A dot matrix structure high-temperature shearing performance testing device

Abstract

The application belongs to the technical field of mechanical test, and particularly relates to a lattice structure high-temperature shearing performance testing device, which comprises a connecting module and a clamping module. The connecting module has two parts, which are symmetrically arranged on the two sides of the length direction of the clamping module. The clamping module comprises side pressing blocks, center blocks and a fixed plate. The two center blocks are oppositely arranged but upside down in the setting direction. The fixed plate has two parts, which are parallel to each other but oppositely arranged. The two fixed plates are respectively connected with the upper and lower surfaces of the two center blocks, and the lattice structure test piece is fixed between the two fixed plates. The side pressing blocks limit the fixed plate between the side pressing blocks and the center blocks. The lattice structure high-temperature shearing performance testing device provided by the application occupies a small space, has a simple structure, can exert shearing force on the lattice structure test piece in a high-temperature environment, and can measure the maximum bearing capacity, thereby providing an effective test method and data support for the research and application of the lattice structure.

Description

Technical Field

[0001] This invention belongs to the field of mechanical testing technology, specifically relating to a high-temperature shear performance testing device for a lattice structure. Background Technology

[0002] With the rapid development of aerospace vehicles, the importance of lightweighting has become increasingly prominent. Lightweighting is mainly achieved through structural and material lightweighting. Structural lightweighting primarily involves optimizing the structure of large components, while material lightweighting mainly utilizes materials with high specific stiffness. Lattice structures possess characteristics such as high specific stiffness, high specific strength, and large specific surface area, offering significant advantages in electromagnetic shielding, stealth, and vibration reduction, and their application in aerospace vehicles is becoming increasingly widespread.

[0003] The shear performance of lattice structures is a crucial factor affecting their structural strength and stability, reflecting their deformation and load-bearing capacity under shear loads. The primary method for testing shear performance involves using standard shear testing machines to subject lattice structure specimens to shear loading; however, existing shear performance testing equipment for lattice structures is typically too large for high-temperature testing.

[0004] Therefore, for testing the high-temperature shear performance of lattice structures, it is necessary to develop a pure shear testing device that occupies little space and is convenient for high-temperature testing. Summary of the Invention

[0005] The purpose of this invention is to provide a high-temperature shear performance testing device for lattice structures. This device facilitates the application of shear force to lattice structure test specimens in a high-temperature environment and measures their maximum load-bearing capacity, thereby solving the technical problem that existing shear testing machines are too large to easily perform high-temperature shear performance testing.

[0006] To achieve the above objectives, the present invention adopts the following specific technical solution: a lattice structure high-temperature shear performance testing device, comprising a connection module and a clamping module;

[0007] There are two connecting modules, symmetrically arranged on both sides of the clamping module along its length; one end of each connecting module is connected to the clamping module, and the other end is connected to the testing machine.

[0008] The clamping module includes a side pressure block, a center block, and a fixing plate;

[0009] The two center blocks are respectively fixedly installed on the two connecting modules; the two center blocks are arranged opposite each other but their orientations are reversed.

[0010] There are two fixing plates, which are parallel to each other but set in opposite directions; the two fixing plates are respectively connected to the upper and lower surfaces of the two central blocks, and the lattice structure test piece is fixed between the two fixing plates;

[0011] The side pressure blocks are four in number and are fixedly installed on the two center blocks respectively; the side pressure blocks limit the fixing plate between the side pressure blocks and the center blocks.

[0012] Furthermore, a threaded hole is provided on the side of the central block that connects to the connecting module, and a T-shaped boss is provided on the upper surface of the central block; a square boss is provided on the lower surface of the central block, and correspondingly, a T-shaped notch is provided at one end of the fixing plate along its length; and a square notch is provided at the other end.

[0013] The T-shaped notch of the fixing plate engages with the T-shaped boss of the center block, and the square notch of the fixing plate engages with the square boss of the center block. The two fixing plates can move to both sides under the drive of the two center blocks, generating shear force on the lattice structure test piece.

[0014] Furthermore, the side pressure block is connected to the center block by bolts, and the side pressure block is slidably connected to the fixing plate to limit the position of the fixing plate.

[0015] Furthermore, the connection module includes a connector and a connecting rod. One end of the connector is provided with a radial pin hole. The connector is connected to the testing machine by inserting the pin into the pin hole. The other end of the connector is fixedly connected to the connecting rod. The end of the connecting rod away from the connector is provided with a thread. The connecting rod is connected to the center block through the thread.

[0016] Furthermore, the fixing plate is provided with fixing holes, and the upper and lower surfaces of the corresponding dot matrix structure test piece are also provided with through holes.

[0017] A method for testing the high-temperature shear properties of a lattice structure includes the following steps:

[0018] S1. Assemble the connection module, clamping module and lattice structure test piece;

[0019] S2. Connect the connection module to the testing machine;

[0020] S3. Place the test apparatus in a high-temperature furnace and heat it to the test temperature, then keep it at that temperature.

[0021] S4. Apply shear force through the testing machine until the lattice structure specimen reaches 20% elongation and then stop loading.

[0022] S5. Extract the load curve of the testing machine to obtain the maximum shear force that the lattice structure test piece can withstand.

[0023] Furthermore, in step S1, when assembling the clamping module and the lattice structure test piece, if the test temperature is below 300 degrees Celsius, the lattice structure test piece and the clamping module are bonded together with an adhesive; if the test temperature is above 300 degrees Celsius, the lattice structure test piece and the clamping module are connected together with bolts.

[0024] The present invention can achieve the following beneficial effects:

[0025] The high-temperature shear performance testing device for lattice structures provided by this invention occupies little space and has a simple structure. It can apply shear force to lattice structure test specimens in a high-temperature environment and measure their maximum load-bearing capacity, providing effective testing methods and data support for the research and application of lattice structures. Attached Figure Description

[0026] Figure 1 This is an exploded structural diagram of the high-temperature shear performance testing device for the lattice structure of the present invention;

[0027] Figure 2 This is a schematic diagram of the high-temperature shear performance testing device for the lattice structure of the present invention;

[0028] Figure 3 This is a side view of the high-temperature shear performance testing device for the lattice structure of the present invention;

[0029] Figure 4 This is an exploded schematic diagram showing the connection relationship between the central block and the fixed plate of the high-temperature shear performance testing device of the lattice structure of the present invention;

[0030] Figure 5 This is a schematic diagram showing the connection relationship between the central block and the fixed plate of the high-temperature shear performance testing device for the lattice structure of the present invention;

[0031] Figure 6 This is a schematic diagram of the central block structure of the lattice structure high-temperature shear performance testing device of the present invention;

[0032] Figure 7 This is a schematic diagram of the lattice structure test piece of the lattice structure high-temperature shear performance testing device of the present invention;

[0033] In the figure: 1. Connector; 2. Connecting rod; 3. Center block; 4. Fixing plate; 5. Side pressure block; 6. T-shaped boss; 7. Square boss; 8. T-shaped notch; 9. Square notch; 10. Lattice structure test piece. Detailed Implementation

[0034] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not constitute a limitation thereof.

[0035] refer to Figure 1-7 A high-temperature shear performance testing device with a lattice structure, comprising a connection module and a clamping module;

[0036] The connecting module is a component used to connect the testing device to the testing machine. There are two connecting modules, symmetrically arranged on both sides of the clamping module along its length. One end of the connecting module is connected to the clamping module, and the other end is connected to the testing machine. The function of the connecting module is to provide shear force to fix the clamping module.

[0037] The clamping module is a component used to fix and clamp the lattice structure test piece 10; the clamping module includes a side pressure block 5, a center block 3 and a fixing plate 4. The lattice structure test piece 10 is fixed on the test device, and the clamping module prevents the lattice structure test piece 10 from sliding and deforming.

[0038] Two center blocks 3 are fixedly installed on the two connecting modules respectively; the center block 3 serves as the main support for the clamping module, and the two center blocks 3 are arranged opposite each other but with their orientations reversed.

[0039] There are two fixing plates 4, which are parallel to each other but set in opposite directions; the two fixing plates 4 are respectively connected to two center blocks 3, and the lattice structure test piece 10 is fixed between the two fixing plates 4.

[0040] Four side pressure blocks 5 are fixedly installed on the upper and lower surfaces of the two center blocks 3 respectively; the side pressure blocks 5 serve as a limit, limiting the fixing plate 4 between the side pressure blocks 5 and the center blocks 3.

[0041] The connecting module drives the central block 3 in the clamping module to move, and the two central blocks 3 respectively drive a fixed plate 4 to move, thereby applying shear force to the lattice structure test piece 10;

[0042] At the same time, the side pressure block 5 also counteracts the bending moment generated by the lattice structure test piece 10, ensuring that the lattice structure test piece 10 is in the correct position.

[0043] Furthermore, the central block 3 is a cuboid structure, and a threaded hole is provided on the side connected to the connecting module for connecting to the connecting rod 2. A T-shaped boss 6 is provided on the upper surface of the central block 3; a square boss 7 is provided on the lower surface of the central block 3. Correspondingly, the fixing plate 4 is a cuboid, and a T-shaped notch 8 is provided at one end of its length direction; a square notch 9 is provided at the other end.

[0044] The T-shaped notch 8 of the fixed plate 4 engages with the T-shaped boss 6 of the center block 3, and the square notch 9 of the fixed plate 4 engages with the square boss 7 of the center block 3. In use, the T-shaped boss 6 of the center block 3 is engaged in the T-shaped notch 8 of the fixed plate 4, and the square boss 7 of the center block 3 is engaged in the square notch 9 of the fixed plate 4. The two fixed plates 4 can move to both sides under the drive of the two center blocks 3, thereby generating shear force on the lattice structure test piece 10. At the same time, the square boss 7 of the center block 3 plays a limiting and guiding role on the square notch 9 of the fixed plate 4, so that the fixed plate 4 moves in the correct direction and does not deviate from the direction.

[0045] Furthermore, the side pressure blocks 5 are connected to the central block 3 by bolts, and the lower surface of the side pressure blocks 5 is slidably connected to the fixing plate 4, so that the fixing plate 4 can move under the action of the central block 3, but will not detach from the central block 3. The function of the side pressure blocks 5 is to limit the movement range of the fixing plate 4, ensure that the fixing plate 4 is parallel to the shear force, and also to counteract the bending moment generated by the lattice structure test piece 10.

[0046] Furthermore, the connection module includes a connector 1 and a connecting rod 2. The connector 1 is cylindrical, and one end of the connector 1 is provided with a radial pin hole. The connector 1 is connected to the testing machine by inserting the pin into the pin hole. The other end of the connector 1 is fixedly connected to the connecting rod 2. The connecting rod 2 is cylindrical, and the end away from the connector 1 is provided with a thread. The connecting rod 2 is connected to the center block 3 through the thread. The length of the connecting rod 2 can be adjusted according to the size of the test piece. The length of the connecting rod 2 should be sufficient to allow the clamping module to be placed in a high-temperature furnace.

[0047] Furthermore, the two fixing plates 4 are arranged in parallel with a spacing not greater than the thickness of the lattice structure to ensure the planarity of the lattice structure test piece 10. Fixing holes are provided on the fixing plates 4, and corresponding through holes are also provided on the upper and lower surfaces of the lattice structure test piece 10. The lattice structure test piece 10 is connected to the fixing plates 4 by bolts. The hole spacing of the fixing plates 4 can be adjusted according to the hole spacing of the lattice structure test piece 10 to accommodate lattice structure test pieces 10 of different shapes and sizes.

[0048] A method for testing the high-temperature shear properties of a lattice structure includes the following steps:

[0049] S1. Assemble the connecting module, the clamping module, and the lattice structure test piece 10.

[0050] S2. Connect the upper and lower connectors 1 to the fixed end and the loading end of the testing machine, respectively;

[0051] S3. Place the test apparatus in a high-temperature furnace and heat it to the test temperature, then keep it at that temperature.

[0052] S4. The tensile force applied to the connector 1 by the loading end of the testing machine drives the fixed plate 4 on one side to move, providing shear force to the specimen. Loading is stopped when the elongation reaches 20%.

[0053] S5. Extract the load curve of the testing machine. The first peak point is the maximum shear force that the lattice structure can withstand.

[0054] Furthermore, in step S1, when assembling the clamping module and the lattice structure test piece 10, when the test temperature is below 300 degrees Celsius, the lattice structure test piece 10 and the clamping module are bonded together with an adhesive, the shear strength of which is greater than the tensile strength of the lattice structure test piece 10. When the test temperature is above 300 degrees Celsius, the lattice structure test piece 10 and the clamping module are connected together with bolts, the shear strength of which is greater than the tensile strength of the lattice structure test piece 10.

[0055] Working principle:

[0056] The high-temperature shear performance testing device for lattice structures disclosed in this application operates on the principle of using the tensile force of the testing machine to provide shear force to the lattice structure test specimen 10 through the connecting module and clamping module. This causes the lattice structure test specimen 10 to be subjected to shear force, and the lattice structure test specimen 10 is also subjected to the clamping force of the two fixed plates 4 on both sides to prevent the lattice structure test specimen 10 from sliding and deforming. At the same time, the side pressure block 5 also counteracts the bending moment generated by the lattice structure test specimen 10. According to the load curve of the testing machine, the maximum shear force of the lattice structure test specimen 10 can be obtained.

[0057] Usage process:

[0058] The high-temperature shear performance testing device with lattice structure of this application can be used to perform the following steps:

[0059] Connect and fix the connecting module to the clamping module and the test piece. Adjust the length of the connecting rod 2 and the hole spacing of the fixing plate 4 according to the size and hole spacing of the lattice structure test piece 10, so that the lattice structure test piece 10 and the fixing plate 4 can fit together.

[0060] Connect the two connectors 1 to the fixed end and the loading end of the testing machine respectively, check whether the connection is firm, and adjust the symmetry and parallelism of the testing device;

[0061] The test device is placed in a high-temperature furnace and heated to the test temperature and kept warm. Depending on the test temperature, a suitable adhesive or bolt is selected to bond or connect the lattice structure test piece 10 to the fixing plate 4.

[0062] The tensile force applied to the connector 1 by the loading end of the testing machine drives the fixed plate 4 on one side to move, providing shear force to the lattice structure test piece 10, and the loading stops when the elongation reaches 20%.

[0063] Extract the load curve of the testing machine, and the first peak point is the maximum shear force that the lattice structure test piece 10 can withstand.

[0064] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0065] Although embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present invention.

[0066] The specific embodiments of the present invention described above do not constitute a limitation on the scope of protection of the present invention. Any other corresponding changes and modifications made in accordance with the technical concept of the present invention should be included within the scope of protection of the claims of the present invention.

Claims

1. A high-temperature shear performance testing device with a lattice structure, characterized in that, Includes a connection module and a clamping module; There are two connecting modules, symmetrically arranged on both sides of the clamping module along its length; one end of each connecting module is connected to the clamping module, and the other end is connected to the testing machine. The clamping module includes a side pressure block (5), a center block (3), and a fixing plate (4); The two center blocks (3) are respectively fixedly installed on the two connecting modules; the two center blocks (3) are arranged opposite each other but inverted in the setting direction; There are two fixing plates (4), which are parallel to each other but set in opposite directions; the two fixing plates (4) are respectively connected to the upper and lower surfaces of the two center blocks (3), and the lattice structure test piece (10) is fixed between the two fixing plates (4); The side pressure block (5) has four parts, which are respectively fixedly installed on the two center blocks (3); the side pressure block (5) limits the fixing plate (4) between the side pressure block (5) and the center block (3); The center block (3) has a threaded hole on the side connected to the connecting module. The center block (3) has a T-shaped boss (6) on its upper surface and a square boss (7) on its lower surface. Correspondingly, the fixing plate (4) has a T-shaped notch (8) at one end in the length direction and a square notch (9) at the other end. The T-shaped notch (8) of the fixed plate (4) is engaged with the T-shaped boss (6) of the center block (3), and the square notch (9) of the fixed plate (4) is engaged with the square boss (7) of the center block (3). The two fixed plates (4) can move to the sides respectively under the drive of the two center blocks (3) to generate shear force on the lattice structure test piece (10). The side pressure block (5) is connected to the center block (3) by bolts. The side pressure block (5) is slidably connected to the fixing plate (4) to limit the position of the fixing plate (4).

2. The high-temperature shear performance testing device for lattice structures according to claim 1, characterized in that, The connection module includes a connector (1) and a connecting rod (2). One end of the connector (1) is provided with a radial pin hole. The connector (1) is connected to the testing machine by inserting the pin into the pin hole. The other end of the connector (1) is fixedly connected to the connecting rod (2). The end of the connecting rod (2) away from the connector (1) is provided with a thread. The connecting rod (2) is connected to the center block (3) through the thread.

3. The high-temperature shear performance testing device for lattice structures according to claim 1, characterized in that, The fixing plate (4) has fixing holes, and the corresponding dot matrix structure test piece (10) also has through holes on its upper and lower surfaces.

4. A method for testing the high-temperature shear properties of a lattice structure, characterized in that, The application of the high-temperature shear performance testing device for lattice structures according to any one of claims 1-3 includes the following steps: S1. Assemble the connection module, clamping module and lattice structure test piece (10); S2. Connect the connection module to the testing machine; S3. Place the test apparatus in a high-temperature furnace and heat it to the test temperature, then keep it at that temperature. S4. Apply shear force through the testing machine until the lattice structure test piece (10) reaches 20% elongation and then stop loading; S5. Extract the load curve of the testing machine to obtain the maximum shear force that the lattice structure test piece (10) can withstand.

5. The method for testing the high-temperature shear performance of a lattice structure according to claim 4, characterized in that, In step S1, when the clamping module and the lattice structure test piece (10) are assembled, when the test temperature is below 300 degrees Celsius, the lattice structure test piece (10) and the clamping module are bonded together with an adhesive. When the test temperature is above 300 degrees Celsius, the lattice structure test piece (10) and the clamping module are connected together with bolts.

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