A method and system for measuring and calculating the modified refractive index of a non-uniform atmospheric waveguide

Abstract

The application discloses a method and system for measuring and calculating a modified refractive index of a non-uniform atmospheric waveguide. The method comprises the following steps: acquiring atmospheric waveguide profile data at a set time, and calculating a modified refractive index gradient value of adjacent atmospheric waveguide profiles at a to-be-measured position; judging a trapping layer height range of an atmospheric waveguide profile i and an atmospheric waveguide profile i+1 according to the modified refractive index gradient value, calculating a trapping layer height range of an atmospheric waveguide profile k and corresponding modified refractive indexes, an upper height limit corresponding modified refractive index and a lower height limit corresponding modified refractive index, and then drawing the atmospheric waveguide profile k; and outputting the modified refractive index of the to-be-measured position based on the drawn atmospheric waveguide profile k. The application can combine the non-uniformity of the atmospheric waveguide in the horizontal and vertical directions, and more accurately measure and calculate the modified refractive index of the to-be-measured position.

Description

Technical Field

[0001] This invention belongs to the field of corrected refractive index measurement, specifically relating to a method and system for measuring the corrected refractive index of non-uniform atmospheric waveguides. Background Technology

[0002] The propagation speed *v* of electromagnetic waves in the atmosphere is affected by the vertical distribution characteristics of air temperature and humidity. In radio meteorology, the refractive index *n* is generally used to quantify this change in speed. *n* is defined as the ratio of the propagation speed *c* of electromagnetic waves in free space to *v*, that is:

[0003]

[0004] Since the refractive index n is relatively small and close to 1 (1.0025~1.0004), it is inconvenient for practical use. Furthermore, considering the influence of the Earth's curvature on the propagation of electromagnetic waves in the atmosphere, a modified refractive index M is introduced to replace the refractive index n. The relationship between the two is as follows:

[0005] M = N + 0.157z; N = (n-1) × 10 6 ;

[0006] Due to environmental limitations, only atmospheric waveguide profile data at specific locations can be measured during the acquisition process. Then, the corrected refractive index of the atmospheric waveguide at the target location is derived from the corrected refractive index M at that specific location. Currently, the commonly used method is to first perform equal-height interpolation of the atmospheric waveguide refractive index profile along the height, and then perform equal-interval interpolation of the height-interpolated profile along the distance to obtain the corrected refractive index of the atmospheric waveguide at the target location. However, this existing method suffers from relatively poor accuracy. Summary of the Invention

[0007] The purpose of this invention is to provide a method and system for calculating the corrected refractive index of a non-uniform atmospheric waveguide, which takes into account the non-uniformity of the atmosphere and accurately calculates the corrected refractive index of the atmospheric waveguide at the measurement location.

[0008] To achieve the above objectives, the technical solution adopted by the present invention in the first aspect is as follows:

[0009] A method for calculating the corrected refractive index of a non-uniform atmospheric waveguide, including...

[0010] Acquire atmospheric waveguide profile data for a set time period, and calculate the corrected refractive index gradient value of the atmospheric waveguide profiles adjacent to the location to be measured; the atmospheric waveguide profiles adjacent to the location to be measured are respectively denoted as atmospheric waveguide profile i and atmospheric waveguide profile i+1;

[0011] The atmospheric waveguide profile at the location to be measured is set as atmospheric waveguide profile k; the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 is determined based on the corrected refractive index gradient value; the trapping layer height range of atmospheric waveguide profile k and the corresponding corrected refractive index are calculated based on the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 and the corresponding corrected refractive index.

[0012] Based on the upper and lower limit corrected refractive indices of atmospheric waveguide profiles i and i+1, calculate the corrected refractive indices corresponding to the upper and lower limits of atmospheric waveguide profile k.

[0013] The atmospheric waveguide profile k is plotted based on the trapped layer height range of the atmospheric waveguide profile k and the corresponding corrected refractive index, the corrected refractive index corresponding to the upper limit of the height, and the corrected refractive index corresponding to the lower limit of the height; the corrected refractive index of the measured position is output based on the plotted atmospheric waveguide profile k.

[0014] Preferably, the process of calculating the corrected refractive index gradient value of the atmospheric waveguide profile adjacent to the location to be measured includes:

[0015] dM / dz(i,n)=(M(i,n)-M(i,n-1)) / (z(i,n)-z(i,n-1));

[0016] dM / dz(i+1,n)=(M(i+1,n)-M(i+1,n-1)) / (z(i+1,n)-z(i+1,n-1));

[0017] In the formula, dM / dz(i,n) represents the corrected refractive index gradient value corresponding to the nth layer data point on the i-th profile, dM / dz(i+1,n) represents the corrected refractive index gradient value corresponding to the nth layer data point on the (i+1)-th profile, M(i,n) represents the corrected refractive index corresponding to the nth layer data point on the i-th profile, M(i,n-1) represents the corrected refractive index corresponding to the (n-1)th layer data point on the i-th profile, and z(i,n) represents the altitude corresponding to the nth layer data point on the i-th profile. z(i,n-1) represents the altitude corresponding to the (n-1)th layer data point on the i-th profile, M(i+1,n) represents the corrected refractive index corresponding to the nth layer data point on the (i+1)-th profile, M(i+1,n-1) represents the corrected refractive index corresponding to the (n-1)th layer data point on the (i+1)-th profile; z(i+1,n-1) represents the altitude corresponding to the nth layer data point on the (i+1)-th profile; z(i+1,n-1) represents the altitude corresponding to the (n-1)th layer data point on the (i+1)-th profile.

[0018] Preferably, the process of determining the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 based on the corrected refractive index gradient value includes:

[0019] When dM / dz(i,n)<0, the altitude z(i,n) is set as the top of the trapping layer of atmospheric waveguide profile i, and the altitude z(i,n-1) is set as the bottom of the trapping layer of atmospheric waveguide profile i. The range of the trapping layer height of atmospheric waveguide profile i is denoted as [Zb(i),Zt(i)].

[0020] When dM / dz(i+1,n)<0, the altitude z(i+1,n) is set as the top of the trapping layer of the atmospheric waveguide profile i+1, and the altitude z(i+1,n-1) is set as the bottom of the trapping layer of the atmospheric waveguide profile i+1. The range of the trapping layer height of the atmospheric waveguide profile i+1 is denoted as [Zb(i+1),Zt(i+1)].

[0021] Preferably, the trapping layer height range of atmospheric waveguide profile k is calculated based on the trapping layer height ranges of atmospheric waveguide profiles i and i+1 and the corresponding corrected refractive index, including:

[0022]

[0023]

[0024] In the formula, Zb(x) represents the bottom height of the trapping layer of atmospheric waveguide profile k, Zt(x) represents the top height of the trapping layer of atmospheric waveguide profile k; d(i+1) represents the position of atmospheric waveguide profile i+1; d(i) represents the position of atmospheric waveguide profile i.

[0025] Preferably, the calculation of the corrected refractive index corresponding to the trapping layer height range of the atmospheric waveguide profile k includes:

[0026]

[0027]

[0028] In the formula, Mb(x) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile k, Mt(x) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile k; Mb(i+1) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile i+1; Mb(i) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile i; Mt(i+1) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile i+1; Mt(i) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile i.

[0029] Preferably, based on the height upper limit corrected refractive index of atmospheric waveguide profile i and atmospheric waveguide profile i+1, the corrected refractive index corresponding to the height upper limit of atmospheric waveguide profile k is calculated, including:

[0030]

[0031] In the formula, Mz max The corrected refractive index corresponding to the upper limit of the atmospheric waveguide profile k is expressed as follows: Δd represents the distance from atmospheric waveguide profile k to atmospheric waveguide profile i; M(i,z) max The refractive index of the atmospheric waveguide profile i is expressed as the upper limit of the height correction; M(i+1,z) max The refractive index is expressed as the upper limit of the height correction for the atmospheric waveguide profile i+1.

[0032] Preferably, based on the height lower limit corrected refractive index of atmospheric waveguide profile i and atmospheric waveguide profile i+1, the corrected refractive index corresponding to atmospheric waveguide profile k and height lower limit is calculated, including:

[0033]

[0034] In the formula, M(i,0) represents the height lower limit corrected refractive index of atmospheric waveguide profile i; M(i+1,0) represents the height lower limit corrected refractive index of atmospheric waveguide profile i+1; and M0 represents the corrected refractive index corresponding to the height lower limit of atmospheric waveguide profile k.

[0035] In a second aspect, the present invention provides a system for calculating the corrected refractive index of a non-uniform atmospheric waveguide, comprising:

[0036] The acquisition module is used to acquire atmospheric waveguide profile data for a set time and calculate the corrected refractive index gradient value of the atmospheric waveguide profiles adjacent to the test location; the atmospheric waveguide profiles adjacent to the test location are respectively denoted as atmospheric waveguide profile i and atmospheric waveguide profile i+1.

[0037] The trapping layer calculation module is used to set the atmospheric waveguide profile where the location to be measured is located as atmospheric waveguide profile k; determine the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 based on the corrected refractive index gradient value; and calculate the trapping layer height range and corresponding corrected refractive index of atmospheric waveguide profile k based on the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 and the corresponding corrected refractive index.

[0038] The limit value calculation module calculates the corrected refractive indices corresponding to the upper and lower limits of the atmospheric waveguide profile k based on the upper and lower limit corrected refractive indices of the atmospheric waveguide profile i and atmospheric waveguide profile i+1.

[0039] The mapping module is used to draw the atmospheric waveguide profile k based on the trapped layer height range of the atmospheric waveguide profile k and the corresponding corrected refractive index, the corrected refractive index corresponding to the upper limit of the height and the corrected refractive index corresponding to the lower limit of the height.

[0040] The output module is used to output the corrected refractive index of the measured location based on the drawn atmospheric waveguide profile k.

[0041] A third aspect of the present invention provides an electronic device including a storage medium and a processor; the storage medium is used to store instructions; the processor is used to operate according to the instructions to perform the method described in the first aspect of the present invention.

[0042] Compared with the prior art, the beneficial effects achieved by the present invention are as follows:

[0043] In this invention, the trapped layer height range and corresponding corrected refractive indices for the atmospheric waveguide profile k are calculated sequentially, along with the corrected refractive indices corresponding to the upper and lower height limits. Then, the atmospheric waveguide profile k is drawn. This method fully incorporates the horizontal and vertical inhomogeneities of the surrounding atmospheric waveguide during the drawing process, resulting in a more accurate drawing of the atmospheric waveguide profile k. Furthermore, this invention first draws the atmospheric waveguide profile k as a whole, and then outputs the corrected refractive index of the measured location based on the drawn atmospheric waveguide profile k. This allows for a more accurate calculation of the corrected refractive index of the measured location by incorporating the horizontal and vertical inhomogeneities of the surrounding atmospheric waveguide. Attached Figure Description

[0044] Figure 1 This is a schematic diagram of the distribution of the initial atmospheric waveguide profile provided in Embodiment 1;

[0045] Figure 2 This is a schematic diagram of the distribution of the trapping layer on the atmospheric waveguide profile provided in Embodiment 1;

[0046] Figure 3 This is a schematic diagram of the distribution of atmospheric waveguide profiles after trapping layer matching interpolation provided in Embodiment 1. Detailed Implementation

[0047] The present invention will be further described below with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and should not be used to limit the scope of protection of the present invention.

[0048] It should be noted that in the description of this invention, the terms "front," "rear," "left," "right," "upper," "lower," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are used only for the convenience of describing the invention and do not require the invention to be constructed and operated in a specific orientation; therefore, they should not be construed as limitations on the invention. The terms "front," "rear," "left," "right," "upper," and "lower" used in the description of this invention refer to the directions shown in the accompanying drawings, while the terms "inner" and "outer" refer to directions toward or away from the geometric center of a specific component, respectively.

[0049] Example 1

[0050] like Figures 1 to 3 As shown, a method for calculating the corrected refractive index of a non-uniform atmospheric waveguide includes...

[0051] The process of acquiring atmospheric waveguide profile data for a set time period and calculating the corrected refractive index gradient values ​​of adjacent atmospheric waveguide profiles at the location to be measured includes:

[0052] dM / dz(i,n)=(M(i,n)-M(i,n-1)) / (z(i,n)-z(i,n-1));

[0053] dM / dz(i+1,n)=(M(i+1,n)-M(i+1,n-1)) / (z(i+1,n)-z(i+1,n-1));

[0054] In the formula, dM / dz(i,n) represents the corrected refractive index gradient value corresponding to the nth layer data point on the i-th profile, dM / dz(i+1,n) represents the corrected refractive index gradient value corresponding to the nth layer data point on the (i+1)-th profile, M(i,n) represents the corrected refractive index corresponding to the nth layer data point on the i-th profile, M(i,n-1) represents the corrected refractive index corresponding to the (n-1)th layer data point on the i-th profile, and z(i,n) represents the altitude corresponding to the nth layer data point on the i-th profile. z(i,n-1) represents the altitude corresponding to the (n-1)th layer data point on the i-th profile, M(i+1,n) represents the corrected refractive index corresponding to the nth layer data point on the (i+1)-th profile, M(i+1,n-1) represents the corrected refractive index corresponding to the (n-1)th layer data point on the (i+1)-th profile; z(i+1,n-1) represents the altitude corresponding to the nth layer data point on the (i+1)-th profile; z(i+1,n-1) represents the altitude corresponding to the (n-1)th layer data point on the (i+1)-th profile.

[0055] The atmospheric waveguide profiles adjacent to the location to be measured are denoted as atmospheric waveguide profile i and atmospheric waveguide profile i+1, respectively; the atmospheric waveguide profile at the location to be measured is set as atmospheric waveguide profile k; the process of determining the trapping layer height range of atmospheric waveguide profiles i and i+1 based on the corrected refractive index gradient value includes:

[0056] According to Table 1, based on the modified refractive index gradient value dM / dz, the refractive types are divided into trapping, superrefractive, standard refractive, normal refractive, and subrefractive.

[0057] Table 1: Range of Corrected Refractive Index Gradients for Different Refraction Types

[0058] Trapped Refraction dM / dz < 0 Superrefractive 0 ≤ dM / dz < 0.079 Standard Refraction dM / dz = 0.118 Normal refraction 0.079 ≤ dM / dz < 0.157 Secondary refraction dM / dz≥0.157

[0059] When dM / dz(i,n)<0, the altitude z(i,n) is set as the top of the trapping layer of atmospheric waveguide profile i, and the altitude z(i,n-1) is set as the bottom of the trapping layer of atmospheric waveguide profile i. The range of the trapping layer height of atmospheric waveguide profile i is denoted as [Zb(i),Zt(i)].

[0060] When dM / dz(i+1,n)<0, the altitude z(i+1,n) is set as the top of the trapping layer of the atmospheric waveguide profile i+1, and the altitude z(i+1,n-1) is set as the bottom of the trapping layer of the atmospheric waveguide profile i+1. The range of the trapping layer height of the atmospheric waveguide profile i+1 is denoted as [Zb(i+1),Zt(i+1)].

[0061] Based on the trapping layer height ranges of atmospheric waveguide profiles i and i+1, and the corresponding corrected refractive indices, the trapping layer height range of atmospheric waveguide profile k is calculated, including:

[0062]

[0063]

[0064] In the formula, Zb(x) represents the bottom height of the trapping layer of atmospheric waveguide profile k, Zt(x) represents the top height of the trapping layer of atmospheric waveguide profile k; d(i+1) represents the position of atmospheric waveguide profile i+1; d(i) represents the position of atmospheric waveguide profile i.

[0065] Calculate the corrected refractive index for the trapped layer height range of the atmospheric waveguide profile k, including:

[0066]

[0067]

[0068] In the formula, Mb(x) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile k, Mt(x) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile k; Mb(i+1) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile i+1; Mb(i) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile i; Mt(i+1) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile i+1; Mt(i) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile i.

[0069] Based on the height-upper corrected refractive index of atmospheric waveguide profiles i and i+1, calculate the corrected refractive index corresponding to the height-upper limit of atmospheric waveguide profile k, including:

[0070]

[0071] In the formula, Mz max The corrected refractive index corresponding to the upper limit of the atmospheric waveguide profile k is expressed as follows: Δd represents the distance from atmospheric waveguide profile k to atmospheric waveguide profile i; M(i,z) max The refractive index of the atmospheric waveguide profile i is expressed as the upper limit of the height correction; M(i+1,z) max The refractive index is expressed as the upper limit of the height correction for the atmospheric waveguide profile i+1.

[0072] Based on the height-lower limit corrected refractive index of atmospheric waveguide profiles i and i+1, calculate the corrected refractive index corresponding to atmospheric waveguide profile k and the height-lower limit, including:

[0073]

[0074] In the formula, M(i,0) represents the height lower limit corrected refractive index of atmospheric waveguide profile i; M(i+1,0) represents the height lower limit corrected refractive index of atmospheric waveguide profile i+1; and M0 represents the corrected refractive index corresponding to the height lower limit of atmospheric waveguide profile k.

[0075] The atmospheric waveguide profile k is plotted based on the trapped layer height range of the atmospheric waveguide profile k and the corresponding corrected refractive index, the corrected refractive index corresponding to the upper limit of the height, and the corrected refractive index corresponding to the lower limit of the height; the corrected refractive index of the measured position is output based on the plotted atmospheric waveguide profile k.

[0076] Example 2

[0077] This embodiment provides a system for calculating the corrected refractive index of a non-uniform atmospheric waveguide. The system described in this embodiment can apply the calculation method shown in Embodiment 1. The calculation system includes:

[0078] The acquisition module is used to acquire atmospheric waveguide profile data for a set time and calculate the corrected refractive index gradient value of the atmospheric waveguide profiles adjacent to the test location; the atmospheric waveguide profiles adjacent to the test location are respectively denoted as atmospheric waveguide profile i and atmospheric waveguide profile i+1.

[0079] The trapping layer calculation module is used to set the atmospheric waveguide profile where the location to be measured is located as atmospheric waveguide profile k; determine the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 based on the corrected refractive index gradient value; and calculate the trapping layer height range and corresponding corrected refractive index of atmospheric waveguide profile k based on the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 and the corresponding corrected refractive index.

[0080] The limit value calculation module calculates the corrected refractive indices corresponding to the upper and lower limits of the atmospheric waveguide profile k based on the upper and lower limit corrected refractive indices of the atmospheric waveguide profile i and the atmospheric waveguide profile i+1.

[0081] The mapping module is used to draw the atmospheric waveguide profile k based on the trapped layer height range of the atmospheric waveguide profile k and the corresponding corrected refractive index, the corrected refractive index corresponding to the upper limit of the height and the corrected refractive index corresponding to the lower limit of the height.

[0082] The output module is used to output the corrected refractive index of the measured location based on the drawn atmospheric waveguide profile k.

[0083] A third aspect of the present invention provides an electronic device including a storage medium and a processor; the storage medium is used to store instructions; the processor is used to operate according to the instructions to execute the method described in the first aspect of the present invention.

[0084] Example 3

[0085] This embodiment provides an electronic device including a storage medium and a processor; the storage medium is used to store instructions; the processor is used to operate according to the instructions to execute the method described in Embodiment 1.

[0086] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A method for calculating the corrected refractive index of a non-uniform atmospheric waveguide, characterized in that, include Acquire atmospheric waveguide profile data for a set time period, and calculate the corrected refractive index gradient value of the atmospheric waveguide profiles adjacent to the location to be measured; the atmospheric waveguide profiles adjacent to the location to be measured are respectively denoted as atmospheric waveguide profile i and atmospheric waveguide profile i+1; The atmospheric waveguide profile at the location to be measured is set as atmospheric waveguide profile k; the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 is determined based on the corrected refractive index gradient value; the trapping layer height range of atmospheric waveguide profile k and the corresponding corrected refractive index are calculated based on the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 and the corresponding corrected refractive index. Based on the upper and lower limit corrected refractive indices of atmospheric waveguide profiles i and i+1, calculate the corrected refractive indices corresponding to the upper and lower limits of atmospheric waveguide profile k. The atmospheric waveguide profile k is plotted based on the trapped layer height range of the atmospheric waveguide profile k and the corresponding corrected refractive index, the corrected refractive index corresponding to the upper limit of the height, and the corrected refractive index corresponding to the lower limit of the height; the corrected refractive index of the measured position is output based on the plotted atmospheric waveguide profile k.

2. The method for calculating the corrected refractive index of a non-uniform atmospheric waveguide according to claim 1, characterized in that, The process of calculating the corrected refractive index gradient value of the atmospheric waveguide profile adjacent to the location to be measured includes: dM / dz(i,n) = (M(i,n)-M(i,n-1)) / (z(i,n)-z(i,n-1)); dM / dz(i+1,n) = (M(i+1,n)-M(i+1,n-1)) / (z(i+1,n)-z(i+1,n-1)); In the formula, dM / dz(i,n) represents the corrected refractive index gradient value corresponding to the nth layer data point on the i-th profile, dM / dz(i+1,n) represents the corrected refractive index gradient value corresponding to the nth layer data point on the (i+1)-th profile, M(i,n) represents the corrected refractive index corresponding to the nth layer data point on the i-th profile, M(i,n-1) represents the corrected refractive index corresponding to the (n-1)th layer data point on the i-th profile, and z(i,n) represents the altitude corresponding to the nth layer data point on the i-th profile. z(i,n-1) represents the altitude corresponding to the (n-1)th layer data point on the i-th profile, M(i+1,n) represents the corrected refractive index corresponding to the nth layer data point on the (i+1)-th profile, M(i+1,n-1) represents the corrected refractive index corresponding to the (n-1)th layer data point on the (i+1)-th profile; z(i+1,n-1) represents the altitude corresponding to the nth layer data point on the (i+1)-th profile; z(i+1,n-1) represents the altitude corresponding to the (n-1)th layer data point on the (i+1)-th profile.

3. The method for calculating the corrected refractive index of a non-uniform atmospheric waveguide according to claim 2, characterized in that, The process of determining the trapping layer height range of atmospheric waveguide profiles i and i+1 based on the corrected refractive index gradient values ​​includes: When dM / dz(i,n)<0, the altitude z(i,n) is set as the top of the trapping layer of atmospheric waveguide profile i, and the altitude z(i,n-1) is set as the bottom of the trapping layer of atmospheric waveguide profile i. The range of the trapping layer height of atmospheric waveguide profile i is denoted as [Zb(i),Zt(i)]. When dM / dz(i+1,n)<0, the altitude z(i+1,n) is set as the top of the trapping layer of the atmospheric waveguide profile i+1, and the altitude z(i+1,n-1) is set as the bottom of the trapping layer of the atmospheric waveguide profile i+1. The range of the trapping layer height of the atmospheric waveguide profile i+1 is denoted as [Zb(i+1),Zt(i+1)].

4. The method for calculating the corrected refractive index of a non-uniform atmospheric waveguide according to claim 3, characterized in that, Based on the trapping layer height ranges of atmospheric waveguide profiles i and i+1, and the corresponding corrected refractive indices, the trapping layer height range of atmospheric waveguide profile k is calculated, including: ； ； In the formula, Zb(x) represents the bottom height of the trapping layer of atmospheric waveguide profile k, Zt(x) represents the top height of the trapping layer of atmospheric waveguide profile k; d(i+1) represents the position of atmospheric waveguide profile i+1; d(i) represents the position of atmospheric waveguide profile i. It is expressed as the distance from atmospheric waveguide profile k to atmospheric waveguide profile i.

5. The method for calculating the corrected refractive index of a non-uniform atmospheric waveguide according to claim 4, characterized in that, Calculate the corrected refractive index for the trapped layer height range of the atmospheric waveguide profile k, including: ； ； In the formula, Mb(x) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile k, Mt(x) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile k; Mb(i+1) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile i+1; Mb(i) represents the corrected refractive index corresponding to the bottom height of the trap layer of atmospheric waveguide profile i; Mt(i+1) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile i+1; Mt(i) represents the corrected refractive index corresponding to the top height of the trap layer of atmospheric waveguide profile i.

6. The method for calculating the corrected refractive index of a non-uniform atmospheric waveguide according to claim 1, characterized in that, Based on the height-upper corrected refractive index of atmospheric waveguide profiles i and i+1, calculate the corrected refractive index corresponding to the height-upper limit of atmospheric waveguide profile k, including: ； In the formula, This is expressed as the corrected refractive index corresponding to the upper limit of the k-height of the atmospheric waveguide profile; It is expressed as the distance from atmospheric waveguide profile k to atmospheric waveguide profile i; The upper limit of the height of atmospheric waveguide profile i is expressed as the corrected refractive index. The upper limit of the height of the atmospheric waveguide profile i+1 is expressed as the corrected refractive index; d(i+1) represents the position of the atmospheric waveguide profile i+1; d(i) represents the position of the atmospheric waveguide profile i.

7. The method for calculating the corrected refractive index of a non-uniform atmospheric waveguide according to claim 1, characterized in that, Based on the height-lower limit corrected refractive index of atmospheric waveguide profiles i and i+1, calculate the corrected refractive index corresponding to atmospheric waveguide profile k and the height-lower limit, including: ； In the formula, The refractive index is expressed as the lower limit of the height correction for atmospheric waveguide profile i. The refractive index is expressed as the lower limit of the height correction for atmospheric waveguide profile i+1, M0 represents the corrected refractive index corresponding to the lower limit of the height of atmospheric waveguide profile k; d(i+1) represents the position of atmospheric waveguide profile i+1; d(i) represents the position of atmospheric waveguide profile i. It is expressed as the distance from atmospheric waveguide profile k to atmospheric waveguide profile i.

8. A system for calculating the corrected refractive index of a non-uniform atmospheric waveguide, characterized in that, include: The acquisition module is used to acquire atmospheric waveguide profile data for a set time and calculate the corrected refractive index gradient value of the atmospheric waveguide profiles adjacent to the test location; the atmospheric waveguide profiles adjacent to the test location are respectively denoted as atmospheric waveguide profile i and atmospheric waveguide profile i+1. The trapping layer calculation module is used to set the atmospheric waveguide profile where the location to be measured is located as atmospheric waveguide profile k; determine the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 based on the corrected refractive index gradient value; and calculate the trapping layer height range and corresponding corrected refractive index of atmospheric waveguide profile k based on the trapping layer height range of atmospheric waveguide profile i and atmospheric waveguide profile i+1 and the corresponding corrected refractive index. The limit value calculation module calculates the corrected refractive indices corresponding to the upper and lower limits of the atmospheric waveguide profile k based on the upper and lower limit corrected refractive indices of the atmospheric waveguide profile i and atmospheric waveguide profile i+1. The mapping module is used to draw the atmospheric waveguide profile k based on the trapped layer height range of the atmospheric waveguide profile k and the corresponding corrected refractive index, the corrected refractive index corresponding to the upper limit of the height and the corrected refractive index corresponding to the lower limit of the height. The output module is used to output the corrected refractive index of the measured location based on the drawn atmospheric waveguide profile k.

9. An electronic device comprising a storage medium and a processor; said storage medium for storing instructions; characterized in that, The processor is configured to operate according to the instructions to perform the method according to any one of claims 1 to 7.

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