A method and system for detecting a delay time of a delay chip

Abstract

The application relates to the technical field of delay calibration, and particularly discloses a detection method and system for the delay time of a delay chip, which comprises the following steps: step one: obtaining the time interval error ratio of an electronic detonator; step two: based on the time interval error ratio of the electronic detonator, evaluating the time interval error of the electronic detonator, and generating an error evaluation signal; step three: based on the time interval error large signal, analyzing whether the error reason is caused by the environmental temperature, and performing coarse calibration on the error; and step four: based on the time interval error small signal, performing fine calibration on the error; the application can accurately calibrate the time interval error of the electronic detonator, improve the time precision and reliability of the electronic detonator, in particular, the influence of the environmental temperature on the time interval error is considered, and the calibration effect is optimized by calculating a temperature correction coefficient, so that the calibration process is more accurate and flexible.

Description

Technical Field

[0001] This invention relates to the field of delay calibration technology, and specifically to a method and system for detecting the delay time of a delay chip. Background Technology

[0002] Electronic detonators use delay chips to replace the chemical delay powder in traditional detonators, which has advantages such as high delay accuracy, good safety, and network detectability.

[0003] However, due to limitations in chip design and manufacturing, the internal clock frequency of a chip is usually affected by the supply voltage and ambient temperature, causing slight deviations in the set delay time. If the delay time is long, the resulting time deviation may exceed the delay between the vias.

[0004] Furthermore, existing technologies cannot perform coarse and fine calibrations on electronic detonators based on the time interval error, thereby calculating the actual set delay time. Nor can they calculate a temperature correction coefficient to optimize the calibration effect based on the influence of ambient temperature on the time interval error. Summary of the Invention

[0005] The purpose of this invention is to provide a method and system for detecting the delay time of a delay chip, so as to solve the technical problems mentioned above.

[0006] The objective of this invention can be achieved through the following technical solutions: In a first aspect, the present invention provides a method for detecting the delay time of a delay chip, comprising the following steps: Step 1: Obtain the time interval error ratio of the electronic detonator; Step 2: Based on the time interval error ratio of the electronic detonator, evaluate the time interval error of the electronic detonator and generate an error evaluation signal; The error assessment signals include: a large time interval error signal and a small time interval error signal; The time interval error ratio is compared and analyzed with the time interval error ratio threshold; If the time interval error ratio is greater than the time interval error ratio threshold, a large time interval error signal is generated, and the process proceeds to step three. If the time interval error ratio is less than or equal to the time interval error ratio threshold, then generate a small time interval error signal and proceed to step four. Step 3: Based on the large time interval error signal, analyze whether the error is caused by the ambient temperature, and perform coarse calibration on the error; Step 4: Based on the small signal of time interval error, perform fine calibration on the error.

[0007] As a further aspect of the present invention: the process for obtaining the time interval error ratio is as follows: After the delay chip of the electronic detonator receives the calibration command from the control device, it starts timing and measures the time interval from sending the command to the first pull-down of the bus to obtain the measurement time interval. The difference between the measurement time interval and the standard time interval is calculated, and the absolute value is taken to obtain the time interval error value. The ratio between the time interval error value and the standard time interval is calculated, and the time interval error ratio is output.

[0008] As a further aspect of the present invention: the process of coarsely calibrating the error is as follows: Based on the large time interval error signal, we analyze whether the error is caused by the ambient temperature, and at the same time, we generate an assessment signal of the impact of ambient temperature. Among them, the environmental temperature impact assessment signals include: environmental temperature impact signals and environmental temperature non-impact signals; Based on the fact that ambient temperature has no effect on the signal, the required clock frequency adjustment is calculated according to the time interval error ratio. Based on the influence of ambient temperature on the signal, the required clock frequency adjustment is calculated according to the time interval error ratio. At the same time, the temperature correction coefficient is calculated, and the temperature correction coefficient is multiplied with the clock frequency adjustment amount to obtain the adjusted clock frequency adjustment amount. Finally, the control device converts the calculated clock frequency adjustment amount or the adjusted clock frequency adjustment amount into a specific clock frequency adjustment command, and sends the clock frequency adjustment command to the electronic detonator. The electronic detonator adjusts its internal clock frequency according to the received clock frequency adjustment command, and after adjustment, the control device sends a calibration command again, repeating steps one and two.

[0009] As a further aspect of the present invention: the process of generating the environmental temperature influence assessment signal is as follows: Based on the single temperature influence value in several bus pull-down operations, the variance between all single temperature influence values ​​is calculated to obtain the temperature influence coefficient. By comparing and analyzing the temperature influence coefficient with the temperature influence coefficient threshold, an environmental temperature influence assessment signal is generated. If the temperature influence coefficient is less than the temperature influence coefficient threshold, then an ambient temperature-independent signal will be generated. If the temperature influence coefficient is greater than or equal to the temperature influence coefficient threshold, then an ambient temperature-affected signal is generated.

[0010] As a further aspect of the present invention: the process for obtaining the single-time temperature influence value is as follows: Obtain the total time of all temperature anomaly cycles during a single bus pull-down operation, obtain the temperature anomaly time, calculate the ratio of the temperature anomaly time to the time interval error, and obtain the single temperature impact value of the single bus pull-down operation.

[0011] As a further aspect of the present invention: the process of obtaining the temperature anomaly cycle is as follows: Get the real-time ambient temperature during a single bus pull-down operation, and extract the average ambient temperature and ambient temperature offset within a single internal clock cycle. The difference between the average ambient temperature and the average standard ambient temperature is calculated to output the ambient temperature deviation value. The ratio of the ambient temperature deviation value to the standard ambient temperature is calculated to obtain the ambient temperature deviation ratio. At the same time, the ratio of the ambient temperature offset value to the ambient temperature offset threshold is calculated to obtain the ambient temperature offset value ratio; Then, the ratio of ambient temperature deviation to ambient temperature offset is multiplied to calculate the degree of periodicity of the internal clock cycle. Compare and analyze the periodic anomaly severity value with the periodic anomaly severity threshold; If the periodic anomaly level value is less than the periodic anomaly level threshold, then an internal clock period normal signal is generated, and the internal clock period is marked as a temperature normal period. If the periodic anomaly level value is greater than or equal to the periodic anomaly level threshold, an internal clock period anomaly signal is generated, and the internal clock period is marked as a temperature anomaly period.

[0012] As a further aspect of the present invention: the process for obtaining the temperature correction coefficient is as follows: Obtain the total time of all temperature normalization cycles during the current bus pull-down operation, obtain the temperature normalization time, calculate the ratio of the temperature normalization time to the measurement time interval, and obtain the temperature correction coefficient.

[0013] As a further aspect of the present invention: the process of finely calibrating the error is as follows: Based on the small signal of time interval error, the proportional correction coefficient is calculated and obtained. The controller sends the proportional correction coefficient to the electronic detonator, and the electronic detonator stores the proportional correction coefficient. During the process of setting the delayed detonation time of the electronic detonator, the detonator sends the delay time to the corresponding electronic detonator. After receiving the time, the electronic detonator multiplies the delay time with the proportional correction coefficient to obtain the actual set delay time of the electronic detonator.

[0014] As a further aspect of the present invention: the process of obtaining the proportional correction coefficient is as follows: Through the formula: The proportional correction factor k is calculated, where Tstd is the standard time interval and Ttest is the measurement time interval.

[0015] Secondly, the present invention provides a system for detecting the delay time of a delay chip, the system comprising: Data acquisition module: acquires the time interval error ratio of the electronic detonator; Error assessment module: Based on the time interval error ratio of the electronic detonator, it assesses the time interval error of the electronic detonator and generates an error assessment signal; The error assessment signals include: a large time interval error signal and a small time interval error signal; The time interval error ratio is compared and analyzed with the time interval error ratio threshold; If the time interval error ratio is greater than the time interval error ratio threshold, a large time interval error signal is generated and enters the coarse calibration module. If the time interval error ratio is less than or equal to the time interval error ratio threshold, a small time interval error signal is generated and enters the fine calibration module. Coarse calibration module: Based on the large time interval error signal, analyze whether the error is caused by the ambient temperature, and perform coarse calibration on the error; Fine calibration module: performs fine calibration on the error based on the small signal of the time interval error.

[0016] The beneficial effects of this invention are: This invention utilizes the delay chip of an electronic detonator to measure the time interval from the command being sent to the bus pull-down after receiving a calibration command, compares it with a standard time interval, calculates the time interval error ratio, and generates corresponding error evaluation signals based on the magnitude of the error ratio, categorized as large time interval error signals and small time interval error signals. For large time interval error signals, the system analyzes whether the error is caused by ambient temperature, and calculates a temperature correction coefficient and clock frequency adjustment accordingly for coarse calibration of the electronic detonator. If the error is not caused by ambient temperature, the clock frequency is adjusted only based on the error ratio. For small time interval error signals, the system calculates a proportional correction coefficient and sends it to the electronic detonator for fine calibration. When setting the delayed detonation time of the electronic detonator, the electronic detonator uses this proportional correction coefficient to calculate the actual set delay time. This invention can accurately calibrate the time interval error of electronic detonators, improving their time accuracy and reliability. In particular, it considers the influence of ambient temperature on the time interval error and optimizes the calibration effect by calculating a temperature correction coefficient, making the calibration process more accurate and flexible. Attached Figure Description

[0017] The invention will now be further described with reference to the accompanying drawings.

[0018] Figure 1 This is a flowchart of Embodiment 1 of the present invention; Figure 2 This is a system block diagram of Embodiment 2 of the present invention. Detailed Implementation

[0019] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention. Example 1:

[0020] Please see Figure 1 As shown in the embodiment of the present invention, a method for detecting the delay time of a delay chip includes the following steps: Step 1: Obtain the time interval error ratio of the electronic detonator; In some implementations, after the delay chip of the electronic detonator (which supports the following instructions: after the control chip of the electronic detonator receives the calibration instruction from the control device, it returns a signal to the bus after counting N internal clock cycles, which can be a bus pull-down operation) receives the calibration instruction from the control device (the control device is an external device that communicates with the electronic detonator and sends calibration instructions), it starts timing, measures the time interval from sending the instruction to the first bus pull-down, obtains the measurement time interval, calculates the difference between the measurement time interval and the standard time interval (the standard time interval is the bus pull-down operation process, which is a time interval preset by those skilled in the art), takes the absolute value, obtains the time interval error value, calculates the ratio between the time interval error value and the standard time interval, and outputs the time interval error ratio. Step 2: Based on the time interval error ratio of the electronic detonator, evaluate the time interval error of the electronic detonator and generate an error evaluation signal; The error assessment signals include: a large time interval error signal and a small time interval error signal; In some implementations, the time interval error ratio is compared and analyzed with a time interval error ratio threshold; If the time interval error ratio is greater than the time interval error ratio threshold, it indicates that the deviation between the measurement time interval and the standard time interval is large, that is, a large time interval error signal is generated, and proceed to step three. If the time interval error ratio is less than or equal to the time interval error ratio threshold, it indicates that the deviation between the measurement time interval and the standard time interval is small, that is, a small time interval error signal is generated, and the process proceeds to step four. Step 3: Based on the large time interval error signal, analyze whether the error is caused by the ambient temperature, and perform coarse calibration on the error; In some implementation schemes, based on the large time interval error signal, the error is analyzed to determine whether the cause is due to ambient temperature. At the same time, an ambient temperature impact assessment signal is generated (the ambient temperature impact assessment signal includes: an ambient temperature-affected signal and an ambient temperature-ineffective signal). Based on the fact that ambient temperature has no effect on the signal, the required clock frequency adjustment is calculated according to the time interval error ratio (the calculation of the required clock frequency adjustment based on the time interval error ratio is existing technology and will not be elaborated here). Based on the influence of ambient temperature on the signal, the required clock frequency adjustment is calculated according to the time interval error ratio. At the same time, the temperature correction coefficient is calculated, and the temperature correction coefficient is multiplied with the clock frequency adjustment amount to obtain the adjusted clock frequency adjustment amount. Finally, the control device converts the calculated clock frequency adjustment amount or the adjusted clock frequency adjustment amount into a specific clock frequency adjustment command, and sends the clock frequency adjustment command to the electronic detonator. The electronic detonator adjusts its internal clock frequency according to the received clock frequency adjustment command, and after adjustment, the control device sends a calibration command again, repeating steps one and two. The first exemplary process for generating an environmental temperature impact assessment signal is as follows: Based on the single temperature influence value in several bus pull-down operations, the variance between all single temperature influence values ​​is calculated to obtain the temperature influence coefficient. By comparing and analyzing the temperature influence coefficient with the temperature influence coefficient threshold, an environmental temperature influence assessment signal is generated. If the temperature influence coefficient is less than the temperature influence coefficient threshold, it indicates that there is a small correlation between the environmental temperature anomaly and the time interval error ratio, meaning that the generated environmental temperature has no influence signal. If the temperature influence coefficient is greater than or equal to the temperature influence coefficient threshold, it indicates that there is a significant correlation between the abnormal ambient temperature and the time interval error ratio, meaning that the generated ambient temperature has an influence signal. Furthermore, the process for obtaining the value of the degree of influence of a single temperature event is as follows: Get the real-time ambient temperature during a single bus pull-down operation, and extract the average ambient temperature (the average ambient temperature is the average real-time ambient temperature within that internal clock cycle) and the ambient temperature offset (the ambient temperature offset is the absolute difference between the maximum and minimum real-time ambient temperature within that internal clock cycle). The difference between the average ambient temperature and the average standard ambient temperature (the average standard ambient temperature is a preset average ambient temperature value by those skilled in the art) is calculated to output the ambient temperature deviation value. The ratio of the ambient temperature deviation value to the average standard ambient temperature is then calculated to obtain the ambient temperature deviation ratio. At the same time, the ratio of the ambient temperature offset value to the ambient temperature offset threshold is calculated to obtain the ambient temperature offset value ratio; Then, the ratio of ambient temperature deviation to ambient temperature offset is multiplied to calculate the degree of periodicity of the internal clock cycle. Compare and analyze the periodic anomaly severity value with the periodic anomaly severity threshold; If the periodic anomaly level value is greater than or equal to the periodic anomaly level threshold, it indicates that the average ambient temperature within the internal clock cycle deviates significantly from the average standard ambient temperature value or that the ambient temperature fluctuates greatly, generating an internal clock cycle anomaly signal, and marking the internal clock cycle as a temperature anomaly cycle. If the periodic anomaly level value is less than the periodic anomaly level threshold, it indicates that the average ambient temperature within the internal clock cycle deviates little from the average standard ambient temperature value and the ambient temperature fluctuation is small, generating a normal signal for the internal clock cycle, and marking the internal clock cycle as a normal temperature cycle. Obtain the total time of all temperature anomaly cycles during the single bus pull-down operation, obtain the temperature anomaly time, calculate the ratio of the temperature anomaly time to the time interval error, and obtain the single temperature impact value of the single bus pull-down operation. In a second exemplary case, the process for obtaining the temperature correction coefficient is as follows: Obtain the total time of all temperature normalization cycles during the current bus pull-down operation, obtain the temperature normalization time, calculate the ratio of the temperature normalization time to the measurement time interval, and obtain the temperature correction coefficient. Step 4: Based on the small signal of time interval error, perform fine calibration on the error; In some implementation schemes, a proportional correction coefficient is calculated based on the small signal of time interval error. The controller sends the proportional correction coefficient to the electronic detonator, and the electronic detonator stores the proportional correction coefficient. During the process of setting the delayed detonation time of the electronic detonator, the detonator sends the delay time to the corresponding electronic detonator. After receiving the time, the electronic detonator multiplies the delay time with the proportional correction coefficient to obtain the actual set delay time of the electronic detonator. For example, the process of obtaining the scaling correction factor is as follows: Through the formula: The proportional correction coefficient k is calculated, where Tstd is the standard time interval and Ttest is the measurement time interval; The technical solution of this invention mainly involves: after receiving a calibration command, the delay chip of the electronic detonator measures the time interval from the command being sent to the bus pull-down, compares it with the standard time interval, calculates the time interval error ratio, and generates a corresponding error evaluation signal based on the magnitude of the error ratio, which is divided into a large time interval error signal and a small time interval error signal. For the large time interval error signal, the system analyzes whether the error is caused by the ambient temperature and calculates the temperature correction coefficient and clock frequency adjustment accordingly to perform coarse calibration of the electronic detonator. If the error is not caused by the ambient temperature, the clock frequency is adjusted only based on the error ratio. For the small time interval error signal, the system calculates a proportional correction coefficient and sends it to the electronic detonator for fine calibration. When setting the delayed detonation time of the electronic detonator, the electronic detonator will use this proportional correction coefficient to calculate the actual set delay time. This invention can accurately calibrate the time interval error of the electronic detonator, improving its time accuracy and reliability. In particular, it considers the influence of ambient temperature on the time interval error and optimizes the calibration effect by calculating the temperature correction coefficient, making the calibration process more accurate and flexible. Example 2:

[0021] Based on Example 1, please refer to Figure 2 As shown in the embodiment of the present invention, a delay time detection system for a delay chip includes: Data acquisition module: acquires the time interval error ratio of the electronic detonator; Error assessment module: Based on the time interval error ratio of the electronic detonator, it assesses the time interval error of the electronic detonator and generates an error assessment signal; The error assessment signals include: a large time interval error signal and a small time interval error signal; The time interval error ratio is compared and analyzed with the time interval error ratio threshold; If the time interval error ratio is greater than the time interval error ratio threshold, a large time interval error signal is generated and enters the coarse calibration module. If the time interval error ratio is less than or equal to the time interval error ratio threshold, a small time interval error signal is generated and enters the fine calibration module. Coarse calibration module: Based on the large time interval error signal, analyze whether the error is caused by the ambient temperature, and perform coarse calibration on the error; Fine calibration module: performs fine calibration on the error based on the small signal of the time interval error.

[0022] The threshold values ​​mentioned above are set to facilitate comparison. The size of the threshold depends on the amount of sample data and the number of bases set by those skilled in the art for each group of sample data. The foregoing has provided a detailed description of one embodiment of the present invention, but this description is merely a preferred embodiment and should not be construed as limiting the scope of the invention. All equivalent variations and modifications made within the scope of the claims of this invention should still fall within the patent coverage of this invention.

Claims

1. A method for detecting the delay time of a delay chip, characterized in that, Includes the following steps: Step 1: Obtain the time interval error ratio of the electronic detonator; Step 2: Based on the time interval error ratio of the electronic detonator, evaluate the time interval error of the electronic detonator and generate an error evaluation signal; The error assessment signals include: a large time interval error signal and a small time interval error signal; The time interval error ratio is compared and analyzed with the time interval error ratio threshold; If the time interval error ratio is greater than the time interval error ratio threshold, a large time interval error signal is generated, and the process proceeds to step three. If the time interval error ratio is less than or equal to the time interval error ratio threshold, then generate a small time interval error signal and proceed to step four. Step 3: Based on the large time interval error signal, analyze whether the error is caused by the ambient temperature, and perform coarse calibration on the error; Step 4: Based on the small signal of time interval error, perform fine calibration on the error.

2. The method for detecting the delay time of a delay chip according to claim 1, characterized in that, The process for obtaining the time interval error ratio is as follows: After the delay chip of the electronic detonator receives the calibration command from the control device, it starts timing and measures the time interval from sending the command to the first pull-down of the bus to obtain the measurement time interval. The difference between the measurement time interval and the standard time interval is calculated, and the absolute value is taken to obtain the time interval error value. The ratio between the time interval error value and the standard time interval is calculated, and the time interval error ratio is output.

3. The method for detecting the delay time of a delay chip according to claim 1, characterized in that, The process of coarsely calibrating the error is as follows: Based on the large time interval error signal, we analyze whether the error is caused by the ambient temperature, and at the same time, we generate an assessment signal of the impact of ambient temperature. Among them, the environmental temperature impact assessment signals include: environmental temperature impact signals and environmental temperature non-impact signals; Based on the fact that ambient temperature has no effect on the signal, the required clock frequency adjustment is calculated according to the time interval error ratio. Based on the influence of ambient temperature on the signal, the required clock frequency adjustment is calculated according to the time interval error ratio. At the same time, the temperature correction coefficient is calculated, and the temperature correction coefficient is multiplied with the clock frequency adjustment amount to obtain the adjusted clock frequency adjustment amount. Finally, the control device converts the calculated clock frequency adjustment amount or the adjusted clock frequency adjustment amount into a specific clock frequency adjustment command, and sends the clock frequency adjustment command to the electronic detonator. The electronic detonator adjusts its internal clock frequency according to the received clock frequency adjustment command, and after adjustment, the control device sends a calibration command again, repeating steps one and two.

4. The method for detecting the delay time of a delay chip according to claim 3, characterized in that, The process of generating the environmental temperature impact assessment signal is as follows: Based on the single temperature influence value in several bus pull-down operations, the variance between all single temperature influence values ​​is calculated to obtain the temperature influence coefficient. By comparing and analyzing the temperature influence coefficient with the temperature influence coefficient threshold, an environmental temperature influence assessment signal is generated. If the temperature influence coefficient is less than the temperature influence coefficient threshold, then an ambient temperature-independent signal will be generated. If the temperature influence coefficient is greater than or equal to the temperature influence coefficient threshold, then an ambient temperature-affected signal is generated.

5. The method for detecting the delay time of a delay chip according to claim 4, characterized in that, The process for obtaining the single-time temperature influence value is as follows: Obtain the total time of all temperature anomaly cycles during a single bus pull-down operation, obtain the temperature anomaly time, calculate the ratio of the temperature anomaly time to the time interval error, and obtain the single temperature impact value of the single bus pull-down operation.

6. The method for detecting the delay time of a delay chip according to claim 5, characterized in that, The process of obtaining the temperature anomaly cycle is as follows: Get the real-time ambient temperature during a single bus pull-down operation, and extract the average ambient temperature and ambient temperature offset within a single internal clock cycle. The difference between the average ambient temperature and the average standard ambient temperature is calculated to output the ambient temperature deviation value. The ratio of the ambient temperature deviation value to the standard ambient temperature is calculated to obtain the ambient temperature deviation ratio. At the same time, the ratio of the ambient temperature offset value to the ambient temperature offset threshold is calculated to obtain the ambient temperature offset value ratio; Then, the ratio of ambient temperature deviation to ambient temperature offset is multiplied to calculate the degree of periodicity of the internal clock cycle. Compare and analyze the periodic anomaly severity value with the periodic anomaly severity threshold; If the periodic anomaly level value is less than the periodic anomaly level threshold, then an internal clock period normal signal is generated, and the internal clock period is marked as a temperature normal period. If the periodic anomaly level value is greater than or equal to the periodic anomaly level threshold, an internal clock period anomaly signal is generated, and the internal clock period is marked as a temperature anomaly period.

7. The method for detecting the delay time of a delay chip according to claim 4, characterized in that, The process for obtaining the temperature correction coefficient is as follows: Obtain the total time of all temperature normalization cycles during the current bus pull-down operation, obtain the temperature normalization time, calculate the ratio of the temperature normalization time to the measurement time interval, and obtain the temperature correction coefficient.

8. The method for detecting the delay time of a delay chip according to claim 1, characterized in that, The process of finely calibrating the error is as follows: Based on the small signal of time interval error, the proportional correction coefficient is calculated and obtained. The controller sends the proportional correction coefficient to the electronic detonator, and the electronic detonator stores the proportional correction coefficient. During the process of setting the delayed detonation time of the electronic detonator, the detonator sends the delay time to the corresponding electronic detonator. After receiving the time, the electronic detonator multiplies the delay time with the proportional correction coefficient to obtain the actual set delay time of the electronic detonator.

9. The method for detecting the delay time of a delay chip according to claim 8, characterized in that, The process of obtaining the proportional correction coefficient is as follows: Through the formula: The proportional correction factor k is calculated, where Tstd is the standard time interval and Ttest is the measurement time interval.

10. A system for detecting the delay time of a delay chip, characterized in that, The system is used to perform the method according to any one of claims 1-9, the system comprising: Data acquisition module: acquires the time interval error ratio of the electronic detonator; Error assessment module: Based on the time interval error ratio of the electronic detonator, it assesses the time interval error of the electronic detonator and generates an error assessment signal; The error assessment signals include: a large time interval error signal and a small time interval error signal; The time interval error ratio is compared and analyzed with the time interval error ratio threshold; If the time interval error ratio is greater than the time interval error ratio threshold, a large time interval error signal is generated and enters the coarse calibration module. If the time interval error ratio is less than or equal to the time interval error ratio threshold, a small time interval error signal is generated and enters the fine calibration module. Coarse calibration module: Based on the large time interval error signal, analyze whether the error is caused by the ambient temperature, and perform coarse calibration on the error; Fine calibration module: performs fine calibration on the error based on the small signal of the time interval error.

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