Inspection collection system, inspection quality evaluation method, device and server

Abstract

The application provides an inspection collection system, an inspection quality evaluation method and device, and a server, and is applied to the field of financial technology or other related fields. In the inspection collection system, an inspection device enters an inspection area corresponding to each to-be-detected device according to a preset inspection sequence, at least one inspection information collection device arranged in the inspection area corresponding to at least one to-be-detected device is powered on when the inspection device enters the inspection area, is in communication connection with the inspection device, and outputs inspection information, the inspection information includes an inspection time, and a server in communication connection with the inspection device accurately obtains the inspection of the inspection device on each to-be-detected device and the condition of each to-be-detected device based on the inspection information uploaded by each inspection information collection device, and accurately monitors the overall inspection condition of the inspection device according to the sequence of each inspection information collection device, thereby guaranteeing the accuracy of the inspection information generated in the inspection process.

Description

Technical Field

[0001] This application relates to the field of financial technology or other related fields, and in particular to an inspection data collection system, an inspection quality evaluation method, an apparatus, and a server. Background Technology

[0002] In recent years, with the rapid development of big data, cloud computing, and the Internet of Things, the importance of data centers has become increasingly prominent. As supporting and auxiliary facilities for IT equipment, computer room equipment such as air conditioners and uninterruptible power supplies play an important role in protecting and maintaining the safe and stable operation of IT equipment.

[0003] Inspection of equipment in data center server rooms is a crucial aspect of daily management, serving as a vital means of identifying and detecting security risks and preventing malfunctions. Common techniques involve setting up checkpoints within the server room for inspectors to record their inspection activities and equipment status. However, this practice is susceptible to issues such as inspectors not performing thorough inspections or missing items and then falsifying equipment status during check-in. Furthermore, the lack of monitoring of the inspection process allows for the creation of security vulnerabilities within the server room. Summary of the Invention

[0004] This application provides an inspection data collection system, an inspection quality evaluation method, a device, and a server to solve the technical problem that the inspection process of computer room inspection personnel cannot be monitored.

[0005] Firstly, this application provides an inspection data collection system, including:

[0006] The inspection equipment is configured to enter the inspection area corresponding to each piece of equipment to be inspected in a preset inspection sequence.

[0007] At least one inspection information collection device is set in the inspection area corresponding to at least one device to be inspected. Each of the inspection information collection devices is configured to power on and communicate with the inspection device when the inspection device enters the inspection area.

[0008] The inspection information collection device is also configured to output inspection information, including inspection time.

[0009] The server is communicatively connected to the inspection equipment and is configured to obtain the inspection information through the inspection equipment and determine the inspection status based on the inspection information.

[0010] Secondly, this application provides a method for evaluating inspection quality, wherein the method is applied to a server, and the server is communicatively connected to at least one inspection information collection device and inspection equipment.

[0011] The method includes:

[0012] When the inspection equipment enters the inspection area corresponding to each device to be inspected according to the preset inspection sequence, the inspection equipment obtains the inspection information output by the inspection information acquisition device corresponding to the device to be inspected; the inspection information includes the inspection time.

[0013] The inspection status is determined based on the inspection information;

[0014] The inspection information collection device is set in the inspection area corresponding to the device to be inspected, and is powered on when the device enters the inspection area, and is connected to the device for communication.

[0015] Thirdly, this application provides an inspection quality evaluation device, comprising:

[0016] The acquisition module is used to obtain the inspection information output by the inspection information acquisition device corresponding to each of the devices under test when the inspection equipment enters the inspection area corresponding to the device under test in accordance with the preset inspection sequence; the inspection information includes the inspection time.

[0017] The processing module is used to determine the inspection status based on the inspection information;

[0018] The inspection information collection device is set in the inspection area corresponding to the device to be inspected, and is powered on when the device enters the inspection area, and is connected to the device for communication.

[0019] Fourthly, this application provides a server, including: a processor, and a memory communicatively connected to the processor;

[0020] The memory stores computer-executed instructions;

[0021] The processor executes the computer execution instructions stored in the memory to implement the inspection quality evaluation method.

[0022] In the inspection data collection system, inspection quality evaluation method, device, and server provided in this application, the inspection equipment enters the inspection area corresponding to each device to be tested according to a preset inspection sequence. At least one inspection information collection device, corresponding to at least one inspection area corresponding to at least one device to be tested, is powered on when the inspection equipment enters the inspection area, establishes a communication connection with it, and outputs inspection information, which includes the inspection time. The server, which is connected to the inspection equipment, accurately obtains the inspection status of each device to be tested and the status of each device to be tested based on the inspection information uploaded by each inspection information collection device. According to the order in which the inspection information collection devices are acquired, the server accurately monitors the overall inspection status of the inspection equipment, ensuring the accuracy of the inspection information generated during the inspection process. Attached Figure Description

[0023] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0024] Figure 1 A schematic diagram illustrating an application scenario of the inspection data collection system provided in an exemplary embodiment of this application;

[0025] Figure 2 A flowchart illustrating an exemplary embodiment of this application for a method of collecting inspection information;

[0026] Figure 3 A schematic diagram illustrating the setting of an inspection area provided in an exemplary embodiment of this application;

[0027] Figure 4 A schematic diagram of the structure of an inspection information collection device provided in an exemplary embodiment of this application;

[0028] Figure 5 A schematic diagram of the layout of the inspection equipment data acquisition device provided in an exemplary embodiment of this application;

[0029] Figure 6 A schematic diagram illustrating the electrical connection relationship between the sensing resistor and the controller provided in an exemplary embodiment of this application;

[0030] Figure 7 A flowchart illustrating an exemplary embodiment of the present application for a method for evaluating inspection quality;

[0031] Figure 8 A schematic diagram of the structure of an inspection quality evaluation device provided in an exemplary embodiment of this application;

[0032] Figure 9 This is a schematic diagram of the structure of a server provided for an exemplary embodiment of this application.

[0033] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concepts of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0034] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0035] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. Furthermore, the collection, use, processing, transmission, provision, disclosure, and application of the relevant data all comply with the relevant laws, regulations, and standards of the relevant countries and regions, have taken necessary confidentiality measures, do not violate public order and good morals, and provide corresponding operation portals for users to choose to authorize or refuse.

[0036] Furthermore, the technical solution involved in this application, which involves big data analysis of user information (including but not limited to personal biometrics, identity data, consumption data, asset data, electronic terminal operation data, etc.) and the use of artificial intelligence technology for automated decision-making, and makes decisions that have a significant impact on personal rights based on the results of automated decision-making, provides users with corresponding operation entry points for users to choose to agree to or reject the results of automated decision-making; if the user chooses to reject, the process will proceed to the expert decision-making process.

[0037] It should be noted that the inspection data collection system, inspection quality evaluation method, device and server provided in this application can be used in the financial technology field, or in any field other than the financial technology field. The application fields of the inspection data collection system, inspection quality evaluation method, device and server provided in this application are not limited.

[0038] A schematic diagram of data center room 110 is shown below. Figure 1 As shown, the system includes multiple computers 111 and auxiliary equipment for maintaining the normal operation of the computers 111. In some embodiments, the auxiliary equipment includes, but is not limited to, a computer room air conditioner 112, an uninterruptible power supply 113, and an intelligent power distribution cabinet 114.

[0039] The computer room air conditioner 112 is configured to maintain the temperature of the computer room environment and multiple computers 111;

[0040] Uninterruptible power supply 113 is configured to provide a stable power supply to multiple computers 111;

[0041] The intelligent power distribution cabinet 114 is configured to collect data on the power consumption parameters of multiple computers 111, collect the status of the power distribution system, analyze and protect against faults of the computers 111, detect the energy efficiency of the load, and perform data analysis.

[0042] Data centers are devices for data processing and storage, and are an important part of the IT industry. The stable operation of multiple computers in a data center is the foundation for ensuring the stable provision of IT resources. Therefore, it is necessary to regularly inspect data centers to promptly identify unsafe factors and take corresponding maintenance measures to prevent failures.

[0043] In related technologies, data center inspections are based on the patrols and inspections of inspection personnel. Figure 1 Taking the scenario shown as an example, a check-in machine can be set up at the entrance of the data center server room 110. The inspection personnel 116 enter the data center server room 110 from the entrance and inspect and record the computers and auxiliary equipment one by one according to the arrangement of the computers and auxiliary equipment. After the computers and auxiliary equipment have been monitored, the personnel check in at the check-in machine to mark the inspection as complete and record the status information of each device.

[0044] However, the inspection results obtained based on the above inspection methods can only be obtained through the inspection personnel's check-in results and registered status information. It is impossible to monitor the inspection process of the inspection personnel, nor can it guarantee the authenticity of the results they submit. This can easily lead to situations where the inspection personnel do not inspect the equipment carefully or miss inspections, and then falsely report the equipment status when they check in, resulting in security risks in the computer room.

[0045] The inspection data collection system, inspection quality evaluation method, device and server provided in this application are intended to solve at least one of the above-mentioned technical problems.

[0046] The technical solution of this application and how it solves the above-mentioned technical problems will be described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of this application will be described below with reference to the accompanying drawings.

[0047] Figure 1 This is a schematic diagram illustrating an application scenario of the inspection data collection system provided as an exemplary embodiment of this application. For example... Figure 1 As shown, it includes a data center room 110 and an inspection and data collection system. The structure of the data center room 110 has been explained in the foregoing and will not be repeated here.

[0048] The inspection data collection system includes at least one inspection information collection device 119, inspection equipment 115, and server 100.

[0049] Inspection equipment 115 is a device for recording the status information of each device to be inspected.

[0050] In some embodiments, the inspection device 115 is an electronic device that can operate autonomously, approaching each device to be inspected one by one to collect inspection information of the devices to be inspected, such as a robot with automatic tracking capabilities.

[0051] In other embodiments, the inspection device 115 is a handheld electronic device that requires an inspection personnel 116 to hold the device and approach each device to be inspected along a preset path to record the corresponding inspection information in the inspection device 115.

[0052] At least one inspection information collection device 119 is installed in the inspection area corresponding to at least one device to be inspected. The device to be inspected includes, but is not limited to: a computer, a computer room air conditioner 112, an uninterruptible power supply 113, or an intelligent power distribution cabinet 114.

[0053] In some embodiments, each device to be tested corresponds to at least one inspection area, and at least one inspection information acquisition device 119 is provided in the corresponding at least one inspection area.

[0054] The inspection information collection device 119 is configured to communicate with the inspection equipment 115 when the inspection equipment 115 is in the inspection area of ​​its corresponding equipment to be inspected, and to transmit the inspection information to the inspection equipment.

[0055] In some embodiments, the inspection information collection device 119 is further configured to power on after the inspection device 115 enters the inspection area of ​​its corresponding device to be inspected, and then communicate with the inspection device 115 to transmit inspection information to the inspection device, and power off when the inspection device 115 leaves the inspection area, so as to reduce the energy consumption of the inspection information collection device 119.

[0056] In some embodiments, the inspection information includes the inspection time, which is the time that the inspection device 115 stays in the inspection area.

[0057] In other embodiments, the inspection information also includes the operating status information of the device under inspection.

[0058] For example, for the computer room air conditioner 112, its corresponding operating status information is the currently set temperature, air outlet temperature and return air outlet temperature of the computer room air conditioner 112.

[0059] The inspection information collection device 119 is also configured to disconnect the communication connection with the device to be tested corresponding to the inspection area after the inspection device 115 leaves the inspection area.

[0060] The communication connection between the inspection equipment 115 and the equipment under test can be a wireless communication connection or an electrical connection via a network cable or data cable.

[0061] Server 100 is connected to inspection equipment 115 and is configured to obtain inspection information from inspection equipment 115.

[0062] Based on the above application scenarios, this application provides a method for collecting inspection information, and the flowchart of this method is shown below. Figure 2 As shown, it includes:

[0063] S101. The inspection equipment enters the inspection area corresponding to each piece of equipment to be inspected according to the preset inspection sequence.

[0064] The inspection area is the area surrounding the device under test. In some embodiments, this area may also be an area that facilitates inspection personnel or inspection equipment in checking the operating status of the device under test. For example, when the device under test is an air conditioner, the inspection area is the area in front of and behind the air conditioner, which facilitates inspection personnel or equipment in checking whether the air conditioner control panel, the location of the temperature sensors located in front of and behind the air conditioner, and the related circuit connections meet the specifications.

[0065] A schematic diagram of one possible layout of the inspection area is shown below. Figure 3 As shown, in Figure 3 In this system, the inspection area for the device under test can be located in the inspection area 11 on its front side or in the inspection area 12 on its right side. Sensors are installed inside the inspection area or around the inspection area so that the sensors associated with the device under test can detect the device 115 after it enters the inspection area.

[0066] In some embodiments, a pressure sensor may be provided in the inspection area. The pressure sensor detects pressure changes to determine whether the inspection equipment 115 or the inspection personnel 116 carrying the inspection equipment 115 has entered the inspection area.

[0067] In other embodiments, photoelectric sensors may be provided in the inspection area or on the device to be inspected to detect the entry of the inspection device 115 into the inspection area based on the changing photoelectric sensing information. When the photoelectric sensor is a camera, the identity of the inspection personnel entering the inspection area can also be verified by identification.

[0068] In other embodiments, the sensor provided in the inspection area may also be an ultrasonic sensor, and the inspection device can be determined to have entered the inspection area when the distance between the object and the sensor is less than a preset distance.

[0069] S102. The inspection information collection device is powered on and connected to the inspection equipment when the inspection equipment enters its corresponding inspection area.

[0070] The inspection information collection device is a device installed within the inspection area to collect the operating information of the equipment to be inspected.

[0071] The inspection information collection device includes the sensor involved in step S101. The inspection information collection device will be powered on and establish a communication connection with the inspection equipment after the sensor detects that the inspection equipment has entered the inspection area. After the inspection equipment leaves the inspection area, the inspection information collection device will be powered off based on the information detected by the sensor and will also disconnect the communication connection with the inspection equipment.

[0072] S103, The inspection information collection device outputs inspection information to the inspection equipment.

[0073] During the communication connection between the inspection information collection device and the inspection equipment, the device transmits the operating information of the equipment to be inspected and related information to the inspection equipment.

[0074] S104. The inspection equipment outputs inspection information to the server.

[0075] In some embodiments, the inspection equipment acts as a relay station for the inspection information collection device to transmit information to the server, directly forwarding the inspection information it obtains to the server.

[0076] In other embodiments, after obtaining the inspection information, the inspection equipment processes the inspection information before uploading it to the server.

[0077] The processing of inspection information by the inspection equipment includes:

[0078] Obtain the equipment status information of the equipment to be inspected from the inspection information;

[0079] Compare the device status information with the corresponding status standard range;

[0080] When the device status information is within the corresponding status standard range, the device status information is uploaded to the server;

[0081] When the equipment status information is not within the corresponding status standard range, based on the equipment status information, corresponding emergency handling measures are output, and when the inspection equipment leaves the inspection area, the equipment status information and emergency handling results are uploaded to the server.

[0082] In some embodiments, the inspection equipment is equipped with a storage module that stores an emergency handling manual. The emergency handling manual includes at least one emergency plan for each device to be inspected. When the device status information is not within the corresponding status standard range, the corresponding emergency handling measures are output based on the device status information so that the inspection personnel can refer to the emergency handling measures to perform corresponding maintenance on the device. After the maintenance is completed, the device status information of the device is reacquired, and the emergency handling result is determined based on the newly acquired device status information. The handling result and the device status information sampled in the two consecutive samplings are then uploaded to the server.

[0083] In other embodiments, the server is equipped with an expert system. When the inspection device determines that the device status information is not within the corresponding status standard range, it generates a fault request. The fault request includes the existence of status standard information, and the inspection device sends the fault request to the server.

[0084] Based on the status standard information in the fault request, the server queries the expert system to determine at least one corresponding emergency plan and a reference score for each emergency plan, and then transmits it to the inspection equipment.

[0085] The inspection equipment outputs various emergency plans based on the reference scores from highest to lowest, so that inspection personnel can refer to at least one emergency plan to carry out corresponding maintenance. After the maintenance is completed, the emergency measures taken during the maintenance and the maintenance results are entered into the inspection equipment, so that the inspection equipment can upload the input information to the server, and the server can update the expert system based on the uploaded information.

[0086] The reference score for the emergency response plan output by the expert system is generated based on maintenance cost and maintenance time. For example, the reference score is the sum of the product of maintenance cost and the first preset weight, and the product of maintenance time and the second preset weight.

[0087] When the inspection equipment outputs an emergency plan, it can display the image or video information of the emergency plan through its display device, and can also play the steps of the emergency plan through its speaker. No specific limitations are made here.

[0088] In other embodiments, the inspection terminal includes a video call module. When inspection personnel encounter complex faults that require technical expert support, they can connect to the server and then to the monitoring display screen. Technical experts can then guide the inspection personnel in handling the faults from the central control center.

[0089] S105. The server determines the inspection status based on the inspection information.

[0090] In the above technical solution, the inspection equipment enters the inspection area corresponding to each device to be tested according to a preset inspection sequence. At least one inspection information acquisition device, which is set in the inspection area corresponding to at least one device to be tested, is powered on when the inspection equipment enters the inspection area, establishes a communication connection with it, and outputs inspection information, which includes the inspection time. The server, which is connected to the inspection equipment, accurately obtains the inspection status of each device to be tested and the status of each device to be tested based on the inspection information uploaded by each inspection information acquisition device. According to the order in which the inspection information acquisition devices are acquired, the server accurately monitors the overall inspection status of the inspection equipment, ensuring the accuracy of the inspection information generated during the inspection process.

[0091] The circuit structure of the inspection information collection device will be explained below.

[0092] Figure 4 A schematic diagram of the structure of an inspection information collection device provided in an exemplary embodiment of this application is shown below. Figure 4 As shown, the inspection information collection device 119 includes:

[0093] At least one sensor 1191, corresponding to at least one preset sampling point set in the inspection area, is configured to generate at least one sampling signal when the inspection equipment enters the inspection area corresponding to the inspection information collection device.

[0094] Timer 1192, electrically connected to at least one sensor, is configured to output a timing signal based on at least one sampled signal.

[0095] Transceiver 1193, electrically connected to a timer, is configured to acquire a timing signal, calculate the dwell time of the device under inspection within the inspection area based on the timing signal, and transmit the dwell time to the inspection device.

[0096] The power supply unit 1194, electrically connected to at least one sensor, timer, and transceiver, is configured to provide a power signal.

[0097] In some embodiments, the inspection information acquisition device 119 further includes a controller 1195, which is electrically connected to at least one sensor 1191 and a power supply unit 1194.

[0098] The controller 1195 is configured to acquire at least one sampling signal generated by at least one sensor 1191, and control the power supply unit 1194 to supply power to the timer and transceiver respectively based on the at least one sampling signal.

[0099] More specifically, the controller 1195 is configured to generate a power supply control signal when at least one sampled information satisfies a preset power supply condition.

[0100] The power supply unit 1194 includes a power supply 1196, a first controllable switch K1 and a second controllable switch K2. The first controllable switch K1 is connected in series between the power supply 1196 and the power supply terminal of the timer 1192, and its control terminal is electrically connected to the controller 1195 and is configured to be turned on based on the power supply control signal.

[0101] The second controllable switch K2 is connected in series between the power supply 1196 and the power supply terminal of the transceiver 1193, and its control terminal is electrically connected to the controller 1195, and is configured to be turned on based on the power supply control signal.

[0102] The first controllable switch K1 and the second controllable switch K2 can be turned on simultaneously. After the timer 1192 completes counting and feeds back to the controller 1195, the controller 1195 outputs a power supply control signal to the second controllable switch K2 based on the feedback information.

[0103] In the above circuit structure, the distance between each sensor, timer, and transceiver is greater than a preset distance to avoid electromagnetic interference.

[0104] In some embodiments, the inspection information collection device is installed under the anti-static floor of the inspection area of ​​the corresponding equipment to be inspected. A schematic diagram of the layout of the inspection equipment collection device is shown below. Figure 5 As shown.

[0105] In the inspection information collection device, at least one sensor 1191 includes at least one pressure sensor, and each pressure sensor is placed at the edge point of the antistatic floor 1197.

[0106] Taking air conditioning as an example, the length of the air conditioner in the computer room is 1.8m. The anti-static floor is generally a square floor with a side length of 600mm. When the inspection area is set along the length of the air conditioner in the computer room, the inspection area is covered with 3 anti-static floor panels 1197. The four pressure sensor measuring points are installed near the four corners of the rectangle formed by the 3 anti-static floor panels. The transceiver 1193, timer 1192 and power supply unit 1194 are glued to the bottom of the floor. Each module is more than 10cm apart to avoid electromagnetic interference between modules. The power supply unit 1194 is a low-voltage power supply.

[0107] In some embodiments, the antistatic floor is a double-layer floor, with each pressure sensor disposed between the two layers of floor.

[0108] Each pressure sensor includes a sensing resistor, which is based on the resistance value of the pressure change it receives.

[0109] Inductive resistors include positive strain gauges and negative strain gauges. Positive strain gauges are resistors whose resistance increases with increasing pressure, while negative strain gauges are resistors whose resistance decreases with increasing pressure.

[0110] The four pressure sensors mentioned above include four sets of sensing resistors, which are connected in a bridge configuration. The controller is connected in series between two diagonal points of the bridge structure.

[0111] More specifically, the electrical connection relationship between the sensing resistor and the controller is as follows: Figure 6 As shown, each group of inductive resistors includes at least one positive strain gauge and at least one negative strain gauge. In each group of inductive resistors, the positive and negative strain gauges are connected in series, that is, the second end of the positive strain gauge and the first end of the negative strain gauge are connected. The two groups of inductive resistors connected in series are then connected in parallel with two other groups of inductive resistors connected in series to form a bridge structure. In two adjacent groups of inductive resistors, when the positive strain gauges are adjacent, the first ends of the positive strain gauges in the two groups are connected, as shown in the connection relationship of positive strain gauges R21 and R22; when the negative strain gauges are adjacent, the second ends of the negative strain gauges in the two groups are connected, as shown in the connection relationship of negative strain gauges R11 and R14.

[0112] The first set of inductive resistors in the two sets of inductive resistors connected in series (e.g.) Figure 6 Within the upper resistor (as shown), the electrical connection point between the negative strain gauge R11 and the positive strain gauge R21 serves as the positive power supply terminal E+ of this bridge structure, and is electrically connected to the positive output terminal of the power supply unit. The second set of sensing resistors (as shown) Figure 6 Within the resistor on the left (as shown), the electrical connection point between the negative strain gauge R12 and the positive strain gauge R22 serves as the positive signal output terminal of the bridge structure, and is electrically connected to the first signal input terminal S+ of the controller 1196; the second set of sensing resistors in the other two sets of series-connected sensing resistors (such as...) Figure 6 The electrical connection point between the negative strain gauge R13 and the positive strain gauge R23 within the lower resistor (as shown) serves as the negative power supply terminal E- of this bridge structure, and is electrically connected to the negative output terminal of the power supply unit. The second set of sensing resistors (as shown) Figure 6 As shown on the right, the electrical connection point of the negative strain resistor R14 and the positive strain resistor R24 ​​serves as the negative signal output terminal of the bridge structure and is electrically connected to the second signal input terminal S- of the controller 1196.

[0113] The power supply continuously outputs power supply signals to the positive power supply terminal E+, the negative power supply terminal E-, and the power supply terminal of the controller. When the controller detects that the voltage difference between the first voltage signal obtained at its first signal input terminal and the second voltage signal obtained at its second signal input terminal is greater than a preset voltage threshold, it determines that an inspection device has entered the inspection area. The controller then outputs a power supply control signal to turn on at least one controllable switch.

[0114] In some embodiments, the device to be tested includes an air conditioner, an uninterruptible power supply (UPS) device, or a smart power distribution cabinet;

[0115] The air conditioner includes an air conditioner data acquisition unit, which is electrically connected to a transceiver. The transceiver is configured to obtain the air conditioner's operating status information and surrounding environmental information from the air conditioner data acquisition unit. For precision air conditioners in computer rooms, the air conditioner data acquisition unit is installed around the LCD display module on the door. This facilitates the collection of information such as air conditioner temperature and humidity, and fault alarm records, and also helps to reduce the length of air conditioner wiring.

[0116] Uninterruptible power supply (UPS) equipment includes monitoring equipment, which is electrically connected to a transceiver. The transceiver is configured to obtain the operating status information of the UPS equipment from the monitoring equipment. For UPS equipment in computer rooms, the monitoring equipment is an SNMP card, which is usually installed on the door of the UPS equipment for easy installation and debugging. It can be used to collect information such as the output power, input / output voltage, input / output current, and fault records of the UPS equipment.

[0117] The intelligent power distribution cabinet includes a communication module, which is connected to a transceiver. The transceiver is configured to obtain power distribution information from the intelligent power distribution cabinet through the communication module.

[0118] In the above technical solution, the inspection information sampling device is powered by the controller to the counter and transceiver only after the inspection equipment enters its corresponding inspection area. The power is cut off when the inspection equipment leaves, which reduces the power consumption of the inspection information sampling device.

[0119] When inspecting multiple devices, the inspection equipment will enter each inspection area one by one according to the preset inspection path. When the inspection equipment is a handheld terminal device for the inspection personnel, the inspection equipment will output the inspection path to guide the inspection personnel to walk along the inspection path.

[0120] In some embodiments, the inspection path is a fixed route set in the inspection equipment.

[0121] In other embodiments, the inspection path is generated by the server based on the location information and the location information of the device to be inspected, and the inspection path is fed back to the inspection device.

[0122] When inspection personnel use handheld inspection terminals for inspections, the terminals can record the inspection time of a single device and the time interval between inspections of two devices. The server can then use Dijkstra's algorithm to calculate the shortest path based on the inspection time and time interval, thereby replanning the inspection routes pre-stored in the server and transmitting the planned routes to the inspection terminals to guide the inspection personnel in their inspection sequence.

[0123] In the above technical solution, the server can correct the inspection path in a timely manner when the inspection personnel do not move according to the preset inspection path, based on the changes in the inspection location and the inspection time, so as to ensure that the path to be inspected by the inspection equipment is the optimal path and save the inspection time of the inspection equipment.

[0124] In some embodiments, the server also determines the inspection quality of the inspection equipment or the inspection personnel holding the inspection equipment based on the inspection time of a single device and the time interval between the inspection personnel inspecting two devices.

[0125] More specifically, the server determines the quantitative evaluation data based on the inspection time and the inspection quality evaluation formula, and determines the inspection quality based on the quantitative evaluation data;

[0126] The inspection quality evaluation formula includes:

[0127]

[0128] If Ta,i'≥Ta,i, then Na,i=1, otherwise Na,i=0, n is the total number of equipment A;

[0129] If Tb,i'≥Tb,i, then Mb,i=1, otherwise Mb,i=0, where m is the total number of devices B;

[0130] If Tc,i'≥Tc,i, then Pc,i=1, otherwise Pc,i=0, where P is the total number of devices C;

[0131] Ta,i represents the standard inspection time for inspecting the i-th device A to be inspected;

[0132] Tb,i represents the standard inspection time for inspecting the i-th device B to be tested;

[0133] Tc,i represents the standard inspection time for inspecting the i-th device C to be tested;

[0134] Ta,i' represents the actual inspection time for the i-th device A to be inspected;

[0135] Tb,i' represents the actual inspection time for the i-th device B to be inspected;

[0136] Tc,i' represents the actual inspection time for the i-th device C to be inspected;

[0137] X represents the inspection weight coefficient of equipment A;

[0138] Y represents the inspection weight coefficient of device B;

[0139] Z represents the inspection weight coefficient of equipment C.

[0140] In the above technical solution, the inspection quality evaluation formula can be used to monitor whether the inspection time of each device to be tested meets the corresponding standard inspection time, so as to ensure that the inspection personnel have enough time to inspect each device to be tested. The server can monitor the inspection process of the inspection personnel or the inspection equipment. At the same time, based on the inspection information collection device corresponding to each device to be tested, it can ensure that the inspection equipment can accurately obtain the operating status of the device to be tested, thereby ensuring the inspection quality.

[0141] Figure 7 This is a flowchart illustrating the inspection quality evaluation method provided in this application according to an exemplary embodiment, such as... Figure 7 As shown, it includes:

[0142] S201. When the inspection equipment enters the inspection area corresponding to each device to be inspected in accordance with the preset inspection sequence, the server obtains the inspection information output by the inspection information collection device corresponding to the device to be inspected through the inspection equipment.

[0143] The inspection information collection device is set up in the inspection area corresponding to the equipment to be inspected. It is powered on when the equipment enters the inspection area and communicates with the equipment.

[0144] S202. The server determines the inspection status based on the inspection information.

[0145] More specifically, the controller determines the inspection status based on the inspection quality evaluation formula involved in the above embodiments and the inspection time of each device to be inspected.

[0146] In the above technical solution, when the inspection equipment enters the inspection area corresponding to each device to be tested according to the preset inspection sequence and obtains inspection information from the inspection information collection device corresponding to each device to be tested, the server can obtain the inspection content in a timely manner and obtain the inspection status of the inspection equipment for each device to be tested. This ensures that the server and other monitoring devices associated with the server can obtain the inspection information in a timely manner, thereby enabling the timely detection of potential problems. In addition, after the inspection equipment completes its inspection, the server can also quantitatively analyze the overall inspection status of the inspection equipment based on the inspection status obtained for each device to be tested, so as to provide effective reference information for improving the inspection quality.

[0147] Figure 8 This is a schematic diagram of the inspection quality evaluation device provided in this application according to an exemplary embodiment, such as... Figure 8 As shown, the inspection quality evaluation device 300 includes:

[0148] The acquisition module 301 is used to obtain the inspection information output by the inspection information acquisition device corresponding to each device under test when the inspection equipment enters the inspection area corresponding to the device under test in accordance with the preset inspection sequence; the inspection information includes the inspection time.

[0149] The processing module 302 is used to determine the inspection status based on the inspection information.

[0150] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this application.

[0151] It should be further noted that although the steps in the flowchart are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowchart may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0152] It should be understood that the above-described device embodiments are merely illustrative, and the device of this application can also be implemented in other ways. For example, the division of units / modules in the above embodiments is only a logical functional division, and there may be other division methods in actual implementation. For example, multiple units, modules, or components may be combined, or integrated into another system, or some features may be ignored or not executed.

[0153] Furthermore, unless otherwise specified, the functional units / modules in the various embodiments of this application can be integrated into one unit / module, or each unit / module can exist physically separately, or two or more units / modules can be integrated together. The integrated units / modules described above can be implemented in hardware or as software program modules.

[0154] When the integrated unit / module is implemented in hardware, the hardware can be digital circuits, analog circuits, etc. The physical implementation of the hardware structure includes, but is not limited to, transistors, memristors, etc. Unless otherwise specified, the processor can be any suitable hardware processor, such as a CPU, GPU, FPGA, DSP, and ASIC, etc. Unless otherwise specified, the storage unit can be any suitable magnetic or magneto-optical storage medium, such as resistive random access memory (RRAM), dynamic random access memory (DRAM), static random access memory (SRAM), enhanced dynamic random access memory (EDRAM), high-bandwidth memory (HBM), hybrid memory cube (HMC), etc. In some embodiments, the circuit structure of the server implementing the above embodiments can be as follows: Figure 9As shown, server 400 includes memory 401 and processor 402, which are connected via a bus.

[0155] If the integrated unit / module is implemented as a software program module and sold or used as an independent product, it can be stored in a computer-readable storage device (CMD). Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned memory includes various media capable of storing program code, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard drive, magnetic disk, or optical disk.

[0156] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as these combinations of technical features do not contradict each other, they should be considered within the scope of this specification.

[0157] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the following claims.

[0158] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. An inspection and data collection system, characterized in that, include: The inspection equipment is configured to enter the inspection area corresponding to each piece of equipment to be inspected in a preset inspection sequence. At least one inspection information collection device is set in the inspection area corresponding to at least one device to be inspected. Each of the inspection information collection devices is configured to power on and communicate with the inspection device when the inspection device enters the inspection area. The inspection information collection device includes: At least one sensor, corresponding to at least one preset sampling point set in the inspection area, is configured to generate at least one sampling signal when the inspection equipment enters the inspection area corresponding to the inspection information collection device. A timer, electrically connected to the at least one sensor, is configured to output a timing signal based on the at least one sampled signal; A transceiver, electrically connected to the timer, is configured to obtain the timing signal, calculate the dwell time of the device under test in the inspection area based on the timing signal, and transmit the dwell time to the inspection device; A power supply unit, electrically connected to the at least one sensor, the timer, and the transceiver, is configured to provide a power signal; The distance between each of the sensors, the timer, and the transceiver is greater than a preset distance; The inspection information acquisition device further includes a controller, which is electrically connected to the at least one sensor and the power supply unit, and is configured as follows: Obtain at least one sampling signal generated by the at least one sensor, and control the power supply unit to supply power to the timer and the transceiver respectively based on the at least one sampling signal; The inspection information collection device is also configured to output inspection information, including inspection time. The inspection information also includes the location information of the device to be inspected; The transceiver is also configured to transmit device status information to the inspection device, so that the inspection device uploads the device status information to the server when the device status information is within the corresponding status standard range. The server is communicatively connected to the inspection equipment and is configured to obtain the inspection information through the inspection equipment and determine the inspection status based on the inspection information.

2. The system according to claim 1, characterized in that, The power supply unit includes a power supply, a first controllable switch, and a second controllable switch; The controller is configured to generate a power supply control signal when at least one sampled information satisfies a preset power supply condition. The first controllable switch is connected in series between the power supply and the timer, and its control terminal is electrically connected to the controller, and is configured to be turned on based on the power supply control signal; The second controllable switch is connected in series between the power supply and the transceiver, and its control terminal is electrically connected to the controller, and is configured to be turned on based on the power supply control signal.

3. The system according to claim 1, characterized in that, The inspection information collection device is installed on the underside of the anti-static floor in the inspection area of ​​the corresponding equipment to be inspected. The at least one sensor includes at least one pressure sensor, and each of the pressure sensors is placed at an edge point of the antistatic floor.

4. The system according to claim 3, characterized in that, The pressure sensor includes a sensing resistor; When the inspection information collection device includes at least four sets of sensing resistors, the at least four sets of sensing resistors are connected in a bridge electrical connection, and the controller is connected in series between two diagonal points. The controller is configured to control the power supply unit to supply power to the timer and the transceiver when the voltage difference between the two diagonal points is greater than a preset threshold.

5. The system according to claim 1, characterized in that, The equipment to be tested includes air conditioners, uninterruptible power supply equipment, or intelligent power distribution cabinets. The air conditioner includes an air conditioner data acquisition unit, which is electrically connected to the transceiver. The transceiver is configured to obtain the air conditioner's operating status information and surrounding environment information from the air conditioner data acquisition unit. The uninterruptible power supply device includes a monitoring device, which is electrically connected to the transceiver. The transceiver is configured to obtain the operating status information of the uninterruptible power supply device from the monitoring device. The intelligent power distribution cabinet includes a communication module, which is communicatively connected to the transceiver. The transceiver is configured to obtain power distribution information of the intelligent power distribution cabinet from the communication module.

6. The system according to claim 5, characterized in that, The equipment status information includes the operating status information of the air conditioner, the surrounding environment information, the operating status information of the uninterruptible power supply equipment, and the power distribution information.

7. The system according to claim 6, characterized in that, The device status information includes device identification information; The inspection equipment is also configured to: When the device status information is not within the corresponding status standard range, an alarm message is output; The device status information is uploaded and stored in the fault record module of the server.

8. The system according to claim 6 or 7, characterized in that, The inspection equipment is also configured to: When the device status information is not within the corresponding status standard range, corresponding emergency handling measures are output based on the device status information.

9. The system according to claim 1, characterized in that, The inspection equipment is also configured to upload its location information to the server at preset time intervals; The server is also configured to generate an inspection path based on the location information and the location information of the device to be inspected, and to feed the inspection path back to the inspection device.

10. The system according to claim 9, characterized in that, The server is also configured to adjust the inspection path based on the inspection time of the detected devices and the interval between two adjacent detected devices.

11. The system according to claim 1, characterized in that, The server is configured to obtain the inspection information, and when determining the inspection status based on the inspection information, it is specifically configured as follows: The inspection time and inspection quality evaluation formula are used to determine the quantitative evaluation data, and the inspection quality is determined based on the quantitative evaluation data. The inspection quality evaluation formula includes: ， X represents the inspection weight coefficient of equipment A; Y represents the inspection weight coefficient of device B; Z represents the inspection weight coefficient of equipment C.

12. A method for evaluating the quality of inspections, characterized in that, The method is applied to a server, which is communicatively connected to at least one inspection information collection device and inspection equipment. The method includes: When the inspection equipment enters the inspection area corresponding to each device to be inspected according to the preset inspection sequence, the inspection equipment obtains the inspection information output by the inspection information acquisition device corresponding to the device to be inspected; the inspection information includes the inspection time. The inspection information collection device includes: At least one sensor, corresponding to at least one preset sampling point set in the inspection area, is configured to generate at least one sampling signal when the inspection equipment enters the inspection area corresponding to the inspection information collection device. A timer, electrically connected to the at least one sensor, is configured to output a timing signal based on the at least one sampled signal; A transceiver, electrically connected to the timer, is configured to obtain the timing signal, calculate the dwell time of the device under test in the inspection area based on the timing signal, and transmit the dwell time to the inspection device; A power supply unit, electrically connected to the at least one sensor, the timer, and the transceiver, is configured to provide a power signal; The distance between each of the sensors, the timer, and the transceiver is greater than a preset distance; The inspection information acquisition device also includes a controller, which is electrically connected to the at least one sensor and the power supply unit, and is configured to: obtain at least one sampling signal generated by the at least one sensor, and control the power supply unit to supply power to the timer and the transceiver based on the at least one sampling signal; The inspection information also includes the location information of the device to be inspected; The transceiver is also used to transmit equipment status information to the inspection equipment, so that the inspection equipment uploads the equipment status information to the server when it is within the corresponding status standard range; The inspection status is determined based on the inspection information; The inspection information collection device is set in the inspection area corresponding to the device to be inspected, and is powered on when the device enters the inspection area, and is connected to the device for communication.

13. A patrol inspection quality evaluation device, characterized in that, include: The acquisition module is used to obtain the inspection information output by the inspection information acquisition device corresponding to each of the devices under test when the inspection equipment enters the inspection area corresponding to the device under test in accordance with the preset inspection order. The inspection information includes the inspection time; wherein, the inspection information collection device includes: At least one sensor, corresponding to at least one preset sampling point set in the inspection area, is configured to generate at least one sampling signal when the inspection equipment enters the inspection area corresponding to the inspection information collection device. A timer, electrically connected to the at least one sensor, is configured to output a timing signal based on the at least one sampled signal; A transceiver, electrically connected to the timer, is configured to obtain the timing signal, calculate the dwell time of the device under test in the inspection area based on the timing signal, and transmit the dwell time to the inspection device; A power supply unit, electrically connected to the at least one sensor, the timer, and the transceiver, is configured to provide a power signal; The distance between each of the sensors, the timer, and the transceiver is greater than a preset distance; The inspection information acquisition device further includes a controller, which is electrically connected to the at least one sensor and the power supply unit, and is configured as follows: Obtain at least one sampling signal generated by the at least one sensor, and control the power supply unit to supply power to the timer and the transceiver respectively based on the at least one sampling signal; The inspection information also includes the location information of the device to be inspected; The transceiver is also used to transmit equipment status information to the inspection equipment, so that the inspection equipment uploads the equipment status information to the server when it is within the corresponding status standard range; The processing module is used to determine the inspection status based on the inspection information; The inspection information collection device is set in the inspection area corresponding to the device to be inspected, and is powered on when the device enters the inspection area, and is connected to the device for communication.

14. A server, characterized in that, include: A processor, and a memory communicatively connected to the processor; The memory stores computer-executed instructions; The processor executes computer execution instructions stored in the memory to implement the method as described in claim 12.

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