A probe coaxiality testing device and testing method

Abstract

A kind of probe coaxiality testing device and testing method, in the testing device, first through hole of positioning table is provided with N positioning lugs in the radial direction and is inwardly convex, N positioning lugs form a positioning hole coaxial with first through hole, probe is installed in positioning hole through intermediate part, the outer diameter of the upper cylindrical part of probe is greater than the aperture of positioning hole but less than the aperture of first through hole, one of positioning lugs is provided with a through hole along third direction, locking positioning push one end is fixed on moving table, the other end passes through the through hole along third direction and pushes the intermediate part of probe inwardly and abuts against remaining N-1 positioning lugs;First posture collection and second posture collection move to first posture position and second posture position on second slide rail and collect posture to probe in opposite direction.This probe coaxiality testing device and testing method provided by the application make that probe positioning installation is accurate, and test is smooth, precision is high, and more improve entire production efficiency.

Description

Technical Field

[0001] This invention relates to the field of coaxiality testing technology, and in particular to a probe coaxiality testing device and testing method. Background Technology

[0002] Currently, nitrogen oxide sensors and oxygen sensors used in the automotive testing industry are precision parts. The components of their probes need to meet coaxial accuracy requirements after assembly. Therefore, accurate testing is required to prevent deviations and ensure product quality.

[0003] Coaxiality is the positioning tolerance. The theoretically correct position is the reference axis. Coaxiality testing is to test whether the degree of coincidence between the measured axis and the reference axis meets the accuracy requirements. The coaxiality of the probe of the nitrogen-oxygen sensor mentioned above refers to the coaxiality between the central axis of the upper cylindrical part and the central axis of the chip. The coaxiality of the probe of the oxygen sensor mentioned above refers to the coaxiality between the central axis of the nut part and the central axis of the chip. The existing coaxiality detection is done by manual visual inspection or rough measurement with the help of auxiliary tools. The test accuracy is very low and cannot meet the product quality requirements. Summary of the Invention

[0004] In order to overcome the shortcomings of the prior art, the purpose of this invention is to provide a probe coaxiality testing device, which enables precise probe positioning and installation, smooth testing, high accuracy, and improves overall production efficiency.

[0005] On one hand, the present invention provides a probe coaxiality testing device, including a first slide rail, a second slide rail, a moving positioning mechanism, a first posture collecting component, and a second posture collecting component. The first slide rail extends along a first direction; the second slide rail extends along a second direction, which is perpendicular to the first direction. The moving positioning mechanism reciprocates on the first slide rail. The moving positioning mechanism includes a moving stage, a positioning stage, and a locking positioning pusher. Along the second direction, the positioning stage is stacked on the moving stage. The positioning stage and the moving stage are coaxially provided with a first through hole and a second through hole along the second direction. The first through hole has N positioning protrusions radially inwardly protruding, forming a positioning hole coaxial with the first through hole between the N positioning protrusions. The probe is installed in the positioning hole through its middle portion. The outer surface of the upper cylindrical portion of the probe... The diameter is larger than the diameter of the positioning hole but smaller than the diameter of the first through hole. One of the positioning protrusions has a through hole along a third direction. One end of the locking positioning pusher is fixed on the moving platform, and the other end passes through the through hole along the third direction and pushes the middle part of the probe inward to abut against the remaining N-1 positioning protrusions, where N>1, N is a natural number, and the third direction is perpendicular to the first direction and the second direction. The first posture collecting member and the second posture collecting member move towards each other or in opposite directions on the second slide rail to the first posture position and the second posture position. The moving positioning mechanism moves on the first slide rail to the position between the first posture collecting member and the second posture collecting member, and the center lines of the three coincide. The first posture collecting member and the second posture collecting member collect postures from the probe in the first posture position and the second posture position.

[0006] In a preferred embodiment of the present invention, the N positioning protrusions are arranged in a circumferential matrix about the center of the first through hole.

[0007] In a preferred embodiment of the present invention, N=3.

[0008] In a preferred embodiment of the present invention, the locking and positioning pusher includes a nut, a fixing rod, and a push rod. The fixing rod is fixed to the movable platform. The free end of the push rod passes through the through hole to push the probe, and the other end is fixedly connected to the nut. The nut is also threadedly connected to the fixing rod. The rotation of the nut drives the push rod to move along the third direction.

[0009] In a preferred embodiment of the present invention, the mobile stage is equipped with a sensing plate, which is sensed and detected by a slotted photoelectric sensor on the worktable.

[0010] In a preferred embodiment of the present invention, the mobile station is T-shaped.

[0011] In a preferred embodiment of the present invention, the probe coaxiality testing device further includes a material feeding and clamping mechanism, a defective product recycling mechanism, and a qualified product recycling mechanism. The defective product recycling mechanism and the qualified product recycling mechanism are arranged side by side, and the material feeding and clamping mechanism is arranged adjacent to the defective product recycling mechanism and the qualified product recycling mechanism.

[0012] In a preferred embodiment of the present invention, the probe coaxiality testing device further includes a feeding clamping mechanism, which is arranged adjacent to the moving positioning mechanism and is located on both sides of the first track, respectively, from the unloading clamping mechanism.

[0013] On the other hand, the present invention provides a probe coaxiality testing device, including a first slide rail, a second slide rail, a moving positioning mechanism, and a first posture collecting component, wherein the first slide rail extends along a first direction; the second slide rail extends along a second direction, the second direction being perpendicular to the first direction; the moving positioning mechanism moves back and forth on the first slide rail, the moving positioning mechanism including a moving stage, a positioning stage, and a locking positioning pusher, wherein, along the second direction, the positioning stage is stacked on the moving stage, the positioning stage and the moving stage are provided with a coaxial first through hole and a second through hole along the second direction, wherein the first through hole has N positioning protrusions protruding inward in the radial direction, and the N positioning protrusions form a positioning hole coaxial with the first through hole, the probe passes through... The probe is installed in the positioning hole through the middle part, and the nut part of the probe is supported on the positioning platform. One of the positioning protrusions has a through hole along the third direction. One end of the locking positioning pusher is fixed on the moving platform, and the other end passes through the through hole along the third direction and pushes the middle part of the probe inward to abut against the remaining N-1 positioning protrusions, where N>1, N is a natural number, and the third direction is perpendicular to the first direction and the second direction. The first posture collecting component moves back and forth on the second slide rail to the first posture position and the second posture position. The moving positioning mechanism moves on the first slide rail to a position that coincides with the center line of the first posture collecting component. The first posture collecting component collects posture of the probe at the first posture position and the second posture position.

[0014] Furthermore, this invention provides a probe coaxiality testing method, applied in the probe chip electrical performance testing device. The testing method includes: the probe is installed in the positioning hole through the middle part; a locking positioning pusher pushes the middle part of the probe inward along the third direction through the through hole to abut against the remaining N-1 positioning protrusions; the moving positioning mechanism moves on the first slide rail to a position between the first posture collector and the second posture collector, with the center lines of the three coinciding; the first posture collector and the second posture collector collect a first posture of the probe facing each other at the first posture position; the first posture collector and the second posture collector collect a second posture of the probe facing each other at the second posture position; the controller compares the first posture, the second posture, and the pre-stored standard posture; and outputs qualified and unqualified products.

[0015] Compared with the prior art, the beneficial effects of the present invention are as follows: Using the probe coaxiality testing device provided by this invention, the moving positioning mechanism moves back and forth on the first slide rail, enabling the moving positioning mechanism to smoothly move the probe from the loading position to the posture collection position and then to the unloading position. Meanwhile, the first posture collection component and the second posture collection component move towards or away from each other on the second slide rail to the first posture position and the second posture position. The moving positioning mechanism is positioned between the first posture collection component and the second posture collection component, facilitating the acquisition of probe posture data from two directions and different distances for comparative testing, resulting in high accuracy and efficiency. The first through hole of the positioning platform has N positioning protrusions protruding inwards radially. A positioning hole coaxial with the first through hole is formed between the protrusions. The probe is installed in the positioning hole along the second direction through the middle part. The outer diameter of the upper cylindrical part of the probe is larger than the diameter of the positioning hole but smaller than the diameter of the first through hole, so that the first posture collector and the second posture collector can collect the posture of the probe when facing each other. In addition, one of the positioning protrusions has a through hole along the third direction. One end of the locking positioning pusher is fixed to the moving stage, and the other end passes through the through hole along the third direction and pushes the middle part of the probe inward to abut against the remaining N-1 positioning protrusions, so as to lock the probe in the positioning stage, so that the probe is accurately positioned during the test, and further improves the test accuracy.

[0016] The present invention also provides a method for testing probe coaxiality, which is applied in a probe chip electrical performance testing device.

[0017] Other features and advantages of the invention will be set forth in the following description and will be apparent in part from the description or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures and / or processes particularly pointed out in the description, claims, and drawings. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the probe coaxiality testing device provided in an embodiment of the present invention; Figure 2 A schematic diagram of the mobile positioning mechanism provided in an embodiment of the present invention (after the probe is installed); Figure 3 This is a schematic diagram of the positioning stage provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of the structure of the mobile positioning mechanism provided in an embodiment of the present invention; Figure 5 This is a schematic diagram of the locking and positioning pusher provided in an embodiment of the present invention; Figure 6 A schematic diagram of the posture collection device provided in an embodiment of the present invention; Figure 7 This is a schematic diagram of the structure of the nitrogen and oxygen sensor in an embodiment of the present invention; Figure 8 This is a schematic diagram of the oxygen sensor structure in an embodiment of the present invention; Explanation of icon numbers: 100-Probe coaxiality testing device; 10 - First slide rail; 20 - Second slide rail; 30-Moving positioning mechanism, 31-Moving stage, 311-Second through hole, 32-Positioning platform, 32a-Supporting surface, 321-First through hole, 3211-Positioning protrusion, 3211a-Through hole, 3212-Positioning hole, 33-Locking positioning push, 331-Nut, 332-Fixing rod, 333-Push rod, 34-Sensing sheet; 40 - First posture collection items; 50 - Second pose collection items; 60 - Material clamping mechanism; 70 - Non-conforming product recycling organization; 80 - Qualified product recycling organizations; 90-groove type photoelectric sensor; 200 - Nitrogen and oxygen sensor probe, 201 - Middle part, 202 - Upper cylindrical part, 203 - Tail part; 300 - Oxygen sensor probe, 301 - Middle section, 302 - Nut section, 303 - Tail section; Detailed Implementation The following detailed description of the embodiments of the present invention, in conjunction with the accompanying drawings, will provide a thorough understanding of how the present invention uses technical means to solve technical problems and achieve technical effects, enabling its implementation. It should be noted that these specific descriptions are merely intended to facilitate a clearer understanding of the present invention by those skilled in the art, and are not intended to limit the scope of the invention. For example, the terms "first" and "second" mentioned in the embodiments of the present invention are not intended to limit the invention, but are merely used to indicate the sequence numbers of multiple identical or similar devices or mechanisms. Those skilled in the art can readjust these sequence numbers for ease of description or during the organization of technical solutions. Furthermore, alternative solutions are described for some mechanisms in different embodiments, and these alternatives can be applied to other identical or similar devices or mechanisms. As long as there is no conflict, the various embodiments and features in each embodiment of the present invention can be combined with each other, and the resulting technical solutions are all within the protection scope of the present invention.

[0019] The technical solution of the present invention will now be described in detail with reference to the accompanying drawings and specific embodiments: Example See Figures 1-8 This embodiment provides a probe coaxiality testing device 100 for testing the coaxiality between the central axis of the upper cylindrical portion 202 of a nitrogen-oxygen sensor probe 200 and the central axis of the chip. The probe coaxiality testing device 100 includes a first slide rail 10, a second slide rail 20, a moving positioning mechanism 30, a first posture collecting component 40, and a second posture collecting component 50. Specifically: The first slide rail 10 extends along the first direction, and the moving positioning mechanism 30 moves back and forth on the first slide rail 10.

[0020] The second slide rail 20 extends along the second direction, and the first posture collecting member 40 and the second posture collecting member 50 move toward or in opposite directions on the second slide rail 20. The posture collecting member is generally an industrial camera. The second direction is perpendicular to the first direction, so that the two slide rails are set in a coordinated manner and do not interfere with each other.

[0021] See Figures 2-5 The moving positioning mechanism 30 includes a moving platform 31, a positioning platform 32, and a locking positioning pusher 33. The moving positioning mechanism 30 moves back and forth on the first slide rail 10 via the moving platform 31. The positioning platform 32 is stacked on the moving platform 31 along the second direction. The positioning platform 32 and the moving platform 31 are provided with a first through hole 321 and a second through hole 311 coaxially along the second direction. The first through hole 321 has N positioning protrusions 3211 protruding inward in the radial direction. The N positioning protrusions 3211 form a positioning hole 3212 coaxial with the first through hole 321.

[0022] The nitrogen-oxygen sensor probe 200 is installed in the positioning hole 3212 through the cylindrical middle part 201, and its tail extends out through the second through hole 311 along the second direction. The outer diameter of the upper cylindrical part 202 of the nitrogen-oxygen sensor probe 200 is larger than the diameter of the positioning hole 3212 but smaller than the diameter of the first through hole 321. One of the positioning protrusions 3211 has a through hole 3211a along the third direction. One end of the locking positioning pusher 33 is fixed on the moving stage 31, and the other end of the locking positioning pusher 33 pushes the middle part 201 inward along the third direction through the through hole 3211a to abut against the remaining N-1 positioning protrusions 3211, where N>1, N is a natural number, and the third direction is perpendicular to the first and second directions. The specific third direction, first direction, and second direction are as follows: Figure 1 , 2 As shown in Figure 4.

[0023] The first posture collector 40 and the second posture collector 50 can move towards each other or in opposite directions on the second slide rail 20 to the first posture position and the second posture position. The moving positioning mechanism 30 moves on the first slide rail 10 to a position between the first posture collector 40 and the second posture collector 50, and the center lines of the three coincide. The first posture collector 40 and the second posture collector 50 collect postures from the nitrogen and oxygen sensor probe 200 facing each other at the first posture position and the second posture position. The first posture position and the second posture position refer to the posture collectors sliding on the second slide rail 20 to two positions with different distances from the nitrogen and oxygen sensor probe 200.

[0024] Using the aforementioned probe coaxiality testing device 100, the moving positioning mechanism 30 moves back and forth on the first slide rail 10, enabling the moving positioning mechanism 30 to smoothly and linearly move the nitrogen and oxygen sensor probe 200 from the loading position to the posture collection position and then to the unloading position; while the first posture collection component 40 and the second posture collection component 50 move towards or away from each other on the second slide rail 20 to the first posture position and the second posture position, and the moving positioning mechanism 30 is clamped between the first posture collection component 40 and the second posture collection component 50, which facilitates the acquisition of the posture of the nitrogen and oxygen sensor probe 200 from two directions and different distances, resulting in high testing accuracy and efficiency.

[0025] Furthermore, the first through hole 321 of the positioning stage 32 has N positioning protrusions 3211 protruding inward in the radial direction. The N positioning protrusions 3211 form a positioning hole 3212 coaxial with the first through hole 321. The nitrogen-oxygen sensor probe 200 is installed in the positioning hole 3212 along the second direction through the middle part 201. The outer diameter of the upper cylindrical part 202 of the nitrogen-oxygen sensor probe 200 is larger than the diameter of the positioning hole 3212 but smaller than the diameter of the first through hole 321. This allows the first posture collecting member 40 and the second posture collecting member 50 to collect the posture of the nitrogen-oxygen sensor probe 200 when they are facing each other. The posture of the nitrogen-oxygen sensor probe 200 is collected from two directions and different distances for comparison and testing, resulting in high accuracy.

[0026] In addition, one of the positioning protrusions 3211 has a through hole 3211a along the third direction. One end of the locking positioning pusher 33 is fixed on the moving stage 31, and the other end passes through the through hole 3211a along the third direction and pushes the middle part 201 of the nitrogen-oxygen sensor probe 200 inward to abut against the remaining N-1 positioning protrusions 3211, so as to lock the nitrogen-oxygen sensor probe 200 in the positioning stage 32, so that the nitrogen-oxygen sensor probe 200 is accurately positioned during the test, and further improves the test accuracy.

[0027] In this embodiment, N positioning protrusions 3211 are arranged in a circumferential matrix around the center of the first through hole 321. As shown above, the nitrogen and oxygen sensor probe 200 is installed in the positioning hole 3212 through the middle part 201 along the second direction. The outer peripheral wall of the middle part 201 is evenly abutted and locked with the N positioning protrusions 3211 in the circumferential direction, so that the positioning accuracy of the nitrogen and oxygen sensor probe 200 is higher.

[0028] Furthermore, the N positioning protrusions 3211 abut against the outer peripheral wall of the middle part 201 in the circumferential direction through their flat end faces, ensuring stable contact, preventing slippage, and providing a good locking effect.

[0029] In this embodiment, the first through hole 321 of the positioning platform 32 is further provided with three positioning protrusions 3211 protruding inward in the radial direction, so that the outer peripheral wall of the middle part 201 is evenly abutted and locked with the three positioning protrusions 3211 in the circumferential direction, which conforms to the principle of the most stable triangle, making the positioning of the nitrogen and oxygen sensor probe 200 more stable.

[0030] See Figure 5The locking and positioning pusher 33 includes a nut 331, a fixing rod 332, and a pusher 333. The fixing rod 332 is fixed on the moving platform 31. The free end of the pusher 333 passes through the through hole 3211a to push the nitrogen and oxygen sensor probe 200. The other end is fixedly connected to the nut 331. The nut 331 is also threadedly connected to the fixing rod 332. By rotating the nut 331 and the fixing rod 332, the pusher 333 is driven to move in a third direction. With the above configuration, the locking and positioning pusher 33 can quickly push the middle part 201 of the nitrogen and oxygen sensor probe 200 inward through the through hole 3211a in a third direction to abut and lock with the remaining N-1 positioning protrusions 3211. The operation is efficient and effective.

[0031] Furthermore, the free end of the push rod 333 pushes the middle part 201 of the nitrogen and oxygen sensor probe 200 to abut and lock with the remaining N-1 positioning protrusions 3211 through the end face set as a plane. The abutment is stable, avoids slippage, and has a good locking effect.

[0032] See figure Figure 2 and Figure 4 The edge of the moving stage 31 is provided with a sensing plate 34. The sensing plate 34 is sensed by the slotted photoelectric sensor 90 on the worktable and can detect that the moving stage 31 has reached the loading position and can proceed to the next process. It moves on the first track 10 to the posture collection position and then to the unloading position.

[0033] In this embodiment, the moving platform 31 is T-shaped. The T-shaped structure is cleverly designed to facilitate the sliding of the moving platform 31 on the first track 10, while simultaneously supporting the positioning platform 32 and being fixedly connected to the locking positioning pusher 33. The entire structure is well-coordinated and has high structural strength.

[0034] In this embodiment, the probe coaxiality testing device 100 further includes a feeding and clamping mechanism 60, a defective product recycling mechanism 70, and a qualified product recycling mechanism 80. The defective product recycling mechanism 70 and the qualified product recycling mechanism 80 are arranged side by side, and the feeding and clamping mechanism 60 is arranged adjacent to the defective product recycling mechanism 70 and the qualified product recycling mechanism 80. The feeding and clamping mechanism 60 can be a robotic arm clamping mechanism, whose clamping part is driven by a motor and can move along the xyz axis to quickly transport the tested products to the corresponding defective product recycling mechanism 70 and the qualified product recycling mechanism 80. Generally, the defective product recycling mechanism 70 is a long and narrow tray structure, and the qualified product recycling mechanism 80 is a square tray structure. The specific structure is not limited.

[0035] Furthermore, the probe coaxiality testing device 100 also includes a feeding and gripping mechanism, which can be a robotic gripping mechanism. The feeding and gripping mechanism is arranged adjacent to the moving positioning mechanism 30 and is located on both sides of the first slide rail 10, respectively, along with the unloading gripping mechanism 60. With the above structure, combined with the moving positioning mechanism 30 moving back and forth on the first slide rail 10, it can move linearly from the feeding position to the posture collection position and then to the unloading position, making the feeding and unloading smooth and efficient.

[0036] In addition, this embodiment also provides a testing method applied to the above-mentioned probe coaxiality testing device 100, the testing method including: The nitrogen and oxygen sensor probe 200 is installed in the positioning hole 3212 through the columnar middle part 201; The locking and positioning pusher 33 pushes the middle part 201 of the nitrogen and oxygen sensor probe 200 inward along the third direction through the through hole 3211a and abuts against the remaining N-1 positioning protrusions 3211. At this time, the nitrogen and oxygen sensor probe 200 is locked. The mobile positioning mechanism 30 moves on the first slide rail 10 to a position between the first posture collecting member 40 and the second posture collecting member 50, with the center lines of the three coinciding. The first posture collector 40 and the second posture collector 50 move on the second slide rail 20 to the first posture position and collect the first posture from the nitrogen and oxygen sensor probe 200 facing each other at the first posture position. The first posture collector 40 and the second posture collector 50 move on the second slide rail 20 to the second posture position and collect the second posture from the nitrogen and oxygen sensor probe 200 facing each other at the second posture position. The controller compares the collected first posture, second posture and pre-stored standard posture, and classifies the tested nitrogen and oxygen sensor probes 200 into qualified products and unqualified products according to the matching results. For example, a posture matching tolerance within ±0.01mm is considered a qualified product. The system outputs the corresponding qualified and unqualified products.

[0037] For the coaxiality test between the central axis of the nut portion 302 of the oxygen sensor probe 300 and the central axis of the chip, the aforementioned probe coaxiality test device 100 is still used, except that the second posture collecting component 50 is not required. Specifically: The oxygen sensor probe 300 is installed in the positioning hole 3212 through the middle part 301. Since the outer diameter of the nut part 302 is larger than the diameter of the first through hole 321, the nut part 302 is supported on the support surface 32a of the positioning table 32, and the tail part 303 passes through the second through hole 311. One end of the locking positioning pusher 33 is fixed on the moving table 31, and the other end passes through the through hole 3211a in the third direction and pushes the middle part 301 inward to abut against the remaining N-1 positioning protrusions 3211 to lock the oxygen sensor probe 300.

[0038] The first posture collector 40 moves back and forth on the second slide rail 20 to the first posture position and the second posture position. The moving positioning mechanism 30 moves on the first slide rail 10 to a position that coincides with the center line of the first posture collector 40. The first posture collector 40 is in the same direction to collect postures from the oxygen sensor probe 300 in both the first posture position and the second posture position.

[0039] Other coaxiality tests are the same as those for the nitrogen and oxygen sensor probe 200 mentioned above, and will not be repeated here.

[0040] Finally, it should be noted that the above description is merely the preferred embodiment of the present invention and is not intended to limit the present invention in any way. Any person skilled in the art can make many possible variations and simple substitutions to the technical solutions of the present invention using the disclosed methods and techniques without departing from the scope of the present invention; all of these variations fall within the protection scope of the present invention.

Claims

1. A probe coaxiality testing device, used for testing the coaxiality between the central axis of the upper cylindrical part of a nitrogen-oxygen sensor probe and the central axis of the chip, characterized in that, It includes a first slide rail, a second slide rail, a motion positioning mechanism, a first posture collecting component, and a second posture collecting component, wherein, The first slide rail extends along a first direction; The second slide rail extends along a second direction, which is perpendicular to the first direction; The mobile positioning mechanism moves back and forth on the first slide rail. The mobile positioning mechanism includes a moving platform, a positioning platform, and a locking positioning pusher. Along the second direction, the positioning platform is stacked on the moving platform. The positioning platform and the moving platform are provided with a first through hole and a second through hole coaxially along the second direction. The first through hole has N positioning protrusions protruding inward in the radial direction. The N positioning protrusions form a positioning hole coaxial with the first through hole. The nitrogen-oxygen sensor probe is installed in the positioning hole through the middle part. The outer diameter of the upper cylindrical part of the nitrogen-oxygen sensor probe is larger than the diameter of the positioning hole but smaller than the diameter of the first through hole. One of the positioning protrusions has a through hole along the third direction. One end of the locking positioning pusher is fixed on the moving platform, and the other end passes through the through hole along the third direction and pushes the middle part of the nitrogen-oxygen sensor probe inward to abut against the remaining N-1 positioning protrusions. Here, N>1, N is a natural number, and the third direction is perpendicular to the first direction and the second direction. The first posture collector and the second posture collector move toward each other or in opposite directions on the second slide rail to a first posture position and a second posture position. The first posture position and the second posture position refer to two positions on the second slide rail that are different from the distance of the nitrogen and oxygen sensor probe. The first posture collecting device and the second posture collecting device are industrial cameras; The mobile positioning mechanism moves on the first slide rail to a position between the first posture collector and the second posture collector, with the center lines of the three coinciding. The first posture collector and the second posture collector face each other at the first posture position and the second posture position to collect posture data from the nitrogen and oxygen sensor probe.

2. The probe coaxiality testing device according to claim 1, characterized in that, The N positioning bumps are arranged in a circumferential matrix about the center of the first through hole.

3. The probe coaxiality testing device according to claim 2, characterized in that, N=3。 4. The probe coaxiality testing device according to claim 3, characterized in that, The locking and positioning pusher includes a nut, a fixing rod, and a push rod. The fixing rod is fixed to the moving platform. The free end of the push rod passes through the through hole to push the nitrogen and oxygen sensor probe. The other end is fixedly connected to the nut. The nut is also threadedly connected to the fixing rod. The rotation of the nut drives the push rod to move along the third direction.

5. The probe coaxiality testing device according to claim 4, characterized in that, The mobile stage is equipped with a sensing plate, which is sensed and detected by a slotted photoelectric sensor on the worktable.

6. The probe coaxiality testing device according to claim 5, characterized in that, The mobile station is T-shaped.

7. The probe coaxiality testing device according to any one of claims 1-6, characterized in that, The probe coaxiality testing device further includes a material feeding and clamping mechanism, a defective product recycling mechanism, and a qualified product recycling mechanism. The defective product recycling mechanism and the qualified product recycling mechanism are arranged side by side, and the material feeding and clamping mechanism is arranged adjacent to the defective product recycling mechanism and the qualified product recycling mechanism.

8. The probe coaxiality testing device according to claim 7, characterized in that, The probe coaxiality testing device also includes a feeding clamping mechanism, which is arranged adjacent to the moving positioning mechanism and is located on both sides of the first slide rail, respectively, from the unloading clamping mechanism.

9. A probe coaxiality testing device for testing the coaxiality between the central axis of the nut portion of an oxygen sensor probe and the central axis of the chip, characterized in that, It includes a first slide rail, a second slide rail, a motion positioning mechanism, and a first posture collecting component, wherein, The first slide rail extends along a first direction; The second slide rail extends along a second direction, which is perpendicular to the first direction; The moving positioning mechanism moves back and forth on the first slide rail. The moving positioning mechanism includes a moving platform, a positioning platform, and a locking positioning pusher. The positioning platform is stacked on the moving platform along the second direction. The positioning platform and the moving platform are provided with a first through hole and a second through hole along the second direction. The first through hole has N positioning protrusions protruding inward in the radial direction. The N positioning protrusions form a positioning hole coaxial with the first through hole. The oxygen sensor probe is installed in the positioning hole through the middle part, and the nut part of the oxygen sensor probe is supported on the positioning platform. One of the positioning protrusions has a through hole along the third direction. One end of the locking positioning pusher is fixed on the moving platform, and the other end passes through the through hole along the third direction and pushes the middle part of the oxygen sensor probe inward to abut against the remaining N-1 positioning protrusions. N>1, N is a natural number, and the third direction is perpendicular to the first direction and the second direction. The first posture collecting component moves back and forth on the second slide rail to the first posture position and the second posture position; The mobile positioning mechanism moves on the first slide rail to a position that coincides with the center line of the first posture collecting component, and the first posture collecting component collects the posture of the oxygen sensor probe at the first posture position and the second posture position. The first posture collecting device collects the posture of the oxygen sensor probe in the same direction at both the first posture position and the second posture position. The first posture collection device is an industrial camera.

10. A testing method, applied in the probe coaxiality testing device according to any one of claims 1-8, characterized in that, The testing method includes: The nitrogen and oxygen sensor probe is installed in the positioning hole through the middle part; The locking and positioning pusher passes through the perforation along the third direction and pushes the middle part of the nitrogen and oxygen sensor probe inward to abut against the remaining N-1 positioning protrusions; The mobile positioning mechanism moves on the first slide rail to a position between the first posture collecting component and the second posture collecting component, and the center lines of the three components coincide. The first posture collector and the second posture collector face each other at the first posture position to collect the first posture of the nitrogen and oxygen sensor probe; The first posture collector and the second posture collector face each other at the second posture position to collect the second posture of the nitrogen and oxygen sensor probe; The controller compares the first pose, the second pose, and the pre-stored standard pose. Output qualified and unqualified products.

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