Server memory CE fault processing method and server

CN119127540APending Publication Date: 2024-12-13XFUSION DIGITAL TECH CO LTD
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Patent Information

Application Number
CN202410853868.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-06-27
Publication Date
2024-12-13

AI Technical Summary

Technical Problem

In the prior art, when handling memory CE failures of the server, system management interrupts are frequently triggered, resulting in business interruptions, and more serious memory failure information cannot be collected in time during the SMI blocking period, resulting in difficulty in fault location.

Method used

By connecting the fault detection signal of the first processor to the substrate management controller, blocking system management interrupts, and using the PECI bus to perform out-of-band CE fault processing, ensuring that failure information is fully collected without affecting the service and stored in the fault register middle.

Benefits of technology

It realizes the precise and complete processing of memory CE fault information without affecting user services, reducing the impact on user services, and improving the ability to locate faults.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the invention provides a processing method for a memory CE fault of a server and the server. And connecting a first fault signal line of the first processor to the substrate management controller. And in the BIOS, shielding the CE fault to trigger the function of the system management terminal. And when the processor detects the CE fault, the processor sets the fault signal on the first fault signal line to be valid, so that the substrate management controller collects the fault information of the out-of-band CE fault through the PECI bus. According to the method, CE faults can be processed under the condition that customer services are not affected, and meanwhile, the accuracy and completeness of fault information collection are also considered.
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Citation Information

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