Method, device and equipment for testing electrical performance of 0bb battery piece and readable storage medium
By calibrating and performing linear analysis on the IV tester, and combining it with correction coefficients, the problem of inaccurate test results for gridless solar cells was solved, achieving efficient and low-cost electrical performance testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHUZHOU JIETAI NEW ENERGY TECH CO LTD
- Filing Date
- 2024-10-25
- Publication Date
- 2026-07-21
AI Technical Summary
Existing technologies still use the same testing systems as those for cells with main busbars when testing cells without main busbars, resulting in inaccurate test results.
Different numbers of probe arrays on an IV tester were used to calibrate and test solar cells with main grids and OBB solar cells. The electrical performance of OBB solar cells was determined by linear analysis and correction coefficients, including the calculation of parameter correction values.
This improved the accuracy of electrical performance testing for 0BB solar cells, reduced testing costs and time, and avoided the need to modify testing equipment.
Smart Images
Figure CN119519595B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of photovoltaic cell technology, and specifically to a method, apparatus, equipment, and readable storage medium for testing the electrical performance of OBB solar cells. Background Technology
[0002] Currently, most conventional N-type tunneling oxide passivated contact (Topcon) cells primarily use 16BB (16 main grids) or 18BB (18 main grids). The number of main grids has increased from the initial two to the current eighteen, resulting in a stronger ability to collect and transport photogenerated carriers, thus achieving higher photoelectric conversion efficiency and output power. However, with the increase in the number of main grids, the light-blocking area also increases, affecting the number of photogenerated carriers generated. To achieve optimal photoelectric conversion efficiency, many factors need to be considered, such as the width, number, shape, and material of the grid lines. To reduce the light-blocking area, the emergence of gridless (OBB) cells has solved this problem, leading to the development of test fixtures with dual-row probes for testing the electrical performance of gridless cells.
[0003] However, although there are test fixtures available on the market for grid-less cells, there are no corresponding test methods. The test systems still use the same methods as those with grids, which results in inaccurate test results when using the improved fixtures to test grid-less cells. Summary of the Invention
[0004] The purpose of this invention is to overcome the deficiencies of the prior art and provide a method, apparatus, device and readable storage medium for testing the electrical performance of OBB solar cells.
[0005] This invention provides a method for testing the electrical performance of OBB solar cells, comprising:
[0006] Step 1: Test the cells with main busbars and the cells with 0BB respectively, and obtain the corresponding electrical performance test parameters for the cells with main busbars and the cells with 0BB.
[0007] Step 2: Determine the electrical performance of the OBB solar cell based on the electrical performance test parameters of the main busbar solar cell and the OBB solar cell.
[0008] According to the electrical performance testing method for an OBB battery cell provided by the present invention, before step one, the method further includes:
[0009] The IV tester is used to calibrate the IV tester by using the first number of probes of the IV tester and the main grid cell standard sheet. The calibrated IV tester is then used to test the main grid cell and the OBB cell respectively.
[0010] The IV tester is used with a second probe array to calibrate the IV tester using a standard cell with a main grid, and then the calibrated IV tester is used to test the main grid cell and the OBB cell respectively.
[0011] According to the present invention, a method for testing the electrical performance of an OBB battery cell is provided, wherein step one includes:
[0012] The first number of probes of the IV tester are used to test the solar cell with main grid and the OBB solar cell respectively, and the first electrical performance test parameters corresponding to the solar cell with main grid and the first electrical performance test parameters corresponding to the OBB solar cell are measured.
[0013] The second number of probes of the IV tester were used to test the cells with main grids and the OBB cells again, and the second electrical performance test parameters corresponding to the cells with main grids and the OBB cells were measured.
[0014] According to the electrical performance testing method for an OBB battery cell provided by the present invention, step two includes:
[0015] Linear analysis is performed on the first and second electrical performance test parameters, and the electrical performance of the OBB cell is determined based on the analysis results.
[0016] According to the present invention, an electrical performance testing method for an OBB battery cell includes performing linear analysis on the first electrical performance test parameter and the second electrical performance test parameter, and determining the electrical performance of the OBB battery cell based on the analysis results.
[0017] Based on the first and second electrical performance test parameters corresponding to the cells with main grids, the first slope of the electrical performance corresponding to the cells with main grids is determined.
[0018] Based on the first and second electrical performance test parameters corresponding to the 0BB solar cell, determine the second slope of the electrical performance corresponding to the 0BB solar cell;
[0019] Based on the first slope and the second slope, determine the parameter correction value of the 0BB battery cell;
[0020] The electrical performance of the OBB solar cell is determined based on the parameter correction values of the OBB solar cell.
[0021] According to the electrical performance testing method of the OBB battery cell provided by the present invention, the step of determining the parameter correction value of the OBB battery cell based on the first slope and the second slope includes:
[0022] The parameter correction values for 0BB solar cells are determined according to the following formula:
[0023] Parameter correction value = i*(A1-A2);
[0024] Where A1 is the first slope, A2 is the second slope, and i is the number of probe rows;
[0025] A1=(Isc Q,i -Isc Q,q ) / (iq);
[0026] A2=(Isc H,i -Isc H,q ) / (iq);
[0027] Where Q represents a cell with a main grid, H represents an OBB cell, i and q represent the number of probe rows, and I > q; Isc Q,i Isc represents the short-circuit current measured by a main grid cell Q with I probe arrays. H,i Isc represents the short-circuit current of a 0BB battery tested with i probe arrays; Q,q Isc represents the short-circuit current measured when there is a main grid cell Q with q probe arrays. H,q This represents the short-circuit current of the 0BB battery when the number of probe arrays is q.
[0028] The present invention also provides an apparatus for performing the electrical performance testing method for OBB solar cells as described above, comprising:
[0029] The test unit is used to test solar cells with main busbars and OBB solar cells respectively.
[0030] The acquisition unit is used to obtain the electrical performance test parameters of the solar cell with main busbar and the electrical performance test parameters of the OBB solar cell respectively.
[0031] The determining unit is used to determine the electrical performance of the OBB cell based on the electrical performance test parameters of the main grid cell and the OBB cell.
[0032] The present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the electrical performance testing method of any of the OBB battery cells described above.
[0033] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the electrical performance testing method for the OBB battery cell as described above.
[0034] The present invention also provides a computer program product, including a computer program that, when executed by a processor, implements the electrical performance testing method for any of the OBB battery cells described above.
[0035] Beneficial effects:
[0036] The present invention provides an electrical performance testing method, apparatus, device, and readable storage medium for OBB solar cells. By testing the electrical performance test parameters of solar cells with main grids and OBB solar cells with different numbers of probe arrays, the changing trends of the electrical performance test parameters of the two are analyzed. By comparing and analyzing the changing trends, the electrical performance of OBB solar cells is evaluated. Compared with existing testing methods, this invention effectively improves the testing accuracy of OBB solar cells. Attached Figure Description
[0037] Figure 1 A flowchart of the electrical performance testing method for the OBB battery cell provided by this invention;
[0038] Figure 2 This is a structural block diagram of the electrical performance testing device for the OBB battery cell provided by the present invention.
[0039] Figure 3 This is a schematic diagram of the structure of the electronic device provided by the present invention. Detailed Implementation
[0040] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention are described clearly and completely below. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.
[0041] Currently, most conventional N-Topcon cells use 16 or 18 main grids. As the number of grids increases, the shading area also increases, leading to a decrease in photoelectric conversion efficiency. To reduce the shading area, it was proposed to make the grid lines as thin as possible. However, thinner grid lines result in a smaller grid cross-sectional area, increasing series resistance loss and thus reducing the fill factor. To address this issue, the emergence of gridless (OBB) cells has solved this problem. The advantages of OBB cells include:
[0042] 1) The absence of main grid silver paste and electrode points for positioning and welding reduces the light-shielding area and silver paste cost;
[0043] 2) The use of finer and more solder strips reduces the transmission distance of photogenerated carriers, improves conductivity, effectively reduces series resistance, and increases module power;
[0044] 3) A greater number of solder strips increases the tensile strength of the solar cells, improving the reliability of the module.
[0045] However, the patterns of 0BB (no grid) cells are diverse, with grids replaced by connecting lines. These connecting lines can be present or absent, solid, dashed, or alternating between solid and dashed lines. The front and back patterns may be identical or different. To test 0BB cells, test fixtures specifically designed for them have been developed. However, although the test fixtures have been updated, the testing methods for 0BB cells still largely follow those for N-TOPCon cells, leading to inaccurate test results. This application introduces a correction factor to provide a low-cost and time-efficient method for testing the electrical performance of 0BB cells. Figure 1 The flowchart of the electrical performance testing method for the OBB battery cell provided by this invention is as follows: Figure 1 As shown, it includes:
[0046] Step 1: Test the cells with main busbars and the cells with 0BB respectively, and obtain the corresponding electrical performance test parameters for the cells with main busbars and the cells with 0BB.
[0047] Specifically, this invention uses an IV tester to test solar cells with main grids and OBB solar cells. An IV tester (i.e., a current-voltage tester) is typically equipped with multiple pairs of probe arrays for establishing electrical connections with the device under test (e.g., solar cells, semiconductor devices) to perform current-voltage characteristic testing. The number of probe arrays can be configured according to testing requirements; common configurations include single-array, double-array, and multi-array configurations. The electrical performance test parameters may include: open-circuit voltage (Voc), short-circuit current (Isc), current density (Jsc), maximum output power (Pmax), fill factor (FF), and efficiency (Eta), etc.
[0048] Step 2: Determine the electrical performance of the 0BB solar cell based on the electrical performance test parameters of the solar cell with main busbar and the solar cell with 0BB.
[0049] Specifically, this invention evaluates the electrical performance of OBB solar cells by analyzing the changes in electrical performance test parameters of solar cells with main grids and OBB solar cells.
[0050] The electrical performance testing method for 0BB solar cells provided by this invention analyzes the changing trends of electrical performance test parameters of solar cells with main grids and 0BB solar cells under different probe array numbers. By comparing and analyzing these changing trends, the electrical performance of 0BB solar cells is evaluated. Compared with existing testing methods, this method effectively improves the testing accuracy of 0BB solar cells.
[0051] Furthermore, before testing the cells with main busbars and OBB cells separately using the IV tester, the following steps are also included:
[0052] The IV tester is used with a first number of probes, and the IV tester is calibrated with a standard cell with a main grid. The calibrated IV tester is then used to test the main grid cells and the OBB cells respectively. The IV tester is used with a second number of probes, and the IV tester is calibrated with a standard cell with a main grid. The calibrated IV tester is then used to test the main grid cells and the OBB cells respectively.
[0053] Specifically, an IV tester is an instrument used to measure the internal resistance and voltage of cells or photovoltaic modules, and its accuracy is crucial for evaluating cell performance. When using platforms with different numbers of probe arrays for testing, differences in factors such as the contact resistance between the probes and the cells, and the probe spacing, can lead to varying test results. Using a 18BB cell with known performance parameters (as used in this embodiment) as a standard for calibration (the 18BB standard is a reference with known performance parameters, and its IV parameters are stable and reliable) can eliminate or reduce the impact of these differences on the test results, thereby ensuring the accuracy of the test results. The specific calibration method is as follows: by comparing the data measured by the tester for 18BB and 0BB cells with the data from the 18BB standard, the error of the tester can be assessed, and necessary corrections and adjustments can be made, thereby ensuring the accuracy of subsequent test results for 18BB and 0BB cells.
[0054] The electrical performance testing method for OBB solar cells provided by this invention improves the accuracy of test parameters by first calibrating the testing machine using standard samples before testing the main busbar solar cells and OBB solar cells, and then using the calibrated IV testing machine to measure the test parameters of the main busbar solar cells and OBB solar cells. This provides strong data support for the electrical performance evaluation of OBB solar cells and improves the accuracy of electrical performance testing. More importantly, this invention effectively improves the accuracy of electrical performance test parameters by calibrating the IV testing machine with main busbar solar cell standard samples after each change of the number of probe rows, thereby further improving the accuracy of electrical performance testing of OBB solar cells.
[0055] Furthermore, the following section introduces how to obtain the electrical performance test parameters of cells with main busbars and cells with 0BB based on the test results:
[0056] First, the first probe array of the IV tester is used to test the cells with main grids and the OBB cells respectively, and the first electrical performance test parameters corresponding to the cells with main grids and the OBB cells are measured. Then, the second probe array of the IV tester is used to test the cells with main grids and the OBB cells again, and the second electrical performance test parameters corresponding to the cells with main grids and the OBB cells are measured.
[0057] Specifically, this invention uses different numbers of probe rows to simulate different test conditions. For example, it tests solar cells with main grids and OBB solar cells on 4 pairs of probe rows and 14 pairs of probe rows, respectively.
[0058] First, an IV tester with a low number of probe rows (4 rows) was used to test the cells with main grids and the cells with 0BBs in sequence, thereby obtaining the electrical performance test parameters of the cells with main grids and the cells with 0BBs corresponding to the 4 rows of probes.
[0059] Then, an IV tester with a high number of probe rows (14 rows) was used to test the cells with main grids and the cells with 0BBs in sequence, thereby obtaining the electrical performance test parameters of the cells with main grids and the cells with 0BBs corresponding to the 14 rows of probes.
[0060] During testing, ensure that the testing conditions (such as light intensity and temperature) for both cells with main grids and OBB cells are consistent to facilitate accurate comparison. By observing the changing trends of electrical performance test parameters (Eta, Voc, Isc, FF) obtained for cells with main grids and OBB cells under different probe array numbers, the electrical performance of OBB cells can be evaluated through comparative analysis of these trends.
[0061] Specifically, the testing method provided by this invention can be as follows: First, using an IV tester with a first number of probe arrays, the tester is calibrated using 18BB standard sheets. Then, the calibrated tester is used to test the main busbar cells and OBB cells respectively to obtain the corresponding first electrical performance test parameters. Next, using an IV tester with a second number of probe arrays, the tester is calibrated again using 18BB standard sheets. Then, the calibrated tester is used to test the main busbar cells and OBB cells respectively to obtain the corresponding second electrical performance test parameters. Then, by performing linear analysis on the first and second electrical performance test parameters corresponding to the main busbar cells and OBB cells respectively, the electrical performance of the OBB cells is determined based on the analysis results.
[0062] The following is an example of performing linear analysis on the first electrical performance test parameter and the second electrical performance test parameter, as detailed below:
[0063] 1. Determine the correction parameters: On the IV tester (Lixite manual IV tester), use platforms with different numbers of probe arrays, calibrate the IV tester with 18BB standard sheet, test 0BB cells (the two graphs are not consistent), and observe the changes in the relative IV parameters of 0BB cells relative to 18BB standard sheet. See Table 1 for details.
[0064] Table 1 Electrical properties of 16BB and 0BB under different numbers of probe arrays.
[0065]
[0066] As can be seen from Table 1:
[0067] 1) The Voc differences of 4-pair probe arrays and above are basically consistent, indicating that the Voc tests of 4-pair probe arrays and above are basically reliable and the Voc does not need to be corrected.
[0068] 2) The FF (Failure Factor) is related to both the test fixture and the calibration standard. The more probe arrays a 0BB battery tester has, the closer it is to the true FF. The FF differences are basically consistent with those of 10 or more probe arrays, indicating that the FF tested with 10 or more probe arrays is basically reliable and does not require correction.
[0069] 3) The patterns of the two 0BB battery cells are inconsistent, and the Isc is significantly different, so Isc correction is required.
[0070] The method provided by this invention simulates different test conditions using different numbers of probe arrays to obtain multiple sets of electrical performance test parameters for main busbar cells and OBB cells. On the one hand, by analyzing multiple sets of electrical performance test parameters for main busbar cells and OBB cells, it is determined that the electrical performance of OBB cells can be evaluated simply by correcting Isc, thus improving the efficiency of electrical performance testing of OBB cells. On the other hand, it can perform linear analysis based on the acquired multiple sets of data and determine the electrical performance of OBB cells based on the analysis results, effectively improving the accuracy of electrical performance testing of OBB cells.
[0071] Furthermore, the following section details how to perform linear analysis on the first and second electrical performance test parameters to determine the electrical performance of the 0BB solar cell. This method specifically includes:
[0072] Based on the first and second electrical performance test parameters corresponding to the cells with main busbars, a first slope for the electrical performance of the cells with main busbars is determined; based on the first and second electrical performance test parameters corresponding to the OBB cells, a second slope for the electrical performance of the OBB cells is determined; based on the first and second slopes, parameter correction values for the OBB cells are determined; based on the parameter correction values for the OBB cells, the electrical performance of the OBB cells is determined.
[0073] Specifically, analysis of the data in Table 1 shows that only Isc needs to be corrected. Therefore, the first slope of the electrical performance corresponding to the main busbar cell is the first slope of Isc; the second slope of the electrical performance corresponding to the 0BB cell is the second slope of Isc.
[0074] The following describes the correction process for Isc:
[0075] a. Preparation before testing: One pack of mainstream 16BB solar cells from the production line, at least 10 0BB solar cells of different shapes, 14 pairs of probe arrays, one traceable Fraunhofer second-label solar cell, and one set of monitoring cells.
[0076] b. 4-pair probe array test: Borrow the IV offline test machine (automated HALM offline test machine) from the production line, change the probe array to 4 pairs, use the monitoring chip to test dynamic and static, ensure the machine's stability is qualified, use two standard cells to calibrate the machine, and test 16BB and 0BB cells.
[0077] c. 14-pair probe array test: Change the probe array to 14 pairs, use monitoring chip to test dynamic and static conditions to ensure the stability of the machine is qualified, calibrate the machine with two standard cells, test 16BB and 0BB cells, and compile the test data into Table 2.
[0078] d. Data processing: Current correction value = 14 * (slope(Isc of standard standard cell vs. number of platform probes) - slope(Isc of 0BB cell vs. number of platform probes))
[0079] e. Current correction process: The current correction value varies for different 0BB pattern solar cells. The equipment has 14 pairs of probes. The machine is calibrated with two standard solar cells. After testing the mainstream 16BB solar cells, the machine is calibrated with two standard solar cells. Current correction (adding 0.103 mA) is performed during current calibration. 0BB-A is tested with current correction (adding 0.089 mA), 0BB-B is tested with current correction (adding 0.100 mA), and 0BB-C is tested with current correction (adding 0.100 mA).
[0080] Table 2 Isc Correction for 4-pair and 14-pair probe arrays (Correction value = slope * 14(16BB - 0BB))
[0081] 1) Battery cells 4 pairs 14 pairs intercept slope slope*14 Correction value 16BB 13.697 13.702 13.6944 0.0005 0.007 0 0BB-A 13.778 13.710 13.8049 -0.068 -0.952 0.959 0BB-B 13.750 13.692 13.7734 -0.058 -0.812 0.819 0BB-C 13.766 13.701 13.793 -0.065 -0.910 0.917
[0082] The above describes the testing and analysis process for main grid cells and 0BB cells using 4-pair and 14-pair probe arrays, respectively. It should be noted that during the testing process, other numbers of probe arrays can also be used to test the main grid cells and 0BB cells; this invention does not impose any limitations on this. Therefore, based on the analysis of Table 2, this invention provides a method for calculating the parameter correction values of 0BB cells, as follows:
[0083] Parameter correction value = i*(A1-A2);
[0084] Where A1 is the first slope, A2 is the second slope, and i is the number of probe rows;
[0085] A1=(Isc Q,i -Isc Q,q ) / (iq);
[0086] A2=(Isc H,i -Isc H,q ) / (iq);
[0087] Where Q represents a cell with a main grid, H represents an OBB cell, and i and q represent the number of probe rows, with i > q; Isc Q,i Isc represents the short-circuit current of a main grid cell Q tested with i probe arrays. H,i Isc represents the short-circuit current of a 0BB battery tested with i probe arrays; Q,q Isc represents the short-circuit current measured when there is a main grid cell Q with q probe arrays. H,q This represents the short-circuit current of the 0BB battery when the number of probe arrays is q.
[0088] The electrical performance testing method for 0BB solar cells provided by this invention uses a current correction value = i*{(Isc)} Q,i -Isc Q,q ) / (iq)-(Isc H,i -Isc H,q The actual electrical performance values of 0BB solar cells can be tested using the method of ) / (iq)}. This method is fast, easy to operate, and convenient, requiring almost no special equipment. One device can meet the testing needs of 0BB solar cells with different patterns, eliminating the need for custom-made test fixtures. Furthermore, the testing time is short and the cost is low. Testing 0BB solar cells does not require modification of the equipment; only six additional probe arrays are needed.
[0089] The electrical performance testing apparatus for OBB solar cells provided by the present invention will be described below. The electrical performance testing apparatus for OBB solar cells described below can be referred to in correspondence with the electrical performance testing method for OBB solar cells described above.
[0090] Figure 2 This is a structural block diagram of the electrical performance testing device for OBB solar cells provided by the present invention, as shown in the figure. Figure 2 As shown, the device includes:
[0091] Test unit 201 is used to test solar cells with main busbars and OBB solar cells respectively;
[0092] The acquisition unit 202 is used to obtain the electrical performance test parameters of the solar cell with main busbar and the electrical performance test parameters of the OBB solar cell respectively.
[0093] The determining unit 203 is used to determine the electrical performance of the OBB cell based on the electrical performance test parameters of the cell with main busbar and the electrical performance test parameters of the OBB cell.
[0094] Figure 3 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 3 As shown, the electronic device may include: a processor 310, a communication interface 320, a memory 330, and a communication bus 340, wherein the processor 310, the communication interface 320, and the memory 330 communicate with each other via the communication bus 340. The processor 310 can call logical instructions in the memory 330 to execute a method for testing the electrical performance of OBB battery cells, the method including:
[0095] Step 1: Test the cells with main busbars and the cells with 0BB respectively, and obtain the corresponding electrical performance test parameters for the cells with main busbars and the cells with 0BB.
[0096] Step 2: Determine the electrical performance of the 0BB solar cell based on the electrical performance test parameters of the solar cell with main busbar and the solar cell with 0BB.
[0097] Furthermore, the logical instructions in the aforementioned memory 330 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0098] On the other hand, the present invention also provides a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer is able to execute the electrical performance testing method for OBB battery cells provided by the above methods, the method including:
[0099] Step 1: Test the cells with main busbars and the cells with 0BB respectively, and obtain the corresponding electrical performance test parameters for the cells with main busbars and the cells with 0BB.
[0100] Step 2: Determine the electrical performance of the 0BB solar cell based on the electrical performance test parameters of the solar cell with main busbar and the solar cell with 0BB.
[0101] In another aspect, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements a method for testing the electrical performance of an OBB battery cell provided by the methods described above, the method comprising:
[0102] Step 1: Test the cells with main busbars and the cells with 0BB respectively, and obtain the corresponding electrical performance test parameters for the cells with main busbars and the cells with 0BB.
[0103] Step 2: Determine the electrical performance of the 0BB solar cell based on the electrical performance test parameters of the solar cell with main busbar and the solar cell with 0BB.
[0104] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.
[0105] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims
1. A method for testing electrical performance of a 0BB battery sheet, characterized in that, include: Step 1: Test the cells with main busbars and the cells with 0BB respectively, and obtain the corresponding electrical performance test parameters for the cells with main busbars and the cells with 0BB. Step 2: Determine the electrical performance of the OBB solar cell based on the electrical performance test parameters of the main busbar solar cell and the OBB solar cell. Before step one, it also includes: The IV tester is used to calibrate the IV tester by using the first number of probes of the IV tester and the main grid cell standard sheet. The calibrated IV tester is then used to test the main grid cell and the OBB cell respectively. The IV tester is used with a second number of probes, and the IV tester is calibrated with a grid cell standard piece. The calibrated IV tester is then used to test the grid cell and the OBB cell respectively. Step one includes: The first number of probes of the IV tester are used to test the solar cell with main grid and the OBB solar cell respectively, and the first electrical performance test parameters corresponding to the solar cell with main grid and the first electrical performance test parameters corresponding to the OBB solar cell are measured. The second number of probes of the IV tester were used to test the solar cell with main grid and the OBB solar cell again, and the second electrical performance test parameters corresponding to the solar cell with main grid and the second electrical performance test parameters corresponding to the OBB solar cell were measured. Step two includes: Based on the first and second electrical performance test parameters corresponding to the cells with main grids, the first slope of the electrical performance corresponding to the cells with main grids is determined. Based on the first and second electrical performance test parameters corresponding to the 0BB solar cell, determine the second slope of the electrical performance corresponding to the 0BB solar cell; Based on the first slope and the second slope, determine the parameter correction value of the 0BB battery cell; The electrical performance of the 0BB solar cell is determined based on the parameter correction values of the 0BB solar cell. The step of determining the parameter correction value of the 0BB battery cell based on the first slope and the second slope includes: The parameter correction values for 0BB solar cells are determined according to the following formula: Parameter correction value ; wherein, is a first slope, is a second slope; is a number of probe rows; = ； = ； in, For cells with main grids, It is a 0BB battery. 、 These represent the number of probe rows, and > ; Indicates the presence of a main grid cell. With the number of probe arrays being The short-circuit current under test, This indicates that the 0BB battery has a probe array of [number]. The short-circuit current under test; Indicates the presence of a main grid cell. With the number of probe arrays being The short-circuit current under test, This indicates that the 0BB battery has a probe array of [number]. The short-circuit current is measured in the following test.
2. An apparatus for performing the electrical performance testing method for the OBB battery cell according to claim 1, characterized in that, include: The test unit is used to test solar cells with main busbars and OBB solar cells respectively. The acquisition unit is used to obtain the electrical performance test parameters of the solar cell with main busbar and the electrical performance test parameters of the OBB solar cell respectively. The determining unit is used to determine the electrical performance of the OBB cell based on the electrical performance test parameters of the main grid cell and the OBB cell.
3. An electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the electrical performance testing method for the OBB battery as described in claim 1.
4. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the electrical performance testing method for the OBB battery as described in claim 1.
5. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the electrical performance testing method for the OBB battery cell as described in claim 1.
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