一种基底的有效介电常数与导体的粗糙度的提取方法
By coupling the odd and even modes of the microstrip line model, the effective dielectric constant of the substrate and the roughness of the conductor can be directly calculated or simulated, thus solving the influence of the surface roughness of the microstrip line-substrate contact surface on the measurement and realizing accurate measurement and efficient production.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- JCET MANAGEMENT CO LTD
- Filing Date
- 2024-01-04
- Publication Date
- 2026-07-17
AI Technical Summary
In the prior art, the surface roughness of the microstrip line in contact with the substrate has a significant impact on the measurement of the effective dielectric constant of the substrate, resulting in inaccurate measurements and making it difficult to accurately extract the effective dielectric constant of the substrate and the roughness of the conductor.
By employing a coupled microstrip line model and utilizing its odd-mode and even-mode properties, the effective dielectric constant of the substrate and the roughness of the conductor can be directly obtained through numerical calculation or software simulation, thus avoiding the shortcomings of traditional measurement methods.
The effective dielectric constant of the substrate can be accurately obtained without measuring the conductor roughness, avoiding the influence of inaccurate roughness measurement, shortening the measurement time, improving production efficiency, and solving the problem of multiple solutions in the single-ended transmission line method.
Smart Images
Figure CN117870769B_ABST