Multifunctional x-ray analysis device and data acquisition method thereof

Abstract

The application discloses a multifunctional X-ray analysis device and a data acquisition method thereof, wherein the device comprises a short light path, a long light path, a base and an upper frame. The device highly integrates X-ray diffraction analysis, X-ray cone beam imaging, X-ray double-energy orthogonal imaging and X-ray phase contrast imaging four measurement modes on one platform, greatly reduces the cost of the equipment, and occupies small space in a desktop structure, greatly reduces the requirement on an installation site. The data acquisition method matched with the device enables users to flexibly select experimental combinations and explore various properties of substances under different measurement modes on the basis of the four measurement modes.

Description

Technical Field

[0001] This invention relates to the field of X-ray imaging technology, and in particular to a desktop multifunctional X-ray analysis device and its data acquisition method that provides multiple measurement modes such as X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging. Background Technology

[0002] With the increasing strategic importance of basic research, the exploration of new materials and material structures is becoming increasingly in-depth, and X-ray imaging technology is playing an increasingly important role in this regard. Furthermore, with the development and widespread adoption of flat-panel imaging detectors, X-ray imaging technology is becoming increasingly digital. Increased demand and technological advancements have led to the widespread application of various X-ray measurement modes, such as X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging.

[0003] X-ray fluoroscopic imaging directly utilizes the penetrating power of X-rays to observe damage to the internal structure of the material being tested. X-ray diffraction utilizes the diffraction phenomenon of X-rays in crystals to obtain the characteristics of the diffracted X-ray signals, which are then processed to obtain diffraction patterns. Using this spectral information, not only can conventional microscopy determine the phase of an object, but it also provides a "X-ray vision" to see if defects (dislocations) and lattice defects exist within the crystal. After X-rays pass through an object, not only does their intensity decrease, but their phase also changes. X-ray phase-contrast imaging utilizes this principle, recording the change in the phase of X-rays passing through the object to reflect the distribution of electron density within the object, i.e., the internal structure. Cone-beam CT is an imaging method that uses a cone-beam X-ray source and a planar matrix detector to achieve three-dimensional imaging. Compared to traditional spiral CT, cone-beam CT has advantages such as faster scanning speed, higher spatial resolution, higher X-ray utilization, and lower radiation dose.

[0004] However, to achieve all of the above functions, it would be necessary to purchase several different types of equipment. This approach is space-consuming, costly to configure, and requires significant space resources and research funding. Furthermore, controlling these devices would require separate control rooms, which would also consume considerable space. Summary of the Invention

[0005] To address the aforementioned technical problems, this invention provides a multifunctional X-ray analysis device that integrates X-ray diffraction, phase contrast, and cone-beam CT functions into a single imaging research platform, and is equipped with a complete data acquisition method.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: A multifunctional X-ray analysis device, comprising: The short optical path includes an X-ray source for diffraction analysis, a detector for diffraction analysis, a flat panel detector for cone-beam imaging, an X-ray source for cone-beam imaging, a first stage, a second stage, an X-ray source base for diffraction analysis, a first dovetail groove, a first two-dimensional slide, a first turntable connecting plate, a flat panel detector base for cone-beam imaging, a detector base for diffraction analysis, a second dovetail groove, a second two-dimensional slide, a second turntable connecting plate, an X-ray source base for cone-beam imaging, a first transmission mechanism, and a second transmission mechanism. The long optical path includes a small-focus X-ray source, a small-focus X-ray source triaxial displacement platform, an amorphous silicon flat panel detector, a flat panel detector triaxial displacement platform, a first grating base, a first grating triaxial displacement slide, a second grating base, and a second grating triaxial displacement slide; Base and upper frame.

[0007] In some embodiments, the multifunctional X-ray analysis device, wherein the X-ray source base for diffraction analysis, the first dovetail groove, the first two-dimensional slide, and the first turntable connecting plate, under the drive of the first transmission mechanism, perform symmetrical or asymmetrical rotational motion.

[0008] In some embodiments, the multifunctional X-ray analysis device, including the cone-beam imaging flat panel detector base, the diffraction analysis detector base, the second dovetail groove, the second two-dimensional slide, and the second turntable connecting plate, performs symmetrical or asymmetrical rotational motion under the drive of the second transmission mechanism.

[0009] In some embodiments, the multifunctional X-ray analysis device includes a first two-dimensional slide and a second two-dimensional slide for adjusting the relative positions of a flat panel detector for cone-beam imaging and an X-ray source for cone-beam imaging; and a three-axis displacement platform for a small-focus X-ray source and a three-axis displacement platform for a flat panel detector for adjusting the relative positions of the small-focus X-ray source and the amorphous silicon flat panel detector.

[0010] In some embodiments, the multifunctional X-ray analysis device wherein the first stage and the second stage adjust the position of the horizontal plane of the lifting height according to the size of the object being measured and the imaging requirements, thereby causing the object being measured to rotate.

[0011] In some embodiments, the multifunctional X-ray analysis device includes a first grating base that performs two-dimensional motion on a first grating triaxial displacement slide, and the first grating base is used to mount the grating; and a second grating base that performs two-dimensional motion on a second grating triaxial displacement slide, and the second grating base is used to mount the grating.

[0012] In some embodiments, the multifunctional X-ray analysis device includes X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging.

[0013] In some embodiments, the data acquisition method of the multifunctional X-ray analysis apparatus performs X-ray diffraction analysis in the following steps: (1) Move the small-focus X-ray source, amorphous silicon flat panel detector, first grating base, and second grating base of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the positioning signal to the control computer, rotate the X-ray diffraction analysis optical path of the short optical path to the front of the device and make it parallel to the long optical path. (3) Place the object to be tested onto the first stage to complete the initialization of the test conditions; (4) Start the scanning software to begin data acquisition; (5) After the collection is completed, adjust the X-ray source and detector for diffraction analysis to the horizontal state in sequence; rotate the short optical path to be perpendicular to the long optical path; move the small focal point X-ray source, amorphous silicon flat plate detector, first grating base and second grating base of the long optical path to the farthest and lowest point from the short optical path; (6) Shut down the system.

[0014] In some embodiments, the data acquisition method, which performs X-ray cone-beam imaging measurements, includes: short-path X-ray cone-beam imaging and long-path X-ray cone-beam imaging.

[0015] In some embodiments, the data acquisition method, wherein the steps of performing the short-path X-ray cone-beam imaging are as follows: (1) Move the small-focus X-ray source, amorphous silicon flat panel detector, first grating base, and second grating base of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the positioning signal to the control computer, rotate the micro-focus X-ray cone beam imaging optical path of the short optical path to the front of the device and parallel it to the long optical path. (3) Place the object to be measured on the second stage and adjust the height and horizontal position of the second stage; (4) Adjust the relative positions of the flat panel detector for cone-beam imaging and the X-ray source for cone-beam imaging using the first two-dimensional slide and the second two-dimensional slide; (5) Start the scanning software to begin data acquisition; (6) After the acquisition is completed, rotate the short optical path to be perpendicular to the long optical path; move the small focal point X-ray source, amorphous silicon flat panel detector, first grating base and second grating base of the long optical path to the farthest and lowest point from the short optical path; (7) Shut down the system.

[0016] In some embodiments, the data acquisition method, wherein the steps of performing the long optical path X-ray cone-beam imaging are as follows: (1) Move the small-focus X-ray source, amorphous silicon flat panel detector, first grating base, and second grating base of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Place the object to be tested on the second stage and adjust the second stage to an appropriate height and horizontal position; (4) Adjust the relative positions of the small-focus X-ray source and the amorphous silicon flat panel detector by using the triaxial displacement platform of the small-focus X-ray source and the triaxial displacement platform of the flat panel detector; (5) Start the scanning software to begin data acquisition; (6) After the acquisition is completed, move the small focal point X-ray source, amorphous silicon flat panel detector, first grating base and second grating base of the long optical path to the farthest and lowest point from the short optical path; (7) Shut down the system.

[0017] In some embodiments, the data acquisition method, wherein the steps of performing X-ray dual-energy orthogonal imaging are as follows: (1) Move the small-focus X-ray source, amorphous silicon flat panel detector, first grating base, and second grating base of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Adjust the relative positions of the flat panel detector for cone-beam imaging and the X-ray source for cone-beam imaging by means of the first two-dimensional slide and the second two-dimensional slide; (4) Place the object to be tested on the second stage and adjust the height and horizontal position of the second stage; (5) Adjust the relative positions of the small-focus X-ray source and the amorphous silicon flat panel detector by using the triaxial displacement platform of the small-focus X-ray source and the triaxial displacement platform of the flat panel detector; (6) Set the tube current and tube voltage of the cone-beam imaging X-ray source and the small-focus X-ray source respectively; (7) Start the scanning software to begin data acquisition; (8) After the acquisition is completed, move the small focal point X-ray source, amorphous silicon flat panel detector, first grating base and second grating base of the long optical path to the farthest and lowest point from the short optical path; (9) Shut down the system.

[0018] In some embodiments, the data acquisition method includes the following steps for performing X-ray phase-contrast imaging: (1) Move the small-focus X-ray source, the first grating base of the amorphous silicon flat panel detector, and the second grating base of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Place the object to be tested on the second stage and adjust the height and horizontal position of the second stage; place the imaging grating on the first grating base and the second grating base respectively; (4) Adjust the relative positions of the small-focus X-ray source and the amorphous silicon flat panel detector by using the triaxial displacement platform of the small-focus X-ray source and the triaxial displacement platform of the flat panel detector; (5) Move the first grating base and the second grating base to the relative positions that meet the experimental requirements by using the first grating triaxial displacement slide and the second grating triaxial displacement slide respectively; (6) Set the tube current and tube voltage of the small-focus X-ray source respectively; (7) Start the scanning software to begin data acquisition; (8) After the acquisition is completed, move the small focal point X-ray source, amorphous silicon flat panel detector, first grating base and second grating base of the long optical path to the farthest and lowest point from the short optical path; (9) Shut down the system.

[0019] The beneficial effects of this invention are: This invention innovatively integrates four measurement modes—X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging—onto a single platform, reducing equipment costs. Its desktop structure occupies minimal space, lowering the requirements for installation location. Users can flexibly select experimental combinations based on the four measurement modes to explore various properties of substances under different measurement conditions. Attached Figure Description

[0020] Figure 1 A front view of the structure of a multifunctional X-ray analysis device provided by the present invention; Figure 2 A partial structural diagram of the short optical path provided by the present invention; Figure 3A schematic diagram of the device in X-ray diffraction analysis and measurement mode provided by the present invention; Figure 4 A schematic diagram of the device provided by the present invention in the short-path X-ray cone-beam imaging measurement mode; Figure 5 A schematic diagram of the device provided by the present invention in the long optical path X-ray cone beam imaging measurement mode; Figure 6 A schematic diagram of the device provided by the present invention in X-ray dual-energy orthogonal imaging measurement mode; Figure 7 This is a schematic diagram of the device in X-ray phase-contrast imaging measurement mode provided by the present invention.

[0021] Figure label: 111 - X-ray source for diffraction analysis; 112 - Detector for diffraction analysis; 121-Flat panel detector for cone-beam imaging; 122 - X-ray source for cone-beam imaging; 131 - First platform; 132 - Second stage; 141 - X-ray source base for diffraction analysis; 142 - First dovetail groove; 143 - First two-dimensional slide; 144 - First turntable connecting plate; 145- Flat panel detector base for cone-beam imaging; 151 - Detector base for diffraction analysis; 152 - Second dovetail groove; 153 - Second two-dimensional slide; 154 - Second turntable connecting plate; 155-Cone-beam imaging X-ray source base; 161 - First transmission mechanism; 162 - Second transmission mechanism; 211-Small Focus X-ray Source; 212-Small Focus X-ray Source Triaxial Displacement Platform; 213-Amorphous silicon flat panel detector; 214-Flat panel detector three-axis displacement platform; 221 - First grating base; 222 - First grating three-axis displacement slide; 231 - Second grating base; 232 - Second grating three-axis displacement slide; 31-Base; 32-Upper frame; Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0023] The present invention provides a multifunctional X-ray analysis device and its data acquisition method, which can solve the problems of large device size, large space occupation, high equipment configuration cost and high radiation shielding cost in the prior art.

[0024] To facilitate understanding of this embodiment, a multifunctional X-ray analysis device provided by this invention will first be described in detail, as shown in Figure 1. The device includes: The short optical path includes an X-ray source 111 for diffraction analysis, a detector 112 for diffraction analysis, a flat panel detector 121 for cone-beam imaging, an X-ray source 122 for cone-beam imaging, a first stage 131, a second stage 132, an X-ray source base 141 for diffraction analysis, a first dovetail groove 142, a first two-dimensional slide 143, a first turntable connecting plate 144, a flat panel detector base 145 for cone-beam imaging, a detector base 151 for diffraction analysis, a second dovetail groove 152, a second two-dimensional slide 153, a second turntable connecting plate 154, an X-ray source base 155 for cone-beam imaging, a first transmission mechanism 161, and a second transmission mechanism 162. The long optical path includes a small-focus X-ray source 211, a small-focus X-ray source triaxial displacement platform 212, an amorphous silicon flat panel detector 213, a flat panel detector triaxial displacement platform 214, a first grating base 221, a first grating triaxial displacement slide 222, a second grating base 231, a second grating triaxial displacement slide 232; a base 31 and an upper frame 32.

[0025] In this embodiment, the multifunctional X-ray analysis device, wherein the X-ray source base 141 for diffraction analysis, the first dovetail groove 142, the first two-dimensional slide 143 and the first turntable connecting plate 144, under the drive of the first transmission mechanism 161, perform symmetrical or asymmetrical rotational motion.

[0026] In this embodiment, the multifunctional X-ray analysis device, including the cone-beam imaging flat panel detector base 145, the diffraction analysis detector base 151, the second dovetail groove 152, the second two-dimensional slide 153, and the second turntable connecting plate 154, performs symmetrical or asymmetrical rotational motion under the drive of the second transmission mechanism 162.

[0027] In this embodiment, the multifunctional X-ray analysis device includes a first two-dimensional slide 143 and a second two-dimensional slide 153 used to adjust the relative positions of the flat panel detector 121 for cone-beam imaging and the X-ray source 122 for cone-beam imaging; and a three-axis displacement platform 212 for the small-focus X-ray source and a three-axis displacement platform 214 for the flat panel detector used to adjust the relative positions of the small-focus X-ray source 211 and the amorphous silicon flat panel detector 213.

[0028] In this embodiment, the multifunctional X-ray analysis device has a first stage 131 and a second stage 132 that adjust the position of the horizontal plane of the lifting height according to the size of the object being measured and the imaging requirements, thereby causing the object being measured to rotate.

[0029] In this embodiment, the multifunctional X-ray analysis device has a first grating base 221 that performs two-dimensional motion on a first grating triaxial displacement slide 222, and the first grating base 221 is used to install the grating; and a second grating base 2231 that performs two-dimensional motion on a second grating triaxial displacement slide 232, and the second grating base 231 is used to install the grating.

[0030] In this embodiment, the multifunctional X-ray analysis device includes X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging.

[0031] In this embodiment, the multifunctional X-ray analysis device, the data acquisition method for performing X-ray diffraction analysis, includes the following steps: (1) Move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221, and second grating base 231 of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the positioning signal to the control computer, rotate the X-ray diffraction analysis optical path of the short optical path to the front of the device and make it parallel to the long optical path. (3) Place the object to be tested onto the first stage 131 to complete the initialization of the test conditions; (4) Start the scanning software to begin data acquisition; (5) After the acquisition is completed, adjust the X-ray source 111 and the detector 112 for diffraction analysis to the horizontal state in sequence; rotate the short optical path to be perpendicular to the long optical path; move the small focal point X-ray source 211, the amorphous silicon flat plate detector 213, the first grating base 221, and the second grating base 231 of the long optical path to the farthest and lowest point from the short optical path; (6) Shut down the system.

[0032] In this embodiment, the data acquisition method, which performs X-ray cone-beam imaging measurement, includes: short-path X-ray cone-beam imaging and long-path X-ray cone-beam imaging.

[0033] In this embodiment, the data acquisition method, wherein the steps of performing the short-path X-ray cone-beam imaging are as follows: (1) Move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221, and second grating base 231 of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the positioning signal to the control computer, rotate the micro-focus X-ray cone beam imaging optical path of the short optical path to the front of the device and parallel it to the long optical path. (3) Place the object to be measured on the second stage 132 and adjust the height and horizontal position of the second stage 132; (4) Adjust the relative positions of the flat panel detector 121 for cone-beam imaging and the X-ray source 122 for cone-beam imaging by means of the first two-dimensional slide 143 and the second two-dimensional slide 153; (5) Start the scanning software to begin data acquisition; (6) After the acquisition is completed, rotate the short optical path to be perpendicular to the long optical path; move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221 and second grating base 231 of the long optical path to the farthest and lowest point from the short optical path; (7) Shut down the system.

[0034] In this embodiment, the data acquisition method, the steps of which perform the long optical path X-ray cone-beam imaging are as follows: (1) Move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221, and second grating base 231 of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Place the object to be measured on the second stage 132 and adjust the second stage 132 to an appropriate height and horizontal position; (4) Adjust the relative positions of the small-focus X-ray source 211 and the amorphous silicon flat panel detector 213 by using the triaxial displacement platform 212 of the small-focus X-ray source and the triaxial displacement platform 214 of the flat panel detector; (5) Start the scanning software to begin data acquisition; (6) After the acquisition is completed, move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221 and second grating base 231 of the long optical path to the farthest and lowest point from the short optical path; (7) Shut down the system.

[0035] In this embodiment, the data acquisition method, specifically the steps of performing X-ray dual-energy orthogonal imaging, are as follows: (1) Move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221, and second grating base 231 of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Adjust the relative positions of the flat panel detector 121 for cone-beam imaging and the X-ray source 122 for cone-beam imaging by means of the first two-dimensional slide 143 and the second two-dimensional slide 153; (4) Place the object to be measured on the second stage 132 and adjust the height and horizontal position of the second stage 132; (5) Adjust the relative positions of the small-focus X-ray source 211 and the amorphous silicon flat panel detector 213 by using the triaxial displacement platform 212 of the small-focus X-ray source and the triaxial displacement platform 214 of the flat panel detector; (6) Set the tube current and tube voltage of the cone-beam imaging X-ray source 122 and the small-focus X-ray source 211 respectively; (7) Start the scanning software to begin data acquisition; (8) After the acquisition is completed, move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221 and second grating base 231 of the long optical path to the farthest and lowest point from the short optical path; (9) Shut down the system.

[0036] In this embodiment, the data acquisition method, specifically the step of performing X-ray phase-contrast imaging, is as follows: (1) Move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221, and second grating base 231 of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Place the object to be measured on the second stage 132 and adjust the height and horizontal position of the second stage 132; place the imaging grating on the first grating base 221 and the second grating base 231 respectively; (4) Adjust the relative positions of the small-focus X-ray source 211 and the amorphous silicon flat panel detector 213 by using the triaxial displacement platform 212 of the small-focus X-ray source and the triaxial displacement platform 214 of the flat panel detector; (5) Move the first grating base 221 and the second grating base 231 to the relative positions that meet the experimental requirements by using the first grating triaxial displacement slide 222 and the second grating triaxial displacement slide 232 respectively; (6) Set the tube current and tube voltage of the small-focus X-ray source respectively; (7) Start the scanning software to begin data acquisition; (8) After the acquisition is completed, move the small focal point X-ray source 211, amorphous silicon flat panel detector 213, first grating base 221 and second grating base 231 of the long optical path to the farthest and lowest point from the short optical path; (9) Shut down the system.

[0037] This invention innovatively integrates four measurement modes—X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging—onto a single platform, significantly reducing equipment costs. Its desktop design minimizes space requirements, greatly reducing the need for installation space. Users can flexibly select experimental combinations based on the four measurement modes to explore various properties of substances under different measurement conditions.

[0038] It should also be noted that conventional structures or constructions will be omitted throughout the accompanying drawings where such omissions could potentially obscure the understanding of the invention. Furthermore, the shapes and dimensions of the components in the drawings do not reflect actual size and proportions, but are merely illustrative of embodiments of the invention. Additionally, any reference numerals placed between parentheses in the claims should not be construed as limiting the scope of the claims.

[0039] Furthermore, the word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The use of ordinal numbers such as "first," "second," "third," etc., in the specification and claims to modify the corresponding elements does not in itself imply that the element has any ordinal number, nor does it represent the order of one element with another, or the order of manufacturing methods. The use of these ordinal numbers is only to clearly distinguish one element with a certain name from another element with the same name.

[0040] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above descriptions are merely specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A multifunctional X-ray analysis device, characterized in that, include: The short optical path includes an X-ray source (111) for diffraction analysis, a detector (112) for diffraction analysis, a flat panel detector (121) for cone-beam imaging, an X-ray source (122) for cone-beam imaging, a first stage (131), a second stage (132), an X-ray source base (141) for diffraction analysis, a first dovetail groove (142), a first two-dimensional slide (143), a first turntable connecting plate (144), a flat panel detector base (145) for cone-beam imaging, a detector base (151) for diffraction analysis, a second dovetail groove (152), a second two-dimensional slide (153), a second turntable connecting plate (154), an X-ray source base (155) for cone-beam imaging, a first transmission mechanism (161), and a second transmission mechanism (162). The long optical path includes a small-focus X-ray source (211), a small-focus X-ray source triaxial displacement platform (212), an amorphous silicon flat panel detector (213), a flat panel detector triaxial displacement platform (214), a first grating base (221), a first grating triaxial displacement slide (222), a second grating base (231), and a second grating triaxial displacement slide (232). The base (31) and the upper frame (32) are provided, wherein the short optical path is provided on the base (31) and the long optical path is provided on the upper frame (32). The X-ray source base (141), the first dovetail groove (142), the first two-dimensional slide (143), and the first turntable connecting plate (144) for diffraction analysis, under the drive of the first transmission mechanism (161), perform symmetrical or asymmetrical rotational motion. The cone-beam imaging flat panel detector base (145), the diffraction analysis detector base (151), the second dovetail groove (152), the second two-dimensional slide (153), and the second turntable connecting plate (154) perform symmetrical or asymmetrical rotational motions under the drive of the second transmission mechanism (162). The first two-dimensional slide (143) and the second two-dimensional slide (153) are used to adjust the relative positions of the flat panel detector (121) for cone-beam imaging and the X-ray source (122) for cone-beam imaging; the three-axis displacement platform (212) for the small-focus X-ray source and the three-axis displacement platform (214) for the flat panel detector are used to adjust the relative positions of the small-focus X-ray source (211) and the amorphous silicon flat panel detector (213); The first stage (131) and the second stage (132) adjust the position of the lifting height horizontal plane according to the size of the object being measured and the imaging requirements, thereby causing the object being measured to rotate. The first grating base (221) performs two-dimensional motion on the first grating three-axis displacement slide (222), and the first grating base (221) is used to install the grating; the second grating base (231) performs two-dimensional motion on the second grating three-axis displacement slide (232), and the second grating base (231) is used to install the grating.

2. The multifunctional X-ray analysis device according to claim 1, characterized in that, The multifunctionality includes: X-ray diffraction analysis, X-ray cone-beam imaging, X-ray dual-energy orthogonal imaging, and X-ray phase-contrast imaging.

3. A data acquisition method, applied to the multifunctional X-ray analysis device according to any one of claims 1-2, characterized in that, The data acquisition method performs X-ray diffraction analysis in the following steps: (1) Move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the positioning signal to the control computer, rotate the X-ray diffraction analysis optical path of the short optical path to the front of the device and make it parallel to the long optical path. (3) Place the object to be tested onto the first stage (131) to complete the initialization of the test conditions; (4) Start the scanning software to begin data acquisition; (5) After the acquisition is completed, adjust the X-ray source (111) and the detector (112) for diffraction analysis to the horizontal state in sequence; rotate the short optical path to be perpendicular to the long optical path; move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and lowest point from the short optical path; (6) Shut down the system.

4. The data acquisition method according to claim 3, characterized in that, The data acquisition method for performing X-ray cone-beam imaging measurements includes: short-path X-ray cone-beam imaging and long-path X-ray cone-beam imaging.

5. The data acquisition method according to claim 4, characterized in that, The data acquisition method performs the following steps for short-path X-ray cone-beam imaging: (1) Move the small-focus X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the positioning signal to the control computer, rotate the micro-focus X-ray cone beam imaging optical path of the short optical path to the front of the device and parallel it to the long optical path. (3) Place the object to be measured on the second stage (132) and adjust the height and horizontal position of the second stage (132); (4) Adjust the relative positions of the flat panel detector (121) for cone-beam imaging and the X-ray source (122) for cone-beam imaging by means of the first two-dimensional slide (143) and the second two-dimensional slide (153); (5) Start the scanning software to begin data acquisition; (6) After the acquisition is completed, rotate the short optical path to be perpendicular to the long optical path; move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and lowest point from the short optical path; (7) Shut down the system.

6. The data acquisition method according to claim 5, characterized in that, The data acquisition method performs the following steps for long-path X-ray cone-beam imaging: (1) Move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Place the object to be measured on the second stage (132) and adjust the second stage (132) to an appropriate height and horizontal position; (4) Adjust the relative positions of the small-focus X-ray source (211) and the amorphous silicon flat panel detector (213) by using the triaxial displacement platform (212) of the small-focus X-ray source and the triaxial displacement platform (214) of the flat panel detector; (5) Start the scanning software to begin data acquisition; (6) After the acquisition is completed, move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and lowest point from the short optical path; (7) Shut down the system.

7. The data acquisition method according to claim 3, characterized in that, The data acquisition method for performing X-ray dual-energy orthogonal imaging follows these steps: (1) Move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Adjust the relative positions of the flat panel detector (121) for cone-beam imaging and the X-ray source (122) for cone-beam imaging by means of the first two-dimensional slide (143) and the second two-dimensional slide (153); (4) Place the object to be measured on the second stage (132) and adjust the height and horizontal position of the second stage (132); (5) Adjust the relative positions of the small-focus X-ray source (211) and the amorphous silicon flat panel detector (213) by using the triaxial displacement platform (212) of the small-focus X-ray source and the triaxial displacement platform (214) of the flat panel detector; (6) Set the tube current and tube voltage of the cone-beam imaging X-ray source (122) and the small-focus X-ray source (211) respectively; (7) Start the scanning software to begin data acquisition; (8) After the acquisition is completed, move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and lowest point from the short optical path; (9) Shut down the system.

8. The data acquisition method according to claim 3, characterized in that, The data acquisition method performs X-ray phase-contrast imaging in the following steps: (1) Move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and highest point from the short optical path; (2) After the corresponding position sensor transmits the position signal to the control computer, rotate the short optical path to a state perpendicular to the long optical path; (3) Place the object to be tested on the second stage (132) and adjust the height and horizontal position of the second stage (132); place the imaging grating on the first grating base (221) and the second grating base (231) respectively. (4) Adjust the relative positions of the small-focus X-ray source (211) and the amorphous silicon flat panel detector (213) by using the triaxial displacement platform (212) of the small-focus X-ray source and the triaxial displacement platform (214) of the flat panel detector; (5) Move the first grating base (221) and the second grating base (231) to the relative positions that meet the experimental requirements by using the first grating triaxial displacement slide (222) and the second grating triaxial displacement slide (232), respectively. (6) Set the tube current and tube voltage of the small-focus X-ray source respectively; (7) Start the scanning software to begin data acquisition; (8) After the acquisition is completed, move the small focal point X-ray source (211), amorphous silicon flat panel detector (213), first grating base (221), and second grating base (231) of the long optical path to the farthest and lowest point from the short optical path; (9) Shut down the system.

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