Device and method for verifying the wien displacement law by infrared point scanning spectroscopy

Abstract

The application discloses a device for verifying Wien displacement law by infrared point scanning spectrum, which comprises a spectrum generating module, an infrared detecting module, a moving step module and a collection and display module. The spectrum generating module comprises a radiation light source, an optical slit, a first light shield, a convex lens and a light dispersion medium arranged in sequence. The infrared detecting module comprises a baffle, a second light shield and a photoelectric detector. The moving step module drives the infrared detecting module to move in one-dimensional direction, receives infrared spectrum and outputs data to the collection and display module. The collection and display module comprises a signal collector and a signal display, which displays the wavelength maximum value of the infrared spectrum and obtains the Wien constant, and obtains the error of the Wien constant measurement value relative to the standard value. The application uses the photoelectric detector to obtain the spectrum curve at a specific temperature, has long scanning distance after light dispersion, high spectrum resolution, high precision of the wavelength maximum value corresponding to the peak value of monochromatic radiant exitance, effectively reduces the measurement cost, has high cost performance and repeatability.

Description

Technical Field

[0001] This invention relates to the technical field of apparatus and methods for verifying Wien's displacement law, and particularly to an apparatus and method for verifying Wien's displacement law using infrared point scanning spectroscopy. Background Technology

[0002] Thermal radiation refers to the phenomenon that any object emits electromagnetic waves of different frequencies at any temperature. However, the Wien formula and Rayleigh-Jeans formula in classical theory cannot fully describe the characteristics of thermal radiation curves. To fill this theoretical gap, Planck proposed a new expression in 1900:

[0003]

[0004] After obtaining the above formula, Planck, in order to find the theoretical basis for it, discovered that the energy of the harmonic oscillator must be discrete to obtain the formula, thus ushering in the quantum era. When the thermodynamic temperature increases, the wavelength corresponding to the peak monochromatic radiance shifts towards shorter wavelengths; this is Wien's displacement law.

[0005] Tλ m =b

[0006] Where Wien's constant b = 2.898 × ​​10 -3 The peak wavelength (m·K) is inversely proportional to the temperature (T). Wien's displacement law plays a crucial role in infrared detection, radiative heat transfer, and many other applications. Its influence extends far beyond traditional thermodynamics and statistical physics, providing key theoretical support for multiple branches of modern physics.

[0007] Most existing experimental setups for demonstrating and studying blackbody radiation use visible light detectors. To capture the complete characteristic curve around the radiation peak, the radiation source temperature must be at least 5000K, which is difficult to achieve. Furthermore, most literature shows that this curve has few measurement points, is discrete and discontinuous, lacks smoothness, cannot be displayed in real time, and makes it difficult to determine the wavelength peak. Switching to a low-temperature radiation source results in the radiation peak falling in the infrared band, exceeding the range of visible light detectors. Although infrared spectrometers can avoid these drawbacks, they are expensive, cannot be miniaturized, and have complex structures. Therefore, they cannot be directly demonstrated in physics classrooms, and the internal principles of the experiment cannot be intuitively explained, hindering students' understanding.

[0008] Therefore, due to the limitations of existing technology, people are unable to solve this problem. Summary of the Invention

[0009] (I) Purpose of the invention: In order to solve the problems existing in the prior art, the purpose of the present invention is to provide an apparatus and method for verifying Wien's displacement law by infrared point scanning spectroscopy. By measuring the temperature of the thermal radiation source and the maximum wavelength corresponding to the peak wavelength of monochromatic radiance within a specific wavelength range, the relationship between temperature and the corresponding wavelength of monochromatic radiation peak is explored. The invention solves the problems of the radiation source temperature being too high to be directly measured and the maximum wavelength corresponding to the peak radiance being difficult to measure accurately by using low-cost equipment and methods, thereby verifying Wien's displacement law.

[0010] (II) Technical Solution: In order to solve the above technical problems, this technical solution provides a device for verifying Wien's displacement law by infrared point scanning spectrum, including a spectrum generation module, an infrared detection module, a moving stepping module and a data acquisition and display module; the spectrum generation module is used to emit infrared spectrum, including a radiation source, an optical slit, a first light shield, a convex lens and a spectrophotometric dispersion medium arranged sequentially along the infrared spectrum generation direction.

[0011] The infrared detection module includes a baffle plate in a direction away from the spectral dispersion medium, a second light-shielding plate, and a photodetector; the infrared detection module receives the infrared spectrum emitted by the spectral generation module and outputs the received infrared spectral data to the acquisition and display module;

[0012] The infrared detection module is mounted on the moving stepping module; the moving stepping module drives the infrared detection module to move in one dimension, ensuring that the infrared detector receives the spectral curve emitted by the spectral generation module;

[0013] The acquisition and display module includes a signal acquisition unit and a signal display. It acquires and displays the maximum wavelength corresponding to the spectral curve received by the infrared detection module and obtains the Wien constant measurement value. Based on the relative error between the Wien constant measurement value and the standard value, it verifies Wien's displacement law.

[0014] The radiation source, optical slit, convex lens, and spectral dispersion medium are all fixed below by clamps; the centers of the radiation source, optical slit, convex lens, spectral dispersion medium, and photodetector are located at the same horizontal height.

[0015] The spectrum generation module further includes a power supply, which is connected to the radiation source for power supply; the power supply is also connected to the signal display, which displays the output voltage and current of the power supply in real time.

[0016] The infrared detection module further includes a photodetector driving module and a linear power supply; the linear power supply is connected to the photodetector driving module, and the photodetector driving module is connected to the photodetector, driving the photodetector to perform infrared detection and receive infrared spectra.

[0017] After the device is installed, the standard light source replaces the radiation light source, and the infrared detection module obtains the calibration data curve, thus obtaining the principal maximum distance length corresponding to the wavelength of the standard light source. Based on the principal maximum distance length corresponding to the wavelength of the standard light source, the formula for calculating the principal maximum distance length x for different wavelengths λ is obtained.

[0018]

[0019] The temperature T of the radiation source is determined based on the relationship between resistance R and temperature T:

[0020]

[0021] The resistance of the radiation source is a preset threshold at room temperature.

[0022] The resistance of the radiation source was obtained by averaging multiple measurements at room temperature (20°C), R. 室温 =0.235Ω.

[0023] The wavelength λ is obtained by solving the formula for the distance to the principal maximum length, and Tλ is used as the basis for the calculation. m Find the Wien constant b for the corresponding wavelength. m .

[0024] Among them, the calculated Wien constant b m The relative error is calculated by comparing it with the standard value b:

[0025]

[0026] A method for verifying Wien's displacement law using infrared point scanning spectroscopy, applicable to the apparatus for verifying Wien's displacement law using infrared point scanning spectroscopy, includes the following steps:

[0027] Step 1: Install the spectrum generation module, infrared detection module, moving stepping module and acquisition display module in sequence, and calibrate the positions of each module.

[0028] Step 2: The moving stepping module moves in one dimension, the infrared receiving module receives the infrared spectrum and outputs it to the acquisition and display module, and the acquisition and display module measures the maximum wavelength λ corresponding to the peak monochromatic radiance. m And calculate the measured value of Wien's constant b according to Wien's displacement law. m ;

[0029] Step 3: Compare the measured values ​​of Wien's constants b1, b2, b3, and b4 obtained in Step 2 with the standard value b, and calculate the relative error to verify Wien's displacement law.

[0030] (III) Beneficial Effects: This invention provides a device and method for verifying Wien's displacement law using infrared point scanning spectroscopy. First, it transforms the measurement of halogen lamp temperature into the measurement of its resistance, simplifying experimental measurement and calculation and solving the problem of not being able to directly measure filament resistance due to high temperatures. Second, this invention uses a point-receiving photodetector with a single detection element to scan and acquire spectral curves at specific temperatures. The long scanning distance after spectral dispersion results in high spectral resolution and high accuracy in obtaining the maximum wavelength corresponding to the peak monochromatic radiance, effectively reducing measurement costs and offering high cost-effectiveness. Third, this invention achieves precise data acquisition and accurate position control through automated control of the moving stepping module, reducing human error. The relative error between the specific embodiment and the standard value is between 1.0182% and 4.96589%, demonstrating high accuracy and repeatability. Finally, this invention can be used to study and explore the spectral characteristics of thermal radiation in different materials and at different temperatures, and can also be used in fields such as infrared thermal imaging and infrared sensors, promoting the development of related technologies and having significant implications for the widespread application of infrared spectroscopy. Attached Figure Description

[0031] Figure 1 This is a system structure diagram of an infrared point scanning spectroscopy device for verifying Wien's displacement law according to the present invention;

[0032] Figure 2 This is a diagram showing the positions of each module in an infrared point scanning spectroscopy device for verifying Wien's displacement law according to the present invention.

[0033] Figure 3 This is a diagram showing the connection of each module of the device for verifying Wien's displacement law using infrared point scanning spectroscopy according to the present invention.

[0034] Figure 4 This is a flowchart of a method for verifying Wien's displacement law using infrared point scanning spectroscopy according to the present invention;

[0035] Figure 5 This is a flowchart of the module connection steps of a method for verifying Wien's displacement law using infrared point scanning spectroscopy according to the present invention;

[0036] Figure 6 This is a schematic diagram of the optical path of the present invention;

[0037] Figure 7 This is a calibration principle diagram of a method for verifying Wien's displacement law using infrared point scanning spectroscopy according to the present invention;

[0038] Figure 8This is a calibration data curve of the method for verifying Wien's displacement law using infrared point scanning spectroscopy according to the present invention;

[0039] Figure 9 This is a flowchart of the steps for calculating the wavelength and Wien constant in a method for verifying Wien's displacement law using infrared point scanning spectroscopy according to the present invention;

[0040] Figure 10 This invention provides a method for verifying Wien's displacement law using infrared point scanning spectroscopy, and the curves of radiance at different temperatures are shown.

[0041] Figure 11 This is a graph of the radiance curve obtained by the photodetector under 8.00V voltage according to the present invention;

[0042] Figure 12 This is a graph of the radiance curve obtained by the photodetector at a voltage of 6.67V according to the present invention;

[0043] Figure 13 This is a graph of the radiance curve obtained by the photodetector under a voltage of 9.20V according to the present invention;

[0044] Figure 14 This is a graph showing the radiance curve obtained by the photodetector under a voltage of 10.5V according to the present invention.

[0045] Reference numerals: 1-Radiation source, 2-Holder, 3-Optical slit, 4-First light-shielding plate, 5-Power supply, 6-Convex lens, 7-Spectroscopic dispersion medium, 8-Baffle, 9-Second light-shielding plate, 10-Photodetector drive module, 11-Photodetector, 12-Linear power supply, 13-Moving stepper module, 14-Signal acquisition unit, 15-Signal display. Detailed Implementation

[0046] The present invention will be further described in detail below with reference to preferred embodiments. More details are set forth in the following description in order to provide a full understanding of the present invention. However, the present invention can obviously be implemented in many other ways different from those described herein. Those skilled in the art can make similar extensions and derivations based on actual application situations without departing from the spirit of the present invention. Therefore, the scope of protection of the present invention should not be limited by the content of this specific embodiment.

[0047] The accompanying drawings are schematic diagrams of embodiments of the present invention. It should be noted that these drawings are for illustrative purposes only and are not drawn to scale, and should not be construed as limiting the actual scope of protection of the present invention.

[0048] A device for verifying Wien's displacement law using infrared point scanning spectroscopy, such as... Figure 1 As shown, it includes a spectrum generation module, an infrared detection module, a moving stepping module, and a data acquisition and display module. Figure 2, Figure 3 As shown, the spectral generation module includes a radiation source 1, an optical slit 3, a first light-shielding plate 4, a power supply 5, a convex lens 6, and a spectroscopic dispersion medium 7. The radiation source 1, optical slit 3, first light-shielding plate 4, convex lens 6, and spectroscopic dispersion medium 7 are arranged sequentially, and their lower parts are fixed by clamps 2 to ensure that their centers are at the same horizontal level. The radiation source 1, after being focused by the optical slit 3, forms a line light source. This line light source passes through the first light-shielding plate 4, which weakens stray light and reduces its impact on the infrared detection module's results. The line light source, after passing through the convex lens 6, forms parallel monochromatic light. This parallel monochromatic light, after passing through the spectroscopic dispersion medium 7, forms a continuous spectrum, which is received by the infrared detection module.

[0049] The radiation source 1 described in this invention is preferably a 35W halogen lamp. Halogen lamps are common lighting devices, readily available, and relatively inexpensive. Furthermore, the halogen lamp has adjustable brightness, allowing control over the intensity of radiation. Simultaneously, the radiation from a halogen lamp is a continuous spectrum, not a discrete spectrum, enabling the measurement of the radiation intensity of light of different wavelengths at different temperatures, thus verifying the correctness of Wien's displacement law.

[0050] The power supply 5 described in this invention is preferably a programmable DC numerically controlled power supply. The power supply 5 is connected to the radiation source 1 to supply power to the radiation source 1, ensuring that the radiation source 1 can emit light stably and that the infrared detection module receives an effective spectrum, thereby verifying Wien's displacement law. The programmable DC numerically controlled power supply provides an output voltage proportional to the light intensity, and the output voltage varies between 1.25V and 14V.

[0051] The dispersive medium 7 described in this invention preferably has a 100-line grating, and is analyzed according to formula (1):

[0052] d sinθ=±kλ (1)

[0053] Where: d is the grating constant. In this invention, a 100-line grating is selected, therefore d = 0.01 mm;

[0054] k is the stripe level, k = 1;

[0055] λ is the wavelength range, λ = (800-1700) nm;

[0056] θ is the diffraction angle.

[0057] The infrared detection module is disposed on one side of the dispersive medium 7 of the spectral generation module, and includes a baffle 8, a second light-shielding plate 9, a photodetector driving module 10, a photodetector 11, and a linear power supply 12. Figure 2 , Figure 3 As shown, the baffle 8, the second light-shielding plate 9, and the photodetector 11 are arranged in sequence in a direction away from the spectral generation module.

[0058] More specifically, the photodetector 11 is mounted on the photodetector driving module 10, and the distance between the photodetector 11 and the dispersive medium 7 is L = 170 mm. The photodetector driving module 10 is connected to the photodetector 11 and drives the photodetector 11 to collect the infrared spectrum emitted by the spectral generation module. The second light-shielding plate 9 is disposed on the surface of the photodetector 11 to ensure that the infrared spectrum emitted by the spectral generation module can be uniformly displayed after passing through the photodetector light-shielding plate 9, and to ensure that the light intensity received by the photodetector 11 is within the effective range. The baffle 8 is placed between the second light-shielding plate 9 and the spectral generation module, and the baffle 8 effectively reduces the main maximum light intensity to prevent overexposure. The linear power supply 12 is connected to the photodetector driving module 10 to supply power to the photodetector driving module 10. The photodetector 11 is also connected to the acquisition and display module to output the acquired infrared spectrum to the acquisition and display module.

[0059] The infrared detection module is mounted on the moving stepping module 13. The infrared detection module can follow the moving stepping module 13 to move in one dimension and receive the infrared spectrum emitted by the spectral generation module.

[0060] The photodetector 11 of this invention is preferably an LSIPD-A75 type InGaAs photodiode, the sensitivity range of which is 800-1700nm. Since the highest operating temperature of the halogen lamp serving as the radiation source 1 is approximately 3000K, theoretically, the peak wavelength corresponding to the Planck radiation curve at this temperature is approximately 970nm. However, the second-order diffraction at λ=400nm and the first-order diffraction at λ=800nm ​​produce the same diffraction angle, potentially causing wavelength and order overlap. To avoid this overlap, a photodiode sensitive only to the 800-1700nm range is selected, effectively eliminating low-wavelength high-order diffraction light.

[0061] The moving stepping module 13 is positioned below the infrared detection module. By moving the moving stepping module 13, the distance between the infrared detection module and the spectrum generation module can be adjusted, ensuring that the infrared detection module can clearly and completely receive the spectrum emitted by the spectrum generation module. This invention preferably uses a 50mm one-dimensional precision translation stage from Zolihan Optoelectronics as the moving stepping module 13.

[0062] When λ1 = 800nm, according to formula (1), θ1 = 4.58857° can be obtained. From x = tanθ·L, the distance x1 = 13.644mm can be obtained. When λ2 = 1700nm, according to formula (1), θ2 = 9.78782° can be obtained. From x = tanθ·L, the distance x2 = 29.327mm can be obtained. Therefore, the single-sided peak travel distance of 800-1700nm is approximately Δx = x2 - x1 = 15.683mm. Based on the single-sided peak travel distance, a 50mm one-dimensional precision translation stage of Zhuoli Hanguang is selected, and in order to ensure sufficient measurement points, a step distance of 0.025mm is selected.

[0063] The acquisition and display module includes a signal acquisition unit 14 and a signal display unit 15. The signal acquisition unit 14 acquires the voltage intensity signal output by the photodetector 11 and outputs the voltage intensity signal to the signal display unit 15 for display, thereby obtaining the spectral curve of the corresponding wavelength. The Wien constant measurement value is obtained based on the maximum wavelength value corresponding to the spectral curve, and the Wien displacement law can be verified based on the relative error between the Wien constant measurement value and the standard value. Additionally, the signal display unit 15 is also connected to the power supply 5, displaying the output voltage and current of the power supply 5 in real time.

[0064] The signal acquisition board 14 is preferably a 12-bit AD7606 voltage acquisition module. The signal display 15 is preferably an STM32F407 development board capable of serial communication, where serial communication refers to a communication method that sends and receives bytes bit by bit.

[0065] This invention provides a device for verifying Wien's displacement law using infrared point scanning spectroscopy. The entire measurement process is automated to reduce the impact of human error. LabVIEW is preferred for the automated measurement in this invention, but no specific limitations are imposed.

[0066] A method for verifying Wien's displacement law using infrared point scanning spectroscopy, employing an apparatus for verifying Wien's displacement law using infrared point scanning spectroscopy, such as... Figure 4 As shown, the specific steps include:

[0067] Step 1: Install the spectrum generation module, infrared detection module, moving stepping module and acquisition display module in sequence, and calibrate the positions of each module.

[0068] Step 2: The moving stepping module moves in one dimension, the infrared receiving module receives the infrared spectrum and outputs it to the acquisition and display module, and the acquisition and display module measures the maximum wavelength λ corresponding to the peak monochromatic radiance. m And calculate the measured value of Wien's constant b according to Wien's displacement law. m ;

[0069] Step 3: Compare the measured values ​​of Wien's constants b1, b2, b3, and b4 obtained in Step 2 with the standard value b, and calculate the relative error to verify Wien's displacement law.

[0070] More specifically, step one includes the following steps, such as Figure 5 As shown:

[0071] Step 101: Securely mount the radiation source on the holder and connect the radiation source to the power supply; place the optical slit in front of the radiation source, adjust the distance between the radiation source and the slit, and adjust the width of the slit; place the first light-shielding plate on the side of the optical slit away from the radiation source; place the convex lens and the spectral dispersion medium in sequence on the side of the first light-shielding plate away from the radiation source, and adjust the distance between the optical slit, the convex lens, and the spectral dispersion medium.

[0072] Step 102: Place a baffle on the side of the spectral dispersion medium away from the radiation source, and connect and fix the photodetector, optical detector drive module and linear power supply to the moving stepping module.

[0073] It should be noted that in steps 101 and 102, the radiation source, optical slit, convex lens, dispersive medium, and photodetector are all at the same height; and the distance L between the dispersive medium and the photodetector is a preset value, set according to the measurement accuracy of the photodetector. Preferably, L = 170 mm, ensuring that the photodetector can receive a complete and clear spectrum.

[0074] Step 103: Connect the photodetector, signal acquisition unit, and signal display.

[0075] Step 104: Replace the radiation source with a calibration source. The infrared detection module receives the spectrum emitted by the calibration source after passing through a convex lens and a dispersive medium, and collects and displays it through the acquisition and display module.

[0076] The calibration process described in step 104 is as follows: Figure 6 , Figure 7As shown, the calibration light source should have a stable wavelength radiance. The calibration light source of this invention is preferably a 532nm green laser pointer generated by a diode-pumped solid-state DPSS green laser.

[0077] The calibration data curve is as follows: Figure 8 As shown, the -1st and +1st order principal maxima with a wavelength of 532nm correspond to points 28 and 768, respectively. Therefore, the wavelength distance x from the principal maxima at 532nm can be obtained as follows:

[0078] (768-28)×0.025=18.5mm

[0079] Based on the proportional relationship between wavelength λ and the corresponding distance principal maximum length x, a calibration formula is derived, as shown in formula (2), which can accurately calculate the distance principal maximum length corresponding to each wavelength:

[0080]

[0081] like Figure 9 As shown, step two specifically includes the following steps:

[0082] Step 201: Using a halogen lamp as a radiation source, first set the voltage value of the radiation source and record the current displayed on the signal display at this time to obtain the resistance R of the radiation source.

[0083] Step 202: Determine the temperature T of the radiation source by the relationship between resistance and temperature.

[0084] Perform the calculation as shown in formula (3):

[0085]

[0086] The resistance of the halogen lamp at room temperature (20°C) is a preset value. Preferably, the resistance is measured using an M328 transistor tester, and the average of 20 sets of data is taken to obtain the R value. 室温 =0.235Ω.

[0087] The power supply provides an output voltage proportional to the light intensity, which varies between 1.25V and 14V. The corresponding voltage and current are read in real time via a signal display. With the halogen lamp voltage set to 6.67V, 8.00V, 9.20V, and 12.20V, the corresponding currents are 2.165A, 2.385A, 2.556A, and 2.970A, respectively. The temperature of the radiation source is calculated using formula (3), and the results are shown in Table 1. As the voltage increases, the resistance of the radiation source increases, and the temperature of the radiation source increases.

[0088]

[0089]

[0090] Table 1 Temperature of radiation source at different voltages

[0091] Step 203: Activate the moving stepping module to make the photodetector translate one-dimensionally along a direction perpendicular to the optical axis. Simultaneously, use a signal acquisition device to collect data, record the signal intensity of the photodetector, and obtain the spectral curve.

[0092] Step 204: Based on the relationship between the distance principal maximum length and the corresponding wavelength, calculate the wavelength λ corresponding to each peak position of the spectral curve obtained in step 203. m and each wavelength λ m The corresponding Wien constant b m .

[0093] The following detailed description is provided with reference to specific embodiments, such as... Figure 10 As shown, the input voltage value of the radiation source was adjusted, the experiment was repeated, and the data obtained by the acquisition and display module was recorded. Under the premise of ensuring the same 0th-order principal maxima, as the temperature increases, the maximum wavelength λ corresponding to the peak monochromatic radiance of the radiation source increases. m The particle moves from position 1243 to position 1214, then continues to position 1190, and finally reaches position 1178. The overall trend is to move to the left, and as the temperature rises, this leftward movement becomes slower, which is consistent with Wien's law of displacement.

[0094] Let's take an 8.00V voltage value as an example for explanation. Figure 11 As shown, the photodetector detects the principal maximum at position 438 and the peak of the first-order diffraction at position 1214. The photodetector records data every 0.025 mm, therefore the distance between these two points can be calculated.

[0095] x=(1214-438)×0.025=19.4mm

[0096] According to formula (2), λ can be calculated. m =1115.762nm, and then according to formula (4):

[0097] Tλ m =b (4)

[0098] The Wien constant b of the radiation source at a voltage of 8.00V can be calculated to be 2.754871 × 10⁻⁶. -3 m·K.

[0099] like Figures 12-14The figures shown are the radiance curves received by the photodetector at voltages of 6.67V, 9.20V, and 12.20V, respectively. The wavelength and Wien constant measured at different voltages are calculated according to formulas (2) and (4), as shown in Table 2. As the voltage increases, the temperature of the radiation source increases, and the Wien constant corresponding to the radiation source increases.

[0100]

[0101] Table 2 Wavelengths and Wien constants for different voltages

[0102] Step three specifically involves comparing the calculated measured value of Wien's constant with the standard value b = 2.898 × ​​10⁻⁶. -3 By comparing m·K, the relative error is calculated according to formula (5):

[0103]

[0104] The calculation results are shown in Table 3:

[0105]

[0106] Table 3. Relative errors between measured and standard values ​​of Wien's constant at various voltages.

[0107] As shown in Table 3, there is a certain deviation between the experimental results of this invention and the standard values. When the voltage value is 8.00V, the measured value of Wien's constant b is... m The closest value to the standard value of Wien's constant, b, is found. The relative error of the experimental results is greater than or equal to 1.0182% and less than or equal to 4.96589%, exhibiting an overall U-shaped pattern. Beyond the threshold, the lower the voltage, the greater the relative error; conversely, the higher the voltage, the greater the relative error. Experimental results demonstrate that the device and method for verifying Wien's displacement law using infrared point scanning spectroscopy of this invention have high accuracy and a certain degree of reliability; furthermore, the device and method for verifying Wien's displacement law using infrared point scanning spectroscopy of this invention are repeatable.

[0108] The preset values ​​described in this invention can be modified before the start of the method described in this invention, and can be changed according to the actual experimental environment to ensure a clear and complete infrared spectral curve is obtained. No specific restrictions are imposed here. However, it should be noted that once the preset values ​​are set, they cannot be modified again during the entire method process.

[0109] This invention discloses a device and method for verifying Wien's displacement law using infrared point scanning spectroscopy. First, it transforms the measurement of a halogen lamp's temperature into the measurement of its resistance, simplifying the experimental measurement and calculation and solving the problem of directly measuring filament resistance at high temperatures. Second, it uses a point-receiving photodetector with a single detection element to scan and acquire the spectral curve at a specific temperature. This results in a long scanning distance after spectral dispersion, high spectral resolution, and high accuracy in determining the wavelength maximum corresponding to the monochromatic radiant peak, effectively reducing measurement costs and offering high cost-effectiveness. Third, it uses LabVIEW to automatically control the stepper motor's progress, achieving precise data acquisition and accurate position control, reducing human error and ensuring high experimental accuracy. The experimental method and measurement technology yield highly accurate and repeatable results. Finally, this invention can be used to study and explore the spectral characteristics of thermal radiation in different materials and at different temperatures, and can also be applied to fields such as infrared thermal imaging and infrared sensors, promoting the development of related technologies.

[0110] The above description illustrates preferred embodiments of the present invention and helps those skilled in the art to more fully understand the technical solution of the present invention. However, these embodiments are merely illustrative and should not be construed as limiting the specific implementation of the present invention to these embodiments. For those skilled in the art, several simple deductions and modifications can be made without departing from the inventive concept, and all such modifications should be considered within the protection scope of the present invention.

Claims

1. A device for verifying Wien's displacement law using infrared point scanning spectroscopy, characterized in that, It includes a spectrum generation module, an infrared detection module, a moving stepping module, and a data acquisition and display module. The spectrum generation module is used to emit infrared spectra and includes a halogen lamp radiation source, an optical slit, a first light-shielding plate, a convex lens, and a spectral dispersion medium arranged sequentially along the infrared spectrum generation direction, as well as a programmable DC numerical control power supply connected to and powered by the halogen lamp radiation source. The centers of the radiation source, optical slit, convex lens, spectral dispersion medium, and photodetector are located at the same horizontal height. The infrared detection module includes a baffle plate in a direction away from the spectral dispersion medium, a second light-shielding plate, a photodetector, a photodetector driving module, and a linear power supply; the infrared detection module receives the infrared spectrum emitted by the spectral generation module and outputs the received infrared spectral data to the acquisition and display module; the photodetector is an InGaAs photodiode. The infrared detection module is mounted on the moving stepping module; the moving stepping module drives the infrared detection module to move in one dimension, ensuring that the infrared detection module receives the spectral curve emitted by the spectral generation module; The acquisition and display module includes a signal acquisition unit and a signal display. It acquires and displays the maximum wavelength corresponding to the spectral curve received by the infrared detection module and obtains the Wien constant measurement value. After the device is installed, it is calibrated using a standard light source to establish the correspondence between different wavelengths and the distance to the principal maximum length. The temperature of the radiation source is determined based on the relationship between the resistance and temperature of the radiation source. Calculate the Wien constant value for the corresponding wavelength, and verify Wien's displacement law based on the relative error between the Wien constant measurement value and the standard value.

2. The apparatus for verifying Wien's displacement law by infrared point scanning spectroscopy according to claim 1, characterized in that, The radiation source, optical slit, convex lens, and the lower part of the dispersive medium are all fixed by clamps.

3. The apparatus for verifying Wien's displacement law by infrared point scanning spectroscopy according to claim 1, characterized in that, The standard light source is a 532nm standard light source. Based on the distance principal maximum length corresponding to the wavelength of the standard light source, the formulas for calculating the distance principal maximum length x for different wavelengths λ are obtained: 。 4. The apparatus for verifying Wien's displacement law by infrared point scanning spectroscopy according to claim 1, characterized in that, The temperature T of the radiation source is determined based on the relationship between resistance R and temperature T: ； The resistance of the radiation source is a preset threshold at room temperature.

5. The apparatus for verifying Wien's displacement law by infrared point scanning spectroscopy according to claim 4, characterized in that, The resistance of the radiation source was obtained by averaging multiple measurements at room temperature (20°C). .

6. The apparatus for verifying Wien's displacement law by infrared point scanning spectroscopy according to claim 1, characterized in that, The calculated Wien constant b m The relative error is calculated by comparing it with the standard value b: 。 7. A method for verifying Wien's displacement law using infrared point scanning spectroscopy, applicable to the apparatus for verifying Wien's displacement law using infrared point scanning spectroscopy as described in claim 1, characterized in that... Includes the following steps: Step 1: Install the spectrum generation module, infrared detection module, moving stepping module and acquisition display module in sequence, and calibrate the positions of each module. Step 2: The moving stepping module moves in one dimension; the infrared detection module receives the infrared spectrum and outputs it to the acquisition and display module; the acquisition and display module measures the maximum wavelength corresponding to the peak monochromatic radiance. And calculate the measured value of Wien's constant b according to Wien's displacement law. m ; Step 3: Measure the Wien constant obtained in Step 2. , , , Compared with standard value By comparing the results and calculating the relative error, Wien's displacement law can be verified.

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