PN junction temperature measurement method and device

Abstract

The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method and device, and relates to the technical field of PN junction temperature measurement. The application provides a PN junction temperature measuring method

Description

Technical Field

[0001] This invention relates to the field of PN junction temperature measurement technology, and specifically to a PN junction temperature measurement method and apparatus. Background Technology

[0002] The voltage across a PN junction has a good linear relationship with temperature, making it suitable as a temperature sensor. For example, connecting a PN junction in series with a suitable fixed resistor can improve the operation of a PN junction temperature sensor, thereby achieving high-precision linearization between the voltage and temperature across the PN junction. Another example is utilizing the characteristic of the PN junction's forward voltage changing with temperature to measure the chip junction temperature; a PN junction array can then be used to obtain the chip junction temperature and heat distribution in real time.

[0003] However, the forward voltage drop of a PN junction is related to both the current flowing through the PN junction and the junction temperature. Under different current and junction temperature conditions, the voltage across the PN junction will also be different. Currently, if the method of PN junction temperature measurement only utilizes the linear relationship between the PN junction voltage and temperature, a temperature reference value needs to be calibrated in advance, which is a rather cumbersome process. Therefore, some technologies are researching PN junction temperature measurement methods that do not require calibration of the PN junction voltage reference value.

[0004] However, existing PN junction temperature measurement methods that do not require calibration of the PN junction voltage reference value treat the ideal factor as a constant when using the PN junction for temperature measurement. In reality, the ideal factor of a PN junction changes inversely with temperature; that is, the ideal factor of the PN junction varies under different temperature conditions. This temperature measurement method, which treats the ideal factor as a constant, will have a large measurement error and cannot achieve accurate temperature measurement of the PN junction. Summary of the Invention

[0005] Technical problems to be solved

[0006] To address the aforementioned shortcomings of existing technologies, this invention provides a PN junction temperature measurement method and apparatus. This technology takes into account the variation of the ideal factor with temperature, eliminates the influence of ideal factor variation on temperature detection, and achieves high accuracy in PN junction temperature measurement.

[0007] Technical solution

[0008] To achieve the above objectives, the present invention provides the following technical solution:

[0009] In a first aspect, the present invention provides a method for measuring the temperature of a PN junction, the method comprising the following steps:

[0010] S1. Obtain the voltage drop curve of the PN junction under test versus temperature under different test currents;

[0011] S2. Obtain the detection current that makes the intercept of the relationship curve zero;

[0012] S3. Calculate the ideality factor of the PN junction to be measured based on the detected current;

[0013] S4. Set the current flowing through the PN junction to be measured as the detection current, and calculate the temperature of the PN junction to be measured based on the ideal factor, the measured tube voltage drop, and the proportional relationship between the detection current and the current.

[0014] Preferably, the relationship curve is:

[0015]

[0016] Where A represents nV T The slope of the linear curve as a function of temperature; b represents nV. T The y-intercept of the linear relationship between temperature and temperature; T is the thermodynamic temperature; n represents the ideality factor of the PN junction to be measured; ΔV F The represents the PN junction voltage difference under different test current conditions; m represents the proportional relationship between different test currents.

[0017] Preferably, the number of detected currents is two or four.

[0018] Preferably, when the number of detected currents is two, step S3 includes:

[0019] according to Calculate the detection current I respectively. b1 and I b2 The ideality factor n of the PN junction under the given conditions is determined, and the average value of n is taken as the ideality factor of the PN junction under the temperature to be measured; where k is the Boltzmann constant and q is the fundamental charge constant.

[0020] Preferably, when the number of detected currents is four, step S3 includes:

[0021] according to Calculate the detection current I b1 and I b2 The ideality factor curve n1 of the PN junction under the given conditions, and the detection current I. b3 and I b4 The ideal factor curve n2 of the PN junction under the given conditions is obtained, and the value n, where n1 and n2 are equal, is selected as the ideal factor for the temperature measurement of the PN junction.

[0022] Preferably, when the number of detected currents is two, step S4 includes:

[0023] according to Calculate the current factor m, and then substitute the current factor m and the ideality factor n of the PN junction to be measured obtained in step S3 into the formula. In the process, the temperature of the PN junction to be measured is determined, where I b1 and I b2 These are different detection currents flowing through the PN junction to be measured.

[0024] Preferably, when the number of detected currents is four, step S4 includes:

[0025] according to and Find the current multiples m1 and m2; where I b1 I b2 I b3 I b4 The detection current flowing through the PN junction to be measured;

[0026] Measure the given detection current I b1 I b2 I b3 I b4 When current flows through the PN junction to be measured, the corresponding forward PN junction voltage V is... F1 V F2 V F3 V F4 According to ΔV F1 =V F1 -V F2 and ΔV F2 =V F3 -V F4 Calculate the PN junction voltage difference ΔV under this detection condition. F1 and ΔV F2 ;

[0027] according to and Find the junction temperatures T1 and T2 of the PN junction;

[0028] according to Determine the junction temperature of the PN junction.

[0029] Secondly, the present invention also provides a PN junction temperature measuring device, the device comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the method described above.

[0030] Beneficial effects

[0031] This invention provides a PN junction temperature measurement technique. It obtains the voltage drop versus temperature curve of the PN junction under different test current conditions; then, it acquires a detection current that makes the intercept of this curve zero; next, it calculates the ideal factor of the PN junction based on this detection current; finally, it sets the current flowing through the PN junction as the aforementioned detection current, and calculates the temperature of the PN junction based on the calculated ideal factor and the proportional relationship between the detection current and the ideal factor. This invention considers the variation of the ideal factor with temperature. By finding a special detection condition that makes the intercept of the voltage drop versus temperature curve of the PN junction zero, it eliminates the influence of ideal factor variation on temperature detection, resulting in small PN junction temperature measurement error and high accuracy. Attached Figure Description

[0032] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are merely some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without any creative effort.

[0033] Figure 1 This is a flowchart of a PN junction temperature measurement method provided in an embodiment of the present invention;

[0034] Figure 2 This is a circuit diagram corresponding to the PN junction temperature measurement method under two voltage-controlled current source test conditions in one embodiment of the present invention;

[0035] Figure 3 This is a circuit diagram corresponding to the PN junction temperature measurement method under four voltage-controlled current source test conditions in one embodiment of the present invention;

[0036] Figure 4 This is a circuit diagram corresponding to the PN junction temperature measurement method under three voltage-controlled current source test conditions in one embodiment of the present invention;

[0037] Figure 5 This invention verifies the ideality factor of the PN junction under different test conditions provided in the experiment.

[0038] Figure 6 This is a comparison of the junction temperature calculation errors of the two methods provided in the verification experiment of this invention. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0040] Example 1:

[0041] Firstly, see Figure 1 This invention provides a method for measuring the temperature of a PN junction, comprising the following steps:

[0042] S1. Obtain the voltage drop curve of the PN junction under test versus temperature under different test currents;

[0043] S2. Obtain the detection current that makes the intercept of the relationship curve zero;

[0044] S3. Calculate the ideality factor of the PN junction to be measured based on the detected current;

[0045] S4. Set the current flowing through the PN junction to be measured as the detection current, and calculate the temperature of the PN junction to be measured based on the ideal factor, the measured tube voltage drop, and the proportional relationship between the detection current and the current.

[0046] As can be seen, the PN junction temperature measurement method provided in this embodiment obtains the relationship curve between the voltage drop and temperature of the PN junction under different test current conditions; then, it obtains the detection current that makes the intercept of the relationship curve zero; next, it calculates the ideal factor of the PN junction under test based on the detection current; finally, it sets the current flowing through the PN junction under test as the above-mentioned detection current, and calculates the temperature of the PN junction under test based on the calculated ideal factor and the proportional relationship between the detection current. This method considers the factor of ideal factor variation with temperature, and by finding a special detection condition that makes the intercept of the relationship curve between the voltage drop and temperature of the PN junction under test zero, it eliminates the influence of ideal factor variation on temperature detection, resulting in small PN junction temperature measurement error and high accuracy.

[0047] The following is in conjunction with the appendix Figure 1-6 The following section provides a detailed explanation of the implementation process of a PN junction temperature measurement method in this embodiment, along with the specific steps of S1-S4.

[0048] S1. Obtain the voltage drop curve of the PN junction under test versus temperature under different test currents.

[0049] Since the reverse saturation current of a PN junction is highly dependent on temperature, its magnitude varies under different temperature conditions. To eliminate the influence of the reverse saturation current on the PN junction temperature, this embodiment selects different test currents flowing through the PN junction under the same temperature conditions and obtains the relationship curves between the voltage drop and temperature of the PN junction under test under different test current conditions. These curves can eliminate the influence of the reverse saturation current on the PN junction temperature.

[0050] The relationship between the forward voltage drop of a PN junction and the current flowing through the PN junction is shown in equation (1):

[0051]

[0052] In equation (1), Indicates thermal voltage; I b I represents the actual current flowing through the diode. so V is the reverse saturation current; k is the Boltzmann constant; q is the fundamental charge constant; n is the ideality factor; V F is the forward voltage of the PN junction; T is the thermodynamic temperature.

[0053] And because of V F >>V T Therefore, equation (1) can be simplified to equation (2):

[0054]

[0055] Because of I so It is highly dependent on temperature; under different temperature conditions, I so The sizes are different. Two detection currents I are used. b1 and I b2 Temperature detection can eliminate I so The influence of [the temperature]. Under a fixed temperature condition, given a current I flowing through the PN junction. b1 and I b2 The forward voltage of the PN junction is measured to be V. F1 and V F2 Assuming that the ideality factor of the PN junction does not change significantly under these two current conditions, then nV T It can be obtained from equation (3):

[0056]

[0057] Pressure drop of the tube The temperature calculation formula of the PN junction can be obtained by equation (3), as shown in equation (4). This method eliminates the influence of reverse saturation current.

[0058] Although this method is independent of the reverse saturation current, it treats the ideal factor of the PN junction as a constant for measurement. In reality, the ideal factor of the PN junction changes inversely with temperature, and the ideal factor also varies when the current flowing through the PN junction is inconsistent. Therefore, the temperature measurement method that treats the ideal factor as a constant has a large measurement error. Combining equation (3), and... It can be seen that, under a known temperature condition, the formula for calculating the ideality factor of a PN junction is shown in equation (5).

[0059]

[0060]

[0061] Since the voltage across the PN junction decreases linearly with temperature, equation (3) is a linear relationship, which can be rewritten as equation (6), where A is nV. T The slope of the linear curve as a function of temperature, where b is nV. T The intercept of the straight line changing with temperature on the y-axis. Then, the ideality factor is obtained using equation (6) as shown in equation (7). Where, k is the Boltzmann constant; q is the elementary charge constant; and T is the thermodynamic temperature.

[0062]

[0063]

[0064] Equation (6) is the curve showing the relationship between the voltage drop of the PN junction under different test currents and the temperature. Equation (7) is the formula showing the relationship between the ideal factor n and the temperature T.

[0065] S2. Obtain the detection current that makes the intercept of the relationship curve zero.

[0066] As can be seen from equation (7) above, the ideal factor n is obtained by adding a constant term and a term that is inversely proportional to temperature. Therefore, the ideal factor n can show an increasing trend, a decreasing trend, or a constant trend with temperature. The trend and speed of the ideal factor n changing with temperature depend on the sign and magnitude of the intercept b. When the intercept b is positive, n shows an inverse decreasing trend with temperature; when the intercept b is negative, n shows an inverse increasing trend with temperature; when the intercept b is 0, n is a fixed number. The closer the intercept b is to 0, the smaller the change of n with temperature, approximately a fixed number. Based on this rule, a special detection condition is sought to make the intercept b 0, keeping n a fixed constant, eliminating the influence of the ideal factor changing with temperature, and improving the accuracy of temperature measurement. However, the condition of intercept b being 0 is relatively harsh, and it is not easy to find a temperature measurement condition where the intercept is completely zero. Therefore, a method for temperature measurement using two cases, intercept greater than 0 and intercept less than 0, is proposed. For the same PN junction, selecting two sets of test conditions with opposite trends in the ideal factor and similar magnitudes for temperature measurement, and calculating the average of the two measurement results, can eliminate the influence of the ideal factor, thereby achieving higher temperature measurement accuracy.

[0067] To keep the ideality factor n a constant, it is necessary to obtain the voltage drop curve of the PN junction under test versus temperature under different test currents according to equation (6). The detection current with an intercept b equal to 0 is obtained.

[0068] Specifically, if PN junction temperature measurement is performed based on two current source excitations, then there are two detection currents, I. b1 and I b2 Of course, to make the temperature measurement results more accurate, the temperature measurement conditions more flexible, and the applicability wider, it is also possible to choose to perform PN junction temperature measurement based on four current source excitation. In this case, the detection currents are four detection currents with opposite signs (opposite signs refer to opposite signs of the intercepts b, i.e., one set of intercepts b>0, and the other set of intercepts b<0): I b1 I b2 I b3 I b4 , among which, I b1 and I b2 As a group, I b3 and I b4 This is another group. More specifically, if two of the four detected currents are equal (assuming the equal currents are denoted as I),... b1 If the current source is insufficient, a PN junction temperature measurement method based on three current source excitation can be used. In this case, there are three detection currents, namely I... b1 I b2 I b3 .

[0069] S3. Calculate the ideal factor of the PN junction to be measured based on the detected current.

[0070] After obtaining the detection current, it can be based on... Determine the ideality factor n of the PN junction under different detection current conditions. Specifically:

[0071] When there are two detected currents, I... b1 and I b2 At that time, according to Calculate the detection current I b1 and I b2 The average value n of the ideality factor of the PN junction under the given conditions;

[0072] When there are four detected currents, namely I b1 I b2 I b3 I b4 At that time, according to Calculate the detection current I b1 and I b2 The ideality factor curve n1 of the PN junction under the given conditions, and the detection current I. b3 and I b4 The ideal factor curve of the PN junction under the condition n2. Under these two conditions, the ideal factors n1 and n2 show opposite trends with temperature. The value n, where n1 and n2 are equal, is selected as the ideal factor value for the PN junction temperature measurement.

[0073] When the detected current is three, namely I b1 I b2 I b3 When the ideal factor is calculated, the method for solving the ideal factor is similar to that when the detection current is four.

[0074] S4. Set the current flowing through the PN junction to be measured as the detection current, and calculate the temperature of the PN junction to be measured based on the ideal factor, the measured tube voltage drop, and the proportional relationship between the detection current and the current.

[0075] After obtaining the ideal factor of the PN junction to be measured according to step S3, the test current is set to the current flowing through the PN junction to be measured, and then according to equation (4). Determine the temperature of the PN junction to be measured. Specifically:

[0076] When the given detection current I b1 and I b2 When the current flowing through the PN junction to be measured is according to Find the current multiple m, and then substitute the current multiple m and the ideal factor value n of the PN junction to be measured obtained in step S3 into equation (4). In the process, the temperature of the PN junction to be measured is determined;

[0077] When the given detection current I b1 I b2 I b3 I b4 When the current flowing through the PN junction to be measured is according to and Calculate the current multiples m1 and m2, and simultaneously measure the given detection current I. b1 I b2 I b3 I b4 When current flows through the PN junction to be measured, the corresponding forward PN junction voltage V is... F1 V F2 V F3 V F4 According to ΔV F1 =V F1 -V F2 and ΔV F2 =V F3 -V F4 Calculate the PN junction voltage difference ΔV under this detection condition. F1 and ΔV F2 ,according to and Calculate the junction temperatures T1 and T2 of the PN junction; finally, based on... Determine the junction temperature of the PN junction;

[0078] Specifically, if two of the four detected currents are equal, let's assume the equal currents are I. b1 According to and Calculate the current multiples m1 and m2, and simultaneously measure the given detection current I. b1 I b2 I b3 When current flows through the PN junction to be measured, the corresponding forward PN junction voltage V is... F1 V F2 V F3 According to ΔV F1 =V F1 -V F2 and ΔV F2 =V F3 -V F4 Calculate the PN junction voltage difference ΔV under this detection condition. F1 and ΔV F2 ,according to and Calculate the junction temperatures T1 and T2 of the PN junction; finally, based on... Determine the junction temperature of the PN junction.

[0079] To facilitate understanding, the circuit diagrams and specific temperature measurement steps for PN junction temperature measurement methods based on two-current-source, four-current-source, and three-current-source excitation are introduced below.

[0080] 1) PN junction temperature measurement method based on two current source excitation:

[0081] The circuit diagram of the PN junction temperature measurement method based on two current source excitation is as follows: Figure 2 As shown, the circuit includes two voltage-controlled current sources I. b1 and I b2 The system consists of two sample-and-hold circuits (S / H1 and S / H2), an adder, and a temperature calculation module T. Two voltage-controlled current sources are connected to the temperature-sensing PN junction via a switching circuit and then grounded (the circuit connection treats the cathode of the PN junction as ground for easier measurement of its forward voltage). The switching circuit is controlled by a clock CLK. A lead from the junction between the switching circuit and the PN junction is connected to one end of the sample-and-hold circuits S / H1 and S / H2, and the other end of S / H1 and S / H2 is connected to the first adder. The output ΔV of the first adder... F The temperature T is calculated by connecting to temperature calculation module 1. When the two detection currents flowing through the PN junction cause the intercept b to be 0, the PN junction temperature measurement method based on two current source excitation is used. The specific steps of the PN junction temperature measurement method based on two current source excitation are as follows:

[0082] Step 1: Select the PN junction to be used for temperature measurement, and obtain the relationship curve between the PN junction voltage drop and temperature under different test currents.

[0083] Step 2: According to The detection current I with an intercept b almost equal to 0 was obtained. b1 and I b2 ;

[0084] Step 3: According to Calculate the detection current I b1 and I b2 The average value n of the ideality factor of the PN junction under the given conditions;

[0085] Step 4: Place I b1 and I b2 Set as the temperature detection current of the PN junction, according to Calculate the current multiple m, and simultaneously set the ideal factor obtained in Step 3 as the ideal factor for junction temperature detection of the PN junction; and set the detection current flowing through the PN junction to I. b1 and I b2 Measure the corresponding forward voltage V of the PN junction. F1 and V F2 According to ΔV F=V F1 -V F2 The magnitude of the detection current is I. b1 and I b2 PN junction voltage difference ΔV under detection conditions F ,according to Determine the temperature.

[0086] 2) PN junction temperature measurement method based on four current source excitation:

[0087] The circuit diagram of the PN junction temperature measurement method based on four current source excitation is shown below. Figure 3 As shown, the circuit includes four voltage-controlled current sources, four sample-and-hold circuits, two adders, and three temperature calculation modules. The four voltage-controlled current sources are connected to the temperature-sensing PN junction via a switching circuit and then grounded. The switching circuit is controlled by a clock CLK. Leads from the junction between the switching circuit and the PN junction are connected to one end of the sample-and-hold circuits S / H1, S / H2, S / H3, and S / H4. The other ends of S / H1 and S / H2 are connected to the first adder, and the other ends of S / H3 and S / H4 are connected to the second adder. The output ΔV of the first adder... F1 The temperature T1 is calculated by connecting to temperature calculation module 1, and the output ΔV of the second adder is... F2 Temperature T2 is calculated by connecting to temperature calculation module 2. Temperature calculation modules 1 and 2 are connected to temperature calculation module 3 to calculate the average temperature Tm. When the four detection currents flowing through the PN junction cause the intercept b to be either greater than 0 or less than 0, a PN junction temperature measurement method based on four current source excitation is used. The specific steps of the PN junction temperature measurement method based on four current source excitation are as follows:

[0088] Step 1: Select the PN junction to be used for temperature measurement, and obtain the relationship curve between the PN junction voltage drop and temperature under different test currents.

[0089] Step 2: According to The detection currents Ib1, Ib2, Ib3, and Ib4 with intercepts close to 0 and opposite signs are obtained. Ib1 and Ib2 are set as one group, and Ib3 and Ib4 are set as another group.

[0090] Step 3: According to Find the ideal factor curve n1 of the PN junction under the detection currents Ib1 and Ib2, and the ideal factor curve n2 of the PN junction under the detection currents Ib3 and Ib4. Since the ideal factors n1 and n2 show opposite trends with temperature under these two conditions, select the value n, where n1 and n2 are equal, as the ideal factor value for the PN junction temperature measurement.

[0091] Step 4: Set Ib1, Ib2, Ib3, and Ib4 as the temperature detection currents for this PN junction, according to... and Calculate the current multiples m1 and m2, and set the ideal factor obtained in Step 3 as the ideal factor for measuring the junction temperature of the PN junction.

[0092] Then, the detection currents flowing through the PN junction are set to Ib1, Ib2, Ib3, and Ib4, and the corresponding forward PN junction voltage V is measured. F1 V F2 V F3 V F4 According to ΔV F1 =V F1 -V F2 and ΔV F2 =V F3 -V F4 Calculate the PN junction voltage difference ΔV under this detection condition. F1 and ΔV F2 , according to and Find the junction temperatures T1 and T2 of the PN junction;

[0093] according to Determine the junction temperature of the PN junction.

[0094] 3) PN junction temperature measurement method based on three current source excitation

[0095] The three-current-source excited PN junction temperature measurement method is a special case of the four-current-source excited PN junction temperature measurement method. When two of the four detection currents are of equal magnitude, the four voltage-controlled current sources can be reduced to three voltage-controlled current sources, resulting in the circuit diagram of the three-current-source excited PN junction temperature measurement method, as shown below. Figure 4 As shown. The PN junction temperature measurement method based on three current source excitation is basically the same in principle as the PN junction temperature measurement method based on four current source excitation, except that two of the current sources are replaced with one current source of equal magnitude. The three detection currents flowing through the PN junction cause the intercept b to have two cases: a value greater than 0 and a value less than 0. The PN junction temperature measurement method based on three current source excitation is used.

[0096] Assume that two of the four detected currents are equal, and let the equal currents be I. b1 Then, using the PN junction temperature measurement method based on three current source excitation, according to... and Calculate the current multiples m1 and m2. The steps of the PN junction temperature measurement method based on three current source excitation are exactly the same as those of the PN junction temperature measurement method based on four current source excitation, and will not be repeated here.

[0097] To verify that the junction temperature measurement method proposed in this embodiment has a small measurement error and high accuracy, we conducted the following experiments.

[0098] Using the method proposed in this embodiment, a PN junction for temperature measurement is selected, and the relationship between the ideality factor of the PN junction and temperature is obtained under different test current conditions, as follows: Figure 5 As shown, the ideal factor n calculated under test currents of 22mA and 46mA is close to 1.19 and remains almost constant. The ideal factor n1 calculated under test currents of 10mA and 46mA shows an increasing trend with temperature, while the ideal factor n2 calculated under test currents of 10mA and 59mA shows a decreasing trend with temperature. The equal value of n is 1.15, which is used as the ideal factor for junction temperature measurement of the PN junction under these two test conditions. After determining the test conditions, the temperature error obtained by measuring the junction temperature using Method 1 (two detection currents: 10mA and 59mA test conditions) and Method 2 (three detection currents: 22mA and 46mA test conditions, 10mA and 46mA test conditions) is compared. Figure 6 As shown, the junction temperature calculation error is less than 2%, indicating that the junction temperature measurement error of this method is small and the accuracy is high.

[0099] Example 2:

[0100] Secondly, the present invention also provides a PN junction temperature measuring device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the above-described method, mainly including:

[0101] S1. Obtain the voltage drop curve of the PN junction under test versus temperature under different test currents;

[0102] S2. Obtain the detection current that makes the intercept of the relationship curve zero;

[0103] S3. Calculate the ideality factor of the PN junction to be measured based on the detected current;

[0104] S4. Set the current flowing through the PN junction to be measured as the detection current, and calculate the temperature of the PN junction to be measured based on the ideal factor, the measured tube voltage drop, and the proportional relationship between the detection current and the current.

[0105] Optionally, the relationship curve is:

[0106]

[0107] Where A represents nV T The slope of the linear curve as a function of temperature; b represents nV. TThe y-intercept of the linear relationship between temperature and temperature; T is the thermodynamic temperature; n represents the ideality factor of the PN junction to be measured; ΔV F represents the tube voltage drop; m represents the proportional relationship between different test currents.

[0108] Optionally, the number of detected currents is two or four.

[0109] Optionally, when the number of detected currents is two, step S3 includes:

[0110] according to Calculate the detection current I respectively. b1 and I b2 The ideality factor n of the PN junction under the given conditions is determined, and the average value of n is taken as the ideality factor of the PN junction under the temperature to be measured; where k is the Boltzmann constant and q is the fundamental charge constant.

[0111] Optionally, when the number of detected currents is four, step S3 includes:

[0112] according to Calculate the detection current I b1 and I b2 The ideality factor curve n1 of the PN junction under the given conditions, and the detection current I. b3 and I b4 The ideal factor curve n2 of the PN junction under the given conditions is obtained, and the value n, where n1 and n2 are equal, is selected as the ideal factor for the temperature measurement of the PN junction.

[0113] Optionally, when the number of detected currents is two, step S4 includes:

[0114] according to Calculate the current factor m, and then substitute the current factor m and the ideality factor n of the PN junction to be measured obtained in step S3 into the formula. In the process, the temperature of the PN junction to be measured is determined, where I b1 and I b2 These are different detection currents flowing through the PN junction to be measured.

[0115] Optionally, when the number of detected currents is four, step S4 includes:

[0116] according to and Find the current multiples m1 and m2; where I b1 I b2 I b3 I b4 The detection current flowing through the PN junction to be measured;

[0117] Measure the given detection current I b1 Ib2 I b3 I b4 When current flows through the PN junction to be measured, the corresponding forward PN junction voltage V is... F1 V F2 V F3 V F4 According to ΔV F1 =V F1 -V F2 and ΔV F2 =V F3 -V F4 Calculate the PN junction voltage difference ΔV under this detection condition. F1 and ΔV F2 ;

[0118] according to and Find the junction temperatures T1 and T2 of the PN junction;

[0119] according to Determine the junction temperature of the PN junction.

[0120] It is understood that the PN junction temperature measuring device provided in the embodiments of the present invention corresponds to the above-described PN junction temperature measuring method. The explanations, examples, and beneficial effects of the relevant content can be referred to the corresponding content in the PN junction temperature measuring method, and will not be repeated here.

[0121] In summary, compared with the prior art, the advantages of the present invention are as follows:

[0122] 1. This invention provides a PN junction temperature measurement technique. Under different test current conditions, the relationship curve between the voltage drop and temperature of the PN junction under test is obtained. Then, a detection current is acquired that makes the intercept of this relationship curve zero. Next, the ideal factor of the PN junction under test is calculated based on this detection current. Finally, the current flowing through the PN junction under test is set as the aforementioned detection current, and the temperature of the PN junction under test is calculated based on the calculated ideal factor and the proportional relationship between the detection currents. This invention considers the variation of the ideal factor with temperature. By finding a special detection condition that makes the intercept of the voltage drop versus temperature relationship curve of the PN junction under test zero, the influence of ideal factor variation on temperature detection is eliminated, resulting in small PN junction temperature measurement error and high accuracy.

[0123] 2. The PN junction temperature measurement technology proposed in this invention uses different detection currents to detect temperature, which can eliminate the influence of reverse saturation current on PN junction temperature measurement and improve the accuracy of PN junction temperature measurement.

[0124] 3. In this invention, the method of selecting different detection currents for the PN junction detection current to eliminate the influence of ideal factor changes on temperature measurement is simple.

[0125] 4. This invention proposes PN junction temperature measurement methods based on two-current-source excitation, three-current-source excitation, and four-current-source excitation. The method can be flexibly selected according to the actual situation. It can be used not only as a single method but also as multiple methods simultaneously. It has high measurement accuracy and wide applicability.

[0126] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions will not cause the essence of the corresponding technical solutions to deviate from the protection scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for measuring the temperature of a PN junction, characterized in that, The method includes: S1. Obtain the voltage drop curve of the PN junction under test versus temperature under different test currents; S2. Obtain the detection current that makes the intercept of the relationship curve zero; S3. Calculate the ideality factor of the PN junction to be measured based on the detected current; S4. Set the current flowing through the PN junction to be measured as the detection current, and calculate the temperature of the PN junction to be measured based on the ideal factor, the measured tube voltage drop, and the proportional relationship between the detection current and the current.

2. The PN junction temperature measurement method according to claim 1, characterized in that, The relationship curve is as follows: Where A represents nV T The slope of the linear curve as a function of temperature; b represents nV. T The y-intercept of the linear relationship between temperature and temperature; T is the thermodynamic temperature; n represents the ideality factor of the PN junction to be measured; ΔV F represents the tube voltage drop; m represents the proportional relationship between different test currents.

3. The PN junction temperature measurement method according to claim 1, characterized in that, The number of detected currents is two or four.

4. The PN junction temperature measurement method according to claim 3, characterized in that, When the number of detected currents is two, step S3 includes: according to Calculate the detection current I respectively. b1 and I b2 The ideality factor n of the PN junction under the given conditions is determined, and the average value of n is taken as the ideality factor of the PN junction under the temperature to be measured; where k is the Boltzmann constant and q is the fundamental charge constant.

5. The PN junction temperature measurement method according to claim 3, characterized in that, When the number of detected currents is four, step S3 includes: according to Calculate the detection current I b1 and I b2 The ideality factor curve n1 of the PN junction under the given conditions, and the detection current I. b3 and I b4 The ideal factor curve n2 of the PN junction under the given conditions is obtained, and the value n, where n1 and n2 are equal, is selected as the ideal factor for the temperature measurement of the PN junction.

6. The PN junction temperature measurement method according to claim 3, characterized in that, When the number of detected currents is two, step S4 includes: according to Calculate the current factor m, and then substitute the current factor m and the ideality factor n of the PN junction to be measured obtained in step S3 into the formula. In the process, the temperature of the PN junction to be measured is determined, where I b1 and I b2 These are different detection currents flowing through the PN junction to be measured.

7. The PN junction temperature measurement method according to claim 3, characterized in that, When the number of detected currents is four, step S4 includes: according to and Find the current multiples m1 and m2; where I b1 I b2 I b3 I b4 The detection current flowing through the PN junction to be measured; Measure the given detection current I b1 I b2 I b3 I b4 When current flows through the PN junction to be measured, the corresponding forward PN junction voltage V is... F1 V F2 V F3 V F4 According to ΔV F1 =V F1 -V F2 and ΔV F2 =V F3 -V F4 Calculate the PN junction voltage difference ΔV under this detection condition. F1 and ΔV F2 ; according to and Find the junction temperatures T1 and T2 of the PN junction; according to Determine the junction temperature of the PN junction.

8. A PN junction temperature measuring device, the device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that the processor, when executing the computer program, implements the steps of the method according to any one of claims 1 to 7.

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