Substrate circuit offset detection method for organic electroluminescent display panel

Abstract

The invention relates to the technical field of organic electroluminescent display panels, and discloses a substrate circuit offset detection method for an organic electroluminescent display panel, which comprises the following steps of: dividing a substrate to be subjected to circuit offset detection into a plurality of substrate areas to be subjected to circuit offset detection, and deploying a light-emitting detector on a signal line to be detected; collecting a light-emitting detection response value, and generating a line detection identifier; when a line suspected offset identifier is identified, analyzing a luminescence detection response value, calculating sub-region line deviation factors, and carrying out classification processing to obtain a plurality of region line deviation factor sets; calculating an initial suspected line deviation factor, and optimizing the initial suspected line deviation factor according to the number of the first regions to obtain a target suspected line deviation factor; according to the method, whether the substrate to be subjected to line offset detection has substrate line offset is judged, the accuracy and efficiency of substrate line offset detection are improved, misjudgment and missed judgment are avoided, and the production efficiency and the product quality of the organic electroluminescence display panel are effectively improved.

Description

Technical Field

[0001] The present invention relates to the technical field of organic electroluminescent display panels, and in particular to a method for detecting substrate line deviation of an organic electroluminescent display panel. Background Art

[0002] In modern display technology, organic electroluminescent display panels have gradually become the mainstream choice due to their advantages such as high contrast, fast response and wide viewing angle. The substrate circuit structure of organic electroluminescent display panels is complex and the signal wiring is dense, which makes it easy for data lines, gate lines and other signal lines to open or short circuit during the manufacturing process. These undesirable phenomena not only affect the display effect, but also may increase production costs and waste resources.

[0003] In the prior art, the detection of substrate line deviation mainly relies on manual detection and image detection. Manual detection is easily affected by human factors, such as the experience and technical level of the inspectors, visual fatigue, etc., which may lead to misjudgment or missed detection. The accuracy of image detection depends largely on the quality of the image. If the image is blurred, blocked, or has insufficient light, it will affect the detection results. Therefore, how to accurately detect and correct these problems in a timely manner has become a technical problem that needs to be solved urgently. Summary of the invention

[0004] The embodiment of the present invention provides a substrate line deviation detection method for an organic electroluminescent display panel, which solves the detection difficulties existing in the prior art, improves the accuracy and efficiency of substrate line deviation detection of the organic electroluminescent display panel, avoids misjudgment and missed judgment, and effectively improves the production efficiency and product quality of the organic electroluminescent display panel.

[0005] In order to achieve the above object, the present invention provides a substrate line deviation detection method for an organic electroluminescent display panel, comprising: Determine a substrate to be detected for line deviation of an organic electroluminescent display panel, divide the substrate to be detected for line deviation into a plurality of substrate regions to be detected for line deviation, determine a signal line to be detected in each substrate region to be detected for line deviation, and deploy a light emitting detector on each signal line to be detected; Apply a preset detection voltage to each signal line to be detected, and collect the luminescence detection response value of each luminescence detector in real time, and generate a line detection mark for the substrate to be detected for line deviation according to all the luminescence detection response values, wherein the line detection mark includes a line deviation mark, a line specification mark and a line suspected deviation mark; When the suspected line deviation mark is identified, the substrate area to be detected for line deviation that meets the preset conditions is extracted, the luminous detection response values ​​in the remaining substrate area to be detected for line deviation are analyzed, and the line deviation factors of the sub-areas of the remaining substrate area to be detected for line deviation are calculated based on the analysis results, wherein the preset conditions are that the luminous detection response values ​​in the substrate area to be detected for line deviation all meet the corresponding standard luminous detection response values, or the luminous detection response values ​​do not meet the corresponding standard luminous detection response values; Extract all sub-region line deviation factors, sort all sub-region line deviation factors by numerical value, and perform factor classification processing on all sub-region line deviation factors based on the sorting results to obtain multiple regional line deviation factor sets; Analyze all regional line deviation factor sets, calculate the initial suspected line deviation factor of the substrate to be detected for line deviation based on the analysis results, count the number of first regions of the substrate region to be detected for line deviation that meet preset conditions, and optimize the initial suspected line deviation factor according to the first region number to obtain the target suspected line deviation factor of the substrate to be detected for line deviation; Based on the relationship between the target suspected line deviation factor and the preset target suspected line deviation factor, it is judged whether the substrate to be detected for line deviation has substrate line deviation, and if so, an alarm prompt is issued.

[0006] Furthermore, when collecting the luminescence detection response value of each luminescence detector in real time and generating a line detection mark for the substrate to be detected for line deviation according to all the luminescence detection response values, it includes: Determine a standard luminescence detection response value corresponding to the preset detection voltage for each signal line to be detected; When all the luminous detection response values ​​meet the corresponding standard luminous detection response values, the line standard mark is generated for the substrate to be detected for line deviation; When all the luminous detection response values ​​do not meet the corresponding standard luminous detection response values, the line deviation mark is generated for the substrate to be detected for line deviation; When there are one or more luminous detection response values ​​that meet the corresponding standards, and there are one or more luminous detection response values ​​that do not meet the corresponding standards, the line suspected deviation mark is generated for the substrate to be detected for line deviation.

[0007] Further, when analyzing the luminous detection response value in the remaining substrate area to be detected for line deviation, and calculating the line deviation factor of the sub-area of ​​the remaining substrate area to be detected for line deviation based on the analysis result, it includes: If the remaining luminescence detection response value in the substrate area to be detected for line deviation is less than the standard luminescence detection response value, a first response value difference between the standard luminescence detection response value and the luminescence detection response value is calculated, and a first response value difference sequence is constructed; If the remaining luminescence detection response value in the substrate area to be detected for line deviation is greater than the standard luminescence detection response value, a second response value difference between the luminescence detection response value and the standard luminescence detection response value is calculated, and a second response value difference sequence is constructed; Extracting a first maximum response value difference and a first minimum response value difference in the first response value difference sequence; Extracting a second maximum response value difference and a second minimum response value difference in the second response value difference sequence; The line deviation factors of the remaining sub-regions of the substrate region to be detected for line deviation are calculated according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference and the second minimum response value difference.

[0008] Further, when calculating the line deviation factor of the remaining sub-region of the substrate region to be detected for line deviation according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference and the second minimum response value difference, it includes: The line deviation factor of the remaining sub-area of ​​the substrate area to be detected for line deviation is calculated according to the following formula: ; Wherein, a is the line deviation factor of the sub-region of the substrate region to be detected for line deviation, n is the number of response value differences in the first response value difference sequence, and y is i is the ith response value difference in the first response value difference sequence, y min is the first minimum response value difference, y max is the first maximum response value difference, For all The maximum value in the second response value difference sequence, n2 is the number of response value differences in the second response value difference sequence, b j is the jth response value difference in the second response value difference sequence, b min is the second minimum response value difference, b max is the second maximum response value difference, For all The maximum value in .

[0009] Furthermore, when factor classification processing is performed on all sub-region line deviation factors based on the sorting result to obtain multiple regional line deviation factor sets, it includes: The maximum sub-region line deviation factor and the adjacent sub-region line deviation factors form an initial region line deviation factor set, and the third sub-region line deviation factor is used as the sub-region line deviation factor to be classified; Calculating the first factor sum of the two sub-regional line deviation factors in the initial regional line deviation factor set, and calculating the first factor difference between the sub-regional line deviation factor to be classified and the first factor sum, judging whether the first factor difference is greater than or equal to a preset factor difference, and if so, classifying the sub-regional line deviation factor to be classified into the initial regional line deviation factor set; If not, the initial regional line deviation factor set is used as a regional line deviation factor set, and a second regional line deviation factor set is formed according to the sub-regional line deviation factor to be classified and the fourth sub-regional line deviation factor; Taking the fifth sub-region line deviation factor as the sub-region line deviation factor to be classified, calculating the second factor sum of the two sub-region line deviation factors in the second region line deviation factor set, and calculating the second factor difference between the fifth sub-region line deviation factor and the second factor sum, determining whether the second factor difference is greater than or equal to the preset factor difference, and if so, classifying the fifth sub-region line deviation factor into the second region line deviation factor set, and updating the second region line deviation factor set; If not, the second regional line deviation factor set is used as a regional line deviation factor set; In this way, classification processing is performed to obtain multiple regional line deviation factor sets based on all sub-regional line deviation factors.

[0010] Furthermore, when analyzing all the regional line deviation factor sets and calculating the initial suspected line deviation factor of the substrate to be detected for line deviation based on the analysis result, it includes: Calculate the set factor and value of the sub-region line deviation factors in each region line deviation factor set; Determine a maximum and a minimum set factor and a value from among all set factors and values; Calculate the difference between the maximum set factor and the minimum set factor and the value; Calculate the absolute value of the factor and value difference between each set factor and value and the set factor and value difference; Determine the mean corresponding to the absolute values ​​of all factor and value differences, and divide all factor and value difference absolute values ​​that are less than or equal to the mean into a first combination; All factors and absolute values ​​of value differences greater than the mean are divided into a second combination; An initial suspected line deviation factor of the substrate to be detected for line deviation is calculated according to the first combination and the second combination.

[0011] Further, when calculating the initial suspected line deviation factor of the substrate to be detected for line deviation according to the first combination and the second combination, it includes: The initial suspected line deviation factor of the substrate to be detected for line deviation is calculated according to the following formula: ; Wherein, k is the initial suspected line deviation factor of the substrate to be tested for line deviation, t1 is the number of absolute values ​​of the sum of factors in the first combination, t2 is the number of absolute values ​​of the sum of factors in the second combination, q r is the absolute value of the difference between the rth factor and the value in the second combination, q max is the absolute value of the maximum factor and value difference in the second combination.

[0012] Further, when the initial suspected line deviation factor is optimized according to the number of the first regions to obtain the target suspected line deviation factor of the substrate to be detected for line deviation, it includes: Counting the number of the remaining second regions of the substrate region to be detected for line deviation; Calculate a ratio u of the number of the first regions to the number of the second regions; Presetting a first preset optimization coefficient, a second preset optimization coefficient, and a third preset optimization coefficient; When u<1, a first product value of the first preset optimization coefficient and the initial suspected line deviation factor is calculated, and the first product value is used as a target suspected line deviation factor of the substrate to be detected for line deviation; When 1≤u<1.2, a second product value of the second preset optimization coefficient and the initial suspected line deviation factor is calculated, and the second product value is used as a target suspected line deviation factor of the substrate to be detected for line deviation; When 1.2≤u, a third product value of the third preset optimization coefficient and the initial suspected line deviation factor is calculated, and the third product value is used as the target suspected line deviation factor of the substrate to be detected for line deviation.

[0013] Further, when judging whether the substrate to be detected for line deviation has substrate line deviation based on the relationship between the target suspected line deviation factor and the preset target suspected line deviation factor, it includes: When the target suspected line deviation factor is less than the preset target suspected line deviation factor, it is determined that there is no substrate line deviation on the substrate to be detected for line deviation; When the target suspected line deviation factor is greater than or equal to the preset target suspected line deviation factor, it is determined that the substrate to be detected for line deviation has substrate line deviation.

[0014] Compared with the prior art, the present invention has the following beneficial effects: The substrate to be detected for line deviation is divided into multiple substrate areas to be detected for line deviation, and a luminescent detector is deployed on the signal line to be detected; the luminescent detection response value is collected to generate a line detection mark; when a suspected line deviation mark is identified, the luminescent detection response value is analyzed, the line deviation factor of the sub-area is calculated, and classification processing is performed to obtain a set of line deviation factors of multiple areas; the initial suspected line deviation factor is calculated, and the initial suspected line deviation factor is optimized according to the number of the first area to obtain the target suspected line deviation factor; it is determined whether the substrate to be detected for line deviation has substrate line deviation, so as to improve the accuracy and efficiency of substrate line deviation detection, avoid misjudgment and missed judgment, and effectively improve the production efficiency and product quality of organic electroluminescent display panels. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present invention. Moreover, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings: Figure 1 A schematic flow chart of a method for detecting substrate line deviation of an organic electroluminescent display panel in an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0016] The specific implementation of the present invention is further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0017] In the description of the present application, it should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0018] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, "plurality" means two or more.

[0019] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0020] The following is a description of preferred embodiments of the present invention with reference to the accompanying drawings.

[0021] like Figure 1 As shown, an embodiment of the present invention discloses a substrate line deviation detection method for an organic electroluminescent display panel, comprising: S110: determining a substrate to be detected for line deviation of an organic electroluminescent display panel, dividing the substrate to be detected for line deviation into a plurality of substrate regions to be detected for line deviation, determining a signal line to be detected in each substrate region to be detected for line deviation, and disposing a light emitting detector on each signal line to be detected; In this embodiment, in order to perform detection more efficiently, the entire substrate to be detected for line deviation is divided into a plurality of smaller substrate regions to be detected for line deviation, and the division may be performed specifically according to the area of ​​the substrate to be detected for line deviation.

[0022] In this embodiment, the signal line to be detected is a line connecting the pixel circuit and the external circuit.

[0023] S120: applying a preset detection voltage to each signal line to be detected, and collecting the luminescence detection response value of each luminescence detector in real time, and generating a line detection mark for the line deviation detection substrate according to all the luminescence detection response values, wherein the line detection mark includes a line deviation mark, a line standard mark and a line suspected deviation mark; In this embodiment, the preset detection voltage can be set according to actual needs to ensure that it is within the voltage safety range of the organic electroluminescent display panel.

[0024] In some embodiments of the present application, when collecting the luminescence detection response value of each luminescence detector in real time and generating a line detection mark for the substrate to be line offset detected according to all the luminescence detection response values, it includes: Determine a standard luminescence detection response value corresponding to the preset detection voltage for each signal line to be detected; When all the luminous detection response values ​​meet the corresponding standard luminous detection response values, the line standard mark is generated for the substrate to be detected for line deviation; When all the luminous detection response values ​​do not meet the corresponding standard luminous detection response values, the line deviation mark is generated for the substrate to be detected for line deviation; When there are one or more luminous detection response values ​​that meet the corresponding standards, and there are one or more luminous detection response values ​​that do not meet the corresponding standards, the line suspected deviation mark is generated for the substrate to be detected for line deviation.

[0025] In this embodiment, the standard luminescence detection response value is obtained based on the circuit deviation detection substrate to be detected without circuit deviation. A preset detection voltage is applied to the circuit deviation detection substrate to be detected without circuit deviation to obtain the luminescence detection response value of each luminescence detector, which is the standard luminescence detection response value.

[0026] In this embodiment, when there are one or more luminous detection response values ​​that do not meet the corresponding standard, and there are one or more luminous detection response values ​​that meet the corresponding standard, a suspected line deviation mark is also generated for the line deviation detection substrate.

[0027] In this embodiment, the line specification mark indicates that there is no line offset on the substrate to be detected for line offset, the line offset mark indicates that there is a line offset on the substrate to be detected for line offset, and the line suspected offset mark indicates that there may or may not be a line offset on the substrate to be detected for line offset, and further detection is required.

[0028] The beneficial effect of the above technical solution is that the present invention can achieve preliminary judgment of the substrate to be detected for line deviation by generating a line deviation mark, a line specification mark and a line suspected deviation mark for the substrate to be detected for line deviation, screen out the substrate to be detected for line deviation that generates a line suspected deviation mark, and perform further detection to avoid missed judgment.

[0029] S130: When the suspected line deviation mark is identified, the substrate area to be detected for line deviation that meets the preset conditions is extracted, the luminous detection response values ​​in the remaining substrate area to be detected for line deviation are analyzed, and the line deviation factors of the sub-areas of the remaining substrate area to be detected for line deviation are calculated based on the analysis results, wherein the preset conditions are that the luminous detection response values ​​in the substrate area to be detected for line deviation all meet the corresponding standard luminous detection response values, or the luminous detection response values ​​do not meet the corresponding standard luminous detection response values; In some embodiments of the present application, when analyzing the luminous detection response value in the remaining substrate area to be detected for line deviation, and calculating the line deviation factor of the sub-area of ​​the remaining substrate area to be detected for line deviation based on the analysis result, it includes: If the remaining luminescence detection response value in the substrate area to be detected for line deviation is less than the standard luminescence detection response value, a first response value difference between the standard luminescence detection response value and the luminescence detection response value is calculated, and a first response value difference sequence is constructed; If the remaining luminescence detection response value in the substrate area to be detected for line deviation is greater than the standard luminescence detection response value, a second response value difference between the luminescence detection response value and the standard luminescence detection response value is calculated, and a second response value difference sequence is constructed; Extracting a first maximum response value difference and a first minimum response value difference in the first response value difference sequence; Extracting a second maximum response value difference and a second minimum response value difference in the second response value difference sequence; The line deviation factors of the remaining sub-regions of the substrate region to be detected for line deviation are calculated according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference and the second minimum response value difference.

[0030] In this embodiment, the first response value difference=standard luminescence detection response value-luminescence detection response value.

[0031] In this embodiment, the second response value difference=luminescence detection response value-standard luminescence detection response value.

[0032] In this embodiment, the above-mentioned “-” is a minus sign in mathematical operations.

[0033] The beneficial effect of the above technical solution is: the present invention calculates the sub-area line deviation factor of the remaining substrate area to be detected for line offset according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference and the second minimum response value difference, thereby ensuring the calculation accuracy of the sub-area line deviation factor, avoiding calculation errors, and laying the foundation for the calculation of the initial suspected line deviation factor.

[0034] In some embodiments of the present application, when calculating the line deviation factor of the remaining sub-region of the substrate region to be detected for line deviation according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference, and the second minimum response value difference, it includes: The line deviation factor of the remaining sub-area of ​​the substrate area to be detected for line deviation is calculated according to the following formula: ; Wherein, a is the line deviation factor of the sub-region of the substrate region to be detected for line deviation, n is the number of response value differences in the first response value difference sequence, and y is i is the ith response value difference in the first response value difference sequence, y min is the first minimum response value difference, y max is the first maximum response value difference, For all The maximum value in the second response value difference sequence, n2 is the number of response value differences in the second response value difference sequence, b j is the jth response value difference in the second response value difference sequence, b min is the second minimum response value difference, b max is the second maximum response value difference, For all The maximum value in .

[0035] S140: extracting all sub-region line deviation factors, sorting all sub-region line deviation factors by numerical value, and performing factor classification processing on all sub-region line deviation factors based on the sorting result to obtain multiple regional line deviation factor sets; In some embodiments of the present application, when factor classification processing is performed on all sub-region line deviation factors based on the sorting result to obtain multiple regional line deviation factor sets, it includes: The maximum sub-region line deviation factor and the adjacent sub-region line deviation factors form an initial region line deviation factor set, and the third sub-region line deviation factor is used as the sub-region line deviation factor to be classified; Calculating the first factor sum of the two sub-regional line deviation factors in the initial regional line deviation factor set, and calculating the first factor difference between the sub-regional line deviation factor to be classified and the first factor sum, judging whether the first factor difference is greater than or equal to a preset factor difference, and if so, classifying the sub-regional line deviation factor to be classified into the initial regional line deviation factor set; If not, the initial regional line deviation factor set is used as a regional line deviation factor set, and a second regional line deviation factor set is formed according to the sub-regional line deviation factor to be classified and the fourth sub-regional line deviation factor; Taking the fifth sub-region line deviation factor as the sub-region line deviation factor to be classified, calculating the second factor sum of the two sub-region line deviation factors in the second region line deviation factor set, and calculating the second factor difference between the fifth sub-region line deviation factor and the second factor sum, determining whether the second factor difference is greater than or equal to the preset factor difference, and if so, classifying the fifth sub-region line deviation factor into the second region line deviation factor set, and updating the second region line deviation factor set; If not, the second regional line deviation factor set is used as a regional line deviation factor set; In this way, classification processing is performed to obtain multiple regional line deviation factor sets based on all sub-regional line deviation factors.

[0036] In this embodiment, the preset factor difference is preferably 4, and can be adjusted according to actual needs.

[0037] In this embodiment, by analogy based on the above method, multiple regional line deviation factor sets can be obtained.

[0038] The beneficial effect of the above technical solution is that the present invention classifies all sub-regional line deviation factors to obtain multiple regional line deviation factor sets, which provides convenience for the calculation of the initial suspected line deviation factor and ensures the accuracy of the calculation process.

[0039] S150: Analyze all regional line deviation factor sets, calculate the initial suspected line deviation factor of the substrate to be detected for line deviation based on the analysis result, count the number of first regions of the substrate to be detected for line deviation that meet the preset conditions, and optimize the initial suspected line deviation factor according to the first region number to obtain the target suspected line deviation factor of the substrate to be detected for line deviation; In this embodiment, the first area quantity is the quantity of the substrate areas to be detected for circuit deviation that meet the preset conditions.

[0040] In some embodiments of the present application, when analyzing all regional line deviation factor sets and calculating the initial suspected line deviation factor of the substrate to be detected for line deviation based on the analysis result, the method includes: Calculate the set factor and value of the sub-region line deviation factors in each region line deviation factor set; Determine a maximum and a minimum set factor and a value from among all set factors and values; Calculate the difference between the maximum set factor and the minimum set factor and the value; Calculate the absolute value of the factor and value difference between each set factor and value and the set factor and value difference; Determine the mean corresponding to the absolute values ​​of all factor and value differences, and divide all factor and value difference absolute values ​​that are less than or equal to the mean into a first combination; All factors and absolute values ​​of value differences greater than the mean are divided into a second combination; An initial suspected line deviation factor of the substrate to be detected for line deviation is calculated according to the first combination and the second combination.

[0041] In this embodiment, each regional line deviation factor set includes a number of sub-regional line deviation factors, and the sum of all sub-regional line deviation factors is calculated to obtain the set factor sum.

[0042] In this embodiment, the difference between the maximum set factor sum value and the minimum set factor sum value is calculated to obtain the set factor sum value difference.

[0043] In this embodiment, the difference between each set factor sum value and the set factor sum value difference is calculated, and then the absolute value is taken to obtain the factor sum value difference absolute value.

[0044] The beneficial effect of the above technical solution is: the present invention calculates the initial suspected line deviation factor of the substrate to be detected for line deviation according to the first combination and the second combination, effectively ensuring the calculation accuracy of the initial suspected line deviation factor, providing a reliable basis for whether the substrate to be detected for line deviation has substrate line deviation, and ensuring the judgment accuracy.

[0045] In some embodiments of the present application, when calculating the initial suspected line deviation factor of the substrate to be detected for line deviation according to the first combination and the second combination, it includes: The initial suspected line deviation factor of the substrate to be detected for line deviation is calculated according to the following formula: ; Wherein, k is the initial suspected line deviation factor of the substrate to be tested for line deviation, t1 is the number of absolute values ​​of the sum of factors in the first combination, t2 is the number of absolute values ​​of the sum of factors in the second combination, q r is the absolute value of the difference between the rth factor and the value in the second combination, q max is the absolute value of the maximum factor and value difference in the second combination.

[0046] In some embodiments of the present application, when the initial suspected line deviation factor is optimized according to the number of the first regions to obtain the target suspected line deviation factor of the substrate to be detected for line deviation, the process includes: Counting the number of the remaining second regions of the substrate region to be detected for line deviation; Calculate a ratio u of the number of the first regions to the number of the second regions; Presetting a first preset optimization coefficient, a second preset optimization coefficient, and a third preset optimization coefficient; When u<1, a first product value of the first preset optimization coefficient and the initial suspected line deviation factor is calculated, and the first product value is used as a target suspected line deviation factor of the substrate to be detected for line deviation; When 1≤u<1.2, a second product value of the second preset optimization coefficient and the initial suspected line deviation factor is calculated, and the second product value is used as a target suspected line deviation factor of the substrate to be detected for line deviation; When 1.2≤u, a third product value of the third preset optimization coefficient and the initial suspected line deviation factor is calculated, and the third product value is used as the target suspected line deviation factor of the substrate to be detected for line deviation.

[0047] In this embodiment, the first preset optimization coefficient is preferably 0.85, the second preset optimization coefficient is preferably 1.15, and the third preset optimization coefficient is preferably 1.25, which can be adjusted according to actual needs.

[0048] The beneficial effect of the above technical solution is: the present invention selects the corresponding preset optimization coefficient according to the ratio of the number of regions, and then optimizes the initial suspected line deviation factor, thereby realizing dynamic adjustment of the initial suspected line deviation factor and ensuring the determination accuracy of the target suspected line deviation factor.

[0049] S160: Based on the relationship between the target suspected line deviation factor and the preset target suspected line deviation factor, it is determined whether the substrate to be detected for line deviation has substrate line deviation, and if so, an alarm is issued.

[0050] In some embodiments of the present application, when judging whether the substrate to be detected for line deviation has substrate line deviation based on the relationship between the target suspected line deviation factor and the preset target suspected line deviation factor, it includes: When the target suspected line deviation factor is less than the preset target suspected line deviation factor, it is determined that there is no substrate line deviation on the substrate to be detected for line deviation; When the target suspected line deviation factor is greater than or equal to the preset target suspected line deviation factor, it is determined that the substrate to be detected for line deviation has substrate line deviation.

[0051] In this embodiment, the preset target suspected line deviation factor is set according to actual conditions. The preset target suspected line deviation factor can measure whether there is a substrate line deviation on the substrate to be detected for line deviation. The preset target suspected line deviation factor is preferably 8 here, and can be adjusted according to actual needs.

[0052] The beneficial effect of the above technical solution is that the present invention improves the accuracy and efficiency of substrate circuit deviation detection, eliminates the need for manual judgment, thereby avoiding misjudgment and missed judgment, and effectively improves the production efficiency and product quality of organic electroluminescent display panels.

[0053] In the description of the above embodiments, specific features, structures, materials or characteristics may be combined in a suitable manner in any one or more embodiments or examples.

[0054] Although the present invention has been described above with reference to the embodiments, various modifications may be made thereto and parts thereof may be replaced with equivalents without departing from the scope of the present invention. In particular, as long as there is no structural conflict, the various features in the embodiments disclosed by the present invention may be used in combination with each other in any manner, and the fact that these combinations are not fully described in this specification is only for the sake of omitting space and saving resources.

[0055] Those skilled in the art can understand that the above are only preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions recorded in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A method for detecting substrate line deviation of an organic electroluminescent display panel, characterized in that: include: Determine a substrate to be detected for line deviation of an organic electroluminescent display panel, divide the substrate to be detected for line deviation into a plurality of substrate regions to be detected for line deviation, determine a signal line to be detected in each substrate region to be detected for line deviation, and deploy a light emitting detector on each signal line to be detected; Apply a preset detection voltage to each signal line to be detected, and collect the luminescence detection response value of each luminescence detector in real time, and generate a line detection mark for the substrate to be detected for line deviation according to all the luminescence detection response values, wherein the line detection mark includes a line deviation mark, a line specification mark and a line suspected deviation mark; When the suspected line deviation mark is identified, the substrate area to be detected for line deviation that meets the preset conditions is extracted, the luminous detection response values ​​in the remaining substrate area to be detected for line deviation are analyzed, and the line deviation factors of the sub-areas of the remaining substrate area to be detected for line deviation are calculated based on the analysis results, wherein the preset conditions are that the luminous detection response values ​​in the substrate area to be detected for line deviation all meet the corresponding standard luminous detection response values, or the luminous detection response values ​​do not meet the corresponding standard luminous detection response values; Extract all sub-region line deviation factors, sort all sub-region line deviation factors by numerical value, and perform factor classification processing on all sub-region line deviation factors based on the sorting results to obtain multiple regional line deviation factor sets; Analyze all regional line deviation factor sets, calculate the initial suspected line deviation factor of the substrate to be detected for line deviation based on the analysis results, count the number of first regions of the substrate region to be detected for line deviation that meet preset conditions, and optimize the initial suspected line deviation factor according to the first region number to obtain the target suspected line deviation factor of the substrate to be detected for line deviation; Based on the relationship between the target suspected line deviation factor and the preset target suspected line deviation factor, it is judged whether the substrate to be detected for line deviation has substrate line deviation, and if so, an alarm prompt is issued.

2. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 1, characterized in that: When the luminescence detection response value of each luminescence detector is collected in real time and a line detection mark is generated for the substrate to be detected for line deviation according to all the luminescence detection response values, it includes: Determine a standard luminescence detection response value corresponding to the preset detection voltage for each signal line to be detected; When all the luminous detection response values ​​meet the corresponding standard luminous detection response values, the line standard mark is generated for the substrate to be detected for line deviation; When all the luminous detection response values ​​do not meet the corresponding standard luminous detection response values, the line deviation mark is generated for the substrate to be detected for line deviation; When there are one or more luminous detection response values ​​that meet the corresponding standards, and there are one or more luminous detection response values ​​that do not meet the corresponding standards, the line suspected deviation mark is generated for the substrate to be detected for line deviation.

3. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 2, characterized in that: When analyzing the luminous detection response value in the remaining substrate area to be detected for line deviation, and calculating the line deviation factor of the sub-area of ​​the remaining substrate area to be detected for line deviation based on the analysis result, it includes: If the remaining luminescence detection response value in the substrate area to be detected for line deviation is less than the standard luminescence detection response value, a first response value difference between the standard luminescence detection response value and the luminescence detection response value is calculated, and a first response value difference sequence is constructed; If the luminescence detection response value in the remaining substrate area to be detected for line deviation is greater than the standard luminescence detection response value, a second response value difference between the luminescence detection response value and the standard luminescence detection response value is calculated, and a second response value difference sequence is constructed; Extracting a first maximum response value difference and a first minimum response value difference in the first response value difference sequence; Extracting a second maximum response value difference and a second minimum response value difference in the second response value difference sequence; The line deviation factors of the remaining sub-regions of the substrate region to be detected for line deviation are calculated according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference and the second minimum response value difference.

4. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 3, characterized in that: When calculating the line deviation factor of the remaining sub-area of ​​the substrate area to be detected for line deviation according to the first maximum response value difference, the first minimum response value difference, the second maximum response value difference and the second minimum response value difference, it includes: The line deviation factor of the remaining sub-area of ​​the substrate area to be detected for line deviation is calculated according to the following formula: ； Wherein, a is the line deviation factor of the sub-region of the substrate region to be detected for line deviation, n is the number of response value differences in the first response value difference sequence, and y is i is the ith response value difference in the first response value difference sequence, y min is the first minimum response value difference, y max is the first maximum response value difference, For all The maximum value in the second response value difference sequence, n2 is the number of response value differences in the second response value difference sequence, b j is the jth response value difference in the second response value difference sequence, b min is the second minimum response value difference, b max is the second maximum response value difference, For all The maximum value in .

5. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 1, characterized in that: When all sub-region line deviation factors are classified based on the sorting results to obtain multiple regional line deviation factor sets, the following are included: The maximum sub-region line deviation factor and the adjacent sub-region line deviation factors form an initial region line deviation factor set, and the third sub-region line deviation factor is used as the sub-region line deviation factor to be classified; Calculating the first factor sum of the two sub-regional line deviation factors in the initial regional line deviation factor set, and calculating the first factor difference between the sub-regional line deviation factor to be classified and the first factor sum, judging whether the first factor difference is greater than or equal to a preset factor difference, and if so, classifying the sub-regional line deviation factor to be classified into the initial regional line deviation factor set; If not, the initial regional line deviation factor set is used as a regional line deviation factor set, and a second regional line deviation factor set is formed according to the sub-regional line deviation factor to be classified and the fourth sub-regional line deviation factor; Taking the fifth sub-region line deviation factor as the sub-region line deviation factor to be classified, calculating the second factor sum of the two sub-region line deviation factors in the second region line deviation factor set, and calculating the second factor difference between the fifth sub-region line deviation factor and the second factor sum, determining whether the second factor difference is greater than or equal to the preset factor difference, and if so, classifying the fifth sub-region line deviation factor into the second region line deviation factor set, and updating the second region line deviation factor set; If not, the second regional line deviation factor set is used as a regional line deviation factor set; In this way, classification processing is performed to obtain multiple regional line deviation factor sets based on all sub-regional line deviation factors.

6. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 1, characterized in that: When analyzing all regional line deviation factor sets and calculating the initial suspected line deviation factor of the substrate to be detected for line deviation based on the analysis result, it includes: Calculate the set factor and value of the sub-region line deviation factors in each region line deviation factor set; Determine a maximum and a minimum set factor and a value from among all set factors and values; Calculate the difference between the maximum set factor and the minimum set factor and the value; Calculate the absolute value of the factor and value difference between each set factor and value and the set factor and value difference; Determine the mean corresponding to the absolute values ​​of all factor and value differences, and divide all factor and value difference absolute values ​​that are less than or equal to the mean into a first combination; All factors and absolute values ​​of value differences greater than the mean are divided into a second combination; An initial suspected line deviation factor of the substrate to be detected for line deviation is calculated according to the first combination and the second combination.

7. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 6, characterized in that: When calculating the initial suspected line deviation factor of the substrate to be detected for line deviation according to the first combination and the second combination, it includes: The initial suspected line deviation factor of the substrate to be detected for line deviation is calculated according to the following formula: ； Wherein, k is the initial suspected line deviation factor of the substrate to be tested for line deviation, t1 is the number of absolute values ​​of the sum of factors in the first combination, t2 is the number of absolute values ​​of the sum of factors in the second combination, q r is the absolute value of the difference between the rth factor and the value in the second combination, q max is the absolute value of the maximum factor and value difference in the second combination.

8. The substrate circuit deviation detection method for an organic electroluminescent display panel according to claim 1, characterized in that: When the initial suspected line deviation factor is optimized according to the number of the first regions to obtain the target suspected line deviation factor of the substrate to be detected for line deviation, the method includes: Counting the number of the remaining second regions of the substrate region to be detected for line deviation; Calculate a ratio u of the number of the first regions to the number of the second regions; Presetting a first preset optimization coefficient, a second preset optimization coefficient, and a third preset optimization coefficient; When u<1, a first product value of the first preset optimization coefficient and the initial suspected line deviation factor is calculated, and the first product value is used as a target suspected line deviation factor of the substrate to be detected for line deviation; When 1≤u<1.2, a second product value of the second preset optimization coefficient and the initial suspected line deviation factor is calculated, and the second product value is used as a target suspected line deviation factor of the substrate to be detected for line deviation; When 1.2≤u, a third product value of the third preset optimization coefficient and the initial suspected line deviation factor is calculated, and the third product value is used as the target suspected line deviation factor of the substrate to be detected for line deviation.

9. The substrate line deviation detection method for an organic electroluminescent display panel according to claim 1, characterized in that: When judging whether the substrate to be detected for line deviation has substrate line deviation based on the relationship between the target suspected line deviation factor and the preset target suspected line deviation factor, it includes: When the target suspected line deviation factor is less than the preset target suspected line deviation factor, it is determined that there is no substrate line deviation on the substrate to be detected for line deviation; When the target suspected line deviation factor is greater than or equal to the preset target suspected line deviation factor, it is determined that the substrate to be detected for line deviation has substrate line deviation.

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