Intercom and method for self-checking an intercom

Abstract

This application discloses a walkie-talkie and a self-testing method for it. The walkie-talkie includes a processor, an radio frequency (RF) circuit, a power supply, and a self-testing circuit. The RF circuit is coupled to the processor and is used to transmit and receive RF signals. The power supply is coupled to the processor and the RF circuit and is used to provide electrical energy. The self-testing circuit is coupled to the processor, the power supply, and the RF circuit. The processor, in self-test mode, performs a self-test on the operating status of the RF circuit and the power supply through the self-testing circuit to determine whether any abnormalities have occurred in their operation. Through this method, this application enables fault detection in the walkie-talkie.

Description

Technical Field

[0001] This application relates to the field of walkie-talkie technology, and in particular to walkie-talkies and walkie-talkie self-testing methods. Background Technology

[0002] With the development of communication technology, more and more communication devices serve people's lives and work, providing them with great convenience. Walkie-talkies are a two-way mobile communication tool that allows communication without any network support or call charges, making them suitable for relatively fixed and frequent communication situations.

[0003] Existing walkie-talkies are often only discovered to have malfunctions when they occur during use, lacking effective fault detection, which often leads to disruptions in normal use. Summary of the Invention

[0004] The main technical problem addressed by this application is to provide a walkie-talkie capable of fault detection.

[0005] To address the aforementioned technical problems, this application provides a walkie-talkie comprising a processor, an radio frequency (RF) circuit, a power supply, and a self-test circuit. The RF circuit is coupled to the processor and is used to transmit and receive RF signals. The power supply is coupled to the processor and the RF circuit and is used to provide electrical energy. The self-test circuit is coupled to the processor, the power supply, and the RF circuit. Specifically, the processor, in self-test mode, performs a self-test on the operating status of the RF circuit and the power supply through the self-test circuit to determine whether any operational abnormalities have occurred in the RF circuit and the power supply.

[0006] To solve the above-mentioned technical problems, the second technical solution adopted in this application is: to provide a self-testing method for a walkie-talkie, the walkie-talkie including a processor, an radio frequency circuit, a power supply, and a self-testing circuit, the radio frequency circuit being coupled to the processor, the power supply being coupled to the processor and the radio frequency circuit, and the self-testing circuit being coupled to the processor, the power supply, and the radio frequency circuit, the self-testing method including: starting a self-testing mode; performing a self-test on the operating status of the radio frequency circuit and the power supply through the self-testing circuit; and determining whether the radio frequency circuit and the power supply have any abnormal operation through the processor.

[0007] The beneficial effects of this application are as follows: Unlike the prior art, by setting a processor, radio frequency circuit, power supply and self-test circuit in the walkie-talkie, wherein the self-test circuit is coupled to the processor, power supply and radio frequency circuit, the processor can perform self-test on the operating status of the radio frequency circuit and power supply through the self-test circuit in self-test mode, so as to determine whether there is any abnormal operation of the radio frequency circuit and power supply, realize the fault detection of the walkie-talkie, discover and troubleshoot problems such as abnormal operation of the walkie-talkie, effectively avoid abnormal operation due to faults during use, and effectively ensure the normal use of the walkie-talkie. Attached Figure Description

[0008] Figure 1 This is a schematic block diagram of the circuit structure of the walkie-talkie embodiment of this application;

[0009] Figure 2 This is a flowchart illustrating an embodiment of the self-testing method for walkie-talkies in this application. Detailed Implementation

[0010] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0011] With the development of communication technology, more and more communication devices serve people's lives and work, providing them with great convenience. Among them, walkie-talkies, as a relatively special type of communication device, are widely used in relatively fixed and frequent communication situations because they do not require any network support to make calls and incur no call charges. These situations include industries such as public security, civil aviation, transportation, water conservancy, railway, manufacturing, construction, and services, where they are used for communication and command and dispatch among group members to improve communication efficiency and the ability to respond quickly to emergencies.

[0012] The inventors of this application, through long-term research, have discovered that existing walkie-talkies lack fault detection. Often, malfunctions are only discovered when users experience abnormalities during use, leading users to put faulty products into operation and affecting normal usage needs. Based on this, this application proposes the following embodiments to solve the aforementioned technical problems.

[0013] The following walkie-talkie embodiments describe an exemplary structure of the walkie-talkie.

[0014] like Figure 1 As shown, the walkie-talkie 1 includes a processor 100, an radio frequency (RF) circuit 200, a power supply 300, and a self-test circuit 400. The RF circuit 200 is coupled to the processor 100 and is used to transmit and receive RF signals. The power supply 300 is coupled to the processor 100 and the RF circuit 200 and is used to provide electrical energy. The self-test circuit 400 is coupled to the processor 100, the power supply 300, and the RF circuit 200.

[0015] The walkie-talkie 1 is equipped with a self-test mode. The processor 100 performs a self-test in this mode using the self-test circuit 400 to check the operating status of the radio frequency circuit 200 and the power supply 300, determining whether any malfunctions have occurred. Optionally, the walkie-talkie 1 has at least one function button 800. One function button 800 or a combination of at least two function buttons 800 is configured to trigger the self-test mode. The function button 800 can be a power button; when pressed, the power supply 300 supplies power to turn on the walkie-talkie 1 and triggers the self-test mode. Alternatively, the function button 800 can also be a self-test button; when the walkie-talkie 1 is on, pressing the self-test button triggers the self-test mode for self-testing. Controlling the walkie-talkie 1 to trigger the self-test mode via the function button 800 is convenient and quick, allowing for timely fault detection and repair, preventing faulty walkie-talkies from being put into service, and effectively ensuring the usability of the walkie-talkie 1.

[0016] Optionally, such as Figure 1 As shown, the self-test circuit 400 includes a detection sensor 410, which is coupled to the processor 100 and the radio frequency circuit 200, and is used to detect whether there are any abnormalities in the transmission and reception of radio frequency signals by the radio frequency circuit 200. The detection sensor 410 can be an electromagnetic wave absorption ratio sensor (SAR sensor) or other sensors.

[0017] Optionally, such as Figure 1 As shown, the self-test circuit 400 includes a current sampling circuit 420, which is coupled to the radio frequency circuit 200 and the power supply 300. The current sampling circuit 420 collects current data and sends it to the processor 100, allowing the processor 100 to determine whether the radio frequency circuit 200 and the power supply 300 are malfunctioning. The current data can be a numerical value of the current or a change in the current. Specifically, in self-test mode, the current sampling circuit 420 collects first current data when the radio frequency circuit 200 is operating, and the processor 100 uses this first current data to determine whether the radio frequency circuit 200 is malfunctioning.

[0018] like Figure 1As shown, the radio frequency circuit 200 includes a transmitting circuit 210, which is coupled to the processor 100 and the detection sensor 410, and is used to transmit radio frequency signals. In self-test mode, the processor 100 controls the transmitting circuit 210 to transmit a first detection signal at a first preset power. The detection sensor 410 detects the transmission power of the first detection signal and sends it to the processor 100. The processor 100 uses the transmission power of the first detection signal to determine whether the transmitting circuit 210 is malfunctioning. Specifically, the processor 100 compares the transmission power of the first detection signal with a first preset threshold range. If the power is within this range, the processor 100 determines that the transmitting circuit 210 is not malfunctioning; otherwise, it determines that the transmitting circuit 210 is malfunctioning. Optionally, the transmitting circuit 210 includes an output circuit 211, a low-pass filter 212, and an antenna 213. The processor 100 controls the output circuit 211 to transmit the radio frequency signal, which is then filtered by the low-pass filter 212 before being transmitted through the antenna 213.

[0019] Furthermore, the current sampling circuit 420 is used to collect first current data when the transmitting circuit 210 transmits the first detection signal, and the processor 100 uses the first current data to determine whether the transmitting circuit 210 has experienced an operational abnormality. The first current data can be collected at least once; for example, the current sampling circuit 420 can collect the first current data when the transmitting circuit 210 is preparing to transmit the first detection signal, and collect the first current data again during transmission, so that the processor 100 can identify the current change when the transmitting circuit 210 transmits the first detection signal, for example, determining whether the change in the first current data is within the first current data change threshold range, thereby determining whether the transmitting circuit 210 has experienced an operational abnormality.

[0020] like Figure 1 As shown, the radio frequency circuit 200 includes a receiving front-end circuit 220, which is coupled to the processor 100, the detection sensor 410, and the transmitting circuit 210. It is used to receive radio frequency signals and perform front-end processing. In self-test mode, the processor 100 controls the transmitting circuit 210 to transmit a second detection signal at a second preset power. The receiving front-end circuit 220 receives the second detection signal and performs front-end processing on it to obtain a front-end processed signal. The detection sensor 410 detects the power of the front-end processed signal and sends it to the processor 100. The processor 100 uses the power of the front-end processed signal to determine whether the receiving front-end circuit 220 is malfunctioning. Specifically, the processor 100 compares the power of the front-end processed signal with whether it is within a second preset threshold range. If it is, the receiving front-end circuit 220 is determined to be functioning normally; otherwise, it is determined to be malfunctioning.

[0021] Specifically, the receiving front-end circuit 220 includes a first bandpass filter 221, a low-noise amplifier 222, and a second bandpass filter 223. The first bandpass filter 221 is coupled to the transmitting circuit 210 and the low-noise amplifier 222, the low-noise amplifier 222 is coupled to the second bandpass filter 223, and the second bandpass filter 223 is coupled to the detection sensor 410. The first bandpass filter 221 is used to filter the second detection signal. The low-noise amplifier 222 is used to amplify the second detection signal processed by the first bandpass filter 221, and the second bandpass filter 223 is used to filter the second detection signal amplified by the low-noise amplifier 222 to output a front-end processed signal.

[0022] like Figure 1 As shown, the RF circuit 200 includes a receiving back-end circuit 230, which is coupled to the processor 100 and the receiving front-end circuit 220. The receiving back-end circuit 230 processes the RF signal output by the receiving front-end circuit 220 and performs back-end processing. Specifically, in self-test mode, the receiving back-end circuit 230 generates an oscillation signal, performs mixing, frequency selection, and intermediate frequency processing on the oscillation signal, and sends a signal strength indication to the processor 100. The processor 100 uses the signal strength indication to determine whether the receiving back-end circuit 230 has malfunctioned.

[0023] Specifically, the receiving back-end circuit 230 includes a crystal oscillator 231, a harmonic amplifier 232, a mixer 233, and an intermediate frequency (IF) processing circuit 234. The crystal oscillator 231 is coupled to the harmonic amplifier 232, which is coupled to the mixer 233 and the processor 100. The mixer 233 is coupled to the IF processing circuit 234, which is coupled to the processor 100. In self-test mode, the crystal oscillator 231 performs oscillation processing to obtain an oscillation signal. The processor 100 controls the harmonic amplifier 232 to receive the oscillation signal. The harmonic amplifier 232 performs harmonic frequency selection processing on the oscillation signal. The mixer 233 performs mixing processing on the oscillation signal processed by the harmonic amplifier 232. The IF processing circuit 234 performs IF processing on the oscillation signal processed by the mixer 233 and sends a signal strength indication to the processor 100. The processor 100 is used to determine whether the signal strength indication is greater than or equal to the preset strength indication. If it is, it determines that the receiving back-end circuit 230 is operating normally; if not, it determines that the receiving back-end circuit 230 is malfunctioning.

[0024] The walkie-talkie 1 also includes a speaker 500. The speaker 500 is coupled to the processor 100 and the current sampling circuit 420. The speaker 500 is used to play a test audio in self-test mode. Specifically, the processor 100 controls the speaker 500 to turn on and play the test audio. The current sampling circuit 420 collects second current data while the speaker 500 is playing the test audio. The processor 100 uses the second current data to determine whether the power consumption of the speaker 500's receiving path is malfunctioning. The test audio can be, for example, a beep. The current sampling circuit 420 can collect at least one second current data point, for example, collecting second current data when the speaker 500 is about to play the test audio, and collecting second current data again while the speaker 500 is playing the test audio, so that the processor 100 can identify the current change when the speaker 500 plays the test audio. For example, it can determine whether the current change in the second current data is within the threshold range of the second current data, thereby determining whether the power consumption of the speaker 500's receiving path is malfunctioning. Optionally, in self-test mode, when the processor 100 determines that the walkie-talkie 1 is malfunctioning, it controls the speaker 500 to play a warning tone.

[0025] The walkie-talkie 1 also includes a microphone 600, which is coupled to the processor 100. In self-test mode, the processor 100 controls the speaker 500 to play test audio and controls the microphone 600 to pick up the sound signal generated by the test audio. The processor 100 calculates the signal strength of the sound signal and compares it with a preset signal strength to determine whether there is any malfunction in the uplink between the microphone 600 and the processor 100, and in the downlink between the speaker 500 and the processor 100. Optionally, in self-test mode, the processor 100 controls the microphone 600 to pick up noise signals generated by ambient noise. The processor 100 calculates the signal strength of the noise signal and compares it with a preset signal strength to determine whether there is any malfunction in the uplink between the microphone 600 and the processor 100.

[0026] The walkie-talkie 1 may also include a display screen 700, which is coupled to the processor 100. In self-test mode, the processor 100 is used to control the display screen 700 to display corresponding prompts when a malfunction occurs in the walkie-talkie 1.

[0027] The power supply 300 can be a smart battery, used to generate power information, internal resistance information and voltage information during operation. The processor 100 is used to acquire the power information, internal resistance information and voltage information to determine whether the power supply 300 is malfunctioning.

[0028] Optionally, such as Figure 1As shown, the self-test circuit 400 includes a voltage sampling circuit 430, which is coupled to the radio frequency circuit 200 and the power supply 300. The voltage sampling circuit 430 collects voltage data and sends it to the processor 100, allowing the processor 100 to determine whether the radio frequency circuit 200 and the power supply 300 are malfunctioning. In self-test mode, the voltage sampling circuit 430 collects at least one light-load voltage data and at least one heavy-load voltage data during the power supply process of the power supply 300. The current sampling circuit 420 collects at least one light-load current data and at least one heavy-load current data during the power supply process of the power supply 300 and sends them to the processor 100. The processor 100 calculates the internal resistance value of the power supply 300 using the difference between the light-load voltage data and the heavy-load voltage data, and the difference between the light-load current data and the heavy-load current data. The processor 100 then compares the internal resistance value with a preset resistance value to determine whether the power supply 300 is malfunctioning.

[0029] Specifically, when the power supply 300 starts supplying power but the transmitting circuit 210 is off, the voltage sampling circuit 430 collects light-load voltage data, and the current sampling circuit 420 collects light-load current data. After the transmitting circuit 210 starts operating, the voltage sampling circuit 430 collects heavy-load voltage data, and the current sampling circuit 420 collects heavy-load current data. The processor 100 uses the difference between the light-load voltage data and the heavy-load voltage data, as well as the difference between the light-load current data and the heavy-load current data, to calculate the internal resistance value of the power supply 300, and compares the internal resistance value with a preset resistance value to determine whether the power supply 300 is malfunctioning.

[0030] like Figure 2 As shown in the embodiments of the walkie-talkie self-testing method described in this application, the walkie-talkie self-testing method may include:

[0031] S100: Start self-test mode.

[0032] S200: Performs self-test on the operating status of the RF circuit and power supply through a self-test circuit.

[0033] The walkie-talkie 1 includes a processor 100, a radio frequency circuit 200, a power supply 300, and a self-test circuit 400. The radio frequency circuit 200 is coupled to the processor 100, the power supply 300 is coupled to the processor 100 and the radio frequency circuit 200, and the self-test circuit 400 is coupled to the processor 100, the power supply 300, and the radio frequency circuit 200.

[0034] Optionally, the self-test circuit 400 includes a detection sensor 410, which is coupled to the processor 100 and the radio frequency circuit 200. In self-test mode, the self-test circuit 400 performs a self-test on the operating status of the radio frequency circuit 200. Specifically, see the following steps included in S200:

[0035] S210: Detects whether there are any abnormalities in the transmission and reception of radio frequency signals by the radio frequency circuit through the detection sensor.

[0036] Optionally, the radio frequency circuit 200 includes a receiving front-end circuit 220 and a transmitting circuit 210, with the transmitting circuit 210 coupled to the processor 100 and the detection sensor 410. In self-test mode, the transmitting circuit 210 transmits a first detection signal to perform a self-test on the operating status of the transmitting circuit 210. See the following steps for details:

[0037] S220: The processor controls the transmitting circuit to send a first detection signal at a first preset power.

[0038] S221: The transmission power of the first detection signal is detected by a detection sensor.

[0039] S222: The processor compares whether the transmission power of the first detection signal is within the range of the first preset threshold.

[0040] The processor 100 compares whether the transmission power of the first detection signal is within the range of the first preset threshold. If it is, it determines that the transmission circuit 210 has no operational abnormality; if not, it determines that the transmission circuit 210 has an operational abnormality.

[0041] Optionally, the receiving front-end circuit 220 is coupled to the processor 100, the detection sensor 410, and the transmitting circuit 210. In self-test mode, the transmitting circuit 210 transmits a second detection signal to perform a self-test on the operating status of the receiving front-end circuit 220. See the following steps for details:

[0042] S230: The processor controls the transmitting circuit to send a second detection signal at a second preset power.

[0043] S231: Receive the second detection signal through the receiving front-end circuit, and perform front-end processing on the second detection signal to obtain the front-end processed signal.

[0044] S232: Detects the power of the front-end processed signal by detecting the sensor.

[0045] S233: The processor compares whether the power of the front-end processed signal is within the range of the second preset threshold.

[0046] The processor 100 compares whether the power of the front-end processed signal is within the range of the second preset threshold. If it is, it determines that the receiving front-end circuit 220 has no abnormal operation; if not, it determines that the receiving front-end circuit 220 has an abnormal operation.

[0047] Optionally, the self-test circuit 400 includes a current sampling circuit 420, which is coupled to the radio frequency circuit 200 and the power supply 300. The radio frequency circuit 200 includes a transmitting circuit 210, which is coupled to the processor 100. In self-test mode, the operating status of the transmitting circuit 210 is self-tested through the current sampling circuit 420. See the following steps for details:

[0048] S240: The processor controls the transmitting circuit to send a first detection signal at a first preset power.

[0049] S241: The first current data is collected by the current sampling circuit when the first detection signal is transmitted by the transmitting circuit.

[0050] S242: The processor uses the first current data to determine whether the transmitting circuit is malfunctioning.

[0051] Optionally, the self-test circuit 400 includes a current sampling circuit 420 and a voltage sampling circuit 430. The current sampling circuit 420 is coupled to the radio frequency circuit 200 and the power supply 300, and the voltage sampling circuit 430 is coupled to the radio frequency circuit 200 and the power supply 300. In self-test mode, the operating status of the radio frequency circuit 200 is self-tested through the current sampling circuit 420, and the operating status of the power supply 300 is self-tested through the voltage sampling circuit 430. See the following steps for details:

[0052] S250: Acquires the first current data when the radio frequency circuit is working through the current sampling circuit.

[0053] S251: The processor uses the first current data to determine whether the radio frequency circuit is malfunctioning.

[0054] S252: The voltage sampling circuit collects at least one light-load voltage data and at least one heavy-load voltage data during the power supply process.

[0055] S253: Collect at least one light-load current data and at least one heavy-load current data during the power supply process by means of a current sampling circuit.

[0056] S254: The processor calculates the internal resistance of the power supply by using the difference between light load voltage data and heavy load voltage data, as well as the difference between light load current data and heavy load current data, and compares the internal resistance with the preset resistance to determine whether the power supply is malfunctioning.

[0057] Optionally, the self-test circuit 400 includes a current sampling circuit 420, which is coupled to the radio frequency circuit 200 and the power supply 300. The walkie-talkie 1 also includes a speaker 500, which is coupled to the processor 100 and the current sampling circuit 420. In self-test mode, the current sampling circuit 420 performs a self-test on the operating status of the radio frequency circuit 200 and the speaker 500. See the following steps for details:

[0058] S260: Acquires the first current data when the radio frequency circuit is working through the current sampling circuit.

[0059] S261: The processor uses the first current data to determine whether the radio frequency circuit is malfunctioning.

[0060] S262: Play test audio through a speaker.

[0061] S263: Acquires second current data through a current sampling circuit when the speaker plays test audio.

[0062] S264: The processor uses the second current data to determine whether there is an operational anomaly in the power consumption of the speaker's receiving path.

[0063] S300: Determines whether there are any operational abnormalities in the radio frequency circuit and power supply through the processor.

[0064] Optionally, the RF circuit 200 includes a receiver back-end circuit 230, which includes a crystal oscillator 231, a harmonic amplifier 232, a mixer 233, and an intermediate frequency (IF) processing circuit 234. The crystal oscillator 231 is coupled to the harmonic amplifier 232, the harmonic amplifier 232 is coupled to the mixer 233 and the processor 100, the mixer 233 is coupled to the IF processing circuit 234, and the IF processing circuit 234 is coupled to the processor 100. In self-test mode, the processor 100 determines whether the receiver back-end circuit 230 has malfunctioned. See the following steps included in S300 for details:

[0065] S310: The oscillation signal is obtained by oscillation processing through a crystal oscillator.

[0066] S311: The processor controls the harmonic amplifier to receive the oscillation signal.

[0067] S312: Harmonic frequency selection processing of oscillation signals through harmonic amplifier.

[0068] S313: The mixer performs frequency mixing on the oscillation signal after it has been processed by the harmonic amplifier.

[0069] S314: Performs intermediate frequency processing on the oscillation signal processed by the mixer through the intermediate frequency processing circuit, and sends a signal strength indication to the processor.

[0070] S315: The processor determines whether the signal strength indicator is greater than or equal to the preset strength indicator. If yes, it determines that the receiving back-end circuit is operating normally; otherwise, it determines that the receiving back-end circuit is malfunctioning.

[0071] Based on the above description, the exemplary use cases of walkie-talkie 1 are detailed below.

[0072] The user turns on the walkie-talkie 1 using the power button, and the power supply 300 starts supplying power. The walkie-talkie 1 triggers a self-test mode to perform a self-test. The voltage sampling circuit 430 collects light-load voltage data, and the current sampling circuit 420 collects light-load current data. The processor 100 controls the transmission circuit 210 to start, and the voltage sampling circuit 430 collects heavy-load voltage data, and the current sampling circuit 420 collects heavy-load current data. The processor 100 uses the difference between the light-load voltage data and the heavy-load voltage data, as well as the difference between the light-load current data and the heavy-load current data, to calculate the internal resistance value of the power supply 300, and compares the internal resistance value with a preset resistance value to determine whether the power supply 300 is malfunctioning.

[0073] The processor 100 controls the speaker 500 and microphone 600 to turn on, and controls the speaker 500 to play test audio. The microphone 600 picks up the sound signal generated by the test audio. The processor 100 calculates the signal strength of the sound signal and compares it with a preset signal strength to determine whether there is any abnormality in the uplink between the microphone 600 and the processor 100, and the downlink between the speaker 500 and the processor 100. The current sampling circuit 420 collects second current data when the speaker 500 plays the test audio. The processor 100 uses the second current data to determine whether there is any abnormality in the power consumption of the speaker 500's receiving path.

[0074] The processor 100 controls the transmitting circuit 210 to send a first detection signal at a first preset power. The detection sensor 410 detects the transmission power of the first detection signal and sends it to the processor 100. The processor 100 uses the transmission power of the first detection signal to determine whether the transmitting circuit 210 has malfunctioned. The current sampling circuit 420 collects first current data when the transmitting circuit 210 transmits the first detection signal. The processor 100 uses the first current data to determine whether the transmitting circuit 210 has malfunctioned.

[0075] The processor 100 controls the transmitting circuit 210 to send the second detection signal at a second preset power. The receiving front-end circuit 220 receives the second detection signal and performs front-end processing on the second detection signal to obtain a front-end processed signal. The detection sensor 410 detects the power of the front-end processed signal and sends it to the processor 100. The processor 100 uses the power of the front-end processed signal to determine whether the receiving front-end circuit 220 has an operational abnormality.

[0076] The crystal oscillator 231 in the receiving back-end circuit 230 performs oscillation processing to obtain an oscillation signal. The processor 100 controls the harmonic amplifier 232 to receive the oscillation signal and perform harmonic frequency selection processing. The mixer 233 performs frequency mixing processing on the oscillation signal processed by the harmonic amplifier 232. The intermediate frequency processing circuit 234 performs intermediate frequency processing on the oscillation signal processed by the mixer 233 and sends a signal strength indication to the processor 100. The processor 100 uses the signal strength indication to determine whether the receiving back-end circuit 230 has an operational abnormality.

[0077] In self-test mode, if the processor 100 determines that an abnormality has occurred, it will issue a warning tone through the speaker 500 and display a corresponding prompt on the display screen 700 so that the user can understand the fault of the walkie-talkie 1. The self-test mode will end after the self-test is completed.

[0078] In summary, by incorporating a processor 100, an RF circuit 200, a power supply 300, a microphone 600, a speaker 500, and a self-test circuit 400 into the walkie-talkie 1, where the self-test circuit 400 is coupled to the processor 100, power supply 300, microphone 600, speaker 500, and RF circuit 200, the processor 100 can perform a self-test in self-test mode using the self-test circuit 400 to check the operating status of the microphone 600, speaker 500, RF circuit 200, and power supply 300. This allows for the determination of whether the walkie-talkie 1 is malfunctioning, enabling effective fault detection and precise location of the malfunctioning component. This facilitates faster and more convenient repairs, effectively preventing users from using a faulty walkie-talkie 1 and avoiding malfunctions during use, thus ensuring the normal operation of the walkie-talkie 1.

[0079] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A walkie-talkie, characterized in that, include: processor; A radio frequency circuit, coupled to the processor, is used to transmit and receive radio frequency signals; A power supply, coupled to the processor and the radio frequency circuit, is used to provide electrical energy; A self-test circuit is coupled to the processor, the power supply, and the radio frequency circuit. The processor is used to perform a self-test on the operating status of the radio frequency circuit and the power supply through the self-test circuit in self-test mode, so as to determine whether the radio frequency circuit and the power supply have any abnormal operation. The self-test circuit includes a detection sensor, which is an electromagnetic wave absorption ratio sensor. The detection sensor is coupled to the processor and the radio frequency circuit and is used to detect whether there is any abnormality in the radio frequency circuit's transmission and reception of radio frequency signals. The radio frequency circuit includes a receiving front-end circuit and a transmitting circuit. The transmitting circuit is used to transmit radio frequency signals, and the receiving front-end circuit is used to receive radio frequency signals and perform front-end processing. The transmitting circuit is coupled to the processor and the detection sensor. In the self-test mode, the processor controls the transmitting circuit to send a first detection signal at a first preset power. The detection sensor detects the transmission power of the first detection signal and sends it to the processor. The processor compares whether the transmission power of the first detection signal is within a first preset threshold range. If it is, it determines that the transmitting circuit has no operational abnormality. If not, it determines that the transmitting circuit has an operational abnormality. The receiving front-end circuit is coupled to the processor, the detection sensor, and the transmitting circuit. In the self-test mode, the processor controls the transmitting circuit to send a second detection signal at a second preset power. The receiving front-end circuit receives the second detection signal and performs front-end processing on the second detection signal to obtain a front-end processed signal. The detection sensor detects the power of the front-end processed signal and sends it to the processor. The processor compares whether the power of the front-end processed signal is within a second preset threshold range. If it is, it determines that the receiving front-end circuit is not malfunctioning; otherwise, it determines that the receiving front-end circuit is malfunctioning.

2. The walkie-talkie according to claim 1, characterized in that: The receiving front-end circuit includes a first bandpass filter, a low-noise amplifier, and a second bandpass filter. When the receiving front-end circuit is coupled to the processor, the detection sensor, and the transmitting circuit, the first bandpass filter is coupled to the transmitting circuit and the low-noise amplifier, the low-noise amplifier is coupled to the second bandpass filter, and the second bandpass filter is coupled to the detection sensor. The first bandpass filter is used to filter the second detection signal. The low-noise amplifier is used to amplify the second detection signal processed by the first bandpass filter. The second bandpass filter is used to filter the second detection signal amplified by the low-noise amplifier to output the front-end processed signal.

3. The walkie-talkie according to claim 1, characterized in that: The radio frequency circuit includes a receiving back-end circuit, which includes a crystal oscillator, a harmonic amplifier, a mixer, and an intermediate frequency processing circuit. The crystal oscillator is coupled to the harmonic amplifier, the harmonic amplifier is coupled to the mixer and the processor, the mixer is coupled to the intermediate frequency processing circuit, and the intermediate frequency processing circuit is coupled to the processor. In the self-test mode, the crystal oscillator is used to perform oscillation processing to obtain an oscillation signal; the processor is used to control the harmonic amplifier to receive the oscillation signal; the harmonic amplifier is used to perform harmonic frequency selection processing on the oscillation signal; the mixer is used to perform frequency mixing processing on the oscillation signal processed by the harmonic amplifier; the intermediate frequency processing circuit is used to perform intermediate frequency processing on the oscillation signal processed by the mixer and send a signal strength indication to the processor; the processor is used to determine whether the signal strength indication is greater than or equal to a preset strength indication. If yes, it is determined that the receiving back-end circuit is operating normally; if no, it is determined that the receiving back-end circuit is malfunctioning.

4. The walkie-talkie according to claim 1, characterized in that: The self-test circuit includes a current sampling circuit, which is coupled to the radio frequency circuit and the power supply. In the self-test mode, the current sampling circuit is used to collect first current data when the radio frequency circuit is working and send it to the processor; the processor is used to use the first current data to determine whether the radio frequency circuit has an operational abnormality.

5. The walkie-talkie according to claim 4, characterized in that: The current sampling circuit is used to collect the first current data when the transmitting circuit transmits the first detection signal; The processor is used to determine whether the transmitting circuit is malfunctioning using the first current data.

6. The walkie-talkie according to claim 4, characterized in that: The self-test circuit includes a voltage sampling circuit, which is coupled to the radio frequency circuit and the power supply, for collecting voltage data and sending it to the processor. In the self-test mode, the voltage sampling circuit is used to collect at least one light-load voltage data and at least one heavy-load voltage data during the power supply process and send them to the processor; the current sampling circuit is used to collect at least one light-load current data and at least one heavy-load current data during the power supply process and send them to the processor; the processor uses the difference between the light-load voltage data and the heavy-load voltage data and the difference between the light-load current data and the heavy-load current data to calculate the internal resistance value of the power supply, and compares the internal resistance value with a preset resistance value to determine whether the power supply has an operational abnormality.

7. The walkie-talkie according to claim 4, characterized in that: The walkie-talkie also includes a speaker, which is coupled to the processor and the current sampling circuit; the speaker is used to play test audio in the self-test mode. The current sampling circuit is used to collect second current data when the speaker plays the test audio. The processor is used to determine whether the power consumption of the speaker's receiving path is malfunctioning using the second current data.

8. The walkie-talkie according to claim 1, characterized in that: The walkie-talkie includes a microphone and a speaker, which are respectively coupled to the processor. In the self-test mode, the processor controls the speaker to play a test audio and controls the microphone to pick up the sound signal generated by playing the test audio. The processor is used to calculate the signal strength of the sound signal and compare the signal strength with a preset signal strength, thereby determining whether there is an operational abnormality in the uplink between the microphone and the processor and the downlink between the speaker and the processor.

9. A self-testing method for a walkie-talkie, characterized in that, The walkie-talkie includes a processor, a radio frequency circuit, a power supply, and a self-test circuit. The radio frequency circuit is coupled to the processor, the power supply is coupled to the processor and the radio frequency circuit, and the self-test circuit is coupled to the processor, the power supply, and the radio frequency circuit. The self-test circuit includes a detection sensor, which is an electromagnetic wave absorption ratio sensor, and the detection sensor is coupled to the processor and the radio frequency circuit. The radio frequency circuit includes a receiving front-end circuit and a transmitting circuit, the transmitting circuit being coupled to the processor and the detection sensor; the self-test method includes: Start self-test mode; The self-test circuit performs a self-test on the operating status of the radio frequency circuit and the power supply. The processor determines whether the radio frequency circuit and the power supply are malfunctioning. The self-testing of the operating status of the radio frequency circuit via the self-testing circuit includes: The detection sensor is used to detect whether there are any abnormalities in the transmission and reception of radio frequency signals by the radio frequency circuit. The self-testing method also includes: The processor controls the transmitting circuit to send a first detection signal at a first preset power. The transmission power of the first detection signal is detected by the detection sensor; The processor compares the transmission power of the first detection signal with the transmission power of the first detection signal to determine whether the transmission circuit is within a first preset threshold range. If the transmission power is within the threshold range, the processor determines that the transmission circuit is not malfunctioning. If not, the processor determines that the transmission circuit is malfunctioning. The receiving front-end circuit is coupled to the processor, the detection sensor, and the transmitting circuit; the self-test method further includes: The processor controls the transmitting circuit to send a second detection signal at a second preset power. The receiving front-end circuit receives the second detection signal and performs front-end processing on the second detection signal to obtain a front-end processed signal. The power of the front-end processed signal is detected by the detection sensor; The processor compares whether the power of the front-end processed signal is within a second preset threshold range. If it is, it is determined that the receiving front-end circuit is not malfunctioning; otherwise, it is determined that the receiving front-end circuit is malfunctioning.

10. The self-testing method according to claim 9, characterized in that, The radio frequency circuit includes a receiving back-end circuit, which includes a crystal oscillator, a harmonic amplifier, a mixer, and an intermediate frequency processing circuit. The crystal oscillator is coupled to the harmonic amplifier, the harmonic amplifier is coupled to the mixer and the processor, the mixer is coupled to the intermediate frequency processing circuit, and the intermediate frequency processing circuit is coupled to the processor. The self-testing method also includes: An oscillation signal is obtained by oscillation processing using the crystal oscillator. The processor controls the harmonic amplifier to receive the oscillation signal. The oscillation signal is subjected to harmonic frequency selection processing by the harmonic amplifier. The mixer performs frequency mixing on the oscillation signal after it has been processed by the harmonic amplifier. The intermediate frequency processing circuit performs intermediate frequency processing on the oscillation signal processed by the mixer and sends a signal strength indication to the processor. The processor determines whether the signal strength indication is greater than or equal to a preset strength indication. If so, the receiving back-end circuit is determined to be operating normally; otherwise, the receiving back-end circuit is determined to be malfunctioning.

11. The self-testing method according to claim 9, characterized in that, The self-test circuit includes a current sampling circuit, which is coupled to the radio frequency circuit and the power supply; the radio frequency circuit includes a transmitting circuit, which is coupled to the processor. The self-test circuit performs a self-test on the operating status of the radio frequency circuit, and the processor determines whether the radio frequency circuit has an operational abnormality, including: The current sampling circuit collects first current data when the transmitting circuit transmits the first detection signal. The processor uses the first current data to determine whether the transmitting circuit is malfunctioning.

12. The self-testing method according to claim 9, characterized in that, The self-test circuit includes a current sampling circuit and a voltage sampling circuit. The current sampling circuit is coupled to the radio frequency circuit and the power supply, and the voltage sampling circuit is coupled to the radio frequency circuit and the power supply. The self-test circuit performs a self-test on the operating status of the radio frequency circuit and the power supply. The processor determines whether the radio frequency circuit and the power supply are experiencing any operational abnormalities, including: The current sampling circuit collects first current data when the radio frequency circuit is working. The processor uses the first current data to determine whether the radio frequency circuit is malfunctioning. The voltage sampling circuit collects at least one light-load voltage data and at least one heavy-load voltage data during the power supply process. The current sampling circuit collects at least one light-load current data and at least one heavy-load current data during the power supply process. The processor calculates the internal resistance of the power supply using the difference between the light load voltage data and the heavy load voltage data, as well as the difference between the light load current data and the heavy load current data, and compares the internal resistance with a preset resistance value to determine whether the power supply is malfunctioning.

13. The self-testing method according to claim 9, characterized in that, The self-test circuit includes a current sampling circuit, which is coupled to the radio frequency circuit and the power supply; the walkie-talkie also includes a speaker, which is coupled to the processor and the current sampling circuit. The self-test circuit performs a self-test on the operating status of the radio frequency circuit, and the processor determines whether the radio frequency circuit has an operational abnormality, including: The current sampling circuit collects first current data when the radio frequency circuit is working. The processor uses the first current data to determine whether the radio frequency circuit is malfunctioning. The self-testing method also includes: The test audio was played through the speaker; The current sampling circuit collects second current data when the speaker plays the test audio. The processor uses the second current data to determine whether there is an operational anomaly in the power consumption of the speaker's receiving path.

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