Cache design test method, test configuration method and related device

CN119201579AActive Publication Date: 2024-12-27HYGON INFORMATION TECH CO LTD
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Patent Information

Application Number
CN202411237027.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-04
Publication Date
2024-12-27
Estimated Expiration
2044-09-04

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Abstract

The embodiment of the invention provides a cache design test method, a test configuration method and a related device, and the test method comprises the steps: obtaining the configuration information of a test case, the configuration information of the test case comprises a plurality of cache environment parameters and the configuration information of a plurality of test incentives; wherein the address corresponding to the configuration information of the test excitation covers the performance bottleneck point corresponding to the cache architecture; configuring a cache environment of cache design according to the plurality of cache environment parameters; according to the configuration information of the plurality of test incentives, generating the plurality of test incentives; and applying a plurality of test excitations to the simulated cache design to test the cache design. According to the embodiment of the invention, the comprehensive performance bottleneck point of the cache design can be tested, the comprehensiveness of the performance test of the cache design is improved, and the effect of the performance test of the cache design can be improved.
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