五轴机床探测方法、系统、电子设备及可读介质
By probing multiple times with a probe at different feed speeds on a CNC machine tool and calculating the transmission delay, the probe coordinates are corrected, thus solving the accuracy problem of indirect measurement methods under varying feed speeds and achieving high-precision and high-efficiency machine tool probing.
CN117921441BActive Publication Date: 2026-07-17SUZHOU RHENAIKE INFORMATION TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SUZHOU RHENAIKE INFORMATION TECH CO LTD
- Filing Date
- 2024-03-04
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
The existing indirect measurement method for CNC machine tools has prominent accuracy control problems under different feed speeds. In particular, the change in feed speed has a significant impact on the measurement accuracy, leading to uncertainty and error in the measurement results.
Method used
By probing the same detection point multiple times at different feed speeds, the transmission delay of the detection coordinate acquisition signal is calculated, and these results are used to correct the detection coordinates to improve accuracy.
Benefits of technology
Without increasing costs or operational complexity, it significantly improves machine tool detection accuracy and efficiency, and reduces the impact of feed rate variations on measurement errors.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN117921441B_ABST
Abstract
本发明公开了一种五轴机床探测方法、系统、电子设备及可读介质，该探测方法包括：探针以第一进给速度对探测点进行探测，得到探测点在工件坐标系下的第一探测坐标；探针以第二进给速度对探测点进行探测，得到探测点在工件坐标系下的第二探测坐标，第一进给速度和第二进给速度不相等；基于第一探测坐标和第二探测坐标，计算探针探测坐标的传输时延T；将坐标缓存队列中t‑T时刻的探测坐标，确定为探针t时刻的实际探测坐标。本发明提供的五轴机床探测方法、系统、电子设备及可读介质，通过探针在不同进给速度下对同一探测点进行多次探测，计算探测坐标采集信号的传输时延，以修正探测坐标，能够提高探测精度。
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