A semiconductor radiation sensor
By using an electrode array and a voltage divider resistor array to form a deflection electric field in the X-ray sensor, rapid electron collection is achieved, solving the signal accumulation problem caused by the long collection path, improving the counting rate and detection efficiency, and increasing the volume of the sensitive area.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHINA INSTITUTE OF ATOMIC ENERGY
- Filing Date
- 2023-12-01
- Publication Date
- 2026-07-14
AI Technical Summary
Existing X-ray sensors have long collection paths, resulting in long charge collection times, which can easily cause signal accumulation and affect the counting rate and detection efficiency.
An electrode array and a voltage divider resistor array within a cylindrical sensitive region are used to form a deflection electric field, causing the rays to drift radially to the central axis and then drift along the central axis to the collection region. After entering the collection region, electrons generate signals and are collected by the collection electrodes.
It shortens the electron collection path, improves the signal accumulation problem, increases the counting rate and X-ray detection efficiency, and increases the volume of the sensitive region while keeping the junction capacitance constant.
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Figure CN117849848B_ABST