一种TFT基板玻璃切割质量控制系统、方法及控制单元
By measuring and adjusting the thermocouple temperature in real time during TFT substrate glass production, and adjusting the cutting path, the cutting quality problem caused by local abnormalities in the glass substrate was solved, thus improving the cutting quality and packaging quality of the glass substrate.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- IRICO DISPLAY DEVICES CO LTD
- Filing Date
- 2024-08-27
- Publication Date
- 2026-07-17
AI Technical Summary
In the production of TFT substrate glass overflow pull-down, local abnormalities in the glass substrate lead to cutting quality problems. The cutting system process parameters cannot compensate for the deformation, affecting the breakage and packaging quality of the glass substrate.
A TFT substrate glass cutting quality control system is adopted, including a control device, an overflow device, an annealing outlet, a substrate glass cutting device, a thermocouple, and a high-temperature distance measuring device. By measuring and adjusting the thermocouple temperature in real time, the cutting path is adjusted to meet the reference, thereby realizing the control of the deformation of the glass substrate.
This improves the cutting quality of glass substrates, reduces breakage and packaging defects, and ensures the stability of subsequent production and the effectiveness for customers.
Smart Images
Figure CN118954928B_ABST