Non-destructive testing apparatus and method for interconnect tabs for solar cell arrays

Abstract

The application provides a kind of solar cell array interconnection sheet nondestructive testing device, including fixed frame, optical camera, servo platform, 3D high-precision laser measuring instrument, moving guide rail and grating ruler, supercomputer, image stitching processing module and defect marking module;Solar cell array is installed on the fixed frame, the optical camera is used to scan solar cell array and obtain solar cell array optical image, the 3D high-precision laser scanner is used to select point profile scanning solar cell array interconnection sheet and obtain the profile curve of interconnection sheet, the maximum point of difference value and the maximum value of root mean square are obtained by data processing, and compared with the set threshold, the defect interconnection sheet is identified, and the interconnection sheet defect position is obtained by combining grating ruler positioning function.The application realizes the detection of superconducting, high-emissivity material for interconnection sheet, greatly improves the quality of space solar cell array interconnection sheet, and improves the space adaptability of solar cell array.

Description

Technical Field

[0001] This invention relates to the field of space solar cell arrays, and particularly to a non-destructive testing device and method for interconnecting sheets used in solar cell arrays. Background Technology

[0002] To meet specific output voltage requirements throughout the lifespan of a solar array, solar cells are connected in series via interconnects to satisfy certain voltage demands. Space-based solar array interconnects must withstand relatively harsh mechanical and thermal environments during launch and in orbit. The quality of the interconnects is crucial to the high reliability of power output throughout the lifespan of the solar array.

[0003] Currently, visual inspection is commonly used to examine the appearance of solar cell interconnects. However, due to the small size and large number of interconnects, visual inspection is inefficient and prone to omissions. This invention uses a 3D high-precision laser measuring instrument to achieve non-destructive testing of interconnects on rigid / flexible large-area solar cell panels. By stitching together the regional inspection images, an inspection image of the entire solar cell array interconnects can be obtained. The defect marking function of interconnects can be used to mark the location and type of defects. This non-destructive testing device can better achieve quality control of interconnects in space solar cell arrays. Summary of the Invention

[0004] The purpose of this invention is to provide a non-destructive testing device and method for interconnects in solar cell arrays, so as to solve the problems of low efficiency, high false negative rate and inability to save and process test results by traditional visual inspection methods.

[0005] To solve the above-mentioned technical problems, the technical solution of the present invention is: to provide a non-destructive testing device for interconnects in solar cell arrays, including a fixed frame, an optical camera, a servo platform, a 3D high-precision laser measuring instrument, a moving guide rail and a grating ruler, a supercomputer, an image stitching processing module and a defect marking module;

[0006] The solar cell array is installed on the fixed frame. The optical camera scans the solar cell array to obtain an optical image of the solar cell array. The 3D high-precision laser scanner performs point-selective contour scanning on the interconnects of the solar cell array to obtain the contour curves of the interconnects. Through data processing, the maximum difference point and the root mean square maximum value are obtained and compared with the set threshold to identify defective interconnects. The defect location of the interconnect is obtained by combining the grating ruler positioning function. The defective interconnect location and defect type are marked on the large-area solar cell array optical image using the image stitching processing module and the defect marking module.

[0007] Furthermore, the optical camera is used to take pictures of the solar cell array, and the images are then stitched together to form a complete photograph.

[0008] Furthermore, a supercomputing computer is used to perform AI self-learning on the interconnect chip positions, and single-chip scanning is performed based on the learned position information.

[0009] Furthermore, a 3D high-precision laser measuring instrument is used to suppress the influence of multiple reflections; the 3D high-precision laser measuring instrument uses a light-receiving element with ultra-high sensitivity, which is not easily affected by the color and gloss of the target object.

[0010] Furthermore, the image stitching processing module stitches the region detection images together to obtain a detection image of the entire interconnect sheet of the solar cell array.

[0011] Furthermore, the defect marking module marks the location and type of defects in the solar cell array interconnects for technicians to judge and handle.

[0012] Another technical solution of the present invention provides a non-destructive testing method for interconnects in solar cell arrays, comprising the following steps:

[0013] S1. Obtain the size information of the solar cell array to be tested;

[0014] S2. Place the solar cell array to be tested on the substrate mounting fixture of the fixed frame of the testing device. The frame is made of aluminum profile. The parallelism between the plane of the substrate mounting fixture and the scanning reference plane is ±1°.

[0015] S3. Connect the visible light camera and turn on the control acquisition card:

[0016] After the motor self-test resets, fill in the test information; use the control handle to turn on the positioning photoelectric switch, move the laser point to the target position, set this position as the zero point, set the light point indicator position as the zero point position of the detection, press start and the device will start automatic acquisition to obtain the optical image of the solar cell array;

[0017] S4. The automatic stitching function is used to stitch the detected images together, and the automatic image fusion process can obtain the stitched image; the image annotation function is used to annotate the visible light photos to obtain 3D camera position data for interconnect sheet detection.

[0018] S5. Read the visible light photograph 3D camera position file, scan to obtain the grayscale image and height of the interconnect position, and obtain the contour curve of the interconnect and the data files of each curve.

[0019] Feature curves are extracted from scan points. The ratio of the actual data and the best-fit data at each point is obtained through processing. The point with the largest difference and the root mean square value are found. By comparing these values ​​with a set threshold, interconnect defects can be identified.

[0020] The beneficial effects of the non-destructive testing device and method for interconnecting sheets in solar cell arrays provided by this invention are:

[0021] This invention mounts a solar cell array on a fixed frame. An optical camera scans the array to obtain an optical image, and a 3D high-precision laser scanner performs point-by-point contour scanning on the interconnects to obtain their contour curves. Data processing identifies the point of maximum difference and the root mean square (RMS) value, which are then compared with a set threshold to identify defective interconnects. Combined with a grating ruler positioning function, the location of defects can be determined. Image stitching and defect annotation functions can be used to mark the location and type of defective interconnects on the optical image of a large-area solar cell array. This inspection method is non-destructive testing, enabling automated inspection of large-area solar cell arrays. It boasts high efficiency, low false negative rate, and the images can be saved and processed. Attached Figure Description

[0022] The invention will be further described below with reference to the accompanying drawings:

[0023] Figure 1 Schematic diagram of non-destructive testing principle for solar cell array interconnects

[0024] Figure 2 Schematic diagram of an automated non-destructive testing device for interconnects in solar cell arrays. Detailed Implementation

[0025] The non-destructive testing device and method for interconnecting wafers in solar cell arrays proposed in this invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. The advantages and features of this invention will become clearer from the following description and claims. It should be noted that the drawings are all in a very simplified form and use non-precise ratios, and are only used to facilitate and clarify the illustration of the embodiments of this invention.

[0026] The purpose of this invention is to provide a non-destructive testing device for interconnects of solar cell arrays. The device comprises hardware and software components. The hardware component includes a fixed frame, an optical camera, a servo platform, a 3D high-precision laser measuring instrument, a moving guide rail, and a grating ruler. The software component includes algorithms for image smoothing, enhancement, restoration, and filtering; lens distortion correction, angle transformation, normalization, feature highlighting, automatic sharpness judgment, contour recognition, homogenization, feathering, pyramiding, and gradient processing; and defect annotation.

[0027] This invention mounts a solar cell array on a fixed frame. An optical camera scans the array to obtain an optical image, and a 3D high-precision laser scanner performs point-by-point contour scanning on the interconnects to obtain their contour curves. Data processing identifies the point of maximum difference and the root mean square (RMS) value, which are then compared with a set threshold to identify defective interconnects. Combined with a grating ruler positioning function, the location of defects can be determined. Image stitching and defect annotation functions can be used to mark the location and type of defective interconnects on the optical image of a large-area solar cell array. This inspection method is non-destructive testing, enabling automated inspection of large-area solar cell arrays. It boasts high efficiency, low false negative rate, and the images can be saved and processed.

[0028] The method for performing non-destructive testing using the non-destructive testing device for solar cell array interconnects provided by this invention includes the following steps:

[0029] Step 1: Obtain the size information of the solar cell array to be tested;

[0030] Step 2: Place the solar cell array to be tested on the substrate mounting fixture of the fixed frame of the testing device. The frame is made of aluminum profile, and the plane of the substrate mounting fixture is parallel to the scanning reference plane by ±1°.

[0031] Step 3: Connect the visible light camera and turn on the control acquisition card. After the motor self-test reset, fill in the test information. Use the control handle to turn on the positioning photoelectric switch, move the laser point to the target position, set this position as the zero point, set the light spot indicator position as the detection zero point position, and press start to begin automatic acquisition to obtain the optical image of the solar cell array.

[0032] Step 4: The automatic stitching function can be used to stitch the detected images together, and the automatic image fusion process will yield the stitched image. The image annotation function can be used to annotate the visible light photographs to obtain 3D camera position data for interconnect patch detection.

[0033] Step 5: Read the visible light photograph 3D camera position file, scan to obtain the grayscale image and height of the interconnect position, and obtain the contour curve of the interconnect and the data files of each curve. Extract the feature curves from the scan points, process them to obtain the ratio of the actual data and the best-fit data at that point, find the point with the largest difference and the root mean square maximum value, and compare them with the set threshold to mark the interconnect defects.

[0034] The contents not described in detail in this specification are prior art known to those skilled in the art. It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within the present invention.

Claims

1. A non-destructive testing device for interconnect sheets used in solar cell arrays, characterized in that, It includes a fixed frame, optical camera, servo platform, 3D high-precision laser measuring instrument, moving guide rail and grating ruler, supercomputer, image stitching and processing module and defect marking module; The solar cell array is installed on the fixed frame. The optical camera scans the solar cell array to obtain an optical image of the solar cell array. The 3D high-precision laser scanner performs point-selective contour scanning on the interconnects of the solar cell array to obtain the contour curves of the interconnects. Through data processing, the maximum difference point and the root mean square maximum value are obtained and compared with a set threshold to identify defective interconnects. The location of the defective interconnects is obtained by combining the grating ruler positioning function. The image stitching processing module and the defect marking module are used to mark the location and type of defective interconnects on the large-area solar cell array optical image. The optical camera is used to take pictures of the solar cell array, and then the pictures are stitched together to form a complete image. A supercomputing computer is used to perform AI self-learning on the interconnect chip positions, and a single scan is performed based on the learned position information. A 3D high-precision laser measuring instrument is used to suppress the effects of multiple reflections; the 3D high-precision laser measuring instrument uses a light-receiving element with ultra-high sensitivity, which is not easily affected by the color and gloss of the target object; The image stitching processing module stitches together the region detection images to obtain a detection image of the entire interconnect sheet of the solar cell array. The defect labeling module marks the location and type of defects in the solar cell array interconnects, allowing technicians to make judgments and handle them.

2. A non-destructive testing method for interconnect sheets used in solar cell arrays, applicable to the non-destructive testing apparatus for interconnect sheets used in solar cell arrays as described in claim 1, characterized in that, Includes the following steps: S1. Obtain the size information of the solar cell array to be tested; S2. Place the solar cell array to be tested on the substrate mounting fixture of the fixed frame of the testing device. The frame is made of aluminum profile. The parallelism between the plane of the substrate mounting fixture and the scanning reference plane is ±1°. S3. Connect the visible light camera and turn on the control acquisition card: After the motor self-test resets, fill in the test information; use the control handle to turn on the positioning photoelectric switch, move the laser point to the target position, set this position as the zero point, set the light point indicator position as the zero point position of the detection, press start and the device will start automatic acquisition to obtain the optical image of the solar cell array; S4. The automatic stitching function is used to stitch the detected images together, and the automatic image fusion process can obtain the stitched image; the image annotation function is used to annotate the visible light photos to obtain 3D camera position data for interconnect sheet detection. S5. Read the visible light photograph 3D camera position file, scan to obtain the grayscale image and height of the interconnect position, and obtain the contour curve of the interconnect and the data files of each curve. Feature curves are extracted from scan points. The ratio of the actual data and the best-fit data at each point is obtained through processing. The point with the largest difference and the root mean square value are found. By comparing these values ​​with a set threshold, interconnect defects can be identified.

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