Fault positioning diagnosis method under multi-fault scene

CN119203867APending Publication Date: 2024-12-27NORTHWESTERN POLYTECHNICAL UNIV +1
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Patent Information

Application Number
CN202411365466.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-29
Publication Date
2024-12-27

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Abstract

The invention discloses a fault location and diagnosis method in a multi-fault scene, which is mainly used for fault diagnosis and location in a complex system such as a circuit system. According to the method, a logic model of a system is constructed, system output under single-fault and multi-fault conditions is simulated by using a fault simulator, and then possible fault components are identified through algorithm processing. The core of the invention lies in providing an innovative fault diagnosis method combined with potential fault position identification, and the high efficiency of fault diagnosis is realized by reducing the number of candidate diagnosis components, improving the accuracy of fault positioning and reducing the calculation and diagnosis cost. Experimental results of an ISCAS-85 benchmark test case show that the method is superior to the prior art in the aspects of diagnosis accuracy and efficiency.
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