一种蒸镀掩膜版及其形成方法

By using an ultra-thin wafer and a fine etching process to form a vapor deposition mask, the problem of high-precision sub-pixel vapor deposition difficulty in existing vapor deposition masks has been solved, achieving ultra-thin size and high-precision vapor deposition effect, avoiding deformation and screen door effect.

CN118308686BActive Publication Date: 2026-07-17ZHEJIANG HONGXI TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
ZHEJIANG HONGXI TECH CO LTD
Filing Date
2024-04-09
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing vapor deposition masks are difficult to use for sub-pixel deposition at the 1-micron level and below, and are prone to deformation during the deposition process, which cannot meet the high precision requirements of OLED devices.

Method used

Using an ultra-thin wafer as the main mask, combined with a protective layer and a metal layer, fine sub-vaporized vias and vapor-deposited vias are formed through anisotropic dry etching process. A sacrificial layer is used to protect the precision of the sub-vaporized vias, and excess material is removed by chemical mechanical polishing and wet etching.

Benefits of technology

An ultra-thin vapor deposition mask has been developed, which can accurately deposit sub-pixels at the level of 1 micrometer and below, avoiding the screen-door effect and meeting the high precision requirements of OLED devices.

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Abstract

本申请提供一种蒸镀掩膜版及其形成方法,所述蒸镀掩膜版包括:晶圆,所述晶圆包括相对的第一面和第二面;保护层,位于所述晶圆的第一面和第二面;金属层,位于所述第一面和第二面的保护层表面;若干组子蒸镀通孔,位于所述第一面的金属层中暴露所述第一面的保护层,每组子蒸镀通孔包括至少三个子蒸镀通孔;若干蒸镀通孔,位于所述第二面贯穿所述第二面的金属层、第二面的保护层、晶圆和第一面的保护层暴露所述第一面的金属层,其中,每个蒸镀通孔连接一组子蒸镀通孔及该组子蒸镀通孔之间的区域。本申请的蒸镀掩膜版及其形成方法,能够具有超薄尺寸并且实现1微米及以下级别的子像素蒸镀,不会在实际蒸镀过程中产生纱窗效应。
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