Method and apparatus for obtaining a balanced profile

Abstract

The embodiment of the application discloses a kind of balanced section acquisition method and device, belong to geological structure restoration technical field.The method includes: obtaining structural section, structural section includes upper tectonic layer and lower tectonic layer, wherein lower tectonic layer is below upper tectonic layer, upper tectonic layer includes first tectonic layer and second tectonic layer, second tectonic layer is below first tectonic layer;Obtain the multiple sites of second tectonic layer, and each site in the multiple sites of second tectonic layer is projected onto first tectonic layer, to obtain the first tectonic layer after projection;The first tectonic layer after projection is flattened, to obtain the balanced section of first tectonic layer;Based on the length of the balanced section of first tectonic layer and the trend of lower tectonic layer, obtain the balanced section of structural section.Compared with the method that complex tectonic style is set to single layer structure in prior art and is handled, the method can improve the precision of the balanced section obtained.

Description

Technical Field

[0001] This application relates to the field of geological structure restoration technology, and in particular to a method and apparatus for obtaining a balanced profile. Background Technology

[0002] Balanced profiling is a simulation technique that uses geometric principles to restore deformed structures to a reasonable, undeformed state on a cross-section perpendicular to the structural strike. Geologists can use balanced profiling to obtain tension and compression amounts, thereby quantitatively understanding the process of structural formation and development, and verifying the rationality of interpretation results.

[0003] In related technologies, specialized software is typically used to perform profile balancing to obtain a balanced profile. The method employed by this specialized software is as follows: based on geological data, a geological model is established; based on the principles of length and area conservation, the fault structures of the geological model are balanced to obtain a balanced profile.

[0004] However, the methods used by specialized software cannot be applied to complex structural styles, such as two-layer structures. When it is necessary to draw balanced sections for complex structural styles, the complex structural style can only be set as a single-layer structure for processing, resulting in low accuracy of the obtained balanced sections. Summary of the Invention

[0005] This application provides a method and apparatus for obtaining a balance profile, which can improve the accuracy of the balance profile. The technical solution is as follows:

[0006] On the one hand, a method for obtaining a balanced profile is provided, the method comprising:

[0007] Obtain a structural profile, the structural profile including an upper structural layer and a lower structural layer, wherein the lower structural layer is located below the upper structural layer, and the upper structural layer includes a first structural layer and a second structural layer, the second structural layer being located below the first structural layer;

[0008] Multiple sites of the second construction layer are obtained, and each of the multiple sites of the second construction layer is projected onto the first construction layer to obtain the projected first construction layer.

[0009] The first structural layer after projection is flattened to obtain the equilibrium profile of the first structural layer.

[0010] The equilibrium profile of the structure is obtained based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer.

[0011] In some embodiments, the plurality of sites include a plurality of fault points on the upper and lower plates of the second structural layer and a plurality of layer sites;

[0012] The step of projecting each of the multiple sites in the second structural layer onto the first structural layer to obtain the projected first structural layer includes:

[0013] The fault points on the upper and lower walls of each fault in the second structural layer are vertically projected onto the first structural layer to obtain the first structural layer after the projection of the fault points on the upper and lower walls of each fault.

[0014] Each layer point of the second construction layer is vertically projected onto the first construction layer after the breakpoint projection to obtain the first construction layer after the layer point projection.

[0015] In some embodiments, the equilibrium profile of the first structural layer includes a fault trend line and a second structural layer trend line, wherein the fault trend line is determined based on the fault points on the hanging wall and footwall of the plurality of faults, and the second structural layer trend line is determined based on the plurality of layer points. The length of the flattened first structural layer is equal to the length of the first structural layer before flattening, and the area of ​​each fault block in the flattened first structural layer is equal to the area of ​​each corresponding fault block in the first structural layer before flattening.

[0016] In some embodiments, the upper construction layer further includes a third construction layer, the third construction layer being located below the second construction layer, and the method further includes:

[0017] Based on the true thickness of the second structural layer and the positions of multiple layer points of the second structural layer on the trend line of the second structural layer, the multiple simulated layer points of the third structural layer are determined;

[0018] Based on multiple simulated layer sites of the third structural layer, the trend line of the third structural layer is determined;

[0019] The area of ​​each segment between the trend line of the second structural layer and the trend line of the third structural layer is equal to the area of ​​each segment corresponding to the second structural layer and the third structural layer in the structural cross-section.

[0020] Based on the conservation of the area of ​​each fault block on the trend line of the third structural layer and the corresponding fault block in the structural profile, the trend line of the fault is adjusted to obtain the fault occurrence that conforms to geological laws.

[0021] In some embodiments, based on the obtained initial profile, the eroded first structural layer included in the initial profile is repaired to obtain a restored structural profile, including:

[0022] Based on the true thickness of the first structural layer that is preserved intact in the initial profile and the trend of each layer in the initial profile, the eroded first structural layer is filled in to obtain the restored structural profile.

[0023] The first structural layer after being flattened and restored has an area equal to the area of ​​the first structural layer after the structural profile is filled.

[0024] In some embodiments, based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer, an evolution profile of all underlying layers after the flattening of the first structural layer is obtained, wherein the lower structural layer includes the fourth structural layer in the structural profile, and trend restoration is performed on the fourth structural layer, including:

[0025] In response to the fourth structural layer being a complete layer, a trend line for the fourth structural layer is determined;

[0026] The attitude of the underlying structural layer does not change as the upper structural layer is flattened. Based on the length of the equilibrium profile of the first structural layer, the missing part of the fourth structural layer is filled in according to the trend line to obtain the evolution profile of all underlying layers after the first structural layer is flattened.

[0027] In some embodiments, the fourth structural layer is completed to obtain a complete fourth structural layer, including:

[0028] (1) In response to the existence of a complete structural layer in the upper and lower adjacent layers of the fourth structural layer, determine the trend and true thickness of the complete structural layer;

[0029] Based on the trend and true thickness of the complete structural layer, the fourth structural layer is completed;

[0030] (2) In response to the absence of a complete structural layer in the upper and lower adjacent layers of the fourth structural layer, the upper and lower adjacent layers of the fourth structural layer are completed to obtain the completed upper and lower adjacent layers. The completion of the upper and lower adjacent layers is based on geological analysis and follows geological laws.

[0031] Based on the completed upper and lower adjacent layers, the fourth structural layer is completed.

[0032] In some embodiments, before obtaining the structural cross-section, the method further includes:

[0033] Obtain seismic profiles;

[0034] The seismic profile is corrected to obtain the structural profile.

[0035] In some embodiments, correcting the seismic profile includes:

[0036] The faults, horizons, and unconformities in the seismic profile are used as the initial profile.

[0037] The gap and thickness of the upper and lower plates in the initial cross-section are corrected to obtain the structural cross-section.

[0038] On the other hand, an apparatus for obtaining a balanced profile is provided, the apparatus comprising:

[0039] An acquisition module is used to acquire a structural profile, the structural profile including an upper structural layer and a lower structural layer, wherein the lower structural layer is located below the upper structural layer, and the upper structural layer includes a first structural layer and a second structural layer, the second structural layer being located below the first structural layer;

[0040] The projection module is used to acquire multiple sites of the second construction layer and project each of the multiple sites of the second construction layer onto the first construction layer to obtain the first construction layer after projection.

[0041] A flattening module is used to flatten the projected first structural layer to obtain a balanced profile of the first structural layer.

[0042] The determination module is used to obtain the equilibrium profile of the structural profile based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer.

[0043] The method for obtaining a balanced profile provided in this application first obtains a structural profile including an upper structural layer and a lower structural layer. The upper structural layer includes a first structural layer and a second structural layer. The first structural layer is projected onto multiple points of the second structural layer, and the projected first structural layer is flattened to obtain a balanced profile of the first structural layer. Then, based on the length of the balanced profile of the first structural layer and the trend of the lower structural layer, a balanced profile of the structural profile is obtained, thus realizing the acquisition of a balanced profile based on the structural profile. This method can process the upper and lower structural layers with different stratigraphic structures in the structural profile sequentially to obtain a balanced profile of the structural profile. Compared with the prior art method of treating complex structural patterns as single-layer structures, this method can improve the accuracy of the obtained balanced profile. Attached Figure Description

[0044] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0045] Figure 1 This is a flowchart of a method for obtaining a balanced profile provided in an embodiment of this application;

[0046] Figure 2 This is a schematic diagram of a structural cross-section provided in an embodiment of this application;

[0047] Figure 3 This is a schematic diagram illustrating the correction of an initial profile according to an embodiment of this application;

[0048] Figure 4 This is a schematic diagram of determining a fault trend line provided in an embodiment of this application;

[0049] Figure 5 This is a schematic diagram of a trend line for determining a second structural layer provided in an embodiment of this application;

[0050] Figure 6 This is a schematic diagram of a trend line for determining a third structural layer provided in an embodiment of this application;

[0051] Figure 7 This is a schematic diagram of an equilibrium cross-section for reducing the area of ​​the lower structural layer, provided in an embodiment of this application.

[0052] Figure 8(a) is a schematic diagram of a structural cross-section provided in an embodiment of this application;

[0053] Figure 8(b) is a schematic diagram of the equilibrium cross-section of a first structural layer provided in an embodiment of this application;

[0054] Figure 8(c) is a schematic diagram of the equilibrium cross-section of a second structural layer provided in an embodiment of this application;

[0055] Figure 8(d) is a schematic diagram of the equilibrium cross-section of a third structural layer provided in an embodiment of this application;

[0056] Figure 8(e) is a schematic diagram of the equilibrium cross-section of a fourth structural layer provided in an embodiment of this application;

[0057] Figure 9(a) is a diagram showing the current structural form and structural pattern of a two-layer structure provided in the embodiments of this application;

[0058] Figure 9(b) is a diagram of the late Pleistocene sedimentary morphology and structural pattern of a double-layered structural style provided in an embodiment of this application;

[0059] Figure 9(c) is a diagram of the post-deposition morphology and structural pattern of a double-layer structure provided in an embodiment of this application;

[0060] Figure 9(d) is a diagram of the post-deposition morphology and structural pattern of a double-layered structure in the Pliocene strata provided in an embodiment of this application;

[0061] Figure 9(e) is a diagram showing the post-depositional morphology and structural pattern of a double-layered Miocene structure according to an embodiment of this application;

[0062] Figure 9(f) is a diagram of the post-deposition morphology and structural pattern of an Oligocene double-layer structure provided in an embodiment of this application;

[0063] Figure 10 This is a flowchart of a method for obtaining a balanced profile provided in an embodiment of this application;

[0064] Figure 11 This is a schematic diagram of the restoration of a bidirectional thrust-structure erosion zone provided in an embodiment of this application;

[0065] Figure 12 This is a diagram illustrating the compression variation pattern of a bidirectional pushover structure provided in an embodiment of this application;

[0066] Figure 13 This is a schematic diagram of a prototype basin before and after restoration, provided in an embodiment of this application.

[0067] Figure 14 This is a structural evolution diagram of a bidirectional pushover structure provided in an embodiment of this application;

[0068] Figure 15 This is a flowchart of a method for obtaining a balanced profile provided in an embodiment of this application;

[0069] Figure 16(a) is a schematic diagram of a reverse construction style provided in an embodiment of this application;

[0070] Figure 16(b) is a schematic diagram of a reverse construction style recovery provided in an embodiment of this application;

[0071] Figure 17 This is an evolution diagram of a reverse construction style provided in an embodiment of this application;

[0072] Figure 18(a) is a schematic diagram of a flattened underlying third structural layer provided in an embodiment of this application;

[0073] Figure 18(b) is a schematic diagram of a flattened underlying sixth structural layer provided in an embodiment of this application;

[0074] Figure 18(c) is a schematic diagram of a flattened underlying seventh structural layer provided in an embodiment of this application;

[0075] Figure 19 This is a schematic diagram illustrating the construction evolution of a reverse construction style provided in an embodiment of this application;

[0076] Figure 20 This is a flowchart of a method for obtaining a balanced profile provided in an embodiment of this application;

[0077] Figure 21 This is a schematic diagram of the structure of a device for obtaining a balance profile provided in an embodiment of this application;

[0078] Figure 22 This is a schematic diagram of the structure of a computer device provided in an embodiment of this application. Detailed Implementation

[0079] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the implementation methods of this application will be further described in detail below with reference to the accompanying drawings.

[0080] Balanced profiling techniques can be used to quantitatively analyze geological structural features and reasonably reconstruct stratigraphic structures from different periods. For example, balanced profiling techniques can reconstruct the original structure of a prototype basin, providing a reliable basis for oil and gas exploration.

[0081] Specialized software is typically used for profile balancing, such as Cogneseis' GEOsec software, the Lcace software system jointly developed by AGIP, IFP, SNEA, and TOTALCFP, Midland Valley's 2Dmove and 3DMove software, the American StructureSollver software, and Schlumberger's Petrel (geological modeling) software.

[0082] However, specialized software must strictly adhere to conservation theories, ensuring the conservation of strata area and length, and cannot reflect the ambiguity of geological conditions. For example, in complex thrust-nappe zones, applying specialized software to balance the profile of the same structural layer requires segmentation, final integration, and then manual intervention based on geological laws, resulting in low efficiency. For bilayer structures with different fault systems, the current length and area conservation principles for structural profiles are no longer applicable. Furthermore, the methods used by specialized software cannot be applied to complex structural patterns, such as bilayer structures. When drawing balanced profiles for complex structural patterns, the complex structural pattern must be treated as a single-layer structure, resulting in a balanced profile that cannot accurately reflect the stratigraphic structure of the complex pattern, leading to low accuracy.

[0083] To address the aforementioned issues, this application provides a method for obtaining a balanced profile. This method can sequentially process two upper and lower structural layers with different stratigraphic structures in a structural profile to obtain a balanced profile of the structural profile, thereby improving the accuracy of the obtained balanced profile.

[0084] The method for obtaining the equilibrium profile provided in the embodiments of this application will be explained in detail below.

[0085] Figure 1 This is a flowchart illustrating a method for obtaining a balanced profile according to an embodiment of this application. This method is applied to a computer device. (Reference) Figure 1 The method includes the following steps.

[0086] Step 101: Obtain a structural profile, which includes an upper structural layer and a lower structural layer. The lower structural layer is located below the upper structural layer. The upper structural layer includes a first structural layer and a second structural layer, with the second structural layer located below the first structural layer.

[0087] Among them, the structural cross-section is a cross-section that is perpendicular to the structural orientation and can represent the structure of each stratum.

[0088] It is understandable that the upper structural layer may include other structural layers besides the first and second structural layers, such as the third structural layer. The lower structural layer may also include multiple structural layers, such as the fourth structural layer, the fifth structural layer, and so on.

[0089] Figure 2 This is a schematic diagram of a structural cross-section provided in an embodiment of this application. See also... Figure 2 , Figure 2 The structural profile includes the first structural layer (layer one), the second structural layer (layer two), the third structural layer (layer three), the fourth structural layer (layer four), and the fifth structural layer (layer five). Geological analysis shows that the structural profile has a double-layer structure: layers one, two, and three are the upper structural layers; layers four and five are the lower structural layers.

[0090] Before this step, the structural cross-section can be obtained through the following steps:

[0091] (1) Obtain seismic profiles.

[0092] A seismic profile, also known as a seismic record profile, is a map representing geological phenomena and their interrelationships on a geological cross-section; it is a depth-domain profile.

[0093] In this embodiment of the application, the seismic profile is a seismic profile perpendicular to the structural trend.

[0094] (2) The seismic profile interpretation scheme is corrected to obtain the structural profile.

[0095] After obtaining the seismic profile, due to abrupt connections between the fault blocks in the interpretation schemes of the seismic profile, such as... Figure 3 At the marked point 1, or between different fault blocks, there may be abrupt changes, thus requiring correction of the seismic profile interpretation scheme. This correction mainly targets the fault blocks interpreted in the seismic profile.

[0096] In the embodiment, the process of correcting the seismic profile can be as follows: taking the faults, horizons and unconformities interpreted in the seismic profile as the initial profile, correcting the fault displacement and thickness of the hanging wall and footwall of the fault block in the initial profile, and obtaining a structural profile that conforms to geological laws.

[0097] In the initial profile, the hanging wall and footwall represent the relative positional relationship between the fault block and the dipping fault plane, and the blocks located on the fault plane (such as...) Figure 2 The block above F in the middle is called the upper plate (F). Figure 2 In the context of fault B), the block located below the fault plane is called the footwall (e.g., the block below the fault plane). Figure 2 (A) in the middle.

[0098] The initial profile can be obtained directly from seismic data. This involves using seismic attribute extraction techniques to extract attribute data characterizing faults, horizons, and unconformities from the seismic data, and then using this attribute data to identify each structural layer in a two-dimensional coordinate system to obtain the initial profile. For example... Figure 2 As shown, Figure 2 The horizontal curve in the diagram represents a structural layer (layer), and the vertical curve represents a fault line.

[0099] After obtaining the initial profile, the fault blocks in the initial profile are connected end-to-end in sequence, correcting the localized, abrupt changes in the strata into gradual, geologically regular changes (footwall and hanging wall thickness correction). Furthermore, the abrupt connections between the fault blocks are corrected into gradual, end-to-end connections (footwall and hanging wall displacement correction) to obtain the structural profile. In other words, the fault blocks are connected end-to-end to ensure a smooth transition of the footwall and hanging wall thicknesses at the fault planes. Figure 3 As shown, it can be seen that Figure 3 The corrected cross-section shows smoother connections between the segments compared to the initial cross-section.

[0100] Step 102: Obtain multiple sites in the second construction layer, and project each of the multiple sites in the second construction layer onto the first construction layer to obtain the projected first construction layer.

[0101] Among them, the multiple sites include multiple breakpoints and multiple layer sites of the second structural layer. Based on this, the implementation process of step 102 can be as follows: vertically project each breakpoint of the second structural layer onto the first structural layer to obtain the first structural layer after the breakpoint projection; vertically project each layer site of the second structural layer onto the first structural layer after the breakpoint projection to obtain the first structural layer after the projection.

[0102] Specifically, embodiments of this application preferentially consider the vertical projection of fault points. Multiple fault points are the intersections of multiple faults and the second structural layer. For example, as... Figure 4 As shown, Figure 4 In the multiple longitudinal fault lines, each longitudinal fault line intersects with the second structural layer at points; these intersections constitute the multiple fault points of the second structural layer. For example... Figure 4 In the diagram, the point marked with the number "3" is the break point of the second structural layer, that is, the intersection of the second structural layer and the fault.

[0103] After obtaining multiple breakpoints in multiple second structural layers, these breakpoints are sequentially projected onto the first structural layer to obtain the projected first structural layer. That is, each breakpoint is vertically projected onto the first structural layer, so that the projected first structural layer includes the vertical projection points of the breakpoints in the multiple second structural layers.

[0104] Additionally, embodiments of this application may also consider vertical projection of layer points. Multiple layer points are curvature change points of the second structural layer. These curvature change points can reflect the general trend of the second structural layer. For example, such as... Figure 5 As shown, Figure 5 The curve of the second structural layer changes at the points marked with the numbers "18", "22", "29", "35", and "40". Therefore, these points can be used as the curvature change points of the second structural layer.

[0105] Since the selected curvature change points only reflect the general orientation of the second structural layer, to fully restore the trend of the second structural layer, multiple interpolation points can be obtained by interpolating between every two adjacent curvature change points on the second structural layer. For example, such as... Figure 5 As shown, the points marked with the numbers "1" and "10" on the second structural layer are two adjacent points of curvature change. The eight points between the numbers "1" and "10" are multiple interpolation points on the second structural layer. By using these interpolation points and curvature change points as multiple layer points of the second structural layer, the trend line of the second structural layer obtained subsequently based on multiple layer points will better match the original direction of the second structural layer.

[0106] After obtaining multiple layer sites, each of these layer sites is sequentially projected onto the first structural layer to obtain the projected first structural layer. That is, a vertical projection is made from each of the multiple layer sites onto the first structural layer, thus the projected first structural layer includes multiple layer projection points of the second structural layer. For example... Figure 5 As shown, multiple layer points on the second structural layer are projected onto the first structural layer, and the first structural layer after projection includes 45 projection points.

[0107] Furthermore, the upper structural layer may also include a third structural layer, which is located below the second structural layer. Therefore, in scenarios where the structural cross-section includes a third structural layer, the embodiments of this application preferentially consider the vertical projection of the fault point. The fault point on the third structural layer also determines the fault trend. Therefore, when determining the fault trend of the structural cross-section, it is also necessary to consider the fault point on the third structural layer to make the fault trend in the balanced cross-section more closely match the original fault trend.

[0108] Based on this, embodiments of this application can also obtain multiple breakpoints on the third construction layer, for example, such as Figure 4The point marked with the number "4" on the third structural layer is a breakpoint of the third structural layer. After obtaining multiple breakpoints on the third structural layer, these breakpoints and multiple breakpoints on the second structural layer are projected onto the first structural layer to obtain the projected first structural layer. Thus, the projected first structural layer includes multiple vertical projection points of breakpoints from the second structural layer and multiple vertical projection points of breakpoints from the third structural layer.

[0109] like Figure 4 As shown in the first sub-figure from top to bottom, multiple breakpoints on the second and third structural layers are projected onto the first structural layer. The projected first structural layer includes 16 projection points. For example, among the 16 projection points on the first structural layer, projection points 3, 7, 9, 11, 13, and 15 are projection points from breakpoints on the second structural layer to the first structural layer, while projection points 1, 2, 4, 5, 6, 8, 10, 12, 14, and 16 are projection points from breakpoints on the third structural layer to the first structural layer.

[0110] Step 103: Flatten the first structural layer after projection to obtain the equilibrium profile of the first structural layer.

[0111] In some embodiments, step 103 can be implemented as follows: flattening the first structural layer after the breakpoints are projected, and determining the trend line of the fault located below the first structural layer based on the position of each breakpoint in the flattened first structural layer. Flattening the first structural layer after the layer points are projected, and determining the trend line of the second structural layer based on the position of each layer point in the flattened first structural layer, wherein the length of the flattened first structural layer is equal to the length of the first structural layer before flattening, and the area of ​​the flattened first structural layer is equal to the area of ​​the first structural layer before flattening.

[0112] A balanced profile refers to a structure that has been restored from a deformed state to a reasonable, undeformed state. In step 103, the first structural layer after projection is flattened. At this point, the flattened first structural layer is equivalent to the original landform of the first structural layer, thus obtaining the balanced profile of the first structural layer.

[0113] When obtaining a balanced profile, it is necessary to first control the structural pattern of the profile and then fill in the strata. That is, first, the fault trend of the profile is determined by projecting multiple fault points, and then the trend lines of the strata are determined based on the projections of multiple strata points. Therefore, the balanced profile of the first structural layer includes the fault trend line and the trend line of the second structural layer. The fault trend line is the fault dip line in the profile after leveling the first structural layer, and the trend line of the second structural layer is the dip change line of the second structural layer in the profile after leveling the first structural layer. It can be understood that the fault trend line is determined based on the changes in the horizontal position of multiple fault projection points after leveling the first structural layer, and the trend line of the second structural layer is determined based on the changes in the horizontal position of multiple strata projection points after leveling the first structural layer. The length and area of ​​the first structural layer after leveling are equal to those before leveling.

[0114] In a scenario where the first structural layer after projection includes multiple first projection points (vertical projection points of the faults in the second and third structural layers), the first structural layer after projection is flattened. Multiple third projection points, each corresponding to one of the first projection points, are then determined on the flattened first structural layer. Based on the multiple third projection points and the vertical distances from the faults to the first structural layer, fourth projection points, each corresponding to one of the third projection points, are obtained. The position of the fourth projection point is determined by the vertical distance from the fault to the first structural layer; that is, the vertical distance from the fourth projection point to the flattened first structural layer is equal to the vertical distance from the fault to the first structural layer, and also equal to the vertical distances from the faults to the first structural layer. After obtaining the multiple fourth projection points, each fourth projection point is connected to the slip surface to obtain the equilibrium profile of the first structural layer. Therefore, the equilibrium profile of the first structural layer includes multiple fault trend lines.

[0115] Since the lateral distance of the first structural layer after flattening is greater than that of the first structural layer before flattening, the distance between the projection points after the projection points are moved laterally after flattening the first structural layer is longer than the lateral distance between the projection points on the first structural layer in the structural profile. Thus, the lateral distance of the equilibrium profile of the first structural layer is longer than the lateral distance of the original structural profile. The difference in distance is the amount of compression after flattening the first structural layer.

[0116] For example, Figure 4 This is a schematic diagram of determining the fault trend line provided in an embodiment of this application, such as... Figure 4 As shown, Figure 4The diagram is divided into three sub-figures from top to bottom. The first sub-figure is a structural cross-section. The second sub-figure shows the location of each fault point after the first structural layer was flattened. This sub-figure shows that after flattening the first structural layer, the lateral distance of each fault point is longer than before flattening. The third sub-figure is a fault trend line diagram. This sub-figure shows multiple fault trend lines, and the lateral distance of these fault trend lines is longer than that of the fault trend lines in the original structural cross-section. This means that after flattening the first structural layer, the fault attitude becomes gentler compared to the structural cross-section, and the fault angle becomes smaller.

[0117] See Figure 4 The following explanation uses the first projection point F as an example to illustrate the method for determining the fault trend line: By flattening the first structural layer after projection, a third projection point F1 corresponding to the first projection point F can be obtained; based on the third projection point F1 and the vertical distance (fault displacement) from the fault point corresponding to the first projection point F to the first structural layer, a fourth projection point F2 corresponding to the third projection point F1 can be obtained; after obtaining the fourth projection point F2, connecting F2 and the slip surface yields a fault trend line. This fault trend line can reflect the structural pattern of the structural profile.

[0118] After obtaining the fault trend line, the strata trend line is then determined. That is, the trend line of the second structural layer is determined based on the projection of multiple strata points of the second structural layer.

[0119] In a scenario where the first constructed layer after projection includes multiple second projection points (layer projection points of the second constructed layer), the first constructed layer after projection is flattened. Multiple fifth projection points, each corresponding to one of the multiple second projection points, are then determined on the flattened first constructed layer. Based on the multiple fifth projection points and the vertical distances from the multiple layer points to the first constructed layer, sixth projection points, each corresponding to one of the fifth projection points, are obtained. These sixth projection points are located below the flattened first constructed layer. Connecting each sixth projection point sequentially yields the trend line of the second constructed layer.

[0120] Figure 5 This is a schematic diagram of the trend line for determining the second structural layer provided in an embodiment of this application, such as... Figure 5 As shown, Figure 5 The diagram is divided into three sub-figures from top to bottom. The first sub-figure is a structural cross-section. The second sub-figure shows the location of each layer point after flattening the first structural layer. This sub-figure shows that after flattening the first structural layer, the lateral distance of each layer point is longer than the lateral distance before flattening the first structural layer. The third sub-figure shows the trend line of the second structural layer after flattening the first structural layer. This sub-figure shows that the lateral distance of the second structural layer after flattening the first structural layer is longer than the lateral distance of the second structural layer in the original structural cross-section.

[0121] See Figure 5The following explanation uses the second projection point H as an example to illustrate the method for determining the trend line of the second structural layer: By flattening the first structural layer after projection, the fifth projection point H1 corresponding to the second projection point H can be obtained; based on the fifth projection point H1 and the vertical distance (layer height) from the layer point corresponding to the second projection point H to the first structural layer, the sixth projection point H2 corresponding to the fifth projection point H1 can be obtained; following this method, the sixth projection point corresponding to each second projection point is obtained, and then each sixth projection point is connected in sequence to obtain the trend line of the second structural layer.

[0122] Therefore, the embodiments of this application can obtain the equilibrium profile of the first structural layer based on the above method. This equilibrium profile, by flattening the first structural layer, restores the original topography of the second structural layer, as shown in the structural pattern diagram in Figure 9.

[0123] In addition, in scenarios where the structural profile includes other structural layers, embodiments of this application may also sequentially determine the trend lines of each other structural layer so that the obtained trend lines of the structural layers match the original stratigraphic structure.

[0124] Based on this, in scenarios where the structural profile includes a third structural layer, embodiments of this application can further determine multiple simulated layer locations of the third structural layer based on the true thickness of the second structural layer and the positions of multiple layer locations on the trend line of the second structural layer. The true thickness is the vertical distance between the two layers. After obtaining multiple simulated layer locations of the third structural layer, the trend line of the third structural layer is determined based on these multiple simulated layer locations, i.e., the trend of the underlying strata is determined by the overlying strata.

[0125] Specifically, after obtaining multiple layer points on the second structural layer in step 102, the true thickness from the second structural layer to the third structural layer is calculated through these layer points, i.e., the vertical distance from the second structural layer to the third structural layer. For example... Figure 6 The numbers 0 to 38 represent the vertical line segments from the second to the third structural layer, which are the true thicknesses. After obtaining multiple true thicknesses, multiple simulated layer sites are obtained on the third structural layer. Figure 6 The intersection of the vertical line segment from 0 to 38 with the third structural layer.

[0126] That is, multiple seventh projection points (simulated layer points) are constructed, each corresponding to a multiple sixth projection point (layer point of the second structural layer). The distance between each seventh projection point and the trend line of the second structural layer is the true thickness between the corresponding layer point and the third structural layer. The seventh projection point is located below the trend line of the second structural layer. Then, each seventh projection point is connected in sequence to obtain the trend line of the third structural layer.

[0127] Figure 6 This is a schematic diagram illustrating the trend line for determining the third structural layer provided in an embodiment of this application. For example... Figure 6 As shown, Figure 6 The diagram is divided into two sub-figures from top to bottom. The first sub-figure is a structural cross-section. The second sub-figure is a trend line diagram of the third structural layer after the first structural layer has been flattened. This sub-figure shows that the lateral distance of the third structural layer after flattening the first structural layer is longer than the lateral distance of the third structural layer in the original structural cross-section.

[0128] See Figure 6 Taking the sixth projection point G as an example, the method for determining the trend line of the third structural layer will be explained. The sixth projection point G is the layer point in the second structural layer corresponding to the second projection point H.

[0129] First, obtain the true thickness between the sixth projection point G and the third structural layer; the length of the line segment GG1 represents the true thickness. Then, in the equilibrium profile of the first structural layer, construct the seventh projection point G1 corresponding to the sixth projection point G through the trend line of the second structural layer. The seventh projection point G1 is the simulated layer point of the third structural layer, i.e., the intersection of the true thickness line and the third structural layer. The eighth projection point G2 is the point where G changes after flattening the first structural layer, and the ninth projection point G3 is the point where G1 changes after flattening the first structural layer, i.e., the simulated layer point after the change in the third structural layer. GG1 is the true thickness before flattening, and G2G3 is the true thickness after flattening. The true thickness before and after flattening is equal, i.e., the length of the line segment GG1 is equal to the length of the line segment G2G3. Following this method, obtain the ninth projection point corresponding to each sixth projection point. Then, connect each ninth projection point sequentially to obtain the trend line of the third structural layer.

[0130] Step 104: Based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer, obtain the equilibrium profile of the structural profile.

[0131] Since the topographic structure of the lower structural layer is not affected by the upper structural layer, the trend line of the lower structural layer can be used to compensate for the increased lateral distance after the first structural layer is flattened, based on the equilibrium profile of the first structural layer, so as to obtain the trend line of the structural layer and thus obtain the equilibrium profile of the structural section.

[0132] In some embodiments, the lower construction layer includes a fourth construction layer. The implementation process of step 104 can be as follows: if the fourth construction layer is a complete layer, the trend line of the fourth construction layer is determined, and the equilibrium profile of the structure is obtained based on the length of the equilibrium profile of the first construction layer and the trend line of the fourth construction layer.

[0133] Specifically, if each layer of the lower structural layer is a complete layer, then each layer can be restored by following the compression amount of the first structural layer and the trend of each layer of the lower structural layer in the structural profile, and the trend line of each layer of the lower structural layer can be obtained.

[0134] like Figure 7As shown, the lower structural layers include a fourth structural layer (layer four) and a fifth structural layer (layer five). Since the structures of the fourth and fifth structural layers are not affected by the first, second, and third structural layers in the upper structural layers, determining the trend line of the fourth structural layer only requires restoring it according to the compression amount of the flattened first structural layer and the trend of the fourth structural layer in the structural cross-section; that is, filling in the missing portion of the fourth structural layer according to the length difference before and after flattening the first structural layer. Similarly, determining the trend line of the fifth structural layer only requires restoring the fifth structural layer according to its trend. The area between the fourth and fifth structural layers, compared to the area of ​​the original structural cross-section, includes the supplemented portion, such as... Figure 7 As shown in the middle S, the area of ​​the lower structure is not conserved before and after flattening the first structural layer because the area of ​​the fourth structural layer in the original structural profile is missing.

[0135] A structural profile of a tectonic layer reflects the geomorphic features of a given period. When a structural profile includes multiple structural layers, it indicates that the profile encompasses strata from multiple periods. Therefore, a balanced profile can be sequentially generated for each structural layer within the profile to obtain the balanced profile for each layer. By analyzing the balanced profiles of each structural layer, geologists can determine the geomorphic features of each period.

[0136] Therefore, in the case where the upper structural layer includes the second structural layer, the embodiments of this application can also flatten the second structural layer based on its area to obtain a balanced profile of the second structural layer.

[0137] In some embodiments, the process of obtaining the equilibrium profile of the second structural layer can be as follows: The area of ​​each segment of the second structural layer is obtained; the second structural layer is flattened; the length of the flattened second structural layer is the same as the length of the original structural profile; and the area of ​​the equilibrium profile of the second structural layer is the same as the area of ​​each segment of the corresponding original structural profile, and also the same as the area of ​​each segment of the corresponding first structural layer equilibrium profile. That is, the length and area of ​​the second structural layer are conserved before and after flattening.

[0138] After the second structural layer is flattened, the equilibrium profile of the second structural layer changes from a double-layer structure to a single-layer structure, meaning that the fault that caused the double-layer structure was formed during the first structural layer period.

[0139] The area of ​​each segment of the second structural layer can be determined when the structural cross-section is obtained. When the second structural layer is flattened to obtain the equilibrium cross-section of the second structural layer, the area of ​​each segment of the equilibrium cross-section of the second structural layer is the same as the area of ​​the corresponding segment of the equilibrium cross-section of the first structural layer.

[0140] Figure 7 This is a schematic diagram of the equilibrium cross-section provided in an embodiment of this application. For example... Figure 7 As shown, Figure 7 The diagram is divided into three sub-figures from top to bottom. The first sub-figure is the original structural cross-section. The second sub-figure is the equilibrium cross-section of the first structural layer obtained by flattening it, which includes multiple fault trend lines and trend lines of the second, third, fourth, and fifth structural layers. The third sub-figure is the equilibrium cross-section of the second structural layer obtained by flattening it, which includes trend lines of the third, fourth, and fifth structural layers. Figure 7 As can be seen, the second structural layer in the original structural profile includes 7 fault blocks. In the equilibrium profile of the first structural layer, the area of ​​these 7 fault blocks in the second structural layer is the same as the area of ​​these 7 fault blocks in the corresponding original structural profile. In the equilibrium profile of the second structural layer, the area of ​​these 7 fault blocks is also the same as the area of ​​these 7 fault blocks in the original structural profile. The fourth structural layer in the original structural profile includes 2 fault blocks. In the equilibrium profile of the first structural layer, the total area of ​​these 2 fault blocks in the fourth structural layer is different from the total area of ​​these 2 fault blocks in the original structural profile because the fourth structural layer is missing in the original structural profile. In the equilibrium profile of the second structural layer, the area of ​​these 2 fault blocks in the fourth structural layer is the same as the area of ​​these 2 fault blocks in the equilibrium profile of the first structural layer because the equilibrium profile of the first structural layer fills in the missing S portion of the fourth structural layer. That is, area conservation is followed in the complete strata after the filling in. In the original structural profile, the third and fourth structural layers mark the boundary between the upper and lower structural layers, indicating the period of unidirectional thrusting. After flattening the second structural layer, the trend line morphology of the fourth structural layer is largely the same as that of the third structural layer, indicating stable sedimentary deposition. The distance between them is referenced to the shortest distance between the third and fourth structural layers in the original structural profile.

[0141] Figure 8(a) shows the original structural cross-section, which includes five structural layers. Figure 8(b) shows the equilibrium cross-section of the first structural layer obtained by flattening the first structural layer. This equilibrium cross-section includes multiple fault trend lines and trend lines of the second, third, fourth, and fifth structural layers. Figure 8(c) shows the equilibrium cross-section of the second structural layer obtained by flattening the second structural layer. This equilibrium cross-section includes trend lines of the third, fourth, and fifth structural layers. Figure 8(d) shows the equilibrium cross-section of the third structural layer obtained by flattening the third structural layer. This equilibrium cross-section includes trend lines of the fourth and fifth structural layers. Figure 8(e) shows the equilibrium cross-section of the fourth structural layer obtained by flattening the fourth structural layer. This equilibrium cross-section includes trend lines of the fifth structural layer. Both the equilibrium cross-sections of the third and fourth structural layers follow the conservation of length and area. When the fourth structural layer is flattened, its length and area are the same as the length and area of ​​the restored fourth structural layer.

[0142] In addition, in scenarios where the structural profile includes multiple structural layers, the method in step 104 can be used to flatten each of these structural layers to obtain a balanced profile for each structural layer.

[0143] Figure 9 is a schematic diagram of the structural mode provided in the embodiment of this application. As shown in Figure 9, the left half of Figure 9 shows the equilibrium cross-sections of each structural layer after flattening each structural layer. The right half shows the original structural modes of each structural layer after flattening each structural layer. The left half and the right half of the figure... Figure 1 One-to-one correspondence. In Figure 9(a), the left half shows the current structural morphology, and the right half shows a structural model diagram of the current structural morphology. In Figure 9(b), the left half shows the late Pleistocene sedimentary morphology, and the right half shows a structural model diagram of the late Pleistocene sedimentary period. In Figures 9(a) and 9(b), the left half shows the original structural profile, and the right half shows the original structural model. In Figure 9(c), the left half shows the post-depositional Pleistocene morphology, which is the equilibrium profile of the first structural layer obtained after flattening the first structural layer; the right half shows a structural model diagram of the post-depositional Pleistocene morphology, which is the structural model after flattening the first structural layer. In Figure 9(d), the left half shows the post-depositional Pliocene morphology, which is the equilibrium profile of the second structural layer obtained after flattening the second structural layer; the right half shows a structural model diagram of the post-depositional Pliocene morphology, which is the structural model after flattening the second structural layer. Figure 9(e) shows the post-depositional morphology of the Miocene, which is the equilibrium section of the third structural layer obtained by flattening the third structural layer. The right half is the post-depositional structural model of the Miocene, which is the structural model after flattening the third structural layer. Figure 9(f) shows the post-depositional morphology of the Oligocene, which is the equilibrium section of the fourth structural layer obtained by flattening the fourth structural layer. The right half is the post-depositional structural model of the Oligocene, which is the structural model after flattening the fourth structural layer.

[0144] It should be noted that in the initial cross-sections obtained in the above embodiments, the first structural layer is a relatively intact layer without severely eroded areas. Therefore, the above embodiments can directly flatten the first structural layer in the initial cross-section to obtain a balanced cross-section of the first structural layer. For ease of description, the above embodiments are referred to as Embodiment 1.

[0145] However, in actual geological structures, the initial profile almost always exhibits erosion. Therefore, in Example 2, the eroded strata in the initial profile can be filled in first, and then the equilibrium profile can be obtained.

[0146] Based on this, the initial profile obtained in Embodiment 2 includes the eroded first structural layer, wherein a partially intact first structural layer exists within the eroded first structural layer. The eroded first structural layer is then filled in based on the true thickness of the intact first structural layer in the initial profile and the trend of each layer in the initial profile, to obtain the structural profile. Then, the restored first structural layer is flattened, and the area of ​​the flattened and restored first structural layer is equal to the area of ​​the first structural layer after the structural profile is filled in.

[0147] The method for obtaining the equilibrium profile provided in Example 2 will be explained in detail below. Figure 10 This is a flowchart of Embodiment 2. The method includes the following steps, wherein the structural cross-section in the following steps is the cross-section of the first structural layer being eroded.

[0148] Step 1001: Obtain a structural profile, which includes an upper structural layer and a lower structural layer. The lower structural layer is located below the upper structural layer. The upper structural layer includes a first structural layer and a second structural layer, with the second structural layer located below the first structural layer.

[0149] The structural cross-section is perpendicular to the structural trend and can represent the stratigraphic structure of each area. In addition to the first and second structural layers, the upper structural layers may also include other structural layers, such as the third structural layer.

[0150] Figure 11 This is a schematic diagram of a structural cross-section provided in Embodiment 2 of this application. See also... Figure 11 , Figure 11 The structural profile includes the first structural layer (layer one), the second structural layer (layer two), the third structural layer (layer three), the fourth structural layer (layer four), the fifth structural layer (layer five), the sixth structural layer (layer six), the seventh structural layer (layer seven), and the eighth structural layer (layer eight). Geological analysis shows that the structural profile has a double-layer structure: layers one, two, three, and four are the upper structural layers; layers five, six, seven, and eight are the lower structural layers.

[0151] The method for obtaining the structural cross-section can refer to the relevant content of Embodiment 1 above. However, the first structural layer in Embodiment 2 is severely eroded, making it impossible to correct the first structural layer fault interpretation scheme as in Embodiment 1. Therefore, the fault correction step in Embodiment 1 can be ignored.

[0152] Step 1002: Complete the eroded strata according to the stratigraphic trend, and restore the eroded strata to their integrity. Obtain multiple sites on the first structural layer where the complete portion is preserved, that is, there are partially complete first structural layers in the eroded first structural layer. Obtain the true thickness of these multiple sites on the complete second structural layer.

[0153] The specific implementation is as follows: First, a geological analysis is conducted on the original structural profile, for example... Figure 11 The bidirectional thrust structure shown depicts thrusting from both sides towards the center, with the central depression remaining intact, sedimentary, and relatively stable in position. The depression's low point, H1, serves as the equilibrium point; that is, with H1 as the axis, the strata on both sides thrust towards the center. The strata on the left side are severely eroded and difficult to restore, while the strata on the right side contain a partially intact first structural layer. Geological analysis indicates that the underlying strata of the first structural layer on both sides are of equal thickness, thus determining that the thickness of the first structural layer on both sides of the depression is approximately equal. The true thickness of the first structural layer on the left side is inferred from the true thickness of the first structural layer on the right side, showing that the true thicknesses on both sides are roughly equal. Based on the true thickness of the intact first structural layer on the right side and the trend of the strata beneath the first structural layer in the bidirectional thrust structure, the eroded first structural layer is then repaired.

[0154] Then, the projection points are obtained. As in Example 1 above, this step is divided into vertical projection of the fault point and vertical projection of the layer point. 1. Vertical projection of the fault point is given priority. Due to the intense bidirectional thrust tectonic activity and severe erosion of the first tectonic layer, a geological analysis of the fault formation period is performed first, such as... Figure 11 The middle f1 fault was formed during the first tectonic layer period and is not used as a fault location for acquisition. That is, the fault disappears when the tectonic layer from which it was formed is flattened. The method for obtaining fault locations (breakpoints) in other tectonic layers within the upper tectonic layer can refer to the relevant content in Example 1 above.

[0155] 2. Consider the vertical projection of the stratigraphic position. This step is implemented as follows: Obtain the true thickness of a partially complete first structural layer to the second structural layer, i.e., select the thickness of a relatively stable sedimentary stratum, such as... Figure 11 The true thickness segments 1, 2, 3, and 4 are given. Taking the true thickness segment 1 as an example, the intersection point H between 1 and the first structural layer is H1, and the intersection point H1 between 1 and the second structural layer is H1. That is, the projection point of the true thickness of the upper layer point H1 of the second structural layer on the first structural layer is H.

[0156] After obtaining multiple layer sites, each of these layer sites is sequentially projected onto the restored first structural layer to obtain the projected first structural layer. This method can be referenced from the relevant content in Embodiment 1 above. That is, this step involves projecting the true thickness of each of the multiple layer sites onto the first structural layer. The true thickness projection is one method of vertical projection of layer sites in Embodiment 1. The method for vertical projection of layer sites in other structural layers within the upper structural layer can also be referenced from the relevant content in Embodiment 1 above.

[0157] Step 1003: Flatten the first structural layer after projection to obtain the equilibrium profile of the first structural layer.

[0158] like Figure 11As shown, the first structural layer is projected horizontally to both sides with the equilibrium point H as the axis. The first structural layer is the restored complete stratum. The trend line of the second layer on the left side is referenced to the trend line of the second layer on the right side, i.e., the true thickness trend line. The specific horizontalization method can be referred to the relevant content of Embodiment 1 above. The length of the first structural layer is conserved before and after horizontalization, that is, the lateral length before the restored first structural layer is equal to the lateral length after the restored first structural layer, and the difference in their vertical lengths is the compression after horizontalization. The area of ​​the first structural layer is conserved before and after horizontalization, that is, the area of ​​the first structural layer after the original structural profile is fully restored is the same as the area after horizontalization. The method for determining the trend lines of other structural layers in the upper structural layer, such as the second, third, and fourth structural layers, can be referred to the relevant content of Embodiment 1 above.

[0159] like Figure 11 As shown, the structural profile also includes a fifth structural layer (layer five), a sixth structural layer (layer six), a seventh structural layer (layer seven), and an eighth structural layer (layer eight). Since the fifth structural layer is a salt layer, it exhibits plastic fluidity, with equal inflow and outflow areas, adhering to the principle of area conservation. Its shape is filled according to the trend lines of adjacent layers. The sixth, seventh, and eighth structural layers are filled by extending from the equilibrium point H3 to both sides according to the stratigraphic trend, based on the lateral length of the flattened first structural layer. H3 is the simulated point of H1 after flattening the first structural layer. H1 and H3 are both on the axis of the lowest point of the vertically recessed section.

[0160] Step 1004: Based on the area of ​​the second structural layer after completion, flatten the second structural layer to obtain the equilibrium profile of the second structural layer.

[0161] The other structural layers in the structural cross-section are flattened layer by layer. The flattening method can refer to the relevant content of the above embodiment one.

[0162] The equilibrium profile of the two-way thrust tectonic layer reflects the compression at each evolutionary stage, such as Figure 12 The cumulative compression of the upper structural layers, i.e., the compression caused by flattening the first and second structural layers, is significant because the faults generated by the bidirectional thrusting mainly occurred during the periods of the first and second structural layers, where drastic stratigraphic changes resulted in compression. In contrast, the third and fourth structural layers were deposited stably without large-scale tectonic movements, and therefore did not produce significant compression. The third and fourth structural layers in Example 2 are similar to the second and third structural layers in Example 1. By creating a bidirectional thrusting equilibrium profile, the following is obtained: Figure 12 The compression amount of the upper tectonic layer is used to determine the rotation pattern before and after the prototype basin restoration, based on the maximum compression amount. This allows for the identification of rotation characteristics and angles. Figure 13By flattening each structural layer, the paleogeographic features of that layer before deposition can be obtained. Geologists can then search for patterns in sedimentary environment changes, such as... Figure 14 .

[0163] In summary, Embodiment 2 is a complex upper structural layer with a double-layer structure, namely the first structural layer eroded in Embodiment 2, which corresponds to the first structural layer in Embodiment 1.

[0164] Similarly, the lower structural layers in Example 1 are relatively intact layers without severe erosion zones. However, in actual stratigraphic structures, both the upper and lower structural layers may exhibit erosion. Therefore, in Example 3, the upper and lower structural layers can be completed first, and then the balanced profile can be obtained.

[0165] The following describes the fabrication of a balanced profile of a complex lower structural layer in a double-layer structure. Figure 15 This is a flowchart of Embodiment 3. The method includes the following steps, wherein the upper and lower structural layers included in the structural profile in the following steps are both eroded strata.

[0166] Step 1501: Obtain the structural profile, which includes an upper structural layer and a lower structural layer, with the lower structural layer located below the upper structural layer.

[0167] The structural profile is perpendicular to the structural trend and can represent the stratigraphic structure of each area. The obtained structural profile is shown in Figure 16(a), which is the original structural profile. Geological analysis of the original structural profile, combined with regional data of the work area, revealed that the structural pattern of this profile is an inversion structure. Structural inversion refers to a change in the polarity of structural undulations. When referring to a specific structure, it means a change from a structural low to a structural high. If the scale is large, this type of deformation can be called a "basin inversion structure".

[0168] For inverted construction, first determine the inverted interface. The area above the inverted interface is the upper construction layer, and the area below the inverted interface is the lower construction layer.

[0169] Figure 16(a) is a schematic diagram of a structural cross-section provided in Embodiment 3 of this application. Referring to Figure 16(a), Figure 16(a) includes a first structural layer (layer one), a second structural layer (layer two), a third structural layer (layer three), a fourth structural layer (layer four), a fifth structural layer (layer five), a sixth structural layer (layer six), a seventh structural layer (layer seven), and an eighth structural layer (layer eight). Geological analysis shows that the structural cross-section has a double-layer structure. As shown by the dashed line in Figure 16(a), the second structural layer is an inversion interface. Above the second structural layer is the upper structural layer, and below the second structural layer is the lower structural layer. That is, layer one is the upper structural layer; layers two, three, four, five, six, seven, and eight are the lower structural layers. Among them, the second structural layer in the lower structural layer of Embodiment 3 corresponds to the fourth structural layer in Embodiment 1.

[0170] In the original structural profile of the present structure, both the upper and lower structural layers are lower in the west and higher in the east, and west on the left and east on the right, i.e., lower on the left and higher on the right. In fact, before the inversion, that is, before the second structural layer, the strata formed should be higher in the west and lower in the east, i.e., higher on the left and lower on the right. After the inversion, due to the uplift and erosion of the eastern strata, the pattern of higher in the west and lower in the east was formed, i.e., lower on the left and higher on the right. After the structural layers before the second structural layer were uplifted and eroded by the inversion structure, the first structural layer was deposited again. Therefore, the first and second structural layers were not formed by the same fault system. So the structural profile in Figure 16(a) is a double-layer structure, and the second structural layer is the inversion interface.

[0171] The method for obtaining the structural cross-section can refer to the relevant content of Embodiment 1 above. However, the first, second, third, fourth, fifth, and sixth structural layers in Embodiment 3 are all incomplete and need to be supplemented and restored. It is not possible to correct the block interpretation scheme of the first structural layer as in Embodiment 1. Therefore, the block correction step in Embodiment 1 can be ignored.

[0172] Furthermore, based on drilling data from the work area, analysis revealed that the strata containing the second structural layer are unconformities in the original structural profile, meaning both the upper and lower layers have been eroded. The second and third structural layers are both unconformities. The strata formed before the second structural layer belong to the lower structural layer. The erosion of the lower structural layer due to tectonic movements does not affect the restoration of the first structural layer above. It is only necessary to restore the eroded portions of the lower structural layer caused by tectonic movements during the period of the upper structural layer. That is, the lower structural layer in the original profile is restored according to the current stratigraphic trend, and the first structural layer is restored according to the trend of the underlying strata, combined with the true thickness. In other words, restoring the first structural layer above the upper structural layer means filling in the missing stratigraphic portions caused by tectonic movements during the period of the first structural layer, thus ensuring the integrity of all strata from the period of the first structural layer.

[0173] The specific method for restoring the first structural layer is as follows: Obtain the true thickness from the partially complete first structural layer to the second structural layer, that is, select the maximum stratigraphic thickness where the deposition is relatively stable. The true thickness of the first structural layer is the maximum depositional thickness of the first structural layer, as shown by the h1 true thickness line segment in Figure 16(a). Using the h1 true thickness line segment as a reference, the stratigraphic restoration is carried out according to the underlying stratigraphic trend of the first structural layer, that is, to complete the first structural layer.

[0174] Since the lower structural layers in Embodiment 3 are all incomplete layers, it is necessary to first complete each structural layer in the lower structural layer to obtain each completed structural layer. Then, based on each completed structural layer, the trend line of the corresponding structural layer is determined. Finally, based on the trend lines of each structural layer in the first structural layer and the lower structural layer, the balanced section of the structural profile is obtained.

[0175] Since the second structural layer in Embodiment 3 is equivalent to the fourth structural layer in Embodiment 1, and Embodiment 1 determines the trend line of the fourth structural layer based on the trend of the fourth structural layer in the structural cross-section, the method for restoring the second structural layer in Embodiment 3 is the same as that in Embodiment 1, restoring the second structural layer based on the trend of the second structural layer in the structural cross-section. Similarly, the third, fourth, fifth, and sixth structural layers are restored, as shown in Figure 16(b).

[0176] Step 1502: Obtain multiple sites of the second construction layer, and project each of the multiple sites of the second construction layer onto the first construction layer to obtain the projected first construction layer.

[0177] The eroded strata are restored by following the stratigraphic trend, i.e., restoring the eroded strata to their integrity. Multiple sites on the first structural layer that preserve complete sections are obtained, indicating that there are partially intact sections of the first structural layer after erosion. The true thickness of these multiple sites on the relatively intact second structural layer is then obtained.

[0178] The specific implementation is as follows: First, the projection points are obtained, as in the above embodiment one. This step is divided into vertical projection of the breakpoint and vertical projection of the layer point.

[0179] 1. Prioritize vertical projection of fault points. The implementation process for this step can be as follows: Since the fault continues to be active after the inversion tectonics, and the first tectonic layer is severely eroded, the geological analysis of the fault formation period is carried out first. As shown in Figure 16(a), faults f4, f5 and f6 were formed during the first tectonic layer period and are not used as faults for obtaining points. That is, when the fault is formed in which tectonic layer period, the fault formed in this period will disappear when the layer is flattened.

[0180] In addition, if the upper structural layer includes other structural layers, the method for obtaining the fault sites (breakpoints) of other structural layers in the upper structural layer can refer to the relevant content of the above embodiment one.

[0181] 2. Next, perform vertical projection of the layer point samples. Project the true thickness points between the first and second structural layers. The method for vertical projection of the restored complete first structural layer's layer points can be found in the relevant content of Example 1; this vertical projection is a true thickness projection. The vertical projection method corresponds to the projection between the second and third structural layers in Example 1.

[0182] After obtaining multiple layer sites, each of the multiple layer sites is sequentially projected onto the restored first structural layer to obtain the projected first structural layer. This method can refer to the relevant content in the above embodiment one.

[0183] Step 1503: Flatten the first structural layer after projection to obtain the equilibrium profile of the first structural layer.

[0184] The implementation process of step 1503 can refer to the relevant content of the above embodiment one, and will not be repeated here.

[0185] For example, Figure 17 It is divided into two sub-figures. The first sub-figure is the equilibrium cross-section of the first structural layer after it has been flattened. The length of the restored first structural layer is equal to the length of the flattened first structural layer, and the area of ​​the restored first structural layer is equal to the area of ​​the flattened first structural layer.

[0186] The trend line of the second structural layer is the unconformity surface of the second structural layer in the original structural cross-section. In the original structural cross-section, there are no complete structural layers in the adjacent layers above and below the second structural layer; that is, the second and third structural layers are unconformities, which are incomplete structural layers. Therefore, it is necessary to complete the adjacent layers above and below the second structural layer, that is, to complete the second and third structural layers, resulting in the completed second and third structural layers. Then, based on the completed adjacent layers, the second structural layer is completed.

[0187] First, complete the adjacent layers. For example... Figure 17 As shown in the first sub-figure, based on the relatively intact C1 and D1 fault blocks in the lower structural layer, and the relatively intact fault blocks controlled by f1, f2, and f3 fault blocks, reconstruction is carried out from bottom to top. First, the trend line of the lower adjacent layer of the second structural layer, i.e., the third structural layer, is reconstructed. The lower structural layer after flattening the first structural layer represents the strata before the reversal movement, following a paleogeographic trend of higher elevations in the west and lower elevations in the east, i.e., higher elevations on the left and lower elevations on the right. The key to reconstructing the third structural layer lies in the trend of the seventh structural layer in the underlying layer. The seventh structural layer is an unconformity, meaning that the sixth, fifth, fourth, and third structural layers were deposited successively on the basis of the erosion of the seventh structural layer. The trend of the third structural layer is the same as that of the fourth, fifth, and sixth structural layers.

[0188] The method for determining the trend line of the seventh structural layer is as follows: after flattening the first structural layer, the area of ​​each fault block in group D ( Figure 17 The blocks marked with numbers 1 to 7 in the first sub-image and the blocks in group D of the original structural cross-section ( Figure 17 In the second sub-map, the areas of the fault blocks marked with numbers 1 to 7 are equal, meaning the areas of the fault blocks in group D between the seventh and eighth tectonic layers are conserved. All fault blocks between F2 and F show a stepped downward trend, consistent with the paleogeographic trend of west-high-east-low. Fault F2 did not begin inversion activity during the seventh tectonic layer period, and its displacement is very small. Combining the area conservation of group D, the paleogeographic trend line, and the displacement of the inverted fault F2, the trend line of the seventh tectonic layer after flattening the first tectonic layer is determined, where the paleogeographic trend line is... Figure 17 As shown by the lower dashed line in the first sub-image.

[0189] The restoration of the third structural layer is specifically implemented as follows: Figure 17 The first sub-figure shows the area of ​​all fault blocks on the left side between the fifth, sixth, and seventh structural layers controlled by fault F2. Figure 17 The left and right side fragments of f1, f2, and f3 in the first sub-image all correspond one-to-one with the fragments in the original structural cross-section. Figure 17 In the second sub-figure, the areas of the fault blocks on both sides of f1, f2, and f3 are equal. After determining the trend line of the seventh structural layer, based on the aforementioned area conservation, the trend lines of the sixth and fifth structural layers to the left of fault F2 are obtained. Then, based on the equilibrium profile length of the first structural layer and the attitude of the boundary fault F, the sixth and fifth structural layers are completed accordingly, following the obtained trend lines of the sixth and fifth structural layers. The fourth structural layer is then completed according to the trend of the fifth structural layer, and the third structural layer is completed according to the trend of the fourth structural layer. This yields the restoration layer of the third structural layer, i.e., completing the third structural layer, the adjacent layer below the second structural layer, and thus obtaining the trend line of the third structural layer.

[0190] Secondly, complete the adjacent layers. For example... Figure 17 As shown in the first sub-figure, after flattening the first structural layer, the maximum thickness h5 between the trend lines of the second and third structural layers is obtained. Based on h5 and the trend line of the third structural layer, and referring to the paleomorphological trend line, the trend of the second structural layer is restored, thus obtaining the trend line of the second structural layer, as shown below. Figure 17 As shown by the upper dashed line in the first sub-graph.

[0191] In summary, by completing the upper and lower adjacent layers of the second structural layer, a complete second structural layer is obtained.

[0192] Step 1504: Based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer, obtain the equilibrium profile of the structural profile.

[0193] After obtaining the equilibrium profile of the first structural layer, based on the length of the equilibrium profile of the first structural layer, the second structural layer is flattened, that is, the trend line of the second structural layer is flattened, using the same method as in Example 1. Figure 17 The second sub-figure is shown in the middle.

[0194] Flatten the third structural layer, that is, flatten the trend line of the third structural layer, in the same way as in Example 1. The fourth and fifth structural layers are inner layers between the third and sixth structural layers. After flattening, their shapes are the same as the trend line of the flattened third structural layer, and will not be described separately, as shown in Figure 18(a).

[0195] The sixth structural layer was flattened, and the sixth structural layer was compensated by sedimentation according to the paleogeographic trend line, that is, the missing area of ​​the sixth structural layer was filled in, as shown in Figure 18(b), where the dashed line is the paleogeographic trend line.

[0196] The seventh structural layer was leveled, and the eighth structural layer followed the paleogeographic trend line, which was higher in the west and lower in the east. Then, based on the fact that F1 and F2 are faults of the same level, the positions of the hanging wall of F1 and F2 were determined. The strata of the seventh structural layer were compensated by deposition, that is, the seventh structural layer was completed, as shown in Figure 18(c).

[0197] By flattening all structural layers, the equilibrium profile of Example 3 is completed. By flattening each structural layer, the tension and compression of each layer are obtained. Geologists can use these tension and compression values ​​to identify patterns in tectonic evolution, such as… Figure 19 .

[0198] In summary, the process for creating the equilibrium profile is as follows (based on the three embodiments above) Figure 20 .like Figure 20 As shown, firstly, a seismic profile is obtained, and geological analysis is performed on it. Faults, bedding planes, and unconformities in the seismic profile are selected as initial profiles. The initial profiles are then corrected to obtain a structural profile. Next, the first structural layer is vertically projected based on multiple points of the second structural layer. These multiple points of the second structural layer include multiple fault points and multiple bedding planes. When projecting based on multiple points, fault trend lines are first obtained from multiple fault points in the upper structural layer. Then, multiple bedding planes in the upper structural layer are projected to obtain the trend lines of the second structural layer. Based on the true thickness of the second structural layer, the trend lines of the third structural layer are obtained, leading to an equilibrium profile of the upper structural layer of the first structural layer. Finally, based on the length of the equilibrium profile of the first structural layer, the trend of the lower structural layer is restored to obtain an equilibrium profile consistent with geological patterns.

[0199] The method for obtaining a balanced profile provided in this application first obtains a structural profile including an upper structural layer and a lower structural layer. The upper structural layer includes a first structural layer and a second structural layer. The first structural layer is projected onto multiple points of the second structural layer, and the projected first structural layer is flattened to obtain a balanced profile of the first structural layer. Then, based on the length of the balanced profile of the first structural layer and the trend of the lower structural layer, a balanced profile of the structural profile is obtained, thus realizing the acquisition of a balanced profile based on the structural profile. This method can sequentially process the upper and lower structural layers with different stratigraphic structures in the structural profile to obtain a balanced profile of the structural profile. Compared with the prior art method of treating complex structural patterns as single-layer structures, this method can improve the accuracy of the obtained balanced profile.

[0200] All of the above-mentioned optional technical solutions can be combined in any way to form optional embodiments of this application, and the embodiments of this application will not be described in detail one by one.

[0201] Figure 21 This is a schematic diagram of a device for obtaining a balance profile according to an embodiment of this application. The device for obtaining a balance profile can be implemented by software, hardware, or a combination of both. Please refer to... Figure 21 The device includes: an acquisition module 2101, a projection module 2102, a flattening module 2103, and a determination module 2104.

[0202] The acquisition module 2101 is used to acquire a structural profile, which includes an upper structural layer and a lower structural layer. The lower structural layer is located below the upper structural layer. The upper structural layer includes a first structural layer and a second structural layer, with the second structural layer located below the first structural layer.

[0203] The projection module 2102 is used to acquire multiple sites of the second construction layer and project each of the multiple sites of the second construction layer onto the first construction layer to obtain the projected first construction layer.

[0204] The flattening module 2103 is used to flatten the projected first structural layer to obtain a balanced profile of the first structural layer.

[0205] The determination module 2104 is used to obtain the equilibrium profile of the structural profile based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer.

[0206] Optionally, the multiple sites include multiple breakpoints and multiple layer sites of the second structural layer, and the projection module 2102 is used for:

[0207] Each breakpoint of the second construction layer is vertically projected onto the first construction layer to obtain the first construction layer after the breakpoint projection.

[0208] Each layer point of the second structural layer is vertically projected onto the first structural layer after the breakpoint projection to obtain the first structural layer after the layer point projection.

[0209] Optionally, the flattening module 2103 is used for:

[0210] The first structural layer after the breakpoint projection is flattened, and based on the position of each breakpoint in the flattened first structural layer, the trend line of the fault located below the first structural layer is determined.

[0211] The first structural layer after the layer points are projected is flattened, and the trend line of the second structural layer is determined based on the position of each layer point in the flattened first structural layer. The length of the flattened first structural layer is equal to the length of the first structural layer before flattening, and the area of ​​the flattened first structural layer is equal to the area of ​​the first structural layer before flattening.

[0212] Optionally, the upper structural layer further includes a third structural layer located below the second structural layer, and the device further includes a module that performs the following operations:

[0213] Based on the true thickness of the second structural layer and the positions of multiple layer sites of the second structural layer on the trend line of the second structural layer, multiple simulated layer sites of the third structural layer are determined.

[0214] Based on multiple simulated layer sites of the third structural layer, the trend line of the third structural layer is determined.

[0215] Optionally, module 2101 is used for:

[0216] An initial profile is obtained, which includes the first structural layer after erosion, wherein a partially intact first structural layer exists within the eroded first structural layer.

[0217] Based on the true thickness of the complete first structural layer in the initial profile and the trend of each layer in the initial profile, the eroded first structural layer is completed to obtain the structural profile.

[0218] Optionally, the lower construction layer includes a fourth construction layer, defining module 2104, for:

[0219] In response to the fact that the fourth structural layer is an incomplete layer, the fourth structural layer is completed to obtain the completed fourth structural layer.

[0220] Based on the completed fourth structural layer, determine the trend line of the fourth structural layer;

[0221] Based on the length of the equilibrium profile of the first structural layer and the trend line of the fourth structural layer, the equilibrium profile of the structural section is obtained.

[0222] Optionally, module 2104 is configured to:

[0223] In response to the fourth structural layer being a complete layer, the trend line of the fourth structural layer is determined;

[0224] Based on the length of the equilibrium profile of the first structural layer and the trend line of the fourth structural layer, the equilibrium profile of the structural section is obtained.

[0225] Optionally, module 2104 is configured to:

[0226] In response to the existence of complete structural layers in the upper and lower adjacent layers of the fourth structural layer, the trend and true thickness of the complete structural layers are determined.

[0227] Based on the trend and true thickness of the complete structural layers, the fourth structural layer is completed.

[0228] Optionally, module 2104 is configured to:

[0229] In response to the absence of a complete structural layer in the upper and lower adjacent layers of the fourth structural layer, the upper and lower adjacent layers of the fourth structural layer are filled to obtain the filled upper and lower adjacent layers.

[0230] Based on the completed upper and lower adjacent layers, complete the fourth structural layer.

[0231] The method for obtaining a balanced profile provided in this application first obtains a structural profile including an upper structural layer and a lower structural layer. The upper structural layer includes a first structural layer and a second structural layer. The first structural layer is projected onto multiple points of the second structural layer, and the projected first structural layer is flattened to obtain a balanced profile of the first structural layer. Then, based on the length of the balanced profile of the first structural layer and the trend of the lower structural layer, a balanced profile of the structural profile is obtained, thus realizing the acquisition of a balanced profile based on the structural profile. This method can sequentially process the upper and lower structural layers with different stratigraphic structures in the structural profile to obtain a balanced profile of the structural profile. Compared with the prior art method of treating complex structural patterns as single-layer structures, this method can improve the accuracy of the obtained balanced profile.

[0232] It should be noted that the equilibrium profile acquisition device provided in the above embodiments is only illustrated by the division of the above functional modules. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the equilibrium profile acquisition device and the equilibrium profile acquisition method embodiments provided in the above embodiments belong to the same concept, and their specific implementation process can be found in the method embodiments, which will not be repeated here.

[0233] Figure 22 This is a structural block diagram of a computer device 2200 provided in an embodiment of this application. Typically, the computer device 2200 includes a processor 2201 and a memory 2202.

[0234] Processor 2201 may include one or more processing cores, such as a quad-core processor, an octa-core processor, etc. Processor 2201 may be implemented using at least one hardware form selected from DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), and PLA (Programmable Logic Array). Processor 2201 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, processor 2201 may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content to be displayed on the screen. In some embodiments, processor 2201 may also include an AI (Artificial Intelligence) processor, which is used to handle computational operations related to machine learning.

[0235] The memory 2202 may include one or more computer-readable storage media, which may be non-transitory. The memory 2202 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments, the non-transitory computer-readable storage media in the memory 2202 is used to store at least one instruction, which is executed by the processor 2201 to implement the method for obtaining the balanced profile provided in the method embodiments of this application.

[0236] In some embodiments, the computer device 2200 may also optionally include: a peripheral device interface 2203 and at least one peripheral device. The processor 2201, memory 2202, and peripheral device interface 2203 can be connected via a bus or signal line. Each peripheral device can be connected to the peripheral device interface 2203 via a bus, signal line, or circuit board. Specifically, the peripheral device includes at least one of: a radio frequency circuit 2204, a touch display screen 2205, a camera 2206, an audio circuit 2207, a positioning component 2208, and a power supply 2209.

[0237] Those skilled in the art will understand that Figure 22 The structure shown does not constitute a limitation on computer device 2200 and may include more or fewer components than shown, or combine certain components, or use different component arrangements.

[0238] In some embodiments, a computer-readable storage medium is also provided, which stores a computer program that, when executed by a processor, implements the steps of the method for obtaining the balanced profile in the above embodiments. For example, the computer-readable storage medium may be a ROM, RAM, CD-ROM, magnetic tape, floppy disk, or optical data storage device.

[0239] It is worth noting that the computer-readable storage medium mentioned in the embodiments of this application can be a non-volatile storage medium, in other words, it can be a non-transient storage medium.

[0240] It should be understood that all or part of the steps of the above embodiments can be implemented by software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented wholly or partially in the form of a computer program product. The computer program product includes one or more computer instructions. The computer instructions can be stored in the above-described computer-readable storage medium.

[0241] That is, in some embodiments, a computer program product containing instructions is also provided, which, when run on a computer, causes the computer to perform the steps of the method for obtaining the equilibrium profile described above.

[0242] It should be noted that the information (including but not limited to user device information, user personal information, etc.), data (including but not limited to data used for analysis, data stored, data displayed, etc.) and signals involved in the embodiments of this application are all authorized by the user or fully authorized by all parties, and the collection, use and processing of related data must comply with the relevant laws, regulations and standards of the relevant countries and regions.

[0243] It should be understood that "at least one" as mentioned herein refers to one or more, and "multiple" refers to two or more. In the description of the embodiments of this application, unless otherwise stated, " / " means "or," for example, A / B can mean A or B; "and / or" in this document is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. In addition, in order to clearly describe the technical solutions of the embodiments of this application, the terms "first," "second," etc., are used in the embodiments of this application to distinguish identical or similar items with substantially the same function and effect. Those skilled in the art will understand that the terms "first," "second," etc., do not limit the quantity or execution order, and the terms "first," "second," etc., are not necessarily different.

[0244] The above descriptions are embodiments provided in this application and are not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for obtaining a balanced profile, characterized in that, The method includes: Obtain a structural profile, the structural profile including an upper structural layer and a lower structural layer, wherein the lower structural layer is located below the upper structural layer, and the upper structural layer includes a first structural layer and a second structural layer, the second structural layer being located below the first structural layer; Multiple sites of the second construction layer are obtained, and each of the multiple sites of the second construction layer is projected onto the first construction layer to obtain the projected first construction layer. The first structural layer after projection is flattened to obtain the equilibrium profile of the first structural layer. Based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer, the equilibrium profile of the structural profile is obtained. The plurality of sites includes a plurality of breakpoints and a plurality of layer sites in the second structural layer. Projecting each of the plurality of sites in the second structural layer onto the first structural layer to obtain the projected first structural layer includes: Each breakpoint of the second construction layer is vertically projected onto the first construction layer to obtain the first construction layer after breakpoint projection. Each layer point of the second structural layer is vertically projected onto the first structural layer after the breakpoint projection to obtain the first structural layer after the layer point projection. The lower structural layer includes a fourth structural layer. The process of obtaining the structural profile based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer includes: In response to the fact that the fourth structural layer is an incomplete layer, the fourth structural layer is completed to obtain the completed fourth structural layer; Based on the completed fourth structural layer, determine the trend line of the fourth structural layer; Based on the length of the equilibrium profile of the first structural layer and the trend line of the fourth structural layer, the equilibrium profile of the structure is obtained. The process of obtaining the equilibrium profile of the structural section based on the length of the structural section of the first structural layer and the trend of the lower structural layer includes: In response to the fourth structural layer being a complete layer, a trend line for the fourth structural layer is determined; The equilibrium profile of the structure is obtained based on the length of the equilibrium profile of the first structural layer and the trend line of the fourth structural layer.

2. The method for obtaining the equilibrium profile as described in claim 1, characterized in that, The step of flattening the projected first structural layer to obtain a balanced profile of the first structural layer includes: The first structural layer after the breakpoints are projected is flattened, and based on the position of each breakpoint in the flattened first structural layer, the trend line of the fault located below the first structural layer is determined. The first structural layer after the layer points are projected is flattened, and the trend line of the second structural layer is determined based on the position of each layer point in the flattened first structural layer. The length of the flattened first structural layer is equal to the length of the first structural layer before flattening, and the area of ​​the flattened first structural layer is equal to the area of ​​the first structural layer before flattening.

3. The method for obtaining the equilibrium profile as described in claim 2, characterized in that, The upper structural layer further includes a third structural layer, which is located below the second structural layer, and the method further includes: Based on the true thickness of the second structural layer and the positions of multiple layer points of the second structural layer on the trend line of the second structural layer, the multiple simulated layer points of the third structural layer are determined; Based on multiple simulated layer sites of the third structural layer, the trend line of the third structural layer is determined.

4. The method for obtaining the equilibrium profile as described in claim 1, characterized in that, The process of obtaining the structural profile includes: An initial profile is obtained, the initial profile including an eroded first structural layer, wherein a partially intact first structural layer exists in the eroded first structural layer; Based on the true thickness of the complete first structural layer in the initial profile and the trend of each layer in the initial profile, the eroded first structural layer is completed to obtain the structural profile.

5. The method for obtaining the equilibrium profile as described in claim 1, characterized in that, The completion of the fourth structural layer includes: In response to the existence of a complete structural layer in the upper and lower adjacent layers of the fourth structural layer, the trend and true thickness of the complete structural layer are determined. Based on the trend and true thickness of the complete structural layer, the fourth structural layer is completed.

6. The method for obtaining the equilibrium profile as described in claim 1, characterized in that, The completion of the fourth structural layer includes: In response to the absence of a complete structural layer in the upper and lower adjacent layers of the fourth structural layer, the upper and lower adjacent layers of the fourth structural layer are completed to obtain the completed upper and lower adjacent layers. Based on the completed upper and lower adjacent layers, the fourth structural layer is completed.

7. A device for obtaining a balanced profile, characterized in that, The device includes: An acquisition module is used to acquire a structural profile, the structural profile including an upper structural layer and a lower structural layer, wherein the lower structural layer is located below the upper structural layer, and the upper structural layer includes a first structural layer and a second structural layer, the second structural layer being located below the first structural layer; The projection module is used to acquire multiple sites of the second construction layer and project each of the multiple sites of the second construction layer onto the first construction layer to obtain the first construction layer after projection. A flattening module is used to flatten the projected first structural layer to obtain a balanced profile of the first structural layer. The determining module is used to obtain the equilibrium profile of the structural profile based on the length of the equilibrium profile of the first structural layer and the trend of the lower structural layer. The plurality of sites includes a plurality of breakpoints and a plurality of layer sites in the second structural layer, and the projection module is used for: Each breakpoint of the second construction layer is vertically projected onto the first construction layer to obtain the first construction layer after the breakpoint projection. Each layer point of the second structural layer is vertically projected onto the first structural layer after the breakpoint projection to obtain the first structural layer after the layer point projection. The lower construction layer includes a fourth construction layer, and the determining module is used for: In response to the fact that the fourth structural layer is an incomplete layer, the fourth structural layer is completed to obtain the completed fourth structural layer; Based on the completed fourth structural layer, determine the trend line of the fourth structural layer; Based on the length of the equilibrium profile of the first structural layer and the trend line of the fourth structural layer, the equilibrium profile of the structural section is obtained. The determining module is used for: In response to the fourth structural layer being a complete layer, a trend line for the fourth structural layer is determined. Based on the length of the equilibrium profile of the first structural layer and the trend line of the fourth structural layer, the equilibrium profile of the structural section is obtained.

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