Intelligent multi-dimensional visual inspection equipment for small electronic components

Abstract

The present application relates to a kind of small electronic components intelligent multi-dimensional visual inspection equipment.Small electronic components intelligent multi-dimensional visual inspection equipment includes feeding device, discharging device, material taking device, material shifting device, feeding conveyor, visual inspection device, unloading conveyor, discharging conveyor, material receiving device and unloading device, for the automatic detection of small electronic components, to reduce the probability of false detection, missed detection and other situations, improve detection reliability.Feeding bin and unloading groove can be respectively placed in multiple layers first tray and multiple layers second tray, first tray and second tray can be placed in multiple small electronic components, facilitate the batch transfer of small electronic components and batch unloading transfer, detection efficiency is higher;Material taking device, discharging device, material shifting device and first lifting mechanism cooperate with each other, further improve detection efficiency;Discharging conveyor, material receiving device and second lifting mechanism cooperate with each other, further improve the detection efficiency.

Description

Technical Field

[0001] This invention relates to the field of small electronic component inspection technology, and in particular to an intelligent multi-dimensional visual inspection device for small electronic components. Background Technology

[0002] With the rapid development of electronic information technology, digital electronic products are being updated at an increasingly faster pace. Sales of consumer electronics products, mainly flat-screen TVs, laptops, and digital cameras, continue to grow, driving the growth of small electronic components. However, some defective products (such as those with poor soldering, short circuits, or peeling leads) are inevitable during the production process of small electronic components, posing safety hazards during use. Therefore, it is necessary to test small electronic components after production.

[0003] The existing testing methods have several shortcomings. First, the testing of small electronic components is mainly done manually, and with a large number of components to be tested, it is easy to miss or misdetect them. Second, during the transportation of small electronic components, multiple small electronic components are often stacked together, requiring manual separation, which results in low testing efficiency. Summary of the Invention

[0004] Therefore, it is necessary to provide a smart multidimensional vision inspection device for small electronic components with high detection efficiency and high detection reliability.

[0005] A small-scale intelligent multi-dimensional vision inspection device for electronic components includes: A feeding device includes a first lifting mechanism, a feeding platform, a feeding bin, and multiple first trays; the feeding platform is disposed on top of the first lifting mechanism and is used to place the feeding bin; multiple first tray portions are formed at intervals along the height direction inside the feeding bin; each first tray is slidably placed on a corresponding first tray portion; multiple parallel and spaced first grooves are formed on the first trays; the first grooves are used to carry small electronic components to be tested arranged in rows; the first lifting mechanism is configured to drive the feeding bin to lift and lower to adjust the height of each first tray; The discharge device includes a first conveying mechanism and a guiding mechanism; the guiding mechanism has a plurality of guiding grooves formed at intervals; the first conveying mechanism is located directly below the guiding mechanism, and each guiding groove is aligned with the conveying surface of the first conveying mechanism; The material handling device is located between the material guiding mechanism and the loading platform, and is configured to be able to extract a first material tray from the loading bin and move it to a position close to the material guiding mechanism, and to align one end of the plurality of first material troughs with one end of the plurality of material guiding troughs respectively. A feeding device is located above the feeding device and is configured to feed small electronic components in multiple first material slots into multiple guide slots, and is located on the conveying surface of the first conveying mechanism. The feeding conveying device has its upstream end connected to the downstream end of the first conveying mechanism; the conveying direction of the feeding conveying device is arranged to intersect with the conveying direction of the first conveying mechanism. A visual inspection device, the inlet of which is connected to the downstream end of the feeding conveyor; the visual inspection device is used to perform visual inspection on the small electronic components sent by the feeding conveyor and to reject the small electronic components that are found to be unqualified. The upstream end of the feeding and conveying device is connected to the discharge end of the visual inspection device; A discharge conveying device, the upstream end of which is connected to the downstream end of the discharge conveying device; A receiving device is located at the downstream end of the discharge conveying device; a plurality of spaced discharge troughs are formed at one end of the receiving device near the discharge conveying device; the receiving device is operable to move left and right relative to the discharge conveying device so as to align the conveying surface of the discharge conveying device with any of the discharge troughs in the conveying direction of the discharge conveying device. The unloading device includes a second lifting mechanism, an unloading platform, an unloading bin, and multiple second trays. The unloading platform is located on top of the second lifting mechanism and is used to place the unloading bin. Multiple second tray sections are spaced apart along the height of the unloading bin. Each second tray is slidably placed on its corresponding second tray section. Multiple parallel and spaced-apart second troughs are formed on each second tray. The second troughs are used to hold rows of qualified small electronic components. The second lifting mechanism is configured to lift the unloading bin to adjust the height of each second tray section. The receiving device is used to take an empty second tray from the unloading bin and transport it directly below the plurality of discharge troughs, and to align the plurality of second trays with the plurality of discharge troughs one by one. It is also used to push the second tray into the unloading bin when the second tray is full of qualified small electronic components.

[0006] The aforementioned intelligent multi-dimensional vision inspection equipment for small electronic components is used for automatic inspection of small electronic components, reducing the probability of false detections and missed detections, and improving the reliability of small electronic component inspection. In practical use, a loading hopper can hold multiple layers of first trays, and a unloading hopper can hold multiple layers of second trays. Each first tray can hold multiple small electronic components to be inspected, and each second tray can hold multiple qualified small electronic components, facilitating the batch transfer of components to be inspected. The collection and batch transfer of qualified small electronic components after inspection improves inspection efficiency. Furthermore, the picking device, discharging device, feeding device, and first lifting mechanism work together to achieve automatic and orderly loading of small electronic components, ensuring that multiple components to be inspected... Small electronic components are transported in a single-row queue on the feeding conveyor to prevent multiple components from stacking together during transport, thus improving inspection efficiency. Furthermore, the unloading conveyor, receiving device, and second lifting mechanism work together to sequentially and orderly feed qualified small electronic components from the unloading conveyor into each of the second slots of the second material tray, and automatically push them into the unloading bin. This achieves automatic collection and batch unloading of qualified small electronic components after inspection, further improving inspection efficiency. Therefore, the aforementioned intelligent multi-dimensional vision inspection equipment for small electronic components exhibits high inspection reliability and efficiency in the batch inspection of small electronic components. Attached Figure Description

[0007] Figure 1 This is a schematic diagram of the structure of the intelligent multi-dimensional vision inspection device for small electronic components in a preferred embodiment of the present invention from one viewpoint; Figure 2 This is a schematic diagram of the structure of the intelligent multi-dimensional vision inspection device for small electronic components in a preferred embodiment of the present invention from another perspective; Figure 3 for Figure 1 and Figure 2 A schematic diagram of the feeding device in the intelligent multi-dimensional vision inspection equipment for small electronic components shown. Figure 4 for Figure 1 and Figure 2 A schematic diagram of the structure of the first tray in the intelligent multidimensional vision inspection equipment for small electronic components shown. Figure 5 for Figure 1 A magnified view of part B in the intelligent multi-dimensional vision inspection device for small electronic components shown; Figure 6 for Figure 1 and Figure 2A schematic diagram of the receiving device in the intelligent multi-dimensional vision inspection equipment for small electronic components shown. Figure 7 for Figure 1 and Figure 2 A schematic diagram of the unloading device in the intelligent multi-dimensional vision inspection equipment for small electronic components shown. Figure 8 for Figure 1 and Figure 2 A schematic diagram of the structure of the second tray in the intelligent multi-dimensional vision inspection equipment for small electronic components shown. Figure 9 for Figure 1 and Figure 2 A schematic diagram of the box structure in the intelligent multidimensional vision inspection equipment for small electronic components shown. Figure 10 for Figure 1 and Figure 2 The diagram shows the installation status of the material handling device and the material feeding device in the intelligent multi-dimensional vision inspection equipment for small electronic components. Figure 11 for Figure 1 A magnified view of part B of the intelligent multi-dimensional vision inspection device for small electronic components shown. Figure 12 for Figure 2 The image shows a partial enlarged view of the intelligent multi-dimensional vision inspection device for small electronic components.

[0008] Labeling Explanation: 10. Intelligent Multi-Dimensional Vision Inspection Equipment for Small Electronic Components; 100. Feeding Device; 110. First Lifting Mechanism; 120. Feeding Platform; 130. First Material Tray; 131. First Material Trough; 200. Discharging Device; 210. First Conveying Mechanism; 220. Guiding Mechanism; 221. Guiding Trough; 224. Limiting Plate; 300. Picking Device; 310. First Support; 311. First Position; 312. Second Position; 320. First Material Support Structure; 330. First Hooking Structure; 331. First Hooking Head; 332. First Hooking Lifting Mechanism; 340 350. First material dragging drive component; 400. First hooking drive component; 410. Material feeding device; 411. Second bracket; 412. First sub-position; 413. Third sub-position; 420. Material feeding lifting structure; 430. Material feeding rake; 440. Material lifting lifting structure; 450. Material lifting rake; 460. First lateral movement drive component; 470. Second lateral movement drive component; 480. Material feeding guide plate; 481. Guide groove; 490. Guide lifting drive component; 500. Material feeding conveyor device; 510. Material feeding conveyor bracket; 520. Material feeding belt; 530. Discharge plate; 540. Discharge drive component; 600. Vision inspection device; 700. Material feeding conveyor; 800. Discharge conveyor; 900. Material receiving device; 910. Discharge chute; 920. Material receiving base; 930. Third support; 931. Third position; 932. Fourth position; 950. Second material support structure; 960. Second hooking structure; 961. Second hooking head; 962. Second hooking lifting mechanism; 970. Second material dragging drive component; 980. Second hooking drive component; 1010. Discharge device; 1011. Second lifting mechanism; 1012. Discharge platform; 1013. Second material tray; 10131, Second material trough; 2000, Box structure; 2010, Storage box; 2011, Inlet / outlet; 2012, First lifting structure; 2013, Second lifting structure; 2020, Material stop bar; 2030, Handle structure; 3000, First counting sensor; 4000, Correction mechanism; 4010, Correction drive component; 4020, Correction plate; 5010, Material stop plate; 5020, Material stop drive component; 5030, Second counting sensor; 6000, First frame; 7000, Second frame; 8000, Third frame; 9000, Roller. Detailed Implementation

[0009] To facilitate understanding of the present invention, a more complete description will be given below with reference to the accompanying drawings. Preferred embodiments of the invention are shown in the drawings. However, the invention can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of the invention.

[0010] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0011] When describing positional relationships, unless otherwise specified, when an element is referred to as being "on" another element, it may be directly on the other element or there may be intermediate elements. It is also understood that when an element is referred to as being "between" two elements, it may be the only one between the two elements, or there may be one or more intermediate elements.

[0012] When using the terms “including,” “having,” and “comprising” as described herein, another component may be added unless explicitly qualifying terms such as “only,” “consisting of,” etc. are used. Unless otherwise stated, singular terms may include plural forms and should not be construed as having a quantity of one.

[0013] Furthermore, the accompanying drawings are not drawn to a 1:1 scale, and the relative dimensions of the components are shown in the drawings only as examples and not necessarily to actual scale.

[0014] Please see Figure 1 and Figure 2 The intelligent multi-dimensional vision inspection device 10 for small electronic components in a preferred embodiment of the present invention is used for batch inspection of small electronic components. The intelligent multi-dimensional vision inspection device 10 for small electronic components includes a feeding device 100, a discharging device 200, a picking device 300, a feeding and distributing device 400, a feeding conveying device 500, a vision inspection device 600, a discharging conveying device 700, a discharging conveying device 800, a receiving device 900, and a discharging device 1010.

[0015] Please refer to the following: Figure 3 and Figure 4 The loading device 100 includes a first lifting mechanism 110, a loading platform 120, a loading bin (not shown in the figure), and multiple first trays 130. The loading platform 120 is disposed on top of the first lifting mechanism 110 and is used to place the loading bin. Multiple first tray portions (not shown in the figure) are formed at intervals along its height direction inside the loading bin. Each first tray 130 is slidably placed on a corresponding first tray portion. Multiple parallel and spaced first grooves 131 are formed on the first trays 130. The first grooves 131 are used to hold small electronic components to be tested placed in rows. The first lifting mechanism 110 is configured to drive the loading bin to lift and lower to adjust the height of each first tray 130.

[0016] Please refer to the following: Figure 5 The discharge device 200 includes a first conveying mechanism 210 and a guiding mechanism 220. The guiding mechanism 220 has a plurality of guiding grooves 221 formed at intervals. The first conveying mechanism 210 is located directly below the guiding mechanism 220, and each guiding groove 221 is aligned with the conveying surface of the first conveying mechanism 210.

[0017] The material handling device 300 is located between the material guiding mechanism 220 and the loading platform 120, and is configured to be able to extract a first material tray 130 from the loading bin and move it to a position close to the material guiding mechanism 220, and align one end of the plurality of first material troughs 131 with one end of the plurality of material guiding troughs 221 respectively.

[0018] The feeding device 400 is located above the picking device 300 and is configured to transfer small electronic components in the multiple guide slots 221 one by one into the multiple guide slots 221, and is located on the conveying surface of the first conveying mechanism 210. That is, the discharging device 200 transfers the small electronic components in each of the first slots 131 of the first tray 130 into the corresponding guide slots 221.

[0019] The upstream end of the feeding conveyor 500 is connected to the downstream end of the first conveying mechanism 210. The conveying direction of the feeding conveyor 500 is intersected with the conveying direction of the first conveying mechanism 210.

[0020] The inlet of the visual inspection device 600 is connected to the downstream end of the feeding conveyor 500. The visual inspection device 600 is used to visually inspect the small electronic components fed by the feeding conveyor 500 and reject those that are found to be unqualified. Specifically, the visual inspection device 600 acquires image information of the small electronic components to be inspected, and determines whether the components have defects such as poor soldering, short circuits, or peeling wires based on the image information. Defective small electronic components are rejected and collected, while qualified small electronic components without defects are continued to be conveyed forward.

[0021] More specifically, the visual inspection device 600 can perform multi-faceted visual inspection on small electronic components to ensure comprehensive inspection and reliability. The visual inspection device 600 can perform multi-faceted visual inspection on small electronic components by setting up multiple image acquisition structures, or by using a gripping or suction structure to display different surfaces of the small electronic components to be inspected to the image acquisition structure. Alternatively, it can combine the gripping or suction structure with multiple image acquisition structures to achieve multi-faceted visual inspection of the small electronic components to be inspected.

[0022] The upstream end of the feeding conveyor 700 is connected to the discharge end of the vision inspection device 600. The upstream end of the discharging conveyor 800 is connected to the downstream end of the feeding conveyor 700.

[0023] Specifically, the feeding conveyor 500, the unloading conveyor 700, and the discharge conveyor 800 are all belt conveyor mechanisms. Of course, in other embodiments, the feeding conveyor 500, the unloading conveyor 700, and the discharge conveyor 800 can also be other conveying devices such as chain conveyor mechanisms.

[0024] Please refer to the following: Figure 6 The receiving device 900 is located at the downstream end of the discharging conveyor 800. A plurality of spaced-apart discharge troughs 910 are formed at the end of the receiving device 900 near the discharging conveyor 800. The receiving device 900 is operably movable left and right relative to the discharging conveyor 800 to align the conveying surface of the discharging conveyor 800 with any of the discharge troughs 910 in the conveying direction of the discharging conveyor 800. It should be noted that the left and right movement relative to the discharging conveyor 800 refers to the left-right direction perpendicular to the conveying direction of the discharging conveyor 800.

[0025] Please refer to the following: Figure 7 and Figure 8 The unloading device 1010 includes a second lifting mechanism 1011, an unloading platform 1012, an unloading bin (not shown), and multiple second trays 1013. The unloading platform 1012 is located on top of the second lifting mechanism 1011 and is used to hold the unloading bin. Multiple second tray sections (not shown) are formed at intervals along the height direction inside the unloading bin. Each second tray 1013 is slidably placed on its corresponding second tray section. Multiple parallel and spaced-apart second troughs 10131 are formed on the second trays 1013. The second troughs 10131 are used to hold small electronic components that have passed inspection and are placed in rows. The second lifting mechanism 1011 is configured to lift the unloading bin to adjust the height of each second tray section.

[0026] The receiving device 900 is used to remove an empty second tray 1013 from the unloading bin and transport it directly below a plurality of discharge troughs 910, aligning the plurality of second troughs 10131 with the plurality of discharge troughs 910 one-to-one. It is also used to push the second tray 1013 into the unloading bin when it is full of inspected and qualified small electronic components. Thus, the number of discharge troughs 910 is the same as the number of second troughs 10131 on a single second tray 1013, and they correspond one-to-one.

[0027] To facilitate understanding, the working process of the above-mentioned intelligent multi-dimensional vision inspection device 10 for small electronic components is briefly explained below: (1) Place multiple layers of first trays 130 filled with small electronic components to be tested in the loading hopper, and place the loading hopper containing multiple layers of first trays 130 on the loading platform 120; place the unloading hopper containing multiple layers of empty second trays 1013 on the unloading platform 1012. (2) The first lifting mechanism 110 drives the loading platform 120 to lift and lower, so as to adjust the height of the first material tray 130 that needs to be picked up in the loading bin to a suitable position. (3) Use the material picking device 300 to pick up the first material tray 130 that needs to be unloaded in the feeding bin and move it to a position close to the material guiding mechanism 220, and ensure that each first material groove 131 of the first material tray 130 is aligned with the corresponding material guiding groove 221. (4) Using the material feeding device 400, the small electronic components to be tested in the first material groove 131 on the first material tray 130 are moved to the corresponding material guide groove 221; (5) The small electronic components to be tested in the guide trough 221 are transported to the upstream end of the feeding conveyor 500 by the first conveying mechanism 210, and the small electronic components to be tested are arranged in a single row on the feeding conveyor 500. (6) The small electronic components to be inspected are sequentially fed into the visual inspection device 600 using the feeding and conveying device 500, and each small electronic component to be inspected is visually inspected sequentially using the visual inspection device 600, and the defective and unqualified small electronic components are removed. (7) The qualified small electronic components detected by the visual inspection device 600 are transported to a position close to the discharge conveyor 800 using the unloading conveyor 700; (8) Use the second lifting mechanism 1011 to drive the unloading platform 1012 to lift and lower, so as to adjust the height of the empty first material tray 130 that needs to be loaded in the unloading bin to a suitable position. (9) Use the receiving device 900 to hook out the first material tray 130 that needs to be loaded in the feeding bin and move it directly below the multiple discharge troughs 910, and ensure that each second material trough 10131 of the second material tray 1013 is aligned with the corresponding discharge trough 910. (10) The qualified small electronic components delivered by the unloading conveyor 700 are placed sequentially in each of the second material trays 10131 of the second material tray 1013 by the unloading conveyor 800 through multiple unloading slots 910; (11) The second tray 1013, which is filled with qualified small electronic components, is pushed into the unloading bin using the receiving device 900; Repeat the above steps until all the small electronic components to be monitored in the loading bin have completed visual inspection, and collect these qualified small electronic components into the unloading bin to achieve batch inspection of small electronic components.

[0028] It should be noted that the order of the steps mentioned above does not limit the operation sequence of the intelligent multi-dimensional vision inspection device 10 for small electronic components. Multiple steps can be run at the same time, or only one step can be run. The operation sequence of each part of the intelligent multi-dimensional vision inspection device 10 for small electronic components can be freely combined and matched according to the actual situation, and is not limited here.

[0029] Therefore, the intelligent multi-dimensional vision inspection equipment 10 for small electronic components described above can realize batch automatic inspection of small electronic components, thereby effectively reducing the probability of false detection and missed detection, and improving the inspection reliability of small electronic components.

[0030] In the batch testing process of small electronic components, a loading hopper can hold multiple layers of first trays 130, and each first tray 130 can hold multiple small electronic components to be tested. A unloading hopper can hold multiple layers of second trays 1013, and each second tray 1013 can hold multiple qualified small electronic components. This facilitates the batch transfer and loading of capacitors to be tested, as well as the collection and batch transfer of qualified small electronic components after testing, thus improving testing efficiency. Furthermore, the picking device 300, the discharging device 200, the feeding device 400, and the first lifting mechanism 110 cooperate to achieve automatic and orderly loading of small electronic components, ensuring multiple... Small electronic components to be inspected are transported in a single-row queue on the feeding conveyor 500 to prevent multiple small electronic components from stacking together during the transport process, thus further improving inspection efficiency. Furthermore, the discharging conveyor 800, the receiving device 900, and the second lifting mechanism 1011 cooperate to sequentially and orderly feed qualified small electronic components from the unloading conveyor 700 into each of the second material slots 10131 of the second material tray 1013, and automatically push them into the unloading bin, realizing automatic collection and batch unloading of qualified small electronic components after inspection, further improving the inspection efficiency of small electronic components. Therefore, the above-mentioned intelligent multi-dimensional vision inspection equipment 10 for small electronic components has high inspection reliability and efficiency in the batch inspection of small electronic components.

[0031] Please refer to the following: Figure 9In some embodiments, both the loading and unloading hoppers are box structures 2000. The box structure 2000 includes a storage bin 2010. The storage bin 2010 has an inlet / outlet 2011 on its side facing the material handling device 300 or the receiving device 900. The storage bin 2010 has multiple first lifting structures 2012 and multiple second lifting structures 2013 spaced apart along the height direction on its two opposing inner walls. Both the first lifting structures 2012 and the second lifting structures 2013 extend along the opening direction of the inlet / outlet 2011. The two ends of the first tray 130 or the second tray 1013 are slidably placed on the first lifting structures 2012 and the second lifting structures 2013, respectively, so that the first tray 130 is slidably placed on the first pallet portion or the second tray 1013 is slidably placed on the second pallet portion.

[0032] Thus, the loading and unloading hoppers have the same structure, with the first lifting structure 2012 and the adjacent second lifting structure 2013 serving together as either the first pallet section or the second pallet section. The first lifting structure 2012 and the second lifting structure 2013 can be integrally formed with the side wall of the storage bin 2010 as protruding ridges, plates, or other structures, or they can be plates, blocks, or other structures fixed to the inner wall of the storage bin 2010 by welding, screwing, or other methods. Of course, the first lifting structure 2012 and the second lifting structure 2013 can be a single structure, or they can be composed of multiple structures spaced apart along the direction of the inlet / outlet 2011.

[0033] Within the storage bin 2010, the first lifting structure 2012 and the second lifting structure 2013, used to place the same first tray 130 or second tray 1013, are positioned at the same or similar heights to ensure that the first tray 130 and the second tray 1013 can be placed stably within the storage bin 2010. Furthermore, the arrangement of the first lifting structure 2012 and the second lifting structure 2013 ensures that the first tray 130 and the second tray 1013 are placed stably while also ensuring that the middle parts of the first tray 130 and the second tray 1013 are suspended, facilitating the removal and replacement of the first tray 130 and the second tray 1013. This also contributes to the lightweight design of the first and second storage bins, facilitating the batch loading of small electronic components to be tested and the batch unloading of qualified small electronic components after testing.

[0034] Furthermore, in some embodiments, the housing structure 2000 also includes a baffle bar 2020. A first through hole (not shown) and a second through hole (not shown) are respectively provided on the top and bottom surfaces of the storage bin 2010 near the inlet / outlet 2011. The baffle bar 2020 is inserted sequentially into the first and second through holes to block all the first trays 130 or all the second trays 1013 within the storage bin 2010 at the inlet / outlet 2011. The number of baffle bars 2020 can be one or more. When there are multiple baffle bars 2020, they are spaced apart along a horizontal direction perpendicular to the opening direction of the inlet / outlet 2011.

[0035] When transferring materials between the loading and unloading hoppers, workers can insert the baffle bar 2020 into the first and second through holes in sequence to block the first tray 130 or the second tray 1013 in the storage box 2010. This prevents the first tray 130 or the second tray 1013 from sliding out of the storage box 2010 during the overall transfer of the loading and unloading hoppers, thus improving the safety and reliability of batch testing of small electronic components.

[0036] During the operation of the intelligent multi-dimensional vision inspection equipment 10 for small electronic components, if it is necessary to remove or return the first material tray 130 or the second material tray 1013 from the storage box 2010, the operator only needs to pull out the baffle bar 2020, which is convenient and quick to operate.

[0037] Furthermore, in some embodiments, a handle structure 2030 is also provided on the top of the storage bin 2010. In actual use, the loading bin and unloading bin can be transferred by means of lifting equipment such as cranes, tools such as hooks, or by manually grabbing the handle structure 2030, so as to facilitate the overall transfer of the loading bin and unloading bin.

[0038] In some embodiments, the material handling device 300 includes a first support 310, a first material support structure 320, a first hook structure 330, a first material support drive member, and a first hook drive member 350. The first support 310 is disposed between the material guiding mechanism 220 and the loading platform 120, and has a first position 311 near the material guiding mechanism 220 and a second position 312 near the loading platform 120.

[0039] Both the first material support structure 320 and the first hook structure 330 are slidably mounted on the first bracket 310. The first material support drive is connected to the first material support structure 320 and is used to drive the first material support structure 320 to reciprocate between the first position 311 and the second position 312.

[0040] The first hooking structure 330 includes a first hooking head 331 and a first hooking lifting mechanism 332. The first hooking head 331 is mounted on the first hooking lifting mechanism 332. The first hooking lifting mechanism 332 is used to drive the first hooking head 331 to rise or fall, so as to hook or detach from the first material tray 130 from the bottom or top. The first hooking drive member 350 is connected to the first hooking lifting mechanism 332 and is used to drive the first hooking lifting mechanism 332 to move the first hooking head 331 back and forth between the first position 311 and the position in the loading bin for placing the first material tray 130.

[0041] The process of transferring the first material tray 130 from the loading bin to the first position 311 is as follows: First, the first material-supporting structure 320 is moved to the second position 312 by the first material-supporting drive component, and at the same time, the first hook-and-lift drive component 350 moves the first hook-and-lift head 331 to the position below or above the corresponding first material tray 130 in the loading bin; then, the first hook-and-lift mechanism 332 drives the first hook-and-lift head 331 to rise or fall until the first hook-and-lift head 331 hooks onto the first material tray 130; then, the first hook-and-lift drive component 350... The first hook head 331 pulls the first tray 130 out to the second position 312 and places it on the first material support structure 320. Then, the first hook lifting mechanism 332 raises or lowers the first hook head 331 until the first hook head 331 leaves the first tray 130. Then, the first material support drive component moves the first material support structure 320 to the first position 311, thus completing the loading process of the small electronic components to be tested on the first tray 130.

[0042] Similarly, when all the capacitors to be tested on the first material tray 130 at the first position 311 have been transferred to the discharge device 200, and the empty first material tray 130 needs to be returned to the loading bin, the working steps are the reverse of the steps described above. That is, firstly, the first material tray 130 is transferred to the second position 312 using the first material support structure 320, then the first hook head 331 is used to hook the first material tray 130, and the first hook drive 350 is used to push the first material tray 130 from the second position 312 back to the loading bin.

[0043] Further, in some embodiments, the feeding device 400 includes a second support 410, a feeding lifting structure 420, a feeding rake 430, a lifting lifting structure 440, a lifting rake 450, a first lateral movement drive 460, and a second lateral movement drive 470. The second support 410 is located at a first position 311 and has a first sub-position 411, a second sub-position 412, and a third sub-position 413 arranged sequentially at intervals along the extending direction of the guide trough 221. When the first material tray 130 is located at the first position 311, the first sub-position 411 is located above the end of the first material tray 130 near the loading platform 120, the second sub-position 412 is located above the end of the first material tray 130 near the guide mechanism 220, and the third sub-position 413 is located above the end of the guide trough 221 near the picking device 300.

[0044] Both the material-feeding lifting structure 420 and the material-lifting lifting structure 440 are slidably mounted on the bottom of the second bracket 410. The material-feeding lifting structure 420 is connected to the material-feeding rake 430 and is used to drive the material-feeding rake 430 to lift. The material-lifting lifting structure 440 is connected to the material-lifting rake 450 and is used to drive the material-lifting rake 450 to lift.

[0045] The first lateral drive 460 is connected to the material-feeding lifting structure 420 and drives the material-feeding rake 430 to reciprocate between the first sub-position 411 and the second sub-position 412. The second lateral drive 470 is connected to the material-lifting lifting structure 440 and drives the material-lifting rake 450 to reciprocate between the second position 312 and the third position 931. The rake teeth of the material-feeding rake 430 are configured to extend into and engage in the process gaps of the small electronic components to be inspected.

[0046] Among them, the process gap of small electronic components refers to the gap formed by the small electronic components during the processing. It can be the gap between two parts of the small electronic components or the groove formed on the surface of the small electronic components. Therefore, the thickness of the rake teeth of the material-pulling rake 430 is smaller than the process gap of the small electronic components. The thickness of the rake teeth of the material-pulling rake 430 can be adapted to the process gap of the small electronic components. After being inserted into the process gap of the small electronic components, it can lift the small electronic components and can also be released from the process gap under the gravity of the small electronic components.

[0047] Therefore, after the first material tray 130 is transferred to the first position 311, the first lateral drive 460 moves the material-feeding rake 430 to above the last small electronic component to be tested at the rear end of the first material trough 131 (i.e., the first sub-position 411); then the material-feeding lifting structure 420 drives the material-feeding rake 430 to descend until the multiple rake teeth of the material-feeding rake 430 extend into the process gap of the last small electronic component to be tested in the multiple first material troughs 131 respectively; the first lateral drive 460 then moves the material-feeding rake 430 to the next position 311. 460 causes the rake 430 to move the small electronic component to be tested forward in the first material tray 131; when the small electronic component to be tested is moved to the front end of the first material tray 131 (i.e., the second sub-position 412), the rake 430 is driven to rise by the lifting structure 420 to leave the small electronic component to be tested; then the process returns to the step of moving the rake 430 to the first sub-position 411 to facilitate the unloading of the small electronic component to be tested on the next second material tray 1013; Simultaneously, the second lateral drive 470 moves the material-feeding rake 430 to above the foremost small electronic component to be tested (i.e., the second sub-position 412) at the front end of the first material trough 131; the lifting and lowering drive structure lowers the lifting rake 450 until the multiple teeth of the lifting rake 450 are respectively engaged in the process gaps of the foremost small electronic components to be tested in the first material trough 131; the lifting and lowering drive structure raises the lifting rake 450 to lift the small electronic components to be tested away from the first material trough 131; using The second lateral drive 470 moves the lifting rake 450 to above the rear end of the guide trough 221 (i.e., the third sub-position 413), and then uses the lifting drive structure to drive the lifting rake 450 down to place the small electronic component to be tested onto the first conveying mechanism 210 in the corresponding guide trough 221, so that the second conveying mechanism can transport the small electronic component to be tested onto the feeding conveying device 500; the above steps are repeated until all the small electronic components to be tested in the first material trough 131 are lifted onto the first conveying mechanism 210.

[0048] Because the feeding rake 430 can simultaneously move all the small electronic components to be tested in the first material tray 131 on the first material tray 130, and the lifting rake 450 can simultaneously lift one small electronic component to be tested in all the first material trays 131, the efficiency of batch testing of small electronic components is higher.

[0049] Furthermore, in some embodiments, the feeding device 400 further includes a feeding guide plate 480 and a guide lifting drive 490. The feeding guide plate 480 is mounted on the second bracket 410 and has a plurality of parallel and spaced guide grooves 481. When the first tray 130 is located at the first position 311, the orthographic projections of the plurality of guide grooves 481 on the first tray 130 respectively completely cover the plurality of first material slots 131 on the first tray 130. The guide lifting drive 490 is tractively connected to the feeding guide plate 480 and is used to drive the feeding guide plate 480 to move up and down to approach or move away from the first tray 130 at the first position 311.

[0050] When the first tray 130 is moved to the first position 311, the guide lifting drive 490 drives the material-dispensing guide plate 480 to descend until the material-dispensing guide plate 480 is located near the first tray 130 or placed on the first tray 130. At this time, the rake teeth of the material-dispensing rake 430 pass through multiple guide grooves 481 and extend into multiple first material grooves 131 respectively. When the material-dispensing rake 430 moves the small electronic components to be tested on the first tray 130 at the first position 311 forward, the multiple guide grooves 481 guide the movement path of the rake teeth of the material-dispensing rake 430 and prevent the small electronic components to be tested from being squeezed out of the first material grooves 131 during the dispensing process, thereby further improving the reliability of the test.

[0051] Please refer to it again. Figure 5 In some embodiments, the feeding conveyor 500 includes a feeding conveyor bracket 510, a feeding belt 520 mounted on the feeding conveyor bracket 510, and a discharge plate 530 mounted on the feeding conveyor bracket 510. The conveying direction of the feeding conveyor 500 is perpendicular to the extending direction of the guide trough 221. The discharge plate 530 is located directly above the upstream end of the feeding belt 520 and is spaced apart from the feeding belt 520. In the extending direction of the guide trough 221, the orthographic projection of the discharge plate 530 on the guiding mechanism 220 completely covers all openings of the guide trough 221 near the end of the feeding belt 520.

[0052] The intelligent multi-dimensional vision inspection device 10 for small electronic components also includes a first counting sensor 3000 and a first control device (not shown). The detection end of the first counting sensor 3000 is located on the movement trajectory of the small electronic components to be inspected on the feeding belt 520, and is used to detect the quantity information of the small electronic components to be inspected passing through the first counting sensor 3000 in real time. The first counting sensor 3000 is configured to reset the count to zero when the quantity information displayed is equal to the quantity in the guide trough 221. The first control device is connected to the first counting sensor 3000 and the first conveying mechanism 210 respectively, and is used to control the first conveying mechanism 210 to stop working when the quantity information displayed is less than the quantity in the guide trough 221, and to control the first conveying mechanism 210 to start working when the quantity information displayed is equal to the quantity in the guide trough 221.

[0053] Therefore, the first counting sensor 3000 is used for cyclic counting. That is, when the counted number is the same as the number of the first material troughs 131 on the first material tray 130, it will start counting from 1. Thus, whenever the count information detected by the first counting sensor 3000 is equal to the number of the guide troughs 221, the first control device will immediately control the first conveying mechanism 210 to start, so as to simultaneously transport the foremost small electronic component to be tested in the multiple guide troughs 221 to the upstream end of the feeding conveyor 500. When the first counting sensor 3000 starts counting from 1, the first control device will immediately control the first conveying mechanism 210 to stop running, so as to ensure that the small electronic component to be tested can be transported in a single line on the feeding conveyor 500, ensuring that the subsequent visual inspection work can be carried out accurately and reliably.

[0054] The setting of the discharge plate 530 can limit the position of the small electronic component to be tested at the front end of the multiple first material troughs 131 at the upstream end of the feeding conveyor 500, so as to ensure that the small electronic component to be tested is arranged more neatly on the feeding conveyor 500, so as to facilitate the subsequent visual inspection of the small electronic component to be tested in sequence.

[0055] Furthermore, in some embodiments, the feeding conveyor 500 also includes a discharge drive 540. The discharge drive 540 is connected to the discharge plate 530 and is used to drive the discharge plate 530 to move in a direction toward or away from the guide trough 221.

[0056] Thus, the distance between the discharge plate 530 and the opening of the guide chute 221 facing the feeding conveyor 500 can be adjusted by the discharge drive component 540 to accommodate small electronic components of different sizes and to adjust their position on the feeding conveyor 500, thereby improving applicability. Simultaneously, the discharge drive component 540 allows the discharge plate 530 to automatically move above or away from the feeding belt 520, facilitating subsequent maintenance and replacement of the feeding belt 520.

[0057] Furthermore, in some embodiments, a limiting plate 224 is provided at one end of the guiding mechanism 220 near the feeding conveyor 500. The limiting plate 224 is suspended directly above the feeding belt 520 and has a preset distance between it and the opening of the guide trough 221 facing the feeding conveyor 500. A limiting step is formed on the top edge of the discharge plate 530 facing the guide groove 481. The discharge drive member 540 is used to drive the discharge plate 530 to move in a direction toward or away from the guide trough 221 until the end of the discharge plate 530 near the guide trough 221 passes through the bottom of the limiting plate 224 and the limiting step contacts the limiting plate 224, or the discharge plate 530 moves away from the limiting plate 224. The setting of the limiting plate 224 can prevent the discharge plate 530 from moving excessively and improve the positional accuracy of the small electronic components to be tested on the feeding belt 520.

[0058] Please refer to the following: Figure 11 In some embodiments, the intelligent multi-dimensional vision inspection device 10 for small electronic components further includes a correction mechanism 4000. The correction mechanism 4000 is located upstream of the discharge conveyor 800 and is used to adjust the orientation of qualified small electronic components at the upstream end of the discharge conveyor 800. Thus, before qualified small electronic components on the unloading conveyor 700 enter the discharge conveyor 800, the correction mechanism 4000 adjusts their orientation to ensure accurate and effective entry into the discharge conveyor 800. This avoids situations where qualified small electronic components cannot enter the discharge conveyor 800 due to incorrect orientation, further improving the reliability of small electronic component inspection.

[0059] Specifically, the correction mechanism 4000 includes a correction drive 4010 and a correction plate 4020 mounted on the correction drive 4010. The correction plate 4020 is located at the upstream end of the discharge conveyor 800 and is perpendicular to the conveying direction of the discharge conveyor 800. The correction drive 4010 is used to drive the correction plate 4020 to move toward or away from the upstream port of the discharge conveyor 800 until the correction plate 4020 completely blocks the upstream port of the discharge conveyor 800 or is completely misaligned with the upstream port of the discharge conveyor 800. In this way, the correction plate 4020 blocking the upstream port of the discharge conveyor 800 is used to straighten the posture of qualified small electronic components, and then the components enter the discharge conveyor 800 when the correction plate 4020 is completely misaligned with the upstream port of the discharge conveyor 800.

[0060] Of course, in other embodiments, the correction mechanism 4000 can also use a structure of visual inspection and correction turntable to correct the pose of qualified small electronic components, or it can use a robotic arm to grasp or pick up and straighten the qualified small electronic components, etc.

[0061] Please refer to the following: Figure 12 In some embodiments, the intelligent multi-dimensional vision inspection device 10 for small electronic components further includes a baffle plate 5010, a baffle drive 5020, a second counting sensor 5030, and a second control device (not shown). The second counting sensor 5030 is located at the downstream end of the discharge conveying device 800 and is used to collect the quantity information of qualified small electronic components passing through the second counting sensor 5030 in real time. The second control device is connected to the baffle drive 5020 and the second counting sensor 5030 respectively, and is used to control the baffle drive 5020 to drive the baffle plate 5010 to move to a position close to or against the conveying surface of the discharge conveying device 800 when the quantity displayed by the quantity information of qualified small electronic components is equal to the quantity of qualified small electronic components that can be accommodated in the second material trough 10131, so as to block the qualified small electronic components facing the end of the second counting sensor 5030 toward the feeding conveying device 500, until the next empty second material trough 10131 is aligned with the downstream end of the discharge conveying device 800.

[0062] The second counting sensor 5030 is used for cyclic counting. That is, whenever the quantity information collected by the second counting sensor 5030 reaches the number of qualified small electronic components that can be placed in the second material tank 10131, it will start counting from 1. Thus, whenever the quantity information detected by the second counting sensor 5030 is equal to the number of qualified small electronic components that can be accommodated in a single guide trough 221, the second control device will immediately control the baffle drive 5020 to drive the baffle plate 5010 to move to a position close to or against the conveying surface of the discharge conveyor 800, so as to limit the qualified small electronic components on the discharge conveyor 800 from continuing to move forward until the second trough 10131 currently aligned with the discharge conveyor 800 is full of qualified small electronic components, and the next empty second trough 10131 is aligned with the discharge conveyor 800, the second control device will immediately control the baffle drive 5020 to drive the baffle plate 5010 away from the conveying surface of the discharge conveyor 800, so as to ensure that qualified small electronic components continue to pass through the second counting sensor 5030. At this time, the second counting sensor 5030 continues to count from 1 to fill all the second troughs 10131 of the second tray 1013, realizing the automatic turntable of qualified small electronic components after detection.

[0063] The first control device and the second control device can be the same control device, or they can be two independent control devices. They can be independent devices that are separate from the equipment control system, or they can be part of the equipment control system.

[0064] Please refer to it again. Figure 6 In some embodiments, the receiving device 900 includes a receiving base 920, a third support 930, a material picking and translating drive (not shown), a second material supporting structure 950, a second hooking structure 960, a second material dragging drive 970, and a second hooking drive 980. The third support 930 is slidably mounted on the receiving base 920 and is located between the downstream end of the discharge conveyor 800 and the unloading platform 1012. The third support 930 has a third position 931 near the discharge conveyor 800 and a fourth position 932 near the unloading platform 1012.

[0065] Both the second material support structure 950 and the second hooking structure 960 are slidably mounted on the third bracket 930. The second material dragging drive 970 is connected to the second material support structure 950 and is used to drive the second material support structure 950 to reciprocate between the third position 931 and the fourth position 932. When the second material support structure 950 is in the third position 931, the multiple second material slots 10131 of the second material tray 1013 on the second material support structure 950 are respectively aligned with the multiple discharge slots 910.

[0066] The second hooking structure 960 includes a second hooking head 961 and a second hooking lifting mechanism 962. The second hooking head 961 is mounted on the second hooking lifting mechanism 962. The second hooking lifting mechanism 962 is used to drive the second hooking head 961 to rise or fall, so as to hook or disengage from the second material tray 1013 from the bottom or top. The second hooking drive member 980 is connected to the second hooking lifting mechanism 962 and is used to drive the second hooking lifting mechanism 962 to move the second hooking head 961 back and forth between the fourth position 932 and the position in the unloading bin for placing the second material tray 1013.

[0067] The material handling translation drive is connected to the third support 930 and is used to drive the third support 930 to move the second material support structure 950 left and right to align any of the second material troughs 10131 on the second material tray 1013 located at the third position 931 with the discharge conveying device 800.

[0068] The process of transferring the empty second material tray 1013 from the unloading bin to the third position 931 is as follows: First, the second material-carrying drive component 970 moves the second material-supporting structure 950 to the fourth position 932, while the second hook-lifting drive component 980 moves the second hook-lifting head 961 to the position below or above the corresponding second material tray 1013 in the unloading bin; then, the second hook-lifting lifting mechanism 962 drives the second hook-lifting head 961 to rise or fall until the second hook-lifting head 961 hooks onto the empty second material tray 1013; then, the second hook-lifting drive component 980... The actuator 980 causes the second hook head 961 to pull the second tray 1013 out to the fourth position 932 and place it on the second material support structure 950; then the second hook lifting mechanism 962 is used to raise or lower the second hook head 961 until the second hook head 961 leaves the first tray 130; then the second material dragging drive 970 is used to move the second material support structure 950 to the third position 931, thus completing the transportation of the empty second tray 1013 from the unloading bin to the third position 931.

[0069] Similarly, when all the second slots 10131 of the second tray 1013 at the third position 931 are filled with qualified small electronic components, and the second tray 1013 filled with qualified small electronic components needs to be automatically transferred to the unloading bin, the working steps are the reverse of the steps described above. That is, firstly, the second tray 1013 is transferred to the fourth position 932 using the second material support structure 950, then the second hook head 961 is used to hook the second tray 1013, and the second hook drive 980 is used to push the second tray 1013 from the fourth position 932 back to the unloading bin using the second hook drive 980.

[0070] Please refer to it again. Figure 1 and Figure 2In some embodiments, the intelligent multi-dimensional vision inspection equipment 10 for small electronic components further includes a first frame 6000, a second frame 7000, and a third frame 8000. The upstream ends of the first lifting mechanism 110, the discharge device 200, the picking device 300, the feeding device 400, and the loading device 100 are all mounted on the first frame 6000. The downstream end of the unloading conveyor 700 and the upstream end of the discharge conveyor 800 are both mounted on the second frame 7000. The downstream end of the discharge conveyor 800, the receiving device 900, and the second lifting mechanism 1011 are all mounted on the third frame 8000. Rollers 9000 are provided at the bottom ends of both the first frame 6000 and the third frame 8000 to facilitate on-site assembly and adjustment of the various parts of the small electronic component vision inspection equipment. The arrangement of the first rack 6000, the second rack 7000, and the third rack 8000 enables the intelligent multi-dimensional vision inspection equipment 10 for small electronic components to achieve a modular design, facilitating assembly and adaptation to the size and specifications of small electronic components.

[0071] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0072] The embodiments described above are merely illustrative of several implementations of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.

Claims

1. A small-scale intelligent multi-dimensional visual inspection device for electronic components, characterized in that, include: A feeding device includes a first lifting mechanism, a feeding platform, a feeding bin, and multiple first trays; the feeding platform is disposed on top of the first lifting mechanism and is used to place the feeding bin; multiple first tray portions are formed at intervals along the height direction inside the feeding bin; each first tray is slidably placed on a corresponding first tray portion; multiple parallel and spaced first grooves are formed on the first trays; the first grooves are used to carry small electronic components to be tested arranged in rows; the first lifting mechanism is configured to drive the feeding bin to lift and lower to adjust the height of each first tray; The discharge device includes a first conveying mechanism and a guiding mechanism; the guiding mechanism has a plurality of guiding grooves formed at intervals; the first conveying mechanism is located directly below the guiding mechanism, and each guiding groove is aligned with the conveying surface of the first conveying mechanism; The material handling device is located between the material guiding mechanism and the loading platform, and is configured to be able to extract a first material tray from the loading bin and move it to a position close to the material guiding mechanism, and to align one end of the plurality of first material troughs with one end of the plurality of material guiding troughs respectively. A feeding device is located above the feeding device and is configured to feed small electronic components in multiple first material slots into multiple guide slots, and is located on the conveying surface of the first conveying mechanism. The feeding conveying device has its upstream end connected to the downstream end of the first conveying mechanism; the conveying direction of the feeding conveying device is arranged to intersect with the conveying direction of the first conveying mechanism. A visual inspection device, the inlet of which is connected to the downstream end of the feeding conveyor; the visual inspection device is used to perform visual inspection on the small electronic components sent by the feeding conveyor and to reject the small electronic components that are found to be unqualified. The upstream end of the feeding and conveying device is connected to the discharge end of the visual inspection device; A discharge conveying device, the upstream end of which is connected to the downstream end of the discharge conveying device; A receiving device is located at the downstream end of the discharge conveying device; a plurality of spaced discharge troughs are formed at one end of the receiving device near the discharge conveying device; the receiving device is operable to move left and right relative to the discharge conveying device so as to align the conveying surface of the discharge conveying device with any of the discharge troughs in the conveying direction of the discharge conveying device. The unloading device includes a second lifting mechanism, an unloading platform, an unloading bin, and multiple second trays. The unloading platform is located on top of the second lifting mechanism and is used to place the unloading bin. Multiple second tray sections are spaced apart along the height of the unloading bin. Each second tray is slidably placed on its corresponding second tray section. Multiple parallel and spaced-apart second troughs are formed on each second tray. The second troughs are used to hold rows of qualified small electronic components. The second lifting mechanism is configured to lift the unloading bin to adjust the height of each second tray section. The receiving device is used to take an empty second material tray from the unloading bin and transport it directly below the plurality of discharge slots, and to align the plurality of second material slots with the plurality of discharge slots one by one. It is also used to push the second material tray into the unloading bin when the second material tray is full of qualified small electronic components. The material handling device includes a first support, a first material supporting structure, a first hooking structure, a first material supporting drive, and a first hooking drive. The first support is disposed between the material guiding mechanism and the loading platform, and has a first position close to the material guiding mechanism and a second position close to the loading platform. The first material supporting structure and the first hooking structure are slidably mounted on the first support. The first material supporting drive is driven by the first material supporting structure and is used to drive the first material supporting structure to reciprocate between the first position and the second position. The first hooking structure includes a first hooking head and a first hooking lifting mechanism. The first hooking head is mounted on the first hooking lifting mechanism. The first hooking lifting mechanism is used to drive the first hooking head to rise or fall to hook or leave the first material tray from the bottom or top. The first hooking drive is driven by the first hooking lifting mechanism and is used to drive the first hooking lifting mechanism to drive the first hooking head to reciprocate between the first position and the position in the loading bin used to place the first material tray. The feeding device includes a second bracket, a feeding lifting structure, a feeding rake, a lifting lifting structure, a lifting rake, a first lateral movement drive, a second lateral movement drive, a feeding guide plate, and a guide lifting drive. The second bracket is located at the first position and has a first sub-position, a second sub-position, and a third sub-position arranged sequentially at intervals along the extension direction of the material guide trough. When the first material tray is located at the first position, the first sub-position is located above the end of the first material tray near the loading platform, the second sub-position is located above the end of the first material tray near the material guide mechanism, and the third sub-position is located above the end of the material guide trough near the material picking device. The feeding lifting structure and the lifting lifting structure are slidably mounted on the bottom of the second bracket. The feeding lifting structure is connected to the feeding rake and is used to drive the feeding rake to lift. The lifting lifting structure is drivenly connected to the lifting rake and is used to drive the lifting rake to lift. The first lateral movement drive is connected to the material feeding and lifting structure and is used to drive the material feeding and lifting structure to move the material feeding rake back and forth between the first sub-position and the second sub-position; the second lateral movement drive is connected to the material lifting structure and is used to drive the material lifting structure to move the material lifting rake back and forth between the second sub-position and the third sub-position; the rake teeth of the material feeding rake are configured to extend into and engage in the process gap of the small electronic component to be tested; the material feeding guide plate is mounted on the second bracket and forms a plurality of parallel and spaced guide grooves; when the first material tray is located at the first position, the orthographic projections of the plurality of guide grooves on the first material tray respectively completely cover the plurality of first material grooves on the first material tray; the guide lifting drive is connected to the material feeding guide plate and is used to drive the material feeding guide plate to lift and move closer to or further away from the first material tray at the first position; The feeding conveying device includes a feeding conveying bracket, a feeding belt mounted on the feeding conveying bracket, and a discharge plate mounted on the feeding conveying bracket; the conveying direction of the feeding conveying device is perpendicular to the extension direction of the guide trough; the discharge plate is located directly above the upstream end of the feeding belt and is spaced apart from the feeding belt; in the extension direction of the guide trough, the orthographic projection of the discharge plate on the guiding mechanism completely covers all the openings of the guide trough near the end of the feeding belt.

2. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 1, characterized in that, Both the loading hopper and the unloading hopper are box-shaped structures; the box-shaped structure includes a storage box; the storage box has an inlet / outlet on its side facing the material receiving device or the material collecting device; the two opposite inner walls of the storage box are respectively formed with a plurality of first lifting structures and a plurality of second lifting structures spaced apart along the height direction; the first lifting structures and the second lifting structures both extend along the opening direction of the inlet / outlet; the two ends of the first tray or the second tray are slidably placed on the first lifting structure and the second lifting structure, respectively, so that the first tray can be slidably placed on the first pallet or the second tray can be slidably placed on the second pallet.

3. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 2, characterized in that, The box structure also includes a baffle rod; the top and bottom surfaces of the storage box are respectively provided with a first through hole and a second through hole near the inlet and outlet; the baffle rod is inserted into the first through hole and the second through hole in sequence to block all the first trays or all the second trays in the storage box at the inlet and outlet.

4. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 2, characterized in that, The top of the storage bin is also equipped with a handle.

5. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 1, characterized in that, It also includes a first counting sensor and a first control device; the detection end of the first counting sensor is located on the movement trajectory of the small electronic component to be tested on the feeding belt, and is used to detect the quantity information of the small electronic component to be tested passing through the first counting sensor in real time; the first counting sensor is configured to reset the count to zero when the quantity information is equal to the quantity of the guide trough; the first control device is connected to the first counting sensor and the first conveying mechanism respectively, and is used to control the first conveying mechanism to stop working when the quantity information is less than the quantity of the guide trough, and to control the first conveying mechanism to start when the quantity information is equal to the quantity of the guide trough.

6. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 5, characterized in that, The feeding and conveying device also includes a discharge driving component; the discharge driving component is connected to the discharge plate and is used to drive the discharge plate to move in a direction toward or away from the guide trough.

7. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 1, characterized in that, It also includes a correction mechanism; the correction mechanism is located at the upstream end of the discharge conveyor and is used to adjust the position and orientation of qualified small electronic components at the upstream end of the discharge conveyor.

8. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 1, characterized in that, It also includes a baffle plate, a baffle drive, a second counting sensor, and a second control device; the second counting sensor is located at the downstream end of the discharge conveying device and is used to collect the quantity information of qualified small electronic components passing through the second counting sensor in real time; the second control device is connected to the baffle drive and the second counting sensor respectively, and is used to control the baffle drive to move the baffle plate to a position close to or against the conveying surface of the discharge conveying device when the quantity information of qualified small electronic components is equal to the quantity of qualified small electronic components that can be accommodated in the second material trough, so as to block the qualified small electronic components facing the end of the second counting sensor towards the feeding conveying device, until the next empty second material trough is aligned with the downstream end of the discharge conveying device.

9. The intelligent multi-dimensional visual inspection device for small electronic components according to claim 1, characterized in that, The receiving device includes a receiving base, a third bracket, a receiving plate, a material picking and translation drive, a second material supporting structure, a second hooking structure, a second material dragging drive, and a second hooking drive; the third bracket is slidably mounted on the receiving base and is located between the downstream end of the discharge conveying device and the unloading platform; the third bracket has a third position close to the discharge conveying device and a fourth position close to the unloading platform; The receiving plate is located at the third position and has multiple spaced-apart discharge troughs; Both the second material support structure and the second hook structure can be slidably mounted on the third bracket; the second material dragging drive is connected to the second material support structure and is used to drive the second material support structure to reciprocate between the third position and the fourth position; when the second material support structure is in the third position, the multiple second material slots of the second material tray on the second material support structure are respectively aligned with the multiple discharge slots. The second hooking structure includes a second hooking head and a second hooking lifting mechanism; the second hooking head is mounted on the second hooking lifting mechanism; the second hooking lifting mechanism is used to drive the second hooking head to rise or fall, so as to hook or leave the second material tray from the bottom or top; the second hooking drive is connected to the second hooking lifting mechanism and is used to drive the second hooking lifting mechanism to move the second hooking head back and forth between the fourth position and the position in the unloading bin for placing the second material tray; The material handling translation drive is connected to the third bracket and is used to drive the third bracket to move the second material support structure left and right to align any of the second material troughs on the second material tray located at the third position with the discharge conveying device.

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