A high-precision sight system assembly, calibration, and testing device and method

Abstract

This invention relates to the field of scope assembly and testing technology, specifically a high-precision scope system assembly, calibration, and testing device. The proposed solution utilizes a collimator, a scope objective lens group or eyepiece, a scope system clamping device, a three-dimensional adjustment base, an imaging module, a light source, a display, and the scope zoom system to be calibrated to form a microscopic imaging system. The reticle serves as the object side, and imaging is achieved through the microscopic imaging system. The magnification of the microscopic system is controlled to be above 200x to ensure the reticle image is sufficiently large and clear on the screen. By controlling the clarity of the reticle image, the position of the reticle object side is precisely measured and adjusted. The axial position tolerance of the reticle in the zoom system can be controlled within ±0.02mm, equivalent to a parallax of <0.1'. This is far superior to the current 1' accuracy of domestic scope zoom system calibration.

Description

Technical Field

[0001] This invention relates to the field of scope assembly and testing technology, specifically to a high-precision scope system assembly, calibration, and testing device and method. Background Technology

[0002] In a visual sight, if the reticle's dividing plane is not located on the image plane but at a distance *b* from it, the following phenomenon will occur when observing through the eyepiece: as the eye moves vertically within the exit pupil plane, the image and the reticle appear to shift relative to each other in the field of view, affecting aiming at the image. Furthermore, when the distance *b* is large, the eye cannot simultaneously see both the image and the reticle, affecting the observation of the target object. This phenomenon is called parallax.

[0003] Where ε is the object-side limiting aiming error angle at the center of the field of view, or the total parallax angle, in feet.

[0004]

[0005] b is the reticle displacement (mm), and D′ is the exit pupil diameter of the telescope system.

[0006] According to GJB 1241-1991 General Specifications for Gun Sights, parallax is calculated using two methods: Method 1: Diopter tube method. Behind the eyepiece of the sight being tested, use a diopter tube to measure the difference in parallax value ΔSD between the collimator reticle and the product reticle of the sight being tested. The parallax is then converted using the following formula:

[0007]

[0008] Where ε is parallax; ΔSD is diopter difference (refractive power); and Γ is visual magnification.

[0009] Method 2: Head-swing method. Using a collimator with tolerance zones engraved on the reticle, align the center line of the reticle of the scope under test with the center of the tolerance zone of the collimator reticle, and observe the amount of movement of the reticle of the scope under test by head-swinging to see if it exceeds the tolerance zone.

[0010] Both the parallax tube method and the tilting head method measure the positional relationship between the reticle lines of the sight and the collimator reticle lines through the eyepiece of the sight. The measurement accuracy can only reach 1' or 0.1SD, and the requirements for the measurer are relatively high, requiring a certain amount of work experience. It is also easy to introduce human judgment error factors, resulting in the actual measurement result being too large. Currently, domestic sight manufacturers use these two methods to adjust sights. This is one of the reasons why, although China provides the assembly and production of more than half of the world's sight products, they are mostly low- to mid-range products, and cannot achieve higher precision parallax adjustment requirements. Summary of the Invention

[0011] To address the aforementioned problems, this invention discloses a high-precision aiming scope system assembly, calibration, and testing device and method.

[0012] To achieve the above objectives, the present invention provides the following technical solution: On the one hand, this application provides a high-precision aiming scope system assembly, adjustment and testing device, including a collimator, a reference lens group, an aiming scope system clamping device, a three-dimensional adjustment base, an imaging module, a light source, a display and an aiming scope zoom system to be adjusted;

[0013] The imaging module is installed at one end of the collimator and coincides with the focal plane of the collimator. The imaging module is connected to the display and is used to output image signals to the display.

[0014] The reference lens group is a sight objective or eyepiece, and the collimator is arranged opposite to the reference lens group to receive the parallel light emitted from the sight objective or eyepiece.

[0015] The other end of the reference lens group is positioned opposite to the aiming scope system, and the objective lens or eyepiece of the aiming scope in the aiming scope system has the same optical structure as the objective lens or eyepiece of the aiming scope group.

[0016] The aiming scope system clamping device is mounted on the three-dimensional adjustment base, and the aiming scope system clamping device includes a positioning structure that corresponds to the main scope barrel and the zoom tube in the aiming scope system.

[0017] The light source is located at the other end of the aiming scope system mounting device and is used to illuminate the aiming scope system reticle, so that it passes through the aiming scope system's zoom system and collimator, and is received by the imaging module and imaged onto the display.

[0018] In the above scheme, the display interface of the monitor has a cross-shaped reticle at the center.

[0019] In the above scheme, the imaging module includes a CMOS or CCD chip module.

[0020] In the above scheme, the cross-shaped reticle at the center of the display interface is formed by pasting a sticker with a cross-shaped reticle.

[0021] In the above scheme, the cross-shaped reticle at the center of the display interface is the cross-shaped reticle displayed on the graphical interface.

[0022] On the other hand, this application also provides a method for assembling, adjusting, and testing a high-precision sight system, including the following steps:

[0023] S01: Set up a calibration and testing device to ensure that the CCD or CMOS plane of the imaging module coincides with the image plane of the collimator, so that the imaging module can clearly image the reticle image of the magnification system under test received by the collimator.

[0024] The light source is fixed at one end of the eyepiece or objective lens of the sight being tested, and the parallel light emitted by it passes through the reticle of the sight being tested to ensure that the reticle is evenly illuminated.

[0025] S02: Fix the scope system mounting device to the three-dimensional adjustment base, and ensure that the scope system mounting device is at a suitable height and level by using its up and down adjustment knob, tilt adjustment button and left and right adjustment button;

[0026] S03: Connect and fix the lens bracket to the three-dimensional adjustment base, and adjust its up and down adjustment knob, front and back adjustment button and left and right adjustment button to ensure that the scope fixture is at the appropriate height and level, so that the center of the scope zoom system to be adjusted is consistent with the center of the collimator.

[0027] S04: Attach a transparent cross-shaped reticle to the middle surface of the monitor screen. The reticle lines are determined according to the optical magnification of the imaging module and the electronic magnification between the chip and the monitor size.

[0028] S05: Install the magnification system of the sight under test on the sight system mounting device, and adjust it through the three-dimensional adjustment base to ensure that the magnification system of the sight under test is coaxial with the sight objective lens group, collimator and light source, and at a suitable axial distance from the sight objective lens group;

[0029] S06: Turn on the power to the light source, imaging module, and display. First, adjust the magnification system of the scope under test to the minimum magnification. Move the reticle back and forth to adjust its axial position. Observe the image on the display to ensure that the image is in a clear position. Then, adjust the magnification system of the scope under test to the maximum magnification. Observe the image on the display to adjust the reticle's axial position back and forth to ensure that the image is in the clearest position. Then, repeatedly adjust the magnification system of the scope under test to the minimum and minimum magnification, and move the reticle's axial position back and forth to ensure that the image on the display is in the clearest position.

[0030] S07: Set the magnification system of the scope under test to its maximum magnification. Adjust the objective lens of the scope under test to ensure that the center of the reticle image coincides with the center of the transparent crosshair reticle on the monitor screen. Adjust the scope under test from the maximum magnification to the minimum magnification and confirm the deviation between the center of the reticle image and the center of the transparent crosshair reticle on the monitor screen. If it exceeds the requirement, adjust the lateral position of the reticle. Then adjust the scope under test from the maximum magnification to the minimum magnification and from the minimum magnification to the maximum magnification. Confirm the deviation between the center of the reticle image and the center of the transparent crosshair reticle on the monitor screen again. Repeat the operation until the deviation between the center of the reticle image and the center of the transparent crosshair reticle on the monitor screen is within the allowable range during the adjustment of the scope under test from the maximum magnification to the minimum magnification and from the minimum magnification to the maximum magnification.

[0031] Compared to existing technologies, this invention has the following advantages: The solution of this application utilizes a collimator, a sight objective lens group or eyepiece, a sight system mounting device, a three-dimensional adjustment base, an imaging module, a light source, and a display to form a microscopic imaging system. The reticle serves as the object side, and imaging is achieved through the microscopic imaging system. The magnification of the microscopic system is controlled to be above 200x, ensuring that the reticle image is sufficiently large and clear on the screen. By controlling the clarity of the reticle image, the position of the reticle object side is accurately measured and adjusted. The axial position tolerance of the reticle in the zoom system can be controlled within ±0.02mm, which translates to a parallax of <0.1'. This is far superior to the 1' accuracy of current domestic sight zoom system adjustments. Attached Figure Description

[0032] Figure 1 This is a schematic diagram of the detection device in Embodiment 1 of this application;

[0033] Figure 2 This is a perspective view of the detection device in Embodiment 1 of this application;

[0034] Figure 3 This is an example of a marking in Embodiment 2 of this application;

[0035] Figure 4 This is a schematic diagram of the method in Embodiment 2 of this application. Detailed Implementation

[0036] The present invention will be further illustrated below with reference to specific embodiments. It should be understood that the following specific embodiments are for illustrative purposes only and are not intended to limit the scope of the invention. It should be noted that the terms "front," "rear," "left," "right," "up," and "down" used in the following description refer to directions in the accompanying drawings, and the terms "inner" and "outer" refer to directions toward or away from the geometric center of a specific component, respectively.

[0037] Example 1: Refer to Appendix Figure 1-2 The high-precision scope zoom system calibration and testing device shown includes a collimator 10, a scope objective lens group or eyepiece 20, a three-dimensional adjustment base 30, a scope zoom system to be calibrated 40, a scope system clamping device 50, an imaging module 60, a light source 70, a planar fixing platform 80, and a display 90.

[0038] The collimator 10 includes a collimator body and a collimator support. The collimator body is fixed on the collimator support and is also fixed on the planar fixed platform 80 by the collimator support. The aiming scope objective lens group or eyepiece 20 includes an aiming scope objective lens group or eyepiece and a collimation objective lens group or eyepiece support. The aiming scope objective lens group or eyepiece is fixed on the collimation objective lens group or eyepiece support and is fixed on the plane fixing platform 80 through the collimation objective lens group or eyepiece support. The three-dimensional adjustment base 30 is fixed on the plane fixing platform 80. The main body of the aiming scope system clamping device 50 is fixed on the three-dimensional adjustment base 30 and can be connected and fixed to the target aiming scope zoom system component to be adjusted through it. It is connected and fixed with the arc-shaped ball head structure and positioning groove of the target aiming scope zoom system 40 to be adjusted, ensuring that the target aiming scope zoom system 40 to be adjusted has no axial displacement and cannot rotate along its circular axis, but can rotate up, down, inward and outward around the arc-shaped ball head structure of the target aiming scope zoom system to be adjusted. Additionally, the up / down, forward / backward, and left / right adjustment buttons on the three-dimensional adjustment base 30 can be used to ensure that the scope zoom system 40 to be adjusted is coaxial with the scope objective lens group or eyepiece and at a certain distance. The imaging module 60 is installed at the rear end of the collimator 10 to ensure that the imaging module CCD or CMOS receiver is on the focal plane of the collimator 10. The light source 70 is fixed by a light source bracket to ensure that the reticle is uniformly illuminated. The display 90 is connected to the imaging module 60, and a cross-shaped transparent reticle is attached to the center of its display screen.

[0039] Among them, the collimator 10 is used to generate parallel light and mainly consists of a collimator body and a collimator support. The collimator body is fixed on the support and is fixed as a whole on the planar fixing platform 80;

[0040] The scope objective lens group or eyepiece 20 includes the objective lens or eyepiece and its support, which is fixed on the plane fixed platform 80. It serves as part of the scope zoom system or as a simulation object, and is used to coordinate with the scope zoom system to be calibrated for calibration.

[0041] Three-dimensional adjustment base 30: Fixed on the planar fixed platform 80, it has adjustment functions in three directions: up and down, front and back, and left and right. It is used to fix the scope system clamping device 50 and to ensure that the scope zoom system 40 to be adjusted is coaxially aligned with the scope objective lens group or eyepiece through adjustment;

[0042] Scope system mounting device 50: used to mount the scope zoom system 40 to be adjusted, ensuring its stability during the adjustment process;

[0043] Imaging module 60: Installed at the rear end of the collimator, ensuring that the receiver (such as CCD or CMOS) is located on the focal plane of the collimator, used to receive and convert the image after the collimated light passes through the scope zoom system, so as to facilitate subsequent analysis and display;

[0044] Light source 70: Provides uniform illumination to the reticle via a fixed bracket, making the image clearer and more visible during the calibration process;

[0045] Display 90: Connected to the imaging module 60, its screen has a cross-shaped transparent reticle for displaying images during the calibration process and assisting the calibration personnel in making precise adjustments;

[0046] The specific training process includes:

[0047] The scope zoom system 40 to be adjusted is fixed on the scope system mounting device 50. The adjustment button of the three-dimensional adjustment base 30 is used to ensure that it is coaxially aligned with the scope objective lens group or eyepiece and kept at a certain distance.

[0048] Turn on light source 70 to provide illumination for the reticle;

[0049] The collimator 10 emits parallel light, which is received by the imaging module 60 and converted into an image signal after passing through the scope zoom system 40.

[0050] The image signal is transmitted to the display 90, and the adjustment personnel can make precise adjustments to the scope's zoom system based on the relative position of the image on the display and the crosshair transparent reticle.

[0051] This calibration and testing device is suitable for calibrating high-precision scope zoom systems, ensuring the accuracy and efficiency of the calibration process. Precise adjustment of the three-dimensional adjustment base 30 enables coaxial alignment of the scope zoom system, improving calibration accuracy. The use of the imaging module 60 and display 90 allows for real-time image display during the calibration process, facilitating observation and analysis by calibration personnel.

[0052] Example 2: The testing method for the high-precision scope zoom system calibration and testing device in Example 1 includes the following steps:

[0053] S01: Set up a calibration and testing device to ensure that the CCD or CMOS plane of the imaging module coincides with the image plane of the collimator, so that the imaging module can clearly image the reticle image of the magnification system under test received by the collimator.

[0054] The light source is fixed at one end of the eyepiece or objective lens of the sight being tested, and the parallel light emitted by it passes through the reticle of the sight being tested to ensure that the reticle is evenly illuminated.

[0055] This step ensures that the imaging module is aligned and can receive and clearly image the image of the magnification system reticle transmitted by the collimator; a CCD or CMOS sensor is used to capture the image; in addition, it is necessary to ensure that the parallel light generated by the light source (which may be located at one end of the eyepiece or objective lens) illuminates the reticle uniformly to provide uniform illumination for the detection step.

[0056] S02: Fix the scope system mounting device to the three-dimensional adjustment base, and ensure that the scope system mounting device is at a suitable height and level by using its up and down adjustment knob, tilt adjustment button and left and right adjustment button;

[0057] S03: Connect and fix the lens bracket to the three-dimensional adjustment base, and adjust its up and down adjustment knob, front and back adjustment button and left and right adjustment button to ensure that the scope fixture is at the appropriate height and level, so that the center of the scope zoom system to be adjusted is consistent with the center of the collimator.

[0058] This step involves securing the scope's zoom system and its mount to the three-dimensional adjustment base. By adjusting the knobs and buttons, ensure the scope is coaxially aligned with the collimator and within the appropriate axial distance. This helps guarantee uniform image quality at different magnifications;

[0059] S04: Attach a transparent cross-shaped reticle to the middle surface of the monitor screen. The reticle lines are determined according to the optical magnification of the imaging module and the electronic magnification between the chip and the monitor size.

[0060] A transparent crosshair reticle is affixed to the center of the display screen; its markings need to be determined based on the optical magnification of the imaging module and the electronic magnification in proportion to the size of the chip and the display; this reticle will serve as a reference when adjusting the scope's zoom system.

[0061] S05: Install the magnification system of the sight under test on the sight system mounting device, and adjust it through the three-dimensional adjustment base to ensure that the magnification system of the sight under test is coaxial with the sight objective lens group, collimator and light source, and at a suitable axial distance from the sight objective lens group;

[0062] S06: Turn on the power to the light source, imaging module, and display. First, adjust the magnification system of the scope under test to the minimum magnification. Move the reticle back and forth to adjust its axial position. Observe the image on the display to ensure that the image is in a clear position. Then, adjust the magnification system of the scope under test to the maximum magnification. Observe the image on the display to adjust the reticle's axial position back and forth to ensure that the image is in the clearest position. Then, repeatedly adjust the magnification system of the scope under test to the minimum and minimum magnification, and move the reticle's axial position back and forth to ensure that the image on the display is in the clearest position.

[0063] S07: Set the magnification system of the scope under test to its maximum magnification. Adjust the objective lens of the scope under test to ensure that the center of the reticle image coincides with the center of the transparent crosshair reticle on the monitor screen. Adjust the magnification system of the scope under test from maximum to minimum magnification, and confirm the deviation between the center of the reticle image and the center of the transparent crosshair reticle on the monitor screen. If it exceeds the requirement, adjust the lateral position of the reticle. Then adjust the magnification system of the scope under test from maximum to minimum magnification and from minimum to maximum magnification again. See [link to relevant documentation]. Figure 3 Then, check the markings 802 and 803 in the image, and confirm the deviation between the center of the reticle image and the center of the transparent crosshair reticle on the monitor screen. Repeat this operation until the deviation between the center of the reticle image and the center of the transparent crosshair reticle on the monitor screen is within the allowable range during the process of adjusting the magnification system of the sight under test from the maximum magnification to the minimum magnification and from the minimum magnification to the maximum magnification.

[0064] Steps S05-S07 begin by installing the magnification system of the scope under test and adjusting it to the appropriate position. Then, power on the relevant equipment and adjust the minimum and maximum magnification, optimizing the axial position of the reticle to ensure a clear image on the monitor. Next, adjust the scope to maximum magnification, ensuring the image center of the reticle coincides with the center of the reticle on the monitor. Check for any lateral displacement of the reticle by adjusting the magnification, ensuring that the image center deviation remains within an acceptable range during the adjustment process.

[0065] The above-described scheme ensures precise alignment and testing of the scope's zoom system through a refined adjustment mechanism; it guarantees consistency in each test through fixed steps and standardized operating procedures; and it reduces human error and improves the reliability of test results by utilizing specialized equipment and methods for calibration. This method is applicable to different types of scopes and zoom systems, exhibiting broad applicability. Through this method, the scope's zoom system can be meticulously tested and calibrated to ensure its accuracy in practical use. This is crucial for any situation requiring high-precision aiming devices (such as military, astronomical observation, or precision measurement).

[0066] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention. Various changes and modifications can be made to the present invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed.

[0067] The technical means disclosed in this invention are not limited to those disclosed in the above embodiments, but also include technical solutions composed of any combination of the above technical features. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of this invention, and these improvements and modifications are also considered within the scope of protection of this invention.

Claims

1. A high-precision sight system assembly, adjustment, and testing device, used for assembling, adjusting, and testing the image center deviation of the reticle during the switching process between minimum and maximum magnification of the sight's zoom system, characterized in that: It includes a collimator, a reference lens assembly, a sight system mounting device, a three-dimensional adjustment base, an imaging module, a light source, and a display; The imaging module is installed at one end of the collimator, the photosensitive surface of the imaging module coincides with the focal plane of the collimator, and the imaging module is connected to the display for outputting image signals to the display. The reference lens group includes a sight objective lens group or an eyepiece, and the collimator is arranged opposite to the reference lens group to receive the parallel light emitted from the reference lens group; The other end of the reference lens group is used to be set opposite to the scope zoom system to be adjusted. The optical structure of the scope objective lens group or eyepiece of the reference lens group is the same as that of the scope objective lens group or eyepiece adapted to the scope zoom system to be adjusted. The scope system clamping device is mounted on the three-dimensional adjustment base. The scope system clamping device includes a positioning structure that is connected to the arc-shaped ball head structure and the positioning groove of the scope zoom system to be adjusted. The positioning structure is used to connect and fix the scope zoom system to be adjusted, so that the scope zoom system to be adjusted has no axial displacement and cannot rotate around its axis, but can rotate around the arc-shaped ball head structure in the up and down direction and in the inward and outward direction. The three-dimensional adjustment base has adjustment functions in the up-down, front-back, and left-right directions, and is used to adjust the position of the scope system mounting device and the scope zoom system to be adjusted, so that the center of the scope zoom system to be adjusted is aligned with the center of the collimator, and the scope zoom system to be adjusted is coaxial with the reference lens group, the collimator and the light source. The light source is mounted on the end of the scope zoom system to be adjusted away from the reference scope group via a light source fixing bracket, so as to uniformly illuminate the reticle in the scope zoom system to be adjusted. The display interface of the display is provided with a display reference reticle at the center. The display reference reticle is a cross-shaped circular reticle. The lines of the display reference reticle are determined according to the optical magnification of the imaging module and the electronic magnification between the imaging size of the imaging module and the display size of the display. The imaging module is used to receive the image of the reticle under test formed by the zoom system of the sight to be adjusted, the reference lens group and the collimator, and to image the image of the reticle under test onto the display. The display is used to display the image of the reticle under test and the display reference reticle, so as to determine the deviation between the center of the image of the reticle under test and the center of the display reference reticle during the process of adjusting the magnification system of the scope to be adjusted from the maximum magnification to the minimum magnification and from the minimum magnification to the maximum magnification, and to use this as the basis for adjusting the lateral position of the reticle under test until the deviation is within the allowable range.

2. The high-precision aiming scope system assembly, calibration, and testing device according to claim 1, characterized in that: The collimator includes a collimator body and a collimator support. The collimator body is fixed on the collimator support and is also fixed to a planar platform via the collimator support. The reference scope assembly includes a sight objective lens assembly or an eyepiece and a reference scope assembly support. The sight objective lens assembly or eyepiece of the reference scope assembly is fixed on the reference scope assembly support and is also fixed to the planar platform via the reference scope assembly support. The three-dimensional adjustment base is fixed to the planar platform.

3. The high-precision aiming scope system assembly, calibration, and testing device according to claim 1, characterized in that: The imaging module includes a CMOS chip module or a CCD chip module, and the CMOS chip module or the CCD chip module has the photosensitive surface.

4. The high-precision aiming scope system assembly, calibration, and testing device according to claim 1, characterized in that: The display reference reticle is formed by pasting a sticker with a cross-shaped reticle.

5. The high-precision aiming scope system assembly, calibration, and testing device according to claim 1, characterized in that: The display reference reticle is a cross-shaped circular reticle displayed on the graphical interface.

6. A method for assembling, calibrating, and testing a high-precision aiming scope system using the high-precision aiming scope system assembly, calibration, and testing device according to any one of claims 1 to 5, characterized in that: Includes the following steps: S01: Construct a high-precision aiming scope system assembly, calibration and testing device as described in any one of claims 1 to 5, to ensure that the photosensitive surface of the imaging module coincides with the focal plane of the collimator, so that the imaging module can clearly image the reticle image received by the collimator. The light source is mounted on the end of the scope zoom system to be adjusted away from the reference scope group via a light source fixing bracket, and the parallel light emitted by the light source passes through the reticle under test to ensure that the reticle under test is uniformly illuminated. S02: Fix the scope system clamping device to the three-dimensional adjustment base, and ensure that the scope system clamping device is at a suitable height and level by using the up and down adjustment knob, front and back adjustment button and left and right adjustment button of the three-dimensional adjustment base; S03: Connect and fix the scope zoom system to be adjusted to the scope system mounting device through the positioning structure, and ensure that the scope zoom system to be adjusted is at a suitable height and level by using the up and down adjustment knob, the front and back adjustment button and the left and right adjustment button of the three-dimensional adjustment base, so that the center of the scope zoom system to be adjusted is consistent with the center of the collimator. S04: A display reference reticle is provided at the center of the display interface of the display. The display reference reticle is a cross-shaped circular reticle. The lines of the display reference reticle are determined according to the optical magnification of the imaging module and the electronic magnification between the imaging size of the imaging module and the display size of the display. S05: Adjust the scope zoom system to be adjusted by the three-dimensional adjustment base to ensure that the scope zoom system to be adjusted is coaxial with the reference lens group, the collimator and the light source, and that the scope zoom system to be adjusted is at a suitable axial distance from the reference lens group. S06: Turn on the power to the light source, the imaging module, and the display. First, adjust the zoom system of the scope to be calibrated to the minimum magnification, and move the axial position of the reticle under test back and forth. Observe the image of the reticle under test on the display to ensure that the image is in a clear position. Then, adjust the zoom system of the scope to be calibrated to the maximum magnification, and observe the image of the reticle under test on the display. Move the axial position of the reticle under test back and forth to ensure that the image is in the clearest position. Then, repeatedly adjust the zoom system of the scope to be calibrated to the minimum and maximum magnification, and move the axial position of the reticle under test back and forth to ensure that the image of the reticle under test on the display is the clearest. S07: Adjust the zoom system of the sight to be calibrated to the maximum magnification, adjust the objective lens of the zoom system of the sight to be calibrated, and ensure that the center of the image of the reticle being tested on the display coincides with the center of the display reference reticle. Adjust the magnification system of the scope to be calibrated from the maximum magnification to the minimum magnification, and confirm the deviation between the center of the reticle image on the display and the center of the display reference reticle. If the requirements are exceeded, adjust the lateral position of the reticle under test, then adjust the zoom system of the scope to be adjusted from the maximum magnification to the minimum magnification and from the minimum magnification to the maximum magnification. Then confirm the deviation between the center of the image of the reticle under test on the display and the center of the display reference reticle. Repeat the operation until the deviation between the center of the image of the reticle under test on the display and the center of the display reference reticle is within the allowable range during the process of adjusting the zoom system of the scope to be adjusted from the maximum magnification to the minimum magnification and from the minimum magnification to the maximum magnification.

Images