1 and R2 in both infrared bands. Detailed temperature measurements were performed on both areas, and the results are shown in Table 1.

[0032]

[0033] Table 1

[0034] The temperature data in the table shows that the radiation temperature difference between R1 and R2 is 24.21℃ in the mid-infrared band and reaches 34.75℃ in the far-infrared band. The mid- and far-infrared emissivity of the region where the thin film is located was calculated, yielding results of 0.2031 and 0.1490, respectively. These values ​​indicate that the composite thin film can effectively reduce target radiation and achieve infrared stealth effects.

Claims

1. A multi-band compatible stealth membrane structure suitable for green backgrounds, characterized in that, It is composed of a DMD structure and a multilayer color-developing structure. The DMD structure, from top to bottom, is as follows: ZnS 103.12nm, Ag 12nm, MgF2 85.71nm; the multilayer color-developing structure is composed of alternating ZnS and MgF2, presenting as a four-layer thin film.

2. The multi-band compatible stealth membrane structure suitable for green backgrounds according to claim 1, characterized in that, The multilayer colorimetric structure is specifically distributed from top to bottom as follows: ZnS 75.61nm, MgF2 243.74nm, ZnS 75.61nm, MgF2 243.74nm.

Citation Information

Patent Citations

  • Multilayer film for hyperspectral-laser stealth

    CN114690278A