A multi-motor multi-detection station variable control method and system

Abstract

The application relates to the technical field of automatic equipment control, in particular to a multi-motor multi-detection-station variable control method, system and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: obtaining a target test task, and determining test flow information according to the target test task; determining function configuration information of a variable test station in a test system according to the test flow information; setting motor control constraint conditions of motor equipment in the test system according to the function configuration information, wherein the motor control constraint conditions comprise stroke ranges of the motor equipment; and configuring the test system based on the function configuration information and the motor control constraint conditions, so as to complete the target test task. The method can improve the flexibility of test equipment and the reuse rate of the equipment.

Description

Technical Field

[0001] This application relates to the field of automated equipment control technology, and in particular to a variable control method, system, device, computer equipment, storage medium, and computer program product for multiple actuators and multiple detection stations. Background Technology

[0002] A multi-functional test line is a device used for testing and inspecting electronic products. It can perform various tests and inspections on the production line, including electrical testing, functional testing, and reliability testing. These tests check the performance, quality, and reliability of electronic products, ensuring they meet relevant standards and requirements. A multi-functional test line typically includes testing instruments, test fixtures, and testing software, enabling rapid and accurate testing and diagnosis of various electronic products, such as mobile phones, tablets, televisions, and audio equipment. This equipment can significantly improve production efficiency and product quality, reducing product defects and quality problems.

[0003] The design and manufacture of multi-functional test lines require consideration of various factors, such as testing accuracy, speed, and reliability, the degree of automation, and the adaptability and flexibility of the testing. Because different electronic products have different testing requirements, multi-functional test lines need to be customized and adjusted according to specific products.

[0004] In related technologies, in the three-mover multi-functional test line system of the automation field, there are usually three different test functions on a single line device. The three-mover is used to schedule and transport the data, so that the entire line can operate smoothly.

[0005] However, the current control methods for three- or multi-motor testing equipment have the following technical problems:

[0006] In fixed production line equipment, different modules follow fixed testing functions, and the cost of equipment adjustment and testing is too high, which greatly reduces the flexibility of the testing equipment. Summary of the Invention

[0007] Therefore, it is necessary to provide a variable control method, system, device, computer equipment, computer-readable storage medium, and computer program product for multiple moving parts and multiple detection stations that can improve the flexibility and reusability of testing equipment, addressing the aforementioned technical problems.

[0008] In a first aspect, this application provides a variable control method for multiple moving parts and multiple detection stations. The method is applied to a multi-functional testing system equipped with multiple moving parts, and includes:

[0009] Obtain the target test task, and determine the test process information based on the target test task;

[0010] Determine the functional configuration information of the variable test station in the test system based on the test process information;

[0011] Based on the functional configuration information, set the motion control constraints for the moving parts in the test system, including the travel range of each moving part;

[0012] Configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task.

[0013] In one embodiment, the step of determining the functional configuration information of the variable test station in the test system based on the test process information includes:

[0014] Obtain test system information associated with the test system.

[0015] The test system information includes the preset relationship between the test station and its corresponding moving part.

[0016] In one embodiment, determining the functional configuration information of the variable test station in the test system based on the test process information includes:

[0017] Based on the test process information, the efficiency of the work steps to complete the corresponding test functions is determined, and the module workstation capacity is determined according to the work step efficiency, wherein the module workstation capacity includes test workstations that complete the same test functions.

[0018] Based on the module station capacity, the functional configuration information of the variable test station is obtained to update the preset relationship between the test station and its corresponding moving device.

[0019] In one embodiment, the test station further includes a fixed test station with unchanged testing functions, and the step of obtaining the functional configuration information of the variable test station based on the module station capacity includes:

[0020] Determine the testing functions of the adjacent fixed testing stations of the variable testing station;

[0021] Based on the module station capacity of the adjacent fixed test stations, the function configuration of the variable test station is completed, and the updated function configuration information of the variable test station is obtained.

[0022] In one embodiment, setting the motion control constraints of the motion device in the test system according to the functional configuration information includes:

[0023] Obtain the functional configuration information of the fixed test station;

[0024] Adjust the motion control constraints of the motion devices in the testing system according to the functional configuration information of the variable test station and the fixed test station.

[0025] In one embodiment, fixed test stations with the same testing function are located in the same test area, and variable test stations with the same initial testing function are located in the same test area.

[0026] The testing system has one or more testing areas consisting of the variable testing stations, and the testing areas having the same testing function include one or more of the variable testing stations.

[0027] In one embodiment, when the test area requiring reconfiguration of test functions is composed of multiple variable test stations, the step of adjusting the motion control constraints of the moving parts in the test system based on the function configuration information of the variable test stations and the fixed test stations includes:

[0028] Select the target variable test station based on the function configuration information of the variable test station and the number of variable test stations in the test area that need to be reconfigured for test functions.

[0029] The corresponding moving parts are matched and set for the target variable test station in order to adjust the moving part control constraints of the corresponding moving parts in the test system.

[0030] Secondly, this application also provides a variable control device for multiple moving parts and multiple detection stations. Applied to a multi-functional testing system equipped with multiple moving parts, the device includes:

[0031] The test task parsing module is used to obtain the target test task and determine the test process information based on the target test task;

[0032] The function configuration information module is used to determine the function configuration information of the variable test station in the test system based on the test process information.

[0033] The actuator control constraint module is used to set actuator control constraint conditions for the actuators in the test system according to the functional configuration information. The actuator control constraint conditions include the travel range of each actuator.

[0034] The test system configuration module is used to configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task.

[0035] In one embodiment, prior to the function configuration information module, the following is also included:

[0036] The test system information module is used to acquire test system information associated with the test system, wherein the test system information includes a preset relationship between the test station and its corresponding moving part.

[0037] In one embodiment, the function configuration information module includes:

[0038] The module workstation capacity module is used to determine the efficiency of the work steps to complete the corresponding test functions based on the test process information, so as to determine the module workstation capacity according to the work step efficiency, wherein the module workstation capacity includes test workstations that complete the same test functions.

[0039] The mapping relationship configuration module is used to obtain the functional configuration information of the variable test station based on the module station capacity, so as to update the preset relationship between the test station and its corresponding moving device.

[0040] In one embodiment, the test station further includes a fixed test station with unchanged testing functions, and the mapping relationship configuration module includes:

[0041] The test function module is used to determine the test functions of adjacent fixed test stations of the variable test station;

[0042] The variable workstation function module is used to complete the function configuration of the variable test station based on the module workstation capacity of the adjacent fixed test station, and obtain the updated function configuration information of the variable test station.

[0043] In one embodiment, the mover control constraint module includes:

[0044] The fixed workstation function module is used to obtain the function configuration information of the fixed test workstation;

[0045] The constraint adjustment module is used to adjust the motion control constraints of the moving parts in the testing system according to the functional configuration information of the variable test station and the fixed test station.

[0046] In one embodiment, fixed test stations with the same testing function are located in the same test area, and variable test stations with the same initial testing function are located in the same test area.

[0047] The testing system has one or more testing areas consisting of the variable testing stations, and the testing areas having the same testing function include one or more of the variable testing stations.

[0048] In one embodiment, when the test area requiring reconfiguration of test functions consists of multiple variable test stations, the constraint adjustment module includes:

[0049] The target variable station module is used to select a target variable test station based on the functional configuration information of the variable test station and the number of variable test stations in the test area that needs to be reconfigured for test functions.

[0050] The target mover constraint adjustment module is used to match and set the corresponding mover device for the target variable test station, so as to adjust the mover control constraint conditions of the corresponding mover device in the test system.

[0051] Thirdly, this application also provides a multi-moving, multi-detection station variable control system, the system comprising:

[0052] The feeding platform is used to store and supply the product to be tested to the target testing equipment;

[0053] A test station is provided to accommodate and perform preset test steps on the product under test. Multiple test stations are provided, and each test station implements different test functions based on functional configuration information.

[0054] A moving device is used to schedule and transfer the product under test so that the product under test can move within and between the test stations; multiple moving devices are provided.

[0055] A feeding platform, which is used to collect and process the products to be tested after completing the target testing process;

[0056] A control device is signal-connected to the loading platform, the testing station, the moving part equipment, and the unloading platform. The control device is used to control the multi-moving part multi-detection station variable control system based on a multi-moving part multi-detection station variable control method as described in any one of the first aspects.

[0057] Fourthly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps of a multi-moving, multi-detection station variable control method as described in any embodiment of the first aspect.

[0058] Fifthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, implements the steps of a multi-mover, multi-detection station variable control method as described in any embodiment of the first aspect.

[0059] Sixthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, implements the steps of a multi-mover, multi-detection station variable control method as described in any embodiment of the first aspect.

[0060] The aforementioned variable control method, apparatus, computer equipment, storage medium, and computer program product for multiple moving parts and multiple detection stations, derived through the technical features described in the proprietary patent, can achieve the following beneficial effects to address the technical problems in the background art:

[0061] This embodiment presents a variable control method for multiple moving parts and multiple detection stations. The method mainly includes acquiring a target test task, determining test process information based on the target test task, configuring the test stations in the target test equipment according to the test process information, thereby setting the test functions of different test stations. Simultaneously, it configures the module station capacity for different test stations based on their functions. After the functional parameters and capacity of the test stations are configured, a change in the test function of the intermediate test station (either changing to the function of an adjacent test station or canceling the test station) causes the moving parts in the intermediate position to be reconfigured, changing their corresponding pick-and-place station and thus their operating range. Therefore, the moving part control constraints, i.e., the operating range of the moving parts, can be determined by the test station capacity corresponding to the test stations in different steps. Finally, based on the above adaptive configuration information for the target test process, variable control of the target test equipment is achieved. In implementation, compared with conventional techniques, the solution provided in this application improves the reusability of the test equipment, allowing technicians to configure test functions and equipment functions according to actual usage needs, thus increasing the flexibility of the test equipment. Attached Figure Description

[0062] Figure 1 This is a schematic diagram of the system structure of a variable control system with multiple movers and multiple detection stations in one embodiment;

[0063] Figure 2 This is a schematic diagram of the first process of a variable control method for multiple movers and multiple detection stations in one embodiment;

[0064] Figure 3 This is a schematic diagram of the second process of a variable control method for multiple movers and multiple detection stations in another embodiment;

[0065] Figure 4 This is a schematic diagram of the third process of a variable control method for multiple moving parts and multiple detection stations in another embodiment;

[0066] Figure 5This is a schematic diagram of the fourth process of a variable control method for multiple movers and multiple detection stations in another embodiment;

[0067] Figure 6 This is a schematic diagram of the fifth process of a variable control method for multiple moving parts and multiple detection stations in another embodiment;

[0068] Figure 7 This is a schematic diagram of the sixth process of a variable control method for multiple movers and multiple detection stations in another embodiment;

[0069] Figure 8 This is a structural block diagram of a multi-motion, multi-detection station testing system in a specific embodiment;

[0070] Figure 9 This is a structural block diagram of a multi-mover, multi-detection station variable control device in one embodiment;

[0071] Figure 10 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0072] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0073] In related technologies, in the three-mover multi-functional test line system of the automation field, there are usually three different test functions on a single line device. The three-mover is used to schedule and transport the data, so that the entire line can operate smoothly.

[0074] However, the current control methods for three- or multi-motor testing equipment have the following technical problems:

[0075] In fixed production line equipment, different modules follow fixed testing functions, and the cost of equipment adjustment and testing is too high, which greatly reduces the flexibility of the testing equipment.

[0076] Based on this, the variable control method for multiple movers and multiple detection stations provided in this application embodiment can be applied to, for example... Figure 1 The application environment shown. For example... Figure 1 As shown in this embodiment Figure 1 The diagram illustrates a variable control system with multiple moving parts and multiple detection stations, comprising: a loading platform 102, a testing station 104, a moving part device 106, a unloading platform 108, and a control device 1010, wherein:

[0077] The feeding platform 102 is used to store and supply the products to be tested to the target testing equipment;

[0078] Test station 104 is used to accommodate and perform preset test steps on the product under test. Test station 104 is provided in multiple ways and implements different test functions based on functional configuration information.

[0079] The moving device 106 is used to schedule and transfer the product under test so that the product under test can move within and between the test stations. Multiple moving devices 106 are provided.

[0080] The unloading platform 108 is used to collect and process the products to be tested after the target testing process has been completed;

[0081] The control device 1010 is signal-connected to the loading platform 102, the testing station 104, the moving device 106, and the unloading platform 108. The control device 1010 is used to realize the control of the multi-moving-multi-detection-station variable control system.

[0082] The control device 1010 can be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, portable wearable devices, and servers. IoT devices can include smart speakers, smart TVs, smart air conditioners, and smart in-vehicle devices. Portable wearable devices can include smartwatches, smart bracelets, and head-mounted devices. Servers can be implemented using independent servers or server clusters composed of multiple servers.

[0083] In one embodiment, such as Figure 2 As shown, a variable control method for multiple moving parts and multiple detection stations is provided, which is applied to... Figure 1 Taking the control device in the middle as an example, the following steps are included:

[0084] Step 202: Obtain the target test task and determine the test process information based on the target test task.

[0085] The target test task can refer to the data used to describe the requirements of the test task, which may include test object information, test process information, test requirement information, test standard information, etc.

[0086] For example, the control device can acquire a target test task after obtaining sufficient authorization and permission. Subsequently, the control device can parse the target test task to determine the test procedure information required by the current test task. At this point, using the test procedure information, the control device can determine the test items that need to be performed on the product under test and the sequence of test procedures.

[0087] Step 204: Determine the functional configuration information of the variable test station in the test system based on the test process information.

[0088] The functional configuration information refers to the parameter configuration information of the test equipment that needs to be completed in advance when testing the target test equipment. For example, the position parameters, attitude parameters, and test signal parameters of the test equipment.

[0089] For example, the control device can determine the functional configuration information of the variable test station in the test system based on the test process information, thereby adjusting the test station to a state that can meet the test requirements.

[0090] Step 206: Set the motion control constraints of the motion devices in the test system according to the functional configuration information. The motion control constraints include the travel range of each motion device.

[0091] Among them, the mover control constraint can refer to the spatial range used to constrain the motion space of the mover device. The mover control constraint can be used to constrain all degrees of freedom of the mover device, such as joint position, actuator position, etc.

[0092] For example, the control device can set the motion control constraints of the motion devices in the test system according to the functional configuration information, and the motion control constraints include the travel range of each motion device.

[0093] Step 208: Configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task.

[0094] For example, the control device can configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task.

[0095] In the above-mentioned variable control method for multiple moving parts and multiple detection stations, by combining the technical features in the embodiments and making reasonable derivations, the following beneficial effects can be achieved in solving the technical problems raised in the background art:

[0096] This embodiment presents a variable control method for multiple moving parts and multiple detection stations. The method mainly includes acquiring a target test task, determining test process information based on the target test task, configuring the test stations in the target test equipment according to the test process information, thereby setting the test functions of different test stations. Simultaneously, it configures the module station capacity for different test stations based on their functions. After the functional parameters and capacity of the test stations are configured, a change in the test function of the intermediate test station (either changing to the function of an adjacent test station or canceling the test station) causes the moving parts in the intermediate position to be reconfigured, changing their corresponding pick-and-place station and thus their operating range. Therefore, the moving part control constraints, i.e., the operating range of the moving parts, can be determined by the test station capacity corresponding to the test stations in different steps. Finally, based on the above adaptive configuration information for the target test process, variable control of the target test equipment is achieved. In implementation, compared with conventional techniques, the solution provided in this application improves the reusability of the test equipment, allowing technicians to configure test functions and equipment functions according to actual usage needs, thus increasing the flexibility of the test equipment.

[0097] In one embodiment, such as Figure 3 As shown, before step 204, the following steps are also included:

[0098] Step 302: Obtain test system information associated with the test system.

[0099] The test system information includes the preset relationship between the test station and its corresponding moving part.

[0100] In one embodiment, such as Figure 4 As shown, step 204 includes:

[0101] Step 402: Determine the efficiency of the work steps to complete the corresponding test functions based on the test process information, and determine the module workstation capacity according to the work step efficiency, wherein the module workstation capacity includes test workstations that complete the same test functions.

[0102] Among them, the efficiency relationship of the test steps can refer to the proportional relationship between the time required for different test steps.

[0103] For example, the control device can determine different capacity configuration ratios for the test stations based on the efficiency relationship of the test steps. For instance, when the efficiency relationship between two test steps is 1:2, meaning that the time it takes for one step to complete the test of one product under test is sufficient for the other step to complete the test of two products, the capacity configuration ratio can be set to 2:1, thereby achieving stability in the scheduling of products under test.

[0104] Step 404: Obtain the functional configuration information of the variable test station based on the module station capacity, so as to update the preset relationship between the test station and its corresponding moving device.

[0105] Among them, the module station capacity can refer to the capacity of different stations to accommodate products under test, such as the quantity and weight of products under test.

[0106] For example, the control device can determine the module station capacity of different test stations based on the functional configuration information of the test stations. Specifically, the mapping relationship between the function of the test station and the module station capacity can be configured based on the efficiency of the test process or based on the hardware parameters of the test equipment.

[0107] In one embodiment, the test station also includes a fixed test station with unchanged test functions, such as... Figure 5 As shown, step 404 includes:

[0108] Step 502: Determine the testing functions of the adjacent fixed test stations of the variable test station.

[0109] Step 504: Based on the module station capacity of the adjacent fixed test stations, complete the functional configuration of the variable test station to obtain the updated functional configuration information of the variable test station.

[0110] In one embodiment, such as Figure 6 As shown, step 206 includes:

[0111] Step 602: Obtain the functional configuration information of the fixed test station.

[0112] Step 604: Adjust the motion control constraints of the moving parts in the testing system according to the functional configuration information of the variable test station and the fixed test station.

[0113] In one embodiment, fixed test stations with the same testing function are located in the same test area in the testing system, and variable test stations with the same initial testing function are located in the same test area; the testing system has one or more test areas composed of the variable test stations, and the test areas with the same testing function include one or more of the variable test stations.

[0114] In one embodiment, when the test area requiring reconfiguration of test functions consists of multiple variable test stations, it can be as follows: Figure 7 As shown, step 604 includes:

[0115] Step 702: Select the target variable test station based on the function configuration information of the variable test station and the number of variable test stations in the test area that need to be reconfigured.

[0116] Step 704: Match and set the corresponding moving device for the target variable test station to adjust the moving device control constraints of the corresponding moving device in the test system.

[0117] In one specific embodiment, the test system can be illustrated by an example comprising three moving devices. The structural block diagram of the test system can be as follows: Figure 8 As shown, it includes a loading platform, three testing platforms (A1, A2, A3) for type A testing, two testing platforms (variable stations B1, B2) for type B testing, three testing platforms (C1, C2, C3) for type C testing, a unloading platform, and three moving devices (X1, X2, X3).

[0118] For example, the mover X3 can perform two types of actions, while the movers X1 and X2 can perform one type of action. For instance, if B1 is selected as type B test and B2 is selected as type B test, the mover X1 picks up the material from the loading platform and places it on the type A test platform. After test A is completed, X2 picks up the product that has completed test A and places it on the type B test platform. After test B is completed, X3 picks up the product that has completed test B and places it on the type C test platform. After test C is completed, X3 picks up the product and places it on the unloading platform. At this time, the actual travel of the mover X1 is from loading to test platform A3, the actual travel of the mover X2 is from test platform A1 to test platform B2, and the actual travel of the mover X3 is from test platform B1 to unloading platform.

[0119] For example, movers X1, X2, and X3 can each be responsible for a type of action. For instance, if B1 and B2 are both selected for test type A, the flow of the movers will change. Mover X1 picks up the material from the loading platform and places it on the test type A platform. After test A is completed, X2 picks up the product that has completed test A and places it on the test type C platform. After test type C is completed, X3 picks up the product that has completed test type C and places it on the unloading platform. The travel of the three movers becomes: the actual travel of mover X1 is from loading to test platform B2, the actual travel of mover X2 is from test platform A1 to test platform C3, and the actual travel of mover X3 is from test platform C1 to unloading platform.

[0120] For example, there may be idle test stations in the testing system, such as B1 and B2, which are not used. At this time, the flow of the movers will change. Mover X1 picks up the material from the loading platform and puts it into test platform A. After test A is completed, X2 picks up the product that has completed test A and puts it into test platform C. After test platform C is completed, X3 picks up the product that has completed test C and puts it into the unloading platform. The stroke of the three movers becomes that the actual stroke of mover X1 is from loading to test platform A3, the actual stroke of mover X2 is from test platform A1 to test platform C3, and the actual stroke of mover X3 is from test platform C1 to unloading platform.

[0121] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0122] Based on the same inventive concept, this application also provides a multi-mover multi-detection station variable control device for implementing the multi-mover multi-detection station variable control method described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations of one or more embodiments of the multi-mover multi-detection station variable control device provided below can be found in the limitations of the multi-mover multi-detection station variable control method described above, and will not be repeated here.

[0123] In one embodiment, such as Figure 9 As shown, a variable control device with multiple movers and multiple detection stations is provided, including: a test task parsing module, a function configuration information module, a mover control constraint module, and a test system configuration module, wherein:

[0124] The test task parsing module is used to obtain the target test task and determine the test process information based on the target test task;

[0125] The function configuration information module is used to determine the function configuration information of the variable test station in the test system based on the test process information.

[0126] The actuator control constraint module is used to set actuator control constraint conditions for the actuators in the test system according to the functional configuration information. The actuator control constraint conditions include the travel range of each actuator.

[0127] The test system configuration module is used to configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task.

[0128] In one embodiment, prior to the function configuration information module, the following is also included:

[0129] The test system information module is used to acquire test system information associated with the test system, wherein the test system information includes a preset relationship between the test station and its corresponding moving part.

[0130] In one embodiment, the function configuration information module includes:

[0131] The module workstation capacity module is used to determine the efficiency of the work steps to complete the corresponding test functions based on the test process information, so as to determine the module workstation capacity according to the work step efficiency, wherein the module workstation capacity includes test workstations that complete the same test functions.

[0132] The mapping relationship configuration module is used to obtain the functional configuration information of the variable test station based on the module station capacity, so as to update the preset relationship between the test station and its corresponding moving device.

[0133] In one embodiment, the test station further includes a fixed test station with unchanged testing functions, and the mapping relationship configuration module includes:

[0134] The test function module is used to determine the test functions of adjacent fixed test stations of the variable test station;

[0135] The variable workstation function module is used to complete the function configuration of the variable test station based on the module workstation capacity of the adjacent fixed test station, and obtain the updated function configuration information of the variable test station.

[0136] In one embodiment, the mover control constraint module includes:

[0137] The fixed workstation function module is used to obtain the function configuration information of the fixed test workstation;

[0138] The constraint adjustment module is used to adjust the motion control constraints of the moving parts in the test system according to the functional configuration information of the variable test station and the fixed test station.

[0139] In one embodiment, fixed test stations with the same testing function are located in the same test area, and variable test stations with the same initial testing function are located in the same test area.

[0140] The testing system has one or more testing areas consisting of the variable testing stations, and the testing areas having the same testing function include one or more of the variable testing stations.

[0141] In one embodiment, when the test area requiring reconfiguration of test functions consists of multiple variable test stations, the constraint adjustment module includes:

[0142] The target variable station module is used to select a target variable test station based on the functional configuration information of the variable test station and the number of variable test stations in the test area that needs to be reconfigured for test functions.

[0143] The target mover constraint adjustment module is used to match and set the corresponding mover device for the target variable test station, so as to adjust the mover control constraint conditions of the corresponding mover device in the test system.

[0144] The various modules in the aforementioned multi-movement, multi-detection, variable control device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the corresponding operations of each module.

[0145] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 10As shown, the computer device includes a processor, memory, input / output interface, communication interface, display unit, and input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interface. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The input / output interface is used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it implements a multi-motion, multi-detection station variable control method. The display unit is used to form a visually visible image and can be a display screen, projection device, or virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0146] Those skilled in the art will understand that Figure 10 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0147] In one embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0148] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0149] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0150] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data shall comply with the relevant laws, regulations and standards of the relevant countries and regions.

[0151] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0152] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0153] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A variable control method for multiple moving parts and multiple detection stations, applied to a multifunctional testing system equipped with multiple moving parts, characterized in that, The method includes: Obtain the target test task, and determine the test process information based on the target test task; Determine the functional configuration information of the variable test station in the test system based on the test process information; Based on the functional configuration information, set the motion control constraints for the moving parts in the test system, including the travel range of each moving part; Configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task; The step of determining the functional configuration information of the variable test station in the test system based on the test process information includes, prior to: Obtain test system information associated with the test system; The test system information includes the preset relationship between the test station and its corresponding moving part; The step of determining the functional configuration information of the variable test station in the test system based on the test process information includes: Based on the test process information, the efficiency of the work steps to complete the corresponding test functions is determined, and the module workstation capacity is determined according to the work step efficiency, wherein the module workstation capacity includes test workstations that complete the same test functions. The functional configuration information of the variable test station is obtained based on the module station capacity, so as to update the preset relationship between the test station and its corresponding moving device; The test station also includes a fixed test station with unchanged testing functions. The process of obtaining the functional configuration information of the variable test station based on the module station capacity includes: Determine the testing functions of the adjacent fixed testing stations of the variable testing station; Based on the module station capacity of the adjacent fixed test stations, the function configuration of the variable test station is completed, and the updated function configuration information of the variable test station is obtained.

2. The method according to claim 1, characterized in that, The step of setting the actuator control constraints of the actuator in the test system according to the functional configuration information includes: Obtain the functional configuration information of the fixed test station; Adjust the motion control constraints of the moving parts in the testing system based on the functional configuration information of the variable test station and the fixed test station.

3. The method according to claim 2, characterized in that, The fixed test stations with the same testing function in the testing system are located in the same testing area, and the variable test stations with the same initial testing function are located in the same testing area. The testing system has one or more testing areas consisting of the variable testing stations, and the testing areas having the same testing function include one or more of the variable testing stations.

4. The method according to claim 3, wherein the test area requiring reconfiguration of test functions is composed of multiple variable test stations, characterized in that, The step of adjusting the motion control constraints of the moving parts in the testing system based on the functional configuration information of the variable test station and the fixed test station includes: Select the target variable test station based on the function configuration information of the variable test station and the number of variable test stations in the test area that need to be reconfigured for test functions. The corresponding moving parts are matched and set for the target variable test station in order to adjust the moving part control constraints of the corresponding moving parts in the test system.

5. A variable control device with multiple actuators and multiple detection stations, characterized in that, The device is applied to a multi-functional testing system equipped with multiple moving parts, and includes: The test task parsing module is used to obtain the target test task and determine the test process information based on the target test task; The function configuration information module is used to determine the function configuration information of the variable test station in the test system based on the test process information. The actuator control constraint module is used to set actuator control constraint conditions for the actuators in the test system according to the functional configuration information. The actuator control constraint conditions include the travel range of each actuator. The test system configuration module is used to configure the test system based on the functional configuration information and the actuator control constraints to complete the target test task. Before the functional configuration information module, it also includes: The test system information module is used to acquire test system information associated with the test system, wherein the test system information includes a preset relationship between the test station and its corresponding moving part. The functional configuration information module includes: The module workstation capacity module is used to determine the efficiency of the work steps to complete the corresponding test functions based on the test process information, so as to determine the module workstation capacity according to the work step efficiency, wherein the module workstation capacity includes test workstations that complete the same test functions. The mapping relationship configuration module is used to obtain the functional configuration information of the variable test station according to the module station capacity, so as to update the preset relationship between the test station and its corresponding moving device; The test station also includes a fixed test station with unchanged testing functions. The mapping relationship configuration module includes: The test function module is used to determine the test functions of adjacent fixed test stations of the variable test station; The variable workstation function module is used to complete the function configuration of the variable test station based on the module workstation capacity of the adjacent fixed test station, and obtain the updated function configuration information of the variable test station.

6. A variable control system with multiple moving parts and multiple detection stations, characterized in that, The system includes: The feeding platform is used to store and supply the product to be tested to the target testing equipment; A test station is provided to accommodate and perform preset test steps on the product under test. Multiple test stations are provided, and each test station implements different test functions based on functional configuration information. A moving device is used to schedule and transfer the product under test so that the product under test can move within and between the test stations; multiple moving devices are provided. A feeding platform, which is used to collect and process the products to be tested after completing the target testing process; A control device is provided, which is signal-connected to the loading platform, the testing station, the moving part, and the unloading platform. The control device is used to control the multi-moving part and multi-detection station variable control system based on a multi-moving part and multi-detection station variable control method as described in any one of claims 1 to 4.

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