Microprobe batch bending device

CN117920891BActive Publication Date: 2026-08-07DALIAN UNIV OF TECH +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
DALIAN UNIV OF TECH
Filing Date
2024-02-19
Publication Date
2026-08-07

AI Technical Summary

Technical Problem

本发明为了解决探针装夹定位过程繁琐、精度差、效率低、折弯角度和折弯点难以控制、一致性不好、整体装置结构复杂等问题,设计一种与微探针适配的折弯装置,通过在下底板上设有一定数量断面为半圆形定位槽实现批量化定位和折弯

Benefits of technology

[0019] The beneficial effects of this invention are: compared with existing technologies, it can conveniently produce microprobes in batches with accurate bending angles, controllable bending points, and good consistency in a single process. It avoids the problems of poor bending effects and difficulty in ensuring consistency during assembly caused by manual measurement of bending angles and lengths. This is of great significance for reducing the difficulty of subsequent assembly of microprobes, improving the accuracy and reliability of the final assembled device, and increasing production efficiency.

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Abstract

The present application belongs to the field of bending, and relates to a microprobe batch bending device. The present application mainly comprises two parts of a positioning and clamping mechanism and a bending mechanism. During bending, accurate positioning of the microprobe is completed through cooperation between the positioning guide column and the positioning hole, and the bending operation of the microprobe at a preset angle and distance is completed through cooperation between the punch and the square through hole. In the process of preparing various microprobes, the method has the characteristics of simple operation, accurate and controllable microprobe bending elements, and good consistency. The problems of manual participation in measurement, inaccurate control of the bending point, and complex device are avoided. The present application has important significance for reducing the subsequent assembly difficulty of the microprobe, improving the precision and reliability of the final assembled device, and improving the production efficiency.
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Description

Technical Field

[0001] This invention belongs to the field of probe processing technology and relates to a microprobe batch bending device. Background Technology

[0002] Microprobes, as precision devices for measuring wind speed, play an indispensable role in fluid flow field research due to their small detection element, low thermal inertia, high sensitivity, and spatial resolution. To ensure the minute spacing between probe tips during assembly and to provide sufficient space at the probe's rear end for subsequent device encapsulation, some probes often require bending. Probe fabrication is one of the most crucial steps before device encapsulation; the bending quality and reliability directly affect whether the final encapsulated device meets the technical requirements of field applications. To avoid deviations in the bending angle and length of two probes in the same group, which could lead to difficulties or even failure in subsequent encapsulation processes, strict control over the consistency of the bending degree of each probe is necessary. Furthermore, probes are thin, have poor rigidity, and short bending lengths; in actual processes, batch bending is also required, making it difficult to guarantee the quality, efficiency, and consistency of bending. Therefore, a high-precision microprobe bending device capable of batch processing is needed to meet these process requirements.

[0003] Some existing probe bending devices use limiting components and stops for positioning to control the bending length and angle. This positioning method sometimes requires external measuring tools to determine the specific bending parameters, and manual alignment and positioning can introduce significant errors. Others can only bend single probes, severely impacting bending efficiency. Chinese patent CN216881463U, "A Probe Bending Fixture Equipment," describes a bending process where the probe is pre-clamped according to its length, and the bending angle is controlled by the collision between the bending component and the limiting component, bending only one probe at a time. While the bending angle is adjustable, the bending length cannot be controlled, making it difficult to guarantee bending accuracy and consistency. Chinese patent CN209006457U, "A Probe Bending Machine," describes a device that utilizes two cylinders and a corresponding special structure to achieve clamping and bending functions, reducing manpower, improving probe bending efficiency, and to some extent improving the quality of probe bending. However, the bending point cannot be precisely controlled, the bending consistency is poor, and the bending efficiency is relatively low. In addition, the entire device uses cylinders and uses PLC to control the air intake and exhaust valves. The device is complex to manufacture, costly, and difficult to maintain. Summary of the Invention

[0004] The purpose of this invention is to overcome the above-mentioned shortcomings and propose a high-efficiency, accurate, and consistent bending device for batch bending of microprobes. To address the problems of cumbersome probe clamping and positioning processes, poor accuracy, low efficiency, difficulty in controlling bending angles and points, poor consistency, and complex overall device structure, this invention designs a bending device adapted to microprobes. It achieves batch positioning and bending by providing a certain number of semi-circular positioning grooves on the lower base plate. Precise control of the bending angle and point is achieved through the cooperation of the base plate and the punch. L-shaped limiting blocks of different thicknesses are designed to meet the requirements of different bending lengths.

[0005] The technical solution of this invention is:

[0006] A microprobe batch bending device, comprising a base plate 3, a positioning plate 2, a cover plate 1, a positioning guide post 5, a first fixing screw 4, an L-shaped limiting block 8, a punch 7, and a second fixing screw 6, arranged from bottom to top.

[0007] The positioning plate 2 is a square plate with multiple semi-circular grooves a on its upper surface for placing probes k. When the probes k are clamped, a portion of them protrudes from the grooves a, ensuring that the cover plate 1 and the positioning plate 2 can press the probes k firmly. A first inclined surface i is cut on one end face of the positioning plate 2, which mates with a second inclined surface j formed by cutting away the bottom surface of the punch 7. The angle between the first inclined surface i and the upper surface of the positioning plate 2 is a bending angle α. During operation, the first inclined surface i and the second inclined surface j are tightly fitted, ensuring accurate bending points and bending angles. The positioning plate 2 has a first positioning hole b, whose position matches the second positioning hole f on the cover plate 1. The cooperation of the first positioning hole b, the second positioning hole f, and the positioning guide post 5 achieves positioning of the cover plate 1, the positioning plate 2, and the punch 7. The four upper corners of the positioning plate 2 have first threaded holes c, which mate with second fixing screws 6 to precisely fix the relative positions of the cover plate 1 and the positioning plate 2. The positioning plate 2 has a second threaded hole d below it, which cooperates with the first fixing screw 4 and the second threaded through hole h on the base plate 3 to fix the base plate 3 and the positioning plate 2.

[0008] The cover plate 1 is a square plate with the same length dimension as the positioning plate 2 and a wider width dimension than the positioning plate 2. The cover plate 1 has a square through hole e for guiding the punch 7. The length of the square through hole e is determined by the number of bending probes k and their arrangement. The square through hole e has a clearance fit with the punch 7 and the L-shaped limiting block 8 to facilitate the placement and removal of the punch 7 and the L-shaped limiting block 8. In the working state, one side of the square through hole e is in the same vertical plane as the edge of the bending slope of the positioning plate 2 to ensure accurate positioning. The cover plate 1 has a first threaded through hole g. The first threaded through hole g is aligned with the first threaded hole c on the positioning plate 2 and cooperates with the second fixing screw 6 to fix the relative positions of the cover plate 1 and the positioning plate 2.

[0009] The punch 7 is a block, with its length and width dimensions matching the square through-hole e of the cover plate 1. Both the punch 7 and the through-hole e are clearance fits in both length and width directions. The second inclined surface j formed by removing material at a bending angle α on the bottom surface of the punch 7, together with the first inclined surface i on the positioning plate 2, constitutes a bending mechanism. The angle between the second inclined surface j and the bottom surface of the punch 7 is the bending angle α. The second inclined surface j and the first inclined surface i are strictly tangent when in contact. The side edges of the punch 7 are rounded for ease of installation, and the bottom edge of the punch 7 also requires rounding to avoid damaging the tip of the probe k.

[0010] The L-shaped limiting block 8 is an L-shaped block structure used during the installation of probe k. The short end of the L-shaped limiting block 8 is mounted on the upper surface of the cover plate 1, and the long end is inserted into the square through hole e. After insertion, the bottom of the L-shaped limiting block 8 must not interfere with the inclined surface of the positioning plate 2, and must be below the protrusion height of probe k to perform its limiting function. The bending length β of probe k is the width of the square through hole e of the cover plate minus the thickness of the long end of the L-shaped limiting block 8. During probe k installation, the inner surfaces of the short and long ends of the L-shaped limiting block 8 must be tightly fitted to the cover plate 1 to ensure strict control of the bending length of probe k. Simultaneously, there are parallelism requirements on the two sides of the long end of the L-shaped limiting block 8, and a perpendicularity requirement between the lower surface of its short end and the surface of its long end.

[0011] Furthermore, the positioning plate 2, the cover plate 1, the bottom plate 3, the punch 7, and the L-shaped limiting block 8 are all made of materials with a hardness of 55-58 HRC, and the positioning guide post 5 is made of ordinary steel.

[0012] Furthermore, the diameter of groove a is 50% to 80% of the diameter of probe k.

[0013] Furthermore, the bending angle α ranges from 120° to 150°.

[0014] Furthermore, the positioning guide post 5 and the first positioning hole b are interference fits, with a bilateral interference amount of 0.02 to 0.10 mm; the second positioning hole f is aligned with the first positioning hole b, and during machining, the second positioning hole f and the square through hole e are required to be completed in one wire cutting operation; the second positioning hole f and the guide post 5 are clearance fits, with a bilateral clearance amount of 0.02 to 0.10 mm, making it easy for the cover plate 1 and the positioning plate 2 to be aligned.

[0015] Furthermore, the clearance between the punch 7 and the through hole e in both length and width directions is 0.02-0.10 mm.

[0016] Furthermore, the edges of the punch 7 are rounded to facilitate insertion into the square through hole e of the cover plate 1.

[0017] Furthermore, the base plate 3 is a square plate, and its length dimension is the same as that of the cover plate 1 and the positioning plate 2. To prevent overturning, the width dimension of the base plate 3 is longer than that of the cover plate 1 and the positioning plate 2.

[0018] Furthermore, the positioning guide post 5 is a stepped shaft structure. The double-sided fit clearance between the positioning guide post 5 and the second positioning hole f on the cover plate 1 is 0.02~0.10mm, and the double-sided fit interference between the positioning guide post 5 and the first positioning hole b on the positioning plate 2 is 0.02~0.10mm.

[0019] The beneficial effects of this invention are: compared with existing technologies, it can conveniently produce microprobes in batches with accurate bending angles, controllable bending points, and good consistency in a single process. It avoids the problems of poor bending effects and difficulty in ensuring consistency during assembly caused by manual measurement of bending angles and lengths. This is of great significance for reducing the difficulty of subsequent assembly of microprobes, improving the accuracy and reliability of the final assembled device, and increasing production efficiency. Attached Figure Description

[0020] Figure 1 Assembly drawing for probe positioning and clamping;

[0021] Figure 2 This is the assembly drawing for the probe bending process;

[0022] Figure 3 This is an exploded view of the probe bending device.

[0023] Figure 4 This is a magnified view of a portion of the positioning grooves on the positioning plate.

[0024] Figure 5 A schematic diagram illustrating the correct positioning and clamping of the probe.

[0025] Figure 6 This is a schematic diagram of the probe after bending.

[0026] Figure 7 This is a diagram showing the probe after bending.

[0027] Figure 8 This is a bottom view of the positioning plate;

[0028] In the diagram: 1-Cover plate, 2-Positioning plate, 3-Anti-tipping base plate, 4-First fixing screw, 5-Positioning guide post, 6-Second fixing screw, 7-Punch, 8-L-shaped limiting block, a-Groove, b-First positioning hole, c-First threaded hole, d-Second threaded hole, e-Square through hole, f-Second positioning hole, g-First threaded through hole, h-Second threaded through hole, i-First inclined plane, j-Second inclined plane, k-Probe, α-Bending angle, β-Bending length. Detailed Implementation

[0029] The embodiments of the present invention will be described in detail below with reference to the technical solutions and accompanying drawings.

[0030] like Figure 1 , Figure 2 and Figure 3 As shown, a micro probe batch bending device mainly consists of a positioning plate 2, a cover plate 1, a base plate 3, a positioning guide post 5, a first fixing screw 4, an L-shaped limiting block 8, a punch 7, and a second fixing screw 6.

[0031] like Figure 3 , Figure 4 and Figure 8 As shown, the positioning plate 2 is made of a material with a hardness range of 55-58 HRC. The upper surface has multiple semi-circular grooves a for placing probes k. The diameter of groove a is 70% of the diameter of probe k. When the probe k is clamped, a portion of it protrudes above groove a, ensuring that the cover plate 1 and positioning plate 2 can press the probe k firmly. A first inclined surface i is cut on one end face of the positioning plate 2, which mates with a second inclined surface j cut from the bottom surface of the punch 7. The angle between the first inclined surface i and the upper surface of the positioning plate 2 is a bending angle α, where α is 129°. During operation, the first inclined surface i and the second inclined surface j are tightly fitted, ensuring accurate bending points and bending angles. The positioning plate 2 has a first positioning hole b, whose position coincides with the second positioning hole f on the cover plate 1. The cooperation of the first positioning hole b, the second positioning hole f, and the positioning guide post 5 achieves the positioning of the cover plate 1, the positioning plate 2, and the punch 7. The positioning plate 2 has four threaded holes c at its upper corners, which cooperate with the second fixing screws 6 to accurately fix the relative positions of the cover plate 1 and the positioning plate 2. The positioning plate 2 has a second threaded hole d at its lower part, which cooperates with the first fixing screw 4 and the second threaded through hole h on the base plate 3 to fix the base plate 3 and the positioning plate 2.

[0032] like Figure 5 As shown, the material hardness of the cover plate 1 ranges from 55 to 58 HRC. The cover plate 1 has a square through hole e. The square through hole e is used to cooperate with the punch 7 and the L-shaped limiting block 8 to achieve positioning and bending. The clearance between the punch 7 and the square through hole e in both length and width directions is 0.08 mm to facilitate the placement and removal of parts. In the working state, one side of the square through hole e is in the same vertical plane as the bending slope edge of the positioning plate 2 to ensure accurate positioning. The cover plate 1 has a second positioning hole f, which is aligned with the first positioning hole b. Positioning between the cover plate 1, the positioning plate 2, and the punch 7 is achieved through the positioning guide post 5. The cover plate 1 has a first threaded through hole g, whose position is aligned with the first threaded hole c on the positioning plate 2. This through hole g cooperates with the second fixing screw 6 to fix the relative positions of the cover plate 1 and the positioning plate 2.

[0033] The punch 7 is made of a material with a hardness range of 55-58 HRC, and its length and width dimensions are the same as the square through-hole e of the cover plate 1. The second inclined surface j formed by removing material from the bottom surface of the punch 7 at a bending angle α, together with the first inclined surface i on the positioning plate 2, constitutes a bending mechanism. The angle between the second inclined surface j and the bottom surface of the punch 7 is the bending angle α, which is 129°. The punch 7 is placed into the square through-hole e of the cover plate 1, which serves as a guide in its height direction. The first inclined surface i and the second inclined surface j are strictly tangent when in contact. The side edges of the punch 7 are rounded for ease of installation, and the bottom edge of the punch 7 is rounded to avoid damaging the tip of the probe k.

[0034] like Figure 5 As shown, the L-shaped limiting block 8 has an L-shaped structure and a material hardness range of 55-58 HRC. The short end of the L-shaped limiting block 8 is installed on the upper surface of the cover plate 1, and the long end is inserted into the square through hole e. After insertion, the bottom of the long end of the L-shaped limiting block 8 does not interfere with the inclined surface of the positioning plate 2, and the bottom is 1.5 mm below the protrusion height of the probe k, thus achieving the limiting function. The bending length β of the probe k is the width of the square through hole e of the cover plate minus the thickness of the long end of the L-shaped limiting block 8. When installing the probe k, the inner surfaces of the short and long ends of the L-shaped limiting block (8) are required to be tightly fitted with the cover plate 1 to ensure strict control of the bending length of the probe k. At the same time, the parallelism of the two sides of the long end of the L-shaped limiting block 8 is required to be 0.02, and the perpendicularity of the lower surface of its short end to the surface of its long end is required to be 0.02.

[0035] like Figure 2 As shown, the base plate 3 is made of a material with a hardness range of 55-58 HRC. It has a second threaded through hole h, the position of which is the same as the second threaded hole d, which cooperates with the first fixing screw 4 to secure the base plate 3 and the positioning plate 2. To prevent overturning, the width dimension of the base plate 3 is longer than the width dimension of the cover plate 1 and the positioning plate 2.

[0036] like Figure 3 As shown, the positioning guide post 5 is a stepped shaft structure. The positioning guide post 5 cooperates with the first positioning hole b and the second positioning hole f to achieve precise positioning of the cover plate 1, the positioning plate 2, and the punch 7. The interference fit between the positioning guide post 5 and the first positioning hole b is 0.08mm, and the clearance fit between the positioning guide post 5 and the second positioning hole f is 0.08mm.

[0037] Specific installation steps of the device of the present invention:

[0038] (1) First, assemble the positioning guide post 5 with the positioning plate 2, and then use the first fixing screw 4 to fasten the base plate 3 and the positioning plate 1.

[0039] (2) Then, a certain number of probes k are placed one by one into the semi-circular groove a on the positioning plate 1. After placement, the cover plate 1 is passed through the positioning guide post 5 to achieve positioning.

[0040] (3) When positioning and clamping, insert the long end of the L-shaped limiting block 8 into the square through hole e of the cover plate 1, such as... Figure 1 As shown, assemble and ensure a tight fit. Then, push the probes k one by one towards the L-shaped limiting block 8 until they contact the L-shaped limiting block 8. Then, use the second fixing screw 6 to tighten the cover plate 1 and the positioning plate 2, as shown. Figure 5 As shown;

[0041] (4) During bending, the L-shaped limiting block 8 is removed, and the punch 7 is assembled into the square through hole e of the cover plate 1, as shown. Figure 2 As shown;

[0042] Example

[0043] Install a certain number of probes k on the positioning plate 2 as described above, insert the L-shaped limiting block 8 to limit the bending length, and then tighten it. Finally, insert the punch 7 into the square through hole e and strike the punch 7 downwards with an impact force. Under the pressure of the punch 7 and the first inclined surface i on the positioning plate 1, the probes k bend and deform. Finally, remove the punch 7. Remove the second fixing screw 6, remove the cover plate 1, and take out the bent probes k. Figure 6 and Figure 7 As shown.

Claims

1. A microprobe batch bending device, characterized in that, The micro probe batch bending device includes, from bottom to top, a base plate (3), a positioning plate (2), a cover plate (1), a positioning guide post (5), a first fixing screw (4), an L-shaped limiting block (8), a punch (7), and a second fixing screw (6); The positioning plate (2) is a square plate with multiple semi-circular grooves (a) on its upper surface for placing probes (k). When the probes (k) are clamped, a portion of them will protrude from the grooves (a), thus ensuring that the cover plate (1) and the positioning plate (2) can press the probes (k) together. A first inclined surface (i) is cut on one end face of the positioning plate (2), which cooperates with the second inclined surface (j) formed by cutting off the bottom surface of the punch (7). The angle between the first inclined surface (i) and the upper surface of the positioning plate (2) is a bending angle. During operation, the first inclined plane (i) and the second inclined plane (j) fit tightly together to ensure accurate bending points and bending angles; the positioning plate (2) is provided with a first positioning hole (b), the hole position is consistent with the second positioning hole (f) on the cover plate (1), and the cooperation of the first positioning hole (b), the second positioning hole (f) and the positioning guide post (5) realizes the positioning of the cover plate (1), the positioning plate (2) and the punch (7); the four corners of the upper part of the positioning plate (2) have a first threaded hole (c), which cooperates with the second fixing screw (6) to realize the precise fixing of the relative positions of the cover plate (1) and the positioning plate (2); the lower part of the positioning plate (2) has a second threaded hole (d), which cooperates with the first fixing screw (4) and the second threaded through hole (h) on the base plate (3) to realize the fixing between the base plate (3) and the positioning plate (2); The cover plate (1) is a square plate with the same length dimension as the positioning plate (2) and a width dimension greater than that of the positioning plate (2). The cover plate (1) is provided with a square through hole (e) for guiding the punch (7). The length of the square through hole (e) is determined according to the number of one-time bending probes (k) and the arrangement of the probes (k). The square through hole (e) is clearance-fitted with the punch (7) and the L-shaped limiting block (8) to facilitate the placement and removal of the punch (7) and the L-shaped limiting block (8). In the working state, one side of the square through hole (e) is in the same vertical plane as the bending slope edge of the positioning plate (2) to ensure accurate positioning. The cover plate (1) is provided with a first threaded through hole (g). The first threaded through hole (g) is consistent with the first threaded hole (c) on the positioning plate (2) and cooperates with the second fixing screw (6) to fix the relative position of the cover plate (1) and the positioning plate (2). The punch (7) is a block, and its length and width dimensions are the same as the square through hole (e) of the cover plate (1); the punch (7) and the square through hole (e) are clearance fit in both length and width directions; the bottom surface of the punch (7) is bent at an angle The second inclined surface (j) formed by removing material together with the first inclined surface (i) on the positioning plate (2) constitutes a bending mechanism; the angle between the second inclined surface (j) and the bottom surface of the punch (7) is the bending angle. The second inclined plane (j) and the first inclined plane (i) are strictly tangent when they come into contact; the side edges of the punch (7) need to be rounded for easy installation, and the bottom edge of the punch (7) also needs to be rounded to avoid damaging the tip of the probe (k); The L-shaped limiting block (8) is an L-shaped block structure used during the installation of the probe (k); the short end of the L-shaped limiting block (8) is installed on the upper surface of the cover plate (1), and the long end is inserted into the square through hole (e). After insertion, the bottom of the L-shaped limiting block (8) should not interfere with the inclined surface of the positioning plate (2), and should be below the protrusion height of the probe (k) in order to perform the limiting function; the bending length of the probe (k) The width of the square through hole (e) of the cover plate is reduced by the thickness of the long end of the L-shaped limiting block (8). When installing the probe (k), the inner side of the short end and the long end of the L-shaped limiting block (8) must fit tightly with the cover plate (1) to ensure strict control of the bending length of the probe (k). At the same time, there is a parallelism requirement in the positional relationship between the two sides of the long end of the L-shaped limiting block (8), and there is a perpendicularity requirement in the positional relationship between the lower surface of its short end and the surface of its long end.

2. The microprobe batch bending device according to claim 1, characterized in that, The positioning plate (2), cover plate (1), bottom plate (3), punch (7), and L-shaped limiting block (8) are all made of materials with a hardness of 55-58HRC, and the positioning guide post (5) is made of ordinary steel.

3. The microprobe batch bending device according to claim 1, characterized in that, The diameter of the groove (a) is 50% to 80% of the diameter of the probe (k).

4. The microprobe batch bending device according to claim 1, characterized in that, bend angle The range is .

5. A microprobe batch bending device according to claim 1, characterized in that, The positioning guide post (5) and the first positioning hole (b) are interference fits, with a bilateral interference of 0.02~0.10mm; the second positioning hole (f) is in the same position as the first positioning hole (b), and the second positioning hole (f) and the square through hole (e) are required to be completed by wire cutting in one go during processing; the second positioning hole (f) and the guide post (5) are clearance fits, with a bilateral clearance of 0.02~0.10mm, so that the cover plate (1) and the positioning plate (2) can be easily matched.

6. The microprobe batch bending device according to claim 1, characterized in that, The clearance between the punch (7) and the square through hole (e) in the length and width directions is 0.02-0.10 mm.

7. A microprobe batch bending device according to claim 1, characterized in that, The edges of the punch (7) are rounded to facilitate insertion into the square through hole (e) of the cover plate (1).

8. The microprobe batch bending device according to claim 1, characterized in that, The base plate (3) is a square plate, and its length dimension is the same as that of the cover plate (1) and the positioning plate (2). In order to play a role in preventing overturning, the width dimension of the base plate (3) is longer than that of the cover plate (1) and the positioning plate (2).

9. A microprobe batch bending device according to claim 1, characterized in that, The positioning guide post (5) is a stepped shaft structure; the double-sided fit clearance between the positioning guide post (5) and the second positioning hole (f) of the cover plate (1) is 0.02~0.10mm, and the double-sided fit interference of the positioning guide post (5) and the first positioning hole (b) on the positioning plate (2) is 0.02~0.10mm.

Citation Information

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