Method for analyzing and testing content of impurity elements in high-purity silver

CN119291011APending Publication Date: 2025-01-10GUOBIAO BEIJING TESTING & CERTIFICATION CO LTD +1
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Patent Information

Application Number
CN202411669632.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-21
Publication Date
2025-01-10

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Abstract

The invention relates to an analytical test method for determining the content of impurity elements in high-purity silver by adopting inductively coupled plasma mass spectrometry, and belongs to the technical field of silver chemical analysis. Silver and part of impurity components in the strong oxidizing nitric acid solution are converted into soluble ions; in a nitric acid-hydrochloric acid system, Au, Pt, Rh and other impurities are converted into soluble ions, silver and impurity elements are fully ionized to form a soluble solution through complexing silver ions with thiourea, and the soluble solution enters ICP-MS for detection. The elements to be detected comprise Cu, Bi, Fe, Pb, Se, Te, As, Mg, Co, Mn, Ni, Zn, Cd, Ca, Al, Sb, Pd, Sn, Rh, Au and Pt. The method mainly solves the problems of dissolution of the impurities in the high-purity silver and determination of the impurity content, has the advantages of high sensitivity, good selectivity, high accuracy and simplicity, convenience and rapidness in operation, and can be used as a conventional method for analyzing and testing the impurity content in the high-purity silver.
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