Temperature sensing system for p-type gate GaN power devices
Patent Information
- Application Number
- CN202411948580.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2025-04-15
- Estimated Expiration
- 2044-12-27
AI Technical Summary
When detecting the temperature of gallium nitride power devices, the sensitivity, accuracy, linearity and repeatability are poor, and are incompatible with the mainstream processes of existing gallium nitride power devices, making it difficult to achieve practical applications.
The first parameters of the gallium nitride gate ground transistor integrated with the power element are used for temperature detection, such as forward conduction voltage, on current, and on resistance, and do not switch high voltage and are not affected by trap states. The accuracy is high, sensitivity is high, linearity is high, and the repeatability is high.
It realizes high-precision and high-sensitivity temperature detection, avoids the influence of trap state, has strong process compatibility, can be integrated on the same piece, and reduces costs.
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Figure CN119469445B_ABST
Abstract
Citation Information
Patent Citations
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