Optical lens, lens module and electronic device

Abstract

The application provides an optical lens, a lens module and an electronic device. The optical lens comprises a superlens and a lens barrel. The superlens is accommodated in the lens barrel. The superlens comprises a substrate and a plurality of nano pillar structures. The plurality of nano pillar structures are fixed to the image side of the substrate. The phase of each nano pillar structure satisfies a phase determined according to a first wavelength, so that the superlens focuses infrared light. The first wavelength is a wavelength corresponding to the infrared light. The phase of each nano pillar structure also satisfies a phase determined according to a second wavelength, so that the superlens spectrally separates visible light. The second wavelength is a wavelength corresponding to the visible light. The optical lens provided by the application can focus infrared light and spectrally separate visible light. Two sets of camera modules are not required. In the case of using only one optical lens, the depth measurement and multispectral imaging functions can be realized, and the space and manufacturing cost of the electronic device are saved.

Description

Technical Field

[0001] This application relates to the field of lenses, specifically to an optical lens, a lens module, and an electronic device. Background Technology

[0002] With the continuous development of electronic device technology, camera functionality has become an important feature of electronic devices and a key indicator for evaluating their performance. To meet diverse user needs, electronic devices can now possess depth measurement and multispectral imaging capabilities. Currently, achieving both depth measurement and multispectral imaging requires two separate lens modules. This approach increases costs and occupies twice the space, further reducing the overall device footprint and effective screen display area. Therefore, how to simultaneously achieve depth measurement and multispectral imaging has become a pressing issue. Summary of the Invention

[0003] This application provides an optical lens, a lens module, and an electronic device. The optical lens provided by this application can perform phase modulation on visible light and infrared light to focus infrared light, and perform spectral splitting on visible light. It eliminates the need for two camera modules and can achieve depth measurement and multispectral imaging functions with only one optical lens, saving space and manufacturing costs for electronic devices.

[0004] In a first aspect, an optical lens is provided, comprising a superlens and a lens barrel, the superlens being housed within the lens barrel, the superlens including a substrate and a plurality of nanopillar structures fixed to the image side of the substrate; the phase of each nanopillar structure satisfies a phase determined according to a first wavelength, such that the superlens focuses infrared light, the first wavelength being the wavelength corresponding to the infrared light; the phase of each nanopillar structure also satisfies a phase determined according to a second wavelength, such that the superlens disperses visible light, the second wavelength being the wavelength corresponding to the visible light.

[0005] In this embodiment, by rationally arranging the nanopillar structure of the superlens, when the incident light beam passes through the superlens, the infrared light corresponding to the first wavelength and the visible light corresponding to the second wavelength can be phase-modulated, so that the superlens can focus the infrared light and perform spectral splitting on the visible light. Without the need for two sets of camera modules, depth measurement and multispectral imaging functions can be realized with only one optical lens, saving space and manufacturing costs for electronic devices.

[0006] In conjunction with the first aspect, in some implementations of the first aspect, the phase of each nanopillar structure satisfies either formula (1) or formula (2) below, and also satisfies either formula (3) or (4).

[0007]

[0008]

[0009]

[0010]

[0011] in, For the phase of each nanopillar structure with respect to the first wavelength, r is the distance from each nanopillar structure to the center of the substrate, f is the focal length, λ1 is the first wavelength, and a i The first parameter to adjust is... For the phase of each nanopillar structure at this second wavelength, α is the deflection angle corresponding to the second wavelength, λ2 is the second wavelength, and b i This is the second adjustment parameter, where R is the aperture of the substrate.

[0012] In conjunction with the first aspect, in some implementations of the first aspect, the height of the plurality of nanopillar structures is between 600 nm and 1500 nm, and the spacing between two adjacent nanopillar structures is between 200 and 400 nm.

[0013] In conjunction with the first aspect, in some implementations of the first aspect, the first wavelength is 940 nm and the second wavelength is 550 nm.

[0014] In conjunction with the first aspect, in some implementations of the first aspect, the plurality of nanopillar structures are rotationally symmetric structures with a rotation angle of 90°.

[0015] In a second aspect, an optical lens is provided, comprising a superlens and a lens barrel, the superlens being housed within the lens barrel, the superlens comprising a substrate and a plurality of nanopillar structures fixed to the image side of the substrate; the superlens comprising a first portion and a second portion, wherein the phase of each nanopillar structure in the first portion satisfies a phase determined according to a first wavelength, such that the superlens focuses infrared light, the first wavelength being the wavelength of the infrared light; and the phase of each nanopillar structure in the second portion satisfies a phase determined according to a second wavelength, such that the superlens disperses visible light, the second wavelength being the wavelength of the visible light.

[0016] In this embodiment, the superlens is divided into two parts. By arranging the nanopillar structures of the two parts in a reasonable manner, the first part and the second part are used to perform phase modulation on the infrared light corresponding to the first wavelength and the visible light corresponding to the second wavelength, respectively. This allows the optical lens to separate the focused infrared light and the visible light in the incident beam after it passes through the optical lens. Without the need for two camera modules, depth measurement and multispectral imaging functions can be achieved with only one optical lens, saving space and manufacturing costs for electronic devices.

[0017] In conjunction with the second aspect, in some implementations of the second aspect, the phase of each nanopillar structure of the first part satisfies any one of the following formulas (1) or (2), and the phase of each nanopillar structure of the second part satisfies any one of the following formulas (3) or (4).

[0018]

[0019]

[0020]

[0021]

[0022] in, For the phase of each nanopillar structure in the first portion of the first wavelength, r is the distance from each nanopillar structure in the first portion to the center of the substrate, f is the focal length, λ1 is the first wavelength, and a i The first parameter to adjust is... For each nanopillar structure in the second part of the second wavelength, α is the deflection angle corresponding to the second wavelength, λ2 is the second wavelength, and b i This is the second adjustment parameter, where R is the aperture of the substrate.

[0023] In conjunction with the second aspect, in some implementations of the second aspect, the height of the plurality of nanopillar structures is between 600 nm and 1500 nm, and the spacing between two adjacent nanopillar structures is between 200 and 400 nm.

[0024] In conjunction with the second aspect, in some implementations of the second aspect, the first wavelength is 940 nm and the second wavelength is 550 nm.

[0025] In conjunction with the second aspect, in some implementations of the second aspect, the plurality of nanopillar structures are rotationally symmetric structures with a rotation angle of 90°.

[0026] Thirdly, a lens module is provided, which includes an optical lens and an image sensor in the first aspect and any implementation thereof. The optical lens is used to focus infrared light in a first region of the image sensor and to split visible light into multiple sub-beams and project them onto a second region of the image sensor, wherein the first region and the second region are different.

[0027] In conjunction with the third aspect, in some implementations of the third aspect, the lens module further includes a filter disposed between the optical lens and a first region of the image sensor, the filter being used to filter the visible light.

[0028] Fourthly, a lens module is provided, which includes an optical lens and an image sensor as described in the second aspect and any implementation thereof. The optical lens is used to focus infrared light in a first region of the image sensor and to split visible light into multiple sub-beams and project them onto a second region of the image sensor, wherein the first region and the second region are different.

[0029] In conjunction with the fourth aspect, in some implementations of the fourth aspect, the lens module further includes a filter disposed between the optical lens and a first region of the image sensor, the filter being used to filter the visible light.

[0030] Fifthly, an electronic device is provided, which includes the lens module implemented in the third and fourth aspects. Attached Figure Description

[0031] Figure 1 This is a schematic diagram of an electronic device provided in an embodiment of this application.

[0032] Figure 2 This is a schematic diagram of the imaging principle provided in the embodiments of this application.

[0033] Figure 3 This is a schematic cross-sectional view of an optical lens provided in an embodiment of this application.

[0034] Figure 4 This is a phase diagram of nanopillar structures with different apertures at the same height, provided in the embodiments of this application.

[0035] Figure 5 This is a schematic diagram showing the distribution of the aperture of multiple nanopillar structures as a function of position, provided in the embodiments of this application.

[0036] Figure 6 This is a schematic diagram of the simulation effect of the superlens provided in the embodiment of this application.

[0037] Figure 7 These are schematic cross-sectional views and schematic top views of another optical lens provided in the embodiments of this application.

[0038] Figure 8 This is a schematic diagram of the simulation effect of the superlens provided in the embodiment of this application.

[0039] Figure 9 This is an exploded view of the lens module provided in the embodiments of this application. Detailed Implementation

[0040] The technical solutions of this application will now be described with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them.

[0041] In the following text, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature.

[0042] Furthermore, in this application, directional terms such as "center," "upper," "lower," "left," "right," "top," and "bottom" are defined relative to the orientation or position of the components shown in the accompanying drawings. It should be understood that these directional terms are relative concepts, used for relative description and clarification, rather than indicating or implying that the device or component referred to must have a specific orientation, or be constructed and operated in a specific orientation. They can change accordingly depending on the orientation of the components in the accompanying drawings, and therefore should not be construed as limiting this application.

[0043] It should also be noted that in the embodiments of this application, the same reference numerals are used to represent the same component or part. For the same part in the embodiments of this application, the reference numerals may only be used to mark one part or component as an example in the figure. It should be understood that the reference numerals are also applicable to other identical parts or components.

[0044] The electronic devices involved in the embodiments of this application may include handheld devices, in-vehicle devices, wearable devices, computing devices, or other processing devices connected to a wireless modem. They may also include cellular phones, smartphones, personal digital assistant (PDA) computers, tablet computers, laptop computers, machine type communication (MTC) terminals, point-of-sale (POS) terminals, in-vehicle computers, and other terminals with imaging capabilities.

[0045] With the continuous development of electronic device technology, camera functionality has become an important feature of electronic devices and a key indicator for evaluating their performance. To meet diverse user needs, electronic devices can now possess depth measurement and multispectral imaging capabilities. Currently, achieving both depth measurement and multispectral imaging requires two separate lens modules. This approach increases costs and occupies twice the space, further reducing the overall device footprint and effective screen display area. Therefore, how to simultaneously achieve depth measurement and multispectral imaging has become a pressing issue.

[0046] For ease of understanding, the technical terms used in this application will be explained and described below.

[0047] The focal point is the point at which all light rays converge when they enter a convex lens, parallel to the optical axis. Ideally, a convex lens should be such that all light rays converge at a single point behind the lens.

[0048] Focal length, also known as focal length, is a measure of the focusing or diverging of light in an optical system. It refers to the distance from the optical center of a lens or lens group to the focal point when a distant object is focused onto the focal plane. It can also be understood as the perpendicular distance from the optical center of the lens or lens group to the focal plane. From a practical perspective, it can be understood as the distance from the center of the lens to the image plane. For prime lenses, the position of their optical center remains fixed, therefore the focal length is fixed. For zoom lenses, changes in the optical center result in changes in the focal length, thus the focal length can be adjusted.

[0049] The field of view (FOV) in optical instruments is the angle between the two edges of the lens, representing the maximum range through which the image of the object can pass through the lens. The size of the FOV determines the field of view of the optical instrument; a larger FOV results in a wider field of view but a smaller optical magnification. A shorter focal length results in a wider horizontal field of view, and consequently, a smaller image. The horizontal field of view narrows as the focal length increases, while the object being photographed grows larger.

[0050] Object space is the space in which the object being photographed is located, with the lens as the boundary.

[0051] Image space is the space behind the lens where the image formed by the light emitted from the object passes through the lens.

[0052] Using the lens as a boundary, the side where the subject is located is called the object side, and the surface of the lens closest to the object side can be called the object side surface; using the lens as a boundary, the side where the image of the subject is located is called the image side, and the surface of the lens closest to the image side can be called the image side surface.

[0053] Figure 1 A schematic diagram of an electronic device is shown. The electronic device 100 can be a device with camera or photographic capabilities, such as a cellular phone, mobile phone, smartphone, tablet computer, laptop computer, camcorder, video recorder, camera, smartwatch, smart wristband, or other forms of device with photographic or video recording capabilities. This application does not impose any special limitations on the specific form of the electronic device 100. For ease of explanation and understanding, the following description uses a mobile phone as an example.

[0054] The aforementioned electronic device 100, such as Figure 1 As shown, the device may include a display panel (DP) 101, a housing 102, a camera compact module (CCM) 103, etc. The housing 102 has a receiving space, within which the display panel 101 and the camera compact module 103 are disposed. The display panel 101 may be a liquid crystal display (LCD) screen, an organic light emitting diode (OLED) screen, etc., wherein the OLED screen may be a flexible display or a rigid display.

[0055] The lens module 103 can be located only on the front of the electronic device 100 to capture images of the scene on one side of the front of the electronic device 100; in some embodiments, it can be called a front-facing lens module. Alternatively, it can be located only on the back of the electronic device 100 to capture images of the scene on one side of the back of the electronic device 100; in some embodiments, it can be called a rear-facing lens module. It can also be located on both the front and back of the electronic device 100, such as... Figure 1 As shown, a lens module 103 is provided on the front of the electronic device 100, and a lens module 103 is also provided on the back of the electronic device 100. It can capture the scene located on the front side of the electronic device 100 or the scene located on the back side of the electronic device 100, as long as the corresponding lens module is used when taking pictures.

[0056] It should be understood that the mounting position of the lens module 103 is merely illustrative. In some embodiments, when the lens module 103 is used as a front-facing lens module, it can also be mounted in other positions on the electronic device 100, such as on the left side of the earpiece, the upper center of the electronic device 100, the lower part of the electronic device 100, or the four corners of the electronic device 100; when the lens module 103 is used as a rear-facing lens module, it can be mounted in the upper center or upper right corner of the back of the electronic device 100. In some other embodiments, the lens module 103 may not be mounted on the main body of the electronic device 100, but may be mounted on an edge protruding from the main body of the electronic device 100, or on a component that is movable or rotatable relative to the main body of the electronic device 100, such as a component that can extend outward, retract, or rotate from the main body of the electronic device 100. When the lens module 103 is rotatable relative to the electronic device 100, the lens module 103 functions as both a front-facing lens module and a rear-facing lens module. That is, by rotating the same lens module 103, it can capture images of both the front and rear sides of the electronic device 100. In other embodiments, when the display screen 101 is foldable, the lens module 103 can function as both a front-facing and a rear-facing lens module. The lens module 103 is used to capture images of either the front or rear sides of the electronic device 100 as the display screen 101 folds.

[0057] This application embodiment does not limit the number of lens modules 103; it can be one, two, four, or even more. For example, the electronic device 100 can have one or more lens modules 103 on the front or the back. This application embodiment does not limit the number of lens modules, nor does it limit the relative positions of multiple lens modules. When multiple lens modules 103 are set, they can be identical or different; for example, the optical parameters of the multiple lens modules 103 may differ.

[0058] Optionally, the electronic device 100 may further include a lens protective lens 104 for protecting the lens module 103. The lens protective lens 104 is disposed on the housing 102 and is used to cover the lens module 103. When the lens protective lens 104 is used to protect the front lens module, the lens protective lens 104 may cover only the front lens module or cover the entire front of the electronic device 100. When the lens protective lens 104 covers the entire front of the electronic device 100, it can simultaneously protect the front lens module and the display screen 101. The lens protective lens 104 is a cover glass (CG). When the lens protective lens 104 is used to protect the rear lens module, the lens protective lens 104 may cover the entire back of the electronic device 100 or may be disposed only at the corresponding position of the rear lens module to protect the rear lens module. The material of the lens protective lens 104 may be glass, sapphire, ceramic, etc., and this application embodiment does not impose any special limitations. In some embodiments, the lens protective lens 104 is transparent, thereby allowing light from outside the electronic device 100 to pass through the lens protective lens 104 and enter the lens module 103.

[0059] It should be noted that the front of the electronic device 100 described in this application embodiment can be understood as the side surface of the electronic device 100 facing the user when the user uses the electronic device 100, and the back of the electronic device 100 can be understood as the side surface of the electronic device 100 facing away from the user when the user uses the electronic device 100.

[0060] It should be understood that Figure 1 The electronic device 100 shown is not limited to the above-mentioned devices, but may also include other devices, such as batteries, flashlights, fingerprint recognition modules, earpieces, buttons, sensors, etc. This application embodiment only uses a terminal with a lens module 103 installed as an example for illustration, but the components installed on the electronic device 100 are not limited to this.

[0061] Figure 2 A schematic diagram of the imaging principle is shown. The light L reflected from the subject passes through the optical lens 201 to generate an optical image, which is projected onto the surface of the image sensor 202. The optical image is then converted into an electrical signal, i.e., an analog image signal S1. The analog image signal S1 is converted into a digital image signal S2 by an analog-to-digital converter (A / D converter) 203. The digital image signal S2 is then processed by an image processor 204, such as a digital signal processing chip (DSP), to form a compressed image signal S3, which can be stored in a memory 205 for further processing. Finally, the image is displayed on a monitor or display screen.

[0062] The optical lens 201 affects image quality and imaging effect. Light from a scene passing through the optical lens 201 can form a clear image on the focal plane, and the image is recorded by a photosensitive material or sensor. The optical lens 201 can be an integral unit composed of one or more lenses assembled in a system. The lenses can be plastic or glass, spherical or aspherical, refractive or reflective. In this embodiment, the optical lens 201 includes a superlens, which can modulate the phase of the incident light; a detailed description follows.

[0063] Image sensor 202 is a semiconductor chip with photodiodes on its surface. When illuminated, photodiodes generate electrical charges, which are then converted into digital signals by an analog-to-digital converter (ADC) chip. Image sensor 202 can be a charge-coupled device (CCD) or a complementary metal-oxide semiconductor (CMOS) device. A CCD image sensor uses a highly sensitive semiconductor material to convert light into electrical charges, which are then converted into digital signals by the ADC chip. A CCD consists of many photosensitive units, typically measured in megapixels. When light illuminates the CCD surface, each photosensitive unit reflects a charge onto the component; the signals from all photosensitive units are combined to form a complete image. A CMOS device primarily utilizes silicon and germanium, allowing N-type (negative) and P-type (positive) semiconductors to coexist on the CMOS. The current generated by these complementary effects can be recorded and interpreted as an image by the processing chip. In some embodiments, image sensor 202 may also be referred to as a photosensitive chip, photosensitive element, etc.

[0064] The function of the image processor 204 is to optimize the digital image signal through a series of complex mathematical algorithms, and finally transmit the processed signal to the display. The image processor 204 can be an image processing chip or a digital signal processing chip (DSP). Its role is to transmit the data obtained by the photosensitive chip to the central processing unit in a timely and fast manner and refresh the photosensitive chip. Therefore, the quality of the DSP chip directly affects the image quality (such as color saturation, sharpness, etc.).

[0065] It should be understood that the "lens" mentioned in the embodiments of this application should be understood as a whole lens, including one or more lens elements.

[0066] Figure 3 A schematic cross-sectional view of an optical lens provided in an embodiment of this application is shown, such as... Figure 3As shown, the optical lens 201 is Figure 1 The optical lens of the lens module 103 shown below, in conjunction with Figure 3 The structure of the optical lens 201 is described.

[0067] like Figure 3 As shown, the optical lens 201 includes a superlens 1 and a lens barrel 2.

[0068] The superlens 1 is used to perform phase modulation on light of different wavelengths so that light of different wavelengths can be projected onto different areas of the image sensor, or onto different image sensors, i.e., focusing infrared light and performing beam splitting on visible light.

[0069] The lens barrel 2 has a receiving space in which the superlens 1 is housed. The lens barrel 2 can be a single unit, with the superlens 1 housed within the single unit of the lens barrel 2. Alternatively, the lens barrel 2 can comprise multiple lens barrel sections.

[0070] In this embodiment of the application, the optical lens 201 can perform phase modulation on light of different wavelengths. For example, the optical lens 201 can split visible light (400-760nm) into multiple beams and project them onto the first area of ​​the first image sensor, and focus infrared light (760nm-1000nm) onto the second area of ​​the first image sensor.

[0071] For example, the optical lens 201 splits visible light into multiple beams and projects them onto the first area of ​​the first image sensor, and focuses infrared light onto the first area of ​​the second sensor.

[0072] Optionally, in some embodiments, since the visible light has a wide wavelength range, in order to achieve multispectral imaging, when the visible light is projected onto the first region of the image sensor, the visible light can also be split into different regions of the first region according to different wavelengths.

[0073] For example, the optical lens 201 can project violet light (400-435nm) into the first sub-region of the first region and blue light (435-450nm) into the second sub-region of the first region.

[0074] It should be noted that, Figure 3 The diagram schematically shows that the optical lens 201 includes a superlens, but it should be understood that the optical lens 201 may also include more lenses, which may or may not be superlenses, and the embodiments of this application do not limit this.

[0075] As mentioned above, achieving depth measurement and multispectral imaging requires two separate lenses, increasing cost and internal space requirements of the electronic device. Therefore, this application provides an optical lens including a superlens. Through phase modulation of light by the superlens, near-infrared imaging and visible light splitting can be achieved. The superlens in the optical lens provided in this application will be described in detail below with reference to the accompanying drawings.

[0076] Figure 3 The illustration also shows a schematic structure of a superlens provided in an embodiment of this application. For ease of description, the upper side of the superlens is defined as the object side, the surface of the superlens facing the object side can be called the object side surface, the lower side of the superlens is the image side, and the surface of the superlens facing the image side can be called the image side surface.

[0077] like Figure 3 As shown, the superlens 1 includes a substrate 11 and a plurality of nanopillar structures 12 disposed on the image side. The substrate can also be referred to as a substrate.

[0078] The substrate 11 can be made of a light-transmitting material. For example, the substrate 11 can be made of silicon dioxide or polydimethylsiloxane, and this embodiment of the application does not limit this. The thickness of the substrate 11 can be designed according to the design requirements of the electronic device. For example, the thickness of the substrate 11 can be 1000 nm, 1500 nm, etc.

[0079] The nanopillar structure 12 can be a 90° rotationally symmetric structure, for example, it can be a square pillar, a cylinder, a regular hexagonal pillar, etc. The embodiments of this application do not limit the material of the nanopillar structure 12; for example, the nanopillar structure 12 can be made of gallium nitride (GaN).

[0080] Multiple nanopillar structures 12 are disposed on the image side of the substrate 11. The reasonable arrangement of these multiple nanopillar structures 12 can make the phase of the superlens 11 different for light of different wavelengths at different positions, so as to achieve focusing of infrared light and splitting of visible light.

[0081] Optionally, in some embodiments, the phases of the plurality of nanopillar structures 12 of the superlens 1 satisfy a first distribution, so that the plurality of nanopillar structures can focus infrared light and perform spectral processing on visible light.

[0082] Optionally, in some embodiments, the phase of the plurality of nanopillar structures 12 of the superlens 1 is to satisfy a first distribution. The phase distribution of the plurality of nanopillar structures 12 can satisfy formula (1), that is, when the phase of the nanopillar structure 12 for the first wavelength satisfies the phase determined according to formula (1), the nanopillar structure 12 can focus infrared light.

[0083]

[0084] in, For the phase of each nanopillar structure 12 with respect to the first wavelength, r is the distance from the nanopillar structure 12 to the center of the substrate 11, f is the focal length, and λ1 is the first wavelength, which is the wavelength corresponding to infrared light. In the embodiments of this application, the value of the first wavelength is not limited, that is, the first wavelength can be any wavelength within the wavelength range of infrared light.

[0085] For example, the nanopillar structure 12#1 is a nanopillar structure 12 located at position #1 of the substrate 11. The phase of the nanopillar structure 12#1 can be determined to be 4 rad according to the above formula (1). After determining that the phase of the nanopillar structure 12#1 for the first wavelength needs to be 4 rad, the height and / or aperture of the nanopillar structure 12#1 can be adjusted to make the phase of the nanopillar structure 12#1 for the first wavelength 4 rad.

[0086] Optionally, in some embodiments, λ1 = 940 nm.

[0087] Optionally, in some embodiments, in order to satisfy the first distribution, the phase distribution of the plurality of nanopillar structures 12 of the superlens 1 can also satisfy formula (2).

[0088]

[0089] in, For the phase of each nanopillar structure 12 at the first wavelength, a i The first adjustment parameter is r, which is the distance from the center of the nanopillar structure 12 to the center of the substrate 11.

[0090] It should be noted that, for different wavelengths, a in formula (2) i The value of a is different, that is, a i This can be understood as a wavelength-related variable. Therefore, in some embodiments of this application, a can be determined based on the first wavelength. i The value of a. In determining a i After obtaining r, the phase of the nanopillar structure 12 at the position corresponding to r can be determined. i This can be understood as an optimized adjustment parameter. When determining the phase of the multiple nanopillar structures 12 of the superlens 1, a can be adjusted based on the actual effect and / or simulation results. i This is to ensure that the phases of the resulting multiple nanopillar structures 12 meet the usage requirements.

[0091] For example, with i=8, wavelength=940nm, focal length=1mm, and field of view=60°, a0~a8 can be [-478.0,-1000,-699.59,324.3,478.5,304.7,13.0,-313.8].

[0092] It is understood that the above is merely an example and should not be construed as a specific limitation of this application. When design parameters change, adjustments can be made to a. i To meet design requirements.

[0093] It is understandable that, since the calculations in formula (1) or (2) are performed using the wavelength of infrared light, the superlens 1 can focus infrared light when the phase distribution of each nanopillar structure 12 of the superlens 11 satisfies formula (1) or (2). In other words, infrared light can be focused when multiple nanopillar structures 12 of the superlens 1 satisfy the phase determined according to the first wavelength.

[0094] It should be noted that the phase distribution of the nanopillar structure 12 described in this application embodiment satisfies formula (1) or (2) within the error range, and does not mean that it is exactly the same as the phase calculated according to formula (1) or (2). For example, assuming that the allowable error is 0.5 rad, the phase of position #1 of the superlens 1 for the first wavelength is calculated according to formula (1) or formula (2), while the phase of the nanopillar structure 12 at position #1 of the superlens 1 for the first wavelength is 4.8 rad as actually measured. The difference between the two is within the error range, so it can be considered that the phase of the nanopillar structure 12 at position #1 of the superlens 1 satisfies formula (1) or formula (2) for the first wavelength, that is, it can focus infrared light.

[0095] Optionally, in some embodiments, when the phases of the plurality of nanopillar structures 12 of the superlens 1 satisfy the first distribution, the phase of each of the plurality of nanopillar structures 12 also needs to satisfy the phase determined according to the second wavelength, so as to perform spectral processing on visible light, wherein the second wavelength is the wavelength of visible light.

[0096] Optionally, in some embodiments, in order to make the phase of the plurality of nanopillar structures 12 of the superlens 1 satisfy the first distribution, the phase distribution of the plurality of nanopillar structures 12 can also satisfy formula (3) when it satisfies the above formula (1) or (2). That is, the phase of the plurality of nanopillar structures 12 satisfying the first distribution can be understood as the phase distribution of the plurality of nanopillar structures 12 satisfying formula (1) or (2) and also satisfying formula (3).

[0097]

[0098] in, For the phase of each nanopillar structure 12 with respect to the second wavelength, r is the distance from the nanopillar structure 12 to the center of the substrate 11, α is the deflection angle corresponding to the second wavelength (e.g., 23°), and λ2 is the second wavelength, which is the wavelength corresponding to visible light. In the embodiments of this application, the value of the second wavelength is not limited, that is, the second wavelength can be any wavelength within the wavelength range of visible light.

[0099] For example, the nanopillar structure 12#1 is a nanopillar structure 12 located at position #1 of substrate 11. The phase of the nanopillar structure 12#1 can be determined to be 4 rad according to the above formula (3). After determining that the phase of the nanopillar structure 12#1 for the second wavelength needs to be 4 rad, the height and / or aperture of the nanopillar structure 12#1 can be adjusted to make the phase of the nanopillar structure 12#1 for the second wavelength 4 rad.

[0100] Optionally, in some embodiments, the second wavelength is the center wavelength of the visible light wavelength range, 550 nm.

[0101] Similarly, the phase distribution of the nanopillar structure 12 described in this embodiment satisfies formula (3) within the error range, not that it is exactly the same as the phase calculated according to formula (3). For example, assuming the allowable error is 0.5 rad, according to formula (3), the phase of the nanopillar structure 12 at position #1 of the superlens 1 for the second wavelength is calculated to be 4 rad, while the actual measured phase of the nanopillar structure 12 at position #1 of the superlens 1 is 4.4 rad. The difference between the two is within the error range, so it can be considered that the phase of the nanopillar structure 12 at position #1 of the superlens 1 satisfies formula (3) for the second wavelength.

[0102] When the distribution of multiple nanopillar structures 12 of the superlens 1 satisfies formulas (1) and (3), or satisfies formulas (2) and (3), the superlens 1 can achieve infrared light focusing and visible light splitting, and then combined with an image sensor, it can achieve depth measurement and multispectral imaging functions.

[0103] Optionally, in some embodiments, the superlens 1 can perform beam splitting on visible light. In order to reduce crosstalk between the split signals, the phase distribution of the plurality of nanopillar structures 12, in addition to satisfying the above formula (1) or (2), also needs to satisfy formula (4).

[0104]

[0105] in, For the phase of each nanopillar structure 12 with respect to the second wavelength, r is the distance from the nanopillar to the center of the substrate 11, α is the deflection angle corresponding to the second wavelength (e.g., 23°), λ2 is the second wavelength, and b i This is the second adjustment parameter, where the second wavelength corresponds to the wavelength of visible light, and R is the aperture of substrate 11. It can be understood that in formula (4), b... i These are adjustment parameters related to the second wavelength. For a detailed description, please refer to the description of the first adjustment parameter. For the sake of brevity, they will not be repeated here.

[0106] The embodiments of this application can arrange the multiple nanopillar structures 12 in a reasonable manner so that the superlens 11 satisfies formula (1) or formula (2), and also satisfies formula (3) or (4). The size and arrangement of the nanopillar structures are described below using the example of the phase distribution of the multiple nanopillar structures 12 of the superlens 1 satisfying formula (1) and formula (3).

[0107] Optionally, in some embodiments, the phase modulation provided by the nanopillar structure 12 satisfies formula (5).

[0108]

[0109] in, λ is the phase of the nanopillar structure 12, n is the equivalent refractive index, λ is the wavelength, and h is the height of the nanopillar structure 12.

[0110] It should be noted that the equivalent refractive index is related to the aperture of the nanopillar structure. In other words, the phase modulation provided by the nanopillar structure 12 is related to both the aperture of the nanopillar structure 12 and the height of the nanopillar structure.

[0111] In this embodiment, the plurality of nanopillar structures 12 can be arranged at equal intervals on the image side of the substrate 11. In this embodiment, the spacing between two adjacent nanopillar structures 12 is not specifically limited and can be determined according to actual needs. Optionally, in some embodiments, the spacing between two adjacent nanopillar structures 12 can be between 200-400 nm.

[0112] Optionally, in some embodiments, the spacing between two adjacent nanopillar structures 12 is 360 nm.

[0113] In this embodiment, the aperture and / or height of the nanopillar structure 12 can be adjusted so that the phase modulation provided by the nanopillar structure 12 can satisfy the phase determined according to the first wavelength and the phase determined according to the second wavelength, respectively.

[0114] One possible implementation is that the heights of the multiple nanopillar structures 12 can be the same. Similarly, in the embodiments of this application, the height of the nanopillar structure 12 is not specifically limited. Optionally, in some embodiments, the height of the nanopillar structure 12 can be between 600nm and 1500nm. Below, we take an example where the height of the multiple nanopillar structures 12 is 1000nm, combined with formula (5). Figure 4 Phase diagrams of nanopillar structures with different apertures at the same height, provided in embodiments of this application, are shown.

[0115] like Figure 4 As shown in the figure, the solid lines represent the phase changes of nanopillar structures 12 with different apertures at the same height for light of the first wavelength (taking 940nm as an example), and the dashed lines represent the phase changes of nanopillar structures 12 with different apertures at the same height for light of the second wavelength (taking 550nm as an example). The vertical axis represents the phase, and the horizontal axis represents the aperture of the nanopillar structure 12 (in μm). Figure 4 It is easy to see that the phase modulation provided by the same aperture nanopillar structure 12 is different for different wavelengths. Therefore, after determining the phase of each nanopillar structure 12 for the first and second wavelengths according to formulas (1) and (3), it is possible to... Figure 4 Determine the 12-aperture nanopillar structure that satisfies both formula (1) and formula (3).

[0116] For example, the nanopillar structure 12#1 is the nanopillar structure 12 at position #1 of the superlens 1. According to formula (1), the phase corresponding to position #1 for the first wavelength is 4 rad, and according to formula (2), the phase corresponding to position #1 for the second wavelength is 5.2 rad. Figure 4 It can be seen that when the height of the nanopillar structure is 1000nm and the aperture of the nanopillar structure 12 is 100nm, the phase calculated by formula (1) and formula (3) can be satisfied at the same time.

[0117] Similarly, the phase distribution of the nanopillar structure 12 described in this application embodiment that simultaneously satisfies formulas (1) and (3) means that it satisfies formulas (1) and (3) within the error range, and does not mean that it is exactly the same as the phase calculated according to formulas (1) and (3). For example, continue to refer to Figure 4Assuming an allowable error of 0.5 rad, according to formula (1), the phase of position #1 of superlens #1 for the first wavelength is 2 rad, and according to formula (3), the phase of position #1 of superlens #1 for the second wavelength is 4 rad. When determining the aperture of the nanopillar structure 12 at position #1, it can be seen that the aperture of the nanopillar structure is 50 nm, and its corresponding phases for the first and second wavelengths are 2.1 rad and 3.9 rad, respectively, which meet the error requirements. Therefore, the height of the nanopillar structure at position #1 of superlens #1 can be determined to be 1000 nm, and the aperture to be 50 nm.

[0118] Similarly, given that the height of the nanopillar structure 12 at each position is determined, the aperture of the nanopillar structure 12 at each position of the superlens 1 can be determined by combining the above analysis, thereby determining the size of the nanopillar structure 12 at each position, so that the phase of the nanopillar structure 12 at each position can simultaneously satisfy the phase determined by formulas (1) and (3).

[0119] Figure 5 This illustration shows a schematic diagram of the aperture distribution of multiple nanopillar structures provided in the embodiments of this application as a function of position.

[0120] like Figure 5 As shown in the schematic diagram, the horizontal axis represents the distance between the center point of the nanopillar structure 12 and the substrate 11, in micrometers (μm), and the vertical axis represents the aperture of the nanopillar structure 12, in micrometers (μm).

[0121] One possible implementation is that the apertures of the multiple nanopillar structures 12 can be the same. Similar to the above, the phase diagrams of nanopillar structures 12 with different heights under the same aperture can be obtained by combining formula (5). Then, the height 12 of the nanopillar structure 12 at each position of the superlens 1 can be determined according to the phase diagram, thereby determining the size of the nanopillar structure 12 at each position, so that the phase of the nanopillar structure 12 at each position can simultaneously satisfy the phase determined according to formulas (1) and (3).

[0122] One possible implementation is that at least two of the multiple nanopillar structures 12 have different apertures and heights. Unlike the two methods mentioned above, in this possible implementation, the height and aperture of each nanopillar structure 12 can be adjusted one by one to determine the size of the nanopillar structure 12 at each position, so that the phase of the nanopillar structure 12 at each position can simultaneously satisfy the phase determined according to formulas (1) and (3).

[0123] Figure 6 A schematic diagram illustrating the simulation effect of the superlens provided in the embodiment of this application is shown.

[0124] like Figure 6 As shown, after determining the size of each nanopillar structure 12, the incident light rays pass through the phase of the superlens 1, which can focus infrared light and split visible light into multiple sub-beams, which are then projected according to a certain deflection angle.

[0125] In this embodiment, by rationally arranging the nanopillar structure of the superlens, when the incident light beam passes through the superlens, the infrared light corresponding to the first wavelength and the visible light corresponding to the second wavelength can be phase-modulated to focus the infrared light and perform spectral splitting on the visible light. Without the need for two sets of camera modules, depth measurement and multispectral imaging functions can be achieved with only one optical lens, saving space and manufacturing costs for electronic devices.

[0126] Figure 7 A schematic cross-sectional view and a schematic top view of another optical lens provided in an embodiment of this application are shown, and... Figure 3 Unlike the optical lens shown, in this embodiment, the superlens 1 can be divided into a first part and a second part, wherein the first part is used to focus infrared light and the second part is used to perform beam splitting on visible light. The first part is the middle part of the superlens 1, and the second part is the part other than the first part.

[0127] Optionally, in some embodiments, the phases of the plurality of nanopillar structures 12 in the first portion of the superlens 1 satisfy a second distribution, that is, the phase of each nanopillar structure 12 in the first portion satisfies a phase determined according to a first wavelength, so that the superlens focuses infrared light, the first wavelength being the wavelength of infrared light.

[0128] Optionally, in some embodiments, the phase distribution of each nanopillar structure 12 of the first part can satisfy formula (1) or (2).

[0129] It is understandable that the phase distribution of each nanopillar structure 12 in the first part can satisfy the description of formula (1) or (2), which can be found above. For the sake of brevity, it will not be repeated here.

[0130] Optionally, in some embodiments, the phases of the plurality of nanopillar structures 12 in the second part of the superlens 1 satisfy a third distribution, that is, the phase of each nanopillar structure 12 in the second part satisfies a phase determined according to a second wavelength, so that the superlens can separate visible light, the second wavelength being the wavelength corresponding to visible light.

[0131] Optionally, in some embodiments, the phase distribution of each nanopillar structure 12 of the second portion of the superlens 1 can satisfy formula (3) or (4).

[0132] It is understandable that the phase distribution of the multiple nanopillar structures 12 in the second part can satisfy the description of formula (3) or (4) as described above. For the sake of brevity, it will not be repeated here.

[0133] Figure 8 A schematic diagram illustrating the simulation effect of the superlens provided in the embodiment of this application is shown.

[0134] like Figure 8 As shown, after determining the size of each nanopillar structure 12, the incident light rays pass through the phase of the superlens 1, which can focus infrared light and split visible light into multiple sub-beams, which are then projected according to a certain deflection angle.

[0135] In this embodiment, the superlens is divided into two parts. By arranging the nanopillar structures of the two parts in a reasonable manner, the first part and the second part are used to perform phase modulation on the infrared light corresponding to the first wavelength and the visible light corresponding to the second wavelength, respectively. This allows the optical lens to separate the focused infrared light and the visible light in the incident beam after it passes through the optical lens. Without the need for two camera modules, depth measurement and multispectral imaging functions can be achieved with only one optical lens, saving space and manufacturing costs for electronic devices.

[0136] Figure 9 An exploded view of the lens module 103 provided in an embodiment of this application is shown. Figure 9 As shown, the lens module 103 includes an optical lens 201 and an image sensor 202. The optical lens 201 is used to focus infrared light onto a first region of the image sensor 202 and to split visible light into multiple sub-beams for projection onto a second region of the image sensor 202.

[0137] It should be understood that the description of optical lens 201 can be found above, and for the sake of brevity, it will not be repeated here.

[0138] Optionally, in some embodiments, in order to avoid interference from visible light, a filter is also provided between the optical lens 201 and the first area of ​​the image sensor 202, the filter being used to filter visible light.

[0139] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to the internal communication between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0140] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. An optical lens, characterized in that, The optical lens includes a superlens and a lens barrel. The superlens is housed in the lens barrel. The superlens includes a substrate and a plurality of nanopillar structures, which are fixed to the image side of the substrate. Each nanopillar structure has a phase that satisfies a phase determined according to a first wavelength, so that the superlens focuses infrared light, where the first wavelength is the wavelength corresponding to the infrared light; The phase of each nanopillar structure also satisfies the phase determined according to the second wavelength, so that the superlens can split visible light, where the second wavelength is the wavelength corresponding to the visible light; The phase of each nanopillar structure satisfies either formula (1) or formula (2) below, and also satisfies either formula (3) or (4). in, Let r be the phase of each nanopillar structure for the first wavelength, r be the distance from each nanopillar structure to the center of the substrate, and f be the focal length. For the first wavelength, The first parameter to adjust is... For the phase of each nanopillar structure described for the second wavelength. This is the deflection angle corresponding to the second wavelength. For the second wavelength, This is the second adjustment parameter, where R is the aperture of the substrate.

2. The optical lens according to claim 1, characterized in that, The height of the plurality of nanopillar structures is between 600nm and 1500nm, and the spacing between two adjacent nanopillar structures is between 200nm and 400nm.

3. The optical lens according to claim 1 or 2, characterized in that, The first wavelength is 940nm, and the second wavelength is 550nm.

4. The optical lens according to claim 1 or 2, characterized in that, The plurality of nanopillar structures are rotationally symmetric structures with a rotation angle of 90°.

5. A lens module, characterized in that, The lens module includes an optical lens and an image sensor as described in any one of claims 1 to 4, wherein the optical lens is used to focus infrared light in a first region of the image sensor and to split visible light into multiple sub-beams and project them onto a second region of the image sensor, wherein the first region and the second region are different.

6. The lens module according to claim 5, characterized in that, The lens module also includes a filter, which is disposed between the optical lens and a first region of the image sensor, and is used to filter the visible light.

7. An electronic device, characterized in that, Includes the lens module as described in claim 5 or 6.

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